AD677TD_技术文档

REVISIONS

LTR

A

DESCRIPTION

Update boilerplate to reflect current requirements. -rrp

DATE (YR-MO-DA)

01-11-16

APPROVED

R. MONNIN

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

A

1

A

2

A

3

A

4

A

5

A

6

A

7

A

8

A

9

A

SHEET

10

11

PREPARED BY

Dan Wonnell

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216

CHECKED BY

Sandra Rooney

STANDARD

MICROCIRCUIT

DRAWING

http://www.dscc.dla.mil

APPROVED BY

Michael A. Frye

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

MICROCIRCUIT, DIGITAL-LINEAR, FAST, SERIAL,

16-BIT, A/D CONVERTER, MULTICHIP SILICON

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

DRAWING APPROVAL DATE

96-01-16

AMSC N/A

REVISION LEVEL

A

SIZE

A

CAGE CODE

5962-95592

67268

SHEET

1

OF

11

DSCC FORM 2233

APR 97

5962-E073-02

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

1. SCOPE

1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and

M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the

Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the

PIN.

1.2 PIN. The PIN is as shown in the following example:

5962

-

95592

01

M

E

X

Federal

stock class

designator

\

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Device

class

designator

(see 1.2.3)

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

/

\/

Drawing number

1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and

are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A

specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

1.2.2 Device type(s). The device type(s) identify the circuit function as follows:

Device type

01

Generic number

AD677

Circuit function

16-bit, 100 kSPS, serial, A/D converter

1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as

follows:

Device class

M

Device requirements documentation

Vendor self-certification to the requirements for MIL-STD-883 compliant, non-

JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A

Q or V

Certification and qualification to MIL-PRF-38535

1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter

E

Descriptive designator

CDIP2-T16

Terminals

16

Package style

Dual-in-line

1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,

appendix A for device class M.

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

2

DSCC FORM 2234

APR 97

1.3 Absolute maximum ratings. 1/

V_CCto V_EE.................................................................................................... -0.3 V dc to +26.4 V dc

V_DDto DGND ............................................................................................... -0.3 V dc to +7 V dc

V_CCto AGND ............................................................................................... -0.3 V dc to +18 V dc

V_EEto AGND ............................................................................................... -18 V dc to +0.3 V dc

AGND to DGND .......................................................................................... ±0.3 V dc

Digital inputs (CAL, SAMPLE, CLK) to DGND ............................................ 0 V dc to +5.5 V dc

Analog inputs (V_IN, V_REF, AGND SENSE) to AGND .................................... (V_CC+ 0.3 V) to (V_EE– 0.3 V)

Power dissipation (P_D):

V

_REF= 10 V .............................................................................................. 630 mW

_REF= 5 V ................................................................................................ 530 mW

Thermal resistance, junction-to-case (θ_JC) .................................................. 15°C/W

Thermal resistance, junction-to-ambient (θ_JA) ............................................. 80°C/W

Storage temperature range ......................................................................... -65°C to +150°C

Lead temperature (soldering, 10 sec) ......................................................... +300°C

1.4 Recommended operating conditions. 2/

Ambient operating temperature range (T_A) ................................................. -55°C to +125°C

Positive analog supply voltage (V_CC) ........................................................... 11.4 V dc to 12.6 V dc

Negative analog supply voltage (V_EE) ......................................................... -11.4 V dc to –12.6 V dc

Digital supply voltage (V_DD) ......................................................................... 4.5 V dc to 5.5 V dc

Analog reference voltage (V_REF) .................................................................. 5 V dc to 10 V dc

Analog input voltage range (V_IN) ................................................................. -V_REFto V_REF

Analog ground sense voltage ...................................................................... -0.1 V dc to 0.1 V dc

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a

part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in

the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the

solicitation.

SPECIFICATION

DEPARTMENT OF DEFENSE

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

STANDARDS

DEPARTMENT OF DEFENSE

MIL-STD-883

-

Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

HANDBOOKS

DEPARTMENT OF DEFENSE

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization

Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

2/ AGND and DGND tied at ADC.

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

3

DSCC FORM 2234

APR 97

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full

ambient operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space

limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the

RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.

Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of

compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see

6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this

drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535

and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for

device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.

3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2

herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.

3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain

the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made

available onshore at the option of the reviewer.

3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in

microcircuit group number H (see MIL-PRF-38535, appendix A).

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

4

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics.

Conditions

-55°C ≤ T_A≤ +125°C,

_CC= +12 V, V_EE= -12 V,

_DD= +5 V, V_REF= 10 V,

Group A

subgroups

Device

type

Limits

Unit

Test

Symbol

V

V_IH= 2.0 V, V_IL= 0.8 V

unless otherwise specified

Min

2.0

Max

Logic input high voltage

Logic input low voltage

Logic input current

V_IH

V_IL

1,2,3

01

V

0.8

I_LIN

V_OH

V_OL

V_IH= 5 V, V_IL= 0 V

I_OH= 0.5 mA

-10

2.4

+10

µA

V

Logic output high voltage

Logic output low voltage

Power supply current

I_OL= 1.6 mA

0.4

V

I_CC

I_EE

I_DD

I_CC

I_EE

I_DD

P_D

V_REF= 10 V,

24

-24

5

mA

device converting

V_REF= 5 V,

20

-20

5

device converting

Power dissipation

V_REF= 10 V

1,2,3

01

630

530

mW

LSB

V_REF= 5 V

Integral nonlinearity

INL

all codes

1

±1.5

±2.0

2,3

Differential nonlinearity

Bipolar zero error

DNL

B_PZE

all codes 1/

1,2,3

01

16

Bits

code = 32767.5

1

LSB

±3.0

±4.0

2,3

Negative full-scale error

Positive full-scale error

A_N

code = 0.5

1

01

LSB

±3.0

±4.0

2,3

A_P

code = 65535.5

1

±3.0

±4.0

2,3

Voltage reference input

Signal-to-noise + distortion

Total harmonic distortion

Conversion time

V_REF

1,2,3

4,5,6

01

5

10

V

S/(N+D) f_IN= 1 kHz 2/

89

dB

µs

THD

t_C

f_IN= 1 kHz 2/

see figure 2

-95

9,11

10

13.3

CLK period

t_CLK

see figure 2

9,11

10

01

480

670

ns

See footnotes at end of table.

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

5

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics – Continued.

Conditions

-55°C ≤ T_A≤ +125°C,

_CC= +12 V, V_EE= -12 V,

_DD= +5 V, V_REF= 10 V,

Group A

subgroups

Device

type

Limits

Unit

Test

Symbol

V

V_IH= 2.0 V, V_IL= 0.8 V

unless otherwise specified

Min

Max

Calibration time

t_CT

see figure 2

9,10,11

01

85532

t_CLK

Sampling time

(included in t_C)

CAL to BUSY delay

t_S

2

µs

t_CALB

t_LCS

t_SB

50

ns

Last CLK to SAMPLE delay

SAMPLE to BUSY delay

CLK high

2.1

µs

ns

75

t_CH

50

35

CLK low

t_CL

1^STCLK delay

t_FCD

t_SCL

t_CB

SCLK low

CLK to BUSY delay

CLK to SDATA valid

CLK to SCLK high

SDATA to SCLK high

Sample low

350

200

350

t_CD

50

75

t_CSH

t_DSH

t_SL

35

100

50

CAL HIGH

t_CALH

1/ Minimum resolution for which “no missing codes” is guaranteed.

2/ V_IN= 0.05 dB, f_IN= 1 kHz, all measurements referred to a 0 dB (20 V ) input signal. The full Nyquist bandwidth is used for

p-p

all values.

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

6

DSCC FORM 2234

APR 97

Device type

01

Case outline

E

Terminal number

Terminal symbol

SAMPLE

CLK

1

2

3

4

5

SDATA

DGND

V_CC

6

NC

7

NC

8

9

AGND

AGND SENSE

V_IN

V_REF

V_EE

10

11

12

13

14

15

16

V_DD

SCLK

BUSY

CAL

NOTE: NC = No connect

FIGURE 1. Terminal connections.

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

7

DSCC FORM 2234

APR 97

Note: Shaded portions of input signals are optional. For best performance, it is recommended that these signals be held low

except when explicitly shown high.

FIGURE 2. Timing waveforms.

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

8

DSCC FORM 2234

APR 97

4. QUALITY ASSURANCE PROVISIONS

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be

in accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

test method 1015.

(2) T_A= +125°C, minimum.

b. Interim and final electrical test parameters shall be as specified in table II herein.

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table II herein.

c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for

groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for

device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed

for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

4.4.1 Group A inspection.

a. Tests shall be as specified in table II herein.

b. Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

9

DSCC FORM 2234

APR 97

TABLE II. Electrical test requirements.

Subgroups

Test requirements

Subgroups

(in accordance with

MIL-STD-883,

MIL-PRF-38535, table III)

method 5005, table I)

Device

class M

1

Device

class Q

1

Device

class V

1

Interim electrical

parameters (see 4.2)

Final electrical

parameters (see 4.2)

Group A test

requirements (see 4.4)

Group C end-point electrical

parameters (see 4.4)

Group D end-point electrical

parameters (see 4.4)

Group E end-point electrical

parameters (see 4.4)

1,2,3,4,5,6, 1/

9,10,11

1,2,3,4,5,6, 1/

9,10,11

1,2,3,4,5, 1/

6,9,10,11

1,2,3,4,5,6,

9,10,11

1,2,3,4,5,6,

9,10,11

1,2,3,4,5,6,

9,10,11

1

1,2,3,4,5,6,

9,10,11

1

1,4,9

1/ PDA applies to subgroup 1.

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method

1005 of MIL-STD-883.

b. T_A= +125°C, minimum.

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify

the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of

MIL-STD-883.

4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.

4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness

assured (see 3.5 herein).

a. End-point electrical parameters shall be as specified in table II herein.

b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as

specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to

radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All

device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at

T_A= +25°C ±5°C, after exposure, to the subgroups specified in table II herein.

c. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied.

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

10

DSCC FORM 2234

APR 97

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device

classes Q and V or MIL-PRF-38535, appendix A for device class M.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), design applications, and logistics purposes.

6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor

prepared specification or drawing.

6.1.2 Substitutability. Device class Q devices will replace device class M devices.

6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.

6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus when a system

application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users

and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering

microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544.

6.4 Comments. Comments on this drawing should be directed to DSCC-VA , Columbus, Ohio 43216-5000, or telephone

(614) 692-0547.

6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in

MIL-PRF-38535 and MIL-HDBK-1331.

6.6 Sources of supply.

6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.

The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to

this drawing.

6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.

The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been

submitted to and accepted by DSCC-VA.

SIZE

STANDARD

5962-95592

A

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

A

SHEET

11

DSCC FORM 2234

APR 97

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 01-11-16

Approved sources of supply for SMD 5962-95592 are listed below for immediate acquisition information only and

shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be

revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a

certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next

dated revision of MIL-HDBK-103 and QML-38535.

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

24355

Vendor

similar

PIN 2/

5962-9559201MEA

AD677TD/883B

1/ The lead finish shown for each PIN representing

a hermetic package is the most readily available

from the manufacturer listed for that part. If the

desired lead finish is not listed contact the vendor

to determine its availability.

2/ Caution. Do not use this number for item

acquisition. Items acquired to this number may not

satisfy the performance requirements of this drawing.

Vendor CAGE

number

Vendor name

and address

24355

Analog Devices

RT 1 Industrial Park

PO Box 9106

Norwood, MA 02062

Point of contact: 804 Woburn Street

Wilmington, MA 01887-3462

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoever for any inaccuracies in the

information bulletin.


型号：	AD677TD
厂家：	ADI
描述：	MICROCIRCUIT, DIGITAL-LINEAR, FAST, SERIAL, 16-BIT, A/D CONVERTER, MULTICHIP SILICON 微型电路，数字线性，速度快，串行， 16位A / D转换器，多芯片SILICON 转换器
文件：	总12页 (文件大小：72K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

AD677TD [ADI]

相关型号：

AD677TD/883B

AD677TD883B

AD678

AD678*

AD678AD

AD678AJ

AD678BD

AD678BJ

AD678JD

AD678JN

AD678JNZ

AD678JP