AD7776 [ADI]

LC2MOS, High Speed 1-, 4- & 8-Channel 10-Bit ADCs; LC2MOS ,高速1 ,4和8通道10位ADC
AD7776
型号: AD7776
厂家: ADI    ADI
描述:

LC2MOS, High Speed 1-, 4- & 8-Channel 10-Bit ADCs
LC2MOS ,高速1 ,4和8通道10位ADC

文件: 总12页 (文件大小:223K)
中文:  中文翻译
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2
LC MOS, High Speed  
1-, 4- & 8-Channel 10-Bit ADCs  
a
AD7776/AD7777/AD7778*  
FEATURES  
FUNCTIO NAL BLO CK D IAGRAMS  
AD7776: Single Channel  
AD7777: 4-Channel  
AD7778: 8-Channel  
Fast 10-Bit ADC: 2.5 s Worst Case  
+5 V Only  
V
CC  
CLKIN  
CONTROL  
REGISTER  
10  
Half-Scale Conversion Option  
Fast Interface Port  
Pow er-Dow n Mode  
ADCREG1  
DB0–DB9  
10-BIT  
ADC  
A
IN  
1
MUX  
T/H  
10  
C
REFIN  
V
BIAS  
APPLICATIONS  
HDD Servos  
Instrum entation  
REFIN  
REFIN  
RTN  
REF  
REFOUT  
V
SWING  
CONTROL LOGIC  
GENERAL D ESCRIP TIO N  
AD7776  
AGND  
T he AD7776, AD7777 and AD7778 are a family of high speed,  
multichannel, 10-bit ADCs primarily intended for use in R/W  
head positioning servos found in high density hard disk drives.  
T hey have unique input signal conditioning features that make  
them ideal for use in such single supply applications.  
DGND  
AGND  
CS RD WR  
BUSY/INT  
V
CC  
CLKIN  
A
IN  
A
IN  
A
IN  
A
IN  
1
2
3
4
CONTROL  
REGISTER  
By setting a bit in a control register within both the four-channel  
version, AD7777, and the eight-channel version, AD7778, the  
input channels can either be independently sampled or any two  
channels of choice can be simultaneously sampled. For all ver-  
MUX  
10  
T/H  
1
ADCREG2  
ADCREG1  
1
DB0–DB9  
10-BIT  
ADC  
10  
C
REFIN  
sions the specified input signal range is of the form VBIAS  
±
VSWING. H owever, if the RT N pin is biased at, say, 2 V the  
V
BIAS  
analog input signal range becomes 0 V to +2 V for all input  
channels. T his is covered in more detail under the section  
Changing the Analog Input Voltage Range. T he voltage VBIAS  
is the offset of the ADCs midpoint code from ground and is  
supplied either by an onboard reference available to the user  
(REFOUT ) or by an external voltage reference applied to  
REFIN. T he full-scale range (FSR) of the ADC is equal to  
2 VSWING where VSWING is nominally equal to REFIN/2. Addi-  
tionally, when placed in the half-scale conversion mode, the  
value of REFIN is converted. T his allows the channel offset(s)  
to be measured.  
REFIN  
T/H  
2
MUX  
2
V
SWING  
REF  
REFOUT  
RTN  
AGND  
AD7777  
CONTROL LOGIC  
REFIN  
DGND AGND  
V
CC  
CLKIN  
A 1  
IN  
A 2  
IN  
A 3  
IN  
A 4  
IN  
A 5  
IN  
CONTROL  
REGISTER  
Control register loading and ADC register reading, channel se-  
lect and conversion start are under the control of the µP. T he  
twos complemented coded ADCs are easily interfaced to a stan-  
dard 16-bit MPU bus via their 10-bit data port and standard  
microprocessor control lines.  
MUX  
1
10  
T/H  
1
ADCREG2  
ADCREG1  
A 6  
IN  
A 7  
IN  
A 8  
IN  
DB0–DB9  
10-BIT  
ADC  
10  
C
REFIN  
V
BIAS  
T he AD7776/AD7777/AD7778 are fabricated in linear compat-  
ible CMOS (LC2MOS), an advanced, mixed technology process  
that combines precision bipolar circuits with low power CMOS  
logic. T he AD7776 is available in a 24-pin SOIC package; the  
AD7777 is available in both 28-pin DIP and 28-pin SOIC pack-  
ages; the AD7778 is available in a 44-pin PQFP package.  
REFIN  
T/H  
2
MUX  
2
V
SWING  
REF  
REFOUT  
RTN  
AGND  
AD7778  
CONTROL LOGIC  
REFIN  
*P r otected by U.S. P atent No. 4,990,916.  
DGND AGND  
RD  
BUSY/INT  
WR  
CS  
REV. 0  
Inform ation furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assum ed by Analog Devices for its  
use, nor for any infringem ents of patents or other rights of third parties  
which m ay result from its use. No license is granted by im plication or  
otherwise under any patent or patent rights of Analog Devices.  
One Technology Way, P.O. Box 9106, Norw ood, MA 02062-9106, U.S.A.  
Tel: 617/ 329-4700  
Fax: 617/ 326-8703  
World Wide Web Site: http:/ / w w w .analog.com  
© Analog Devices, Inc., 1997  
(V = +5 V ؎ 5%; AGND = DGND = O V;  
CLKIN = 8 MHz; RTN = O V; CREFIN = 10 nF; all specifications TMIN to TMAX unless otherwise noted.)  
AD7776/AD7777/AD7778–SPECIFICATIONS  
CC  
P aram eter  
A Versions1  
Units  
Conditions/Com m ents  
DC ACCURACY  
Resolution2  
10  
Bits  
Relative Accuracy  
Differential Nonlinearity  
Bias Offset Error  
Bias Offset Error Match  
Plus or Minus Full-Scale Error  
Plus or Minus Full-Scale Error Match 10  
±1  
±1  
±12  
10  
±12  
LSB max  
LSB max  
LSB max  
LSB max  
LSB max  
LSB max  
See T erminology  
No Missing Codes; See T erminology  
See T erminology  
Between Channels, AD7777/AD7778 Only; See T erminology  
See T erminology  
Between Channels, AD7777/AD7778 Only; See T erminology  
ANALOG INPUT S  
Input Voltage Range  
All Inputs  
VBIAS ± VSWING  
V min/V max  
Input Current  
+200  
µA max  
VIN = VBIAS ± VSWING; Any Channel  
REFERENCE INPUT  
REFIN  
REFIN Input Current  
1.9/2.1  
+200  
V min/V max For Specified Performance  
µA max  
REFERENCE OUT PUT  
REFOUT  
DC Output Impedance  
Reference Load Change  
1.9/2.1  
5
±2  
V min/V max Nominal REFOUT = 2.0 V  
typ  
mV max  
mV max  
For Reference Load Current Change of 0 to ±500 µA  
±5  
For Reference Load Current Change of 0 to ±1 mA  
Reference Load Should Not Change During Conversion  
See T erminology  
Short Circuit Current3  
20  
mA max  
LOGIC OUT PUT S  
DB0–DB9, BUSY/INT  
VOL, Output Low Voltage  
VOH , Output High Voltage  
Floating State Leakage Current  
Floating State Capacitance3  
ADC Output Coding  
0.4  
4.0  
±10  
10  
V max  
V min  
µA max  
pF max  
ISINK = 1.6 mA  
ISOURCE = 200 µA  
T wos Complement  
LOGIC INPUT S  
DB0–DB9, CS, WR, RD, CLKIN  
Input Low Voltage, VINL  
Input High Voltage, VINH  
Input Leakage Current  
Input Capacitance3  
0.8  
2.4  
10  
V max  
V min  
µA max  
pF max  
10  
CONVERSION T IMING  
Acquisition T ime  
4.5 tCLKIN  
5.5 tCLKIN + 70  
14 tCLKIN  
28 tCLKIN  
125/500  
50  
ns min  
ns max  
ns max  
ns max  
See T erminology  
Single Conversion  
Double Conversion  
tCLKIN  
tCLKIN High  
tCLKIN Low  
ns min/ns max Period of Input Clock CLKIN  
ns min  
ns min  
Minimum High T ime for CLKIN  
Minimum Low T ime for CLKIN  
40  
POWER REQUIREMENT S  
VCC Range  
+4.75/+5.25  
V min/V max For Specified Performance  
ICC, Normal Mode  
15  
1.5  
mA max  
mA max  
CS = RD = +5 V, CR8 = 0  
CR8 = 1. All Linear Circuitry OFF  
ICC, Power-Down Mode  
Power-Up T ime to Operational  
Specifications  
500  
µs max  
From Power-Down Mode  
See T erminology  
DYNAMIC PERFORMANCE  
Signal to Noise and Distortion  
S/(N+D) Ratio  
T otal Harmonic Distortion (T HD)  
Intermodulation Distortion (IMD)  
–57  
–60  
–75  
dB min  
dB min  
dB typ  
VIN = 99.88 kHz Full-Scale Sine Wave with fSAMPLING = 380.95 kHz  
VIN = 99.88 kHz Full-Scale Sine Wave with fSAMPLING = 380.95 kHz  
fa = 103.2 kHz, fb = 96.5 kHz with fSAMPLING = 380.95 kHz. Both  
Signals Are Sine Waves at Half-Scale Amplitude  
Channel-to-Channel Isolation  
NOT ES  
–90  
dB typ  
VIN = 100 kHz Full-Scale Sine Wave with fSAMPLING = 380.95 kHz  
1T emperature range as follows: A = –40°C to +85°C.  
21 LSB = (2 × VSWING)/1024 = 1.95 mV for VSWING = 1.0 V.  
3Guaranteed by design, not production tested.  
Specifications subject to change without notice.  
–2–  
REV. 0  
AD7776/AD7777/AD7778  
1, 2  
TIMING SPECIFICATIONS (V = +5 V ؎ 5%; AGND = DGND = 0 V; all specifications TMIN to TMAX unless otherwise noted.)  
CC  
P aram eter  
Label  
Lim it at TMIN to TMAX Units  
Test Conditions/Com m ents  
INT ERFACE T IMING  
CS Falling Edge to WR or RD Falling Edge  
WR or RD Rising Edge to CS Rising Edge  
WR Pulse Width  
t1  
t2  
t3  
t4  
t5  
0
0
53  
60  
10  
45  
55  
10  
ns min  
ns min  
ns min  
ns m ax  
ns m in  
ns m ax  
ns min  
ns min  
ns min  
ns max  
CS or RD Active to Valid D ata3  
Bus Relinquish Tim e after RD4  
Tim ed fr om Whichever O ccur s Last  
Data Valid to WR Rising Edge  
Data Valid after WR Rising Edge  
WR Rising Edge to BUSY Falling Edge  
t6  
t7  
t8  
1.5 tCLKIN  
2.5 tCLKIN + 70  
CR9 = 0  
WR Rising Edge to BUSY Rising Edge or  
INT Falling Edge  
t9  
t10  
t11  
19.5 tCLKIN + 70  
33.5 tCLKIN + 70  
60  
ns max  
ns max  
ns max  
Single Conversion, CR6 = 0  
Double Conversion, CR6 = 1  
CR9 = 1  
WR or RD Falling Edge to INT Rising Edge  
NOT ES  
1See Figures 1 to 3.  
2T iming specifications in bold print are 100% production tested. All other times are guaranteed by design, not production tested. All input signals are specified with  
tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.  
3t4 is measured with the load circuit of Figure 4 and defined as the time required for an output to cross 0.8 V or 2.4 V.  
4t5 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 4. T he measured time is then extrapolated back  
to remove the effects of charging or discharging the 100 pF capacitor. T his means that the time t 5 quoted above is the true bus relinquish time of the device and, as  
such, is independent of the external bus loading capacitance.  
Specifications subject to change without notice.  
FIRST  
CONVERSION  
FINISHED  
SECOND  
CONVERSION  
FINISHED (CR6 = 1)  
AD7777/AD7778 ONLY  
(CR6 = 0)  
t3  
WR, RD  
t1  
t9  
t2  
t8  
CS  
RD  
BUSY  
(CR8 = 0)  
t10  
t11  
t9  
t5  
t4  
INT  
(CR8 = 1)  
DB0–DB9  
t10  
Figure 1. Read Cycle Tim ing  
Figure 3. BUSY/INT Tim ing  
I
OL  
t1  
t2  
1.6mA  
CS  
WR  
t3  
DB n  
+2.1V  
t6  
t7  
C
OUT  
100pF  
DB0–DB9  
I
OH  
200µA  
Figure 2. Write Cycle Tim ing  
Figure 4. Load Circuit for Bus Tim ing Characteristics  
REV. 0  
–3–  
AD7776/AD7777/AD7778  
ABSO LUTE MAXIMUM RATINGS*  
(T A = +25°C unless otherwise noted)  
VCC to AGND or DGND . . . . . . . . . . . . . . . . . . –0.3 V, +7 V  
AGND, RT N to DGND . . . . . . . . . . . . . 0.3 V, VCC + 0.3 V  
CS, RD, WR, CLKIN, DB0–DB9,  
BUSY/INT to DGND . . . . . . . . . . . . . 0.3 V, VCC + 0.3 V  
Analog Input Voltage to AGND . . . . . . . –0.3 V, VCC + 0.3 V  
REFOUT to AGND . . . . . . . . . . . . . . . . –0.3 V, VCC + 0.3 V  
REFIN to AGND . . . . . . . . . . . . . . . . . . –0.3 V, VCC + 0.3 V  
Operating T emperature Range  
SOIC Packages, Power Dissipation . . . . . . . . . . . . . . 875 mW  
θJA T hermal Impedance . . . . . . . . . . . . . . . . . . . . . 75°C/W  
Lead T emperature, Soldering  
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C  
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . +220°C  
PQFP Package, Power Dissipation . . . . . . . . . . . . . . 500 mW  
θJA T hermal Impedance . . . . . . . . . . . . . . . . . . . . . 95°C/W  
Lead T emperature, Soldering  
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C  
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . +220°C  
All Versions . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C  
Storage T emperature Range . . . . . . . . . . . . –65°C to +150°C  
Junction T emperature . . . . . . . . . . . . . . . . . . . . . . . . +150°C  
DIP Package, Power Dissipation . . . . . . . . . . . . . . . . 875 mW  
θJA T hermal Impedance . . . . . . . . . . . . . . . . . . . . . 75°C/W  
Lead T emperature, Soldering (10 sec) . . . . . . . . . . +260°C  
*Stresses above those listed under “Absolute Maximum Ratings” may cause  
permanent damage to the device. T his is a stress rating only; functional operation  
of the device at these or any other conditions above those listed in the operational  
sections of this specification is not implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device reliability.  
CAUTIO N  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection. Although  
the AD7776/AD7777/AD7778 feature proprietary ESD protection circuitry, permanent damage  
may occur on devices subjected to high energy electrostatic discharges. T herefore, proper ESD  
precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
P IN CO NFIGURATIO NS  
24-P in SO IC  
44-P in P Q FP  
DB0  
DB1  
1
2
3
4
5
24  
23  
C
REFIN  
AGND  
44 43 42 41 40 39 38 37 36 35 34  
DB2  
22 RTN  
1
33  
A
A
8
NC  
NC  
IN  
21 REFIN  
DB3  
20  
A
IN  
DGND  
DB4  
7
6
5
4
3
2
3
32  
31  
30  
29  
28  
27  
26  
IN  
AD7776  
19 AGND  
6
DB2  
A
IN  
IN  
IN  
TOP VIEW  
(Not to Scale)  
18  
17  
DB5  
7
REFOUT  
A
A
A
DB3  
DGND  
DB4  
DB5  
DB6  
DB7  
NC  
4
5
V
DB6  
8
9
CC  
AD7778  
TOP VIEW  
(Not to Scale)  
16 CLKIN  
15 WR  
14 CS  
DB7  
6
IN  
IN  
10  
11  
12  
DB8  
7
A
2
1
(MSB) DB9  
BUSY/INT  
8
A
IN  
13 RD  
9
25 AGND  
10  
11  
24  
23  
REFOUT  
28-P in D IP & SO IC  
V
NC  
CC  
DB0  
DB1  
NC  
1
2
3
4
5
6
7
8
9
28  
27  
26  
25  
24  
23  
22  
21  
20  
C
REFIN  
12  
13 14 15 16 17 18 19 20 21 22  
AGND  
RTN  
DB2  
DB3  
DGND  
DB4  
DB5  
DB6  
REFIN  
NC = NO CONNECT  
A
4
3
IN  
IN  
A
O RD ERING GUID E  
A 2  
IN  
AD7777  
TOP VIEW  
A
IN  
1
Tem perature  
Range  
No. of  
Channels  
P ackage  
O ption1  
(Not to Scale)  
AGND  
Model  
DB7 10  
DB8 11  
19  
18  
17  
REFOUT  
AD7776AR2  
AD7777AN  
AD7777AR2  
AD7778AS2  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
1
4
4
8
R-24  
N-28  
R-28  
S-44  
V
CC  
CLKIN  
(MSB) DB9 12  
BUSY/INT 13  
RD 14  
16 WR  
15 CS  
NOT ES  
NC = NO CONNECT  
1R = SOIC, N = Plastic DIP, S = PQFP.  
2Analog Devices reserves the right to ship devices branded with a J in place of  
the A, e.g., AD7776JR instead of AD7776AR. T emperature range remains  
–40°C to +85°C.  
REV. 0  
–4–  
AD7776/AD7777/AD7778  
P IN FUNCTIO N D ESCRIP TIO N  
Mnem onic  
D escription  
VCC  
+5 V Power Supply.  
Analog Ground.  
AGND  
DGND  
DB0–DB9  
Digital Ground. Ground reference for digital circuitry.  
Input/Output Data Bus. T his is a bidirectional data port from which ADC output data may be read and to which  
control register data may be written.  
BUSY/INT  
Busy/Interrupt Output. Active low logic output indicating A/D converter status. T his logic output has two modes  
of operation depending on whether location CR9 of the control register has been set low or high:  
If CR9 is set low, then the BUSY/INT output will behave as a BUSY signal. T he BUSY signal will go low and stay  
low for the duration of a single conversion, or if simultaneous sampling has been selected, BUSY will stay low for  
the duration of both conversions.  
If CR9 is set high, then the BUSY/INT output behaves as an INT ERRUPT signal. T he INT signal will go low  
and remain low after either a single conversion is completed or after a double conversion is completed if simulta-  
neous sampling has been selected. With CR9 high, the falling edge of WR or RD resets the INT line high.  
CS  
Chip Select Input. T he device is selected when this input is low.  
WR  
Write Input (Active Low). It is used in conjunction with CS to write data to the control register. Data is latched to the  
registers on the rising edge of WR. Following the rising edge of WR, the analog input is acquired and a conversion is  
started.  
RD  
Read Input (Active Low). It is used in conjunction with CS to enable the data outputs from the ADC registers.  
AIN1–8  
Analog Inputs 1–8. T he analog input range is VBIAS ± VSWING where VBIAS and VSWING are defined by the reference  
voltage applied to REFIN. Input resistance between any of the analog input pins and AGND is 10 kor greater.  
REFIN  
Voltage Reference Input. T he AD7776/AD7777/AD7778 are specified over a voltage reference range of 1.9 V to 2.1 V  
with a nominal value of 2.0 V. T his REFIN voltage provides the VBIAS and VSWING levels for the input channel(s).  
VBIAS is equal to REFIN and VSWING is nominally equal to REFIN/2. Input resistance between this REFIN pin and  
AGND is 10 kor greater.  
REFOUT  
CREFIN  
RT N  
Voltage Reference Output. T he internal voltage reference, which is nominally 2.0 V and can be used to provide the  
bias voltage (VBIAS) for the input channel(s), is provided at this pin.  
Reference Decoupling Capacitor. A 10 nF capacitor must be connected from this pin to AGND to ensure correct  
operation of the high speed ADC.  
Signal Return Path for the input channel(s). Normally RT N is connected to AGND at the package.  
CIRCUIT D ESCRIP TIO N  
AD C Tr ansfer Function  
1FF  
1FE  
For all versions, an input signal of the form VBIAS ± VSWING is  
expected. T his VBIAS signal level operates as a pseudo ground to  
which all input signals must be referred. T he VBIAS level is de-  
termined by the voltage applied to the REFIN pin. T his can be  
driven by an external voltage source or, alternatively, the on-  
board 2 V reference, available at REFOUT , can be used. T he  
magnitude of the input signal swing is equal to VBIAS/2 (or  
REFIN/2) and is set internally. With a REFIN of 2 V, the analog  
input signal level varies from 1 V up to 3 V i.e., 2 ± 1 V. Fig-  
ure 5 shows the transfer function of the ADC and its relation-  
ship to VBIAS and VSWING. T he half-scale twos complement code  
of the ADC, 000 Hex (00 0000 0000 Binary), occurs at an input  
voltage equal to VBIAS. T he input full-scale range of the ADC is  
equal to 2 VSWING, so that the Plus Full-Scale transition (1FE to  
1FF) occurs at a voltage equal to VBIAS + VSWING – 1.5 LSBs  
and the minus full-scale code transition (200 to 201) occurs at  
a voltage VBIAS – VSWING + 0.5 LSBs.  
ADC  
OUTPUT  
CODE  
(HEX)  
000  
202  
201  
200  
VBIAS  
VBIAS–VSWING  
VBIAS+VSWING  
ANALOG INPUT, VIN  
Figure 5. ADC Transfer Function  
REV. 0  
–5–  
AD7776/AD7777/AD7778  
CO NTRO L REGISTER  
CR6: Determines whether operation is on a single channel or  
simultaneous sampling on two channels. Location CR6 is a  
“dont care” for the AD7776.  
T he control register is 10-bits wide and can only be written to.  
On power-on, all locations in the control register are automati-  
cally loaded with 0s. For the single channel AD7776, locations  
CR0 to CR6 of the control register are “don’t cares.” For the  
quad channel AD7777, locations CR2 and CR5 are “dont  
cares.” Individual bit functions are described below.  
CR6 Function  
0
Single channel operation. Channel select  
address is contained in locations CR0–CR2.  
T wo channels simultaneously sampled  
and sequentially converted. Channel  
select addresses contained in locations  
CR0–CR2 and CR3–CR5.  
1
CR0CR2: Channel Address Locations. Determines which channel  
will be selected and converted for single channel operation. For si-  
multaneous sampling operation CR0–CR2 holds the address of one  
of the two channels to be sampled.  
CR7: Determines whether the device is in the normal operating  
mode or in the half-scale test mode.  
AD 7776  
CR2 CR1 CR0 Function  
CR7 Function  
X*  
X
X
Select AIN  
1
0
1
Normal Operating Mode  
Half-Scale T est Mode  
*X = Dont Care  
In the half-scale test mode REFIN is internally connected as an  
analog input(s). In this mode locations CR0–CR2 and CR3–  
CR5 are all “dont cares” since it is REFIN which will be con-  
verted. For the AD7777 and AD7778, the contents of location  
CR6 still determine whether a single or a double conversion is  
carried out on the REFIN level.  
AD 7777  
CR2 CR1 CR0 Function  
X*  
X
X
0
0
1
1
0
1
0
1
Select AIN1  
Select AIN2  
Select AIN3  
Select AIN4  
X
CR8: Determines whether the device is in the normal operating  
*X = Dont Care  
mode or in the powerdown mode.  
AD 7778  
CR8 Function  
CR2 CR1 CR0 Function  
0
1
Normal Operating Mode  
Powerdown Mode  
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
Select AIN1  
Select AIN2  
Select AIN3  
Select AIN4  
Select AIN5  
Select AIN6  
Select AIN7  
Select AIN8  
In the powerdown mode all linear circuitry is turned off and the  
REFOUT output is weakly (5 k) pulled to AGND. T he input  
impedance of the analog inputs and of the REFIN input re-  
mains the same in either normal mode or powerdown mode. See  
under Circuit Description—Powerdown Mode.  
CR9: Determines whether BUSY/INT output flag goes low and  
remains low during conversion(s) or else goes low and remains  
low after the conversion(s) is (are) complete.  
CR3CR5: Channel Address Locations. Only applicable for simul-  
taneous sampling with the AD7777 or AD7778 when CR3–CR5  
holds the address of the second channel to be sampled.  
CR9 BUSY/INT Functionality  
0
Output goes low and remains low during  
conversion(s).  
AD 7777  
1
Output goes low and remains low after conversion(s)  
is (are) complete.  
CR5 CR4 CR3 Function  
AD C Conver sion Star t Tim ing  
X*  
X
X
0
0
1
1
0
1
0
1
Select AIN1  
Select AIN2  
Select AIN3  
Select AIN4  
Figure 6 shows the operating waveforms for the start of a con-  
version cycle. On the rising edge of WR, the conversion cycle  
starts with the acquisition and tracking of the selected ADC  
channel, AIN1–8. T he analog input voltage is held 40 ns (typi-  
cally) after the first rising edge of CLKIN following four com-  
plete CLKIN cycles. If tD in Figure 6 is greater than 12 ns, the  
falling edge of CLKIN as shown will be seen as the first falling  
clock edge. If tD is less than 12 ns, the first falling clock edge to  
be recognized will not occur until one cycle later.  
X
*X = Dont Care  
AD 7778  
CR5 CR4 CR3 Function  
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
Select AIN1  
Select AIN2  
Select AIN3  
Select AIN4  
Select AIN5  
Select AIN6  
Select AIN7  
Select AIN8  
Following the “hold” on the analog input(s), two complete  
CLKIN cycles are allowed for settling purposes before the MSB  
decision is made. The actual decision point occurs approximately  
40 ns after the rising edge of CLKIN as shown in Figure 6. A  
further two CLKIN cycles are allowed for the second MSB  
decision. T he succeeding bit decisions are made approximately  
40 ns after each rising edge of CLKIN until the conversion is  
complete. At the end of conversion, if a single conversion  
has been requested (CR6 = 0), the BUSY/INT line changes  
REV. 0  
–6–  
AD7776/AD7777/AD7778  
state (as programmed by CR9), and the SAR contents are trans-  
ferred to the first register ADCREG1. T he SAR is then reset in  
readiness for a new conversion. If simultaneous sampling has  
been requested (CR6 = 1), no change occurs in the status of the  
BUSY/INT output and the ADC automatically starts the second  
conversion. At the end of this conversion the BUSY/INT line  
changes state (as programmed by CR9) and the SAR contents  
are transferred to the second register, ADCREG2.  
Control inputs CS, WR and RD retain their purpose while the  
AD7776/ AD7777/AD7778 is in powerdown. If no conversions  
are in progress when the AD7776/AD7777/AD7778 is placed  
into the powerdown modes, the contents of the ADC registers,  
ADCREG1 and ADCREG2, are retained during powerdown  
and can be read as normal. On returning to normal operating  
mode a new conversion (or conversions, dependent on CR6) is  
automatically started. On completion, the invalid conversion  
results are loaded into the ADC registers losing the previous  
valid results.  
WR  
tD*  
In order to achieve the lowest possible power consumption in  
the powerdown mode special attention must be paid to the state  
of the digital and analog inputs and outputs:  
CLKIN  
40ns  
TYP  
40ns  
TYP  
• Because each analog input channel sees a resistive divider to  
AGND, the input resistance of which does not change be-  
tween normal and powerdown modes, driving the analog input  
signals to 0 V or as close as possible to 0 V will minimize the  
power dissipated in the input signal conditioning circuitry.  
VIN  
CHANNEL ACQUISITION  
'HOLD'  
TIMING SHOWN FOR tD GREATER THAN 12ns  
DB9 (MSB)  
*
• Similarly, the REFIN input sees a resistive divider to AGND,  
the input resistance of which does not change between normal  
and powerdown modes. If an external reference is being used,  
then driving this reference input to 0 V or as close as possible  
to 0 V will minimize the power dissipated in the input signal  
conditioning circuitry.  
Figure 6. ADC Conversion Start Tim ing  
Tr ack-and-H old  
T he track-and-hold (T /H) amplifiers on the analog input(s) of  
the AD7776/AD7777/AD7778 allow the ADC to accurately  
convert an input sine wave of 2 V peak-peak amplitude up to a  
frequency of 189 kHz, the Nyquist frequency of the ADC when  
operated at its maximum throughput rate of 378 kHz. T his  
maximum rate of conversion includes conversion time and time  
between conversions. Because the input bandwidth of the track-  
and-hold is much greater than 189 kHz, the input signal should  
be band limited to avoid folding unwanted signals into the band  
of interest.  
• Since the REFOUT pin is pulled to AGND via, typically, a  
5 kresistor, any voltage above 0 V that this output may be  
pulled to by external circuitry will dissipate unnecessary  
power.  
Digital inputs CS, WR & RD should all be held at VCC or as  
close as possible. CLKIN should be held as close as possible  
to either 0 V or VCC.  
P ower down  
T he AD7776/AD7777/AD7778 can be placed in a powerdown  
mode simply by writing a logic high to location CR8 of the con-  
trol register. T he following changes are effected immediately on  
writing a “1” to location CR8:  
• Since the BUSY/INT output is actively driven to a logic high,  
any loading on this pin to 0 V will dissipate power.  
T he AD7776/AD7777/AD7778 comes out of the powerdown  
mode when a Logic “0” is written to location CR8 of the con-  
trol register. Note that the contents of the other locations in the  
control register are retained when the device is placed in  
powerdown and are valid when power is restored. H owever,  
coming out of powerdown provides an opportunity to reload  
the complete contents of the control register without any extra  
instructions.  
• Any conversion in progress is terminated.  
• If a conversion is in progress, the leading edge of WR immedi-  
ately drives the BUSY/INT output high.  
• All the linear circuitry is turned off.  
• T he REFOUT output stops being driven and is weakly (5 k)  
pulled to analog ground.  
REV. 0  
–7–  
AD7776/AD7777/AD7778  
Figure 10 shows the interface with the 80C196KB @ 12 MHz  
and the 80C196KC @ 16 MHz. One wait state is required with  
the 16 MHz machine. T he 80C196 is configured to operate  
with a 16-bit multiplexed address/data bus.  
Micr opr ocessor Inter facing Cir cuits  
T he AD7776/AD7777/AD7778 family of ADCs is intended to  
interface to DSP machines such as the ADSP-2101, ADSP-2105,  
the T MS320 family and microcontrollers such as the 80C196  
family.  
T able I gives a truth table for the AD7776/AD7777/AD7778  
and summarizes their microprocessor interfacing features. Note  
that a read instruction to any of the devices while a conversation  
is in progress will immediately stop that conversion and return  
unreliable data over the data bus.  
Figure 7 shows the AD7776/AD7777/AD7778 interfaced to the  
TMS320C10 @ 20.5 MHz and the TMS320C14 @ 25 MHz.  
Figure 8 shows the interface with the TMS320C25 @ 40 MHz.  
Note that one wait state is required with this interface. The  
ADSP-2101-50 and the ADSP-2105-40 interface is shown in  
Figure 9. One wait state is required with either of these machines.  
A13–A0  
ADDRESS BUS  
A11–A0  
ADDRESS BUS  
ADDR  
DECODE  
ADDR  
DECODE  
TMS320C10-20.5  
TMS320C14-25  
CS  
CS  
EN  
DMS  
AD7776/7/8*  
AD7776/7/8*  
WR  
WR  
WE  
WR  
RD  
RD  
(C10) DEN  
(C14) REN  
RD  
DB9–DB0  
ADSP-2101-50  
ADSP-2105-40  
DB9–DB0  
D23–D6  
DATA BUS  
D15–D0  
DATA BUS  
*
ADDITIONAL PINS OMITTED FOR CLARITY  
*
ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 9. AD7776/AD7777/AD7778 to ADSP-2101 and  
ADSP-2105 Interface  
Figure 7. AD7776/AD7777/AD7778 to TMS320C10 and  
TMS320C14 Interface  
AD15–AD6  
ADDRESS BUS  
(PORT 4)  
A15–A0  
IS  
ADDRESS BUS  
'373  
LATCH  
ADDR  
DECODE  
ALE  
READY  
MSC  
AD7776/7/8*  
CS  
80C196KB-12  
80C196KC-16  
ADDR  
AD7776/7/8*  
CS  
DECODER  
STRB  
R/W  
WR  
WR  
WR  
RD  
RD  
RD  
TMS320C25-40  
DB9–DB0  
DATA BUS (10)  
DB9–DB0  
AD7–AD0  
(PORT 3)  
D15–D0  
DATA BUS  
*
ADDITIONAL PINS OMITTED FOR CLARITY  
*
ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 10. AD7776/AD7777/AD7778 to 80C196 Interface  
Figure 8. AD7776/AD7777/AD7778 to TMS320C25 Interface  
REV. 0  
–8–  
AD7776/AD7777/AD7778  
Table I. AD 7776/AD 7777/AD 7778 Truth Table for Microprocessor Interfacing  
CS  
RD  
WR  
D B0–D B9 Function/Com m ents  
1
0
0
X*  
1
X*  
j
1
High Z  
Data Port High Impedance  
CR Data  
Load control register (CR) data to control register and start a conversion.  
k
ADC Data ADC data placed on data bus. Depending upon location CR6 of the control register, one or two  
Read instructions will be required.  
If CR6 is low, i.e., single channel conversion selected, a read instruction returns the contents of  
ADCREG1. Succeeding read instructions continue to return the contents of ADCREG1.  
If CR6 is high, i.e., simultaneous sampling (double conversion) selected, the first read instruction  
returns the contents of ADCREG1 while the second read instruction returns the contents of  
ADCREG2. A third read instruction returns ADCREG1 again, the fourth ADCREG2, etc.  
*X = Dont Care  
D ESIGN INFO RMATIO N  
TERMINO LO GY  
Layout H ints  
Relative Accur acy  
Ensure that the layout for the printed circuit board has the digi-  
tal and analog grounds separated as much as possible. T ake care  
not to run any digital track alongside an analog signal track.  
Guard (screen) the analog input(s) with RT N.  
For the AD7776, AD7777 and AD7778, relative accuracy or  
endpoint nonlinearity is the maximum deviation, in LSBs, of the  
ADCs actual code transition points from a straight line drawn  
between the endpoints of the ADC transfer function.  
Establish a single point analog ground separate from the logic  
system ground and as close as possible to the AD7776/AD7777/  
AD7778. Both the RT N and AGND pins on the AD7776/  
AD7777/AD7778 and all other signal grounds should be con-  
nected to this single point analog ground. In turn, this star  
ground should be connected to the digital ground at one point  
only—preferably at the low impedance power supply itself.  
D iffer ential Nonlinear ity  
Differential nonlinearity is the difference between the measured  
change and the ideal 1 LSB change between any two adjacent  
codes. A specified maximum differential nonlinearity of ±1 LSB  
ensures no missed codes.  
Bias O ffset Er r or  
For an ideal 10-bit ADC, the output code for an input voltage  
equal to VBIAS should be midscale. T he bias offset error is the  
difference between the actual midpoint voltage for midscale  
code and VBIAS, expressed in LSBs.  
Low impedance analog and digital power supply common re-  
turns are important for correct operation of the devices, so make  
the foil width for these tracks as wide as possible.  
In order to ensure a low impedance +5 V power supply at the  
actual VCC pin, it will be necessary to employ bypass capacitors  
from the pin itself to DGND. A 4.7 µF tantalum capacitor in  
parallel with a 0.1 µF ceramic capacitor is sufficient.  
Bias O ffset Er r or Match  
T his is a measure of how closely the bias offset errors of all  
channels track each other. T he bias offset error match of any  
channel must be no further away than 10 LSBs from the bias  
offset error of any other channel, regardless of whether the  
channels are independently sampled or simultaneously sampled.  
AD C Cor r uption  
Executing a read instruction to the AD7776/AD7777/AD7778  
while a conversion is in progress will immediately halt the con-  
version and return invalid data over the data bus. T he BUSY/  
INT output pin should be monitored closely and all read in-  
structions to the AD7776/AD7777/AD7778 prevented while  
this output shows that a conversion is in progress.  
P lus and Minus Full-Scale Er r or  
T he input channels of the ADC can be considered to have  
bipolar (positive and negative) input ranges, but which are re-  
ferred to VBIAS (or REFIN) instead of AGND. Positive full-scale  
error for the ADC is the difference between the actual input  
voltage required to produce the plus full-scale code transition  
and the ideal input voltage (VBIAS + VSWING –1.5 LSB), ex-  
pressed in LSBs. Minus full-scale error is similarly specified for  
the minus full-scale code transition, relative to the ideal input  
voltage for this transition (VBIAS – VSWING + 0.5 LSB). Note that  
the full-scale errors for the ADC input channels are measured  
after their respective bias offset errors have been adjusted out.  
Executing a write instruction to the AD7776/AD7777/AD7778  
while a conversion is in progress immediately halts the conver-  
sion, the falling edge of WR driving the BUSY/INT output high.  
T he analog input(s) is sampled as normal and a new conversion  
sequence (dependent upon CR6) is started.  
AD C Conver sion Tim e  
Although each conversion takes only 14 CLKIN cycles, it can  
take between 4.5 to 5.5 CLKIN cycles to acquire the analog  
input(s) after the WR input goes high and before any conver-  
sions start.  
P lus and Minus Full-Scale Er r or Match  
T his is a measure of how closely the full-scale errors of all chan-  
nels track each other. T he full-scale error match of any channel  
must be no further away than 10 LSBs from the respective full-  
scale error of any other channel, regardless of whether the chan-  
nels are independently sampled or simultaneously sampled.  
REV. 0  
–9–  
AD7776/AD7777/AD7778  
Shor t Cir cuit Cur r ent  
Figure 11 shows a 2048 point FFT plot for a single channel of  
the AD7778 with an input signal of 99.88 kHz. T he SNR is  
58.71 dB. It can be seen that most of the harmonics are buried  
in the noise floor. It should be noted that the harmonics are  
taken into account when calculating the S/(N+D).  
T his is defined as the maximum current which will flow either  
into or out of the REFOUT pin if this pin is shorted to any  
potential between 0 V and VCC. T his condition can be allowed  
for up to 10 seconds provided that the power dissipation of the  
package is not exceeded.  
0
Signal-to-Noise and D istor tion Ratio, S/(N+D )  
Signal-to-noise and distortion ratio, S/(N+D), is the ratio of the  
rms value of the measured input signal to the rms sum of all  
other spectral components below the Nyquist frequency, includ-  
ing harmonics but excluding dc. T he value for S/(N+D) is given  
in decibels.  
INPUT FREQUENCY =  
99.88 kHz  
SAMPLE FREQUENCY =  
380.95 kHz  
SNR = 58.7 dB  
–20  
T
A = +25°C  
–40  
–60  
Total H ar m onic D istor tion, TH D  
T otal harmonic distortion is the ratio of the rms sum of the first  
five harmonic components to the rms value of a full-scale input  
signal and is expressed in decibels. For the AD7776/AD7777/  
AD7778, total harmonic distortion (T HD) is defined as:  
–80  
–90  
2
2
2
2
(V2 + V3 + V4 + V52 + V6 )1/2  
0
99.88  
20 log =  
FREQUENCY – kHz  
V1  
Figure 11. ADC FFT Plot  
where V1 is the rms amplitude of the fundamental and V2,  
V3, V4, V5 and V6 are the rms amplitudes of the individual  
harmonics.  
T he relationship between S/(N+D) and resolution (n) is ex-  
pressed by the following equation:  
Inter m odulation D istor tion, IMD  
With inputs consisting of sine waves at two frequencies, fa and  
fb, any active device with nonlinearities will create distortion  
products, of order (m + n), at sum and difference frequencies of  
mfa + nfb, where m, n = 0, 1, 2, 3. Intermodulation terms are  
those for which m or n is not equal to zero. For example, the  
second order terms include (fa + fb) and (fa – fb) and the third  
order terms include (2 fa + fb), (2 fa – fb), (fa + 2 fb) and (fa –  
2 fb).  
S/(N+D) = (6.02n + 1.76) dB  
T his is for an ideal part with no differential or integral linearity  
errors. T hese errors will cause a degradation in S/(N+D). By  
working backwards from the above equation, it is possible to get  
a measure of ADC performance expressed in effective number  
of bits (n).  
Channel-to-Channel Isolation  
S/(N+D) (dB) – 1.76  
n(effective) =  
Channel-to-channel isolation is a measure of the level of cross-  
talk between channels. It is measured by applying a full-scale  
100 kHz sine wave signal to any one of the input channels and  
monitoring the remaining channels. T he figure given is the  
worst case across all channels.  
6.02  
T he effective number of bits plotted vs. frequency for a single  
channel of the AD7778 is shown in Figure 12. T he effective  
number of bits is typically 9.5.  
10  
9.5  
9
D IGITAL SIGNAL P RO CESSING AP P LICATIO NS  
In digital signal processing (DSP) application areas like voice  
recognition, echo cancellation and adaptive filtering, the dy-  
namic characteristics S/(N+D), T HD & IMD of the ADC are  
critical. T he AD7776/AD7777/AD7778 are specified dynami-  
cally as well as with standard dc specifications. Because the  
track/hold amplifier has a wide bandwidth, an antialiasing filter  
should be placed on the analog inputs to avoid aliasing of high  
frequency noise back into the bands of interest.  
SAMPLE FREQUENCY = 378.4 kHz  
8.5  
T
= +24°C  
A
T he dynamic performance of the ADC is evaluated by applying  
a sine wave signal of very low distortion to a single analog input  
which is sampled at a 380.95 kHz sampling rate. A fast Fourier  
transform (FFT ) plot or histogram plot is then generated from  
which the signal to noise and distortion, harmonic distortion  
and dynamic differential nonlinearity data can be obtained.  
Similarly, for intermodulation distortion, an input signal con-  
sisting of two pure sine waves at different frequencies is applied  
to the AD7776/AD7777/AD7778.  
8
7.5  
0
189.2  
INPUT FREQUENCY – kHz  
Figure 12. Effective Num ber of Bits vs. Frequency  
REV. 0  
–10–  
AD7776/AD7777/AD7778  
Changing the Analog Input Voltage Range  
RT N is tied to REFOUT then the analog input range becomes  
0 V to 2 V. T he fixed 2 V analog input voltage span of the ADC  
can range from 1 V to 3 V (RT N = 0 V) to 0 V to 2 V (RT N =  
2 V), i.e., with proper biasing, an input signal range from 0.3 V  
to 2.3 V can be covered. Both the relative accuracy and differen-  
tial nonlinearity performance remains essentially unchanged in  
this mode while the SNR and T HD performance are typically  
2 dB to 3 dB worse than standard.  
By biasing the RT N pin above AGND it is possible to change  
the analog input voltage range from its VBIAS ± VSWING format to  
a more traditional 0 V to VREF range. T he new input range can  
be described as  
VOFFSET to (VOFFSET + REFIN)  
where 0 V VOFFSET  
1 V. T o produce this range the RT N pin  
must be biased to (REFIN – 2 VOFFSET). For instance if  
O UTLINE D IMENSIO NS  
D imensions shown in inches and (mm).  
R-24  
24-Lead Wide-Body SO IC  
24  
13  
0.299 (7.6)  
0.291 (7.4)  
0.419 (10.65)  
0.394 (10.00)  
PIN 1  
1
12  
0.614 (15.6)  
0.598 (15.2)  
0.104 (2.65)  
0.093 (2.35)  
0.013 (0.32)  
0.012 (0.3)  
0.004 (0.1)  
0.050 (1.27)  
BSC  
0.005 (1.27)  
0.015 (0.40)  
0.019 (0.49)  
0.014 (0.35)  
0.009 (0.23)  
R-28  
28-Lead Wide-Body SO IC  
28  
15  
0.299 (7.60)  
0.291 (7.39)  
0.414 (10.52)  
0.398 (10.10)  
PIN 1  
1
14  
0.03 (0.76)  
0.02 (0.51)  
0.708 (18.02)  
0.696 (17.67)  
0.096 (2.44)  
0.089 (2.26)  
0.01 (0.254)  
0.006 (0.15)  
0.013 (0.32)  
0.009 (0.23)  
0.050 (1.27)  
BSC  
0.042 (1.067)  
0.018 (0.457)  
0.019 (0.49)  
0.014 (0.35)  
1. LEAD NO. 1 IDENTIFIED BY A DOT.  
2. SOIC LEADS WILL BE EITHER TIN PLATED OF SOLDER DIPPED  
IN ACCORDANCE WITH MIL-M-38510 REQUIREMENTS.  
REV. 0  
–11–  
AD7776/AD7777/AD7778  
O UTLINE D IMENSIO NS  
D imensions shown in inches and (mm).  
N-28  
28-Lead P lastic D IP  
28  
15  
0.550 (13.97)  
0.530 (13.462)  
PIN 1  
14  
1
0.606 (15.39)  
0.594 (15.09)  
1.450 (36.83)  
1.440 (36.576)  
0.200  
(5.080)  
MAX  
0.160 (4.06)  
0.140 (3.56)  
0.175 (4.45)  
0.120 (3.05)  
0.012 (0.305)  
0.008 (0.203)  
15  
°
0
°
0.020 (0.508)  
0.015 (0.381)  
0.105 (2.67)  
0.095 (2.41)  
0.065 (1.65)  
0.045 (1.14)  
SEATING  
PLANE  
S-44  
44-P in P Q FP  
0.547 ± 0.01 SQ  
(13.9 ± 0.25)  
0.096 (2.45) MAX  
0.394 ± 0.004 SQ  
(10 ± 0.1)  
0.031 ± 0.006  
(0.8 ± 0.15)  
4°± 4°  
23  
33  
34  
22  
0.394 ± 0.004  
TOP VIEW  
(10 ± 0.1)  
PIN 1  
44  
12  
1
11  
0.036 ± 0.004  
(0.92 ± 0.1)  
0.036 ± 0.004  
(0.92 ± 0.1)  
0.079 + 0.004/–0.002  
(2 + 0.1/–0.05)  
0.014 ± 0.002  
(0.35 ± 0.05)  
0.031 ± 0.002  
(0.8 ± 0.05)  
REV. 0  
–12–  

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LC2MOS, High Speed 1-,4-,and 8-Channel 10-Bit ADCs
ADI

AD7776_15

LC MOS High Speed 1. 4 nad 8 Channel 10 Bit ADCs
ADI

AD7777

LC2MOS, High Speed 1-, 4- & 8-Channel 10-Bit ADCs
ADI

AD7777AN

LC2MOS, High Speed 1-, 4- & 8-Channel 10-Bit ADCs
ADI

AD7777AN

4-CH 10-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PDIP28, PLASTIC, DIP-28
ROCHESTER

AD7777ANZ

High Speed 4-Channel 10-Bit CMOS ADC
ADI

AD7777AR

LC2MOS, High Speed 1-, 4- & 8-Channel 10-Bit ADCs
ADI

AD7777AR

4-CH 10-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PDSO28, MS-013AE, SOIC-28
ROCHESTER