AD9012TQ883B [ADI]

1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CDIP28, CERDIP-28;
AD9012TQ883B
型号: AD9012TQ883B
厂家: ADI    ADI
描述:

1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CDIP28, CERDIP-28

CD 转换器
文件: 总11页 (文件大小:53K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
REVISIONS  
LTR  
DESCRIPTION  
DATE (YR-MO-DA)  
APPROVED  
A
B
C
D
Changes in accordance with NOR 5962-R213-92.  
92-06-19  
98-11-04  
99-08-13  
01-11-14  
M. A. Frye  
Changes to table I. Editorial changes throughout. - drw  
Raymond Monnin  
Raymond Monnin  
Raymond Monnin  
Change to the input bias current test and input resistance test in table I. –rrp  
Add footnote to table I. Editorial changes throughout. – drw  
THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.  
REV  
SHEET  
REV  
SHEET  
REV STATUS  
OF SHEETS  
PMIC N/A  
REV  
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
D
SHEET  
10  
PREPARED BY  
Joseph A. Kerby  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216  
CHECKED BY  
Charles E. Besore  
STANDARD  
MICROCIRCUIT  
DRAWING  
http://www.dscc.dla.mil  
APPROVED BY  
Michael A. Frye  
THIS DRAWING IS AVAILABLE  
FOR USE BY ALL  
MICROCIRCUIT, LINEAR, HIGH SPEED 8-BIT A/D  
CONVERTER, MONOLITHIC SILICON  
DEPARTMENTS  
AND AGENCIES OF THE  
DEPARTMENT OF DEFENSE  
DRAWING APPROVAL DATE  
90-02-16  
AMSC N/A  
REVISION LEVEL  
D
SIZE  
A
CAGE CODE  
5962-89654  
67268  
SHEET  
1
OF  
10  
DSCC FORM 2233  
APR 97  
5962-E074-02  
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.  
1. SCOPE  
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in  
accordance with MIL-PRF-38535, appendix A.  
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:  
5962-89654  
01  
X
X
Drawing number  
Device type  
(see 1.2.1)  
Case outline  
(see 1.2.2)  
Lead finish  
(see 1.2.3)  
1.2.1 Device types. The device types identify the circuit function as follows:  
Device type  
Generic number  
Circuit function  
01  
02  
AD9012S  
AD9012T  
8 Bit A/D  
8 Bit A/D  
1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:  
Outline letter  
Descriptive designator  
Terminals  
Package style  
X
3
GDIP1-T28 or CDIP2-T28  
CQCC1-N28  
28  
28  
Dual-in-line  
Square leadless chip carrier  
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.  
1.3 Absolute maximum ratings.  
Positive supply voltage (VS+) .................................................. +6 V dc  
Negative supply voltage (VS-).................................................. -6 V dc  
Analog input voltage................................................................ -2.1 V dc to +0.5 V dc  
Power dissipation (PD) (TA = +25°C):  
Case outline X.................................................................. 2.5 W  
Case outline 3 .................................................................. 1.8 W  
Storage temperature range ..................................................... -65°C to +150°C  
Lead temperature (soldering, 10 seconds) ............................. +300°C  
Junction temperature (TJ)........................................................ +175°C  
Thermal resistance, junction-to-case (θJC) .............................. See MIL-STD-1835  
Thermal resistance, junction-to-ambient (θJA):  
Case outline X.................................................................. 60°C/W  
Case outline 3 .................................................................. 80°C/W  
ENCODE input voltage............................................................ 0 V to +5 V dc  
OVERFLOW INH input voltage ............................................... 0 V to -5.2 V dc  
Reference input voltage (+VREF -VREF) ................................... -3.5 to +0.1 V dc 1/  
Reference midpoint current..................................................... ±4 mA  
Digital output current............................................................... 30 mA  
Differential reference voltage .................................................. 2.1 V dc  
1/ +VREF -VREF under all circumstances.  
SIZE  
STANDARD  
MICROCIRCUIT DRAWING  
5962-89654  
A
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
D
SHEET  
2
DSCC FORM 2234  
APR 97  
1.4 Recommended operating conditions.  
Ambient operating temperature range (TA) ............................. -55°C to +125°C  
Positive supply voltage (VS+) .................................................. +5 V dc  
Negative supply voltage (VS-).................................................. -5.2 V dc  
2. APPLICABLE DOCUMENTS  
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a  
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed  
in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in  
the solicitation.  
SPECIFICATION  
DEPARTMENT OF DEFENSE  
MIL-PRF-38535 -- Integrated Circuits, Manufacturing, General Specification for.  
STANDARDS  
DEPARTMENT OF DEFENSE  
MIL-STD-883  
-
Test Method Standard Microcircuits.  
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.  
HANDBOOKS  
DEPARTMENT OF DEFENSE  
MIL-HDBK-103 -- List of Standard Microcircuit Drawings.  
MIL-HDBK-780 - Standard Microcircuit Drawings.  
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization  
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)  
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text  
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a  
specific exemption has been obtained.  
SIZE  
STANDARD  
5962-89654  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
D
SHEET  
3
DSCC FORM 2234  
APR 97  
3. REQUIREMENTS  
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-  
JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer  
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-  
PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying  
activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan  
may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.  
These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-  
PRF-38535 is required to identify when the QML flow option is used.  
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as  
specified in MIL-PRF-38535, appendix A and herein.  
3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1.  
3.2.2 System timing diagram and load circuit. The system timing diagram and load circuit shall be as specified on figure 2.  
3.2.3 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.  
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are  
as specified in table I and shall apply over the full ambient operating temperature range.  
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical  
tests for each subgroup are described in table I.  
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN  
listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For  
packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the  
option of not marking the "5962-" on the device.  
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance  
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in  
accordance with MIL-PRF-38535 to identify when the QML flow option is used.  
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an  
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to  
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-  
38535, appendix A and the requirements herein.  
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided  
with each lot of microcircuits delivered to this drawing.  
3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535,  
appendix A.  
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's  
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the  
reviewer.  
SIZE  
STANDARD  
5962-89654  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
D
SHEET  
4
DSCC FORM 2234  
APR 97  
TABLE I. Electrical performance characteristics.  
Conditions 1/  
-55°C TA +125°C  
unless otherwise specified  
Group A  
subgroups  
Device  
type  
Limits  
Max  
Unit  
Test  
Symbol  
Min  
IB  
RIN  
R
Analog input = 0 V  
1, 2, 3  
All  
All  
All  
200  
µA  
kΩ  
Input bias current  
1
1
25  
40  
Input resistance  
110  
250  
Reference ladder resistance  
Overflow inhibit 0 V  
input current  
IIN  
1, 2, 3  
All  
µA  
VOH  
VOL  
+ICC  
2/  
1, 2, 3  
All  
All  
All  
2.4  
V
V
High level output voltage  
Low level output voltage  
Positive supply current  
2/  
1, 2, 3  
0.4  
45.0  
48.0  
179  
191  
VS+ = +5.0 V 3/  
1
2, 3  
1
mA  
-ICC  
VS- = -5.2 V 3/  
All  
mA  
Negative supply current  
2, 3  
4
FS  
All  
All  
All  
All  
01  
02  
01  
02  
01  
02  
All  
All  
75  
2.5  
2.5  
46  
MSPS  
ns  
Conversion rate  
tPWL  
tPWH  
SNR  
DNL  
4/  
4/  
5/  
4
Encode pulse width (low)  
Encode pulse width (high)  
Signal-to-noise ratio  
Differential linearity  
4
ns  
4
dB  
4
0.75  
0.5  
1.0  
0.75  
1.0  
0.5  
1.2  
15  
LSB  
6/  
6/  
5, 6  
4
INL  
LSB  
Integral linearity  
5, 6  
1
mV  
mV  
Top of reference ladder  
2, 3  
4
18  
All  
10  
Bottom of reference ladder  
6/  
6/  
6/  
5, 6  
4, 5, 6  
4, 5, 6  
13  
VIH  
VIL  
All  
All  
2.0  
V
V
High level input voltage  
Low level input voltage  
0.8  
See footnotes at end of table.  
SIZE  
STANDARD  
5962-89654  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
D
SHEET  
5
DSCC FORM 2234  
APR 97  
TABLE I. Electrical performance characteristics - Continued.  
Conditions 1/  
-55°C TA +125°C  
unless otherwise specified  
Group A  
subgroups  
Device  
type  
Limits  
Max  
Unit  
Test  
Symbol  
Min  
IIH  
IIL  
6/  
4, 5, 6  
All  
All  
All  
All  
All  
All  
All  
250  
400  
2.5  
18  
µA  
µA  
High level input current  
Low level input current  
Power supply rejection ratio  
Input capacitance  
Output delay  
6/  
4, 5, 6  
PSRR  
CIN  
tPD  
tr  
3/, 7/  
4
4
9
9
9
mV/V  
pF  
8/  
2/, 9/, 10/  
2/, 10/  
4.0  
48  
11.0  
8.0  
4.3  
ns  
ns  
Output rise time  
tf  
2/, 10/  
ns  
Output fall time  
Analog input signal  
= 1.23 MHz 11/  
4
All  
dB  
In-band harmonics  
1/ VS+ = 5.0 V, VS- = -5.2 V, differential reference voltage = 2.0 V.  
2/ Outputs terminated with two equivalent LS00 type loads.  
3/ Supplies should remain stable within ±5 % for normal operation.  
4/ ENCODE signal rise/fall times should be less than 30 ns for normal operation.  
5/ RMS signal to RMS noise, including harmonics with 1.23 MHz analog input signal.  
6/ Subgroups 5 and 6 if not tested shall be guaranteed to the limits specified.  
7/ Measured at -5.2 V ±5 % and +5.0 V ±5 %.  
8/ Subgroup 4 (CIN measurement) shall be measured only for the initial test and after process or design changes which may  
affect input capacitance.  
9/ Measured from ENCODE into data out for LSB only.  
10/ Guaranteed by design. Not tested.  
11/ Measured at 75 MSPS encode rate. Harmonic data based on worst case harmonics.  
SIZE  
STANDARD  
5962-89654  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
D
SHEET  
6
DSCC FORM 2234  
APR 97  
Device types  
Case outlines  
01 and 02  
X and 3  
Terminal  
number  
Terminal symbol  
1
DIGITAL VS+  
OVERFLOW INH  
HYSTERESIS  
+VREF  
2
3
4
5
ANALOG INPUT  
ANALOG GROUND  
ENCODE  
6
7
8
DIGITAL VS+  
ANALOG GROUND  
ANALOG INPUT  
-VREF  
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
REF mid  
DIGITAL VS+  
DIGITAL VS-  
D1 (LSB)  
D2  
D3  
D4  
D5  
DIGITAL GROUND  
ANALOG VS-  
ANALOG VS-  
DIGITAL GROUND  
D6  
D7  
D8 (MSB)  
OVERFLOW  
DIGITAL VS-  
FIGURE 1. Terminal connections.  
SIZE  
STANDARD  
5962-89654  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
D
SHEET  
7
DSCC FORM 2234  
APR 97  
FIGURE 2. System timing diagram and load circuit.  
SIZE  
STANDARD  
5962-89654  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
D
SHEET  
8
DSCC FORM 2234  
APR 97  
4. QUALITY ASSURANCE PROVISIONS  
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,  
appendix A.  
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices  
prior to quality conformance inspection. The following additional criteria shall apply:  
a. Burn-in test, method 1015 of MIL-STD-883.  
(1) Test condition A, B, or C. The test circuit shall be maintained by the manufacturer under document revision level  
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall  
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in  
test method 1015 of MIL-STD-883.  
(2) TA = +125°C, minimum.  
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter  
tests prior to burn-in are optional at the discretion of the manufacturer.  
TABLE II. Electrical test requirements.  
MIL-STD-883 test requirements  
Subgroups  
(in accordance with  
MIL-STD-883, method 5005,  
table I)  
Interim electrical parameters  
(method 5004)  
1
1*, 2, 3, 4  
1, 2, 3, 4, 5**, 6**, 9  
1
Final electrical test parameters  
(method 5004)  
Group A test requirements  
(method 5005)  
Groups C and D end-point  
electrical parameters  
(method 5005)  
* PDA applies to subgroup 1.  
** Subgroups 5 and 6 if not tested shall be guaranteed to the limits specified in table I.  
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-  
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.  
4.3.1 Group A inspection.  
a. Tests shall be as specified in table II herein.  
b. Subgroups 7, 8, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.  
SIZE  
STANDARD  
5962-89654  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
D
SHEET  
9
DSCC FORM 2234  
APR 97  
4.3.2 Groups C and D inspections.  
a. End-point electrical parameters shall be as specified in table II herein.  
b. Steady-state life test conditions, method 1005 of MIL-STD-883.  
(1) Test condition A, B, or C. The test circuit shall be maintained by the manufacturer under document revision level  
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall  
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified  
in test method 1005 of MIL-STD-883.  
(2) TA = +125°C, minimum.  
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.  
5. PACKAGING  
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.  
6. NOTES  
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications  
(original equipment), design applications, and logistics purposes.  
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-  
prepared specification or drawing.  
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for  
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.  
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application  
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for  
coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962)  
should contact DSCC-VA, telephone (614) 692-0544.  
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone  
(614) 692-0547.  
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-  
HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted  
by DSCC-VA.  
SIZE  
STANDARD  
5962-89654  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
D
SHEET  
10  
DSCC FORM 2234  
APR 97  
STANDARD MICROCIRCUIT DRAWING BULLETIN  
DATE: 01-11-14  
Approved sources of supply for SMD 5962-89654 are listed below for immediate acquisition information only and  
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be  
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a  
certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next  
dated revision of MIL-HDBK-103 and QML-38535.  
Standard  
microcircuit drawing  
PIN 1/  
Vendor  
CAGE  
number  
Vendor  
similar  
PIN 2/  
5962-89654013A  
5962-8965401XA  
5962-89654023A  
5962-8965402XA  
3/  
AD9012SE/883B  
AD9012SQ/883B  
AD9012TE/883B  
AD9012TQ/883B  
24355  
3/  
24355  
1/ The lead finish shown for each PIN representing  
a hermetic package is the most readily available  
from the manufacturer listed for that part. If the  
desired lead finish is not listed contact the vendor  
to determine its availability.  
2/ Caution. Do not use this number for item  
acquisition. Items acquired to this number may not  
satisfy the performance requirements of this drawing.  
3/ Not available from an approved source.  
Vendor CAGE  
number  
Vendor name  
and address  
24355  
Analog Devices  
RT 1 Industrial Park  
P.O. Box 9106  
Norwood, MA 02062  
Point of contact: 7910 Triad Center Drive  
Greensboro, NC 27409-9605  
The information contained herein is disseminated for convenience only and the  
Government assumes no liability whatsoever for any inaccuracies in the  
information bulletin.  

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