ADG431ABR [ADI]
LC2MOS Precision Quad SPST Switches; LC2MOS精密四通道SPST开关![ADG431ABR](http://pdffile.icpdf.com/pdf1/p00052/img/icpdf/ADG431_271501_icpdf.jpg)
型号: | ADG431ABR |
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描述: | LC2MOS Precision Quad SPST Switches |
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中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
LC2MOS
a
Precision Quad SPST Switches
ADG431/ADG432/ADG433
FUNCTIONAL BLOCK DIAGRAMS
FEATURES
44 V Supply Maximum Ratings
؎15 V Analog Signal Range
Low On Resistance (<24 ⍀)
Ultralow Power Dissipation (3.9 W)
Low Leakage (<0.25 nA)
Fast Switching Times
tON <165 ns
tOFF <130 ns
Break-Before-Make Switching Action
TTL/CMOS Compatible
Plug-in Replacement for DG411/DG412/DG413
S1
S1
IN1
IN2
IN3
IN4
IN1
IN2
IN3
IN4
D1
S2
D1
S2
D2
S3
D2
S3
ADG431
ADG432
D3
S4
D3
S4
D4
D4
S1
APPLICATIONS
IN1
Audio and Video Switching
Automatic Test Equipment
Precision Data Acquisition
Battery Powered Systems
Sample Hold Systems
Communication Systems
D1
S2
IN2
IN3
IN4
D2
S3
ADG433
D3
S4
D4
GENERAL DESCRIPTION
SWITCHES SHOWN FOR A LOGIC "1" INPUT
The ADG431, ADG432 and ADG433 are monolithic CMOS
devices comprising four independently selectable switches. They
are designed on an enhanced LC2MOS process which provides
low power dissipation yet gives high switching speed and low on
resistance.
PRODUCT HIGHLIGHTS
1. Extended Signal Range
The ADG431, ADG432 and ADG433 are fabricated on an
enhanced LC2MOS process giving an increased signal range
which extends fully to the supply rails.
The on resistance profile is very flat over the full analog input
range ensuring excellent linearity and low distortion when
switching audio signals. Fast switching speed coupled with high
signal bandwidth also make the parts suitable for video signal
switching. CMOS construction ensures ultralow power dissipa-
tion making the parts ideally suited for portable and battery
powered instruments.
2. Ultralow Power Dissipation
3. Low RON
4. Break-Before-Make Switching
This prevents channel shorting when the switches are config-
ured as a multiplexer.
The ADG431, ADG432 and ADG433 contain four indepen-
dent SPST switches. The ADG431 and ADG432 differ only in
that the digital control logic is inverted. The ADG431 switches
are turned on with a logic low on the appropriate control input,
while a logic high is required for the ADG432. The ADG433
has two switches with digital control logic similar to that of the
ADG431 while the logic is inverted on the other two switches.
5. Single Supply Operation
For applications where the analog signal is unipolar, the
ADG431, ADG432 and ADG433 can be operated from a
single rail power supply. The parts are fully specified with a
single +12 V power supply and will remain functional with
single supplies as low as +5 V.
Each switch conducts equally well in both directions when ON
and has an input signal range which extends to the supplies. In
the OFF condition, signal levels up to the supplies are blocked.
All switches exhibit break before make switching action for use
in multiplexer applications. Inherent in the design is low charge
injection for minimum transients when switching the digital inputs.
REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
Fax: 781/326-8703
World Wide Web Site: http://www.analog.com
© Analog Devices, Inc., 1998
ADG431/ADG432/ADG433–SPECIFICATIONS1
(V = +15 V ؎ 10%, V = –15 V ؎ 10%, V = +5 V ؎ 10%, GND = O V, unless otherwise noted)
Dual Supply
DD
SS
L
B Versions
T Versions
–55؇C to
–40؇C to
Parameter
+25؇C +85؇C
+25؇C +125؇C
Units
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
RON
V
DD to VSS
VDD to VSS
27
V
17
24
15
0.5
5
17
Ω typ
Ω max
% typ
%/°C typ
% typ
VD = ±8.5 V, IS = –10 mA;
VDD = +13.5 V, VSS = –13.5 V
26
24
15
0.5
5
RON vs. VD (VS)
RON Drift
RON Match
VD = 0 V, IS = –10 mA
LEAKAGE CURRENTS
Source OFF Leakage IS (OFF)
VDD = +16.5 V, VSS = –16.5 V
VD = ±15.5 V, VS = ϯ15.5 V;
Test Circuit 2
VD = ±15.5 V, VS = ϯ15.5 V;
Test Circuit 2
VD = VS = ±15.5 V;
Test Circuit 3
±0.05
±0.25 ±2
±0.05
±0.25 ±2
±0.1
±0.35 ±3
±0.05
±0.25 ±15
±0.05
±0.25 ±15
±0.1
±0.35 ±17
nA typ
nA max
nA typ
nA max
nA typ
nA max
Drain OFF Leakage ID (OFF)
Channel ON Leakage ID, IS (ON)
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
2.4
0.8
2.4
0.8
V min
V max
IINL or IINH
0.005
0.005
µA typ
µA max
pF typ
VIN = VINL or VINH
±0.02
±0.02
CIN Digital Input Capacitance
9
9
DYNAMIC CHARACTERISTICS2
tON
VDD = +15 V, VSS = –15 V
RL = 300 Ω, CL = 35 pF;
VS = ±10 V; Test Circuit 4
RL = 300 Ω, CL = 35 pF;
VS = ±10 V; Test Circuit 4
RL = 300 Ω, CL = 35 pF;
VS1 = VS2 = +10 V;
90
60
90
60
25
ns typ
ns max
ns typ
ns max
ns typ
165
130
175
145
tOFF
Break-Before-Make Time Delay, tD 25
(ADG433 Only)
Test Circuit 5
VS = 0 V, RS = 0 Ω, CL = 10 nF;
Test Circuit 6
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 7
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 8
Charge Injection
5
5
pC typ
dB typ
dB typ
OFF Isolation
68
85
68
85
Channel-to-Channel Crosstalk
CS (OFF)
CD (OFF)
CD, CS (ON)
9
9
35
9
9
35
pF typ
pF typ
pF typ
f = 1 MHz
f = 1 MHz
f = 1 MHz
POWER REQUIREMENTS
V
DD = +16.5 V, VSS = –16.5 V
Digital Inputs = 0 V or 5 V
IDD
ISS
IL
0.0001
0.1
0.0001
0.1
0.0001
0.1
0.0001
0.1
0.0001
0.1
0.0001
0.1
µA typ
µA max
µA typ
µA max
µA typ
µA max
µW max
0.2
0.2
0.2
0.2
0.2
7.7
0.2
7.7
Power Dissipation
NOTES
1Temperature ranges are as follows: B Versions: –40°C to +85°C; T Versions: –55°C to +125°C.
2Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–2–
REV. B
ADG431/ADG432/ADG433
(VDD = +12 V ؎ 10%, VSS = O V, VL = +5 V ؎ 10%, GND = O V, unless otherwise noted)
Single Supply
B Versions
–40؇C to
T Versions
–55؇C to
Parameter
+25؇C +85؇C
+25؇C +125؇C
Units
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
RON
0 V to VDD
28
0 V to VDD
28
V
Ω typ
Ω max
% typ
%/°C typ
% typ
0 < VD < 8.5 V, IS = –10 mA;
VDD = +10.8 V
42
20
0.5
5
45
42
20
0.5
5
45
RON vs. VD (VS)
RON Drift
RON Match
VD = 0 V, IS = –10 mA
DD = +13.2 V
LEAKAGE CURRENTS
V
Source OFF Leakage IS (OFF)
±0.04
±0.25 ±2
±0.04
±0.25 ±2
±0.01
±0.3
±0.04
±0.25 ±15
±0.04
±0.25 ±15
±0.01
±0.3
nA typ
nA max
nA typ
nA max
nA typ
nA max
VD = 12.2/1 V, VS = 1/12.2 V;
Test Circuit 2
VD = 12.2/1 V, VS = 1/12.2 V;
Test Circuit 2
VD = VS = +12.2 V/+1 V;
Test Circuit 3
Drain OFF Leakage ID (OFF)
Channel ON Leakage ID, Is (ON)
±3
±17
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
2.4
0.8
2.4
0.8
V min
V max
IINL or IINH
0.005
9
0.005
9
µA typ
µA max
pF typ
VIN = VINL or VINH
±0.01
±0.01
CIN Digital Input Capacitance
DYNAMIC CHARACTERISTICS2
tON
VDD = +12 V, VSS = 0 V
RL = 300 Ω, CL = 35 pF;
VS = +8 V; Test Circuit 4
RL = 300 Ω, CL = 35 pF;
VS = +8 V; Test Circuit 4
RL = 300 Ω, CL = 35 pF;
VS1 = VS2 = +10 V;
Test Circuit 5
165
60
165
60
ns typ
ns max
ns typ
ns max
ns typ
240
115
240
115
tOFF
Break-Before-Make Time Delay, tD 25
(ADG433 Only)
25
Charge Injection
25
68
85
25
68
85
pC typ
dB typ
dB typ
VS = 0 V, RS = 0 Ω, CL = 10 nF;
Test Circuit 6
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 7
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 8
OFF Isolation
Channel-to-Channel Crosstalk
CS (OFF)
CD (OFF)
CD, CS (ON)
9
9
35
9
9
35
pF typ
pF typ
pF typ
f = 1 MHz
f = 1 MHz
f = 1 MHz
POWER REQUIREMENTS
VDD = +13.2 V
Digital Inputs = 0 V or 5 V
IDD
IL
0.0001
0.03
0.0001
0.03
0.0001
0.03
0.0001
0.03
µA typ
µA max
µA typ
µA max
µW max
0.1
0.1
0.1
1.9
0.1
1.9
VL = +5.25 V
Power Dissipation
NOTES
1Temperature ranges are as follows: B Versions: –40°C to +85°C; T Versions: –55°C to +125°C.
2Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
Truth Table (ADG431/ADG432)
Truth Table (ADG433)
Switch 1, 4
ADG431 In
ADG432 In
Switch Condition
Logic
Switch 2, 3
0
1
1
0
ON
OFF
0
1
OFF
ON
ON
OFF
REV. B
–3–
ADG431/ADG432/ADG433
ABSOLUTE MAXIMUM RATINGS
(TA = +25°C unless otherwise noted)
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 76°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . +300°C
Plastic Package, Power Dissipation . . . . . . . . . . . . . . . 470 mW
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 117°C/W
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . +260°C
SOIC Package, Power Dissipation . . . . . . . . . . . . . . . . 600 mW
θJA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 77°C/W
Lead Temperature, Soldering
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+44 V
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +25 V
VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –25 V
VL to GND . . . . . . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V
Analog, Digital Inputs2 . . . . . . . . . . VSS – 2 V to VDD + 2 V or
30 mA, Whichever Occurs First
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 30 mA
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA
(Pulsed at 1 ms, 10% Duty Cycle max)
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C
NOTES
1Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability. Only one absolute
maximum rating may be applied at any one time.
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . . . –40°C to +85°C
Extended (T Version) . . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +150°C
Cerdip Package, Power Dissipation . . . . . . . . . . . . . . . 900 mW
2Overvoltages at IN, S or D will be clamped by internal diodes. Current should be
limited to the maximum ratings given.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the ADG431/ADG432/ADG433 features proprietary ESD protection circuitry, perma-
nent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper
ESD precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ORDERING GUIDE
PIN CONFIGURATION
(DIP/SOIC)
Model1
Temperature Range
Package Options2
ADG431BN
ADG431BR
ADG431TQ
ADG431ABR
ADG432BN
ADG432BR
ADG432TQ
ADG432ABR
–40°C to +85°C
–40°C to +85°C
–55°C to +125°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–55°C to +125°C
–40°C to +85°C
N-16
IN1
D1
S1
IN2
D2
S2
V
1
2
3
4
5
6
7
8
16
15
14
R-16A
Q-16
ADG431
ADG432
R-16A3
V
ADG433 13
TOP VIEW
SS
DD
N-16
GND
V
L
12
R-16A
Q-16
(Not to Scale)
S4
D4
S3
11
10
9
R-16A3
D3
IN3
ADG433BN
ADG433BR
ADG433ABR
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
N-16
IN4
R-16A
R-16A3
NOTES
1To order MIL-STD-883, Class B processed parts, add /883B to T grade part numbers.
2N = Plastic DIP; R = 0.15" Small Outline IC (SOIC); Q = Cerdip.
3Trench isolated, latch-up proof parts. See Trench Isolation section.
TERMINOLOGY
CS (OFF)
VDD
VSS
Most positive power supply potential.
Most negative power supply potential in dual
supplies. In single supply applications, it may be
connected to GND.
Logic power supply (+5 V).
Ground (0 V) reference.
“OFF” switch source capacitance.
“OFF” switch drain capacitance.
“ON” switch capacitance.
CD (OFF)
CD, CS (ON)
CIN
Input Capacitance to ground of a digital input.
Delay between applying the digital control input
and the output switching on.
Delay between applying the digital control input
and the output switching off.
“OFF” time or “ON” time measured between the
90% points of both switches, when switching
from one address state to another.
A measure of unwanted signal which is coupled
through from one channel to another as a result
of parasitic capacitance.
VL
GND
S
D
IN
tON
Source terminal. May be an input or output.
Drain terminal. May be an input or output.
Logic control input.
tOFF
tD
RON
Ohmic resistance between D and S.
RON vs. VD (VS) The variation in RON due to a change in the ana-
log input voltage with a constant load current.
Crosstalk
RON Drift
RON Match
IS (OFF)
ID (OFF)
ID, IS (ON)
VD (VS)
Change in RON vs. temperature.
Difference between the RON of any two switches.
Source leakage current with the switch “OFF.”
Drain leakage current with the switch “OFF.”
Channel leakage current with the switch “ON.”
Analog voltage on terminals D, S.
Off Isolation
A measure of unwanted signal coupling through an
“OFF” switch.
A measure of the glitch impulse transferred from the
digital input to the analog output during switching.
Charge
Injection
–4–
REV. B
ADG431/ADG432/ADG433
Typical Performance Graphs
50
50
40
30
20
T
V
= +25؇C
= +5V
T
= +25؇C
A
A
V
= +5V
L
L
40
V
V
= +5V
= 0V
DD
SS
V
V
= +5V
= –5V
DD
SS
30
20
V
V
= +10V
= 0V
DD
SS
V
V
= +12V
= 0V
V
V
= +10V
= –10V
DD
SS
DD
SS
V
V
= +12V
= –12V
DD
SS
10
0
10
0
V
V
= +15V
= 0V
V
V
= +15V
= –15V
DD
SS
DD
SS
–20
–10
0
10
20
0
5
10
15
20
V
OR V – DRAIN OR SOURCE VOLTAGE – V
S
V
OR V – DRAIN OR SOURCE VOLTAGE – V
D
D
S
Figure 1. On Resistance as a Function of VD (VS) Dual
Supplies
Figure 4. On Resistance as a Function of VD (VS) Single
Supply
100mA
50
V
V
V
= +15V
= –15V
= +5V
4 SW
1 SW
V
V
V
= +15V
= –15V
= +5V
DD
SS
DD
SS
10mA
1mA
L
L
40
30
20
I+, I–
100A
10A
+125؇C
+85؇C
+25؇C
I
L
10
0
1A
100nA
100
1k
10k
100k
1M
10M
10
–20
–10
0
10
20
FREQUENCY – Hz
V
OR V – DRAIN OR SOURCE VOLTAGE – V
D
S
Figure 2. On Resistance as a Function of
VD (VS) for Different Temperatures
Figure 5. Supply Current vs. Input Switching Frequency
0.04
10
V
V
= +15V
= –15V
DD
SS
V
V
V
= +15V
= –15V
= +5V
DD
SS
T
= +25؇C
= +5V
A
I
(ON)
D
L
V
L
0.02
1
0.1
V
V
= ؎15V
= ؎15V
I (OFF)
S
S
I
(OFF)
S
D
0.00
–0.02
–0.04
I
(OFF)
D
I
(OFF)
D
0.01
0.001
I
(ON)
D
20
40
60
80
100
120
140
–20
–10
0
10
20
TEMPERATURE – ؇C
V
OR V – DRAIN OR SOURCE VOLTAGE – V
D
S
Figure 3. Leakage Currents as a Function of Temperature
Figure 6. Leakage Currents as a Function of VD (VS)
REV. B
–5–
ADG431/ADG432/ADG433
120
V
V
G
G
V
V
V
V
D
S
D
S
V
V
V
= +15V
= –15V
= +5V
DD
SS
L
P-CHANNEL
N-CHANNEL
T
T
T
+
+
+
+
P
N
P
N
N
100
80
R
E
N
C
H
R
E
N
C
H
R
E
N
C
H
–
–
P
BURIED OXIDE LAYER
SUBSTRATE (BACKGATE)
60
Figure 9. Trench Isolation
APPLICATION
40
Figure 10 illustrates a precise, fast sample-and-hold circuit. An
AD845 is used as the input buffer while the output operational
amplifier is an AD711. During the track mode, SW1 is closed
and the output VOUT follows the input signal VIN. In the hold
mode, SW1 is opened and the signal is held by the hold capaci-
tor CH.
100
1k
10k
100k
1M
10M
FREQUENCY – Hz
Figure 7. Off Isolation vs. Frequency
110
Due to switch and capacitor leakage, the voltage on the hold
capacitor will decrease with time. The ADG431/ADG432/
ADG433 minimizes this droop due to its low leakage specifica-
tions. The droop rate is further minimized by the use of a poly-
styrene hold capacitor. The droop rate for the circuit shown is
typically 30 µV/µs.
V
V
V
= +15V
= –15V
= +5V
DD
SS
100
90
80
70
60
L
A second switch SW2, which operates in parallel with SW1, is
included in this circuit to reduce pedestal error. Since both
switches will be at the same potential, they will have a differen-
tial effect on the op amp AD711 which will minimize charge
injection effects. Pedestal error is also reduced by the compensa-
tion network RC and CC. This compensation network also
reduces the hold time glitch while optimizing the acquisition
time. Using the illustrated op amps and component values, the
pedestal error has a maximum value of 5 mV over the ±10 V
input range. Both the acquisition and settling times are 850 ns.
100
1k
10k
100k
1M
10M
FREQUENCY – Hz
Figure 8. Crosstalk vs. Frequency
TRENCH ISOLATION
+15V
+5V
2200pF
In the ADG431A, ADG432A and ADG433A, an insulating
oxide layer (trench) is placed between the NMOS and PMOS
transistors of each CMOS switch. Parasitic junctions, which
occur between the transistors in junction isolated switches, are
eliminated, the result being a completely latch-up proof switch.
+15V
AD711
–15V
SW2
SW1
+15V
S
S
D
D
C
C
R
C
V
V
OUT
1000pF
IN
75⍀
AD845
C
H
2200pF
In junction isolation, the N and P wells of the PMOS and
NMOS transistors from a diode that is reverse-biased under
normal operation. However, during overvoltage conditions, this
diode becomes forward biased. A silicon-controlled rectifier
(SCR) type circuit is formed by the two transistors causing a
significant amplification of the current which, in turn, leads to
latch up. With trench isolation, this diode is removed, the result
being a latch-up proof switch.
–15V
ADG431
ADG432
ADG433
–15V
Figure 10. Fast, Accurate Sample-and-Hold
–6–
REV. B
ADG431/ADG432/ADG433
Test Circuits
I
DS
V1
I
(ON)
A
I
(OFF)
A
I
(OFF)
A
D
D
S
S
D
S
D
S
D
V
V
D
V
V
V
S
S
D
S
R
= V1/I
DS
ON
Test Circuit 3. On Leakage
Test Circuit 1. On Resistance
Test Circuit 2. Off Leakage
+15V
0.1F
+5V
0.1F
3V
V
V
L
DD
V
V
50%
50%
50%
50%
ADG431
IN
S
D
V
OUT
3V
ADG432
R
C
L
IN
L
V
S
35pF
300⍀
IN
90%
90%
V
V
OUT
GND
SS
0.1F
–15V
tON
tOFF
Test Circuit 4. Switching Times
+15V
+5V
0.1F
0.1F
3V
V
IN
50%
50%
V
V
L
DD
0V
0V
S1
S2
D1
D2
V
V
S1
OUT1
90%
90%
V
V
OUT1
R
C
L1
35pF
L1
V
OUT2
300⍀
V
S2
R
C
L2
35pF
IN1, IN2
L2
300⍀
90%
V
90%
GND
SS
V
OUT2
IN
0V
tD
tD
0.1F
–15V
Test Circuit 5. Break-Before-Make Time Delay
+15V
+5V
3V
V
V
DD
L
V
R
OUT
S
S
D
V
IN
C
10nF
L
V
S
IN
V
OUT
⌬V
OUT
V
GND
SS
Q
= C
؋
⌬V L OUT
INJ
–15V
Test Circuit 6. Charge Injection
REV. B
–7–
ADG431/ADG432/ADG433
+15V
0.1F
+5V
+15V
+5V
0.1F
0.1F
0.1F
V
V
L
DD
V
V
L
50⍀
DD
S
D
S
D
V
OUT
V
IN1
R
V
L
S
V
IN2
50⍀
IN
V
V
S
S
IN
D
V
OUT
NC
V
V
GND
R
SS
GND
SS
L
50⍀
CHANNEL TO CHANNEL
CROSSTALK = 20
؋
LOG V /V 0.1F
–15V
0.1F
–15V
S
OUT
Test Circuit 7. Off Isolation
Test Circuit 8. Channel-to-Channel Crosstalk
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
16-Lead Cerdip
(Q-16)
16-Lead SOIC
(R-16A)
0.005 (0.13) MIN
16
0.080 (2.03) MAX
0.3937 (10.00)
0.3859 (9.80)
9
0.310 (7.87)
16
1
9
8
0.1574 (4.00)
0.1497 (3.80)
0.220 (5.59)
0.2440 (6.20)
0.2284 (5.80)
1
8
0.320 (8.13)
0.290 (7.37)
PIN 1
0.840 (21.34) MAX
0.060 (1.52)
0.015 (0.38)
0.0688 (1.75)
0.0532 (1.35)
PIN 1
0.0196 (0.50)
0.0099 (0.25)
x 45؇
0.200 (5.08)
MAX
0.0098 (0.25)
0.0040 (0.10)
0.150
(3.81)
MIN
SEATING
PLANE
0.200 (5.08)
0.125 (3.18)
8؇
0؇
0.015 (0.38)
0.008 (0.20)
0.0500
(1.27)
BSC
0.0192 (0.49)
0.0138 (0.35)
0.023 (0.58)
0.014 (0.36)
0.100
(2.54)
BSC
0.070 (1.78)
0.030 (0.76)
SEATING
PLANE
15°
0°
0.0500 (1.27)
0.0160 (0.41)
0.0099 (0.25)
0.0075 (0.19)
16-Lead Plastic DIP (Narrow)
(N-16)
0.840 (21.34)
0.745 (18.92)
16
1
9
0.280 (7.11)
0.240 (6.10)
8
0.325 (8.26)
0.195 (4.95)
0.115 (2.93)
0.300 (7.62)
PIN 1
0.060 (1.52)
0.015 (0.38)
0.210 (5.33)
MAX
0.130
(3.30)
MIN
0.160 (4.06)
0.115 (2.93)
0.015 (0.381)
0.008 (0.204)
0.070 (1.77) SEATING
0.100
(2.54)
BSC
0.022 (0.558)
0.014 (0.356)
PLANE
0.045 (1.15)
–8–
REV. B
相关型号:
![](http://pdffile.icpdf.com/pdf2/p00255/img/page/ADG432ABR-RE_1542631_files/ADG432ABR-RE_1542631_1.jpg)
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ADG431ABR-REEL
IC QUAD 1-CHANNEL, SGL POLE SGL THROW SWITCH, PDSO16, 0.150 INCH, SOIC-16, Multiplexer or Switch
ADI
![](http://pdffile.icpdf.com/pdf2/p00240/img/page/ADG433ABRZ-R_1449239_files/ADG433ABRZ-R_1449239_1.jpg)
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ADG431ABRZ-REEL
IC QUAD 1-CHANNEL, SGL POLE SGL THROW SWITCH, PDSO16, 0.150 INCH, SOIC-16, Multiplexer or Switch
ADI
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