ADG707BRU [ADI]
CMOS, 2.5ohm Low-Voltage, 8-/16-Channel Multiplexers; CMOS ， 2.5ohm低电压， 8 / 16通道多路复用器
| 型号： | ADG707BRU |
| 厂家： | 
ADI |
| 描述： | CMOS, 2.5ohm Low-Voltage, 8-/16-Channel Multiplexers |
| 文件： | 总11页 (文件大小：155K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
CMOS, 2.5 ⍀ Low-Voltage,
8-/16-Channel Multiplexers
a
ADG706/ADG707
FEATURES
1.8 V to 5.5 V Single Supply
؎3 V Dual Supply
FUNCTIONAL BLOCK DIAGRAMS
ADG706
ADG707
2.5 ⍀ On Resistance
0.5 ⍀ On-Resistance Flatness
100 pA Leakage Currents
40 ns Switching Times
Single 16-to-1 Multiplexer ADG706
Differential 8-to-1 Multiplexer ADG707
28-Lead TSSOP Package
Low-Power Consumption
TTL/CMOS-Compatible Inputs
S1
S1A
S8A
DA
DB
D
S1B
S8B
S16
1-OF-16
DECODER
1-OF-8
DECODER
APPLICATIONS
Data Acquisition Systems
Communication Systems
Relay Replacement
A1
A0
A2 A3 EN
A2
A1 EN
A0
Audio and Video Switching
Battery-Powered Systems
GENERAL DESCRIPTION
PRODUCT HIGHLIGHTS
The ADG706 and ADG707 are low-voltage, CMOS analog
multiplexers comprising 16 single channels and eight differential
channels respectively. The ADG706 switches one of 16 inputs
(S1–S16) to a common output, D, as determined by the 4-bit
binary address lines A0, A1, A2, and A3. The ADG707 switches
one of eight differential inputs to a common differential output as
determined by the 3-bit binary address lines A0, A1, and A2.
An EN input on both devices is used to enable or disable the
device. When disabled, all channels are switched OFF.
1. Single/Dual Supply Operation. The ADG706 and ADG707
are fully specified and guaranteed with 3 V and 5 V single
supply and 3 V dual supply rails.
2. Low On Resistance (2.5 Ω typical).
3. Low-Power Consumption (<0.01 µW).
4. Guaranteed Break-Before-Make Switching Action.
5. Small 28-Lead TSSOP Package.
Low-power consumption and operating supply range of 1.8 V to
5.5 V make the ADG706 and ADG707 ideal for battery-powered,
portable instruments. All channels exhibit break-before-make
switching action preventing momentary shorting when switch-
ing channels. These devices are also designed to operate from a
dual supply of 3 V.
These multiplexers are designed on an enhanced submicron
process that provides low-power dissipation yet gives high-
switching speed, very low on resistance and leakage currents.
On resistance is in the region of a few ohms and is closely
matched between switches and very flat over the full signal
range. These parts can operate equally well as either multiplexers
or demultiplexers and have an input signal range which extends
to the supplies.
The ADG706 and ADG707 are available in small 28-lead TSSOP
packages.
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700
Fax: 781/326-8703
World Wide Web Site: http://www.analog.com
© Analog Devices, Inc., 2000
ADG706/ADG707–SPECIFICATIONS1
(VDD = 5 V ؎ 10%, VSS = 0 V, GND = 0 V, unless otherwise noted.)
B Version
–40؇C
to +85؇C
Parameter
25؇C
Unit
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
0 V to VDD
V
On Resistance (RON
)
2.5
4.5
Ω typ
Ω max
Ω typ
Ω max
Ω typ
Ω max
VS = 0 V to VDD, IDS = 10 mA;
Test Circuit 1
VS = 0 V to VDD, IDS = 10 mA
5
0.3
0.8
On Resistance Match Between
Channels (∆RON
)
On-Resistance Flatness (RFLAT(ON)
)
0.5
VS = 0 V to VDD, IDS = 10 mA
1.2
LEAKAGE CURRENTS
VDD = 5.5 V
Source OFF Leakage IS (OFF)
0.01
0.1
0.01
0.4
0.1
0.01
0.4
nA typ
nA max
nA typ
nA max
nA max
nA typ
nA max
nA max
VD = 4.5 V/1 V, VS = 1 V/4.5 V;
Test Circuit 2
VD = 4.5 V/1 V, VS = 1 V/4.5 V;
Test Circuit 3
0.3
Drain OFF Leakage ID (OFF)
ADG706
ADG707
Channel ON Leakage ID, IS (ON)
ADG706
ADG707
1.5
1
VD = VS = 1 V, or 4.5 V;
Test Circuit 4
1.5
1
0.1
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
2.4
0.8
V min
V max
I
INL or IINH
0.005
5
µA typ
µA max
pF typ
VIN = VINL or VINH
0.1
CIN, Digital Input Capacitance
DYNAMIC CHARACTERISTICS2
tTRANSITION
40
30
32
10
5
ns typ
ns max
ns typ
ns min
ns typ
ns max
ns typ
ns max
pC typ
RL = 300 Ω, CL = 35 pF, Test Circuit 5;
60
1
VS1 = 3 V/0 V, VS16 = 0 V/3 V
Break-Before-Make Time Delay, tD
RL = 300 Ω, CL = 35 pF;
VS = 3 V, Test Circuit 6
RL = 300 Ω, CL = 35 pF;
VS = 3 V, Test Circuit 7
RL = 300 Ω, CL = 35 pF;
VS = 3 V, Test Circuit 7
VS = 1 V, RS = 0 Ω, CL = 1 nF;
Test Circuit 8
t
t
ON (EN)
OFF (EN)
50
14
Charge Injection
Off Isolation
–60
–80
dB typ
dB typ
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 9
Channel-to-Channel Crosstalk
–60
–80
dB typ
dB typ
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 10
–3 dB Bandwidth
ADG706
ADG707
CS (OFF)
CD (OFF)
ADG706
25
36
13
MHz typ
MHz typ
pF typ
RL = 50 Ω, CL = 5 pF, Test Circuit 9
RL = 50 Ω, CL = 5 pF, Test Circuit 9
180
90
pF typ
pF typ
ADG707
CD, CS (ON)
ADG706
ADG707
200
100
pF typ
pF typ
POWER REQUIREMENTS
IDD
VDD = 5.5 V
Digital Inputs = 0 V or 5.5 V
0.001
µA typ
µA max
1.0
NOTES
1Temperature range is as follows: B Version: –40°C to +85°C.
2Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–2–
REV. 0
ADG706/ADG707
SPECIFICATIONS1
(VDD = 3 V ؎ 10%, VSS = 0 V, GND = 0 V, unless otherwise noted)
B Version
–40؇C
Parameter
25؇C
to +85؇C
Unit
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
0 V to VDD
V
On Resistance (RON
)
6
11
Ω typ
Ω max
Ω typ
Ω max
Ω typ
VS = 0 V to VDD, IDS = 10 mA;
Test Circuit 1
VS = 0 V to VDD, IDS = 10 mA
12
0.4
1.2
3
On-Resistance Match Between
Channels (∆RON
)
On-Resistance Flatness (RFLAT(ON)
)
VS = 0 V to VDD, IDS = 10 mA
LEAKAGE CURRENTS
VDD = 3.3 V
Source OFF Leakage IS (OFF)
0.01
0.1
0.01
0.4
0.1
0.01
0.4
nA typ
nA max
nA typ
nA max
nA max
nA typ
nA max
nA max
VS = 3 V/1 V, VD = 1 V/3 V;
Test Circuit 2
VS = 3 V/1 V, VD = 1 V/3 V;
Test Circuit 3
0.3
Drain OFF Leakage ID (OFF)
ADG706
ADG707
Channel ON Leakage ID, IS (ON)
ADG706
ADG707
1.5
1
VS = VD = 1 V or 3 V;
Test Circuit 4
1.5
1
0.1
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
2.0
0.4
V min
V max
IINL or IINH
0.005
5
µA typ
µA max
pF typ
VIN = VINL or VINH
0.1
CIN, Digital Input Capacitance
DYNAMIC CHARACTERISTICS2
tTRANSITION
45
30
40
20
5
ns typ
ns max
ns typ
ns min
ns typ
ns max
ns typ
ns max
pC typ
RL = 300 Ω, CL = 35 pF, Test Circuit 5
75
1
VS1 = 2 V/0 V, VS16 = 0 V/2 V
Break-Before-Make Time Delay, tD
RL = 300 Ω, CL = 35 pF;
VS = 2 V, Test Circuit 6
RL = 300 Ω, CL = 35 pF;
VS = 2 V, Test Circuit 7
RL = 300 Ω, CL = 35 pF;
VS = 2 V, Test Circuit 7
VS = 1 V, RS = 0 Ω, CL = 1 nF;
Test Circuit 8
t
t
ON (EN)
OFF (EN)
70
28
Charge Injection
Off Isolation
–60
–80
dB typ
dB typ
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 9
Channel-to-Channel Crosstalk
–60
–80
dB typ
dB typ
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 10
–3 dB Bandwidth
ADG706
ADG707
CS (OFF)
CD (OFF)
ADG706
25
36
13
MHz typ
MHz typ
pF typ
RL = 50 Ω, CL = 5 pF, Test Circuit 9
RL = 50 Ω, CL = 5 pF, Test Circuit 9
180
90
pF typ
pF typ
ADG707
CD, CS (ON)
ADG706
ADG707
200
100
pF typ
pF typ
POWER REQUIREMENTS
IDD
VDD = 3.3 V
Digital Inputs = 0 V or 3.3 V
0.001
µA typ
µA max
1.0
NOTES
1Temperature ranges are as follows: B Versions: –40°C to +85°C.
2Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. 0
–3–
ADG706/ADG707
Dual Supply1
(VDD = +3 V ؎ 10%, VSS = –3 V ؎ 10%, GND = 0 V, unless otherwise noted.)
B Version
–40؇C
to +85؇C
Parameter
25؇C
Unit
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
V
5
0.3
0.8
SS to VDD
V
On Resistance (RON
)
2.5
4.5
Ω typ
Ω max
Ω typ
Ω max
Ω typ
Ω max
VS = VSS to VDD, IDS = 10 mA;
Test Circuit 1
On-Resistance Match Between
VS = VSS to VDD, IDS = 10 mA
Channels (∆RON
)
On-Resistance Flatness (RFLAT(ON)
)
0.5
VS = VSS to VDD, IDS = 10 mA
1.2
LEAKAGE CURRENTS
VDD = +3.3 V, VSS = –3.3 V
VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
Test Circuit 2
VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V;
Test Circuit 3
Source OFF Leakage IS (OFF)
0.01
0.1
0.01
0.4
0.1
0.01
0.4
0.1
nA typ
nA max
nA typ
nA max
nA max
nA typ
nA max
nA max
0.3
Drain OFF Leakage ID (OFF)
ADG706
ADG707
Channel ON Leakage ID, IS (ON)
ADG706
ADG707
1.5
1
VS = VD = +2.25 V/–1.25 V, Test Circuit 4
1.5
1
DIGITAL INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Input Current
2.0
0.4
V min
V max
I
INL or IINH
0.005
5
µA typ
µA max
pF typ
VIN = VINL or VINH
0.1
CIN, Digital Input Capacitance
DYNAMIC CHARACTERISTICS2
tTRANSITION
40
15
32
16
8
ns typ
ns max
ns typ
ns min
ns typ
ns max
ns typ
ns max
pC typ
RL = 300 Ω, CL = 35 pF, Test Circuit 5
60
1
VS1 = 1.5 V/0 V, VS16 = 0 V/1.5 V
Break-Before-Make Time Delay, tD
RL = 300 Ω, CL = 35 pF;
VS = 1.5 V, Test Circuit 6
RL = 300 Ω, CL = 35 pF;
VS = 1.5 V, Test Circuit 7
RL = 300 Ω, CL = 35 pF;
VS = 1.5 V, Test Circuit 7
VS = 0 V, RS = 0 Ω, CL = 1 nF;
Test Circuit 8
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 9
RL = 50 Ω, CL = 5 pF, f = 10 MHz;
RL = 50 Ω, CL = 5 pF, f = 1 MHz;
Test Circuit 10
t
t
ON (EN)
OFF (EN)
50
26
Charge Injection
Off Isolation
–60
–80
dB typ
dB typ
Channel-to-Channel Crosstalk
–60
–80
dB typ
dB typ
–3 dB Bandwidth
ADG706
25
36
13
MHz typ
MHz typ
pF typ
RL = 50 Ω, CL = 5 pF, Test Circuit 9
RL = 50 Ω, CL = 5 pF, Test Circuit 9
ADG707
CS (OFF)
CD (OFF)
ADG706
180
90
pF typ
pF typ
ADG707
CD, CS (ON)
ADG706
ADG707
200
100
pF typ
pF typ
POWER REQUIREMENTS
IDD
0.001
0.001
µA typ
µA max
µA typ
µA max
VDD = +3.3 V
1.0
1.0
Digital Inputs = 0 V or 3.3 V
VSS = –3.3 V
ISS
Digital Inputs = 0 V or 3.3 V
NOTES
1Temperature range is as follows: B Version: –40°C to +85°C.
2Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
–4–
REV. 0
ADG706/ADG707
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150°C
TSSOP Package
ABSOLUTE MAXIMUM RATINGS1
(TA = 25°C unless otherwise noted)
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
θ
JA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 97.9°C/W
V
DD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
θ
JC Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 14°C/W
VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –3.5 V
Analog Inputs2 . . . . . . . . . . . . . . VSS – 0.3 V to VDD + 0.3 V or
30 mA, Whichever Occurs First
Lead Temperature, Soldering (10 seconds) . . . . . . . . . . 300°C
IR Reflow, Peak Temperature . . . . . . . . . . . . . . . . . . . . 220°C
Digital Inputs2 . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V or
30 mA, Whichever Occurs First
NOTES
1Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only, functional operation of the
device at these or any other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maximum rating condi-
tionsforextendedperiodsmayaffectdevicereliability. Onlyoneabsolutemaximum
rating may be applied at any one time.
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA
(Pulsed at 1 ms, 10% Duty Cycle max)
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 30 mA
Operating Temperature Range
2Overvoltages at IN, S or D will be clamped by internal diodes. Current should be
limited to the maximum ratings given.
Industrial (B Version) . . . . . . . . . . . . . . . . –40°C to +85°C
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the ADG706/ADG707 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ORDERING GUIDE
Model
Temperature Range
Package Description
Package Option
ADG706BRU
ADG707BRU
–40°C to +85°C
–40°C to +85°C
Thin Shrink Small Outline Package (TSSOP)
Thin Shrink Small Outline Package (TSSOP)
RU-28
RU-28
PIN CONFIGURATIONS
28-Lead TSSOP
DA
V
1
1
2
3
4
5
6
7
8
9
28
27
26
25
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V
D
V
V
DD
DD
NC
NC
2
3
4
5
6
7
8
9
DB
NC
SS
SS
S8A
S7A
S6A
S5A
S4A
S3A
S2A
S1A
EN
S8
S7
S16
S15
S14
S13
S12
S11
S8B
S7B
S6B
S5B
S4B
S3B
24 S6
23
22
21
S5
S4
S3
ADG706
TOP VIEW
(Not to Scale)
ADG707
TOP VIEW
(Not to Scale)
20 S2
S10 10
19
18
S1
S2B 10
11
11
S9
EN
S1B
A0
12
12
17 A0
16 A1
15 A2
GND
GND
A1
13
14
13
14
NC
A3
NC
NC
A2
NC = NO CONNECT
NC = NO CONNECT
REV. 0
–5–
ADG706/ADG707
Table I. ADG706 Truth Table
Table II. ADG707 Truth Table
A3
A2
A1
A0
EN
ON Switch
A2
A1
A0
EN
ON Switch Pair
X
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
X
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
X
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
X
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
NONE
1
2
3
4
5
6
7
X
0
0
0
0
1
1
1
1
X
0
0
1
1
0
0
1
1
X
0
1
0
1
0
1
0
1
0
1
1
1
1
1
1
1
1
NONE
1
2
3
4
5
6
7
8
8
9
X = Don’t Care.
10
11
12
13
14
15
16
X = Don’t Care.
TERMINOLOGY
VDD
VSS
Most Positive Power Supply Potential.
CD (OFF)
“OFF” Switch Drain Capacitance. Measured
with reference to ground.
Most Negative Power Supply in a Dual Sup-
ply Application. In single supply applications,
this should be tied to ground at the device.
CD, CS (ON)
“ON” Switch Capacitance. Measured with
reference to ground.
IDD
ISS
Positive Supply Current.
CIN
Digital Input Capacitance.
Negative Supply Current.
tTRANSITION
Delay Time Measured Between the 50% and
90% Points of the Digital Inputs and the Switch
“ON” Condition when Switching from One
Address State to Another.
GND
S
Ground (0 V) Reference.
Source Terminal. May be an input or output.
Drain Terminal. May be an input or output.
Logic Control Input.
D
t
t
ON (EN)
OFF (EN)
Delay Time Between the 50% and 90% Points
of the EN Digital Input and the Switch “ON”
Condition.
IN
VD (VS)
Analog Voltage on Terminals D, S.
Ohmic Resistance Between D and S.
Delay Time Between the 50% and 90% Points
of the EN Digital Input and the Switch “OFF”
Condition.
RON
∆RON
On Resistance Match Between any Two Chan-
nels, i.e., RONmax – RONmin.
tOPEN
“OFF” Time Measured Between the 80%
Points of Both Switches when Switching from
One Address State to Another.
RFLAT(ON)
Flatness is defined as the difference between
the maximum and minimum value of on
resistance as measured over the specified analog
signal range.
Charge
Injection
A Measure of the Glitch Impulse Transferred
from the Digital Input to the Analog Output
During Switching.
IS (OFF)
D (OFF)
Source Leakage Current with the Switch
“OFF.”
Off Isolation
Crosstalk
A Measure of Unwanted Signal Coupling
through an “OFF” Switch.
I
Drain Leakage Current with the Switch “OFF.”
ID, IS (ON)
Channel Leakage Current with the Switch
“ON.”
A Measure of Unwanted Signal which is
Coupled through from One Channel to
Another as a Result of Parasitic Capacitance.
VINL
VINH
Maximum Input Voltage for Logic “0.”
Minimum Input Voltage for Logic “1.”
Input Current of the Digital Input.
Bandwidth
The Frequency at which the Output Is
Attenuated by 3 dBs.
I
INL(IINH
)
On Response
The Frequency Response of the “ON” Switch.
CS (OFF)
“OFF” Switch Source Capacitance. Measured
with reference to ground.
Insertion
Loss
The Loss Due to the ON Resistance of the
Switch.
–6–
REV. 0
Typical Performance Characteristics–ADG706/ADG707
8
7
6
5
4
3
2
8
8
7
6
5
T
V
= 25؇C
V
V
= 5V
= 0V
V
V
= +3.0V
A
DD
SS
DD
= GND
7
6
SS
= –3.0V
SS
V
= 2.7V
DD
5
4
3
2
1
V
= 3.3V
V
DD
4
+25؇C
= 4.5V
+25؇C
DD
+85؇C
–40؇C
0
3
2
+85؇C
–40؇C
V
= 5.5V
DD
1
0
1
0
0
–3
V
0
0
1
2
3
4
5
–2
–1
1
2
3
1
2
3
4
5
V
OR V /DRAIN OR SOURCE VOLTAGE – V
OR V /DRAIN OR SOURCE VOLTAGE – V
V
, V , DRAIN OR SOURCE VOLTAGE – V
D
S
D S
D
S
Figure 3. On Resistance as a Function
of VD (VS) for Different Temperatures,
Single Supply
Figure 2. On Resistance as a Function
of VD (VS) for Different Temperatures,
Dual Supply
Figure 1. On Resistance as a Function
of VD (VS) for Single Supply
0.3
8
8
T
= 25؇C
V
V
= 3V
= 0V
A
DD
SS
V
V
= 5V
= 0V
= 25؇C
DD
7
6
7
6
5
SS
I
(OFF)
D
0.2
T
A
V
= +2.7V
DD
I
, I (ON)
S
D
+85؇C
V
= –2.7V
V
= +3.0V
SS
DD
5
4
3
2
0.1
0
V
= –3.0V
SS
4
–40؇C
3
2
1
I
(OFF)
S
+25؇C
–0.1
–0.2
V
= +3.3V
1
0
DD
V
= –3.3V
SS
0
–3
0
1
2
3
4
5
0
0.5
1.0
1.5
2.0
2.5
3.0
–2
–1
0
1
2
3
V
(V ) – Volts
S
D
V
OR V /DRAIN OR SOURCE VOLTAGE – V
V OR V – DRAIN OR SOURCE VOLTAGE – V
D S
D
S
Figure 4. On Resistance as a Function
of VD (VS) for Dual Supply
Figure 6. Leakage Currents as a Func-
tion of VD (VS)
Figure 5. On Resistance as a Function
of VD (VS) for Different Temperatures,
Single Supply
0.3
0.8
0.3
V
V
T
= +3V
V
V
V
V
= 5V
V
V
V
V
= +3V
DD
DD
DD
V
V
= 3V
= 0V
DD
I
(OFF)
0.7
0.6
0.5
D
= –3V
I
(OFF)
= GND
= –3V
SS
0.2
0.1
D
SS
SS
0.2
0.1
SS
= 25؇C
= 4.5V/1V
= 1V/4.5V
= +2.25V/–1.25V
= –1.25V/+2.25V
A
D
S
D
S
T
= 25؇C
A
0.4
0.3
0.2
0.1
0
I
(OFF)
D
0
0
–0.1
–0.2
–0.3
I
, I (ON)
S
D
I
, I (ON)
S
I (OFF)
S
D
–0.1
–0.2
–0.3
I (OFF)
S
I
, I (ON)
S
D
I
(OFF)
S
–0.1
–3
–2
–1
0
1
2
3
0
1
2
3
4
5
5
15
25
35 45
55
65 75
85
VOLTAGE – Volts
V
(V ) – Volts
S
TEMPERATURE – ؇C
D
Figure 7. Leakage Currents as a Func-
tion of VD (VS)
Figure 9. Leakage Currents as a Func-
tion of Temperature
Figure 8. Leakage Currents as a Func-
tion of VD (VS)
REV. 0
–7–
ADG706/ADG707
10m
1m
0
0.8
0.7
0.6
0.5
0.4
0.3
T
= 25؇C
A
V
V
V
V
= 3V
DD
= GND
SS
–2
–4
–6
–8
ADG706
ADG707
= 3V/1V
= 1V/3V
D
S
V
= +3.0V
100
10
DD
V
= –3.0V
SS
V
= +5V
DD
I
(OFF)
1
100n
10n
1n
D
I
(OFF)
S
V
= +3V
DD
0.2
0.1
0
I
, I (ON)
S
D
–0.1
–10
10
100
1k
10k
100k
1M
10M
10k
100k
1M
10M
100M
5
15
25
35 45
55
65 75
85
TEMPERATURE – ؇C
FREQUENCY – Hz
FREQUENCY – Hz
Figure 12. Supply Currents vs. Input
Switching Frequency
Figure 11. On Response vs.
Frequency
Figure 10. Leakage Currents as a
Function of Temperature
20
10
0
0
V
V
= +3.0V
= –3.0V
DD
SS
V
T
= 5V
= 25؇C
V
T
= 5V
= 25؇C
DD
DD
A
A
–20
–40
–20
–40
V
V
= 5V
= GND
DD
SS
0
–60
–80
–60
–80
–10
–20
–30
–40
V
V
= 3V
= GND
DD
SS
–100
–120
–100
–120
100k
1M
10M
100M
30k
100k
1M
10M
100M
30k
–3
–2
–1
0
1
2
3
4
5
VOLTAGE – V
FREQUENCY – Hz
FREQUENCY – Hz
Figure 14. Charge Injection vs.
Source Voltage
Figure 15. Crosstalk vs. Frequency
Figure 13. Off Isolation vs. Frequency
–8–
REV. 0
ADG706/ADG707
TEST CIRCUITS
I
DS
V
V
V
V
SS
DD
DD
V1
SS
S1
S2
I
OFF
A
D
D
S
D
V
DD
S16
V
S
0.8V
EN
V
S
GND
R
= V /V
1 DS
ON
Test Circuit 1. On Resistance
Test Circuit 3. ID (OFF)
V
V
SS
DD
V
V
SS
SS
DD
DD
V
V
SS
DD
V
V
I OFF
S
I
ON
A
D
S1
S2
D
S1
A
V
D
D
S16
V
S
S16
2.4V
EN
0.8V
V
S
GND
EN
V
D
GND
Test Circuit 4. ID (ON)
Test Circuit 2. IS (OFF)
V
V
V
V
SS
DD
3V
0V
SS
DD
ADDRESS
DRIVE (V
50%
50%
)
V
V
S1
IN
S1
A3
A2
A1
A0
D
S1 THRU S15
V
50⍀
IN
ADG706*
S16
D
S16
V
S1
90%
V
OUT
V
OUT
R
C
L
2.4V
EN
L
90%
GND
300⍀
35pF
V
S16
tTRANSITION
tTRANSITION
*SIMILAR CONNECTION FOR ADG707
Test Circuit 5. Switching Time of Multiplexer, tTRANSITION
V
V
V
V
DD
SS
SS
DD
3V
V
S1
S
A3
A2
A1
A0
ADDRESS
DRIVE (V
D
)
S1 THRU S15
V
50⍀
IN
IN
0V
V
ADG706*
S16
D
V
S
OUT
R
300⍀
C
L
35pF
2.4V
EN
L
80%
80%
V
GND
OUT
tOPEN
*SIMILAR CONNECTION FOR ADG707
Test Circuit 6. Break-Before-Make Delay, tOPEN
REV. 0
–9–
ADG706/ADG707
V
V
V
V
SS
DD
3V
0V
SS
DD
ENABLE
DRIVE (V
50%
50%
)
IN
V
S1
S2 THRU S16
S
A3
A2
A1
A0
EN
tOFF(EN)
0.9V
ADG706*
V
O
0.9V
O
O
OUTPUT
D
V
OUT
R
300⍀
C
L
35pF
L
V
0V
GND
IN
50⍀
tON(EN)
*SIMILAR CONNECTION FOR ADG707
Test Circuit 7. Enable Delay, tON (EN), tOFF (EN)
V
V
V
SS
DD
V
SS
DD
A3
A2
A1
3V
LOGIC
INPUT (V
)
ADG706*
IN
0V
A0
S
D
V
OUT
R
S
C
1nF
V
L
OUT
⌬V
OUT
EN
V
Q
= C
؋
⌬V S
INJ
L
OUT
V
GND
IN
*SIMILAR CONNECTION FOR ADG707
Test Circuit 8. Charge Injection
V
V
DD
DD
V
V
DD
A3
A2
A1
A0
S1
DD
2.4V
S1
EN
A3
A2
S16
V
S
ADG706*
ADG706*
A1
50⍀
D
A0
V
OUT
D
V
R
L
EN**
OUT
S2
R
50⍀
50⍀
L
V
GND
SS
S16
V
S
V
SS
V
GND
SS
*SIMILAR CONNECTION FOR ADG707
**CONNECT TO 2.4V FOR BANDWIDTH MEASUREMENTS
OFF ISOLATION = 20LOG (V /V )
V
SS
10 OUT
S
*SIMILAR CONNECTION FOR ADG707
CHANNEL-TO-CHANNEL CROSSTALK = 20LOG (V
OFF ISOLATION = 20LOG
V
WITH SWITCH
10
OUT
/V )
S
(
V
)
10 OUT
WITHOUT SWITCH
OUT
Test Circuit 10. Channel-to-Channel Crosstalk
Test Circuit 9. OFF Isolation and Bandwidth
–10–
REV. 0
ADG706/ADG707
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
28-Lead TSSOP
(RU-28)
0.386 (9.80)
0.378 (9.60)
28
15
0.177 (4.50)
0.169 (4.30)
0.256 (6.50)
0.246 (6.25)
1
14
PIN 1
0.006 (0.15)
0.002 (0.05)
0.0433 (1.10)
MAX
8؇
0؇
0.0256 (0.65) 0.0118 (0.30)
0.028 (0.70)
0.020 (0.50)
SEATING
PLANE
0.0079 (0.20)
0.0035 (0.090)
BSC
0.0075 (0.19)
REV. 0
–11–
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