ADIS16003PCB [ADI]
Dual-Axis 【1.7 g Accelerometer with SPI Interface; 双轴【 1.7克加速度计采用SPI接口
| 型号： | ADIS16003PCB |
| 厂家： | 
ADI |
| 描述： | Dual-Axis 【1.7 g Accelerometer with SPI Interface |
| 文件： | 总16页 (文件大小：261K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Dual-Axis ± ±1. g Accelerometer
with SPI Interface
ADIS±6003
GENERAL DESCRIPTION
FEATURES
Dual-axis accelerometer
The ADIS16003 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI). An integrated temperature sensor is also available on the
SPI interface. The ADIS16003 measures acceleration with a full-
scale range of 1.ꢀ g (minimum), and it can measure both
dynamic acceleration (vibration) and static acceleration
(gravity).
SPI® digital output interface
Internal temperature sensor
Highly integrated; minimal external components;
bandwidth externally selectable
1 mg resolution at 60 Hz
Externally controlled electrostatic self-test
3.0 V to 5.25 V single-supply operation
Low power: <2 mA
The typical noise floor is 110 μg/√Hz, allowing signals below
1 mg (60 Hz bandwidth) to be resolved.
3500 g shock survival
7.2 mm × 7.2 mm × 3.6 mm package
The bandwidth of the accelerometer is set with optional capaci-
tors CX and CY at the XFILT and YFILT pins. Selection of the
two analog input channels is controlled via the serial interface.
APPLICATIONS
Industrial vibration/motion sensing
An externally driven self-test pin (ST) allows the user to verify
the accelerometer functionality.
Platform stabilization
Dual-axis tilt sensing
Tracking, recording, analysis devices
Alarms, security devices
The ADIS16003 is available in a ꢀ.2 mm × ꢀ.2 mm × 3.6 mm,
12-terminal LGA package.
FUNCTIONAL BLOCK DIAGRAM
V
CC
SCLK
DUAL-AXIS
±1.7g
ACCELEROMETER
DIN
SERIAL
INTERFACE
DOUT
CS
C
DC
TCS
TEMP
SENSOR
COM
ST
YFILT
XFILT
C
C
X
Y
Figure 1.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registeredtrademarks arethe property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
Fax: 781.461.3113
www.analog.com
© 2005 Analog Devices, Inc. All rights reserved.
ADIS±6003
TABLE OF CONTENTS
Specifications..................................................................................... 3
Temperature Sensor Serial Interface........................................ 12
Power Supply Decoupling ......................................................... 13
Setting the Bandwidth Using CXFILT and CYFILT ....................... 13
Timing Specifications .................................................................. 4
Circuit and Timing Diagrams..................................................... 5
Absolute Maximum Ratings............................................................ 6
ESD Caution.................................................................................. 6
Pin Configuration and Function Descriptions............................. ꢀ
Typical Performance Characteristics ............................................. 8
Theory of Operation ...................................................................... 11
Self-Test........................................................................................ 11
Serial Interface ............................................................................ 11
Accelerometer Serial Interface.................................................. 11
Selecting Filter Characteristics:
The Noise/Bandwidth Trade-Off ............................................. 13
Applications..................................................................................... 14
Dual-Axis Tilt Sensor ................................................................ 14
Second-Level Assembly............................................................. 14
Outline Dimensions....................................................................... 15
Ordering Guide .......................................................................... 15
REVISION HISTORY
10/05—Revision 0: Initial Version
Rev. 0 | Page 2 of 16
ADIS±6003
SPECIFICATIONS
TA = –40°C to +125°C, VCC = 5 V, CX, CY = 0 μF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications are
guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter
Conditions
Min
Typ
Max
Unit
ACCELEROMETER SENSOR INPUT
Measurement Range1
Nonlinearity
Package Alignment Error
Alignment Error
Each axis
1.ꢀ
g
%
% of full scale
X sensor to Y sensor
Each axis
0.ꢁ
1.ꢁ
0.1
2
2.ꢁ
degrees
degrees
%
Cross Axis Sensitivity
ꢁ
ACCELEROMETER SENSITIVITY
Sensitivity at XFILT, YFILT
Sensitivity Change due to Temperature2
ZERO g BIAS LEVEL
ꢀ69
820
8
88ꢁ
LSB/g
LSB
Delta from 2ꢁ°C
Each axis
0 g Voltage at XFILT, YFILT
0 g Offset vs. Temperature
ACCELEROMETER NOISE PERFORMANCE
Noise Density
190ꢁ
2048
0.14
2190
LSB
LSB/°C
@2ꢁ°C
110
μg/√Hz rms
ACCELEROMETER FREQUENCY RESPONSE3
CX, CY Range4
RFILT Tolerance
Sensor Resonant Frequency
ACCELEROMETER SELF-TEST
Logic Input Low
0
24
10
40
μF
kΩ
kHz
32
ꢁ.ꢁ
0.2 × VCC
904
V
V
kΩ
LSB
Logic Input High
0.8 × VCC
30
Self-Test 0 to Self-Test 1 323
ST Input Resistance to COM
Output Change at XOUT, YOUT
ꢁ0
614
ꢁ
TEMPERATURE SENSOR
Accuracy
Resolution
Update Rate
Temperature Conversion Time
DIGITAL INPUT
VCC = 3 V to ꢁ.2ꢁ V
2
10
400
2ꢁ
°C
Bits
μs
μs
Input High Voltage (VINH
)
VCC = 4.ꢀꢁ V to ꢁ.2ꢁ V
VCC = 3.0 V to 3.6 V
VCC = 3.0 V to ꢁ.2ꢁ V
VIN = 0 V or VCC
2.4
2.1
V
V
V
μA
pF
Input Low Voltage (VINL)
Input Current
Input Capacitance
DIGITAL OUTPUT
0.8
10
-10
1
10
Output High Voltage (VOH)
ISOURCE = 200 μA,
VCC = 3.0 V to ꢁ.2ꢁ V
ISINK = 200 μA
V
V
VCC – 0.ꢁ
3.0
Output Low Voltage (VOL)
POWER SUPPLY
0.4
Operating Voltage Range
Quiescent Supply Current
Power Down Current
ꢁ.2ꢁ
2.0
V
FSCLK = ꢁ0 kSPS
Cx, Cy = 0.1 μF
1.ꢁ
1.0
20
mA
mA
Ms
Turn-On Time6
1 Guaranteed by measurement of initial offset and sensitivity.
2 Defined as the output change from ambient to maximum temperature or ambient to minimum temperature.
3 Actual bandwidth response controlled by user-supplied external capacitor (Cx, Cy).
4 Bandwidth = 1/(2π x 32 kΩ x (2200 pF + C)). For Cx, Cy = 0, bandwidth = 2260 Hz. For Cx, Cy = 10 μF, bandwidth = 0.ꢁ Hz. Min/max values not tested.
ꢁ Self-test response changes as the square of Vcc.
6 Larger values of Cx, Cy increase turn-on time. Turn-on time is approximately 160 x (0.0022 μF + Cx + Cy) + 4 ms, where Cx, Cy are in μF.
Rev. 0 | Page 3 of 16
ADIS±6003
TIMING SPECIFICATIONS
TA = –40°C to +125°C, acceleration = 0 g, unless otherwise noted.
Table 2.
Parameter1, 2
VCC = 3.3
VCC = 5
Unit
Description
3
fSCLK
10
2
10
2
kHz min
MHz max
tCONVERT
tACQ
t1
14.ꢁ tSCLK
1.ꢁ tSCLK
10
14.ꢁ tCSLK
1.ꢁ tSCLK
10
Throughput time = tCONVERT + tACQ = 16 tSCLK
TCS/CS to SCLK setup time
ns min
ns max
ns max
ns min
ns min
ns min
ns min
ns max
μs typ
4
t2
60
30
Delay from TCS/CS until DOUT three-state disabled
Data access time after SCLK falling edge
Data setup time prior to SCLK rising edge
Data hold time after SCLK rising edge
SCLK high pulse width
SCLK low pulse width
TCS/CS rising edge to DOUT high impedance
Power-up time from shutdown
4
t3
100
20
20
0.4 × tSCLK
0.4 × tSCLK
80
ꢀꢁ
20
20
0.4 x tSCLK
0.4 x tSCLK
80
ꢁ
t4
tꢁ
t6
tꢀ
ꢁ
t8
t9
ꢁ
1 Guaranteed by design. All input signals are specified with tr and tf = ꢁ ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans
from 3.0 V to 3.6 V. The ꢁ V operating range spans from 4.ꢀꢁ V to ꢁ.2ꢁ V.
2 See Figure 3 and Figure 4.
3 Mark/space ratio for the SCLK input is 40/60 to 60/40.
4 Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with VCC = 3.3 V and time for an output to cross 0.8 V or
2.4 V with VCC = ꢁ.0 V.
ꢁ t8 is derived from the measured time taken by the data outputs to change 0.ꢁ V when loaded with the circuit in Figure 2. The measured number is then extrapolated
back to remove the effects of charging or discharging the ꢁ0 pF capacitor. This means that the time, t8, quoted in the timing characteristics is the true bus relinquish
time of the part and is independent of the bus loading.
Rev. 0 | Page 4 of 16
ADIS±6003
CIRCUIT AND TIMING DIAGRAMS
200μA
I
OL
TO OUTPUT
PIN
1.6V
C
L
50pF
200μA
I
OH
Figure 2. Load Circuit for Digital Output Timing Specifications
tACQ
tCONVERT
CS
t6
t1
1
5
6
15
SCLK
DOUT
2
3
4
16
t2
THREE-STATE
t7
t8
t3
THREE-STATE
4 LEADING ZEROS
ZERO
DB11
DB10
DB9
DB0
t4
t5
DIN
DONTC
ZERO
ZERO
ADD0
ONE
ZERO
PM0
Figure 3. Accelerometer Serial Interface Timing Diagram
TCS
t6
t1
1
11
15
SCLK
DOUT
2
3
4
16
t3
t7
t8
THREE-
STATE
THREE-STATE
LEADING
ZERO
DB0
DB9
DB8
DIN
Figure 4. Temperature Serial Interface Timing Diagram
Rev. 0 | Page ꢁ of 16
ADIS±6003
ABSOLUTE MAXIMUM RATINGS
Table 3.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Parameter
Rating
Acceleration (Any Axis, Unpowered)
Acceleration (Any Axis, Powered)
VCC
3,ꢁ00 g
3,ꢁ00 g
–0.3 V to +ꢀ.0 V
All Other Pins
(COM – 0.3 V) to
(VCC + 0.3 V)
Output Short-Circuit Duration
(Any Pin to Common)
Indefinite
Operating Temperature Range
Storage Temperature
–40°C to +12ꢁ°C
–6ꢁ°C to +1ꢁ0°C
Table 4. Package Characteristics
Package Type
θJA
θJC
Device Weight
0.3 grams
12-Terminal LGA
200°C/W
2ꢁ°C/W
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
1.0755
8× BSC
0.670
8× BSC
5.873
2×
1.127
12× BSC
0.500
12× BSC
Figure 5. Second-Level Assembly Pad Layout
Rev. 0 | Page 6 of 16
ADIS±6003
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
12
11
10
1
2
3
9
8
7
TCS
DOUT
DIN
XFILT
YFILT
NC
ADIS16003
TOP VIEW
(Not to Scale)
4
5
6
NC = NO CONNECT
Figure 6. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. Mnemonic Description
1
2
3
TCS
Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the temperature
sensor output.
Data Out, Logic Output. The conversion of the ADIS16003 is provided on this output as a serial data stream.
The bits are clocked out on the falling edge of the SCLK input.
Data In, Logic Input. Data to be written into the ADIS16003’s control register is provided on this input and
is clocked into the register on the rising edge of SCLK.
DOUT
DIN
4
ꢁ, ꢀ
6
COM
NC
ST
Common. Reference point for all circuitry on the ADIS16003.
No Connect.
Self-Test Input. Active high logic input. Simulates a nominal 0.ꢀꢁ g test input for diagnostic purpose.
8
YFILT
Y Channel Filter Node. Used in conjunction with an optional external capacitor to band-limit the ac signal
from the accelerometer.
9
XFILT
CS
X Channel Filter Node. Used in conjunction with an optional external capacitor to band-limit the ac signal
from the accelerometer.
Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer
conversions on the ADIS16003 and frames the serial data transfer for the accelerometer output.
10
11
12
VCC
SCLK
Power Supply Input. The VCC range for the ADIS16003 is from 3.0 V to ꢁ.2ꢁ V.
Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part and writing serial data
to the control register. This clock input is also used as the clock source for the ADIS16003’s conversion process.
Rev. 0 | Page ꢀ of 16
ADIS±6003
TYPICAL PERFORMANCE CHARACTERISTICS
40
35
30
25
20
15
10
5
890
870
850
830
810
790
770
0
1900 1929 1958 1987 2016 2045 2074 2103 2132 2161 2190
OUTPUT (LSB)
–40
–20
0
20
40
60
80
100
125
TEMPERATURE (°C)
Figure 10. X-Axis Zero g Bias at 25°C
Figure 7. Sensitivity vs. Temperature (AD16003 Soldered to PCB)
2200
40
35
30
25
20
15
10
5
2150
2100
2050
2000
1950
1900
–40
–20
0
20
40
60
80
100
125
0
1990 1929 1958 1987 2016 2045 2074 2103 2132 2161 2190
OUTPUT (LSB)
TEMPERATURE (°C)
Figure 8. Zero g Bias vs. Temperature
Figure 11. Y-Axis Zero g Bias at 25°C
2200
45
40
35
30
25
20
15
10
5
2150
2100
2050
2000
1950
1900
0
2.8 3.0 3.2 3.4 3.6 3.8 4.0 4.2 4.7 4.6 4.8 5.0 5.2 5.4
60
70
80
90
100 110 120 130 140 150
VOLTS
X-AXIS NOISE DENSITY (μg/ Hz)
Figure 9. Zero g Bias vs. Supply
Figure 12. X-Axis Noise Density at 25°C
Rev. 0 | Page 8 of 16
ADIS±6003
50
40
30
20
10
0
60
50
40
30
20
10
0
60
70
80
90
100 110 120 130 140 150
350 400 450 500 550 600 650 700 750 800 850
Y-AXIS NOISE DENSITY (μg/ Hz)
OUTPUT (LSB)
Figure 13. Y-Axis Noise Density at 25°C
Figure 16. Self-Test at 25°C, VCC at 5.0 V
35
30
25
20
15
10
5
45
40
35
30
25
20
15
10
5
0
0
–4.5 –3.5 –2.5 –1.5 –0.5 0.5 1.5 2.5 3.5 4.5 5.5
PERCENT SENSITIVITY (%)
180 195 210 225 240 255 270 285 300 315
OUTPUT (LSB)
Figure 14. Z vs. X Cross-Axis Sensitivity
Figure 17. Self-Test at 25°C, VCC at 3.3 V
40
35
30
25
20
15
10
5
750
700
650
600
550
500
450
0
–4.5 –3.5 –2.5 –1.5 –0.5 0.5 1.5 2.5 3.5 4.5 5.5
PERCENT SENSITIVITY (%)
–40
–20
0
20
40
60
80
100
125
TEMPERATURE (°C)
Figure 15. Z vs. Y Cross-Axis Sensitivity
Figure 18. Self-Test vs. Temperature VCC at 5.0 V
Rev. 0 | Page 9 of 16
ADIS±6003
800
700
600
500
400
300
200
100
90
80
70
60
50
40
30
20
10
0
3.3V
5V
1.15 1.20 1.25 1.30 1.35 1.40 1.45 1.50 1.55 1.60 1.65 1.70 1.75
2.8 3.0 3.2 3.4 3.6 3.8 4.0 4.2 4.4 4.6 4.8 5.0 5.2 5.4
CURRENT (μA)
VOLTS
Figure 21. Supply Current at 25°C
Figure 19. Self-Test vs. Supply Voltage
1.0
0.8
1.8
1.7
1.6
1.5
1.4
1.3
1.2
1.1
1.0
0.6
0.4
T
= +25°C
A
T
= +125°C
A
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
T
= –40°C
A
1
10
100
2.8 3.0 3.2 3.4 3.6 3.8 4.0 4.2 4.4 4.6 4.8 5.0 5.2 5.4
SAMPLE RATE (kSPS)
VOLTS
Figure 22. Sampling Error vs. Sample Rate
Figure 20. Supply Current vs. Supply Voltage
Rev. 0 | Page 10 of 16
ADIS±6003
THEORY OF OPERATION
ACCELEROMETER SERIAL INTERFACE
12
11
10
Figure 3 shows the detailed timing diagram for serial inter-
facing to the accelerometer in the ADIS16003. The serial clock
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 1229
Y-AXIS: 2048
CS
provides the conversion clock.
initiates the data transfer and
conversion process and frames the serial data transfer for the
accelerometer output. The accelerometer output is sampled on
the second rising edge of the SCLK input after the falling edge
4
5
6
9
8
7
3
2
1
CS
of the . The conversion requires 16 SCLK cycles to complete.
CS CS
The rising edge of
puts the bus back into three-state. If
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
Top View
Not to Scale
Y-AXIS: 2867
Y-AXIS: 1229
remains low, the next digital conversion is initiated. The details
for the control register bit functions are shown in Table 6.
1
2
3
7
8
9
Accelerometer Control Register
6
5
4
MSB
LSB
DONTC ZERO ZERO ZERO ADD0 ONE ZERO PM0
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2867
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
Y-AXIS: 2048
Y-AXIS: 2048
Table 6. Accelerometer Control Register Bit Functions
Bit Mnemonic Comments
10
11
12
ꢀ
DONTC
Don’t care. Can be one or zero.
These bits should be held low.
6, ꢁ, ZERO
4
Figure 23. Output Response vs. Orientation
3
ADD0
This address bit selects the x-axis or y-axis
outputs. Zero selects the x-axis; one selects
the y-axis.
The ADIS16003 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI) and an integrated temperature sensor whose output is also
available on the SPI interface. The ADIS16003 is capable of
measuring acceleration with a full-scale range of 1.ꢀ g
(minimum). It can also measure both dynamic acceleration
(vibration) and static acceleration (gravity).
2
1
0
ONE
ZERO
PM0
This bit should be held high.
This bit should be held low.
This bit selects the operation mode for the
accelerometer; set to zero for normal
operation and one for power down mode.
SELF-TEST
Power Down
The ST pin controls the self-test feature. When this pin is set to
VCC, an electrostatic force is exerted on the beam of the acceler-
ometer. The resulting movement of the beam allows the user to
test if the accelerometer is functional. The typical change in
output is ꢀ50 mg (corresponding to 614 LSB) for VCC = 5.0 V.
This pin may be left open-circuit or connected to common in
normal use. The ST pin should never be exposed to voltage
greater than VCC + 0.3 V. If the system design is such that this
condition cannot be guaranteed (for example, multiple supply
voltages present), a low VF clamping diode between ST and VCC
is recommended.
By setting PM0 to one when updating the accelerometer control
register, the ADIS16003 goes into a shutdown mode. The
information stored in the control register is maintained during
shutdown. The ADIS16003 changes modes as soon as the
control register is updated. If the part is in shutdown mode and
PM0 is changed to zero, then the part powers up on the
sixteenth SCLK rising edge.
ADD0
By setting ADD0 to zero when updating the accelerometer
control register, the x-axis output is selected. By setting ADD0
to one, the y-axis output is selected.
SERIAL INTERFACE
ZERO
CS
The serial interface on the ADIS16003 consists of five wires,
TCS
,
ZERO is defined as the logic low level.
, SCLK, DIN, and DOUT, with the temperature sensor’s
serial interface in parallel with the accelerometer’s serial
CS TCS
are used to select the accelerometer
ONE
interface. The
and
ONE is defined as the logic high level.
CS
TCS
cannot
or temperature sensor outputs, respectively.
be active at the same time.
and
DONTC
DONTC is defined as don’t care; can be a low or high logic level.
The SCLK input accesses data from the internal data registers.
Rev. 0 | Page 11 of 16
ADIS±6003
Accelerometer Conversion Details
A conversion is initiated approximately every 350 μs. At this
time, the temperature sensor wakes up and performs a tempera-
ture conversion. This temperature conversion typically takes
25 μs, at which time the temperature sensor automatically shuts
down. The result of the most recent temperature conversion is
available in the serial output register at any time. Once the
conversion is finished, an internal oscillator starts counting and
is designed to time out every 350 μs. The temperature sensor
Every time the accelerometer is sampled, the sampling function
discharges the internal CX or CY filtering capacitors by up to 2%
of their initial values (assuming no additional external filtering
capacitors have been added). The recovery time for the filter
capacitor to recharge is approximately 10 μs. Thus, sampling the
accelerometer at a rate of 10 kSPS or less does not induce a
sampling error. However, as sampling frequencies increase
above 10 kSPS, one can expect sampling errors to attenuate the
actual acceleration levels.
TCS
then powers up and does a conversion. Note that if the
is
brought low every 350 μs ( 30%) or less, then the same
temperature value is output onto the DOUT line every time
TEMPERATURE SENSOR SERIAL INTERFACE
Read Operation
TCS
without changing. It is recommended that the
line not be
brought low every 350 μs ( 30%) or less. The 30% covers
Figure 4 shows the timing diagram for a serial read from the
TCS
process variation. The
outside this range.
should become active (high to low)
TCS
temperature sensor. The
line enables the SCLK input. Ten
bits of data and a leading zero are transferred during a read
operation. Read operations occur during streams of 16 clock
pulses. The serial data is accessed in a number of bytes if 10 bits
of data are being read. At the end of the read operation, the
DOUT line remains in the state of the last bit of data clocked
The device is designed to auto convert every 350 μs. If the
temperature sensor is accessed during the conversion process,
an internal signal is generated to prevent any update of the
temperature value register during the conversion. This prevents
the user from reading back spurious data. The design of this
feature results in this internal lockout signal being reset only at
TCS
out until
goes high, at which time the DOUT line from
the temperature sensor goes three-state.
TCS
the start of the next auto conversion. Therefore, if the
goes active before the internal lockout signal is reset to its
inactive mode, the internal lockout signal is not reset. To ensure
TCS
line
Write Operation
Figure 4 also shows the timing diagram for the serial write
to the temperature sensor. The write operation takes place at
the same time as the read operation. Data is clocked into the
control register on the rising edge of SCLK. DIN should remain
low for the entire cycle.
that no lockout signal is set, bring
low at a greater time
than 350 μs ( 30%). As a result, the temperature sensor is not
interrupted during a conversion process.
In the automatic conversion mode, every time a read or write
operation takes place, the internal clock oscillator is restarted at
the end of the read or write operation. The result of the conver-
sion is typically available 25 μs later. Reading from the device
before conversion is complete provides the same set of data.
Temperature Sensor Control Register
MSB
ZERO ZERO ZERO ZERO ZERO ZERO ZERO ZERO
LSB
Table 7. Temperature Sensor Control Register Bit Functions
Bit
Mnemonic
Comments
Table 8. Temperature Sensor Data Format
ꢀ to 0
ZERO
All bits should be held low.
Temperature
Digital Output (DB9 … DB0)
ZERO
–40°C
11 0110 0000
ZERO is defined as the logic low level.
–2ꢁ°C
11 1001 1100
–0.2ꢁ°C
0°C
+0.2ꢁ°C
+10°C
11 1111 1111
00 0000 0000
00 0000 0001
00 0010 1000
Output Data Format
The output data format for the temperature sensor is twos
complement. Table 8 shows the relationship between the digital
output and the temperature.
+2ꢁ°C
00 0110 0100
+ꢁ0°C
+ꢀꢁ°C
+100°C
+12ꢁ°C
00 1100 1000
01 0010 1100
01 1001 0000
01 1111 0100
Temperature Sensor Conversion Details
The ADIS16003 features a 10-bit digital temperature sensor
that allows an accurate measurement of the ambient device
temperature to be made.
The conversion clock for the temperature sensor is internally
generated so no external clock is required except when reading
from and writing to the serial port. In normal mode, an internal
clock oscillator runs the automatic conversion sequence.
Rev. 0 | Page 12 of 16
ADIS±6003
The ADIS16003 noise has the characteristics of white Gaussian
noise, which contributes equally at all frequencies and is
described in terms of μg/√Hz (that is, the noise is proportional
to the square root of the accelerometer’s bandwidth). The user
should limit bandwidth to the lowest frequency needed by the
application in order to maximize the resolution and dynamic
range of the accelerometer.
POWER SUPPLY DECOUPLING
For most applications, a single 0.1 μF capacitor (CDC) adequately
decouples the accelerometer from noise on the power supply.
However, in some cases, particularly where noise is present at
the 140 kHz internal clock frequency (or any harmonic
thereof), noise on the supply may cause interference on the
ADIS16003 output. If additional decoupling is needed, ferrite
beads may be inserted in the supply line of the ADIS16003.
Additionally, a larger bulk bypass capacitor (in the 1 μF to 22 μF
range) may be added in parallel to CDC.
With the single pole roll-off characteristic, the typical noise of
the ADIS16003 is determined by
rmsNoise = (110 μg/√Hz) x (√(BW x 1.6))
At 100 Hz, the noise is
SETTING THE BANDWIDTH USING CXFILT AND CYFILT
The ADIS16003 has provisions for band-limiting the acceler-
ometer. Capacitors can be added at the XFILT and YFILT pins
to implement further low-pass filtering for antialiasing and
noise reduction. The equation for the 3 dB bandwidth is
rmsNoise = (110 μg/√Hz) x (√(100 x 1.6)) =1.4 mg
Often, the peak value of the noise is desired. Peak-to-peak noise
can only be estimated by statistical methods. Table 10 is useful
for estimating the probabilities of exceeding various peak
values, given the rms value.
F
−3dB = 1/(2π(32 kΩ) × (C(XFILT, YFILT) + 2200 pF))
or more simply,
−3dB = 5 μF/(C(XFILT, YFILT) + 2200 pF)
Table 10. Estimation of Peak-to-Peak Noise
F
Peak-to-Peak Percentage of Time that Noise Exceeds
The tolerance of the internal resistor (RFILT) can vary typically as
much as 25% of its nominal value (32 kΩ); thus, the band-
width varies accordingly.
Value
Nominal Peak-to-Peak Value
2 × rms
4 × rms
6 × rms
8 × rms
32%
4.6%
0.2ꢀ%
0.006%
A minimum capacitance of 0 pF for CXFILT and CYFILT is
allowable.
Table 9. Filter Capacitor Selection, CXFILT and CYFILT
Bandwidth (Hz)
Capacitor (μF)
1
4.ꢀ
10
ꢁ0
100
200
400
22ꢁ0
0.4ꢀ
0.10
0.04ꢀ
0.022
0.01
0
SELECTING FILTER CHARACTERISTICS:
THE NOISE/BANDWIDTH TRADE-OFF
The accelerometer bandwidth selected ultimately determines
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor, which improves
the resolution of the accelerometer. Resolution is dependent
on the analog filter bandwidth at XFILT and YFILT.
The ADIS16003 has a typical bandwidth of 2.25 kHz with no
external filtering. The analog bandwidth may be further
decreased to reduce noise and improve resolution.
Rev. 0 | Page 13 of 16
ADIS±6003
APPLICATIONS
DUAL-AXIS TILT SENSOR
CRITICAL ZONE
TO T
T
tP
L
P
T
P
One of the most popular applications of the ADIS16003 is tilt
measurement. An accelerometer uses the force of gravity as an
input vector to determine the orientation of an object in space.
An accelerometer is most sensitive to tilt when its sensitive axis
is perpendicular to the force of gravity, that is, parallel to the
earth’s surface. At this orientation, its sensitivity to changes in
tilt is highest. When the accelerometer is oriented on axis to
gravity, near its +1 g or –1 g reading, the change in output
acceleration per degree of tilt is negligible. When the acceler-
ometer is perpendicular to gravity, its output changes nearly
1ꢀ.5 mg per degree of tilt. At 45°, its output changes at only
12.2 mg per degree, and resolution declines.
RAMP-UP
T
L
tL
T
SMAX
T
SMIN
tS
RAMP-DOWN
PREHEAT
t
25°C TO PEAK
TIME
Figure 24. Acceptable Solder Reflow Profiles
Table 11.
Converting Acceleration to Tilt
Condition
When the accelerometer is oriented so both its x-axis and y-axis
are parallel to the earth’s surface, it can be used as a 2-axis tilt
sensor with a roll axis and a pitch axis. Once the output signal
from the accelerometer has been converted to an acceleration
that varies between –1 g and +1 g, the output tilt in degrees is
calculated as follows:
Profile Feature
Sn63/Pb37
Pb-free
Average Ramp Rate (TL to TP)
Preheat
Minimum Temperature (TSMIN
Maximum Temperature (TSMAX
Time (TSMIN to TSMAX) (ts)
3°C/sec max
3°C/sec max
)
)
100°C
1ꢁ0°C
60 sec to
120 sec
1ꢁ0°C
200°C
60 sec to
1ꢁ0 sec
PITCH = Asin(A
X/1 g)
TSMAX to TL
Ramp-Up Rate
ROLL = Asin(A /1 g)
Y
3°C/sec
3°C/sec
Time Maintained Above
Liquidous (TL)
Liquidous Temperature (TL)
Time (tL)
Be sure to account for overranges. It is possible for the
accelerometers to output a signal greater than 1 g due to
vibration, shock, or other accelerations.
183°C
21ꢀ°C
60 sec to
1ꢁ0 sec
60 sec to
1ꢁ0 sec
SECOND-LEVEL ASSEMBLY
Peak Temperature (TP)
240°C +
260°C +
The ADIS16003 may be attached to the second-level assembly
board using SN63 (or equivalent) or lead-free solder. Figure 24
and Table 11 provide acceptable solder reflow profiles for each
solder type. Note: These profiles may not be the optimum
profile for the user’s application. In no case should 260°C be
exceeded. It is recommended that the user develop a reflow
profile based upon the specific application. In general, keep in
mind that the lowest peak temperature and shortest dwell time
above the melt temperature of the solder results in less shock
and stress to the product. In addition, evaluating the cooling
rate and peak temperature can result in a more reliable
assembly.
0°C/–ꢁ°C
0°C/–ꢁ°C
Time Within ꢁ°C of Actual Peak
Temperature (tp)
10 sec to
30 sec
20 sec to
40 sec
Ramp-Down Rate
6°C/sec max
6 min max
6°C/sec max
8 min max
Time 2ꢁ°C to Peak Temperature
Rev. 0 | Page 14 of 16
ADIS±6003
OUTLINE DIMENSIONS
1.302
BSC
7.327
MAX SQ
PIN 1
INDICATOR
10
12
1.00
BSC
9
7
1
PIN 1
INDICATOR
0.797
BSC
3
6
4
TOP VIEW
5.00 TYP
BOTTOM VIEW
0.373
BSC
0.227
BSC
3.60
MAX
Figure 25. 12-Terminal Land Grid Array [LGA]
(CC-12)
Dimensions shown in millimeters
ORDERING GUIDE
Model
ADIS16003CCCZ 1
Temperature Range
−40°C to +12ꢁ°C
Package Description
Package Option
CC-12
12-Terminal Land Grid Array (LGA)
Evaluation Board
ADIS16003/PCB
1 Z = Pb-free part.
Rev. 0 | Page 1ꢁ of 16
ADIS±6003
NOTES
© 2005 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D05463-0-10/05(0)
Rev. 0 | Page 16 of 16
相关型号：
©2020 ICPDF网 联系我们和版权申明