ADXL212AEZ [ADI]

Precision ±2 g Dual Axis, PWM Output Accelerometer; 精度±2 g两轴, PWM输出加速度计
ADXL212AEZ
型号: ADXL212AEZ
厂家: ADI    ADI
描述:

Precision ±2 g Dual Axis, PWM Output Accelerometer
精度±2 g两轴, PWM输出加速度计

模拟IC 信号电路 PC
文件: 总12页 (文件大小:241K)
中文:  中文翻译
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Precision ± ± g Dual Axis,  
PWM Output Accelerometer  
ADXL±1±  
FEATURES  
GENERAL DESCRIPTION  
Dual axis accelerometer on a single IC chip  
5 mm × 5 mm × 2 mm LCC package  
5 mg resolution at 60 Hz  
Low power: 700 μA at VS = 5 V (typical)  
High zero g bias stability  
The ADXL212 is a high precision, low power, complete dual  
axis accelerometer with signal conditioned, duty cycle modulated  
outputs, all on a single monolithic IC. The ADXL212 measures  
acceleration with a full-scale range of 2 g (typical). The ADXL212  
measures both dynamic acceleration (such as vibration) and  
static acceleration (such as gravity).  
High sensitivity accuracy  
Pulse width modulated digital outputs  
X- and Y-axis aligned to within 0.1° (typical)  
Bandwidth adjustment with a single capacitor  
Single-supply operation  
The outputs are digital signals whose duty cycles (ratio of pulse  
width to period) are proportional to acceleration (12.5%/g) in  
each of the two sensitive axes. The duty cycle outputs can be  
directly measured by a microcontroller without an analog-to-  
digital converter (ADC) or glue logic. The output period is  
adjustable from 0.5 ms to 10 ms via a single resistor (RSET).  
3500 g shock survival  
APPLICATIONS  
Automotive tilt alarms  
Vehicle dynamic control (VDC)/electronic stability program  
(ESP) systems  
The typical noise floor is 500 μg/√Hz, allowing signals below  
5 mg (0.3° of inclination) to be resolved in tilt sensing applica-  
tions using narrow bandwidths (<60 Hz).  
Electronic chassis control  
Electronic braking  
Data projectors  
The user selects the bandwidth of the accelerometer using  
Capacitors CX and CY at the XFILT and YFILT pins. Bandwidths  
of 0.5 Hz to 500 Hz can be selected to suit the application.  
Navigation  
The ADXL212 is available in a 5 mm × 5 mm × 2 mm, 8-lead  
hermetic LCC package.  
Platform stabilization/leveling  
Alarms and motion detectors  
High accuracy, 2-axis tilt sensing  
FUNCTIONAL BLOCK DIAGRAM  
+V  
V
S
C
Y
Y
FILT  
S
ADXL212  
32k  
32kΩ  
OUTPUT  
AMP  
Y
X
OUT  
OUT  
C
DC  
AC  
AMP  
DEMOD  
DCM  
OUTPUT  
AMP  
SENSOR  
COM  
ST  
X
T2  
FILT  
C
R
SET  
X
PWM OUTPUT WAVEFORM SAMPLE  
t2  
t1  
A(g) = (t1/t2 – 0.5)/12.5%  
0g = 50% DUTY CYCLE  
t2(sec) = R  
/125MΩ  
SET  
Figure 1.  
Rev. 0  
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responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other  
rights of third parties that may result from its use. Specifications subject to change without notice. No  
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.  
Trademarks and registeredtrademarks arethe property of their respective owners.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781.329.4700  
Fax: 781.461.3113  
www.analog.com  
©2011 Analog Devices, Inc. All rights reserved.  
 
ADXL±1±  
TABLE OF CONTENTS  
Features .............................................................................................. 1  
Applications Information.............................................................. 10  
Power Supply Decoupling ......................................................... 10  
Setting the Bandwidth Using CX and CY ................................. 10  
Self Test........................................................................................ 10  
Applications....................................................................................... 1  
General Description......................................................................... 1  
Functional Block Diagram .............................................................. 1  
Revision History ............................................................................... 2  
Specifications..................................................................................... 3  
Absolute Maximum Ratings............................................................ 4  
Thermal Resistance ...................................................................... 4  
ESD Caution.................................................................................. 4  
Pin Configuration and Function Descriptions............................. 5  
Typical Performance Characteristics ............................................. 6  
Theory of Operation ........................................................................ 9  
Performance .................................................................................. 9  
Design Trade-Offs for Selecting Filter Characteristics: Noise  
vs. Bandwidth ............................................................................. 10  
Using the ADXL212 with Operating Voltages Other Than 5 V  
....................................................................................................... 11  
Using the ADXL212 as a Dual Axis Tilt Sensor..................... 11  
Outline Dimensions....................................................................... 12  
Ordering Guide .......................................................................... 12  
REVISION HISTORY  
5/11—Revision 0: Initial Version  
Rev. 0 | Page 2 of 12  
 
ADXL±1±  
SPECIFICATIONS  
TA = –40°C to +85°C, VS = 5 V, CX = CY = 0.1 ꢀF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications  
are guaranteed. Typical specifications are not guaranteed.  
Table 1.  
Parameter  
Test Conditions/Comments  
Min  
Typ  
Max  
Unit  
SENSOR INPUT  
Measurement Range1  
Each axis  
1.ꢀ  
2
g
Nonlinearity  
Package Alignment Error  
Alignment Error  
Best fit straight line  
X sensor to Y sensor  
0.2  
1
0.01  
% of FS  
Degrees  
Degrees  
%
Cross Axis Sensitivity  
SENSITIVITY (RATIOMETRIC)2  
Sensitivity at XOUT, YOUT  
Sensitivity Change Due to Temperature3  
ZERO g BIAS LEVEL (RATIOMETRIC)  
0 g Duty Cycle at XOUT, YOUT  
Initial 0 g Output Deviation from Ideal  
0 g Duty Cycle vs. Supply  
0 g Offset vs. Temperature  
NOISE PERFORMANCE  
Noise Density  
FREQUENCY RESPONSE4  
3 dB Bandwidthꢀ  
CX, CY Rangeꢀ  
Sensor Resonant Frequency  
SELF TEST6  
Duty Cycle Change  
2
Each axis  
VS = ꢀ V  
VS = ꢀ V  
10  
2ꢀ  
12.ꢀ  
0.ꢀ  
1ꢀ  
%/g  
%
Each axis  
ꢀ0  
2
1.0  
2
7ꢀ  
%
%
%/V  
mg/°C  
TA = 2ꢀ°C  
TA = 2ꢀ°C  
4.0  
ꢀ00  
ꢀ00  
ꢀ.ꢀ  
10  
1000 μg/√Hz rms  
Hz  
μF  
kHz  
0.002  
4.7  
Self test (ST) pin: pulled low (0) to high (1)  
%
DUTY CYCLE OUTPUT STAGE  
7
fSET  
RSET = 12ꢀ kΩ  
RSET = 12ꢀ kΩ  
1
kHz  
kHz  
fSET7 Tolerance  
0.7  
1.3  
Voltage Levels  
High  
Low  
I = 2ꢀ μA  
I = 2ꢀ μA  
VS − 0.2  
V
mV  
200  
t2 Drift vs. Temperature  
Rise/Fall Time  
3ꢀ  
200  
ppm/°C  
ns  
POWER SUPPLY  
Operating Voltage Range  
Specified Performance  
Quiescent Supply Current  
Turn-On Time8  
3.0  
4.7ꢀ  
ꢀ.2ꢀ  
ꢀ.2ꢀ  
1.1  
V
V
mA  
ms  
0.7  
19  
TEMPERATURE RANGE  
Specified Performance  
−40  
+8ꢀ  
°C  
1 Guaranteed by measurement of initial offset and sensitivity.  
2 Sensitivity varies with VS. At VS = 3 V, sensitivity is typically 7.ꢀ%/g.  
3 Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature.  
4 Actual frequency response is controlled by a user supplied external capacitor (CX, CY).  
Bandwidth = 1/(2 × π × 32 kΩ × C). For CX, CY = 0.002 μF, bandwidth = 2ꢀ00 Hz. For CX, CY = 4.7 μF, bandwidth = 1 Hz. Minimum/maximum values are not tested.  
6 Self test response changes with VS. At VS = 3 V, self test output is typically 6%.  
7 The value of fSET is defined by the following equation:  
1
fSET  
=
t2  
8 Larger values of CX, CY increase turn-on time. Turn-on time is approximately 160 × CX or CY + 3, where CX, CY are in μF, and the resulting turn-on time is in ms.  
Rev. 0 | Page 3 of 12  
 
ADXL±1±  
ABSOLUTE MAXIMUM RATINGS  
Table 2.  
THERMAL RESISTANCE  
θJA is specified for the worst-case conditions, that is, a device  
soldered in a circuit board for surface-mount packages.  
Parameter  
Rating  
Acceleration (Any Axis, Unpowered)  
Acceleration (Any Axis, Powered)  
VS  
Output Short-Circuit Duration  
(Any Pin to Common)  
1000 g  
1000 g  
−0.3 V to +7.0 V  
Indefinite  
Table 3. Thermal Resistance  
Package Type  
θJA  
θJC  
Device Weight  
8-Lead Ceramic LCC  
120°C/W  
20°C/W  
<1.0 g  
Operating Temperature Range  
Storage Temperature Range  
−ꢀꢀ°C to +12ꢀ°C  
−6ꢀ°C to +1ꢀ0°C  
ESD CAUTION  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only; functional operation of the device at these or any  
other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
CRITICAL ZONE  
TO T  
T
tP  
L
P
T
P
RAMP-UP  
T
L
tL  
T
SMAX  
T
SMIN  
tS  
RAMP-DOWN  
PREHEAT  
t
25°C TO PEAK  
TIME  
Figure 2. Recommended Soldering Profile  
Table 4. Soldering Profile  
Condition  
Profile Feature  
Sn63/Pb37  
Pb Free  
Average Ramp Rate (TL to TP)  
Preheat  
3°C/sec maximum  
Minimum Temperature (TSMIN  
)
)
100°C  
1ꢀ0°C  
60 sec to 120 sec  
1ꢀ0°C  
200°C  
60 sec to 1ꢀ0 sec  
Minimum Temperature (TSMAX  
Time (TSMIN to TSMAX) (tS)  
TSMAX to TL  
Ramp-Up Rate  
3°C/sec maximum  
217°C  
Time (tL) Maintained Above Liquidous (TL)  
Liquidous Temperature (TL)  
Time (tL)  
183°C  
60 sec to 1ꢀ0 sec  
240°C +0°C/–ꢀ°C  
10 sec to 30 sec  
60 sec to 1ꢀ0 sec  
Peak Temperature (TP)  
260°C +0°C/–ꢀ°C  
20 sec to 40 sec  
Time Within ꢀ°C of Actual Peak Temperature (tP)  
Ramp-Down Rate  
6°C/sec maximum  
8 minutes maximum  
Time 2ꢀ°C to Peak Temperature  
6 minutes maximum  
Rev. 0 | Page 4 of 12  
 
ADXL±1±  
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS  
ADXL212  
TOP VIEW  
(Not to Scale)  
V
S
8
ST  
T2  
1
2
3
7
6
5
X
Y
X
FILT  
FILT  
OUT  
COM  
4
Y
OUT  
Figure 3. Pin Configuration  
Table 5. Pin Function Descriptions  
Pin No.  
Mnemonic  
Description  
1
2
ST  
T2  
Self Test.  
Frequency Set. Connect the RSET resistor to ground.  
t2 = RSET/12ꢀ MΩ  
See the Theory of Operation section for details.  
Common.  
Y Channel Output.  
X Channel Output.  
Y Channel Filter Pin.  
X Channel Filter Pin.  
Voltage Supply. 3 V to ꢀ.2ꢀ V.  
3
4
6
7
8
COM  
YOUT  
XOUT  
YFILT  
XFILT  
VS  
Rev. 0 | Page ꢀ of 12  
 
ADXL±1±  
TYPICAL PERFORMANCE CHARACTERISTICS  
VS = 5 V, unless otherwise noted.  
25  
25  
20  
15  
10  
20  
15  
10  
5
0
5
0
DUTY CYCLE OUTPUT (%)  
DUTY CYCLE OUTPUT (%)  
Figure 4. X-Axis Zero g Bias Deviation from Ideal at 25°C  
Figure 7. Y-Axis Zero g Bias Deviation from Ideal at 25°C  
30  
25  
40  
35  
30  
25  
20  
15  
10  
20  
15  
10  
5
5
0
0
TEMPCO (mg/°C)  
TEMPCO (mg/°C)  
Figure 8. Y-Axis Zero g Bias Tempco  
Figure 5. X-Axis Zero g Bias Tempco  
30  
25  
20  
15  
30  
25  
20  
15  
10  
5.0  
0
10  
5
0
SENSITIVITY (%/g)  
SENSITIVITY (%/g)  
Figure 9. Y-Axis Sensitivity at 25°C  
Figure 6. X-Axis Sensitivity at 25°C  
Rev. 0 | Page 6 of 12  
 
ADXL±1±  
54.0  
53.5  
53.0  
52.5  
52.0  
51.5  
51.0  
50.5  
50.0  
49.5  
49.0  
13.1  
13.0  
12.9  
12.8  
12.7  
12.6  
12.5  
12.4  
12.3  
12.2  
48.5  
48.0  
47.5  
47.0  
46.5  
46.0  
12.1  
12.0  
11.9  
TEMPERATURE (°C)  
TEMPERATURE (°C)  
Figure 13. Sensitivity vs. Temperature, Parts Soldered to PCB  
Figure 10. Zero g Bias vs. Temperature, Parts Soldered to PCB  
40  
35  
30  
25  
20  
15  
10  
40  
35  
30  
25  
20  
15  
10  
5
0
5
0
NOISE DENSITY (µg/ Hz)  
NOISE DENSITY (µg/ Hz)  
Figure 14. Y-Axis Noise Density at 25°C  
Figure 11. X-Axis Noise Density at 25°C  
0.9  
10.8  
10.6  
0.8  
0.7  
0.6  
10.4  
10.2  
10.0  
9.8  
V
= 5V  
S
9.6  
0.5  
9.4  
V
= 3V  
S
9.2  
0.4  
0.3  
9.0  
8.8  
–50  
0
50  
TEMPERATURE (°C)  
100  
150  
TEMPERATURE (°C)  
Figure 15. Supply Current vs. Temperature  
Figure 12. Self Test Response vs. Temperature  
Rev. 0 | Page 7 of 12  
 
ADXL±1±  
16  
18  
16  
14  
12  
10  
8
14  
12  
10  
8
6
6
4
4
2
2
0
0
DELTA IN DUTY CYCLE (%)  
DELTA IN DUTY CYCLE (%)  
Figure 18. Y-Axis Self Test Response at 25°C  
Figure 16. X-Axis Self Test Response at 25°C  
100  
90  
T
V
= 5V  
S
80  
V
= 3V  
S
70  
60  
50  
40  
30  
20  
C , C = 0.1µF  
X
Y
TIME SCALE = 2ms/div  
10  
0
SUPPLY CURRENT (µA)  
Figure 17. Supply Current at 25°C  
Figure 19. Turn-On Time  
Rev. 0 | Page 8 of 12  
ADXL±1±  
THEORY OF OPERATION  
PIN 8  
= 62.5%  
X
OUT  
Y
= 50%  
OUT  
PIN 8  
TOP VIEW  
PIN 8  
X
= 50%  
= 37.5%  
(Not to Scale)  
X
Y
= 50%  
= 62.5%  
OUT  
OUT  
OUT  
Y
OUT  
X
Y
= 50%  
= 50%  
OUT  
OUT  
PIN 8  
X
= 37.5%  
OUT  
Y
= 50%  
OUT  
EARTH'S SURFACE  
Figure 20. Output Response vs. Orientation  
The ADXL212 is a complete dual axis acceleration measure-  
ment system on a single monolithic IC. It contains a polysilicon  
surface-micromachined sensor and signal conditioning circuitry  
to implement an open-loop acceleration measurement archi-  
tecture. The output signals are duty cycle modulated digital  
signals proportional to the acceleration. The ADXL212 is capable  
of measuring both positive and negative accelerations to 2 g.  
The accelerometer can measure static acceleration forces such  
as gravity, allowing the ADXL212 to be used as a tilt sensor.  
A single resistor (RSET) sets the period for a complete cycle (t2)  
according to the following equation:  
t2 (nominal) = RSET/125 Mꢁ  
A 0 g acceleration produces a 50% nominal duty cycle. The  
acceleration can be determined by measuring the length of the  
positive pulse width (t1) and the period (t2). The nominal  
transfer function of the ADXL212 is  
Acceleration = ((t1/t2) − Zero g Bias)/Sensitivity  
The sensor is a surface-micromachined polysilicon structure  
built on top of a silicon wafer. Polysilicon springs suspend the  
structure over the surface of the wafer and provide a resistance  
against acceleration forces. Deflection of the structure is measured  
using a differential capacitor that consists of independent fixed  
plates and plates attached to the moving mass. The fixed plates  
are driven by 180° out-of-phase square waves. Acceleration  
deflects the beam and unbalances the differential capacitor,  
resulting in an output square wave with an amplitude that is  
proportional to acceleration. Phase sensitive demodulation tech-  
niques are used to rectify the signal and determine the direction  
of the acceleration.  
where:  
Zero g Bias = 50% nominal.  
Sensitivity = 12.5%/g nominal.  
PERFORMANCE  
High performance is built into the device through innovative  
design techniques rather than by using additional temperature  
compensation circuitry. As a result, there is essentially no quantiza-  
tion error or nonmonotonic behavior, and temperature hysteresis  
is very low (typically less than 10 mg over the −40°C to +85°C  
temperature range).  
Figure 10 shows the zero g output performance of eight parts  
(x-axis and y-axis) over a –40°C to +85°C temperature range.  
The output of the demodulator is amplified and brought off  
chip through a 32 kΩ resistor, at which point the user can set  
the signal bandwidth of the device by adding a capacitor. This  
filtering improves measurement resolution and helps prevent  
aliasing.  
Figure 13 demonstrates the typical sensitivity shift over temper-  
ature for VS = 5 V. Sensitivity stability is optimized for VS = 5 V  
but remains very good over the specified range; it is typically  
better than 2% over temperature at VS = 3 V.  
After being low-pass filtered, the analog signals are converted to  
duty cycle modulated outputs that can be read by a counter.  
Rev. 0 | Page 9 of 12  
 
 
ADXL±1±  
APPLICATIONS INFORMATION  
DESIGN TRADE-OFFS FOR SELECTING FILTER  
CHARACTERISTICS: NOISE vs. BANDWIDTH  
POWER SUPPLY DECOUPLING  
For most applications, a single 0.1 μF capacitor, CDC, adequately  
decouples the accelerometer from noise on the power supply.  
However, in some cases, particularly where noise is present at  
the 140 kHz internal clock frequency (or any harmonic thereof),  
noise on the supply may cause interference on the output of the  
ADXL212. If additional decoupling is needed, insert a 100 Ω (or  
smaller) resistor or ferrite beads in the supply line of the ADXL212.  
In addition or as an alternative to adding the resistor or ferrite  
beads, a larger bulk bypass capacitor (in the range of 1 μF to  
The chosen accelerometer bandwidth ultimately determines the  
measurement resolution (smallest detectable acceleration). Filtering  
can be used to lower the noise floor, which improves the resolu-  
tion of the accelerometer. Resolution is dependent on the analog  
filter capacitors at XFILT and YFILT  
.
The ADXL212 has a typical PWM bandwidth of 500 Hz. The  
user must filter the signal to a bandwidth lower than 500 Hz to  
limit aliasing errors.  
22 μF) can be added in parallel to CDC  
.
The ADXL212 noise has the characteristics of white Gaussian  
noise, which contributes equally at all frequencies and is described  
in terms of μg/√Hz (that is, the noise is proportional to the square  
root of the accelerometer bandwidth). To maximize the resolu-  
tion and dynamic range of the accelerometer, limit bandwidth  
to the lowest frequency needed by the application.  
SETTING THE BANDWIDTH USING CX AND CY  
The ADXL212 has provisions for band limiting the XOUT and  
YOUT pins. Capacitors must be added at these pins to implement  
low-pass filtering for antialiasing and noise reduction. The  
equation for the 3 dB bandwidth is  
With the single pole roll-off characteristic, the typical noise of  
the ADXL212 is determined by  
f
3 dB = 1/(2π(32 kΩ) × C(X, Y)  
or more simply,  
3 dB = 5 μF/C(X, Y)  
)
rms Noise = (500 μg/ Hz )×( BW ×1.6)  
At 100 Hz, the noise is  
f
The tolerance of the internal resistor (RFILT) can vary typically as  
much as 25% of its nominal value (32 kΩ); the bandwidth varies  
accordingly. A minimum capacitance of 2000 pF for CX and CY  
is required in all cases.  
rms Noise = (500 μg/ Hz)×( 100×1.6) = 6.3mg  
Often, the peak value of the noise is desired. Peak-to-peak noise  
can only be estimated by statistical methods. Table 7 is useful  
for estimating the probabilities of exceeding various peak values,  
given the rms value.  
Table 6. Filter Capacitor Selection, CX and CY  
Bandwidth (Hz)  
Capacitor (μF)  
1
10  
ꢀ0  
100  
200  
ꢀ00  
4.7  
Table 7. Estimation of Peak-to-Peak Noise  
0.47  
0.10  
0.0ꢀ  
0.027  
0.01  
% of Time that Noise Exceeds  
Nominal Peak-to-Peak Value  
Peak-to-Peak Value  
2 × rms  
32  
4 × rms  
4.6  
6 × rms  
8 × rms  
0.27  
0.006  
SELF TEST  
The ST pin controls the self test feature. When this pin is set to  
VS, an electrostatic force is exerted on the beam of the accelero-  
meter. The resulting movement of the beam allows the user to  
test if the accelerometer is functional. The typical change in  
output is 750 mg (corresponding to a duty cycle of 10%) and is  
additive to the accelerometer outputs. The ST pin can remain  
open circuit, or it can be connected to ground in normal use.  
For example, at 100 Hz bandwidth, peak noise exceeds 25.2 mg  
4.6% of the time.  
Peak-to-peak noise values provide the best estimate of the  
uncertainty in a single measurement. Table 8 lists the typical  
noise output of the ADXL212 for various CX and CY values.  
Table 8. Filter Capacitor Selection (CX, CY)  
CX, CY RMS Noise  
Peak-to-Peak Noise  
Estimate (mg)  
Never expose the ST pin to voltages greater than VS + 0.3 V. If  
the system design is such that this condition cannot be guaranteed  
(that is, multiple supply voltages are present), a low VF clamping  
diode between ST and VS is recommended.  
Bandwidth(Hz) (μF)  
(mg)  
0.64  
1.4  
2
10  
ꢀ0  
100  
ꢀ00  
0.47  
0.1  
0.047  
0.01  
3.8  
8.6  
12  
4.ꢀ  
27.2  
Rev. 0 | Page 10 of 12  
 
 
 
ADXL±1±  
An accelerometer is most sensitive to tilt when its sensitive axis  
is perpendicular to the force of gravity, that is, parallel to the  
surface of the earth. At this orientation, its response to changes  
in tilt is highest: its output changes nearly 17.5 mg per degree of  
tilt. When the accelerometer is oriented on axis to gravity, that  
is, near its +1 g or –1 g reading, the change in output acceleration  
per degree of tilt is negligible. At 45°, its output changes by  
12.2 mg per degree.  
USING THE ADXL212 WITH OPERATING  
VOLTAGES OTHER THAN 5 V  
The ADXL212 is tested and specified at VS = 5 V; however, it  
can be powered with VS as low as 3 V or as high as 5.25 V. Some  
performance parameters change as the supply voltage varies.  
The ADXL212 sensitivity varies proportionally to supply  
voltage. At VS = 3 V, the sensitivity is typically 7.5%/g.  
The zero g bias output is ratiometric to supply voltage;  
therefore, the zero g output is nominally equal to 50% at all  
supply voltages.  
Dual Axis Tilt Sensor: Converting Acceleration to Tilt  
When the accelerometer is oriented with both its x-axis and  
y-axis parallel to the surface of the earth (reading approximately  
0 g), it can be used as a dual axis tilt sensor with a roll axis and a  
pitch axis. The output tilt in degrees is calculated as follows:  
Self test response in g is roughly proportional to the square of  
the supply voltage. Therefore, at VS = 3 V, the self test response  
is equivalent to approximately 270 mg (typical), or 6%.  
Pitch = ASIN(AX/1 g)  
The supply current decreases as the supply voltage decreases.  
Typical current consumption at VDD = 3 V is 450 μA.  
Roll = ASIN(AY/1 g)  
where AX and AY are accelerations in g, ranging from −1 g to +1 g.  
USING THE ADXL212 AS A DUAL AXIS TILT  
SENSOR  
Be sure to account for overranges. It is possible for the  
accelerometers to output a signal greater than 1 g due to  
vibration, shock, or other accelerations.  
A common application of the ADXL212 is tilt measurement. An  
accelerometer uses the force of gravity as an input vector to deter-  
mine its orientation in space.  
Rev. 0 | Page 11 of 12  
 
ADXL±1±  
OUTLINE DIMENSIONS  
0.030  
0.025  
0.020  
(PLATING OPTION 1,  
SEE DETAIL A  
FOR OPTION 2)  
0.087  
0.078  
0.069  
0.028  
0.020 DIA  
0.012  
0.203  
0.197 SQ  
0.193  
0.054  
0.050  
0.046  
0.020  
0.015  
0.010  
(R 4 PLCS)  
1
3
7
5
0.180  
0.177 SQ  
0.174  
0.106  
0.100  
0.094  
0.075 REF  
R 0.008  
(8 PLCS)  
0.008  
0.006  
0.004  
TOP VIEW  
BOTTOM VIEW  
R 0.008  
(4 PLCS)  
0.077  
0.070  
0.063  
0.019 SQ  
DETAIL A  
(OPTION 2)  
Figure 21. 8-Terminal Ceramic Leadless Chip Carrier [LCC]  
(E-8-1)  
Dimensions shown in millimeters  
ORDERING GUIDE  
Number  
Specified  
Voltage (V)  
Temperature  
Range  
Package  
Option  
Model1  
of Axes  
Package Description  
ADXL212AEZ  
ADXL212AEZ–RL  
EVAL-ADXL212Z  
2
2
–40°C to +8ꢀ°C  
–40°C to +8ꢀ°C  
8-Terminal Ceramic Leadless Chip Carrier [LCC]  
8-Terminal Ceramic Leadless Chip Carrier [LCC]  
Evaluation Board  
E-8-1  
E-8-1  
1 Z = RoHS Compliant Part.  
©2011 Analog Devices, Inc. All rights reserved. Trademarks and  
registered trademarks are the property of their respective owners.  
D09804-0-5/11(0)  
Rev. 0 | Page 12 of 12  
 
 

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