HMC-AUH312 [ADI]
HMC-AUH312;
ADI 
0.5 GHz to 80 GHz, GaAs, HEMT, MMIC,
Low Noise Wideband Amplifier
HMC-AUH312
Data Sheet
FEATURES
FUNCTIONAL BLOCK DIAGRAM
Small signal gain: >8 dB
2
80 GHz distributed amplifier
V
1
GG
Configurable with or without bias tees for VDD and VGG1 bias
Low power dissipation
HMC-AUH312
RFIN/V
1
GG
1
300 mW with bias tee at VDD = 5 V
360 mW without bias tee at VDD = 6 V
480 mW without bias tee at VDD = 8 V
Die size: 1.2 mm × 1.0 mm × 0.1 mm
RFOUT/
V
DD
3
V
V
2
DD
GG
APPLICATIONS
5
4
Fiber optic modulator drivers
Figure 1.
Fiber optic photoreceiver postamplifiers
Low noise amplifier for test and measurement equipment
Point to point and point to multipoint radios
Wideband communication and surveillance systems
Radar warning receivers
GENERAL DESCRIPTION
The HMC-AUH312 is a gallium arsenide (GaAs), monolithic
microwave integrated circuit (MMIC), HEMT, low noise,
wideband amplifier die that operates between 500 MHz and
80 GHz, providing a typical 3 dB bandwidth of 80 GHz. The
amplifier provides 10 dB of small signal gain and a maximum
output amplitude of 2.5 V p-p, which makes it ideal for use in
broadband wireless, fiber optic communications, and test
equipment applications.
The amplifier die occupies 1.2 mm × 1.0 mm, facilitating easy
integration into a multichip module (MCM). The HMC-AUH312
can be used with or without a bias tee, and requires off-chip
blocking components and bypass capacitors for the dc supply
lines. Adjustable gate voltages allow for gain adjustment.
Rev. E
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HMC-AUH312
Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Theory of Operation ...................................................................... 11
Applications Information .............................................................. 12
Applications Overview .............................................................. 12
Device Mounting........................................................................ 14
Device Operation ....................................................................... 14
Applications....................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description......................................................................... 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
0.5 GHz to 60 GHz Frequency Range........................................ 3
60 GHz to 80 GHz Frequency Range......................................... 3
Recommended Operating Conditions ...................................... 3
Absolute Maximum Ratings............................................................ 5
ESD Caution.................................................................................. 5
Pin Configuration and Function Descriptions............................. 6
Interface Schematics..................................................................... 7
Typical Performance Characteristics ............................................. 8
Mounting and Bonding Techniques for Millimeterwave GaAs
MMICs............................................................................................. 15
Handling Guidelines for ESD Protection of GaAs MMICs.. 15
Handling Precautions ................................................................ 15
Mounting Techniques................................................................ 16
Wire Bonding.............................................................................. 16
Outline Dimensions....................................................................... 17
Ordering Guide .......................................................................... 17
Added Interface Schematics Section...............................................7
Changes to Figure 3...........................................................................7
Changes to Figure 14, Figure 16, and Figure 19............................9
Changes to Figure 20...................................................................... 10
Added Theory of Operation Section and Figure 21 .................. 11
Added Applications Information Section and Applications
Overview Section............................................................................ 12
Changes to Figure 24 and Figure 25 ............................................ 13
Changes to Device Power-Up Instructions Section and Device
Power-Down Instructions Section............................................... 14
Added Handling Guidelines for ESD Protection of GaAs MMICs
Section and Opening the Protective Packaging Section ................ 15
Changes to Handling Precautions Section.................................. 15
Changes to Mounting Techniques Section ................................. 16
Updated Outline Dimensions....................................................... 17
Changes to Ordering Guide.......................................................... 17
REVISION HISTORY
11/15—v04.0615 to Rev. E
This Hittite Microwave Products data sheet has been reformatted
to meet the styles and standards of Analog Devices, Inc.
Updated Format..................................................................Universal
Changes to Title of Data Sheet............................................... Page 1
Change Vg1 to VGG1, Vg2 to VGG2, Vd to VDD, RFIN to
RFIN/VGG1, and RFOUT to RFOUT/VDD.................. Throughout
Changes to General Description Section ...................................... 1
Changes to Gain Parameter, Table 2 .............................................. 3
Changes to Power Dissipation Parameter and Operating
Temperature Parameter, Table 3..................................................... 3
Changes to Power Dissipation Parameter and Operating
Temperature Parameter, Table 4..................................................... 4
Changes to Table 5............................................................................ 5
Added Figure 2, Renumbered Sequentially .................................. 6
Changes to Table 6............................................................................ 6
Rev. E | Page 2 of 17
Data Sheet
HMC-AUH312
SPECIFICATIONS
TA = 25°C, VDD = 8 V, VGG2 = 1.8 V, IDD = 60 mA, unless otherwise noted.
0.5 GHz to 60 GHz FREQUENCY RANGE
Table 1.
Parameter
FREQUENCY RANGE
GAIN
Symbol Min Typ Max Unit Test Conditions/Comments
0.5
8
60
GHz
dB
10
RETURN LOSS
Input
Output
15
17
dB
dB
OUTPUT
Output Power for 1 dB
Compression
P1dB
13.5
dBm
Saturated Output Power
Output Third-Order Intercept
NOISE FIGURE
PSAT
IP3
16
23
5
dBm
dBm
dB
SUPPLY CURRENT
IDD
60
mA
VDD = 8 V, adjust VGG1 between −2 V and 0 V to achieve IDD
60 mA typical
=
60 GHz to 80 GHz FREQUENCY RANGE
Table 2.
Parameter
FREQUENCY RANGE
GAIN
Symbol Min Typ Max Unit Test Conditions/Comments
60
80
GHz
dB
9
RETURN LOSS
Input
Output
10
15
dB
dB
OUTPUT
Output Power for 1 dB
Compression
P1dB
13
dBm
Saturated Output Power
Output Third-Order Intercept
NOISE FIGURE
PSAT
IP3
15
22
dBm
dBm
dB
SUPPLY CURRENT
IDD
60
mA
VDD = 8 V, adjust VGG1 between −2 V and 0 V to achieve IDD
60 mA typical
=
RECOMMENDED OPERATING CONDITIONS
Table 3. Recommended Operating Conditions with Bias Tee
Parameter
Symbol
Min
Typ
Max
Unit
POSITIVE SUPPLY
Voltage
3
5
6
V
Current
60
80
mA
GATE VOLTAGE
Gate Voltage 1
Gate Voltage 2
POWER DISSIPATION
RF INPUT POWER
OPERATING TEMPERATURE
VGG1
VGG2
−1
+0.3
V
V
1.8
300
mW
dBm
°C
4
−55
+25
+85
Rev. E | Page 3 of 17
HMC-AUH312
Data Sheet
Table 4. Recommended Operating Conditions Without Bias Tee
Parameter
Symbol
Min
Typ
Max
Unit
POSITIVE SUPPLY
Voltage
Current
5
8
60
8.25
65
V
mA
GATE VOLTAGE
Gate Voltage 1
Gate Voltage 2
POWER DISSIPATION
VDD = 6 V
VGG1
VGG2
−1
1
+0.5
V
V
1.8
360
480
mW
mW
dBm
°C
VDD = 8 V
RF INPUT POWER
OPERATING TEMPERATURE
4
−55
+25
+85
Rev. E | Page 4 of 17
Data Sheet
HMC-AUH312
ABSOLUTE MAXIMUM RATINGS
Table 5.
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
Parameter
Rating
Drain Bias Voltage with Bias Tee (VDD)
Drain Bias Voltage Without Bias Tee (VDD)
Gain Bias Voltage (VGG1)
Gain Bias Voltage (VGG2)
RF Input Power
7 V dc
8.25 V dc
0.5 V
2 V
10 dBm
180°C
ESD CAUTION
Channel Temperature
Storage Temperature Range
Operating Temperature Range
−40°C to +85°C
−55°C to +85°C
Rev. E | Page 5 of 17
HMC-AUH312
Data Sheet
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
2
V
1
GG
1
RFIN/V
1
GG
HMC-AUH312
TOP VIEW
(Not to Scale)
RFOUT/V
DD
3
V
V
2
DD
5
GG
4
NOTES
1. DIE BOTTOM MUST BE CONNECTED TO RF/DC GROUND.
Figure 2. Pin Configuration
Table 6. Pin Function Descriptions
Pin No. Mnemonic Description
1
RFIN/VGG1
RF Input/Gate Bias for Alternate Circuit for the Input Stage. This is a multifunction pin where the VGG1 function is
used in the alternate circuit only for biasing (see Figure 23 and Figure 25 for the alternate applications circuit and
alternate assembly drawings, respectively). This pin is dc-coupled and requires a dc block. See Figure 3 for the
interface schematic.
2, 4
3
VGG1, VGG2
Gate Control for Amplifier. For more information about assembly and required assembly components, see Figure 24
See Figure 4 for the interface schematic.
RFOUT/VDD RF Output/DC Bias for Alternate Application Circuit for the Output Stage. This is a multifunction pin where the VDD
function is used in the alternate application circuit only for biasing (see Figure 23 and Figure 25 for the alternate
applications circuit and alternate assembly diagram, respectively). This pin is dc-coupled and requires a dc block.
See Figure 5 for the interface schematic.
5
VDD
Supply Voltage for Application Circuit. See Figure 22 and Figure 24 for the external components. See Figure 6 for
the interface schematic.
GND
Die Bottom (Ground). The die bottom must be connected to RF/dc ground. See Figure 7 for the interface schematic.
Rev. E | Page 6 of 17
Data Sheet
HMC-AUH312
INTERFACE SCHEMATICS
V
DD
RFIN/V
1
GG
Figure 6. VDD Interface
Figure 3. RFIN/VGG1 Interface
GND
V
1, V
2
GG
GG
Figure 4. VGG1 and VGG2 Interface
Figure 7. GND Interface
RFOUT/V
DD
Figure 5. RFOUT/VDD Interface
Rev. E | Page 7 of 17
HMC-AUH312
Data Sheet
TYPICAL PERFORMANCE CHARACTERISTICS
20
14
12
10
8
+85°C
+25°C
–55°C
10
0
–10
–20
6
4
–30
–40
S11
S21
S22
2
0
10
20
30
40
50
60
70
80
0
0
0
10
20
30
40
50
60
70
80
90
100
FREQUENCY (GHz)
FREQUENCY (GHz)
Figure 8. Gain and Return Loss
Figure 11. Gain vs. Frequency at Various Temperatures
0
0
–5
+85°C
+25°C
–55°C
+85°C
+25°C
–55°C
–5
–10
–15
–20
–25
–30
–10
–15
–20
–25
–30
–35
10
20
30
40
50
60
70
80
0
10
20
30
40
50
60
70
80
FREQUENCY (GHz)
FREQUENCY (GHz)
Figure 9. Input Return Loss at Various Temperatures
Figure 12. Output Return Loss at Various Temperatures
18
16
14
12
10
8
18
16
14
12
10
8
+85°C
+25°C
–55°C
+85°C
+25°C
–55°C
6
6
5
10 15 20 25 30 35 40 45 50 55 60 65 70 75
FREQUENCY (GHz)
0
5
10 15 20 25 30 35 40 45 50 55 60 65 70 75
FREQUENCY (GHz)
Figure 10. P1dB vs. Frequency at Various Temperatures
Figure 13. PSAT vs. Frequency at Various Temperatures
Rev. E | Page 8 of 17
Data Sheet
HMC-AUH312
12
10
8
27
25
23
21
19
17
15
13
11
+85°C
+25°C
–55°C
6
4
2
+85°C
+25°C
–55°C
0
0
5
10 15 20 25 30 35 40 45 50 55 60 65 70 75
FREQUENCY (GHz)
0
5
10 15 20 25 30 35 40 45 50 55 60 65 70 75
FREQUENCY (GHz)
Figure 14. Noise Figure
Figure 17. Output IP3 vs. Frequency at Various Temperatures, POUT = 0 dBm
per Tone
0
–10
–20
–30
–40
–50
–60
–70
–80
0.50
0.45
0.40
+85°C
+25°C
–55°C
2GHz
0.35
0.30
10GHz
20GHz
30GHz
40GHz
0
10
20
30
40
50
60
70
80
–10 –8
–6
–4
–2
0
2
4
6
8
10
12
FREQUENCY (GHz)
INPUT POWER (dBm)
Figure 15. Reverse Isolation vs. Frequency at Various Temperatures
Figure 18. Power Dissipation at 85°C
50
50
40
30
20
10
0
40
30
20
10
8V
7V
6V
+85°C
+25°C
–55°C
0
0
4
8
12
16
20
24
0
4
8
12
16
20
24
FREQUENCY (GHz)
FREQUENCY (GHz)
Figure 16. Second-Order Harmonic vs. vs. Frequency at Various
Temperatures, POUT = 2 dBm
Figure 19. Second-Order Harmonic vs. Frequency at Various Supplies (VDD),
OUT = 2 dBm
P
Rev. E | Page 9 of 17
HMC-AUH312
Data Sheet
50
40
30
20
0dBm
1dBm
2dBm
10
3dBm
4dBm
5dBm
0
0
4
8
12
16
20
24
FREQUENCY (GHz)
Figure 20. Second-Order Harmonic vs. Frequency at Various POUT Levels
Rev. E | Page 10 of 17
Data Sheet
HMC-AUH312
THEORY OF OPERATION
V
DD
HMC-AUH312 is a GaAs MMIC HEMT cascode distributed,
low noise, wideband amplifier. The cascode distributed
amplifier uses a fundamental cell of two field effect transistors
(FETs) in series, source to drain. This fundamental cell then
duplicates a number of times.
RFOUT
V
2
GG
RFIN
The major benefit of this architecture is an increase in the
operation bandwidth. The basic schematic for a fundamental
cell is shown in Figure 21, which shows the RFIN and RFOUT
functions of the RFIN/VGG1 and RFOUT/VDD pins.
V
1
GG
Figure 21. Fundamental Cell Schematic
To obtain the best performance from the HMC-AUH312 and
not damage the device, follow the recommended biasing
sequence outlined in the Device Operation section.
Rev. E | Page 11 of 17
HMC-AUH312
Data Sheet
APPLICATIONS INFORMATION
The HMC-AUH312 is a wideband amplifier with a positive gain
slope with increasing frequency, which helps users to compensate
for the typical higher frequency loss introduced by several
system components.
APPLICATIONS OVERVIEW
The HMC-AUH312 has single-ended input and output ports
whose impedances are nominally equal to 50 Ω over the
frequency range 0.5 GHz to 80 GHz. Consequently, it can be
directly inserted into a 50 Ω system with no impedance
matching circuitry required. This means that multiple numbers
of HMC-AUH312 amplifiers can be cascaded back to back
without the need for external matching circuitry.
There are two methods for biasing the device. The typical
biasing technique is shown by the circuit diagram in Figure 22
and the assembly diagram shown in Figure 24. This technique
uses only the RFIN and RFOUT functions of the RFIN/VGG1
and RFOUT/VDD pins.
Because the input and output impedances are sufficiently stable
vs. variations in temperature and supply voltage, no impedance
matching compensation is required.
The alternate biasing technique is represented by the circuit
shown in Figure 23 and the assembly shown in Figure 25, which
include the use of the VGG1 and VDD functions of the RFIN/VGG
and RFOUT/VDD pins.
1
It is critical to supply very low inductance ground connections
to the ground pins as well as to the die bottom. These connec-
tions ensure stable operation.
V
1
GG
0.1µF
200pF
2
1
3
RFOUT
RFIN
4
5
V
V
2
DD
GG
0.1µF
200pF
200pF
0.1µF
Figure 22. Applications Circuit
V
DD
V
1
GG
BIAS
TEE
BIAS
TEE
RFOUT
1
3
RFIN
4
5
V
2
GG
0.1µF
200pF
200pF
0.1µF
Figure 23. Suggested Alternate Applications Circuit
Rev. E | Page 12 of 17
Data Sheet
HMC-AUH312
TO V 1 POWER SUPPLY
GG
3mil NOMINAL GAP
200pF
0.1µF
3.0mil × 0.5mil RIBBON
50Ω
TRANSMISSION LINE
TO V POWER SUPPLY
DD
0.1µF
220pF
220pF
0.1µF
TO V 2 POWER SUPPLY
GG
Figure 24. Assembly Diagram
3.0mil × 0.5mil RIBBON
3mil NOMINAL GAP
V
1
GG
BIAS
TEE
V
DD
BIAS
TEE
RFIN
RFOUT
50Ω
TRANSMISSION LINE
0.1µF
220pF
220pF
0.1µF
TO V 2 POWER SUPPLY
GG
Figure 25. Suggested Alternate Assembly Diagram
Rev. E | Page 13 of 17
HMC-AUH312
Data Sheet
Device Power-Up Instructions
Use the following steps to power up the device:
1. Ground the device.
2. Bring VGG1 to −2 V to pinch off the drain current.
3. Turn on VDD to 0 V. Bring VDD to 8 V; 6 V is the minimum
recommended VDD (5 V if a bias tee is used for VD bias).
4. Turn on VGG2 to 1.8 V (no drain current).
5. Adjust VGG1 to achieve a target bias of 60 mA.
6. Apply the RF signal.
DEVICE MOUNTING
The following are best practice layout practices:
•
•
•
•
1 mil wire bonds are used on the VGG1 and VGG
connections to the capacitors.
0.5 mil × 3 mil round wire bonds are used on all other
connections.
Capacitors on VGG1 and VGG2 are used to filter the low
frequency, <800 MHz, RF noise.
For best gain flatness and group delay variation, place the
capacitors from VDD, VGG1, and VGG2 as close to the die as
possible to minimize bond wire parasitics. VDD is especially
sensitive to bond parasitics.
2
Device Power-Down Instructions
To power down the device, reverse the sequence identified in
Step 1 through Step 6 in the Device Power-Up Instructions.
•
Silver-filled conductive epoxy is used for die attachment.
(Ground the backside of the die and connect the GND
pads to the backside metal through vias.)
Bias conditions provided in the Device Power-Up Instructions
are the operating points recommended to optimize the overall
performance.
DEVICE OPERATION
Unless otherwise noted, the data shown in the Specifications
section were taken using the recommended bias conditions (see
Table 4). Operation of the HMC-AUH312 at different bias
conditions may result in performance that differs from that
shown in the Specifications section (Table 1 through Table 3)
and the Typical Performance Characteristics section (Figure 8
through Figure 20). Typically, output power levels and linearity
can be improved at the expense of power consumption.
These devices are susceptible to damage from electrostatic
discharge. Observe proper precautions during handling,
assembly, and test. In addition, dc block the input and output to
this device.
Rev. E | Page 14 of 17
Data Sheet
HMC-AUH312
MOUNTING AND BONDING TECHNIQUES FOR MILLIMETERWAVE GaAs MMICS
HANDLING GUIDELINES FOR ESD PROTECTION OF
GaAs MMICS
HANDLING PRECAUTIONS
Take the following precautions to avoid permanent damage to
the device.
All electrical components are sensitive to some degree to
electrostatic discharge (ESD), and GaAs MMICs are no
exception. Many digital semiconductions have some level of
protection circuitry designed into the input and output pins.
However, GaAs MMIC designs rarely include built-in
protection circuitry because of RF performance issues.
Specifically, protection circuits add reactive parasitics that limit
high frequency performance.
Opening the Protective Packaging
Prior to opening the protective packaging, the device must be
placed on a conductive workbench to dissipate any charge that
has built up on the outside of the package.
Storage
All bare die are placed in either waffle or gel-based ESD protec-
tive containers and sealed in an ESD protective bag for shipment.
Immediately upon opening the sealed ESD protective bag, store
all die in a dry nitrogen environment.
Circuitry on GaAS MMICs can be damaged by ESD at voltages
below 250 V. In some cases, this classifies these devices as
Class 0, meaning that stringent levels of ESD protection must be
observed.
Cleanliness
Electrostatic charges are created by the contact and separation
of two objects. The magnitude of this charge buildup varies
within different materials. Conductive and static dissipative
materials release this charge quite easily to a grounded surface.
Insulators retain the charge for a longer period of time.
Handle the chips in a clean environment. Do not attempt to
clean the chip using liquid cleaning systems.
Static Sensitivity
Follow ESD precautions to protect against ESD strikes. Handle
the device at a grounded workstation only by an operator that is
also grounded through a conductive wrist strap. Equipment
used in the manufacture, assembly, and test of GaAs MMIC
devices must also be properly grounded.
To protect static sensitive devices from an electrostatic
discharge, the devices must be completely enclosed with
protective conductive packaging. This shielding protects the
devices inside by causing any static discharge to follow the
shortest conductive path to ground. Prior to opening the
protective packaging, the device must be placed on a conductive
workbench to dissipate any charge that has built up on the
outside of the package.
Transients
Suppress instrument and bias supply transients during bias
application. To minimize inductive pickup, use shielded signal
and bias cables.
General Handling
When the device is removed from its protective package, it must
be handled only at a grounded workstation by an operator
grounded through a conductive wrist strap. Equipment used in
the manufacture, assembly, and test of GaAs MMIC devices
must also be properly grounded.
Handle the chip on the edges only using a vacuum collet or a sharp
pair of bent tweezers. Because the surface of the chip may have
fragile air bridges, do not touch the chip surface with a vacuum
collet, tweezers, or fingers.
Antistatic or dissipative tubes and pink poly bags provide no
ESD protection to the device. The antistatic or dissipative name
only implies that it does not create an ESD hazard.
The only proper protection is to completely enclose the device
in a conductive static shield; that is, a silver colored bag, black
conductive tote box, and/or conductive carrier tape.
For additional information on proper ESD handling, consult the
Electrostatic Discharge Association Advisory ESD-ADV-2.0-
1994 or MIL-STD-1686. Information contained in this section
of the data sheet was obtained from the ESD Association
Advisory (Reference) AS-9100.
Rev. E | Page 15 of 17
HMC-AUH312
Data Sheet
The chip is back-metallized and can be die mounted with AuSn
eutectic preforms or with electrically conductive epoxy. Ensure
that the mounting surface is clean and flat.
MOUNTING TECHNIQUES
Attach the die directly to the ground plane eutectically or with
conductive epoxy.
Eutectic Die Attach
Using 50 Ω microstrip transmission lines on 0.127 mm (5 mil)
thick alumina thin film substrates is recommended for bringing
the RF to and from the chip (see Figure 26). If 0.254 mm
(10 mil) thick alumina thin film substrates must be used, raise the
die 0.150 mm (6 mils) so that the surface of the die is coplanar
with the surface of the substrate. One way to accomplish this is
to attach the 0.100 mm (4 mil) thick die to a 0.150 mm (6 mil)
thick molybdenum heat spreader (moly tab), which is then
attached to the ground plane (see Figure 27).
An 80% gold/20% tin preform is recommended with a work
surface temperature of 255°C and a tool temperature of 265°C.
When hot 90% nitrogen/10% hydrogen gas is applied, make
sure that the tool tip temperature is 290°C. Do not expose the
chip to a temperature greater than 320°C for more than 20 sec.
No more than 3 sec of scrubbing is required for attachment.
Epoxy Die Attach
Apply a minimum amount of epoxy to the mounting surface so
that a thin epoxy fillet is observed around the perimeter of the
chip when it is placed into position. Cure the epoxy per the
schedule provided by the manufacturer.
To minimize bond wire length, place microstrip substrates as
close to the die as possible. Typical die to substrate spacing is
0.076 mm to 0.152 mm (3 mil to 6 mil).
WIRE BONDING
0.100mm (0.004") THICK GaAs MMIC
RF bonds made with two 1 mil wires are recommended. These
bonds must be thermosonically bonded with a force of 40 g to 60 g.
Use of dc bonds of 0.001 inch (0.025 mm) diameter, thermosoni-
cally bonded, are recommended. Create ball bonds with a force
of 40 g to 50 g and wedge bonds at 18 g to 22 g.
WIRE BOND
0.076mm
(0.003")
RF GROUND PLANE
Create all bonds with a nominal stage temperature of 150°C.
Apply a minimum amount of ultrasonic energy to achieve
reliable bonds. Keep all bonds as short as possible, less than
12 mil (0.31 mm).
0.127mm (0.005") THICK ALUMINA
THIN FILM SUBSTRATE
Figure 26. Routing RF Signals
0.100mm (0.004") THICK GaAs MMIC
WIRE BOND
0.076mm
(0.003")
RF GROUND PLANE
0.150mm
0.254mm (0.010") THICK ALUMINA
THIN FILM SUBSTRATE
(0.005”) THICK
MOLY TAB
Figure 27. Routing RF Signals Using Molly Tab
Rev. E | Page 16 of 17
Data Sheet
HMC-AUH312
OUTLINE DIMENSIONS
1.200
0.200
0.100
0.200
0.385
0.082
0.200
0.200
2
1.000
1
TOP VIEW
(CIRCUIT SIDE)
0.200
3
0.314
0.200
0.018
5
4
0.102
SIDE VIEW
0.004 × 0.004
0.102
0.366
0.230
0.200
0.200
Figure 28. 5-Pad Bare Die [CHIP]
(C-5-5)
Dimensions shown in millimeters
ORDERING GUIDE
Model
Temperature Range
−55°C to +85°C
−55°C to +85°C
Package Description
Package Option
C-5-5
C-5-5
HMC-AUH312
HMC-AUH312-SX
5-Pad Bare Die [CHIP]
5-Pad Bare Die [CHIP]
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D13476-0-11/15(E)
Rev. E | Page 17 of 17
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