PM139R000C [ADI]
Aerospace Quad Low-Power Voltage Comparator;
| 型号： | PM139R000C |
| 厂家： | 
ADI |
| 描述： | Aerospace Quad Low-Power Voltage Comparator 放大器 |
| 文件： | 总15页 (文件大小：119K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REVISIONS
LTR
A
DESCRIPTION
DATE (YR-MO-DA)
92-09-24
APPROVED
M. A. FRYE
Make change to 1.3. Add vendor CAGE numbers 01295 and 07933.
In accordance with N.O.R. 5962-R259-92.
Add class V devices and case outline X. Replace vendor CAGE number
B
97-06-09
R. MONNIN
06665 with 24355. Make change to I test and editorial changes throughout.
IB
Redrawn.
C
D
E
F
Make change to dimensions L, R, and R1 as specified in case X. - ro
97-12-17
98-06-17
98-10-29
99-02-10
R. MONNIN
R. MONNIN
R. MONNIN
R. MONNIN
Add radiation hardness assurance requirements. - ro
Add device type 02 with radiation hardness requirements. - ro
Make change to table IIB. - ro
G
Drawing updated to reflect current requirements. Delete figure 1 and make
change to 3.2.4. - ro
02-08-08
07-07-06
11-05-25
R. MONNIN
R. HEBER
C. SAFFLE
H
J
Delete Accelerated aging test, 4.4.4.1.1. - ro
Add device type 03 with radiation hardness requirements. Editorial changes
throughout. - jt
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
REV
J
J
J
J
J
J
J
J
J
J
J
J
J
SHEET
1
2
3
4
5
6
7
8
9
10
11
12
13
PREPARED BY
JOSEPH A. KERBY
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
STANDARD
MICROCIRCUIT
DRAWING
CHECKED BY
DAVID H. JOHNSON
APPROVED BY
MICHAEL A. FRYE
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE
COMPARATOR, RADIATION HARDENED,
MONOLITHIC SILICON
DRAWING APPROVAL DATE
88-04-24
REVISION LEVEL
J
SIZE
A
CAGE CODE
AMSC N/A
5962-87739
67268
SHEET
1 OF 13
DSCC FORM 2233
APR 97
5962-E315-11
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and
M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part
or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following examples.
For device classes M and Q:
5962
-
87739
01
C
A
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
For device class V:
5962
R
87739
01
V
C
A
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device types. The device types identify the circuit function as follows:
Device type
Generic number
Circuit function
01
02
03
LM139A
LM139
PM139A
Quad voltage comparator
Quad voltage comparator
Quad voltage comparator
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed
below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q
designators will not be included in the PIN and will not be marked on the device.
Device class
M
Device requirements documentation
Vendor self-certification to the requirements for MIL-STD-883 compliant, non-
JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Q or V
Certification and qualification to MIL-PRF-38535
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
2
DSCC FORM 2234
APR 97
1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
C
D
X
2
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
GDFP1-G14
14
Dual-in-line
Flat pack
Flat pack with gull wing leads
Square leadless chip carrier
14
14
20
CQCC1-N20
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
1.3 Absolute maximum ratings. 1/
Supply voltage range (V ) .............................................................................. 36 V dc or ±18 V dc
S
Input voltage range ......................................................................................... -0.3 V dc to 36 V dc
Input current (V < -0.3 V) ............................................................................. 50 mA
IN
Maximum power dissipation (P ) .................................................................... 900 mW 2/
D
Sink current ..................................................................................................... 20 mA approximately
Lead temperature (soldering 10 seconds) ...................................................... +300°C
Storage temperature range ............................................................................. -65°C to +150°C
Junction temperature (T ) ............................................................................... +150°C
J
Thermal resistance, junction-to- case (θ ):
JC
Cases C, D, and 2 ....................................................................................... See MIL-STD-1835
Case X ........................................................................................................ 23°C/W
1.4 Recommended operating conditions.
Supply voltage (V ) ......................................................................................... 5 V dc to 30 V dc
S
Ambient operating temperature range (T ) ..................................................... -55°C to +125°C
A
1.5 Radiation features.
Device types 01, 02:
Maximum total dose available (dose rate = 50 – 300 rads (Si)/s) ........................ 100 Krads(Si) 3/
Device Type 03:
Maximum total dose available (dose rate </= 10 mrad (Si)/s………………. 50 Krads(Si) 4/
______
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Derate above 100°C ambient, 10 mW/°C.
3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,
method 1019, condition A.
4/ For device type 03, radiation endpoint limits for the noted parameters are guaranteed for the condition specified in MIL-
STD-883, Test Method 1019, Condition D.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
3
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
-
Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Logic diagram. The logic diagram shall be as specified on figure 2.
3.2.4 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Conditions
-55°C ≤ T ≤ +125°C
unless otherwise specified
Test
Symbol
Group A
subgroups
Device
type
Limits
Unit
A
Min
Max
1
01, 03
mV
±2.0
±4.0
V
R = 0 Ω, V = 1.4 V,
S O
Input offset voltage
IO
2,3
+V = 5 V dc to 30 V dc
S
M,D,P,L,R 1/ 2/
M, D, P, L 1/ 2/
1
1
01
03
±3.0
1
2,3
1
02
±5.0
±9.0
±6.0
±25
R
= 0 Ω, V = 1.4 V,
O
S
+V = 5 V dc to 30 V dc
S
M,D,P,L,R 1/ 2/
1
All
nA
nA
I
+I - -I with output in
Input offset current
Input bias current
IO
IN
IN
the linear range
M,D,P,L,R 1/ 2/
M, D, P, L 1/ 2/
2,3
±100
1
01,02
03
±25
1
1
All
±100
±300
I
+I or –I with output
IN IN
IB
in the linear range
M,D,P,L,R 1/ 2/
M, D, P, L 1/ 2/
2,3
1
01,02
03
±100
1
+V
S
Input common-mode 3/
voltage range
1,2,3
All
All
0
V
V
A
+V = 5 V to 30 V
ICR
S
– 2.0
1
50
25
V/mV
R ≥ 15 kΩ, +V = 15 V
Voltage gain 3/
V
L
S
2,3
-V = 1 V, +V = 0 V,
IN IN
1
All
All
6
mA
mV
I
Output sink current 3/
Saturation voltage
SINK
V
O
≥ 1.5 V, T = +25°C
A
1
400
700
V
-V = 1 V, +V = 0 V, 3/
SAT
IN
IN
1,2,3
I
≤ 4 mA
SINK
-V = 1 V, +V = 0 V,
IN
IN
1
1
400
400
I
= 4 mA
O
M,D,P,L,R 1/ 2/
M, D, P, L 1/ 2/
01,02
03
1
All
0.5
1
µA
I
+V ≥ 1 V dc, V = 30 V,
Output leakage current
OL
IN
O
1,2,3
1
-V = 0 V
IN
M,D,P,L,R 1/ 2/
M, D, P, L 1/ 2/
01,02
03
0.5
See footnotes at end of table.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Conditions
-55°C ≤ T ≤ +125°C
unless otherwise specified
Test
Symbol
Group A
subgroups
Device
type
Limits
Unit
A
Min
Max
+V = 5 V to 30 V,
S
1,2,3
1
All
3
2
mA
I
Supply current
CC
RL = ∞
M,D,P,L,R 1/ 2/
M, D, P, L 1/ 2/
= 0 V to 28 V,
01, 02
03
V
CM
Input voltage common 3/
mode rejection ratio
CMRR
PSRR
1,2,3
1,2,3
All
All
70
70
dB
dB
R ≥ 15 kΩ, +V = 30 V
L
S
Power supply rejection
ratio
+V = 5 V to 30 V 3/ 4/
S
V
RL
= 5 V, R = 5.1 kΩ,
L
100 mV input step,
9
All
5
µs
t
Response time 3/
RLH
T = +25°C
A
5 mV overdrive,
2.5
t
RHL
T = +25°C
A
1/ Device 01 & 02 supplied to this drawing have been characterized through all levels M, D, P, L, and R of irradiation.
Device 01 & 02 is only tested at the "R" level and device type 03 is only tested at “L” Level.
Device 03 supplied to this drawing has been characterized through all levels P and L of irradiation.
Pre and Post irradiation values are identical unless otherwise specified in table I. When performing post irradiation
electrical measurements for any RHA level, T = +25°C.
A
2/ Device types 01 and 02 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate
effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-
883,method 1019, condition A for device types 01 and 02. Device type 03 has been tested at a low dose rate.
3/ This parameter is not tested to post irradiation.
4/ Guaranteed, if not tested, to the limits specified in table I herein.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
6
DSCC FORM 2234
APR 97
Device types
Case outlines
ALL
C, D, and X
Terminal symbol
2
Terminal
number
1
2
OUTPUT 2
OUTPUT 1
NC
OUTPUT 2
OUTPUT 1
3
+V
S
4
-INPUT 1
+INPUT 1
-INPUT 2
+INPUT 2
-INPUT 3
+INPUT 3
-INPUT 4
+INPUT 4
GND
+V
S
5
NC
-INPUT 1
NC
6
7
8
+INPUT 1
-INPUT 2
+INPUT 2
NC
9
10
11
12
13
14
15
16
17
18
19
20
-INPUT 3
+INPUT 3
-INPUT 4
NC
OUTPUT 4
OUTPUT 3
---
---
+INPUT 4
NC
---
---
GND
---
OUTPUT 4
OUTPUT 3
---
NC = No connection
FIGURE 1. Terminal connections.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
7
DSCC FORM 2234
APR 97
FIGURE 2. Logic diagram.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
8
DSCC FORM 2234
APR 97
FIGURE 3. Radiation exposure circuit.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
9
DSCC FORM 2234
APR 97
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime's agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 050 (see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
10
DSCC FORM 2234
APR 97
TABLE IIA. Electrical test requirements.
Test requirements
Subgroups
Subgroups
(in accordance with
(in accordance with
MIL-STD-883,
MIL-PRF-38535, table III)
method 5005, table I)
Device
Device
class Q
Device
class V
class M
1
Interim electrical
1
1
parameters (see 4.2)
Final electrical
1, 2, 3, 9 1/
1, 2, 3, 9
1, 2, 3
1, 2, 3, 9 1/
1, 2, 3, 9
1, 2, 3
1, 2, 3, 9 2/
1, 2, 3, 9
1, 2, 3, 2/
1, 2, 3
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
1, 2, 3
1, 2, 3
---
---
1
1/ PDA applies to subgroup 1.
2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits
shall be computed with reference to the previous interim electrical parameters.
TABLE IIB. 240 hours and group C operating life deltas.
Test
Symbol
Device
types
Limits
Max
2
Units
mV
Min
-2
Delta
±1.5
±2.0
±15
Input offset voltage
Input bias current
01, 03
02
V
IO
IB
-5
5
All
-100
100
nA
I
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 4, 5, 6, 7, 8, 10, 11 shall be omitted.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
11
DSCC FORM 2234
APR 97
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b. TA = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a. End-point electrical parameters shall be as specified in table IIA herein.
b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
TA = +25°C ±5°C, after exposure, to the subgroups specified in table IIA herein.
4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883
method 1019, condition A for device types 01 and 02, condition D for device type 03 and as specified herein.
4.4.4.2 Dose rate burnout. When required by the customer test shall be performed on devices, SEC, or approved test
structures at technology qualifications and after any design or process changes which may effect the RHA capability of the
process. Dose rate burnout shall be performed in accordance with test method 1023 of MIL-STD-883 and as specified herein.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-0547.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
12
DSCC FORM 2234
APR 97
6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime-VA and
have agreed to this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DLA Land and Maritime-VA.
SIZE
STANDARD
5962-87739
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
J
SHEET
COLUMBUS, OHIO 43218-3990
13
DSCC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 11-05-25
Approved sources of supply for SMD 5962-87739 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
Vendor
similar
PIN 2/
number
5962-8773901CA
01295
27014
3/
LM139AJB
LM139AJ-SMD
LM139AD/883
3/
PM-139AY/883
LM139AWB
5962-8773901DA
01295
27014
27014
01295
27014
3/
LM139AW-SMD
LM139AWG-SMD
LM139AFKB
5962-8773901XA
5962-87739012A
LM139AE-SMD
PM-139ARC/883
LM139LMB
5962-87739012A
5962-8773901VCA
5962-8773901VDA
5962-8773901V2A
5962R8773901VCA
5962R8773901VDA
5962R8773901V2A
0C7V7
24355
24355
24355
24355
24355
24355
PM139AY/QMLV
PM139AM/QMLV
PM139ARC/QMLV
PM139AY/QMLR
PM139AM/QMLR
PM139ARC/QMLR
1 of 2
STANDARD MICROCIRCUIT DRAWING BULLETIN - CONTINUED
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
Vendor
similar
PIN 2/
number
5962R8773902VCA
5962R8773902VDA
5962R8773902V2A
5962L8773903VDA
24355
24355
24355
24355
PM139Y/QMLR
PM139M/QMLR
PM139RC/QMLR
PM139AM/QMLL
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
Vendor CAGE
number
Vendor name
and address
01295
24355
Texas Instruments, Incorporated
Semiconductor Group
8505 Forest Lane
P.O. Box 660199
Dallas, TX 75243
Point of contact: U.S. Highway 75 South
P.O. Box 84, M/S 853
Sherman, TX 75090-9493
Analog Devices, Incorporated
Route 1 Industrial Park
PO Box 9106
Norwood, MA 02062
Point of contact: 7910 Triad Center Drive
Greensboro, NC 27409-9605
27014
0C7V7
National Semiconductor Corporation
2900 Semiconductor Drive
P.O. Box 58090
Santa Clara, CA 95052-8090
E2V Aerospace and Defense, Inc.
dba QP Semiconductor, Inc.
2945 Oakmead Village Court
Santa Clara, CA 95051
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
2 of 2
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