ADG608BRUZ-REEL7 [ADI]

LC2MOS ± 5V 8-Channel High Performance Analog Multiplexer;
ADG608BRUZ-REEL7
型号: ADG608BRUZ-REEL7
厂家: ADI    ADI
描述:

LC2MOS ± 5V 8-Channel High Performance Analog Multiplexer

信息通信管理 光电二极管
文件: 总12页 (文件大小:182K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
3 V/5 V, 4/8 Channel High  
Performance Analog Multiplexers  
a
ADG608/ADG609  
FUNCTIO NAL BLO CK D IAGRAMS  
FEATURES  
+3 V, +5 V, ؎5 V Pow er Supplies  
VSS to VDD Analog Signal Range  
Low On Resistance (30 m ax)  
Fast Sw itching Tim es  
tON 75 ns m ax  
tOFF 45 ns m ax  
Low Pow er Dissipation (1.5 W m ax)  
Break-Before-Make Construction  
ESD > 5000 V as per Military Standard 3015.7  
TTL and CMOS Com patible Inputs  
ADG608  
ADG609  
S1  
S1A  
S4A  
DA  
DB  
D
S1B  
S4B  
S8  
1 OF 4  
DECODER  
1 OF 8  
DECODER  
APPLICATIONS  
Autom atic Test Equipm ent  
Data Acquisition System s  
A0 A1 A2 EN  
A0  
A1  
EN  
Com m unication System s  
Avionics and Military System s  
Microprocessor Controlled Analog System s  
Medical Instrum entation  
Battery Pow ered Instrum ents  
Rem ote Pow ered Equipm ent  
Com patible w ith ؎5 V DACs and ADCs such as  
AD7840/ 8, AD7870/ 1/ 2/ 4/ 5/ 6/ 8  
T he ability to operate from single +3 V, +5 V or ±5 V bipolar  
supplies makes the ADG608 and ADG609 perfect for use in  
battery operated instruments and with the new generation of  
DACs and ADCs from Analog Devices. T he use of 5 V sup-  
plies and reduced operating currents gives much lower power  
dissipation than devices operating from ±15 V supplies.  
GENERAL D ESCRIP TIO N  
T he ADG608 and ADG609 are monolithic CMOS analog mul-  
tiplexers comprising eight single channels and four differential  
channels respectively, fully specified for ±5 V, +5 V and +3 V  
power supplies. T he ADG608 switches one of eight inputs to a  
common output as determined by the 3-bit binary address lines  
A0, A1 and A2. T he ADG609 switches one of four differential  
inputs to a common differential output as determined by the  
2-bit binary address lines A0 and A1. An EN input on both de-  
vices is used to enable or disable the device. When disabled, all  
channels are switched OFF. All the address and enable inputs  
are T T L compatible over the full specified operating tempera-  
ture range, making the parts suitable for bus-controlled systems  
such as data acquisition systems, process controls, avionics and  
ATEs since the TTL compatible address inputs simplify the digital  
interface design and reduce the board space requirements.  
P RO D UCT H IGH LIGH TS  
1. Extended Signal Range  
T he ADG608/ADG609 are fabricated on an enhanced  
LC2MOS process giving an increased signal range which  
extends to the supplies.  
2. Low Power Dissipation  
3. Low RON  
4. Fast Switching T imes  
5. Break-Before-Make Switching  
Switches are guaranteed break-before-make so that input  
signals are protected against momentary shorting.  
6. Single/Dual Supply Operation  
T he ADG608/ADG609 are designed on an enhanced LC2MOS  
process that provides low power dissipation yet gives high  
switching speed and low on resistance. Each channel conducts  
equally well in both directions when ON and has an input signal  
range which extends to the supplies. In the OFF condition, sig-  
nal levels up to the supplies are blocked. All channels exhibit  
break-before-make switching action preventing momentary  
shorting when switching channels. Inherent in the design is low  
charge injection for minimum transients when switching the  
digital inputs.  
O RD ERING GUID E  
Model  
Tem perature Range P ackage O ption*  
ADG608BN  
ADG608BR  
ADG608BRU  
ADG608T RU  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–55°C to +125°C  
N-16  
R-16A  
RU-16  
RU-16  
ADG609BN  
ADG609BR  
ADG609BRU  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
N-16  
R-16A  
RU-16  
*N = Plastic DIP; RU = T hin Shrink Small Outline Package (T SSOP);  
R = 0.15" Small Outline IC (SOIC).  
REV. A  
Inform ation furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assum ed by Analog Devices for its  
use, nor for any infringem ents of patents or other rights of third parties  
which m ay result from its use. No license is granted by im plication or  
otherwise under any patent or patent rights of Analog Devices.  
© Analog Devices, Inc., 1995  
One Technology Way, P.O. Box 9106, Norw ood, MA 02062-9106, U.S.A.  
Tel: 617/ 329-4700 Fax: 617/ 326-8703  
ADG608/ADG609–SPECIFICATIONS  
1
(V = +5 V ؎ 10%, V = –5 V ؎ 10%, GND = 0 V, unless otherwise noted)  
DUAL SUPPLY  
P aram eter  
DD  
SS  
B Version  
T Version  
+25؇C –55؇C to  
+125؇C  
+25؇C  
–40°C to  
Test Conditions/  
Com m ents  
+85؇C  
Units  
ANALOG SWIT CH  
Analog Signal Range  
RON  
VSS to VDD  
VSS to VDD  
V
22  
30  
22  
30  
typ  
max  
–3.5 V < VS < +3.5 V, IS = –1 mA;  
VDD = +4.5 V, VSS = –4.5 V;  
T est Circuit 1  
–3 V < VS < +3 V, IDS = –1 mA;  
VDD = +5 V, VSS = –5 V  
VS = 0 V, IDS = –1 mA;  
35  
6
40  
6
RON  
5
2
5
max  
max  
RON Match  
3
2
3
VDD = +5 V, VSS = –5 V  
LEAKAGE CURRENT S  
Source OFF Leakage IS (OFF)  
VDD = +5.5 V, VSS = –5.5 V  
VD = ±4.5 V, VS = ϯ4.5 V;  
T est Circuit 2  
VD = ±4.5 V, VS = ϯ4.5 V;  
T est Circuit 3  
±0.05  
±0.5  
±0.05  
±0.5  
±0.5  
±0.05  
±0.5  
±0.05  
±0.5  
±0.05  
±0.5  
±0.5  
±0.05  
±0.5  
nA typ  
nA max  
nA typ  
nA max  
nA max  
nA typ  
nA max  
nA max  
±2  
±10  
Drain OFF Leakage ID (OFF)  
ADG608  
ADG609  
Channel ON Leakage ID, IS (ON)  
ADG608  
ADG609  
±2  
±1  
±10  
±5  
VS = VD = ±4.5 V;  
T est Circuit 4  
±3  
±1.5  
±20  
±10  
±0.5  
±0.5  
DIGIT AL INPUT S  
Input High Voltage, VINH  
Input Low Voltage, VINL  
Input Current  
2.4  
0.8  
2.4  
0.8  
V min  
V max  
IINL or IINH  
±1  
±1  
µA max  
VIN = 0 or VDD  
CIN, Digital Input Capacitance  
5
5
pF typ  
DYNAMIC CHARACT ERIST ICS2  
tT RANSIT ION  
50  
75  
50  
75  
ns typ  
ns max  
RL = 300 , CL = 35 pF;  
VS1 = ±3.5 V, VS8 = ϯ3.5 V;  
T est Circuit 5  
90  
100  
tOPEN  
10  
10  
ns min  
RL = 300 , CL = 35 pF;  
VS = +3.5 V; T est Circuit 6  
RL = 300 , CL = 35 pF;  
VS = +3.5 V; T est Circuit 7  
RL = 300 , CL = 35 pF;  
VS = +3.5 V; T est Circuit 7  
VS = 0 V, RS = 0 , CL = 1 nF;  
T est Circuit 8  
RL = 1 k, CL = 15 pF, f = 100 kHz;  
VS = 3 V rms; T est Circuit 9  
RL = 1 k, CL = 15 pF, f = 100 kHz;  
T est Circuit 10  
tON (EN)  
50  
75  
30  
45  
6
50  
75  
30  
45  
6
ns typ  
ns max  
ns typ  
ns max  
pC typ  
90  
60  
100  
75  
tOFF (EN)  
Charge Injection  
OFF Isolation  
Channel-to-Channel Crosstalk  
85  
85  
9
85  
85  
9
dB typ  
dB typ  
pF typ  
CS (OFF)  
CD (OFF)  
ADG608  
ADG609  
CD (ON)  
ADG608  
ADG609  
40  
20  
40  
20  
pF typ  
pF typ  
54  
34  
54  
34  
pF typ  
pF typ  
POWER REQUIREMENT S  
IDD  
0.05  
0.2  
0.01  
0.2  
2
0.1  
0.05  
0.2  
0.01  
0.2  
2
0.1  
µA typ  
µA max  
µA typ  
VIN = 0 V or VDD  
ISS  
0.1  
1
0.1  
1
µA max  
NOT ES  
1T emperature ranges are as follows: B Version: –40°C to +85°C; T Version: –55°C to +125°C.  
2Guaranteed by design, not subject to production test.  
Specifications subject to change without notice.  
–2–  
REV. A  
ADG608/ADG609  
1
(V = +5 V  
؎ 10%, V = 0 V, GND = 0 V, unless otherwise noted)  
SINGLE SUPPLY  
P aram eter  
DD  
SS  
B Version  
T Version  
+25؇C –55؇C to  
+125؇C  
+25؇C  
–40؇C to  
Test Conditions/  
+85؇C  
Units  
Com m ents  
ANALOG SWIT CH  
Analog Signal Range  
RON  
0 to VDD  
0 to VDD  
V
40  
50  
40  
50  
typ  
max  
VS = +3.5 V, IS = –1 mA;  
VDD = +4.5 V;  
T est Circuit 1  
+1 V < VS < +3 V, IDS = –1 mA;  
VDD = +5 V  
VS = 0 V, IDS = –1 mA;  
VDD = +5 V  
60  
6
70  
6
RON  
5
2
5
max  
max  
RON Match  
3
2
3
LEAKAGE CURRENT S  
VDD = +5.5 V  
Source OFF Leakage IS (OFF)  
±0.05  
±0.5  
±0.05  
±0.5  
±0.5  
±0.05  
±0.5  
±0.05  
±0.5  
±0.05  
±0.5  
±0.5  
±0.05  
±0.5  
nA typ  
nA max  
nA typ  
nA max  
nA max  
nA typ  
nA max  
nA max  
VD = 4.5 V/0.1 V, VS = 0.1 V/4.5 V;  
T est Circuit 2  
VD = 4.5 V/0.1 V, VS = 0.1 V/4.5 V;  
T est Circuit 3  
±2  
±10  
Drain OFF Leakage ID (OFF)  
ADG608  
ADG609  
Channel ON Leakage ID, IS (ON)  
ADG608  
ADG609  
±2  
±1  
±10  
±5  
VS = VD = 4.5 V/0.1 V;  
T est Circuit 4  
±3  
±1.5  
±20  
±10  
±0.5  
±0.5  
DIGIT AL INPUT S  
Input High Voltage, VINH  
Input Low Voltage, VINL  
Input Current  
2.4  
0.8  
2.4  
0.8  
V min  
V max  
IINL or IINH  
±1  
±1  
µA max  
VIN = 0 or VDD  
CIN, Digital Input Capacitance  
5
5
pF typ  
DYNAMIC CHARACT ERIST ICS2  
tT RANSIT ION  
80  
100  
80  
100  
ns typ  
ns max  
RL = 300 , CL = 35 pF;  
VS1 = 3.5 V/0 V, VS8 = 0 V/3.5 V;  
T est Circuit 5  
130  
150  
tOPEN  
10  
10  
ns min  
RL = 300 , CL = 35 pF;  
VS = +3.5 V; T est Circuit 6  
RL = 300 , CL = 35 pF;  
VS = +3.5 V; T est Circuit 7  
RL = 300 , CL = 35 pF;  
VS = +3.5 V; T est Circuit 7  
VS = 0 V, RS = 0 , CL = 1 nF;  
T est Circuit 8  
RL = 1 k, CL = 15 pF, f = 100 kHz;  
VS = 1.5 V rms; T est Circuit 9  
RL = 1 k, CL = 15 pF, f = 100 kHz;  
T est Circuit 10  
tON (EN)  
80  
100  
40  
50  
0.5  
3
80  
100  
40  
50  
0.5  
3
ns typ  
ns max  
ns typ  
ns max  
pC typ  
pC max  
dB typ  
130  
60  
150  
75  
tOFF (EN)  
Charge Injection  
OFF Isolation  
Channel-to-Channel Crosstalk  
85  
85  
85  
9
85  
9
dB typ  
pF typ  
CS (OFF)  
CD (OFF)  
ADG608  
ADG609  
CD (ON)  
ADG608  
ADG609  
40  
20  
40  
20  
pF typ  
pF typ  
54  
34  
54  
34  
pF typ  
pF typ  
POWER REQUIREMENT S  
IDD  
0.05  
0.2  
0.2  
2
0.05  
0.2  
0.2  
2
µA typ  
µA max  
VIN = 0 V or VDD  
NOT ES  
1T emperature ranges are as follows: B Version: –40°C to +85°C; T Version: –55°C to +125°C.  
2Guaranteed by design, not subject to production test.  
Specifications subject to change without notice.  
REV. A  
–3–  
ADG608/ADG609–SPECIFICATIONS  
1
(V = +3.3 V ؎ 10%, V = 0 V, GND = 0 V, unless otherwise noted)  
DD  
SS  
SINGLE SUPPLY  
P aram eter  
B Version  
T Version  
+25؇C –55؇C to  
+125؇C  
+25؇C  
–40؇C to  
+85؇C  
Test Conditions/  
Com m ents  
Units  
ANALOG SWIT CH  
Analog Signal Range  
RON  
0 to VDD  
0 to VDD  
V
60  
90  
3
60  
90  
3
typ  
max  
max  
VS = +1.5 V, IS = –1 mA;  
VDD = +3 V; T est Circuit 1  
VS = 0 V, IDS = –1 mA, VDD = +3.3 V  
100  
3
120  
3
RON Match  
LEAKAGE CURRENT S  
VDD = +3.6 V  
Source OFF Leakage IS (OFF)  
±0.05  
±0.5  
±0.05  
±0.5  
±0.5  
±0.05  
±0.5  
±0.05  
±0.5  
±0.05  
±0.5  
±0.5  
±0.05  
±0.5  
nA typ  
nA max  
nA typ  
nA max  
nA max  
nA typ  
nA max  
nA max  
VD = 2.6 V/0.1 V, VS = 0.1 V/2.6 V;  
T est Circuit 2  
VD = 2.6 V/0.1 V, VS = 0.1 V/2.6 V;  
T est Circuit 3  
±2  
±10  
Drain OFF Leakage ID (OFF)  
ADG608  
ADG609  
Channel ON Leakage ID, IS (ON)  
ADG608  
ADG609  
±2  
±1  
±10  
±5  
VS = VD = 2.6 V/0.1 V;  
T est Circuit 4  
±3  
±1.5  
±20  
±10  
±0.5  
±0.5  
DIGIT AL INPUT S  
Input High Voltage, VINH  
Input Low Voltage, VINL  
Input Current  
2.4  
0.8  
2.4  
0.8  
V min  
V max  
IINL or IINH  
±1  
±1  
µA max  
VIN = 0 or VDD  
CIN, Digital Input Capacitance  
5
5
pF typ  
DYNAMIC CHARACT ERIST ICS2  
tT RANSIT ION  
120  
170  
120  
170  
ns typ  
ns max  
RL = 300 , CL = 35 pF;  
VS1 = 1.5 V/0 V, VS8 = 0 V/1.5 V;  
T est Circuit 5  
225  
250  
tOPEN  
10  
10  
ns min  
RL = 300 , CL = 35 pF;  
VS = +1.5 V; T est Circuit 6  
RL = 300 , CL = 35 pF;  
VS = +1.5 V; T est Circuit 7  
RL = 300 , CL = 35 pF;  
VS = +1.5 V; T est Circuit 7  
VS = 0 V, RS = 0 , CL = 1 nF;  
T est Circuit 8  
RL = 1 k, CL = 15 pF, f = 100 kHz;  
VS = 1 V rms; T est Circuit 9  
RL = 1 k, CL = 15 pF, f = 100 kHz;  
T est Circuit 10  
tON (EN)  
120  
170  
40  
60  
0.5  
3
120  
170  
40  
60  
0.5  
3
ns typ  
ns max  
ns typ  
ns max  
pC typ  
pC max  
dB typ  
225  
75  
250  
90  
tOFF (EN)  
Charge Injection  
OFF Isolation  
Channel-to-Channel Crosstalk  
85  
85  
85  
9
85  
9
dB typ  
pF typ  
CS (OFF)  
CD (OFF)  
ADG608  
ADG609  
CD (ON)  
ADG608  
ADG609  
40  
20  
40  
20  
pF typ  
pF typ  
54  
34  
54  
34  
pF typ  
pF typ  
POWER REQUIREMENT S  
IDD  
0.05  
0.2  
0.2  
2
0.05  
0.2  
0.2  
2
µA typ  
µA max  
VIN = 0 V or VDD  
NOT ES  
1T emperature ranges are as follows: B Version: –40°C to +85°C; T Version: –55°C to +125°C.  
2Guaranteed by design, not subject to production test.  
Specifications subject to change without notice.  
–4–  
REV. A  
ADG608/ADG609  
ABSO LUTE MAXIMUM RATINGS 1  
SOIC Package  
θJA, T hermal Impedance . . . . . . . . . . . . . . . . . . . . . . 77°C/W  
Lead T emperature, Soldering  
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C  
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C  
T SSOP Package  
θJA, T hermal Impedance . . . . . . . . . . . . . . . . . . . . . 158°C/W  
Lead T emperature, Soldering  
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C  
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C  
(T A = +25°C unless otherwise noted)  
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V  
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +6.5 V  
VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6.5 V  
Analog, Digital Inputs2 . . . . . . . . . . . . . . –0.3 V to VDD + 2 V  
or 20 mA, Whichever Occurs First  
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . 20 mA  
Peak Current, S or D  
(Pulsed at 1 ms, 10% Duty Cycle Max) . . . . . . . . . . 40 mA  
Operating T emperature Range  
Industrial (B Version) . . . . . . . . . . . . . . . . –40°C to +85°C  
Extended (T Version) . . . . . . . . . . . . . . . –55°C to +125°C  
Storage T emperature Range . . . . . . . . . . . . –65°C to +150°C  
Junction T emperature . . . . . . . . . . . . . . . . . . . . . . . . +150°C  
Plastic DIP Package  
ESD Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >5000 V  
NOT ES  
1Stresses above those listed under “Absolute Maximum Ratings” may cause  
permanent damage to the device. T his is a stress rating only and functional  
operation of the device at these or any other conditions above those listed in the  
operational sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect device reliability.  
Only one absolute maximum rating may be applied at any one time.  
2Overvoltages at A, S, D or EN will be clamped by internal diodes. Current should  
be limited to the maximum ratings given.  
θ
JA, T hermal Impedance . . . . . . . . . . . . . . . . . . . . 117°C/W  
Lead T emperature, Soldering (10 sec) . . . . . . . . . . +260°C  
Table I. AD G608 Truth Table  
Table II. AD G609 Truth Table  
A2  
A1  
A0  
EN  
ON SWITCH  
A1  
A0  
EN  
O N SWITCH P AIR  
X
0
0
0
0
1
1
1
1
X
0
0
1
1
0
0
1
1
X
0
1
0
1
0
1
0
1
0
1
1
1
1
1
1
1
1
NONE  
X
0
0
1
1
X
0
1
0
1
0
1
1
1
1
NONE  
1
2
3
4
5
6
7
8
1
2
3
4
X = Dont Care  
X = Dont Care  
P IN CO NFIGURATIO NS  
D IP /SO IC/TSSO P  
D IP /SO IC/TSSO P  
1
2
16  
15  
14  
A1  
A0  
EN  
1
2
16  
15  
14  
13  
12  
11  
A1  
A0  
EN  
GND  
A2  
V
V
3
4
5
6
7
8
DD  
SS  
GND  
V
3
4
5
6
7
8
SS  
ADG609  
TOP VIEW  
(Not to Scale)  
S1A  
13 S1B  
ADG608  
TOP VIEW  
(Not to Scale)  
S1  
S2  
S3  
V
DD  
12  
11  
S2B  
S3B  
S2A  
S3A  
S4A  
DA  
S5  
S6  
10 S4B  
DB  
10 S7  
S8  
S4  
D
9
9
REV. A  
–5–  
ADG608/ADG609–Typical Performance Characteristics  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
o
o
T = +25 C  
A
T
= +25 C  
A
V
V
= +3V  
= 0V  
DD  
V
= +3V  
= –3V  
SS  
DD  
V
SS  
V
= +5V  
= –5V  
DD  
V
= +5V  
= 0V  
DD  
V
SS  
V
SS  
0
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0 4.5  
5.0  
–5.0 –4.0 –3.0 –2.0 –1.0 0.0  
1.0  
2.0  
3.0  
4.0  
5.0  
V
D
(V ) – Volts  
V
(V ) – Volts  
S
D
S
Figure 4. RON as a Function of VD (VS): Single Supply Voltage  
Figure 1. RON as a Function of VD (VS): Dual Supply Voltage  
100  
50  
V
V
= +5V  
= 0V  
V
= +5V  
= –5V  
DD  
DD  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
45  
40  
35  
30  
25  
20  
15  
10  
5
V
SS  
SS  
o
+125 C  
o
+125 C  
o
+85 C  
o
+85 C  
o
+25 C  
o
+25 C  
0
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
4.5  
5.0  
–5.0 –4.0 –3.0 –2.0 –1.0 0.0  
1.0  
2.0  
3.0 4.0  
5.0  
V
D
(V ) – Volts  
V
(V ) – Volts  
S
D
S
Figure 2. RON as a Function of VD (VS) for Different  
Tem peratures  
Figure 5. RON as a Function of VD (VS) for Different  
Tem peratures  
100  
0.03  
o
+125 C  
V
V
= +5V  
V
V
= +3V  
= 0V  
DD  
DD  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
= –5V  
o
o
SS  
SS  
+85 C  
0.02  
0.01  
T
= +25 C  
A
I
(OFF)  
o
D
+25 C  
I
(OFF)  
S
0.00  
I
(ON)  
D
–0.01  
–0.02  
–0.03  
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
–5  
–4  
–3  
–2  
–1  
V
0
1
2
3
4
5
V
(V ) – Volts  
S
, V – Volts  
D
S
D
Figure 3. RON as a Function of VD (VS) for Different  
Tem peratures  
Figure 6. Leakage Currents as a Function of VD (VS)  
–6–  
REV. A  
ADG608/ADG609  
0.02  
0.01  
0.02  
0.01  
V
V
= +5V  
V
V
= +3V  
DD  
DD  
I
(OFF)  
D
= 0V  
o
= 0V  
o
SS  
SS  
T
= +25 C  
I
(OFF)  
(ON)  
T
= +25 C  
A
D
A
I
(ON)  
D
I
D
I
(OFF)  
I
(OFF)  
S
S
0.00  
0.00  
–0.01  
–0.01  
0
1
2
3
4
5
0
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
V
,V – Volts  
D
V
, V – Volts  
S
S D  
Figure 10. Leakage Currents as a Function of VD (VS)  
Figure 7. Leakage Currents as a Function of VD (VS)  
4
4
10  
10  
V
V
= +5V  
= –5V  
V
V
= +5V  
= –5V  
DD  
DD  
SS  
SS  
3
2
1
0
10  
10  
10  
10  
3
2
1
0
10  
10  
10  
10  
EN = 2.4V  
EN = 2.4V  
EN = 0V  
EN = 0V  
–1  
10  
10  
–2  
–1  
10  
10  
100  
1k  
10k  
100k  
1M  
10M  
10  
100  
1k  
10k  
100k  
1M  
10M  
FREQUENCY – Hz  
FREQUENCY – Hz  
Figure 8. Positive Supply Current vs. Switching Frequency  
Figure 11. Negative Supply Current vs. Switching Frequency  
120  
30  
C
= 1nF  
L
V
V
= +5V  
= –5V  
DD  
110  
100  
90  
SS  
20  
10  
V
V
= +5V  
= 0V  
DD  
SS  
80  
V
V
= +5V  
= –5V  
DD  
SS  
70  
0
V
V
= +3V  
= 0V  
DD  
SS  
60  
–10  
–5  
50  
100  
1k  
10k  
100k  
1M  
–4  
–3  
–2  
–1  
0
1
2
3
4
5
FREQUENCY – Hz  
SOURCE VOLTAGE – V  
Figure 9. Charge Injection vs. Analog Voltage VS  
Figure 12. Crosstalk and Off Isolation vs. Frequency  
REV. A  
–7–  
ADG608/ADG609  
Test Circuits  
I
DS  
V1  
V
DD  
V
SS  
V
V
DD  
SS  
S1  
S2  
S8  
I
(OFF)  
A
D
D
D
S
V
D
+0.8V  
V
S
EN  
GND  
V
S
R
ON  
= V /I  
1 DS  
Test Circuit 1. On Resistance  
Test Circuit 3. ID (OFF)  
V
V
V
DD  
SS  
V
V
V
DD  
SS  
V
SS  
DD  
V
SS  
DD  
I
(OFF)  
A
S
I
(ON)  
A
D
S1  
S2  
S8  
D
S1  
S8  
D
V
S
V
D
+2.4V  
+0.8V  
EN  
V
S
EN  
GND  
GND  
V
D
Test Circuit 2. IS (OFF)  
Test Circuit 4. ID (ON)  
V
V
V
V
SS  
DD  
3V  
ADDRESS  
DRIVE (V  
SS  
DD  
50%  
50%  
)
IN  
A2  
V
S1  
S1  
S2 THRU S7  
A1  
A0  
V
IN  
50Ω  
0V  
ADG608*  
V
S8  
S8  
D
90%  
V
OUT  
+2.4V  
EN  
C
35pF  
R
L
300Ω  
L
V
OUT  
GND  
90%  
tTRANSITION  
tTRANSITION  
* SIMILAR CONNECTION FOR ADG609  
Test Circuit 5. Switching Tim e of Multiplexer, tTRANSITION  
–8–  
REV. A  
ADG608/ADG609  
V
V
V
V
SS  
DD  
3V  
ADDRESS  
DRIVE (V  
SS  
DD  
)
IN  
A2  
V
S
S1  
S2 THRU S7  
A1  
A0  
V
IN  
50Ω  
0V  
ADG608  
*
S8  
D
V
OUT  
+2.4V  
EN  
80%  
80%  
C
35pF  
V
OUT  
R
300Ω  
L
L
GND  
tOPEN  
* SIMILAR CONNECTION FOR ADG609  
Test Circuit 6. Break-Before-Make Delay, tOPEN  
V
V
V
V
SS  
DD  
3V  
ENABLE  
SS  
DD  
50%  
50%  
DRIVE (V  
)
IN  
A2  
S1  
S2 THRU S8  
V
S
A1  
A0  
0V  
tOFF (EN)  
ADG608  
*
V
0
0.9V  
0.9V  
0
0
D
EN  
V
OUT  
C
35pF  
R
300Ω  
L
OUTPUT  
0V  
L
50Ω  
V
IN  
GND  
tON (EN)  
* SIMILAR CONNECTION FOR ADG609  
Test Circuit 7. Enable Delay, tON (EN), tOFF (EN)  
V
V
V
V
SS  
DD  
3V  
SS  
DD  
LOGIC  
A2  
INPUT (V  
)
IN  
A1  
A0  
S
ADG608*  
GND  
0V  
R
S
D
V
OUT  
EN  
C
1nF  
L
V
S
V
OUT  
V  
OUT  
V
IN  
Q
= C x V  
L OUT  
INJ  
* SIMILAR CONNECTION FOR ADG609  
Test Circuit 8. Charge Injection  
REV. A  
–9–  
ADG608/ADG609  
V
V
V
V
DD  
DD  
DD  
A2  
A1  
A0  
DD  
S1  
S8  
A2  
A1  
A0  
EN  
D
2.4V  
ADG608  
V
S
1kΩ  
S1  
ADG608  
V
L
1kΩ  
OUT  
R
S2  
S8  
V
D
OUT  
EN  
GND  
R
1kΩ  
L
V
SS  
GND  
V
SS  
V
S
V
SS  
V
SS  
Test Circuit 9. OFF Isolation  
Test Circuit 10. Channel-to-Channel Crosstalk  
TERMINO LO GY  
VDD  
t
OFF (EN)  
Delay time between the 50% and 90% points  
of the digital input and switch “OFF”  
condition.  
Most positive power supply potential.  
VSS  
Most negative power supply potential in dual  
supplies. In single supply applications, it may  
be connected to ground.  
tT RANSIT ION  
Delay time between the 50% and 90% points  
of the digital inputs and the switch “ON”  
condition when switching from one address  
state to another.  
GND  
RON  
Ground (0 V) reference.  
Ohmic resistance between D and S.  
tOPEN  
“OFF” time measured between the 80%  
points of both switches when switching from  
one address state to another.  
RON  
RON variation due to a change in the analog  
input voltage with a constant load current.  
RON Match  
Difference between the RON of any two  
channels.  
VINL  
VINH  
Maximum input voltage for logic “0.”  
Minimum input voltage for logic “1.”  
Input current of the digital input.  
IS (OFF)  
Source leakage current when the switch is off.  
Drain leakage current when the switch is off.  
IINL (IINH  
Crosstalk  
)
ID (OFF)  
ID, IS (ON)  
A measure of unwanted signal which is  
coupled through from one channel to another  
as a result of parasitic capacitance.  
Channel leakage current when the switch is  
on.  
VD, VS  
Analog voltage on terminals D, S.  
Off Isolation  
A measure of unwanted signal coupling  
through an “OFF” channel.  
CS (OFF)  
Channel input capacitance for “OFF”  
condition.  
Charge Injection A measure of the glitch impulse transferred  
from the digital input to the analog output  
during switching.  
C
D (OFF)  
Channel output capacitance for “OFF”  
condition.  
IDD  
ISS  
Positive supply current.  
Negative supply current.  
CD, CS (ON)  
CIN  
“ON” switch capacitance.  
Digital input capacitance.  
tON (EN)  
Delay time between the 50% and 90% points  
of the digital input and switch “ON”  
condition.  
–10–  
REV. A  
ADG608/ADG609  
O UTLINE D IMENSIO NS  
D imensions shown in inches and (mm).  
16-P in P lastic (N-16)  
16  
1
9
0.280 (7.11)  
0.240 (6.10)  
PIN 1  
8
0.325 (8.25)  
0.300 (7.62)  
0.840 (21.33)  
0.745 (18.93)  
0.060 (1.52)  
0.015 (0.38)  
0.195 (4.95)  
0.115 (2.93)  
0.210  
(5.33)  
0.150  
(3.81)  
0.200 (5.05)  
0.125 (3.18)  
0.015 (0.381)  
0.008 (0.204)  
SEATING  
PLANE  
0.022 (0.558)  
0.014 (0.356)  
0.070 (1.77)  
0.045 (1.15)  
0.100  
(2.54)  
BSC  
16-P in SO IC (R-16A)  
0.3937 (10.00)  
0.3859 (9.80)  
16  
1
9
8
0.1574 (4.00)  
0.1497 (3.80)  
0.2440 (6.20)  
0.2284 (5.80)  
PIN 1  
0.0688 (1.75)  
0.0532 (1.35)  
0.0196 (0.50)  
0.0099 (0.25)  
x 45°  
0.0098 (0.25)  
0.0040 (0.10)  
8°  
0°  
0.0192 (0.49)  
0.0138 (0.35)  
0.0500  
(1.27)  
BSC  
SEATING  
PLANE  
0.0500 (1.27)  
0.0160 (0.41)  
0.0099 (0.25)  
0.0075 (0.19)  
16-P in TSSO P (RU-16)  
0.201 (5.10)  
0.193 (4.90)  
16  
9
1
8
PIN 1  
0.006 (0.15)  
0.002 (0.05)  
0.0433  
(1.10)  
MAX  
0.028 (0.70)  
0.020 (0.50)  
8°  
0°  
0.0118 (0.30)  
0.0075 (0.19)  
0.0256  
(0.65)  
BSC  
SEATING  
PLANE  
0.0079 (0.20)  
0.0035 (0.090)  
REV. A  
–11–  
–12–  

相关型号:

ADG608BRZ

3 V/5 V, 4/8 Channel High Performance Analog Multiplexers
ADI

ADG608BRZ

8-CHANNEL, SGL ENDED MULTIPLEXER, PDSO16, 0.150 INCH, SOIC-16
ROCHESTER

ADG608BRZ-REEL

3 V/5 V, 4/8 Channel High Performance Analog Multiplexers
ADI

ADG608BRZ-REEL

8-CHANNEL, SGL ENDED MULTIPLEXER, PDSO16, SOIC-16
ROCHESTER

ADG608TRU

3 V/5 V, 4/8 Channel High Performance Analog Multiplexers
ADI

ADG608TRU

8-CHANNEL, SGL ENDED MULTIPLEXER, PDSO16, TSSOP-16
ROCHESTER

ADG608TRU-REEL

IC 8-CHANNEL, SGL ENDED MULTIPLEXER, PDSO16, TSSOP-16, Multiplexer or Switch
ADI

ADG608TRU-REEL

8-CHANNEL, SGL ENDED MULTIPLEXER, PDSO16, TSSOP-16
ROCHESTER

ADG608TRU-REEL7

8-CHANNEL, SGL ENDED MULTIPLEXER, PDSO16, TSSOP-16
ROCHESTER

ADG608TRUZ

3 V/5 V, 4/8 Channel High Performance Analog Multiplexers
ADI

ADG608TRUZ

8-CHANNEL, SGL ENDED MULTIPLEXER, PDSO16, TSSOP-16
ROCHESTER

ADG608TRUZ-REEL

LC2MOS ± 5V 8-Channel High Performance Analog Multiplexer
ADI