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元器件品牌
EVAL-AD5520EB
[AD]
Per Pin Parametric Measurement Unit/Source Measure Unit; 每个引脚参数测量单元/源测量单元
元器件型号：
EVAL-AD5520EB
生产厂家：
ANALOG DEVICES
描述和应用：
Per Pin Parametric Measurement Unit/Source Measure Unit
每个引脚参数测量单元/源测量单元
PDF文件：
总24页 (文件大小：514K)
下载文档：
下载PDF数据表文档文件
型号参数：EVAL-AD5520EB参数
查看货源
EVAL-AD5522EBDZ
Quad Parametric Measurement Unit with Integrated 16-Bit Level Setting DACs
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EVAL-AD5522EBUZ
Quad Parametric Measurement Unit with Integrated 16-Bit Level Setting DACs
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EVAL-AD5532EB
32-Channel, 14-Bit Voltage-Output DAC
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EVAL-AD5532EB
32-Channel Infinite Sample-and-Hold
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EVAL-AD5532EB
32-Channel, 14-Bit DAC with Precision Infinite Sample-and-Hold Mode
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EVAL-AD5533EB
32-Channel Precision Infinite Sample-and-Hold
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EVAL-AD5535BEBZ
32-Channel, 14-Bit DAC with Full-Scale Output Voltage Programmable from 50 V to 200 V
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EVAL-AD5541/42EBZ
2.7 V to 5.5 V, Serial-Input, Voltage-Output, 16-Bit DACs
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EVAL-AD5543SDZ
Current Output/Serial Input, 16-/14-Bit DACs
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EVAL-AD5560EBUZ
1.2 A Programmable Device Power Supply
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EVAL-AD5570EB
True Accuracy, 16-Bit 12 V/15 V, Serial Input Voltage Output DAC
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EVAL-AD5590EBZ
16 Input, 16 Output Analog I/O Port with Integrated Amplifiers
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EVAL-AD5620EB
Single, 12-/14-/16-Bit nanoDAC with 5 ppm/C On-Chip Reference in SOT-23
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EVAL-AD5620EBZ
Single, 12-/14-/16-Bit nanoDAC with 5 ppm/°C On-Chip Reference in SOT-23
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EVAL-AD5621EBZ
2.7 V to 5.5 V, <100 μA, 8-/10-/12-Bit nanoDAC, SPI Interface in LFCSP and SC70
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