AS6UA25617-100BI [ALSC]

Standard SRAM, 256KX16, 100ns, CMOS, PBGA48, FBGA-48;
AS6UA25617-100BI
型号: AS6UA25617-100BI
厂家: ALLIANCE SEMICONDUCTOR CORPORATION    ALLIANCE SEMICONDUCTOR CORPORATION
描述:

Standard SRAM, 256KX16, 100ns, CMOS, PBGA48, FBGA-48

静态存储器 内存集成电路
文件: 总9页 (文件大小:216K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Preliminary information  
June 2000  
AS6UA25617  
1.65V to 3.6V 256K×16 Intelliwatt™ low power CMOS SRAM with two chip enables  
Low power consumption: STANDBY  
- 72 µW max at 3.6V  
Features  
AS6UA25617  
- 41 µW max at 2.7V  
• Intelliwatt™ active power circuitry  
• Industrial and commercial temperature ranges available  
• Organization: 262,144 words × 16 bits  
• 2.7V to 3.6V at 55 ns  
• 2.3V to 2.7V at 70 ns  
• 1.65V to 2.3V at 100 ns  
- 28 µW max at 2.3V  
• 1.2V data retention  
Equal access and cycle times  
Easy memory expansion with CS1, CS2, OE inputs  
Smallest footprint package  
- 400-mil 44-pin TSOP II  
- 48-ball FBGA  
CS1 and CS2 for chip selection  
Low power consumption: ACTIVE  
- 144 mW at 3.6V and 55 ns  
- 68 mW at 2.7V and 70 ns  
ESD protection 2000 volts  
Latch-up current 200 mA  
- 28 mW at 2.3 V and 100 ns  
Pin arrangement (top view)  
400-pin 400-mil TSOP II  
Logic block diagram  
A0  
A1  
1
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
A17  
A0  
2
A16  
V
A1  
A2  
A2  
3
A15  
DD  
A3  
4
OE  
1024 × 256 × 16  
Array  
(4,194,304)  
A4  
5
UB  
V
A3  
SS  
CS1  
I/ O1  
6
LB  
A4  
I/ O16  
I/ O15  
I/ O14  
7
A6  
I/ O  
2
8
A7  
I/ O3  
I/ O4  
9
A8  
I/ O  
13  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
A12  
A13  
V
V
SS  
CC  
V
V
CC  
SS  
I/ O12  
I/ O5  
I/ O6  
I/ O7  
I/ O8  
WE  
A5  
I/ O1–I/ O8  
I/ O  
Control circuit  
I/ O11  
I/ O10  
I/ O9  
CS2  
buffer  
I/ O9–I/ O16  
Column decoder  
WE  
A14  
A6  
A13  
A7  
A12  
A8  
A11  
A9  
A10  
UB  
OE  
LB  
CS1  
CS2  
48-CSP Ball-Grid-Array Package  
1
2
3
4
5
6
A
B
C
D
E
LB  
OE  
A
A
A
2
CS2  
0
1
I/ O9 UB  
A
A
CS1 I/ O1  
I/ O2 I/ O3  
I/ O4 VCC  
3
4
I/ O10 I/ O11  
A
A
6
5
V
I/ O12  
A
A
7
SS  
17  
VCC I/ O13 NC  
A
I/ O5  
V
SS  
16  
F
I/ O15 I/ O14  
I/ O16 NC  
A
A
I/ O6 I/ O7  
WE I/ O8  
14  
15  
G
H
A
A
13  
12  
NC  
A
A
A
A
11  
NC  
8
9
10  
Selection guide  
VCC Range  
Power Dissipation  
Typ2  
(V)  
Max  
(V)  
Speed  
(ns)  
Operating (ICC1  
)
Standby (ISB2)  
Min  
(V)  
Product  
Max (mA)  
Max (µA)  
AS6UA25617  
AS6UA25617  
2.7  
2.3  
3.0  
2.5  
2.0  
3.6  
2.7  
2.3  
55  
70  
2
1
1
20  
15  
12  
AS6UA25617*  
1.65  
100  
ALLIANCE SEMICONDUCTOR  
1
Copyright ©2000 Alliance Semiconductor. All rights reserved.  
AS6UA25617  
Functional description  
The AS6UA25617 is a low-power CMOS 4,194,304-bit Static Random Access Memory (SRAM) device organized as 262,144  
words × 16 bits. It is designed for memory applications where slow data access, low power, and simple interfacing are desired.  
Equal address access and cycle times (tAA, tRC, tWC) of 55/ 70/ 100 ns are ideal for low-power applications. Active high and  
low chip selects (CS1 and CS2) permit easy memory expansion with multiple-bank memory systems.  
When CS1 is high, or UB and LB are high or CS2 is low, the device enters standby mode: the AS6UA25617 is guaranteed not  
to exceed 72 µW power consumption at 3.6V and 55 ns; 41 µW at 2.7V and 70 ns; or 28 µW at 2.3V and 100 ns. The device  
also returns data when VCC is reduced to 1.5V for even lower power consumption.  
A write cycle is accomplished by asserting write enable (WE) and chip select (CS1) low, UB and/ or LB low, and CS2 high. Data  
on the input pins I/ O1–I/ O16 is written on the rising edge of WE (write cycle 1) or CS1, CS2 (write cycle 2). To avoid bus  
contention, external devices should drive I/ O pins only after outputs have been disabled with output enable (OE) or write  
enable (WE).  
A read cycle is accomplished by asserting output enable (OE), chip select (CS1) low, UB and/ or LB low, with write enable  
(WE) and CS2 high. The chip drives I/ O pins with the data word referenced by the input address. When either chip select or  
output enable is inactive, or write enable is active, or (UB) and (LB), output drivers stay in high-impedance mode.  
This device provides multiple center power and ground pins, and separate byte enable controls, allowing individual bytes to be  
written and read. LB controls the lower bits, I/ O1–I/ O8, and UB controls the higher bits, I/ O9–I/ O16.  
All chip inputs and outputs are CMOS-compatible, and operation is from either a single 1.65V to 3.6V supply. The device is  
available in the JEDEC standard 48-ball FBGA and 44-pin TSOPII packages.  
Absolute maximum ratings  
Parameter  
Device  
Symbol  
Min  
–0.5  
–0.5  
Max  
Unit  
V
Voltage on VCC relative to V  
V
VCC + 0.5  
SS  
tIN  
Voltage on any I/ O pin relative to GND  
Power dissipation  
V
V
tI/ O  
PD  
1.0  
+150  
+125  
20  
W
Storage temperature (plastic)  
Temperature with VCC applied  
DC output current (low)  
Tstg  
Tbias  
IOUT  
–65  
–55  
°C  
°C  
mA  
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional  
operation of the device at these or any other conditions outside those indicated in the operational sections of this specificati on is not implied. Exposure to  
absolute maximum rating conditions for extended periods may affect reliability.  
Truth table  
CS1  
H
X
X
L
CS2  
X
L
OE  
X
X
X
H
H
L
WE  
X
X
X
H
H
H
H
H
L
LB  
X
X
H
L
UB  
X
X
H
X
L
I/ O1–8  
High-Z  
High-Z  
High-Z  
High-Z  
High-Z  
DOUT  
I/ O9–16  
High-Z  
High-Z  
High-Z  
High-Z  
High-Z  
High-Z  
DOUT  
Mode  
Power  
Standby  
Standby  
Standby  
Active  
Active  
Active  
Active  
Active  
Active  
Active  
Active  
Deselected  
Deselected  
X
H
H
H
H
H
H
H
H
Deselected  
Output Disabled  
Output Disabled  
Lower Byte Read  
Upper Byte Read  
Word Read  
L
X
L
L
H
L
L
L
H
L
High-Z  
DOUT  
L
L
L
DOUT  
L
X
X
X
L
H
L
D
High-Z  
Lower Byte Write  
Upper Byte Write  
Word Write  
IN  
L
L
H
L
High-Z  
D
IN  
L
L
L
D
D
IN  
IN  
Key: X = Dont care, L = Low, H = High.  
2
AS6UA25617  
Recommended operating condition (over the operating range)  
Parameter  
Description  
Test Conditions  
Min  
2.4  
2.0  
1.5  
Max  
Unit  
V
IOH = 2.1mA  
OH = 1.5mA  
IOH = 1.65mA  
OL = 2.1mA  
VCC = 2.7V  
V
Output HIGH Voltage  
I
VCC = 2.3V  
VCC = 1.65V  
VCC = 2.7V  
VCC = 2.3V  
VCC = 1.65V  
OH  
I
0.4  
V
Output LOW Voltage  
Input HIGH Voltage  
Input LOW Voltage  
IOL = 0.5mA  
IOL = 0.1mA  
0.4  
V
V
V
OL  
0.2  
VCC = 2.7V  
2.2  
2.0  
VCC + 0.5  
V
VCC = 2.3V  
VCC + 0.3  
IH  
VCC = 1.65V  
1.4  
VCC + 0.3  
VCC = 2.7V  
–0.5  
–0.3  
–0.3  
–1  
0.8  
V
VCC = 2.3V  
0.6  
IL  
VCC = 1.65V  
0.4  
IIX  
Input Load Current  
Output Load Current  
GND < VIN < VCC  
GND < V < VCC; Outputs High Z  
+1  
µA  
µA  
IOZ  
–1  
+1  
O
VCC = 3.6V  
VCC = 2.7V  
2
CS1 = V , VIN = V  
IL  
IL  
VCC Operating Supply  
Current  
ICC  
or V , IOUT = 0mA,  
1
mA  
mA  
mA  
IH  
f = 0  
VCC = 2.3V  
1
VCC = 3.6V  
2
CS1 0.2V, V  
IN  
ICC1  
@
Average VCC Operating  
Supply Current at 1 MHz  
0.2V or V VCC  
VCC = 2.7V  
1
IN  
1 MHz  
0.2V, f = 1mS  
VCC = 2.3V  
1
VCC = 3.6V (55/ 70/ 100 ns)  
VCC = 2.7V (55/ 70/ 100 ns)  
40/ 30/ 20  
30/ 25/ 15  
25/ 20/ 12  
Average VCC Operating  
Supply Current  
CS1 V , VIN = V ,  
IL IL  
ICC2  
or V , f = fMax  
IH  
V
CC = 2.3V (55/ 70/ 100 ns)  
CC = 3.6V  
VCC = 2.7V  
CC = 2.3V  
CS1 V , CS2 = V ,  
V
IH  
IH  
CS1, CS2 Power Down  
Current; TTL inputs  
or UB = LB V ,  
IH  
ISB  
100  
µA  
other inputs = V or  
IL  
V
V , f = 0  
IH  
CS1 > VCC – 0.2V, CS2  
= + 0.2V, or UB = LB  
> VCC – 0.2V, other  
20  
15  
VCC = 3.6V  
VCC = 2.7V  
CS1, CS2 Power Down  
Current; CMOS Inputs  
ISB1  
µA  
µA  
input = 0V – V ,  
CC  
VCC = 2.3V  
12  
2
f = fMax  
CS1 > VCC – 0.1V, CS2  
< + 0.1V, or UB =  
ISBDR  
Data Retention  
VCC = 1.2V  
LB = VCC – 0.1V, f = 0  
Capacitance (f = 1 MHz, T = Room temperature, V = NOMINAL)2  
a
CC  
Signals  
Parameter  
Input capacitance  
I/ O capacitance  
Symbol  
Test conditions  
IN = 0V  
IN = VOUT = 0V  
Max  
5
7
Unit  
pF  
pF  
C
A, CS1, CS2, WE, OE, LB, UB  
I/ O  
V
IN  
C
V
I/ O  
3
AS6UA25617  
Read cycle (over the operating range)  
–55  
–70  
–100  
Parameter  
Read cycle time  
Symbol Min  
Max  
Min  
70  
Max  
Min  
100  
Max  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Notes  
tRC  
tAA  
tACS1,2  
tOE  
55  
Address access time  
55  
55  
25  
70  
70  
35  
100  
100  
50  
3
3
Chip selects access time  
Output enable (OE) access time  
Output hold from address change  
Chip selects low to output in low Z  
Chip selects high to output in high Z  
OE low to output in low Z  
UB/ LB access time  
tOH  
10  
10  
0
10  
10  
0
15  
10  
0
5
tCLZ  
tCHZ  
tOLZ  
tBA  
4, 5  
4, 5  
4, 5  
20  
20  
20  
5
5
5
55  
70  
100  
UB/ LB low to low Z  
tBLZ  
tBHZ  
tOHZ  
tPU  
10  
0
10  
0
10  
0
4, 5  
4, 5  
4, 5  
4, 5  
4, 5  
UB/ LB high to high Z  
20  
20  
20  
20  
20  
20  
OE high to output in high Z  
Power up time  
0
0
0
0
0
0
Power down time  
tPD  
55  
70  
100  
Shaded areas indicate preliminary information.  
Key to switching waveforms  
Rising input  
Falling input  
Undefined/ dont care  
Read waveform 1 (address controlled)  
t
RC  
Address  
t
AA  
t
t
OH  
OH  
D
Previous data valid  
Data valid  
OUT  
Read waveform 2 (chip selects, OE, UB, LB controlled)  
t
RC  
Address  
t
AA  
OE  
t
OE  
t
t
t
OH  
OLZ  
OLZ  
CS1  
t
t
t
OHZ  
LZ  
t
t
t
t
HZ  
OHZ  
ACS1  
ACS1  
LZ  
CS2  
t
OH  
t
t
HZ  
OE  
LB, UB  
t
t
BHZ  
BA  
t
BLZ  
D
Data valid  
OUT  
4
AS6UA25617  
Write cycle (over the operating range)  
–55  
–70  
–100  
Parameter  
Write cycle time  
Symbol  
tWC  
tCW  
tAW  
Min  
55  
40  
40  
0
Max  
Min  
70  
60  
60  
0
Max  
Min  
100  
80  
80  
0
Max  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Notes  
12  
Chip selects to write end  
Address setup to write end  
Address setup time  
tAS  
12  
Write pulse width  
tWP  
tAH  
tDW  
tDH  
35  
0
55  
0
70  
0
Address hold from end of write  
Data valid to write end  
Data hold time  
25  
0
30  
0
40  
0
4, 5  
4, 5  
4, 5  
Write enable to output in high Z  
Output active from write end  
tWZ  
tOW  
tBW  
0
20  
0
20  
0
20  
5
5
5
UB/ LB low to end of write  
35  
55  
70  
Shaded areas indicate preliminary information.  
Write waveform 1 (WE controlled)  
t
t
WC  
CW  
Address  
t
AH  
CS1  
CS2  
t
CW  
t
AH  
t
BW  
LB, UB  
WE  
t
AW  
t
t
AS  
WP  
t
t
DH  
DW  
D
IN  
Data valid  
t
WZ  
t
OW  
D
OUT  
Data undefined  
High Z  
Write waveform 2 (chip selects controlled)  
t
WC  
Address  
t
t
AS  
AH  
AH  
t
CW  
CS1  
CS2  
t
t
AW  
AW  
t
CW  
t
t
AS  
t
BW  
LB, UB  
WE  
t
WP  
t
t
DH  
DW  
Data valid  
High Z  
D
IN  
t
t
CLZ  
WZ  
t
OW  
D
Data undefined  
OUT  
High Z  
5
AS6UA25617  
Data retention characteristics (over the operating range)  
Parameter  
VCC for data retention  
Data retention current  
Sym  
Test conditions  
Min  
1.2V  
Max  
3.6  
2
Unit  
V
VDR  
VCC = 1.2V  
CS1 VCC – 0.1V or  
UB = LB > VCC – 0.1V  
ICCDR  
mA  
ns  
Chip deselect to data retention time tCDR  
0
V
VCC – 0.1V or  
IN  
Operation recovery time  
tR  
V
0.1V  
tRC  
ns  
IN  
Data retention waveform  
Data retention mode  
1.2V  
V
V
V
CC  
V
CC  
CC  
DR  
t
t
R
CDR  
V
DR  
V
V
IH  
IH  
CS1  
CS2  
V
V
IH  
IH  
V
DR  
t
t
R
CDR  
AC test loads and waveforms  
R1  
Thevenin equivalent:  
R1  
V
R
CC  
V
TH  
CC  
V
OUTPUT  
OUTPUT  
OUTPUT  
30 pF  
5 pF  
ALL INPUT PULSES  
V
Typ  
R2  
CC  
R2  
90%  
10%  
90%  
10%  
INCLUDING  
JIG AND  
SCOPE  
INCLUDING  
JIG AND  
SCOPE  
< 5 ns  
(c)  
GND  
(a)  
(b)  
Parameters  
3.0V  
1105  
1550  
645  
2.5V  
2.0V  
15294  
11300  
6500  
Unit  
R1  
R2  
RTH  
16670  
15380  
8000  
Ohms  
Ohms  
Ohms  
Volts  
V
1.75V  
1.2V  
0.85V  
TH  
Notes  
1
2
3
4
5
6
7
8
9
During V power-up, a pull-up resistor to V on CS1 is required to meet I specification.  
CC CC SB  
This parameter is sampled, but not 100% tested.  
For test conditions, see AC Test Conditions.  
t
and t are specified with C = 5pF as in Figure C. Transition is measured ±500 mV from steady-state voltage.  
CHZ L  
CLZ  
This parameter is guaranteed, but not tested.  
WEis HIGH for read cycle.  
CS1 and OE are LOW and CS2 is HIGH for read cycle.  
Address valid prior to or coincident with CS1 transition LOW and CS2 HIGH.  
All read cycle timings are referenced from the last valid address to the first transitioning address.  
10 CS1 or WE must be HIGH or CS2 LOW during address transitions. Either CS1 or WE asserting HIGH terminates a write cycle.  
11 All write cycle timings are referenced from the last valid address to the first transitioning address.  
12 CE1 and CE2 have identical timing.  
13 1.2V data retention applies to commercial and industrial temperature range operations.  
14 C = 30pF, except at HIGH Z and LOW Z parameters, where C = 5pF.  
6
AS6UA25617  
Typical DC and AC characteristics  
Normalized supply current  
vs. supply voltage  
1.4  
Normalized access time  
vs. supply voltage  
Normalized standby current  
vs. ambient temperature  
1.0  
3.0  
2.5  
2.0  
1.2  
1.0  
V
= V typ  
CC  
CC  
0.75  
0.5  
V
= V typ  
IN  
CC  
V
= V typ  
CC  
IN  
1.5  
1.0  
0.5  
0.8  
0.6  
0.4  
0.2  
0.0  
TA = 25 °C  
T = 25 °C  
A
0.0  
0.25  
0.0  
–0.5  
1.7  
2.2  
2.7  
3.2  
3.7  
1.7  
2.2  
2.7  
3.2  
3.7  
–55  
25  
105  
Supply voltage (V)  
Supply Voltage (V)  
Ambient temperature (°C)  
Normalized standby current  
vs. supply voltage  
Normalized I  
CC  
vs. Cycle Time  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
1.5  
1.0  
I
SB2  
V
= V typ  
CC  
IN  
T = 25 °C  
A
0.50  
0.10  
V
= V typ  
CC  
IN  
T = 25 °C  
A
1
5
10  
15  
2.8  
1
1.9  
3.7  
Supply voltage (V)  
Supply voltage (V)  
Package diagrams and dimensions  
44-pin TSOP II  
c
2423  
4443424140393837363534333231302928272625  
Min (mm)  
Max (mm)  
1.2  
A
A
0.05  
0.95  
0.25  
1
A
1.05  
0.45  
2
H
e
44-pin TSOP II  
e
b
c
0.15 (typical)  
d
e
He  
E
l
20.85  
10.06  
11.56  
0.80 (typical)  
0.40  
21.05  
10.26  
11.96  
1 2 3 4 5 6 7 8 9 10111213141516171819202122  
d
0.60  
l
A
2
A
0–5  
°
A
1
b
E
7
AS6UA25617  
48-ball FBGA  
Bottom View  
Top View  
Ball # A1 index  
Ball # A1  
6
5
4
3
2
1
A
B
C
D
E
SRAM Die  
C
C1  
F
A
G
H
Elastomer  
A
B
B1  
Detail View  
Side View  
A
E2  
D
E
E2  
Y
E
Die  
Die  
E1  
0.3/ Typ  
Minimum  
Typical  
0.75  
7.00  
3.75  
11.00  
5.25  
0.35  
Maximum  
7.10  
11.10  
A
B
B1  
C
C1  
D
E
E1  
E2  
Y
6.90  
10.90  
0.30  
Notes  
1. Bump counts: 48 (8 row × 6 column).  
2. Pitch: (x,y) = 0.75 mm × 0.75 mm (typ).  
3. Units: millimeters.  
0.40  
1.20  
0.27  
0.08  
4. All tolerances are ±0.050 unless otherwise specified.  
5. Typ: typical.  
0.68  
0.25  
0.22  
6. Y is coplanarity: 0.08 (max).  
8
AS6UA25617  
Ordering codes  
Speed (ns)  
Ordering Code  
AS6UA25617-BC  
AS6UA25617-TC  
AS6UA25617-BI  
A6UA25617-TI  
Package Type  
48-ball fine pitch BGA  
44-pin TSOP II  
Operating Range  
Commercial  
Industrial  
55/ 70/ 100  
48-ball fine pitch BGA  
44-pin TSOP II  
Part numbering system  
AS6UA  
25617  
B, T  
C, I  
Package:  
Temperature range:  
SRAM Intelliwatt™ prefix  
Device number  
B: CSP BGA  
T: TSOP II  
C: Commercial: 0° C to 70° C  
I: Industrial: -40° C to 85° C  
9
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