AS7C31025B-12TJI [ALSC]

3.3V 128K X 8 CMOS SRAM (Center power and ground); 3.3V 128K ×8 CMOS SRAM (中心电源和地)
AS7C31025B-12TJI
型号: AS7C31025B-12TJI
厂家: ALLIANCE SEMICONDUCTOR CORPORATION    ALLIANCE SEMICONDUCTOR CORPORATION
描述:

3.3V 128K X 8 CMOS SRAM (Center power and ground)
3.3V 128K ×8 CMOS SRAM (中心电源和地)

静态存储器
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中文:  中文翻译
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March 2004  
AS7C31025B  
®
3.3V 128K X 8 CMOS SRAM (Center power and ground)  
Features  
• Industrial and commercial temperatures  
• Organization: 131,072 x 8 bits  
• High speed  
- 10/12/15/20 ns address access time  
- 5, 6, 7, 8 ns output enable access time  
• Low power consumption: ACTIVE  
- 252 mW / max @ 10 ns  
• Easy memory expansion with CE  
• Center power and ground  
• TTL/LVTTL-compatible, three-state I/O  
• JEDEC-standard packages  
- 32-pin, 300 mil SOJ  
- 32-pin, 400 mil SOJ  
• ESD protection 2000 volts  
• Latch-up current 200 mA  
, OE inputs  
• Low power consumption: STANDBY  
- 18 mW / max CMOS  
• 6 T 0.18 u CMOS technology  
Pin arrangement  
Logic block diagram  
V
CC  
32-pin SOJ (300 mil)  
32-pin SOJ (400 mil)  
GND  
Input buffer  
A16  
A0  
1
32  
31  
30  
A15  
A14  
A13  
OE  
I/O7  
A1  
A2  
A3  
CE  
I/O0  
I/O1  
2
3
4
5
6
7
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
I/O7  
I/O0  
512 x 256 x 8  
Array  
(1,048,576)  
I/O6  
GND  
V
8
CC  
V
GND  
I/O2  
I/O3  
WE  
A4  
A5  
A6  
A7  
9
10  
11  
12  
13  
14  
15  
16  
CC  
I/O5  
I/O4  
A12  
A11  
A10  
WE  
A9  
A8  
18  
17  
Control  
circuit  
Column decoder  
OE  
CE  
Selection guide  
-10  
-12  
12  
6
-15  
15  
7
-20  
20  
8
Unit  
ns  
Maximum address access time  
Maximum output enable access time  
Maximum operating current  
10  
5
ns  
70  
5
65  
5
60  
5
55  
5
mA  
mA  
Maximum CMOS standby current  
3/24/04, v. 1.3  
Alliance Semiconductor  
P. 1 of 9  
Copyright © Alliance Semiconductor. All rights reserved.  
AS7C31025B  
®
Functional description  
The AS7C31025B is a high-performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) device organized as 131,072 x 8  
bits. It is designed for memory applications where fast data access, low power, and simple interfacing are desired.  
Equal address access and cycle times (tAA, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 5, 6, 7, 8 ns are ideal for  
high-performance applications. The chip enable input CE permits easy memory and expansion with multiple-bank memory systems.  
When CE is high the device enters standby mode. A write cycle is accomplished by asserting write enable (WE) and chip enable (CE). Data  
on the input pins I/O0 through I/O7 is written on the rising edge of WE (write cycle 1) or CE (write cycle 2). To avoid bus contention,  
external devices should drive I/O pins only after outputs have been disabled with output enable (OE) or write enable (WE).  
A read cycle is accomplished by asserting output enable (OE) and chip enable (CE), with write enable (WE) high. The chip drives I/O pins  
with the data word referenced by the input address. When either chip enable or output enable is inactive or write enable is active, output  
drivers stay in high-impedance mode.  
All chip inputs and outputs are TTL-compatible, and operation is from a single 3.3 V supply. The AS7C31025B is packaged in common  
industry standard packages.  
Absolute maximum ratings  
Parameter  
Symbol  
Min  
–0.50  
–0.50  
Max  
Unit  
V
Voltage on V relative to GND  
V
V
+5.0  
CC  
t1  
t2  
D
Voltage on any pin relative to GND  
Power dissipation  
V
+ 0.5  
V
CC  
P
1.0  
+150  
+125  
20  
W
o
Storage temperature (plastic)  
T
–65  
–55  
C
stg  
bias  
o
Ambient temperature with V applied  
T
C
CC  
DC current into outputs (low)  
I
mA  
OUT  
NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and func-  
tional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure  
to absolute maximum rating conditions for extended periods may affect reliability.  
Truth table  
CE  
H
L
WE  
X
OE  
X
Data  
Mode  
Standby (I , I  
High Z  
High Z  
)
SB SB1  
H
H
Output disable (I  
)
CC  
L
H
L
D
Read (I  
)
OUT  
CC  
L
L
X
D
Write (I  
)
IN  
CC  
Key: X = don’t care, L = low, H = high.  
3/24/04, v. 1.3  
Alliance Semiconductor  
P. 2 of 9  
AS7C31025B  
®
Recommended operating conditions  
Parameter  
Symbol  
Min  
3.0  
2.0  
–0.5  
0
Nominal  
Max  
Unit  
V
Supply voltage  
V
3.3  
3.6  
CC  
V
V
+ 0.5  
CC  
V
IH  
Input voltage  
V
0.8  
70  
85  
V
IL  
o
T
C
A
Ambient operating temperature  
o
T
–40  
C
A
VIL = -1.0V for pulse width less than 5ns  
V
V
+ 1.5V for pulse width less than 5ns  
IH = CC  
DC operating characteristics (over the operating range)1  
-10  
-12  
-15  
-20  
Parameter  
Sym  
Test conditions  
= Max, V = GND to V  
CC  
Min Max Min Max Min Max Min Max Unit  
Input leakage  
current  
| ILI  
|
V
1
1
1
1
1
1
1
1
µA  
µA  
CC  
IN  
V
= Max, CE = V ,  
IH  
Output leakage  
current  
CC  
| ILO  
|
V
= GND to V  
out  
CC  
V
= Max  
CC  
Operating power  
supply current  
ICC  
70  
65  
60  
55  
mA  
CE V , f = f  
,
IL  
Max  
I
= 0 mA  
OUT  
V
= Max  
CC  
ISB  
30  
5
25  
5
20  
5
20  
5
mA  
mA  
CE V , f = f  
IH  
Max  
Standby power  
supply current1  
V
= Max, CE V –0.2 V,  
CC  
0.2 V or V V –0.2 V,  
CC  
ISB1  
V
IN  
IN  
CC  
f = 0  
VOL  
VOH  
0.4  
0.4  
0.4  
0.4  
V
V
I
= 8 mA, V = Min  
CC  
OL  
Output voltage  
I
= –4 mA, V = Min  
2.4  
2.4  
2.4  
2.4  
OH  
CC  
o
Capacitance (f = 1 MHz, T = 25 C, V = NOMINAL)2  
a
CC  
Parameter  
Input capacitance  
I/O capacitance  
Symbol  
Signals  
Test conditions  
= 0 V  
Max  
Unit  
C
A, CE  
,
WE  
,
OE  
V
5
7
pF  
pF  
IN  
IN  
C
I/O  
V
= V  
= 0 V  
OUT  
I/O  
IN  
3/24/04, v. 1.3  
Alliance Semiconductor  
P. 3 of 9  
AS7C31025B  
®
Read cycle (over the operating range)3,9  
-10  
-12  
-15  
-20  
Parameter  
Read cycle time  
Symbol Min Max Min Max Min Max Min Max Unit Notes  
t
10  
3
3
0
0
10  
10  
5
12  
3
3
0
0
12  
12  
6
15  
3
3
0
0
15  
15  
7
20  
3
3
0
0
20  
20  
8
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
RC  
Address access time  
t
3
3
AA  
Chip enable (CE) access time  
Output enable (OE) access time  
Output hold from address change  
CE low to output in low Z  
CE high to output in high Z  
OE low to output in low Z  
OE high to output in high Z  
Power up time  
t
ACE  
t
OE  
OH  
t
5
t
4, 5  
4, 5  
4, 5  
4, 5  
4, 5  
4, 5  
CLZ  
CHZ  
t
3
3
4
5
t
OLZ  
OHZ  
t
5
6
7
8
t
t
PU  
PD  
Power down time  
10  
12  
15  
20  
Key to switching waveforms  
Rising input  
Falling input  
Undefined/don’t care  
Read waveform 1 (address controlled)3,6,7,9  
t
RC  
Address  
t
t
AA  
OH  
D
Data valid  
OUT  
Read waveform 2 (CE and OE controlled)3,6,8,9  
t
RC1  
CE  
t
OE  
OE  
t
t
OHZ  
OLZ  
t
CHZ  
t
ACE  
D
OUT  
Data valid  
t
t
CLZ  
t
I
PD  
CC  
PU  
Supply  
current  
I
SB  
50%  
50%  
3/24/04, v. 1.3  
Alliance Semiconductor  
P. 4 of 9  
AS7C31025B  
®
Write cycle (over the operating range)11  
-10  
-12  
-15  
-20  
Parameter  
Write cycle time  
Symbol Min Max Min Max Min Max Min Max Unit  
Notes  
t
t
t
10  
8
8
0
7
0
0
5
0
1
5
12  
9
9
0
8
0
0
6
0
1
6
15  
10  
10  
0
7
20  
12  
12  
0
8
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
WC  
CW  
AW  
Chip enable (CE) to write end  
Address setup to write end  
Address setup time  
t
AS  
WP  
WR  
Write pulse width  
t
9
12  
0
Write recovery time  
t
0
Address hold from end of write  
Data valid to write end  
Data hold time  
t
0
0
AH  
t
8
10  
0
DW  
t
0
4, 5  
4, 5  
4, 5  
DH  
WZ  
OW  
Write enable to output in high Z  
Output active from write end  
t
t
1
1
Write waveform 1 (WE controlled)10,11  
t
WC  
t
t
WR  
t
AW  
AH  
Address  
WE  
t
WP  
t
AS  
t
t
DW  
DH  
D
Data valid  
IN  
t
t
WZ  
OW  
D
OUT  
Write waveform 2 (CE controlled)10,11  
t
WC  
t
t
AH  
AW  
t
WR  
Address  
t
t
CW  
AS  
CE  
t
WP  
WE  
t
t
t
DH  
WZ  
DW  
D
Data valid  
IN  
D
OUT  
3/24/04, v. 1.3  
Alliance Semiconductor  
P. 5 of 9  
AS7C31025B  
®
AC test conditions  
– Output load: see Figure B.  
Thevenin equivalent:  
– Input pulse level: GND to 3.0 V. See Figure A.  
– Input rise and fall times: 2 ns. See Figure A.  
– Input and output timing reference levels: 1.5 V.  
168  
D
+1.728 V  
+3.3 V  
OUT  
320  
D
OUT  
+3.0 V  
13  
90%  
10%  
90%  
10%  
255  
C
2 ns  
Figure A: Input pulse  
GND  
Figure B: 3.3 V Output load  
GND  
Notes  
1
2
3
4
5
6
7
8
9
During VCC power-up, a pull-up resistor to VCC on CE is required to meet ISB specification.  
This parameter is sampled, but not 100% tested.  
For test conditions, see AC Test Conditions, Figures A and B.  
t
CLZ and tCHZ are specified with CL = 5 pF, as in Figure B. Transition is measured ±500 mV from steady-state voltage.  
This parameter is guaranteed, but not 100% tested.  
WE is high for read cycle.  
CE and OE are low for read cycle.  
Address is valid prior to or coincident with CE transition low.  
All read cycle timings are referenced from the last valid address to the first transitioning address.  
10 N/A  
11 All write cycle timings are referenced from the last valid address to the first transitioning address.  
12 N/A.  
13 C = 30 pF, except all high Z and low Z parameters where C = 5 pF.  
3/24/04, v. 1.3  
Alliance Semiconductor  
P. 6 of 9  
AS7C31025B  
®
Package dimensions  
32-pin SOJ  
300 mil/400 mil  
D
e
E1  
A1  
E2  
B
Pin 1  
A
c
Seating  
plane  
b
A2  
E
32-pin SOJ  
300 mil  
32-pin SOJ  
400 mil  
Symbol Min  
Max  
0.128 0.145 0.132 0.146  
0.025 0.025  
Min  
Max  
A
A1  
A2  
B
-
-
0.095 0.105 0.105 0.115  
0.026 0.032 0.026 0.032  
0.016 0.020 0.015 0.020  
0.007 0.010 0.007 0.013  
0.820 0.830 0.820 0.830  
0.255 0.275 0.354 0.378  
0.295 0.305 0.395 0.405  
0.330 0.340 0.435 0.445  
b
c
D
E
E1  
E2  
e
0.050 BSC  
0.050 BSC  
3/24/04, v. 1.3  
Alliance Semiconductor  
P. 7 of 9  
AS7C31025B  
®
Ordering Codes  
Package \  
Access time  
Temperature  
Commercial  
Industrial  
10 ns  
12 ns  
15 ns  
20 ns  
AS7C31025B-10TJC  
AS7C31025B-10TJI  
AS7C31025B-10JC  
AS7C31025B-10JI  
AS7C31025B-12TJC  
AS7C31025B-12TJI  
AS7C31025B-12JC  
AS7C31025B-12JI  
AS7C31025B-15TJC AS7C31025B-20TJC  
300-mil SOJ  
AS7C31025B-15TJI  
AS7C31025B-15JC  
AS7C31025B-15JI  
AS7C31025B-20TJI  
AS7C31025B-20JC  
AS7C31025B-0JI  
Commercial  
Industrial  
400-mil SOJ  
Note:  
Add suffix ‘N’ to the above part number for lead free parts (Ex. AS7C31025B-10TJCN)  
Part numbering system  
AS7C  
X
1025B  
–XX  
X
X
X
Voltage:  
3 = 3.3 V  
CMOS  
Package:  
Temperature range  
SRAM  
prefix  
Device Access  
number time  
TJ = SOJ 300 mil C = commercial, 0° C to 70° C  
J = SOJ 400 mil I = industrial, -40° C to 85° C  
N=Lead Free Part  
3/24/04, v. 1.3  
Alliance Semiconductor  
P. 8 of 9  
AS7C31025B  
®
®
Alliance Semiconductor Corporation  
2575, Augustine Drive,  
Santa Clara, CA 95054  
Tel: 408 - 855 - 4900  
Copyright © Alliance Semiconductor  
All Rights Reserved  
Part Number: AS7C31025B  
Document Version: v. 1.3  
Fax: 408 - 855 - 4999  
www.alsc.com  
© Copyright 2003 Alliance Semiconductor Corporation. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered  
trademarks of Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make  
changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document.  
The data contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this  
data at any time, without notice. If the product described herein is under development, significant changes to these specifications are possible. The  
information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate  
as, or provide, any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application  
or use of any product described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including  
liability or warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express  
agreed to in Alliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according  
to Alliance's Terms and Conditions of Sale. The purchase of products from Alliance does not convey a license under any patent rights, copyrights; mask  
works rights, trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical  
components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the  
inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify  
Alliance against all claims arising from such use.  

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