AS7C3128PFS36A-3.5TQC [ALSC]

Standard SRAM, 128KX36, 3.5ns, CMOS, PQFP100, 14 X 20 MM, TQFP-100;
AS7C3128PFS36A-3.5TQC
型号: AS7C3128PFS36A-3.5TQC
厂家: ALLIANCE SEMICONDUCTOR CORPORATION    ALLIANCE SEMICONDUCTOR CORPORATION
描述:

Standard SRAM, 128KX36, 3.5ns, CMOS, PQFP100, 14 X 20 MM, TQFP-100

静态存储器
文件: 总9页 (文件大小:257K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
High-performance  
4Mb synchronous  
CMOS SRAM  
AS7C3128PFS32/ 36A  
®
128K × 32/ 36 synchronous SRAM  
Advance information  
Features  
Byte write enables  
• Organization: 131,072 words × 32 or 36 bits  
Fast clock speeds to 166 MHz in LVTTL/ LVCMOS  
Fast clock to data access: 3.5/ 3.8/ 4/ 5 ns  
Fast OEaccess time: 3.5/ 3.5/ 3.8/ 4 ns  
Fully synchronous register-to-register operation  
Single register ‘flow-through’ mode  
Clock enable for operation hold  
• Multiple chip enables for easy expansion  
• 3.3 core power supply  
• 2.5V or 3.3V I/ O operation with separate V  
DDQ  
Automatic power down: 10 mW typical standby power  
• NTD™ pipeline architecture available  
(AS7C3128KNTD32/ 36)  
Single cycle de-select  
• Pentium® compatible architecture and timing  
Synchronous and asynchronous output enable control  
Economical 100-pin TQFP package  
Logic block diagram  
Pin arrangement  
lbo  
clk  
adv  
clk  
ce  
clr  
burst logic  
adsc  
adsp  
128k×32/ 36  
memory  
17  
15  
17  
17  
d
ce  
clk  
q
a[16:0]  
array  
address  
register  
DQPb/ NC  
DQb  
DQPc/ NC  
DQc  
1
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
2
DQb  
DQc  
3
36  
36  
gwe  
bwe  
V
V
4
DDQ  
DDQ  
d
q
q
q
q
V
V
5
dqd  
SSQ  
SSQ  
bw  
d
DQb  
DQb  
DQb  
DQb  
DQc  
DQc  
DQc  
DQc  
6
byte write  
registers  
clk  
7
8
9
d
dqc  
V
V
10  
11  
bw  
c
SSQ  
SSQ  
DDQ  
byte write  
registers  
V
V
DDQ  
DQb  
DQb  
DQc 12  
DQc 13  
FT 14  
TQFP 14x20mm  
clk  
d
V
SS  
dqb  
bw  
b
V
V
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
DD  
DD  
byte write  
registers  
clk  
V
V
DD  
DD  
V
ZZ  
SS  
DQa  
DQa  
DQd  
d
DQd  
dqa  
byte write  
registers  
bw  
a
4
V
V
DDQ  
DDQ  
V
V
SSQ  
SSQ  
clk  
d
DQa  
DQa  
DQa  
DQa  
DQd  
DQd  
DQd  
DQd  
ce0  
ce1  
ce2  
q
q
oe  
output  
registers  
le  
enable  
input  
registers  
clk  
register  
V
V
SSQ  
SSQ  
ce  
V
V
DDQ  
clk  
DDQ  
clk  
DQa  
DQd  
DQa  
DQd  
d
enable  
delay  
DQPa/ NC  
DQPd/ NC 30  
power  
down  
zz  
oe  
register  
clk  
36  
ft  
data [35:0]  
Note: Pins 1,30,51,80 are NC for ×32  
Selection guide  
AS7C3128PFS32/ 36A AS7C3128PFS32/ 36A AS7C3128PFS32/ 36A AS7C3128PFS32/ 36A  
3.5  
6
166.7  
-3.8  
6.7  
150  
-4  
7.5  
133.3  
-5  
10  
100  
Units  
ns  
MHz  
Minimum cycle time  
Maximum clock frequency  
Maximum pipelined clock access  
time  
3.5  
3.8  
4
5
ns  
Maximum operating current  
Maximum standby current  
Maximum CMOS standby current  
(DC)  
350  
60  
325  
60  
300  
60  
250  
60  
mA  
mA  
5
5
5
5
mA  
6/ 8/ 00  
ALLIANCE SEMICONDUCTOR  
1
Copyright ©2000 Alliance Semiconductor. All rights reserved.  
AS7C3128PFS32/ 36A  
®
Functional description  
The AS7C37C3128PFS32/ 36A family is a high performance CMOS 4 Mbit synchronous Static Random Access Memory  
(SRAM) organized as 131,072 words × 32 or 36 bits and incorporates a two stage register-register pipeline for highest  
frequency on any given technology.  
Timing for this device is compatible with existing Pentium synchronous cache specifications. This architecture is suited for  
ASIC, DSP (TMS320C6X), and PowerPC based systems in computing, datacomm, instrumentation, and telecommunications  
systems. When using pipeline burst SRAMs, any turnaround from read-to-write and write-to-read, required the insertion of  
two dead cycles. When reading data, a two cycle latency until data valid exists due to the nature of the dual register  
architecture. When writing, data, address and controls are all presented simultaneously. Therefore two dead cycles are required  
to clear the read pipeline before a write can occur. In a write-to-read transition, two dead cycles are again produced due to the  
pipeline read latency. These penalties are eliminated in the AS7C3128KNTD32/ 36 architecture device.  
Fast cycle times of 6/ 6.7/ 7.5/ 10 ns with clock access times (tCD) of 3.5/ 3.5/ 3.8/ 4 ns enable 167, 150, 133 and 100 MHz  
bus frequencies. Three chip enable inputs permit easy memory expansion. Burst operation is initiated in one of two ways: the  
controller address strobe (ADSC), or the processor address strobe (ADSP). The burst advance pin (ADV) allows subsequent  
internally generated burst addresses.  
Read cycles are initiated with ADSP (regardless of WE and ADSC) using the new external address clocked into the on-chip  
address register when ADSP is sampled Low, the chip enables are sampled active, and the output buffer is enabled with OE. In a  
read operation the data accessed by the current address, registered in the address registers by the positive edge of CLK, are  
carried to the data-out registers and driven on the output pins on the next positive edge of CLK. ADV is ignored on the clock  
edge that samples ADSP asserted, but is sampled on all subsequent clock edges. Address is incremented internally for the next  
access of the burst when WE is sampled High, ADV is sampled Low, and both address strobes are High. Burst operation is  
selectable with the MODE input. With MODE unconnected or driven High, burst operations use a Pentium count sequence.  
With MODE driven LOW the device uses a linear count sequence, suitable for PowerPC and many other applications.  
Write cycles are performed by disabling the output buffers with OE and asserting a write command. A global write enableGWE  
writes all 32 bits regardless of the state of individual BW[a:d] inputs. Alternately, when GWE is High, one or more bytes may be  
written by asserting BWE and the appropriate individual byte BW signal(s).  
BWn is ignored on the clock edge that samples ADSP Low, but is sampled on all subsequent clock edges. Output buffers are  
disabled when BWn is sampled LOW (regardless of OE). Data is clocked into the data input register when BWn is sampled Low.  
Address is incremented internally to the next burst of address if BWn and ADV are sampled Low.  
Read or write cycles may also be initiated with ADSC instead of ADSP. The differences between cycles initiated with ADSC and  
ADSP follow.  
ADSP must be sampled HIGH when ADSC is sampled LOW to initiate a cycle with ADSC.  
• WEsignals are sampled on the clock edge that samples ADSC LOW (and ADSP High).  
• Master chip select CE0 blocks ADSP, but not ADSC.  
The AS7C3128K36P family operates from a 3.3V supply. I/ Os use a separate power supply that can operate at 2.5V or 3.3V.  
This device is available in a 100-pin 14×20 mm TQFP package.  
Capacitance  
Parameter  
Symbol  
Signals  
Address and control pins  
I/ O pins  
Test conditions  
V = 0V  
Max  
5
7
Unit  
pF  
pF  
Input capacitance  
I/ O capacitance  
C
IN  
in  
C
V = Vout = 0V  
I/ O  
in  
Write enable truth table (per byte)  
GWE  
BWE  
BWn  
X
WRITEn  
L
X
T
X
L
L
T
H
H
X
F
F †  
H
L
H
Key: X = Dont Care, L = Low, H = High.  
Valid read.  
2
ALLIANCE SEMICONDUCTOR  
6/ 8/ 00  
AS7C3128PFS32/ 36A  
®
Signal descriptions  
Signal  
I/ O Properties  
Description  
Clock. All inputs except OE are synchronous to this clock.  
CLK  
I
I
CLOCK  
SYNC  
A0A16  
Address. Sampled when all chip enables are active and ADSC or ADSP are asserted.  
Data. Driven as output when the chip is enabled and OE is active.  
DQ[a,b,c,d] I/ O SYNC  
Master chip enable. Sampled on clock edges when ADSP or ADSC is active. When CE0 is  
inactive, ADSP is blocked. Refer to the SYNCHRONOUS TRUTH TABLE for more  
information.  
CE0  
I
SYNC  
Synchronous chip enables. Active HIGH and active Low, respectively. Sampled on clock edges  
when ADSC is active or when CE1 and ADSP are active.  
CE1, CE2  
I
SYNC  
ADSP  
ADSC  
ADV  
I
I
I
SYNC  
SYNC  
SYNC  
Address strobe processor. Asserted LOW to load a new bus address or to enter standby mode.  
Address strobe controller. Asserted LOW to load a new address or to enter standby mode.  
Advance. Asserted LOW to continue burst read/ write.  
SYNC default Global write enable. Asserted LOW to write all 36 bits. When High, BWE and WE0–WE3  
= HIGH control write enable. This signal is internally pulled High.  
SYNC default Byte write enable. Asserted LOW with GWE = HIGH to enable effect of WE0–WE3 inputs.  
GWE  
BWE  
I
I
= LOW  
This signal is internally pulled Low.  
Write enables. Used to control write of individual bytes when GWE = HIGH and BWE =  
Low. If any of BW[a:d] is active with GWE = HIGH and BWE = LOW the cycle is a write  
cycle. If all BW[a:d] are inactive the cycle is a read cycle.  
BW[a,b,c,d] I  
SYNC  
Asynchronous output enable. I/ O pins are driven when OE is active and the chip is  
synchronously enabled.  
OE  
I
I
ASYNC  
STATIC default Count mode. When driven High, count sequence follows Intel XOR convention. When  
LBO  
= HIGH  
STATIC  
ASYNC  
driven Low, count sequence follows linear convention. This signal is internally pulled High.18  
Flow-through mode.When low, enables single register flow-through mode. Connect to V  
DD  
FT  
ZZ  
I
I
if unused or for pipelined operation.  
Sleep. Places device in low power mode; data is retained. Connect to GND if unused.  
Absolute maximum ratings  
Parameter  
Power supply voltage relative to GND  
Input voltage relative to GND (input pins)  
Input voltage relative to GND (I/ O pins)  
Power dissipation  
Symbol  
VDD, V  
Min  
–0.5  
–0.5  
–0.5  
Max  
Unit  
V
V
V
W
+4.6  
+4.6  
VDDQ + 0.5  
1.2  
DDQ  
V
IN  
V
IN  
PD  
DC output current  
Storage temperature (plastic)  
Temperature under bias  
IOUT  
Tstg  
Tbias  
–65  
–65  
30  
+150  
+135  
mA  
oC  
oC  
Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation  
of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute max-  
imum rating conditions may affect reliability.  
6/ 8/ 00  
ALLIANCE SEMICONDUCTOR  
3
AS7C3128PFS32/ 36A  
®
Synchronous truth table  
CE0  
H
L
CE1  
X
L
CE2  
X
X
X
H
H
L
ADSP ADSC ADV  
n
OE  
X
X
X
X
X
L
Address accessed CLK  
Operation  
X
L
L
X
X
X
X
X
X
X
X
X
L
X
X
X
X
X
F
F
F
F
F
F
F
F
F
F
F
F
T
T
T
T
T
NA  
L to H Deselect  
X
L
NA  
Lto H Deselect  
L
L
H
L
NA  
Lto H Deselect  
L
X
X
H
H
H
H
X
X
X
X
X
X
X
X
H
X
X
X
X
X
L
NA  
Lto H Deselect  
L
H
L
NA  
Lto H Deselect  
L
X
X
L
External  
External  
External  
External  
Next  
Lto H Begin read  
Lto H Begin read  
Lto H Begin read  
Lto H Begin read  
Lto H Cont. read  
Lto H Cont. read  
Lto H Suspend read  
Lto H Suspend read  
Lto H Cont. read  
Lto H Cont. read  
L to H Suspend read  
L to H Suspend read  
Lto H Begin write  
Lto H Cont. write  
Lto H Cont. write  
Lto H Suspend write  
L to H Suspend write  
L
L
L
H
L
L
L
H
H
H
H
H
H
X
X
X
X
H
H
X
H
X
L
L
L
H
L
X
X
X
X
H
H
H
H
L
X
X
X
X
X
X
X
X
L
H
H
H
H
H
H
H
H
L
L
H
L
Next  
H
H
L
Current  
Current  
Next  
H
L
L
H
L
Next  
H
H
X
L
Current  
Current  
External  
Next  
H
X
X
X
H
H
X
H
X
H
X
X
X
X
H
H
H
H
L
Next  
H
H
Current  
Current  
Key: X = Dont Care, L = Low, H = High.  
See Write enable truth table for more information.  
Recommended operating conditions  
Parameter  
Symbol  
VDD  
GND  
Min  
3.135  
0.0  
Nominal  
3.3  
0.0  
Max  
3.6  
0.0  
Unit  
V
V
Supply voltage  
VDDQ  
GNDQ  
2.35  
0.0  
2.5 or 3.3  
0.0  
3.6  
0.0  
4.5  
0.8  
VDDQ + 0.5  
0.8  
70  
V
V
V
V
I/ O supply voltage  
Address and  
V
2.0  
IH  
–0.5*  
2.0  
control pins  
V
IL  
Input voltages  
V
V
IH  
I/ O pins  
V
-0.5*  
0
IL  
Ambient operating temperature  
TA  
°C  
* V min = –2.0V for pulse width less than 0.2 x t  
IL  
.
RC  
DC electrical characteristics over operating range  
-166  
-150  
-133  
-100  
Parameter  
Symbol Test conditions  
Min Max Min Max Min Max Min Max Unit  
Input leakage  
current  
| ILI |  
| ILO  
VDD = Max, V = GND to VDD  
2
2
2
2
2
2
2
2
µA  
µA  
in  
Output leakage  
current  
OE VIH, VDD = Max,  
|
Vout = GND to VDD  
4
ALLIANCE SEMICONDUCTOR  
6/ 8/ 00  
AS7C3128PFS32/ 36A  
®
-166  
-150  
-133  
-100  
Parameter  
Symbol Test conditions  
Min Max Min Max Min Max Min Max Unit  
Operating power  
supply current  
CE = V , CE = V , CE = V ,  
IL  
IH  
IL  
ICC  
ISB  
350  
60  
5
325  
60  
5
300  
60  
5
250 mA  
60 mA  
f = fmax, out  
I
= 0 mA  
f = fmax  
f = 0  
0.2V or VDD - 0.2V  
Standby power  
supply current  
ISB1  
5
mA  
IN  
V
IOL = 8 mA, VDDQ = 3.6V  
IOH = –8 mA, VDDQ = 3.0V  
0.4  
0.4  
0.4  
0.4  
V
V
OL  
Output voltage  
V
2.4  
2.4  
2.4  
2.4  
OH  
Timing characteristics over operating range  
-3.5  
-3.8  
-4  
-5  
Parameter  
Symbol Min Max Min Max Min Max Min Max Unit Notes  
Clock frequency  
Cycle time (pipelined mode)  
Clock access time (pipelined mode)  
FMAX  
tCYC  
tCD  
-
6
-
-
-
0
1.5  
1
-
-
166  
-
3.5  
6
3.5  
-
-
-
6.6  
-
-
-
0
1.5  
1
-
-
150  
-
3.8  
6.6  
3.5  
-
-
-
7.5  
-
-
-
133  
-
10  
-
-
-
0
2
2
-
-
-
3
3
1.5  
1.5  
1.5  
1.5  
0.5  
0.5  
0.5  
0.5  
1.5  
1.5  
100 MHz 1  
-
4
7.5  
3.8  
-
-
-
4
3.5  
2
-
-
-
-
-
-
-
-
-
-
5
10  
4
-
-
-
4
3.5  
2.5  
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Clock access time (flow-through mode) tCDF  
Output enable Low to data valid  
Clock High to output Low Z  
Data output hold from clock High  
Output enable Low to output Low Z  
Output enable High to output High Z  
Clock High to output High Z  
Clock High to output High Z  
Clock High pulse width  
tOE  
tLZC  
tOH  
tLZOE  
tHZOE  
tHZC  
tHZCN  
tCH  
0
8
8
8
8
8
1.5  
1.5  
-
-
-
2.8  
2.8  
1.5  
1.5  
1.5  
1.5  
0.5  
0.5  
0.5  
0.5  
1.5  
1.5  
-
-
3
2.5  
1.5  
-
-
-
-
-
-
-
3.5  
3
1.5  
-
-
-
-
-
-
-
-
-
ns 1,9  
ns  
ns  
2.4  
2.4  
1
1
1
2.6  
2.6  
1.3  
1.3  
1.3  
1.3  
0.5  
0.5  
0.5  
0.5  
1.5  
1.5  
Clock Low pulse width  
Address and Control setup to clock High tAS  
Data setup to clock High  
tCL  
-
-
ns  
tDS  
tWS  
tCSS  
tAH  
tDH  
tWH  
tCSH  
tR  
-
ns  
Write setup to clock High  
Chip select setup to clock High  
Address hold from clock High  
Data hold from clock High  
Write hold from clock High  
Chip select hold from clock High  
Output rise time (0 pF load)  
Output fall time (0 pF load)  
See “Notes” on page 9.  
-
ns  
1
-
ns  
0.5  
0.5  
0.5  
0.5  
1.5  
1.5  
-
ns  
-
-
-
-
-
-
-
-
-
ns  
-
ns  
-
-
-
-
ns  
-
-
V/ ns 1  
V/ ns 1  
tF  
-
-
Key to switching waveforms  
Rising input  
Falling input  
Undefined/ don’t care  
6/ 8/ 00  
ALLIANCE SEMICONDUCTOR  
5
AS7C3128PFS32/ 36A  
®
Timing waveform of read cycle  
t
t
CYC  
t
CH  
CL  
CLK  
t
SS  
t
SH  
ADSP  
t
SS  
t
SH  
ADSC  
t
AS  
LOAD NEW ADDRESS  
t
AH  
A1  
A2  
A3  
Address  
t
WS  
t
WH  
GWE, BWE  
t
CSS  
t
CSH  
CE0, CE2  
CE1  
t
ADVS  
t
ADVH  
ADV  
OE  
t
CD  
t
HZOE  
t
LZOE  
t
t
OH  
ADV INSERTS WAIT STATES  
t
t
HZC  
OE  
LZC  
Q(A1)  
Q(A2)  
Q(A2Ý01)  
Q(A2Ý10)  
Q(A2Ý11) Q(A3) Q(A3Ý01) Q(A3Ý10) Q(A3Ý11)  
D
OUT  
(pipelined mode)  
t
OE  
t
LZOE  
Q(A1)  
Q(A2) Q(A2Ý01)  
Q(A2Ý10)  
Q(A2Ý11) Q(A3)  
Q(A3Ý01) Q(A3Ý10)  
Q(A3Ý11)  
D
OUT  
(flow-through mode)  
t
HZC  
t
CDF  
Note: = XOR when MODE = High/ No Connect; = ADD when MODE = Low. Refer to Burst Sequence Table.  
[0:3] is dont care.  
6
ALLIANCE SEMICONDUCTOR  
6/ 8/ 00  
AS7C3128PFS32/ 36A  
®
Timing waveform of write cycle  
t
t
CYC  
CL  
t
CH  
CLK  
t
SS  
t
SH  
ADSP  
ADSC  
t
SS  
t
SH  
ADSC LOADS NEW ADDRESS  
A3  
t
AS  
t
AH  
A1  
A2  
Address  
t
WS  
t
WH  
WE  
BW[a:d]  
t
CSS  
t
CSH  
CE0, CE2  
CE1  
t
ADVS  
ADV SUSPENDS BURST  
t
ADVH  
ADV  
OE  
t
DS  
t
DH  
D(A1)  
D(A2)  
D(A2Ý01) D(A2Ý01) D(A2Ý10) D(A2Ý11) D(A3)  
D(A3Ý01) D(A3Ý10)  
Data In  
Note: = XOR when MODE = High/ No Connect; = ADD when MODE = Low. Refer to Burst Sequence Table.  
6/ 8/ 00  
ALLIANCE SEMICONDUCTOR  
7
AS7C3128PFS32/ 36A  
®
Timing waveform of read/ write cycle  
t
t
CYC  
t
CH  
CL  
CLK  
t
SS  
t
SH  
ADSP  
t
AS  
t
AH  
A2  
A3  
Address  
A1  
t
WS  
t
WH  
WE  
CE0, CE2  
CE1  
t
ADVS  
t
ADVH  
ADV  
OE  
t
DS  
t
DH  
D(A2)  
HZOE  
D
IN  
t
t
OH  
t
t
LZOE  
LZC  
t
t
CD  
OE  
Q(A1)  
Q(A3)  
Q(A3Ý01)  
Q(A3Ý10) Q(A3Ý11)  
D
OUT  
(pipeline mode)  
t
CDF  
Q(A1)  
Q(A3)  
Q(A3Ý01)  
Q(A3Ý10)  
D
OUT  
(flow-through mode)  
Note: = XOR when MODE = High/ No Connect; = ADD when MODE = Low. Refer to Burst Sequence Table.  
8
ALLIANCE SEMICONDUCTOR  
6/ 8/ 00  
AS7C3128PFS32/ 36A  
®
Notes  
1
2
3
4
This parameter is guaranteed but not tested.  
6
7
8
9
I
given with no output loading. I increases with faster cycle times  
CC  
CC  
and greater output loading.  
For test conditions, see AC Test Conditions, Figures A, B, C.  
Transitions are measured ±500 mV from steady state voltage. Output  
loading specified with C = 5 pF as in Figure C.  
This parameter is sampled and not 100% tested.  
This is a synchronous device. All addresses must meet the specified setup  
and hold times for all rising edges of CLK. All other synchronous inputs  
must meet the setup and hold times with stable logic levels for all rising  
edges of CLK when chip is enabled.  
L
t
is less than t  
; and t  
is less than t at any given temperature  
HZC LZC  
HZOE  
and voltage.  
LZOE  
t
is a‘no load’ parameter to indicate exactly when SRAM outputs  
HZCN  
have stopped driving.  
5
Typical values measured at 3.3V, 25°C and 10 ns cycle time.  
AC test conditions  
• Output Load: see Figure B,  
except for  
t
, t  
, t  
, tHZC see Figure C.  
LZC LZOE HZOE  
• Input pulse level: GND to 3V. See Figure A.  
• Input rise and fall time (Measured at 0.3V and 2.7V): 2 ns. See Figure A.  
• Input and output timing reference levels: 1.5V.  
+3.3V  
317Ω  
5 pF*  
Z =50Ω  
50Ω  
0
D
out  
D
+3.0V  
V =1.5V  
out  
L
90%  
10%  
90%  
10%  
30 pF*  
351Ω  
GND  
*including scope  
and jig capacitance  
GND  
Figure A: Input waveform  
Figure B: Output load (A)  
Figure C: Output load(B)  
AS7C3128PFS32/ 36A ordering information  
Package Functionality  
166 MHz  
AS7C3128PFS32/ 36AP-  
3.5TQC  
150 MHz  
AS7C3128PFS32/ 36A-  
3.8TQC  
133 MHz  
100 MHz  
TQFP  
TQFP  
PBSRAM  
PBSRAM  
AS7C3128PFS32/ 36A-4TQCAS7C3128PFS32/ 36A-5TQC  
AS7C3128PFS32/ 36A-4TQCAS7C3128PFS32/ 36A-5TQC  
AS7C3128PFS32/ 36A-  
3.5TQC  
AS7C3128PFS32/ 36A-  
3.8TQC  
AS7C3128K32P and AS7C3128PFS32/ 36A part numbering system  
AS7C  
3
128K36  
P
XX  
XX  
C
Timing  
SRAM  
prefix  
Operating  
voltage  
Part number,  
organization  
Package:  
TQ = TQFP  
Commercial temperature,  
0°C to 70 °C  
NTD=NTD timing access time (ns)  
P=PBSRAM  
NTD is a trademark of Integrated Device Technology, Inc.  
Pentium is a trademark of Intel Corporation.  
6/ 8/ 00  
ALLIANCE SEMICONDUCTOR  
9

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