A63L83361E-7.5
更新时间:2024-09-18 02:07:50
品牌:AMICC
描述:256K X 36 Bit Synchronous High Speed SRAM with Burst Counter and Flow-through Data Output
A63L83361E-7.5 概述
256K X 36 Bit Synchronous High Speed SRAM with Burst Counter and Flow-through Data Output 256K X 36位同步高速SRAM突发计数器和流过的数据输出 SRAM
A63L83361E-7.5 规格参数
生命周期: | Obsolete | 包装说明: | , |
Reach Compliance Code: | unknown | 风险等级: | 5.84 |
Is Samacsys: | N | Base Number Matches: | 1 |
A63L83361E-7.5 数据手册
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PDF下载A63L83361
256K X 36 Bit Synchronous High Speed SRAM with
Burst Counter and Flow-through Data Output
Preliminary
Document Title
256K X 36 Bit Synchronous High Speed SRAM with Burst Counter and Flow-
through Data Output
Revision History
Rev. No. History
Issue Date
Remark
0.0
Initial issue
July 14, 2005
Preliminary
PRELIMINARY (July, 2005, Version 0.0)
AMIC Technology, Corp.
A63L83361
256K X 36 Bit Synchronous High Speed SRAM with
Burst Counter and Flow-through Data Output
Preliminary
Features
ꢀFast access times: 6.5/7.5/8.0 ns(153/133/117 MHz)
ꢀSingle 3.3V±5% power supply
ꢀSynchronous burst function
ꢀIndividual Byte Write control and Global Write
ꢀThree separate chip enables allow wide range of
options for CE control, address pipelining
ꢀSelectable BURST mode
ꢀSLEEP mode (ZZ pin) provided
ꢀAvailable in 100-pin LQFP package
ꢀIndustrial operating temperature range: -45°C to
+125°C for -I series
General Description
The A63L83361 is a high-speed SRAM containing 9M bits
of bit synchronous memory, organized as 256K words by
36 bits.
The A63L83361 combines advanced synchronous
peripheral circuitry, 2-bit burst control, input registers,
output buffer and a 256K X 36 SRAM core to provide a
wide range of data RAM applications.
The positive edge triggered single clock input (CLK)
controls all synchronous inputs passing through the
registers. Synchronous inputs include all addresses (A0 -
A17), all data inputs (I/O1 - I/O36 ), active LOW chip
Burst operations can be initiated with either the address
status processor ( ADSP ) or address status controller
( ADSC ) input pin. Subsequent burst sequence burst
addresses can be internally generated by the A63L83361
and controlled by the burst advance ( ADV ) pin. Write
cycles are internally self-timed and synchronous with the
rising edge of the clock (CLK).
This feature simplifies the write interface. Individual Byte
enables allow individual bytes to be written. BW1 controls
I/O1 - I/O9, BW2 controls I/O10 - I/O18, BW3 controls
I/O19 - I/O27, and BW4 controls I/O28 - I/O36, all on the
enable ( CE ), two additional chip enables (CE2, CE2 ),
burst control inputs ( ADSC , ADSP , ADV ), byte write
enables ( BWE , BW1, BW2 , BW3 , BW4 ) and Global
Write ( GW ). Asynchronous inputs include output enable
condition that BWE is LOW. GW LOW causes all bytes
to be written.
( OE ), clock (CLK), BURST mode (MODE) and SLEEP
mode (ZZ).
PRELIMINARY
(July, 2005, Version 0.0)
1
AMIC Technology, Corp.
A63L83361
Pin Configuration
I/O19
I/O20
1
80
79
I/O18
2
I/O17
I/O16
VCCQ
GNDQ
I/O15
I/O14
I/O13
I/O12
GNDQ
VCCQ
I/O11
I/O10
GND
NC
I/O21
3
78
77
4
VCCQ
GNDQ
I/O22
5
76
75
74
6
7
I/O23
I/O24
8
73
72
9
I/O25
GNDQ
VCCQ
I/O26
10
11
12
13
14
15
16
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
I/O27
NC
VCC
NC
A63L83361E
VCC
ZZ
GND
I/O28
17
18
I/O8
19
20
21
22
23
24
25
26
27
28
29
30
I/O7
I/O29
VCCQ
GNDQ
VCCQ
GNDQ
I/O6
I/O30
I/O31
I/O5
I/O4
I/O32
I/O33
I/O3
GNDQ
GNDQ
VCCQ
I/O2
VCCQ
I/O34
I/O35
I/O36
I/O1
I/O9
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
Block Diagram
ZZ
MODE
LOGIC
MODE
ADV
CLK
LOGIC
BURST
LOGIC
ADDRESS
COUNTER
CLR
CLK
ADSC
ADSP
ADDRESS
REGISTERS
A0-A17
18
9
BYTE1
WRITE
DRIVER
9
9
9
9
9
9
BYTE2
WRITE
DRIVER
GW
BWE
BW1
BW2
BW3
BW4
256KX9X4
MEMORY
ARRAY
OUTPUT
BUFFER
BYTE
WRITE
ENABLE
LOGIC
36
BYTE3
WRITE
DRIVER
BYTE4
WRITE
DRIVER
9
36
4
DATA-IN
REGISTERS
4
CHIP
ENABLE
LOGIC
CE
CE2
CE2
OUTPUT
ENABLE
LOGIC
OE
I/O1 - I/O36
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
Pin Description
Pin No.
Symbol
Description
32 – 37 , 43 - 50, 81, 82,
99, 100
A0 - A17
Address Inputs
89
CLK
BWE , BW1 - BW4
GW
Clock
87, 93 - 96
Byte Write Enables
Global Write
88
86
Output Enable
OE
92, 97, 98
Chip Enables
CE2 ,CE2, CE
ADV
83
84
85
31
Burst Address Advance
Processor Address Status
Controller Address Status
ADSP
ADSC
MODE
Burst Mode: HIGH or NC (Interleaved burst)
LOW (Linear burst)
64
ZZ
Asynchronous Power-Down (Snooze): HIGH (Sleep)
LOW or NC (Wake up)
1,2, 3, 6 - 9, 12, 13, 18,
19, 22 - 25, 28, 29,30,51,
52, 53,
I/O1- I/O36
Data Inputs/Outputs
56 - 59, 62, 63, 68, 69, 72
- 75, 78, 79,80
1, 14, 16, 30, 38, 39, 42,
43, 51, 66, 80
NC
No Connection
15, 41, 65, 91
17, 40, 67, 90
VCC
GND
Power Supply
Ground
4, 11, 20, 27,
54, 61, 70, 77
VCCQ
Isolated Output Buffer Supply
5, 10, 21, 26,
55, 60, 71, 76
GNDQ
Isolated Output Buffer Ground
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
Synchronous Truth Table (See Notes 1 Through 5)
Address
I/O
Operation
Operation
CE2
CLK
ADSC
CE2
WRITE
CE
ADV
OE
ADSP
Used
Deselected Cycle,
Power-down
NONE
H
X
X
X
L
X
X
X
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
L-H
High-Z
High-Z
High-Z
High-Z
High-Z
Dout
Deselected Cycle,
Power-down
NONE
NONE
NONE
NONE
External
External
External
External
External
Next
L
L
X
H
X
H
L
L
X
L
L
L
X
X
L
X
X
X
X
X
X
X
X
X
L
X
X
X
X
X
X
L
X
X
X
X
L
Deselected Cycle,
Power-down
Deselected Cycle,
Power-down
L
H
H
L
Deselected Cycle,
Power-down
L
X
H
H
H
H
H
X
X
X
X
X
X
X
X
X
X
X
X
L
READ Cycle,
Begin Burst
L
X
X
L
READ Cycle,
Begin Burst
L
L
L
H
X
L
High-Z
Din
WRITE Cycle,
Begin Burst
L
L
H
H
H
H
H
X
X
H
X
H
H
X
X
H
X
READ Cycle,
Begin Burst
L
L
L
H
H
H
H
H
H
L
Dout
READ Cycle,
Begin Burst
L
L
L
H
L
High-Z
Dout
READ Cycle,
Continue Burst
READ Cycle,
Continue Burst
READ Cycle,
Continue Burst
READ Cycle,
Continue Burst
WRITE Cycle,
Continue Burst
WRITE Cycle,
Continue Burst
READ Cycle,
Suspend Burst
READ Cycle,
Suspend Burst
READ Cycle,
Suspend Burst
READ Cycle,
Suspend Burst
WRITE Cycle,
Suspend Burst
WRITE Cycle,
Suspend Burst
X
X
H
H
X
H
X
X
H
H
X
H
X
X
X
X
X
X
X
X
X
X
X
X
H
H
H
H
H
H
H
H
H
H
H
H
Next
L
H
L
High-Z
Dout
Next
L
Next
L
H
X
X
L
High-Z
Din
Next
L
Next
L
L
Din
Current
Current
Current
Current
Current
Current
H
H
H
H
H
H
H
H
H
H
L
Dout
H
L
High-Z
Dout
H
X
X
High-Z
Din
L
Din
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
Notes: 1. X = "Disregard", H = Logic High, L = Logic Low.
2. WRITE = L means:
1) Any BWx (BW1,BW2 ,BW3 , or BW4 ) and BWE are low or
2) GW is low.
3. All inputs except OE must be synchronized with setup and hold times around the rising edge (L-H) of CLK.
4. For write cycles that follow read cycles, OE must be HIGH before the input data request setup time and held
HIGH throughout the input data hold time.
5. ADSP LOW always initiates an internal Read at the L-H edge of CLK. A Write is performed by setting one or
more byte write enable signals and BWE LOW or GW LOW for the subsequent L-H edge of CLK. Refer to
the Write timing diagram for clarification.
Write Truth Table
Operation
GW
H
BWE
BW1
BW2
X
BW3
X
BW4
X
READ
READ
H
L
L
L
X
X
H
L
H
H
H
H
WRITE Byte 1
WRITE all bytes
WRITE all bytes
H
H
H
H
H
L
L
L
L
L
X
X
X
X
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
Linear Burst Address Table (MODE = LOW)
First Address (External)
X . . . X00
Second Address (Internal)
Third Address (Internal)
X . . . X10
Fourth Address (Internal)
X . . . X11
X . . . X01
X . . . X10
X . . . X11
X . . . X00
X . . . X01
X . . . X11
X . . . X00
X . . . X10
X . . . X00
X . . . X01
X . . . X11
X . . . X01
X . . . X10
Interleaved Burst Address Table (MODE = HIGH or NC)
First Address (External)
X . . . X00
Second Address (Internal)
X . . . X01
Third Address (Internal)
X . . . X10
Fourth Address (Internal)
X . . . X11
X . . . X01
X . . . X00
X . . . X11
X . . . X10
X . . . X10
X . . . X11
X . . . X00
X . . . X01
X . . . X11
X . . . X10
X . . . X01
X . . . X00
Absolute Maximum Ratings*
VCC & VCCQ Supply Voltages
VCC for all devices . . ….. . . . . . . . . . . . . . . . . . . . +3.3V
VCCQ for all devices . . ….. . . . . . . . . . . . . . . . . . . +3.3V
Operating ranges define those limits between which the
functionally of the device is guaranteed.
Power Supply Voltage (VCC) . . . . . . . . . . -0.5V to +4.6V
Voltage Relative to GND for any Pin Except VCC (Vin,
Vout) . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VCC +0.5V
Power Dissipation (PD) . . . . . . . . . . . . . . . . . . . . . . . . 2W
Storage Temperature (Tbias) . . . . . . . . . . -65°C to 150 °C
Storage Temperature (Tstg) . . . . . . . . . . . -55°C to 125°C
*Comments
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to this device.
These are stress ratings only. Functional operation of
this device at these or any other conditions above those
indicated in the operational sections of this specification
is not implied or intended. Exposure to the absolute
maximum rating conditions for extended periods may
affect device reliability.
Operating Ranges
Ambient Temperature
Commercial (C) Devices . . . . . . . . . . . . . . . 0°C to +70°C
Industrial (I) Devices . . . . . . . . . . . . . . . -45°C to +125°C
Recommended DC Operating Conditions
(0°C ≤ TA ≤ 70°C, VCC, VCCQ = 3.3V+5% or 3.3V-5%, unless otherwise noted)
Symbol
VCC
VCCQ
GND
VIH
Parameter
Supply Voltage (Operating Voltage Range)
Isolated Input Buffer Supply
Supply Voltage to GND
Min.
3.135
3.135
0.0
Typ.
Max.
3.465
3.465
0.0
Unit
V
Note
3.3
3.3
V
-
-
-
-
V
Input High Voltage
2
VCC+0.3
VCC+0.3
0.8
V
1, 2
1, 2
VIHQ
Input High Voltage (I/O Pins)
Input Low Voltage
2
V
VIL
-0.3
V
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
DC Electrical Characteristics
(0°C ≤ TA ≤ 70°C, VCC, VCCQ = 3.3V+5% or 3.3V-5%, unless otherwise noted)
Symbol
⏐ILI⏐
Parameter
Min.
Max.
±2.0
±2.0
Unit
µA
Test Conditions
Note
Input Leakage Current
Output Leakage Current
-
-
All inputs VIN = GND to VCC
OE = VIH, Vout = GND to VCC
⏐ILO⏐
µA
Device selected; VCC = max.
Iout = 0mA, all inputs = VIH or VIL
Cycle time = tKC min.
ICC1
Supply Current
Standby Current
-
-
300
30
mA
mA
3, 11
Device deselected; VCC = max.
All inputs are fixed.
All inputs ≥ VCC - 0.2V
or ≤ GND + 0.2V
ISB1
11
Cycle time = tKC min.
ISB2
VOL
VOH
-
-
15
1.0
-
mA
V
ZZ ≥ VCC - 0.2V
IOL = 8 mA
Output Low Voltage
Output High Voltage
1.6
V
IOH = -4 mA
Capacitance
Symbol
CIN
Parameter
Input Capacitance
Input/Output Capacitance
Typ.
Max.
Unit
pF
Conditions
3
4
4
5
TA = 25 C; f = 1MHz
VCC = 3.3V
CI/O
pF
* These parameters are sampled and not 100% tested.
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
AC Characteristics (0°C ≤ TA ≤ 70°C, VCC = 3.3V+5% or 3.3V-5%)
-6.5
-7.5
-8.5
Symbol
Parameter
Unit
Note
Min.
7.5
2.5
2.5
-
Max. Min. Max. Min. Max.
TKC
TKH
Clock Cycle Time
-
-
8.5
2.8
2.8
-
-
-
10
3.0
3.0
-
-
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Clock High Time
TKL
Clock Low Time
-
-
-
TKQ
Clock to Output Valid
Clock to Output Invalid
Clock to Output in Low-Z
Clock to Output in High-Z
OE to Output Valid
6.5
-
7.5
-
8.5
-
tKQX
tKQLZ
tKQHZ
tOEQ
tOELZ
tOEHZ
3.0
2.5
-
3.0
2.5
-
3.0
2.5
-
-
-
-
5, 6
5, 6
8
3.5
3.5
-
3.5
3.5
-
5.0
5.0
-
-
-
-
0
0
0
5, 6
5, 6
OE to Output in Low-Z
OE to Output in High-Z
-
3.5
-
3.5
-
5.0
Setup Times
TAS
tADSS
tADVS
tWS
Address
1.5
1.5
1.5
1.5
-
-
-
-
2.0
2.0
2.0
2.0
-
-
-
-
2.0
2.0
2.0
2.0
-
-
-
-
ns
ns
ns
ns
7, 9
7, 9
7, 9
7, 9
Address Status ( ADSC , ADSP )
Address Advance ( ADV )
Write Signals
(BW1, BW2 , BW3 , BW4 , BWE , GW )
TDS
tCES
Data-in
1.5
1.5
-
-
1.5
2.0
-
-
2.0
2.0
-
-
ns
ns
7, 9
7, 9
Chip Enable ( CE , CE2, CE2 )
Hold Times
TAH
Address
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
0.5
ns
ns
ns
ns
7, 9
7, 9
7, 9
7, 9
tADSH
tAAH
Address Status ( ADSC , ADSP )
Address Advance ( ADV )
tWH
Write Signal
(BW1, BW2 , BW3 ,BW4 , BWE , GW )
TDH
tCEH
Data-in
0.5
0.5
0.5
0.5
0.5
0.5
ns
ns
7, 9
7, 9
Chip Enable ( CE , CE2, CE2 )
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
Notes:
1. All voltages refer to GND.
2. Overshoot: VIH ≤ +2V for t ≤ tKC/2.
Undershoot: VIL ≥ -0.7V for t ≤ tKC/2.
Power-up: VIH ≤ +2 and VCC ≤ 1.7V
for t ≤ 200ms
3. ICC1 is given with no output current. ICC1 increases with greater output loading and faster cycle times.
4. Test conditions assume the output loading shown in Figure 1, unless otherwise specified.
5. For output loading, CL = 5pF, as shown in Figure 2. Transition is measured ±150mV from steady state voltage.
6. At any given temperature and voltage condition, tKQHZ is less than tKQLZ and tOEHZ is less than tQELZ.
7. A WRITE cycle is defined by at least one Byte Write enable LOW and ADSP HIGH for the required setup and hold
times. A READ cycle is defined by all byte write enables HIGH and ( ADSC or ADV LOW) or ADSP LOW for the
required setup and hold times.
8. OE has no effect when a Byte Write enable is sampled LOW.
9. This is a synchronous device. All addresses must meet the specified setup and hold times for all rising edges of CLK
when either ADSP or ADSC is LOW and the chip is enabled. All other synchronous inputs must meet the setup and
hold times with stable logic levels for all rising edges of clock (CLK) when the chip is enabled. Chip enable must be
valid at each rising edge of CLK when either ADSP or ADSC is LOW to remain enabled.
10. The load used for VOH, VOL testing is shown in Figure 2. AC load current is higher than the given DC values.
AC I/O curves are available upon request.
11. "Device Deselected" means device is in POWER-DOWN mode, as defined in the truth table. "Device Selected" means
device is active (not in POWER-DOWN mode).
12. MODE pin has an internal pulled-up, and ZZ pin has an internal pulled-down. All of then exhibit an input leakage
current of 10µA.
13. Snooze (ZZ) input is recommended that users plan for four clock cycles to go into SLEEP mode and four clocks to
emerge from SLEEP mode to ensure no data is lost.
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
Timing Waveforms
t
KC
CLK
t
KH
tKL
t
ADSS
t
ADSH
ADSP
ADSC
Deselect cycle
t
ADSS
tADSH
t
AS
tAH
A1
A2
A3
ADDRESS
t
WS
tWH
GW,BWE
BW1-BW4
t
CES
t
CEH
Deselect with CE
CE
(NOTE 2)
t
ADVS
tADVH
ADV
OE
ADV suspends burst
(NOTE 3)
t
KQ
t
OELZ
tKQHZ
t
OEQ
t
OEHZ
t
KQX
t
KQX
t
KQLZ
High-Z
Q(A1)
Q(A2)
Q(A2+1)
Q(A2+2)
Q(A2+3)
DOUT
Q(A3)
t
KQ
(NOTE *1)
Single READ
BURST READ
Don't Care
Undefined
Read Timing
Notes: 1. QA(2) refers to output from address A2. Q(A2+1) refers to output from the next internal burst address following A2.
2. CE and CE2 have timing identical to CE . On this diagram, when CE is LOW, CE2 is LOW and CE2 is HIGH.
When CE is HIGH, CE2 is HIGH and CE2 is LOW.
3. Timing is shown assuming that the device was not enabled before entering into this sequence. OE does not
cause Q to be driven until after the following clock rising edge.
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
Timing Waveforms (continued)
t
KC
CLK
ADSP
t
KH
tKL
t
ADSS
tADSH
ADSC extends burst
t
ADSS
tADSH
t
ADSH
t
ADSS
ADSC
t
AS
tAH
A1
A2
A3
ADDRESS
BYTE WRITE signals are ignored
t
WS
t
WH
for first cycle when ADSP initiates burst
BWE,BW1-BW4
(NOTE 5)
t
WS
tWH
GW
t
CES
tCEH
CE
(NOTE 2)
t
ADVS
t
ADVH
ADV
(NOTE 4)
ADV suspends burst
OE
(NOTE 3)
t
DS
tDH
D(A3+2)
High-Z
D(A1)
D(A2)
D(A2+1)
D(A2+1)
D(A2+2)
D(A2+3)
D(A3)
D(A3+1)
DIN
t
OEHZ
(NOTE 1)
DOUT
BURST READ
Single WRITE
Extended BURST WRITE
Don't Care
Undefined
Write Timing
Notes: 1. D(A2) refers to output from address A2. D(A2+1) refers to output from the internal burst address immediately
following A2.
2. Timing for CE2 and CE2 is identical to that for CE . As shown in the above diagram, when CE is LOW, CE2
is LOW and CE2 is HIGH. When CE is HIGH, CE2 is HIGH and CE2 is LOW.
3. OE must be HIGH before the input data setup, and held HIGH throughout the data hold period. This prevents
input/output data contention for the period prior to the time Byte Write enable inputs are sampled.
4. ADV must be HIGH to permit a Write to the loaded address.
5. Byte Write enables are decided by means of a Write truth table.
PRELIMINARY (July, 2005, Version 0.0)
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AMIC Technology, Corp.
A63L83361
Timing Waveforms (continued)
tKC
CLK
ADSP
t
KH
tKL
tADSS
tADSH
ADSC
tAS
tAH
A1
A2
A3
A4
A5
A6
ADDRESS
tWS
tWH
GW,BWE,
BW1-BW4
(NOTE 3)
tCES
tCEH
CE
(NOTE 2)
ADV
OE
tDS
tDH
t
KQ
t
OELZ
High-Z
D(A3)
D(A6)
DIN
D(A5)
tOEHZ
t
KQ
(NOTE 1)
Q(A4+1)
DOUT
Q(A1)
Q(A2)
Q(A4)
Q(A4+2)
Q(A4+3)
Back-to-Back
WRITEs
Back-to-Back READs
Single WRITE
BURST READ
Don't Care
Undefined
Read/Write Timing
Notes: 1. Q(A4) refers to output from address A4. Q(A4+1) refers to output from the next internal burst address following A4.
2. CE2 and CE2 have timing identical to CE . On this diagram, when CE is LOW, CE is LOW and CE2 is HIGH,
When CE is HIGH, CE2 is HIGH and CE2 is LOW.
3. The data bus (Q) remains in High-Z following a WRITE cycle unless an ADSP , ADSC , or ADV cycle is
performed.
4. Byte Write enables are decided by means of a Write truth table.
5. Back-to-back READs may be controlled by either ADSP or ADSC
PRELIMINARY (July, 2005, Version 0.0)
13
AMIC Technology, Corp.
A63L83361
AC Test Conditions
Input Pulse Levels
GND to 3V
1 ns
Input Rise and Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
1.5V
VccQ/2
See Figures 1 and 2
Figure 1. Output Load Equivalent Figure
2. Output Load Equivalent
VCCQ/2
50Ω
Q
RL=50Ω
ZO=50Ω
Q
5pF
VT=0.75V
Ordering Information
Part No.
A63L83361E-6.5
A63L83361E-6.5F
A63L83361E-7.5
A63L83361E-7.5F
A63L83361E-8
Access Times (ns)
Frequency (MHz)
Package
6.5
6.5
7.5
7.5
8
153
153
133
133
117
117
100L LQFP
100L Pb-Free LQFP
100L LQFP
100L Pb-Free LQFP
100L LQFP
A63L83361E-8F
8
100L Pb-Free LQFP
PRELIMINARY (July, 2005, Version 0.0)
14
AMIC Technology, Corp.
A63L83361
Package Information
LQFP 100L Outline Dimensions
unit: inches/mm
H
E
A
2
A1
E
y
80
51
81
50
31
100
1
30
b
c
e
θ
Dimensions in inches
Dimensions in mm
Symbol
Min.
0.002
0.053
0.011
0.005
0.860
0.783
0.624
0.547
Nom.
-
Max.
-
Min.
0.05
Nom.
-
Max.
-
A1
A2
b
0.055
0.013
-
0.057
0.015
0.008
0.872
0.791
0.636
0.555
1.35
1.40
1.45
0.37
0.20
22.15
20.10
16.15
14.10
0.27
0.32
c
0.12
-
HE
E
0.866
0.787
0.630
0.551
0.026 BSC
0.024
0.039 REF
-
23.35
19.90
15.85
13.90
22.00
20.00
16.00
14.00
0.65 BSC
0.60
HD
D
e
L
0.018
0.030
0.45
0.75
L1
y
1.00 REF
-
-
0.004
-
0.1
θ
0°
3.5°
7°
0°
3.5°
7°
Notes:
1. Dimensions D and E do not include mold protrusion.
2. Dimensions b does not include dambar protrusion.
Total in excess of the b dimension at maximum material condition.
Dambar cannot be located on the lower radius of the foot.
PRELIMINARY (July, 2005, Version 0.0)
15
AMIC Technology, Corp.
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