A64S0616G-55I [AMICC]

DRAM;
A64S0616G-55I
型号: A64S0616G-55I
厂家: AMIC TECHNOLOGY    AMIC TECHNOLOGY
描述:

DRAM

动态存储器
文件: 总15页 (文件大小:171K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
A64S0616  
Preliminary  
1M X 16 Bit Low Voltage Super RAMTM  
Document Title  
1M X 16 Bit Low Voltage Super RAMTM  
Revision History  
Rev. No. History  
Issue Date  
Remark  
0.0  
0.1  
0.2  
Initial issue  
November 30, 2001  
Preliminary  
Add tASC, tAHC, tCEH, tWEH  
July 31, 2002  
Change VCCmax from 3.1V to 3.3V  
October 21, 2002  
Change tCW from 60ns to 70ns for -70 and from 70ns to 85ns  
for -85  
Change tWP from 50ns to 55ns for -70 and from 55ns to 60ns  
for -85  
Change tWHZ from 20ns to 25ns for -70 and from 20ns to 25ns  
for -85  
0.3  
November 7, 2002  
Change power on CE1=50ns  
Change avoid timing  
0.4  
0.5  
Change tOHZ from 25ns to 14ns  
March 4, 2003  
June 24, 2003  
Change tBE from 70ns to 35ns for -70 and from 85ns to 45ns  
For -85  
Add –55 grade spec.  
PRELIMINARY  
(June, 2003, Version 0.5)  
AMIC Technology, Corp.  
A64S0616  
Preliminary  
1M X 16 Bit Low Voltage Super RAMTM  
Features  
n Operating voltage: 2.7V to 3.3V  
n Access times: 55/70/85 ns (max.)  
n Current:  
n All inputs and outputs are directly TTL-compatible  
n Common I/O using three-state output  
n Industrial operating temperature range: -25°C to +85°C  
for -I  
A64S0616 series: Operating: 35mA (max.)  
Power Down Standby: 10mA (max.)  
n Available in 48-ball Mini BGA (6X8) package.  
n Fully SRAM compatible operation  
n Full static operation, no clock or refreshing required  
General Description  
The A64S0616 is a low operating current 16,777,216-bit  
Super RAM organized as 1,048,576 words by 16 bits and  
operates on low power supply voltage from 2.7V to 3.3V.  
It is built using AMIC’s high performance CMOS DRAM  
process.  
Inputs and three-state outputs are TTL compatible and allow  
for direct interfacing with common system bus structures.  
The chip enable input is provided for POWER-DOWN,  
device enable. Two byte enable inputs and an output enable  
input are included for easy interfacing.  
Using hidden refresh technique, the A64S0616 provides  
a 100% compatible asynchronous interface.  
This A64S0616 is suited for low power application such as  
mobile phone and PDA or other battery-operated handheld  
device.  
Pin Configuration  
n Mini BGA (6X8) Top View  
1
2
3
4
5
6
A
B
C
D
E
F
A0  
A1  
A2  
CE2  
LB  
OE  
HB  
I/O8  
A3  
A5  
A4  
A6  
I/O0  
I/O2  
VCC  
VSS  
I/O6  
I/O7  
NC  
CE1  
I/O9  
VSS  
VCC  
I/O14  
I/O15  
A18  
I/O10  
I/O1  
I/O11  
I/O12  
I/O13  
A19  
A8  
A17  
GND  
A14  
A12  
A9  
A7  
I/O3  
I/O4  
I/O5  
A16  
A15  
A13  
A10  
G
H
WE  
A11  
A64S0616G  
PRELIMINARY  
(Juen, 2003, Version 0.5)  
1
AMIC Technology, Corp.  
A64S0616  
Block Diagram  
VCC  
VSS  
GND  
A0  
16,777,216  
DECODER  
MEMORY ARRAY  
A18  
A19  
I/O  
0
I/O8  
INPUT  
DATA  
COLUMN I/O  
INPUT  
DATA  
CIRCUIT  
CIRCUIT  
I/O15  
I/O  
7
CE1  
CE2  
LB  
CONTROL  
CIRCUIT  
HB  
OE  
WE  
Pin Description  
Symbol  
A0 - A19  
CE1  
Description  
Address Inputs  
Chip Enable 1 Input  
Chip Enable 2 Input  
Data Input/Outputs  
Write Enable Input  
CE2  
I/O0 - I/O15  
WE  
LB  
Byte Enable Input (I/O0 to I/O7)  
Byte Enable Input (I/O8 to I/O15)  
Output Enable Input  
Power  
HB  
OE  
VCC  
VSS  
Ground  
GND  
NC  
Ground  
No Connection  
PRELIMINARY  
(June, 2003, Version 0.5)  
2
AMIC Technology, Corp.  
A64S0616  
Recommended DC Operating Conditions  
(TA = 0°C to + 70°C or -25°C to 85°C)  
Symbol  
VCC  
VSS  
GND  
VIH  
Parameter  
Min.  
2.7  
0
Max.  
Unit  
V
Supply Voltage  
Ground  
3.3  
0
V
Ground  
0
0
V
Input High Voltage  
Input Low Voltage  
Output Load  
Output Load  
2.4  
-0.3  
-
VCC + 0.3  
V
VIL  
+0.6  
30  
1
V
CL  
pF  
-
TTL  
-
Absolute Maximum Ratings*  
*Comments  
VCC to GND . . . . . . . . . . . . . . . . . . . . . -0.5V to +4.6V  
IN, IN/OUT Volt to GND . . . . . . . . -0.5V to VCC + 0.5V  
Storage Temperature, Tstg . . . . . . . . . -55°C to +125°C  
Power Dissipation, PT . . . . . . . . . . . . . . . . . . . . . 0.7W  
Soldering Temp. & Time . . . . . . . . . . . . 260°C, 10 sec  
Stresses above those listed under "Absolute Maximum  
Ratings" may cause permanent damage to this device.  
These are stress ratings only. Functional operation of this  
device at these or any other conditions above those  
indicated in the operational sections of this specification  
is not implied or intended. Exposure to the absolute  
maximum rating conditions for extended periods may  
affect device reliability.  
DC Electrical Characteristics (TA = 0°C to + 70°C or -25°C to 85°C, VCC = 2.7V to 3.3V, GND = 0V)  
-55  
-70  
-85  
Symbol  
Parameter  
Unit  
Conditions  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
Input Leakage Current  
Output Leakage Current  
-
1
-
1
-
1
VIN = GND to VCC  
çILIú  
mA  
mA  
CE1 = VIH or CE2 = VIL or  
-
-
-
1
35  
5
-
-
-
1
35  
5
-
-
-
1
30  
5
çILOú  
OE = VIH or WE = VIL  
VI/O = GND to VCC  
Min. Cycle, Duty = 100%  
ICC1  
ICC2  
mA  
mA  
CE1 = VIL, CE2 = VIH  
II/O = 0mA  
Dynamic Operating  
Current  
CE1 = VIL, CE2 = VIH  
VIH = VCC, VIL = 0V,  
f = 1MHz, II/O = 0mA  
PRELIMINARY  
(June, 2003, Version 0.5)  
3
AMIC Technology, Corp.  
A64S0616  
DC Electrical Characteristics (continued)  
Symbol  
Parameter  
-55  
-70  
-85  
Unit  
Conditions  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
CE1 ³ VCC - 0.2V  
CE2 ³ VCC - 0.2V  
VIN ³ 0V  
Standby Power  
Supply Current  
ISB1  
ISB2  
-
-
100  
10  
-
-
100  
10  
-
-
100  
10  
mA  
mA  
Power Down Mode  
Standby Current  
CE2 £ 0.2V  
VOL  
VOH  
Output Low Voltage  
Output High Voltage  
-
0.4  
-
-
0.4  
-
-
0.4  
-
V
V
IOL = 2.1mA  
IOH = -1.0mA  
2.4  
2.4  
2.4  
Truth Table  
I/O0 to I/O7 Mode  
I/O8 to I/O15 Mode  
VCC Current  
CE1  
H
CE2  
H
OE  
X
WE  
X
LB  
X
H
X
L
HB  
X
H
X
L
Not selected  
Not selected  
Not selected  
Read  
Not selected  
Not selected  
Not selected  
Read  
ISB1  
X
H
X
X
ISB1  
X
L
X
X
ISB2  
ICC1, ICC2  
ICC1, ICC2  
ICC1, ICC2  
ICC1, ICC2  
ICC1, ICC2  
ICC1, ICC2  
ICC1, ICC2  
ICC1, ICC2  
L
H
L
H
L
H
L
Read  
High - Z  
H
L
High - Z  
Read  
L
Write  
Write  
L
L
H
H
X
H
L
L
H
L
Write  
Not Write/Hi - Z  
Write  
H
Not Write/Hi - Z  
High - Z  
High - Z  
H
X
X
High - Z  
High - Z  
Note: X = H or L  
Capacitance (TA = 25°C, f = 1.0MHz)  
Symbol  
CIN*  
Parameter  
Min.  
Max.  
10  
Unit  
pF  
Conditions  
VIN = 0V  
Input Capacitance  
-
-
CI/O*  
Input/Output Capacitance  
10  
pF  
VI/O = 0V  
* These parameters are sampled and not 100% tested.  
PRELIMINARY  
(June, 2003, Version 0.5)  
4
AMIC Technology, Corp.  
A64S0616  
Initialization  
The A64S0616 is initialized in the power-on sequence according to the following.  
1. To stabilize internal circuits, after turning on the power, a 350ms or longer wait time must precede any signal toggling.  
2. After the wait time, it can be normal operation.  
Power on Chart  
VCC(min)  
VCC  
CE1  
350us  
CE2  
Wait Time  
Normal Operation  
Notes: 1. Following power application, make CE2 and CE1 high level during the wait time interval.  
2. After power on sequence, the normal operating CE2 must keep at high.  
Power on / Depower down State Machine  
Power on  
CE1=VIH  
,
CE2=VIH  
Wait 350us  
Initial State  
CE1=VIL  
,
CE2=VIH  
CE1=V IH  
CE2=V IH  
CE1=VIH  
CE2=VIH  
,
,
Active  
CE1=VIH  
CE1=V IH  
CE2=V IH  
,
CE2=VIL  
,
CE1=VIL  
,
CE2=VIH  
Standby  
Mode  
Power Down  
Mode  
CE1=VIH  
CE2=VIL  
,
Standby Mode Characteristics  
Standby Mode  
Standby  
Memory Cell Data Hold  
Standby Supply Current (mA)  
100 (ISB1)  
Valid  
Power down  
Invalid  
10 (ISB2)  
PRELIMINARY  
(June, 2003, Version 0.5)  
5
AMIC Technology, Corp.  
A64S0616  
Avoid Timing  
Following figure 1 is show you an abnormal timing which is not supported on Super RAM.  
CE1  
WE  
Less than 30ns  
Address  
Figure 1  
PRELIMINARY  
(June, 2003, Version 0.5)  
6
AMIC Technology, Corp.  
A64S0616  
AC Characteristics (TA = 0°C to +70°C or -25°C to 85°C, VCC = 2.7V to 3.3V)  
Symbol  
Parameter  
-55  
-70  
-85  
Unit  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
Read Cycle  
tRC  
Read Cycle Time  
55  
-
-
70  
-
-
85  
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tSKEW  
tAA  
Address Skew  
10  
55  
55  
30  
30  
-
10  
70  
70  
35  
35  
-
10  
85  
85  
45  
45  
-
Address Access Time  
-
-
-
tACE  
tBE  
Chip Enable Access Time  
-
-
-
Byte Enable Access Time  
-
-
-
tOE  
Output Enable to Output Valid  
Chip Enable to Output in Low Z  
Byte Enable to Output in Low Z  
Output Enable to Output in Low Z  
Chip Disable to Output in High Z  
Byte Disable to Output in High Z  
Output Disable to Output in High Z  
Output Hold from Address Change  
-
-
-
tCLZ  
10  
5
5
0
0
0
5
0
10  
5
5
0
0
0
10  
0
10  
5
5
0
0
0
10  
0
tBLZ  
-
-
-
tOLZ  
tCHZ  
tBHZ  
tOHZ  
tOH  
-
-
-
20  
20  
14  
-
25  
25  
14  
-
35  
35  
14  
-
tASC  
-
-
-
Address Setup to CE1 Low  
Address Hold Time from CE1 High  
CE1 High Pulse With  
tAHC  
tCEH  
0
-
-
0
-
-
0
-
-
ns  
ns  
10  
10  
10  
Write Cycle  
tWC  
Write Cycle Time  
55  
-
-
10  
-
70  
-
-
10  
-
85  
-
-
10  
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tSKEW  
tCW  
Address Skew  
Chip Enable to End of Write  
Byte Enable to End of Write  
Address Setup Time  
55  
50  
0
70  
60  
0
85  
70  
0
tBW  
-
-
-
tAS  
-
-
-
tAW  
Address Valid to End of Write  
Write Pulse Width  
50  
45  
0
-
60  
55  
0
-
70  
60  
0
-
tWP  
-
-
-
tWR  
Write Recovery Time  
-
-
-
tWHZ  
tDW  
Write to Output in High Z  
Data to Write Time Overlap  
Data Hold from Write Time  
Output Active from End of Write  
-
20  
-
-
25  
-
-
25  
-
25  
0
30  
0
35  
0
tDH  
-
-
-
tOW  
5
-
5
-
5
-
tASC  
0
-
0
-
0
-
Address Setup to CE1 Low  
Address Hold Time from CE1 High  
CE1 High Pulse With  
tAHC  
tCEH  
tWEH  
0
-
-
-
0
-
-
-
0
-
-
-
ns  
ns  
ns  
10  
10  
10  
10  
10  
10  
WE High Pulse With  
Note: tCHZ, tBHZ and tOHZ and tWHZ are defined as the time at which the outputs achieve the open circuit condition and are  
not referred to output voltage levels.  
PRELIMINARY  
(June, 2003, Version 0.5)  
7
AMIC Technology, Corp.  
A64S0616  
Timing Waveforms  
Read Cycle 1(1, 2, 4, 6)  
tSKEW  
tRC  
tSKEW  
tRC  
Address  
DOUT  
tAA  
tOH  
tAA  
tOH  
tASC  
CE1  
PRELIMINARY  
(June, 2003, Version 0.5)  
8
AMIC Technology, Corp.  
A64S0616  
Read Cycle 2-1(1, 3, 6)  
t
SKEW  
tSKEW  
t
RC  
tRC  
Address  
CE1  
t
ASC  
t
AHC  
t
ASC  
tAHC  
t
AA  
t
AA  
t
CEH  
t
BE  
t
ACE  
5
tACE  
tCLZ  
5
5
t
CHZ  
tCHZ  
5
t
CLZ  
t
BE  
t
BE  
,
HB LB  
5
5
5
5
t
BLZ  
t
BHZ  
t
BLZ  
tBHZ  
OE  
t
5
OE  
t
5
OE  
5
5
t
OHZ  
tOHZ  
t
OLZ  
tOLZ  
DOUT  
Read Cycle 2-2(1, 3, 6)  
t
SKEW  
t
SKEW  
t
SKEW  
t
RC  
t
RC  
Address  
CE1  
t
ASC  
t
AHC  
t
AA  
t
AA  
t
ACE  
5
5
t
CHZ  
t
CLZ  
t
BE  
t
BE  
,
HB LB  
5
5
5
5
t
BLZ  
t
BHZ  
t
BLZ  
t
BHZ  
OE  
t
5
OE  
t
5
OE  
5
5
t
OHZ  
t
OHZ  
t
OLZ  
t
OLZ  
DOUT  
Notes: 1. WE is high for Read Cycle.  
2. Device is continuously enabled  
= VIL, HB = VIL and, or LB = VIL.  
CE1  
3. Address valid prior to or coincident with CE1 and (HB and, or LB ) transition low.  
4. OE = VIL.  
5. Transition is measured ±500mV from steady state. This parameter is sampled and not 100% tested.  
6. CE2 is high for Read Cycle.  
PRELIMINARY  
(June, 2003, Version 0.5)  
9
AMIC Technology, Corp.  
A64S0616  
Timing Waveforms (continued)  
Write Cycle 1-1(6)  
(Write Enable Controlled)  
t
SKEW  
t
SKEW  
t
WC  
t
WC  
Address  
CE1  
t
ASC  
t
AHC  
t
ASC  
tAHC  
t
AW  
tAW  
t
CW  
BW  
t
t
CEH  
t
CW  
BW  
t
t
t
,
HB LB  
AS 1  
t
WR3  
t
WR3  
t
t
AS 1  
WP2  
WP2  
WE  
t
DW  
t
t
DH  
t
DW  
t
DH  
Data In  
t
WHZ4  
t
WHZ4  
OW  
t
OW  
Data Out  
Write Cycle 1-2(6)  
(Write Enable Controlled)  
t
SKEW  
t
SKEW  
t
SKEW  
t
WC  
t
WC  
Address  
CE1  
t
ASC  
tAHC  
t
BW  
t
BW  
,
HB LB  
AS 1  
t
AS 1  
t
WR3  
t
WR3  
t
t
WP2  
t
WP2  
WE  
t
WEH  
t
DW  
t
t
DH  
t
DW  
t
DH  
Data In  
t
WHZ4  
t
WHZ4  
OW  
tOW  
Data Out  
PRELIMINARY  
(June, 2003, Version 0.5)  
10  
AMIC Technology, Corp.  
A64S0616  
Timing Waveforms (continued)  
Write Cycle 2-1(6)  
(Chip Enable Controlled)  
t
SKEW  
t
WC  
tSKEW  
t
WC  
Address  
CE1  
t
AHC  
t
AHC  
t
AW  
tAW  
t
ASC  
CW2  
t
CEH  
t
CW2  
t
ASC  
t
WR3  
t
WR3  
t
t
BW  
tBW  
,
HB LB  
t
WP  
t
WP  
WE  
t
DW  
t
DH  
t
DW  
tDH  
Data In  
t
WHZ4  
t
WHZ4  
t
OW  
tOW  
Data Out  
Write Cycle 2-2(6)  
(Chip Enable Controlled)  
t
SKEW  
t
SKEW  
t
SKEW  
t
WC  
t
WC  
Address  
CE1  
t
AHC  
t
AW  
t
ASC  
WR3  
t
WR3  
t
t
BW  
t
BW  
,
HB LB  
t
WP  
t
WP  
WE  
t
DW  
t
DH  
t
DW  
t
DH  
Data In  
t
WHZ4  
t
WHZ4  
t
OW  
t
OW  
Data Out  
PRELIMINARY  
(June, 2003, Version 0.5)  
11  
AMIC Technology, Corp.  
A64S0616  
Timing Waveforms (continued)  
Write Cycle 3-1(6)  
(Byte Enable Controlled)  
t
SKEW  
t
SKEW  
t
WC  
t
WC  
Address  
t
AHC  
t
AHC  
t
AW  
t
AW  
t
ASC  
t
ASC  
t
CW  
t
CEH  
tCW  
CE1  
t
WR3  
t
WR3  
t
AS 1  
t
BW2  
t
AS 1  
t
BW2  
,
HB LB  
t
WP  
tWP  
WE  
t
DW  
t
t
DH  
t
DW  
tDH  
Data In  
WHZ4  
t
WHZ4  
t
OW  
tOW  
Data Out  
Write Cycle 3-2(6)  
(Byte Enable Controlled)  
t
SKEW  
SKEW  
t
WC  
t
t
SKEW  
t
WC  
Address  
CE1  
t
AHC  
t
AW  
t
ASC  
t
WR3  
t
WR3  
t
AS 1  
t
BW2  
t
AS 1  
t
BW2  
,
HB LB  
t
WP  
tWP  
WE  
t
DW  
t
t
DH  
t
DW  
tDH  
Data In  
WHZ4  
t
WHZ4  
t
OW  
tOW  
Data Out  
Notes: 1. tAS is measured from the address valid to the beginning of Write.  
2. A Write occurs during the overlap (tWP, tBW) of a low , WE and (HB and, or LB ).  
CE1  
or WE or (HB and, or LB ) going high to the end of the Write cycle.  
3. tWR is measured from the earliest of  
CE1  
4. OE level is high or low.  
5. Transition is measured ±500mV from steady state. This parameter is sampled and not 100% tested.  
6. CE2 is high for Write Cycle.  
PRELIMINARY  
(June, 2003, Version 0.5)  
12  
AMIC Technology, Corp.  
A64S0616  
AC Test Conditions  
Input Pulse Levels  
0.4V to 2.4V  
5 ns  
Input Rise And Fall Time  
Input and Output Timing Reference Levels  
Output Load  
1.5V  
See Figures 3 and 4  
TTL  
TTL  
CL  
CL  
30pF  
5pF  
* Including scope and jig.  
* Including scope and jig.  
Figure 3. Output Load  
Figure 4. Output Load for tCLZ, tOLZ,  
tCHZ, tOHZ, tWHZ, and tOW  
Ordering Information  
Power Down Mode  
Standby Current  
Operating Current  
Part No.  
Access Time (ns)  
Package  
Max. (mA)  
Max. (mA)  
A64S0616G-55  
A64S0616G-70  
A64S0616G-85  
A64S0616G-55I  
A64S0616G-70I  
A64S0616G-85I  
55  
70  
85  
55  
70  
85  
35  
35  
30  
35  
35  
30  
10  
10  
10  
10  
10  
10  
48B Mini BGA  
48B Mini BGA  
48B Mini BGA  
48B Mini BGA  
48B Mini BGA  
48B Mini BGA  
Note: -I is for industrial operating temperature range  
PRELIMINARY  
(June, 2003, Version 0.5)  
13  
AMIC Technology, Corp.  
A64S0616  
Package Information  
48LD CSP (6 x 8 mm) Outline Dimensions  
(48TFBGA)  
unit: mm  
TOP VIEW  
BOTTOM VIEW  
Ball#A1 CORNER  
S
S
0.10  
0.25  
C
C A B  
Ball*A1 CORNER  
b (48X)  
6
5 4 3 2 1  
1
2 3 4 5 6  
A
B
C
D
E
F
A
B
C
D
E
F
G
H
G
H
B
e
D1  
A
SIDE VIEW  
D
0.20(4X)  
C
SEATING PLANE  
Dimensions in mm  
Symbol  
MIN. NOM. MAX.  
A
A1  
D
---  
0.20  
5.90  
7.90  
---  
---  
1.20  
0.30  
6.10  
8.10  
---  
0.25  
6.00  
8.00  
3.75  
5.25  
0.75  
0.35  
E
D1  
E1  
e
---  
---  
---  
---  
b
0.30  
0.40  
Note:  
1. THE BALL DIAMETER, BALL PITCH, STAND-OFF  
& PACKAGE THICKNESS  
ARE DIFFERENT FROM JEDEC SPEC MO192 (LOW PROFILE BGA FAMILY).  
2. PRIMARY DATUM C AND SEATING PLANE ARE DEFINED BY THE SPHERICAL  
CROWNS OF THE SOLDER BALLS.  
3. DIMENSION b IS MEASURED AT THE MAXIMUM.  
THERE SHALL BE A MINIMUM CLEARANCE OF 0.25mm BETWEEN THE EDGE OF  
THE SOLDER BALL AND THE BODY EDGE.  
4. BALL PAD OPENING OF SUBSTRATE IS F 0.3mm (SMD)  
SUGGEST TO DESIGN THE PCB LAND SIZE AS F 0.3mm (NSMD)  
PRELIMINARY  
(June, 2003, Version 0.5)  
14  
AMIC Technology, Corp.  

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