ATA00501D1C [ANADIGICS]

AGC TRANSIMPEDANCE AMPLIFIER; AGC阻放大器
ATA00501D1C
型号: ATA00501D1C
厂家: ANADIGICS, INC    ANADIGICS, INC
描述:

AGC TRANSIMPEDANCE AMPLIFIER
AGC阻放大器

放大器
文件: 总8页 (文件大小:222K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ATA00501  
AGC TransimpedanceAmplifier  
SONET OC-1  
PRELIMINARY DATA SHEET-Rev 1.5  
FEATURES  
·
·
·
·
·
Single +5 Volt Supply  
Automatic Gain Control  
-43 dBm Sensitivity  
0 dBm Optical Overload  
70 MHz Bandwidth  
VDD2  
VDD1  
GND  
GND  
1992  
19F  
IIN  
APPLICATIONS  
VOUT  
GND  
GND  
·
·
·
OC-1 Receiver  
FITL  
CAGC  
CBY  
CBY  
GND  
GND  
GND  
GND  
Low Noise RF Amplifier  
S2  
D1C  
12 Pin 4 Sided SQFP  
Package  
PRODUCT DESCRIPTION  
The ANADIGICS ATA00501 is a 5V low noise  
transimpedance amplifier with AGC designed to be  
used in OC-1 fiber optic links. The device is used in  
conjunction with a photodetector (PIN diode or  
avalanche photodiode) to convert an optical signal  
into an output voltage. TheATA00501 has a bandwidth  
of 70MHz and a dynamic range in excess of 40dB. It  
is manufactured in a GaAs MESFET process and  
available in bare die form or a 12 pin SQFP package.  
VDD  
AGC  
60K  
70K  
AGC  
C
+
4pF  
IIN  
- 35  
+ 0.8  
VOUT  
VGA  
GND  
or  
neg.supply  
GND  
20pF  
PATENT PENDING  
BY  
C
Photodetector cathode must be connected  
To IIN for proper AGC operation  
Figure 1:ATA00501 Equivalent Circuit  
08/2001  
1
ATA00501  
Table 1: ATA00501D1C Pad Description (Die Only)  
PAD  
VDD1  
VDD2  
IIN  
DESCRIPTION  
VDD1  
COMMENT  
Positive supply for input gain stage  
Positive supply for second gain stage  
Connect detector cathode for proper operation  
Requires external DC block  
VDD2  
TIA Input Current  
TIA Output Voltage  
External AGC Capacitor  
VOUT  
CAGC  
CBY  
70K * CAGC= AGC time constant  
Input gain stage bypass capacitor >56 pF  
11  
12  
10  
VDD2  
VDD1  
GND  
GND  
1992  
1
2
3
9
925 um  
19F  
IIN  
8
OUT  
V
7
GND  
GND  
CAGC  
CBY  
CBY  
GND  
GND  
GND  
GND  
1250 um  
4
5
6
Figure 3: Pin Layout  
Figure 2: Bonding Pad Layout (Die Only)  
Table 2:ATA00501S2C Pin Description  
PIN DESCRIPTION PIN DESCRIPTION  
1
NC  
7
VOUT  
GND  
NC  
2
3
GND  
8
9
I
IN  
4
10  
CBY  
VDD  
GND  
NC  
5
6
GND  
11  
12  
CAGC  
ELECTRICAL CHARACTERISTICS  
Table 3: Absolute Maximum Ratings  
VDD1  
VDD2  
7.0 V  
7.0 V  
5 mA  
I
IN  
o
o
TA  
TS  
Operating Temp. - 40 C to 125  
C
Storage Temp. - 65 C to 150 o C  
o
Stresses in excess of the absolute ratings  
may cause permanent damage. Functional  
operation is not implied under these  
conditions. Exposure to absolute ratings for  
extended periods of time may adversely  
affect reliability.  
PRELIMINARY DATA SHEET - Rev 1.5  
21.  
08/2001  
ATA00501  
Table 4: Electrical Specifications  
PARAMETER  
MIN  
TYP  
MAX  
UNIT  
Transresistance(RL= ,Idc<500nA)  
¥
55  
K
W
15  
50  
28  
70  
K
(1)  
W
Transresistance (R L=50  
Bandwith -3dB  
)
MHz  
Input Resistance (2)  
Output Resistance  
Input Offset Voltage  
Output Offset Voltage  
Offset Voltage Drift  
1500  
50  
W
30  
60  
W
1.5  
1.6  
1.8  
1
1.9  
Volts  
Volts  
mV/oC  
5
10  
A
m
AGC Threshold (I ) (3)  
IN  
Optical Overload (4)  
-3  
0
dBm  
AGC Time Constant(6)  
Optical Sensitivity - DIE (7)  
16  
sec  
m
- 43  
-41  
dBm  
dBm  
Optical Sensitivity - SQFP (7)  
Supply Current  
30  
45  
+ 6.0  
85  
mA  
Volts  
oC  
Operating Voltage Range  
Operating Temperature Range  
+ 4.5  
- 40  
+ 5.0  
Notes:  
(1) f=50MHz  
(2) Measured with I below AGC Threshold. During AGC, input impedance will decrease propor-  
IN  
tionally to IIN  
(3) Defined as the I where Transresistance has decreased by 50%.  
IN  
(4) See note on “Indirect Measurement of Optical Overload”.  
(5) See note on “Measurement of Input Referred Noise Current”.  
(6) CAGC = 56 pF  
(7) Parameter is guaranteed (not tested) by design and characterization data @ 51Mb/s, assuming  
detector responsivity of 0.9  
PRELIMINARY DATA SHEET - Rev 1.5  
3
08/2001  
ATA00501  
APPLICATION INFORMATION  
VDD  
0.1µF  
NC  
12  
VDD  
11  
10  
56pF  
56pF  
GND  
NC  
1
2
NC  
9
VDD2  
GND  
V
DD  
8
0.1µF  
Vout  
60C  
GND  
1992  
IIN  
PIN  
7
3
I
IN  
GND  
GND  
VOUT  
OUT  
GND  
GND  
C
BY  
CBY  
GND  
or  
C
AGC  
4
GND  
GND  
5
6
Neg.Supply  
56pF  
56pF  
56 pF  
56 pF  
Figure 4: ATA 00501D1C Typical Bonding  
Figure 5: ATA 00501S2C External Circuit  
Power Supplies and General Layout  
degradation in bandwidth and sensitivity (see  
Considerations  
Bandwidth vs. C curves).  
T
The ATA00501S2C may be operated from a positive  
supply as low as + 4.5 V and as high as + 6.0 V.  
Below + 4.5 V, bandwidth, overload and sensitivity  
will degrade, while at + 6.0 V, bandwidth, overload  
and sensitivity improve (see “Bandwidth vs.  
Temperature” curves). Use of surface mount, low  
inductance power supply bypass capacitors  
(>=56pF) are essential for good high frequency and  
low noise performance. The power supply bypass  
capacitors should be mounted on or connected to a  
good low inductance ground plane.  
Figure 6: Bandwidth vs. Temperature  
T
C = 0.5 pF  
0.09  
0.08  
0.07  
0.06  
0.05  
0.04  
VDD  
=
5.5 V  
VDD  
=
5.0 V  
General Layout Considerations  
Since the gain stages of the transimpedance  
amplifier have an open loop bandwidth in excess  
of 1.0 GHz, it is essential to maintain good high  
frequency layout practices. To prevent oscillations,  
a low inductance RF ground plane should be made  
available for power supply bypassing. Traces that  
can be made short should be made short, and the  
utmost care should be taken to maintain very low  
capacitance at the photodiode-TIA interface (IIN),  
excess capacitance at this node will cause a  
VDD=  
4.5 V  
-40  
10  
60  
85  
Temperature (C)  
PRELIMINARY DATA SHEET - Rev 1.5  
41.  
08/2001  
ATA00501  
Figure 7: Bandwidth vs. CT  
Figure 9: Bandwidth vs. IIN  
1.44  
1.24  
1.04  
.84  
90  
80  
70  
60  
50  
40  
30  
π
in  
t
B(3dB) A/ 2 Rf(C +C)  
VDD = 5.5 V  
VDD = 5.5 V  
VDD= 5.0 V  
.64  
Rf  
.44  
VDD = 4.5 V  
VDD= 4.5 V  
.24  
50  
I
IN  
.04  
- 2.1  
- 1.6  
- 1.1  
- 0.6  
- 0.1  
0
0.2  
0.4 0.6  
0.8  
1
1.2  
IIN (mA DC)  
C (pF)  
T
o
Note: All performance curves are typical @ T =25  
A
C
V
Connection  
OUT  
unless otherwise noted.  
The output pad should be connected via a coupling  
capacitor to the next stage of the receiver channel  
(filter or decision circuits), as the output buffers are  
not designed to drive a DC coupled 50 ohm load  
(this would require an output bias current of  
approximately 36 mA to maintain a quiescent 1.8  
I
Connection  
IN  
(Refer to the equivalent circuit diagram.) Bonding  
the detector cathode to I (and thus drawing current  
from the ATA00501) improves the dynamic range.  
Although the detector may be used in the reverse  
direction for input currents not exceeding 25mA, the  
specifications for optical overload will not be met.  
IN  
Volts across the output load). If V  
is connected  
OUT  
to a high input impedance decision circuit (>500  
ohms), then a coupling capacitor may not be  
required, although caution should be exercised  
since DC offsets of the photo detector/TIA  
combination may cause clipping of subsequent gain  
or decision circuits.  
Figure 8: Transimpedance vs. IIN  
25  
22  
19  
16  
13  
Figure 10: VOUT vs. IIN  
3.4  
3.2  
Heavy AGC  
3.0  
Output Collapse  
2.9  
50  
IN  
I
2.7  
2.5  
(
10  
7
2.4  
VDD = 5.5 V  
2.2  
Linear Region  
2.0 o  
1.9  
1.7  
1.5  
1.4  
1.2  
1.0  
0.8  
0.7  
0.5  
0.3  
0.2  
0.0  
VDD = 5.5 V  
f
R
4
IIN  
VDD = 4.5 V  
1
VDD = 4.5 V  
-0.6  
vOUT  
-2.1  
-1.6  
-1.1  
-0.1  
-4  
- 3  
- 2  
- 1  
IN  
I
(mA DC)  
IIN (mA DC)  
PRELIMINARY DATA SHEET - Rev 1.5  
5
08/2001  
ATA00501  
Figure 11: Input Offset Voltage vs. Temperature  
Indirect Measurement of Optical Overload  
Optical overload can be defined as the maximum  
1.9  
optical power above which the BER (bit error rate)  
10  
increases beyond 1 error in 10  
bits. The  
1.85  
1.8  
ATA00501D1C is 100% tested at die sort by a DC  
measurement which has excellent correlation with  
an PRBS optical overload measurement. The  
measurement consists of sinking a negative current  
1.75  
1.7  
V
DD = 5.5 V  
VDD =  
5.0V  
(see V  
vs I figure) from the TIA and determining  
OUT  
IN  
1.65  
1.6  
the point of output voltage collapse. Also the input  
node virtual ground during “heavy AGC” is checked to  
verify that the linearity (i.e. pulse width distortion) of  
the amplifier has not been compromised.  
1.55  
1.5  
VDD =  
4.5V  
Measurement of Input Referred Noise Current  
The “Input Noise Current” is directly related to  
sensitivity . It can be defined as the output noise  
voltage (Vout), with no input signal, (including a 30  
MHz lowpass filter at the output of the TIA) divided by  
the AC transresistance.  
- 40  
10  
Temperature oC  
60  
C
Connection  
BY  
The C  
Figure 12: Input Referred Noise Spectral Density  
pad must be connected via a low  
BY  
inductance path to a surface mount capacitor of at  
least 56pF (additional capacitance can be added in  
parallel with the 56 pF or 220 pF capacitors to  
improve low frequency response and noise  
performance). Referring to the equivalent circuit  
diagram and the typical bonding diagram, it is critical  
that the connection from CBY to the bypass capacitor  
use two bond wires for low inductance, since any  
high frequency impedance at this node will be fed  
back to the open loop amplifier with a resulting loss  
of transimpedance bandwidth. Two pads are  
provided for this purpose.  
7
R
f
6
5
4
3
2
1
CT  
50  
C
T
=1.0pF  
CT =0.5pF  
1000  
- 0.1  
1
10  
100  
Frequency (MHz)  
Sensitivity and Bandwidth  
In order to guarantee sensitivity and bandwidth  
FIgure 13: Input Referred Noise vs Temperature  
performance, the TIA is subjected to  
a
10  
comprehensive series of tests at the die sort level  
(100% testing at 25 C) to verify the DC parametric  
o
V
DD = 4.5 V  
performance and the high frequency performance  
(i.e. adequate |S21|) of the amplifier.Acceptably high  
|S21| of the internal gain stages will ensure low  
amplifier input capacitance and hence low input  
referred noise current. Transimpedance sensitivity  
and bandwidth are then guaranteed by design and  
correlation with RF and DC die sort test results.  
25dB  
9
8
30  
MHz  
LPF  
TIA  
0.5pF  
7
6
5
V
DD =5.5V  
6500in  
R
η
(dBm) = 10 LOG  
-40  
0
40  
80  
Temperature ( 0C)  
PRELIMINARY DATA SHEET - Rev 1.5  
61.  
08/2001  
ATA00501  
AGC Capacitor  
It is important to select an external AGC capacitor of  
high quality and appropriate size. TheATA00501D1C  
has an on-chip 70 KW resistor with a shunt 4 pF  
capacitor to ground. Without external capacitance  
the chip will provide an AGC time constant of 280  
nS. For the best performance in a typical 51MB/s  
SONET receiver, a minimumAGC capacitor of 56pF  
is recommended. This will provide the minimum  
amount of protection against pattern sensitivity and  
pulse width distortion on repetitive data sequences  
during high average optical power conditions.  
Conservative design practices should be followed  
when selecting an AGC capacitor, since unit to unit  
variability of the internal time constant and various  
data conditions can lead to data errors if the chosen  
value is too small.  
Phase Response  
At frequencies below the 3dB bandwidth of the  
device, the transimpedance phase response is  
characteristic of a single pole transfer function (as  
shown in the Phase vs Frequency curve). The output  
impedance is essentially resistive up to 1000 MHz.  
Figure 14: Phase (IIN to VOUT)  
180  
200  
Rf  
VOUT  
220  
240  
IIN  
0.5pF  
50  
100  
150  
Frequency (MHz)  
PRELIMINARY DATA SHEET - Rev 1.5  
7
08/2001  
ATA00501  
PACKAGE OUTLINE  
0.245 (6.22)  
0.230 (5.84)  
0.065 (1.65)  
0.055 (1.40)  
0.165 (4.19)  
0.152 (3.86)  
7°  
0o  
0.047 (1.19)  
0.032 (0.81)  
0.035 (.89)  
0.020 (.51)  
11  
10  
12  
0.018 (.460)  
0.012 (.300)  
0.021X45°  
4 Sides  
1
2
3
9
8
7
0.015 (.38)  
0.000 (0.00)  
0.000 (0.00)  
0.020 (.51)  
4
5
6
4X 0.023X45°  
0.024 (.61)  
0.018 (.46)  
0.011 (.28)  
0.007 (.18)  
0.032 BSC  
(0.81)  
Figure 15:ATA00501S2C Package Pin-Out (S2C)  
Dimensions in Inches (Millimeters)  
ORDERING INFORMATION  
PART NUMBER  
ATA00501D1C  
ATA00501S2C  
PACKAGE OPTION  
PACKAGE DESCRIPTION  
Die  
D1C  
S2C  
12 Pin 4 Sided SQFP Package  
ANADIGICS, Inc.  
141 Mount Bethel Road  
Warren, New Jersey 07059, U.S.A.  
Tel: +1 (908) 668-5000  
Fax: +1 (908) 668-5132  
URL: http://www.anadigics.com  
E-mail: Mktg@anadigics.com  
IMPORTANT NOTICE  
ANADIGICS, Inc. reserves the right to make changes to its products or to discontinue any product at any time without  
notice. The product specifications contained in Advanced Product Information sheets and Preliminary Data Sheets are  
subject to change prior to a product’s formal introduction. Information in Data Sheets have been carefully checked and are  
assumed to be reliable; however, ANADIGICS assumes no responsibilities for inaccuracies. ANADIGICS strongly urges  
customers to verify that the information they are using is current before placing orders.  
WARNING  
ANADIGICS products are not intended for use in life support appliances, devices or systems. Use of an ANADIGICS  
product in any such application without written consent is prohibited.  
PRELIMINARY DATA SHEET - REV 1.5  
8
08/2001  

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