5962-8958407XC [APITECH]
ADC, Successive Approximation, 12-Bit, 1 Func, 1 Channel, Serial, Parallel, Word Access, Hybrid, DIP-24;
| 型号： | 5962-8958407XC |
| 厂家： | 
API Technologies Corp |
| 描述： | ADC, Successive Approximation, 12-Bit, 1 Func, 1 Channel, Serial, Parallel, Word Access, Hybrid, DIP-24 |
| 文件： | 总15页 (文件大小：104K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REVISIONS
LTR
A
DESCRIPTION
DATE (YR-MO-DA)
91-05-07
APPROVED
W. Heckman
Made technical changes to table I. Corrected figure 1 to change a 28-
lead package to a 24-lead package. Editorial changes throughout.
B
C
Added case outline X. Editorial changes throughout.
93-07-30
03-10-31
K. Cottongim
Raymond Monnin
Table I; added footnote 2 for the I , S , t
, and t
PWH
tests.
PWL
OS
O
Made correction to the clock input test in table I. Renumbered the
footnotes in table I. Figure 1; Corrected the case outline Y side view.
Updated drawing to reflect the latest requirements of MIL-PRF-38534.
-sld
D
Figure 1; Case outline X , changed the dimension L min and max
from .175 and .205 inches to .200 and .230 inches. Added
dimensions A1 and b1 to the figure 1 for case outline X. Editorial
changes throughout. -sld
07-08-29
Robert M. Heber
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
REV
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
D
D
D
D
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SHEET
10
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14
PMIC N/A
PREPARED BY
Steve Duncan
DEFENSE SUPPLY CENTER COLUMBUS
STANDARD
MICROCIRCUIT
DRAWING
CHECKED BY
Robert M. Heber
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil/
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
APPROVED BY
William K. Heckman
MICROCIRCUIT, HYBRID, LINEAR, ANALOG
TO DIGITAL CONVERTER, HIGH SPEED, 12-
BIT
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
89-11-17
AMSC N/A
REVISION LEVEL
SIZE
A
CAGE CODE
5962-89584
67268
D
SHEET
1 OF 14
DSCC FORM 2233
APR 97
5962-E631-07
1. SCOPE
1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits in accordance with MIL-PRF-38534.
1.2 PIN. The PIN shall be as shown in the following example:
5962-89584
01
X
X
⏐
⏐
⏐
⏐
⏐
⏐
⏐
⏐
⏐
⏐
⏐
⏐
Drawing number
Device type
(see 1.2.1)
Case outline
(see 1.2.2)
Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
Circuit function
01
02
03
04
05
06
07
MN5210
MN5213
MN5211
MN5214
MN5212
MN5215
MN5216
A/D converter, high speed, 12-bit, 0 V to -10 V internal reference
A/D converter, high speed, 12-bit, 0 V to -10 V external reference
A/D converter, high speed, 12-bit, -5 V to +5 V internal reference
A/D converter, high speed, 12-bit, -5 V to +5 V external reference
A/D converter, high speed, 12-bit, -10 V to +10 V internal reference
A/D converter, high speed, 12-bit, -10 V to +10 V external reference
A/D converter, high speed, 12-bit, 0 V to +10 V internal reference
1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
X
Y
See figure 1
See figure 1
24
24
Dual-in-line package
Dual-in-line package
1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Positive supply voltage (VCC)..................................................
Negative supply voltage (VEE).................................................
Logic supply voltage (VLOG) ....................................................
Analog input voltage...............................................................
Digital input voltage ................................................................
Digital output voltage..............................................................
Reference input voltage (VREF)...............................................
Lead temperature (soldering, 60 seconds).............................
Junction temperature (TJ).......................................................
Thermal resistance:
+18 V dc
-18 V dc
+7 V dc
±25 V dc
+5.5 V dc
+VLOG
0 to -15 V dc (Ext. ref. only)
+300°C
+175°C
Junction-to-case (θJC).........................................................
Junction-to-ambient (θJA)....................................................
6°C/W
33°C/W
1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
SIZE
STANDARD
5962-89584
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
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D
2
DSCC FORM 2234
APR 97
1.4 Recommended operating conditions.
Positive supply voltage range (VCC)........................................
Negative supply voltage range (VEE) ......................................
Logic supply voltage range (VLOG) ..........................................
External reference (VREF):
+14.55 V dc to +15.45 V dc
-14.55 V dc to -15.45 V dc
+4.5 V dc to +5.5 V dc
Device types 02, 04, and 06...............................................
-10.0 V dc
Ambient operating temperature range (TA).............................
-55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the
Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
SIZE
STANDARD
5962-89584
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
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D
3
DSCC FORM 2234
APR 97
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements shall be in accordance with MIL-PRF-38534 and as
specified herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Logic diagram(s). The logic diagram(s) shall be as specified on figure 3.
3.2.4 Timing diagram. The timing table shall be as specified on figure 4.
3.2.5 Digital output codes. The digital output codes shall be as specified on figure 5.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
SIZE
STANDARD
5962-89584
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
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D
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
ICC
Conditions 1/
Group A
subgroups
Device
type
Limits
Max
Unit
-55°C ≤ T ≤+125°C
C
Min
3
unless otherwise specified
Power supply current
from VCC
VCC = 15.45 V, VIN (analog) = max
positive input voltage +0.5 V,
output code = 0000 0000 0000
1,2,3
1,2,3
1,2,3
1,2,3
All
28
28
mA
VCC = 15.45 V, VIN (analog) = max
negative input voltage -0.5 V,
output code = 1111 1111 1111
3
-1
-1
1
Power supply current
from VEE
IEE
VEE = -15.45 V, VIN (analog) = max
positive input voltage +0.5 V,
output code = 0000 0000 0000
01,03,
05,07
-25
-25
42
mA
mA
mA
V
EE = -15.45 V, VIN (analog) = max
negative input voltage -0.5 V,
output code = 1111 1111 1111
02,04,
06
Power supply current
from VLOG
ILOG
VLOG = 5.5 V, VIN (analog) = max
positive input voltage +0.5 V,
output code = 0000 0000 0000
All
V
LOG = 5.5 V, VIN (analog) = max
negative input voltage -0.5 V,
output code = 1111 1111 1111
1
42
Reference input
IREF
VREF = -10 V, VIN (analog) = max
positive input voltage +0.5 V
02,04,
06
-0.1
-0.1
-2
-2
VREF = -10 V, VIN (analog) = max
negative input voltage -0.5 V
Power dissipation
Input low current
Input high current
PD
IIL
1,2,3
1,2,3
1,2,3
All
All
All
915
-0.4
40
mW
mA
μA
VIN (Logic) = 0.3 V
VIN (Logic) = 2.4 V
VIN (Logic) = 5.5 V
-0.05
IIH
0
0
1
mA
mA
Output short circuit 2/
IOS
VIN (Logic) = max negative input
voltage -0.5 V, output code =
1111 1111 1111, (test one output
at a time)
1,2,3
All
-4
-35
Output logic voltage
levels
VOH
VOL
SO
1,2,3
4,5,6
All
All
2.4
V
IL = -80 μA
IL = 3.2 mA
0.3
Serial/parallel 2/
Set VIN for output code = 1000
0000 0000, serial output code
exactly equals parallel output code
PASS/FAIL
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-89584
A
REVISION LEVEL
SHEET
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D
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
Group A
subgroups
Device
type
Limits
Unit
-55°C ≤ T ≤+125°C
C
Min
Max
unless otherwise specified
Bit transition linearity
error (end-point) 3/
TLE
4,5,6
4,5,6
All
All
-0.50
-0.9
+0.50
LSB
ΔVCC (max) = ΔVEE (max) = ±.015,
abbreviated test
Major carry errors
MCE
+1.5
LSB
ΔVCC (max) = ΔVEE (max) = ±.015,
800-7FF (HEX) to 002-001 (HEX)
7FF-&FE (HEX) to 001-000 (HEX)
-0.9
+1.5
Power supply
sensitivity to VCC
+PSS1
-PSS1
+PSS2
TLE
VCC = +14.55 V, +15.45 V, output
transition = 0000 0000 000∗ 4/
4,5,6
4,5,6
4,5,6
4,5,6
All
All
All
All
-0.02
+0.02
%FSR/%
VS
Power supply
sensitivity to VEE
VEE = -14.55 V, -15.45 V, output
transition = 0000 0000 000∗ 4/
-0.05
-1
+0.05
+1
%FSR/%
VS
Power supply
sensitivity to VLOG
VLOG = +4.5 V, +5.5 V, output
transition = 0000 0000 000∗ 4/
%FSR/%
VS
Bit transition linearity
error (end-point)
-0.75
+0.75
13
LSB
ΔVCC (max) = ΔVEE (max) = ±.015,
all codes test
Conversion time
Clock input 2/
tC
5/
9,10,11
9,10,11
All
All
μs
tPWH
tPWL
Logic 1 = 2.4 V
Logic 0 = 0.3 V
175
125
ns
1/ Unless otherwise specified VCC = +15 V dc ±5 percent, VEE = -15 V dc ±5 percent, and VLOG = +5 V dc ±10 percent.
2/ Guaranteed by design, but not tested.
3/ The abbreviated bit transition linearity error test shown for subgroups 4, 5, and 6 shall represent the minimum number of
tests required. The manufacturer shall add additional tests and/or calculations to assure that the worst positive and
negative error values, as determined by the abbreviated test, are within 150 milli LSB, of the worst positive and negative
values, as determined by the all codes test for subgroups 7 and 8.
4/ ∗ represents the transition point between two adjacent code-words ( i.e.: 0000 0000 0000 and 0000 0000 0001 or 0111 1111
1111 and 1000 0000 0000 ).
5/ The listed conversion time is for test purposes and is based on a maximum clock frequency of 923 kHz.
SIZE
STANDARD
5962-89584
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
D
6
DSCC FORM 2234
APR 97
Case outline X.
Symbol
Millimeters
Inches
Max
Min
Max
4.65
Min
A
A1
b
.183
.068
.019
.052
.012
1.270
1.105
.620
1.22
0.381
1.22
1.73
.048
.015
0.483
1.32
b1
c
.048
0.203
31.24
27.81
0.305
32.26
28.07
15.75
.008
D
1.230
1.095
D
1
E
e
eA
L
2.54 BSC
.100 BSC
15.11
5.08
1.65
15.37
5.84
2.03
.595
.200
.065
.605
.230
.080
S
NOTES:
1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound
units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the
inch-pound units shall take precedence.
FIGURE 1. Case outline(s).
SIZE
STANDARD
5962-89584
A
MICROCIRCUIT DRAWING
REVISION LEVEL
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7
DSCC FORM 2234
APR 97
Case outline Y.
Symbol
Millimeters
Inches
Min
Min
Max
4.32
0.89
0.51
Max
.170
.035
.020
A
A1
b
3.05
0.38
.120
.015
.016
.035
.009
1.275
1.095
.770
0.41
b1
c
0.89
0.23
0.30
33.40
28.07
20.57
.012
1.315
1.105
.810
D
32.38
27.81
19.56
D1
E
e
2.54 BSC
.100 BSC
eA
L
15.11
5.08
2.20
15.37
5.84
2.92
.595
.200
.087
.605
.230
.115
S
NOTES:
1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound
units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the
inch-pound units shall take precedence.
FIGURE 1. Case outline - Continued.
SIZE
STANDARD
5962-89584
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
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8
DSCC FORM 2234
APR 97
Device types
Case outlines
All
X and Y
Terminal number
Terminal symbol
1
2
Start convert
VLOG
3
Serial output
Bit 6
4
5
Bit 5
6
Bit 4
7
Bit 3
8
Bit 2
9
Bit 1 (MSB)
No connection
Ground (see note 1)
VREF (see note 2)
VEE
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
Analog input
VCC
Bit 12 (LSB)
Bit 11
Bit 10
Bit 9
Bit 8
Bit 7
Status (E.O.C)
Ground (see note 1)
Clock input
NOTES:
1. The units two ground pins (pins 11 and 23) must be connected together as close to the package as possible, and
preferably should be connected to a large analog ground plane underneath the package. If these commons must be run
separately, a non-polarized 0.01μF bypass capacitor should be connected between pins 11 and 23 as close to the unit
as possible and wide conductor runs should be employed.
2. For device types 02, 04, 06, a -10 V external reference is applied to pin 12. No other connection shall be made to pin
12. For device types 01, 03, 05, and 07 terminal is reference output of -6.3 V.
FIGURE 2. Terminal connections.
SIZE
STANDARD
5962-89584
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MICROCIRCUIT DRAWING
REVISION LEVEL
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DEFENSE SUPPLY CENTER COLUMBUS
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DSCC FORM 2234
APR 97
FIGURE 3. Logic diagram.
SIZE
STANDARD
MICROCIRCUIT DRAWING
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DSCC FORM 2234
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NOTES:
1. Operation shown is for the digital word 1101 0011 0101 which corresponds to 1.7432 V on the 0 to +10 V input
range, Device type 07.
2. Conversion time is defined as the width of the status (E.O.C.) pulse.
3. The converter is reset (MSB = "0", all other bits = "1") by holding the start convert low during a low to high clock
transition. The start convert must be low for a minimum of 25 ns prior to the clock transition. Holding the start low
will hold the converter in the reset state. Actual conversion will begin on the next rising clock edge after the start
has returned high.
4. The delay between the resetting clock edge and status actually rising to a "1" is 160 ns maximum.
5. The start convert may be brought low at any time during a conversion to reset and begin converting again.
6. Both serial and parallel data bits become valid on the same rising clock edges. Serial data is valid on
subsequent falling clock edges, and these edges can be used to clock serial data into receiving registers.
7. Output data will be valid 30 ns (maximum) after the status (E.O.C.) output has returned low. Parallel output data
will remain valid and the status output low until another conversion is initiated.
8. For continuous conversion, connect the status output (pin 22) to the start convert input (pin 1).
9. When the converter is initially “powered up” it may come on at any point in the conversion cycle.
FIGURE 4. Timing diagram.
SIZE
STANDARD
5962-89584
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DSCC FORM 2234
APR 97
Analog input
Digital output
(MSB) (LSB)
Device types
01 and 02
Device types
Device types
05 and 06
Device type 07
03 and 04
0.0000 V
0.0024 V
+5.0000 V
+4.9976 V
+10.0000 V
+9.9951 V
+10.0000 V
+9.9976 V
0000 0000 0000
0000 0000 000∗ See Note
-4.9976 V
-5.0000 V
-5.0024 V
+0.0024 V
0.0000 V
-0.0024 V
+0.0049 V
0.0000 V
-0.0049 V
+5.0024 V
+5.0000 V
+4.9976 V
0111 1111 111∗ See Note
∗∗∗∗ ∗∗∗∗ ∗∗∗∗ See Note
1000 0000 000∗ See Note
-9.9976 V
-4.9976 V
-5.0000 V
-9.9951 V
+0.0024 V
0.0000 V
1111 1111 111∗ See Note
1111 1111 1111
-10.0000 V
-10.0000 V
NOTE: Voltages given are the theorectical values for the transitions indicated. Ideally with the
converter continously converting, the output bits indicated as ∗ will change "1" to "0" or
"0" to "1" as the input voltage passes through the level indicated.
FIGURE 5. Digital output codes.
SIZE
STANDARD
MICROCIRCUIT DRAWING
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REVISION LEVEL
SHEET
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COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A
test table)
Interim electrical parameters
Final electrical parameters
Group A test requirements
1,4
1*,2,3,4,5,6,7,8,9,10,11
1,2,3,4,5,6,7,8,9,10,11
Group C end-point electrical
parameters
1,2,3
End-point electrical parameters
for Radiation Hardness Assurance
(RHA) devices
Not applicable
* PDA applies to subgroup 1.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in test method 1015 of MIL-STD-883.
(2)
T as specified in accordance with table I of method 1015 of MIL-STD-883.
A
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a. Tests shall be as specified in table II herein.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
SIZE
STANDARD
5962-89584
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MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
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13
DSCC FORM 2234
APR 97
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in test method 1005 of MIL-STD-883.
(2)
T as specified in accordance with table I of method 1005 of MIL-STD-883.
A
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF-
38534.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used
for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962)
should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614)
692-1081.
6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103
and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing.
SIZE
STANDARD
5962-89584
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
D
14
DSCC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 07-08-29
Approved sources of supply for SMD 5962-89584 are listed below for immediate acquisition information only and shall
be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next
dated revisions of MIL-HDBK-103 and QML-38534.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8958401XA
5962-8958401YA
3/
3/
MN5210H/B
MN5210H/B
5962-8958402XA
5962-8958402YA
5962-8958402YC
3/
50507
50507
MN5213H/B
MN5213MYA
MN5213MYC
5962-8958403XA
5962-8958403XC
5962-8958403YA
5962-8958403YC
50507
50507
50507
50507
MN5211MXA
MN5211MXC
MN5211MYA
MN5211MYC
5962-8958404XA
5962-8958404YA
5962-8958404YC
3/
50507
50507
MN5214H/B
MN5214MYA
MN5214MYC
5962-8958405XA
5962-8958405XC
5962-8958405YA
5962-8958405YC
50507
50507
50507
50507
MN5212MXA
MN5212MXC
MN5212MYA
MN5212MYC
5962-8958406XA
5962-8958406XC
5962-8958406YA
5962-8958406YC
50507
50507
50507
50507
MN5215MXA
MN5215MXC
MN5215MYA
MN5215MYC
5962-8958407XA
5962-8958407XC
5962-8958407YA
5962-8958407YC
50507
50507
50507
50507
MN5216MXA
MN5216MXC
MN5216MYA
MN5216MYC
1/ The lead finish shown for each PIN representing a hermetic
package is the most readily available from the manufacturer
listed for that part. If the desired lead finish is not listed contact
the Vendor to determine its availability.
2/ Caution. Do not use this number for item acquisition. Items acquired
to this number may not satisfy the performance requirements of this drawing.
3/ This device is no longer available.
Vendor CAGE
number
Vendor name
and address
50507
Micro Networks Corporation
324 Clark Street
Worcester, MA 01602
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
相关型号：
5962-8958407YC
ADC, Successive Approximation, 12-Bit, 1 Func, 1 Channel, Serial, Parallel, Word Access, Hybrid, DIP-24
APITECH
5962-8958701XX
IC VREG 5 V FIXED POSITIVE LDO REGULATOR, 1 V DROPOUT, CDSO16, CERAMIC, SMT-16, Fixed Positive Single Output LDO Regulator
WEDC
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