AT28BV16-30SI [ATMEL]

16K 2K x 8 Battery-Voltage CMOS E2PROM; 16K 2K ×8的电池电压CMOS E2PROM
AT28BV16-30SI
型号: AT28BV16-30SI
厂家: ATMEL    ATMEL
描述:

16K 2K x 8 Battery-Voltage CMOS E2PROM
16K 2K ×8的电池电压CMOS E2PROM

电池 可编程只读存储器
文件: 总8页 (文件大小:401K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AT28BV16  
Features  
2.7 to 3.6V Supply  
Full Read and Write Operation  
Low Power Dissipation  
8 mA Active Current  
50 µA CMOS Standby Current  
Read Access Time - 250 ns  
Byte Write - 3 ms  
Direct Microprocessor Control  
DATA Polling  
READ/BUSY Open Drain Output on TSOP  
High Reliability CMOS Technology  
Endurance: 100,000 Cycles  
16K (2K x 8)  
Battery-Voltage  
CMOS  
Data Retention: 10 Years  
Low Voltage CMOS Compatible Inputs and Outputs  
JEDEC Approved Byte Wide Pinout  
Commercial and Industrial Temperature Ranges  
E2PROM  
Description  
The AT28BV16 is a low-power, high-performance Electrically Erasable and Program-  
mable Read Only Memory with easy to use features. The AT28BV16 is a 16K mem-  
ory organized as 2,048 words by 8 bits. The device is manufactured with Atmel’s  
reliable nonvolatile CMOS technology.  
The AT28BV16 is accessed like a static RAM for the read or write cycles without the  
need of external components. During a byte write, the address and data are latched  
(continued)  
Pin Configurations  
Pin Name  
A0 - A10  
CE  
Function  
TSOP  
Top View  
Addresses  
Chip Enable  
Output Enable  
Write Enable  
Data Inputs/Outputs  
No Connect  
AT28BV16  
OE  
WE  
I/O0 - I/O7  
NC  
DC  
Don’t Connect  
PLCC  
Top View  
PDIP, SOIC  
Top View  
0308A  
2-119  
Description (Continued)  
internally, freeing the microprocessor address and data  
bus for other operations. Following the initiation of a write  
cycle, the device will go to a busy state and automatically  
clear and write the latched data using an internal control  
timer. The end of a write cycle can be determined by  
The CMOS technology offers fast access times of 250 ns  
at low power dissipation. When the chip is deselected the  
standby current is less than 50 µA.  
Atmel’s 28BV16 has additional features to ensure high  
quality and manufacturability. The device utilizes error cor-  
rection internally for extended endurance and for im-  
proved data retention characteristics. An extra 32-bytes of  
DATA polling of I/O Once the end of a write cycle has  
7.  
been detected, a new access for a read or a write can  
begin.  
2
E PROM are available for device identification or tracking.  
Block Diagram  
Absolute Maximum Ratings*  
*NOTICE: Stresses beyond those listed under “Absolute Maxi-  
mum Ratings” may cause permanent damage to the device.  
This is a stress rating only and functional operation of the  
device at these or any other conditions beyond those indi-  
cated in the operational sections of this specification is not  
implied. Exposure to absolute maximum rating conditions  
for extended periods may affect device reliability.  
Temperature Under Bias................. -55°C to +125°C  
Storage Temperature...................... -65°C to +150°C  
All Input Voltages  
(including NC Pins)  
with Respect to Ground ................... -0.6V to +6.25V  
All Output Voltages  
with Respect to Ground .............-0.6V to V + 0.6V  
CC  
Voltage on OE and A9  
with Respect to Ground ................... -0.6V to +13.5V  
2-120  
AT28BV16  
AT28BV16  
Device Operation  
READ: The AT28BV16 is accessed like a Static RAM.  
When CE and OE are low and WE is high, the data stored  
at the memory location determined by the address pins is  
asserted on the outputs. The outputs are put in a high im-  
pedance state whenever CE or OE is high. This dual line  
control gives designers increased flexibility in preventing  
bus contention.  
READY/BUSY (TSOP only): READY/BUSY is an open  
drain output; it is pulled low during the internal write cycle  
and released at the completion of the write cycle.  
WRITE PROTECTION: Inadvertent writes to the device  
are protected against in the following ways. (a) Vcc  
sense— if Vcc is below 2.0V (typical) the write function is  
inhibited. (b) Vcc power on delay— once Vcc has reached  
2.0V the device will automatically time out 5 ms (typical)  
before allowing a byte write. (c) Write Inhibit— holding any  
one of OE low, CE high or WE high inhibits byte write cy-  
cles.  
BYTE WRITE: Writing data into the AT28BV16 is similar  
to writing into a Static RAM. A low pulse on the WE or CE  
input with OE high and CE or WE low (respectively) initi-  
ates a byte write. The address location is latched on the  
last falling edge of WE (or CE); the new data is latched on  
the first rising edge. Internally, the device performs a self-  
clear before write. Once a byte write has been started, it  
will automatically time itself to completion. Once a pro-  
gramming operation has been initiated and for the dura-  
DEVICE IDENTIFICATION: An extra 32-bytes of  
2
E PROM memory are available to the user for device  
identification. By raising A9 to 12 ± 0.5V and using ad-  
dress locations 7E0H to 7FFH the additional bytes may be  
written to or read from in the same manner as the regular  
memory array.  
tion of t , a read operation will effectively be a polling  
WC  
operation.  
DATA POLLING: The AT28BV16 provides DATA  
POLLING to signal the completion of a write cycle. During  
a write cycle, an attempted read of the data being written  
results in the complement of that data for I/O (the other  
7
outputs are indeterminate). When the write cycle is fin-  
ished, true data appears on all outputs.  
2-121  
DC and AC Operating Range  
AT28BV16-25  
0°C - 70°C  
AT28BV16-30  
0°C - 70°C  
Com.  
Ind.  
Operating  
Temperature (Case)  
-40°C - 85°C  
2.7V to 3.6V  
-40°C - 85°C  
2.7V to 3.6V  
V
Power Supply  
CC  
Operating Modes  
Mode  
CE  
OE  
WE  
I/O  
Read  
V
V
V
V
D
D
IL  
IL  
IH  
IL  
IH  
OUT  
IN  
(2)  
Write  
V
V
IH  
IL  
(1)  
Standby/Write Inhibit  
Write Inhibit  
V
X
X
High Z  
X
X
V
IH  
Write Inhibit  
X
X
V
X
IL  
Output Disable  
V
X
High Z  
IH  
Notes: 1. X can be VIL or VIH.  
2. Refer to AC Programming Waveforms.  
DC Characteristics  
Symbol  
Parameter  
Condition  
Min  
Max Units  
I
I
I
I
Input Load Current  
Output Leakage Current  
V
V
= 0V to V + 1.0V  
5
µA  
µA  
µA  
mA  
V
LI  
IN  
CC  
= 0V to V  
CC  
5
50  
8
LO  
SB  
CC  
I/O  
V
V
Standby Current CMOS  
Active Current AC  
CE = V - 0.3V to V + 1.0V  
CC CC  
CC  
CC  
f = 5 MHz; I  
= 0 mA; CE = V  
OUT  
IL  
V
V
Input Low Voltage  
Input High Voltage  
0.6  
IL  
2.0  
2.0  
V
IH  
I
I
I
= 1 mA  
0.3  
0.3  
V
OL  
OL  
OH  
V
V
Output Low Voltage  
Output High Voltage  
OL  
= 2 mA for RDY/BUSY  
V
= -100 µA  
V
OH  
2-122  
AT28BV16  
AT28BV16  
AC Read Characteristics  
AT28BV16-25  
AT28BV16-30  
Min  
Max  
Min  
Max  
300  
300  
100  
55  
Symbol  
Parameter  
Units  
ns  
t
t
t
t
Address to Output Delay  
CE to Output Delay  
OE to Output Delay  
CE or OE High to Output Float  
250  
250  
100  
55  
ACC  
(1)  
ns  
CE  
OE  
DF  
(2)  
ns  
(3, 4)  
0
0
0
0
ns  
Output Hold from OE, CE or  
Address, whichever occurred first  
t
ns  
OH  
AC Read Waveforms (1, 2, 3, 4)  
Notes: 1. CE may be delayed up to tACC - tCE after the address  
3. tDF is specified from OE or CE whichever occurs first  
(CL = 5 pF).  
transition without impact on tACC  
.
2. OE may be delayed up to tCE - tOE after the falling  
edge of CE without impact on tCE or by tACC - tOE  
4. This parameter is characterized and is not 100% tested.  
after an address change without impact on tACC  
.
Input Test Waveforms and  
Measurement Level  
Output Test Load  
t , t < 20 ns  
R
F
Pin Capacitance (f = 1 MHz, T = 25°C) (1)  
Typ  
Max  
6
Units  
pF  
Conditions  
C
C
4
8
V
V
= 0V  
IN  
IN  
12  
pF  
= 0V  
OUT  
OUT  
Note: 1. This parameter is characterized and is not 100% tested.  
2-123  
AC Write Characteristics  
Symbol  
Parameter  
Min  
10  
Max  
Units  
ns  
t
t
t
t
t
t
t
t
, t  
Address, OE Set-up Time  
Address Hold Time  
AS OES  
100  
150  
100  
10  
ns  
AH  
WP  
DS  
Write Pulse Width (WE or CE)  
Data Set-up Time  
1000  
ns  
ns  
, t  
Data, OE Hold Time  
ns  
DH OEH  
, t  
CS CH  
CE to WE and WE to CE Set-up and Hold Time  
Write Cycle Time  
0
ns  
3.0  
50  
ms  
ns  
WC  
DB  
Time to Device Busy  
AC Write Waveforms  
WE Controlled  
CE Controlled  
2-124  
AT28BV16  
AT28BV16  
Data Polling Characteristics (1)  
Symbol  
Parameter  
Min  
10  
Typ  
Max  
Units  
ns  
t
t
t
t
Data Hold Time  
OE Hold Time  
OE to Output Delay  
DH  
10  
ns  
OEH  
OE  
(2)  
ns  
Write Recovery Time  
0
ns  
WR  
Notes: 1. These parameters are characterized and not 100% tested.  
2. See AC Characteristics.  
Data Polling Waveforms  
2-125  
Ordering Information (1)  
t
I
(mA)  
ACC  
CC  
Ordering Code  
Package  
Operation Range  
Active Standby  
(ns)  
250  
8
8
8
8
0.05  
0.05  
0.05  
0.05  
AT28BV16-25TC  
AT28BV16-25JC  
AT28BV16-25PC  
AT28BV16-25SC  
28T  
32J  
24P6  
24S  
Commercial  
(0°C to 70°C)  
AT28BV16-25TI  
AT28BV16-25JI  
AT28BV16-25PI  
AT28BV16-25SI  
28T  
32J  
24P6  
24S  
Industrial  
(-40°C to 85°C)  
300  
AT28BV16-30TC  
AT28BV16-30JC  
AT28BV16-30PC  
AT28BV16-30SC  
28T  
32J  
24P6  
24S  
Commercial  
(0°C to 70°C)  
AT28BV16-30TI  
AT28BV16-30JI  
AT28BV16-30PI  
AT28BV16-30SI  
28T  
32J  
24P6  
24S  
Industrial  
(-40°C to 85°C)  
Note: 1. See Valid Part Number table below.  
Valid Part Numbers  
The following table lists standard Atmel products that can be ordered.  
Device Numbers  
AT28BV16  
Speed  
Package and Temperature Combinations  
JC, JI, PC, PI, SC, SI, TC, TI  
25  
30  
AT28BV16  
JC, JI, PC, PI, SC, SI, TC, TI  
Package Type  
28T  
32J  
28 Lead, Plastic Thin Small Outline Package (TSOP)  
32 Lead, Plastic J-Leaded Chip Carrier (PLCC)  
24P6  
24S  
24 Lead, 0.600" Wide, Plastic Dual Inline Package (PDIP)  
24 Lead, 0.300" Wide, Plastic Gull Wing Small Outline (SOIC)  
2-126  
AT28BV16  

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