AT28LV010-20TU [ATMEL]
1-Megabit (128K x 8) Low Voltage Paged Parallel EEPROMs; 1兆位（ 128K ×8 ）低电压分页并行的EEPROM
| 型号： | AT28LV010-20TU |
| 厂家： | 
ATMEL |
| 描述： | 1-Megabit (128K x 8) Low Voltage Paged Parallel EEPROMs |
| 文件： | 总15页 (文件大小：340K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Features
•
•
•
Single 3.3V 10% Supply
Fast Read Access Time – 200 ns
Automatic Page Write Operation
– Internal Address and Data Latches for 128 Bytes
– Internal Control Timer
•
•
Fast Write Cycle Time
– Page Write Cycle Time – 10 ms Maximum
– 1 to 128-Byte Page Write Operation
Low Power Dissipation
1-Megabit
(128K x 8)
Low Voltage
Paged Parallel
EEPROMs
– 15 mA Active Current
– 20 µA CMOS Standby Current
Hardware and Software Data Protection
DATA Polling for End of Write Detection
High Reliability CMOS Technology
– Endurance: 105 Cycles
•
•
•
– Data Retention: 10 Years
•
•
•
JEDEC Approved Byte-Wide Pinout
Industrial and Automotive Temperature Ranges
Green (Pb/Halide-free) Packaging Option
AT28LV010
1. Description
The AT28LV010 is a high-performance 3-volt only Electrically Erasable and Program-
mable Read-Only Memory. Its 1 megabit of memory is organized as 131,072 words by
8 bits. Manufactured with Atmel’s advanced nonvolatile CMOS technology, the device
offers access times to 200 ns with power dissipation of just 54 mW. When the device
is deselected, the CMOS standby current is less than 20 µA.
The AT28LV010 is accessed like a Static RAM for the read or write cycle without the
need for external components. The device contains a 128-byte page register to allow
writing of up to 128 bytes simultaneously. During a write cycle, the address and 1 to
128 bytes of data are internally latched, freeing the address and data bus for other
operations. Following the initiation of a write cycle, the device will automatically write
the latched data using an internal control timer. The end of a write cycle can be
detected by DATA polling of I/O7. Once the end of a write cycle has been detected a
new access for a read or write can begin.
Atmel’s 28LV010 has additional features to ensure high quality and manufacturability.
The device utilizes internal error correction for extended endurance and improved
data retention characteristics. Software data protection is implemented to guard
against inadvertent writes. The device also includes an extra 128 bytes of EEPROM
for device identification or tracking.
0395D–PEEPR–10/06
AT28LV010
2.2
32-lead PDIP Top View
2. Pin Configurations
Pin Name
A0 - A16
CE
Function
NC
A16
A15
A12
A7
1
2
3
4
5
6
7
8
9
32 VCC
Addresses
31 WE
30 NC
29 A14
28 A13
27 A8
Chip Enable
Output Enable
Write Enable
Data Inputs/Outputs
No Connect
OE
WE
A6
I/O0 - I/O7
NC
A5
26 A9
A4
25 A11
24 OE
23 A10
22 CE
21 I/O7
20 I/O6
19 I/O5
18 I/O4
17 I/O3
A3
DC
Don’t Connect
A2 10
A1 11
A0 12
I/O0 13
I/O1 14
I/O2 15
GND 16
2.3
32-lead TSOP Top View
2.1
32-lead PLCC Top View
A11
1
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
OE
A9
A8
2
A10
CE
3
A7
A6
A5
A4
A3
5
6
7
8
9
29 A14
A13
A14
NC
WE
VCC
NC
A16
A15
A12
A7
4
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
5
28 A13
27 A8
26 A9
25 A11
24 OE
23 A10
22 CE
21 I/O7
6
7
8
9
A2 10
A1 11
A0 12
10
11
12
13
14
15
16
I/O0 13
A6
A1
A5
A2
A4
A3
2
0395D–PEEPR–10/06
AT28LV010
3. Block Diagram
4. Device Operation
4.1
Read
The AT28LV010 is accessed like a Static RAM. When CE and OE are low and WE is high, the
data stored at the memory location determined by the address pins is asserted on the outputs.
The outputs are put in the high impedance state when either CE or OE is high. This dual-line
control gives designers flexibility in preventing bus contention in their system.
4.2
Write
The write operation of the AT28LV010 allows 1 to 128 bytes of data to be written into the
device during a single internal programming period. Each write operation must be preceded by
the software data protection (SDP) command sequence. This sequence is a series of three
unique write command operations that enable the internal write circuitry. The command
sequence and the data to be written must conform to the software protected write cycle timing.
Addresses are latched on the falling edge of WE or CE, whichever occurs last and data is
latched on the rising edge of WE or CE, whichever occurs first. Each successive byte must be
written within 150 µs (tBLC) of the previous byte. If the tBLC limit is exceeded the AT28LV010
will cease accepting data and commence the internal programming operation. If more than
one data byte is to be written during a single programming operation, they must reside on the
same page as defined by the state of the A7 - A16 inputs. For each WE high to low transition
during the page write operation, A7 - A16 must be the same.
The A0 to A6 inputs are used to specify which bytes within the page are to be written. The
bytes may be loaded in any order and may be altered within the same load period. Only bytes
which are specified for writing will be written; unnecessary cycling of other bytes within the
page does not occur.
3
0395D–PEEPR–10/06
4.3
4.4
DATA Polling
Toggle Bit
The AT28LV010 features DATA Polling to indicate the end of a write cycle. During a byte or
page write cycle an attempted read of the last byte written will result in the complement of the
written data to be presented on I/O7. Once the write cycle has been completed, true data is
valid on all outputs, and the next write cycle may begin. DATA Polling may begin at anytime
during the write cycle.
In addition to DATA Polling the AT28LV010 provides another method for determining the end
of a write cycle. During the write operation, successive attempts to read data from the device
will result in I/O6 toggling between one and zero. Once the write has completed, I/O6 will stop
toggling and valid data will be read. Reading the toggle bit may begin at any time during the
write cycle.
4.5
Data Protection
If precautions are not taken, inadvertent writes may occur during transitions of the host system
power supply. Atmel® has incorporated both hardware and software features that will protect
the memory against inadvertent writes.
4.5.1
Hardware Protection
Hardware features protect against inadvertent writes to the AT28LV010 in the following ways:
(a) VCC power-on delay – once VCC has reached 2.0V (typical) the device will automatically
time out 5 ms (typical) before allowing a write; (b) write inhibit – holding any one of OE low, CE
high or WE high inhibits write cycles; and (c) noise filter – pulses of less than 15 ns (typical) on
the WE or CE inputs will not initiate a write cycle.
4.5.2
Software Data Protection
The AT28LV010 incorporates the industry standard software data protection (SDP) function.
Unlike standard 5-volt only EEPROM’s, the AT28LV010 has SDP enabled at all times. There-
fore, all write operations must be preceded by the SDP command sequence.
The data in the 3-byte command sequence is not written to the device; the addresses in the
command sequence can be utilized just like any other location in the device. Any attempt to
write to the device without the 3-byte sequence will start the internal timers. No data will be
written to the device. However, for the duration of tWC, read operations will effectively be poll-
ing operations.
4
AT28LV010
0395D–PEEPR–10/06
AT28LV010
5. DC and AC Operating Range
AT28LV010-20
AT28LV010-25
Operating
Temperature (Case)
Ind.
-40°C - 85°C
-40°C - 85°C
3.3V 10%
Automotive
-40°C - 125°C
3.3V 5%
V
CC Power Supply
6. Operating Modes
Mode
CE
OE
VIL
VIH
X(1)
X
WE
VIH
VIL
X
I/O
DOUT
DIN
Read
VIL
VIL
VIH
X
Write(2)
Standby/Write Inhibit
Write Inhibit
Write Inhibit
High Z
VIH
X
X
VIL
VIH
Output Disable
X
X
High Z
Notes: 1. X can be VIL or VIH.
2. Refer to AC Programming Waveforms.
7. Absolute Maximum Ratings*
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
Temperature Under Bias................................ -55°C to +125°C
Storage Temperature..................................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground.............................-0.6V to VCC + 0.6V
Voltage on OE and A9
with Respect to Ground...................................-0.6V to +13.5V
8. DC Characteristics
Symbol
Parameter
Condition
Min
Max
1
Units
µA
µA
µA
mA
V
ILI
Input Load Current
Output Leakage Current
VCC Standby Current CMOS
VCC Active Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
VIN = 0V to VCC
VI/O = 0V to VCC
ILO
1
ISB
CE = VCC - 0.3V to VCC + 1V
Ind.
50
15
0.8
ICC
f = 5 MHz; IOUT = 0 mA; VCC = 3.6V
VIL
VIH
2.0
2.4
V
VOL
VOH
IOL = 1.6 mA; VCC = 3.0V
0.45
V
IOH = -100 µA; VCC = 3.0V
V
5
0395D–PEEPR–10/06
9. AC Read Characteristics
AT28LV010-20
Symbol
Parameter
Min
Max
Units
ns
tACC
Address to Output Delay
200
200
80
(1)
tCE
CE to Output Delay
ns
(2)
tOE
OE to Output Delay
0
0
0
ns
(3)(4)
tDF
CE or OE to Output Float
Output Hold from OE, CE or Address, Whichever Occurred First
55
ns
tOH
ns
10. AC Read Waveforms(1)(2)(3)(4)
Notes: 1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC
.
.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
6
AT28LV010
0395D–PEEPR–10/06
AT28LV010
11. Input Test Waveforms and Measurement Level
tR, tF < 5 ns
12. Output Test Load
13. Pin Capacitance
f = 1 MHz, T = 25°C(1)
Symbol
CIN
Typ
4
Max
6
Units
pF
Conditions
VIN = 0V
COUT
8
12
pF
VOUT = 0V
Note:
1. This parameter is characterized and is not 100% tested.
7
0395D–PEEPR–10/06
14. AC Write Characteristics(1)
Symbol
Parameter
Min
0
Max
Units
ns
t
AS, tOES
Address, OE Set-up Time
Address Hold Time
tAH
tCS
tCH
tWP
tDS
100
0
ns
Chip Select Set-up Time
Chip Select Hold Time
Write Pulse Width (WE or CE)
Data Set-up Time
ns
0
ns
200
100
10
ns
ns
t
DH, tOEH
Data, OE Hold Time
ns
Note:
1. All write operations must be preceded by the SDP command sequence.
15. AC Write Waveforms
15.1 WE Controlled
15.2 CE Controlled
8
AT28LV010
0395D–PEEPR–10/06
AT28LV010
16. Software Protected Write Characteristics
Symbol
Parameter
Min
Max
Units
ms
ns
tWC
Write Cycle Time
Address Set-up Time
Address Hold Time
Data Set-up Time
Data Hold Time
10
tAS
0
tAH
100
100
10
ns
tDS
ns
tDH
ns
tWP
Write Pulse Width
Byte Load Cycle Time
Write Pulse Width High
200
ns
tBLC
tWPH
150
µs
100
ns
17. Programming Algorithm
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA A0
TO
ADDRESS 5555
WRITES ENABLED(2)
LOAD DATA XX
TO
ANY ADDRESS(3)
LOAD LAST BYTE
TO
LAST ADDRESS(3)
ENTER DATA
PROTECT STATE
Notes: 1. Data Format: I/O7 - I/O0 (Hex); Address Format: A14 - A0 (Hex).
2. Data protect state will be re-activated at the end of program cycle.
3. 1 to 128 bytes of data are loaded.
18. Software Protected Program Cycle Waveforms(1)(2)(3)
Notes: 1. A0 - A14 must conform to the addressing sequence for the first three bytes as shown above.
2. After the command sequence has been issued and a page write operation follows, the page address inputs (A7 - A16) must
be the same for each high to low transition of WE (or CE).
3. OE must be high only when WE and CE are both low.
9
0395D–PEEPR–10/06
19. Data Polling Characteristics(1)
Symbol
Parameter
Min
10
Typ
Max
Units
ns
tDH
Data Hold Time
tOEH
tOE
OE Hold Time
10
ns
OE to Output Delay(2)
Write Recovery Time
ns
tWR
0
ns
Notes: 1. These parameters are characterized and not 100% tested.
2. See AC Read Characteristics
20. Data Polling Waveforms
21. Toggle Bit Characteristics(1)
Symbol
Parameter
Min
10
Typ
Max
Units
ns
tDH
Data Hold Time
tOEH
tOE
tOEHP
tWR
OE Hold Time
10
ns
OE to Output Delay(2)
OE High Pulse
ns
150
0
ns
Write Recovery Time
ns
Notes: 1. These parameters are characterized and not 100% tested.
2. See AC Read Characteristics
22. Toggle Bit Waveforms
Notes: 1. Toggling either OE or CE or both OE and CE will operate toggle bit.
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
10
AT28LV010
0395D–PEEPR–10/06
AT28LV010
23. Ordering Information(1)
23.1 Standard Package
I
Active
15
CC (mA)
tACC
(ns)
Standby
Ordering Code
Package
Operation Range
200
250
0.05
0.05
AT28LV010-20JI
AT28LV010-20PI
AT28LV010-20TI
32J
Industrial
32P6
32T
(-40° to 85° C)
15
AT28LV010-25JI
AT28LV010-25PI
AT28LV010-25TI
32J
Industrial
32P6
32T
(-40° to 85° C)
Note:
1. See “Valid Part Numbers” below.
23.2 Green Package Option (Pb/Halide-free)
I
Active
15
CC (mA)
Standby
0.05
tACC
(ns)
Ordering Code
Package
Operation Range
200
AT28LV010-20JU
AT28LV010-20PU
AT28LV010-20TU
32J
Industrial
32P6
32T
(-40° to 85° C)
Package Type
32J
32-Lead, Plastic J-Leaded Chip Carrier (PLCC)
32P6
32T
32-Lead, 0.600” Wide, Plastic Dual Inline Package (PDIP)
32-Lead, Plastic Thin Small Outline Package (TSOP)
24. Valid Part Numbers
The following table lists standard Atmel products that can be ordered.
Device Numbers
AT28LV010
Speed
Package and Temperature Combinations
JI, JU, PI, TI, TU, PU
20
25. Die Products
Reference Section: Parallel EEPROM Die Products
11
0395D–PEEPR–10/06
26. Packaging Information
26.1 32J – PLCC
1.14(0.045) X 45˚
PIN NO. 1
IDENTIFIER
1.14(0.045) X 45˚
0.318(0.0125)
0.191(0.0075)
E2
E1
E
B1
B
e
A2
A1
D1
D
A
0.51(0.020)MAX
45˚ MAX (3X)
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
3.175
1.524
0.381
12.319
11.354
9.906
14.859
13.894
12.471
0.660
0.330
MAX
3.556
2.413
–
NOM
NOTE
SYMBOL
A
–
D2
A1
A2
D
–
–
–
12.573
D1
D2
E
–
11.506 Note 2
10.922
–
Notes:
1. This package conforms to JEDEC reference MS-016, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
–
15.113
E1
E2
B
–
14.046 Note 2
13.487
–
–
–
0.813
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
B1
e
0.533
1.270 TYP
10/04/01
TITLE
DRAWING NO.
REV.
2325 Orchard Parkway
San Jose, CA 95131
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC)
32J
B
R
12
AT28LV010
0395D–PEEPR–10/06
AT28LV010
26.2 32P6 – PDIP
D
PIN
1
E1
A
SEATING PLANE
A1
L
B
B1
e
E
COMMON DIMENSIONS
(Unit of Measure = mm)
0º ~ 15º REF
C
MIN
–
MAX
4.826
–
NOM
NOTE
SYMBOL
A
–
eB
A1
D
0.381
41.783
15.240
13.462
0.356
1.041
3.048
0.203
15.494
–
–
42.291 Note 1
15.875
E
–
E1
B
–
13.970 Note 1
0.559
–
B1
L
–
1.651
Note:
1. Dimensions D and E1 do not include mold Flash or Protrusion.
Mold Flash or Protrusion shall not exceed 0.25 mm (0.010").
–
3.556
C
–
–
0.381
eB
e
17.526
2.540 TYP
09/28/01
DRAWING NO. REV.
32P6
TITLE
2325 Orchard Parkway
San Jose, CA 95131
32P6, 32-lead (0.600"/15.24 mm Wide) Plastic Dual
Inline Package (PDIP)
B
R
13
0395D–PEEPR–10/06
26.3 32T – TSOP
PIN 1
0º ~ 8º
c
Pin 1 Identifier
D1
D
L
b
L1
e
A2
E
GAGE PLANE
A
SEATING PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
A1
MIN
–
MAX
1.20
0.15
1.05
20.20
NOM
–
NOTE
SYMBOL
A
A1
A2
D
0.05
0.95
19.80
18.30
7.90
0.50
–
1.00
Notes:
1. This package conforms to JEDEC reference MO-142, Variation BD.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
20.00
18.40
8.00
D1
E
18.50 Note 2
8.10
0.70
Note 2
L
0.60
L1
b
0.25 BASIC
0.22
0.17
0.10
0.27
0.21
c
–
e
0.50 BASIC
10/18/01
DRAWING NO. REV.
32T
TITLE
2325 Orchard Parkway
San Jose, CA 95131
32T, 32-lead (8 x 20 mm Package) Plastic Thin Small Outline
Package, Type I (TSOP)
B
R
14
AT28LV010
0395D–PEEPR–10/06
Atmel Corporation
Atmel Operations
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 487-2600
Memory
RF/Automotive
Theresienstrasse 2
Postfach 3535
74025 Heilbronn, Germany
Tel: (49) 71-31-67-0
Fax: (49) 71-31-67-2340
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 436-4314
Microcontrollers
Regional Headquarters
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 436-4314
1150 East Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906, USA
Tel: 1(719) 576-3300
Europe
Atmel Sarl
Route des Arsenaux 41
Case Postale 80
CH-1705 Fribourg
Switzerland
Tel: (41) 26-426-5555
Fax: (41) 26-426-5500
Fax: 1(719) 540-1759
Biometrics/Imaging/Hi-Rel MPU/
High-Speed Converters/RF Datacom
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Tel: (33) 2-40-18-18-18
Fax: (33) 2-40-18-19-60
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38521 Saint-Egreve Cedex, France
Tel: (33) 4-76-58-30-00
Fax: (33) 4-76-58-34-80
Asia
Room 1219
Chinachem Golden Plaza
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Tel: (852) 2721-9778
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Tel: (33) 4-42-53-60-00
Fax: (33) 4-42-53-60-01
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Tel: 1(719) 576-3300
Japan
9F, Tonetsu Shinkawa Bldg.
1-24-8 Shinkawa
Chuo-ku, Tokyo 104-0033
Japan
Tel: (81) 3-3523-3551
Fax: (81) 3-3523-7581
Fax: 1(719) 540-1759
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Maxwell Building
East Kilbride G75 0QR, Scotland
Tel: (44) 1355-803-000
Fax: (44) 1355-242-743
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0395D–PEEPR–10/06
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SI9135_11
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SI9136_11
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SI9130CG-T1-E3
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SI9130LG-T1-E3
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SI9130_11
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SI9137
Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9137DB
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