AT45D011-JC [ATMEL]

1-Megabit 5.0-volt Only Serial DataFlash; 1兆位5.0伏,只有串行数据闪存
AT45D011-JC
型号: AT45D011-JC
厂家: ATMEL    ATMEL
描述:

1-Megabit 5.0-volt Only Serial DataFlash
1兆位5.0伏,只有串行数据闪存

闪存 存储 内存集成电路 异步传输模式 ATM 时钟
文件: 总20页 (文件大小:155K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Features  
Single 4.5V - 5.5V Supply  
Serial Interface Architecture  
Page Program Operation  
– Single Cycle Reprogram (Erase and Program)  
– 512 Pages (264 Bytes/Page) Main Memory  
Optional Page and Block Erase Operations  
One 264-Byte SRAM Data Buffer  
Internal Program and Control Timer  
Fast Page Program Time – 7 ms Typical  
120 µs Typical Page to Buffer Transfer Time  
Low-Power Dissipation  
– 15 mA Active Read Current Typical  
– 10 µA CMOS Standby Current Typical  
15 MHz Max Clock Frequency  
Hardware Data Protection Feature  
Serial Peripheral Interface (SPI) Compatible – Modes 0 and 3  
CMOS and TTL Compatible Inputs and Outputs  
Commercial and Industrial Temperature Ranges  
1-Megabit  
5.0-volt Only  
Serial  
DataFlash®  
Description  
AT45D011  
Preliminary  
The AT45D011 is a 5.0-volt only, serial interface Flash memory suitable for in-system  
reprogramming. Its 1,081,344 bits of memory are organized as 512 pages of 264  
bytes each. In addition to the main memory, the AT45D011 also contains one SRAM  
data buffer of 264 bytes. Unlike conventional Flash memories that are accessed ran-  
domly with multiple address lines and a parallel interface, the DataFlash uses a serial  
interface to sequentially access its data. The simple serial interface facilitates hard-  
(continued)  
Pin Configurations  
SOIC  
Pin Name  
Function  
SI  
SCK  
1
2
3
4
8
7
6
5
SO  
CS  
Chip Select  
Serial Clock  
Serial Input  
Serial Output  
GND  
VCC  
WP  
RESET  
CS  
SCK  
SI  
SO  
AT45DB011  
Hardware Page  
Write Protect Pin  
WP  
Preliminary 16-  
Megabit 2.7-volt  
Only Serial  
RESET  
Chip Reset  
Ready/Busy  
PLCC  
RDY/BUSY  
TSSOP Top View  
Type 1  
DataFlash  
RDY/BUSY  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
CS  
NC  
NC  
NC  
NC  
NC  
SI  
SCK  
SI  
5
6
7
8
9
29 WP  
RESET  
WP  
28 RESET  
27 RDY/BUSY  
26 NC  
SO  
NC  
NC  
VCC  
GND  
SCK  
SO  
25 NC  
NC 10  
NC 11  
NC 12  
NC 13  
24 NC  
23 NC  
22 NC  
8
21 NC  
Rev. 1123A–08/98  
Note: PLCC package pins 16  
and 17 are DON’T CONNECT  
ware layout, increases system reliability, minimizes switch-  
ing noise, and reduces package size and active pin count.  
The device is optimized for use in many commercial and  
industrial applications where high density, low pin count,  
low voltage, and low power are essential. Typical applica-  
tions for the DataFlash are digital voice storage, image  
storage, and data storage. The device operates at clock  
frequencies up to 15 MHz with a typical active read current  
consumption of 15 mA.  
To allow for simple in-system reprogrammability, the  
AT45D011 does not require high input voltages for pro-  
gramming. The device operates from a single power sup-  
ply, 4.5V to 5.5V, for both the program and read  
operations. The AT45D011 is enabled through the chip  
select pin (CS) and accessed via a three-wire interface  
consisting of the Serial Input (SI), Serial Output (SO), and  
the Serial Clock (SCK).  
All programming cycles are self-timed, and no separate  
erase cycle is required before programming.  
Block Diagram  
WP  
FLASH MEMORY ARRAY  
PAGE (264 BYTES)  
BUFFER (264 BYTES)  
SCK  
CS  
I/O INTERFACE  
RESET  
V
CC  
GND  
RDY/BUSY  
SI  
SO  
Memory Array  
To provide optimal flexibility, the memory array of the  
AT45D011 is divided into three levels of granularity com-  
prising of sectors, blocks, and pages. The Memory Archi-  
tecture Diagram illustrates the breakdown of each level and  
details the number of pages per sector and block. All pro-  
gram operations to the DataFlash occur on a page by page  
basis; however, the optional erase operations can be per-  
formed at the block or page level.  
AT45DB011  
2
AT45DB011  
Memory Architecture Diagram  
SECTOR ARCHITECTURE  
BLOCK ARCHITECTURE  
PAGE ARCHITECTURE  
SECTOR 0  
PAGE 0  
PAGE 1  
8 Pages  
SECTOR 0 = 2112 BYTES (2K + 64)  
BLOCK 0  
BLOCK 1  
BLOCK 2  
BLOCK 3  
PAGE 6  
PAGE 7  
PAGE 8  
PAGE 9  
SECTOR 1 = 65,472 BYTES (62K + 1984)  
BLOCK 29  
BLOCK 30  
BLOCK 31  
BLOCK 32  
BLOCK 33  
BLOCK 34  
PAGE 14  
PAGE 15  
PAGE 16  
PAGE 17  
PAGE 18  
SECTOR 2 = 67,584 BYTES (64K + 2K)  
BLOCK 61  
BLOCK 62  
BLOCK 63  
PAGE 509  
PAGE 510  
PAGE 511  
Block = 2112 bytes  
(2K + 64)  
Page = 264 bytes  
(256 + 8)  
Device Operation  
The device operation is controlled by instructions from the  
host processor. The list of instructions and their associated  
opcodes are contained in Table 1 and Table 2. A valid  
instruction starts with the falling edge of CS followed by the  
appropriate 8-bit opcode and the desired buffer or main  
memory address location. While the CS pin is low, toggling  
the SCK pin controls the loading of the opcode and the  
desired buffer or main memory address location through  
the SI (serial input) pin. All instructions, addresses, and  
data are transferred with the most significant bit (MSB) first.  
bits are sent to initialize the read operation. Following the  
32 don’t care bits, additional pulses on SCK result in serial  
data being output on the SO (serial output) pin. The CS pin  
must remain low during the loading of the opcode, the  
address bits, and the reading of data. When the end of a  
page in main memory is reached during a main memory  
page read, the device will continue reading at the beginning  
of the same page. A low to high transition on the CS pin will  
terminate the read operation and tri-state the SO pin.  
BUFFER READ: Data can be read from the data buffer  
using an opcode of 54H. To perform a buffer read, the eight  
bits of the opcode must be followed by 15 don’t care bits,  
nine address bits, and eight don't care bits. Since the buffer  
size is 264-bytes, nine address bits (BFA8-BFA0) are  
required to specify the first byte of data to be read from the  
buffer. The CS pin must remain low during the loading of  
the opcode, the address bits, the don’t care bits, and the  
reading of data. When the end of the buffer is reached, the  
device will continue reading back at the beginning of the  
buffer. A low to high transition on the CS pin will terminate  
the read operation and tri-state the SO pin.  
Read  
By specifying the appropriate opcode, data can be read  
from the main memory or from the data buffer.  
MAIN MEMORY PAGE READ: A main memory read allows  
the user to read data directly from any one of the 512  
pages in the main memory, bypassing the data buffer and  
leaving the contents of the buffer unchanged. To start a  
page read, the 8-bit opcode, 52H, is followed by 24  
address bits and 32 don’t care bits. In the AT45D011, the  
first six address bits are reserved for larger density devices  
(see Notes on page 10), the next nine address bits (PA8-  
PA0) specify the page address, and the next nine address  
bits (BA8-BA0) specify the starting byte address within the  
page. The 32 don’t care bits which follow the 24 address  
MAIN MEMORY PAGE TO BUFFER TRANSFER: A page  
of data can be transferred from the main memory to buffer.  
An 8-bit opcode of 53H is followed by the six reserved bits,  
nine address bits (PA8-PA0) which specify the page in  
3
main memory that is to be transferred, and nine don’t care  
bits. The CS pin must be low while toggling the SCK pin to  
load the opcode, the address bits, and the don’t care bits  
from the SI pin. The transfer of the page of data from the  
main memory to the buffer will begin when the CS pin tran-  
sitions from a low to a high state. During the transfer of a  
page of data (tXFR), the status register can be read to deter-  
mine whether the transfer has been completed or not.  
page are internally self timed and should take place in a  
maximum time of tEP. During this time, the status register  
will indicate that the part is busy.  
BUFFER TO MAIN MEMORY PAGE PROGRAM WITH-  
OUT BUILT-IN ERASE: A previously erased page within  
main memory can be programmed with the contents of the  
buffer. An 8-bit opcode of 88H is followed by the six  
reserved bits, nine address bits (PA8-PA0) that specify the  
page in the main memory to be written, and nine additional  
don’t care bits. When a low to high transition occurs on the  
CS pin, the part will program the data stored in the buffer  
into the specified page in the main memory. It is necessary  
that the page in main memory that is being programmed  
has been previously erased. The programming of the page  
is internally self timed and should take place in a maximum  
time of tP. During this time, the status register will indicate  
that the part is busy.  
MAIN MEMORY PAGE TO BUFFER COMPARE: A page of  
data in main memory can be compared to the data in the  
buffer. An 8-bit opcode of 60H is followed by 24 address  
bits consisting of the six reserved bits, nine address bits  
(PA8-PA0) which specify the page in the main memory that  
is to be compared to the buffer, and nine don’t care bits.  
The loading of the opcode and the address bits is the same  
as described previously. The CS pin must be low while tog-  
gling the SCK pin to load the opcode, the address bits, and  
the don't care bits from the SI pin. On the low to high transi-  
tion of the CS pin, the 264 bytes in the selected main mem-  
ory page will be compared with the 264 bytes in the buffer.  
During this time (tXFR), the status register will indicate that  
the part is busy. On completion of the compare operation,  
bit 6 of the status register is updated with the result of the  
compare.  
PAGE ERASE: The optional Page Erase command can be  
used to individually erase any page in the main memory  
array allowing the Buffer to Main Memory Page Program  
without Built-In Erase command to be utilized at a later  
time. To perform a Page Erase, an opcode of 81H must be  
loaded into the device, followed by six reserved bits, nine  
address bits (PA8-PA0), and nine don’t care bits. The nine  
address bits are used to specify which page of the memory  
array is to be erased. When a low to high transition occurs  
on the CS pin, the part will erase the selected page to 1s.  
The erase operation is internally self-timed and should take  
place in a maximum time of tPE. During this time, the status  
register will indicate that the part is busy.  
Program  
BUFFER WRITE: Data can be shifted in from the SI pin  
into the data buffer. To load data into the buffer, an 8-bit  
opcode of 84H is followed by 15 don’t care bits and nine  
address bits (BFA8-BFA0). The nine address bits specify  
the first byte in the buffer to be written. The data is entered  
following the address bits. If the end of the data buffer is  
reached, the device will wrap around back to the beginning  
of the buffer. Data will continue to be loaded into the buffer  
until a low to high transition is detected on the CS pin.  
BLOCK ERASE: A block of eight pages can be erased at  
one time allowing the Buffer to Main Memory Page Pro-  
gram without Built-In Erase command to be utilized to  
reduce programming times when writing large amounts of  
data to the device. To perform a Block Erase, an opcode of  
50H must be loaded into the device, followed by six  
reserved bits, six address bits (PA8-PA3), and 12 don’t  
care bits. The six address bits are used to specify which  
block of eight pages is to be erased. When a low to high  
transition occurs on the CS pin, the part will erase the  
selected block of eight pages to 1s. The erase operation is  
internally self-timed and should take place in a maximum  
time of tBE. During this time, the status register will indicate  
that the part is busy.  
BUFFER TO MAIN MEMORY PAGE PROGRAM WITH  
BUILT-IN ERASE: Data written into the buffer can be pro-  
grammed into the main memory. An 8-bit opcode of 83H is  
followed by the six reserved bits, nine address bits (PA8-  
PA0) that specify the page in the main memory to be writ-  
ten, and nine additional don’t care bits. When a low to high  
transition occurs on the CS pin, the part will first erase the  
selected page in main memory to all 1s and then program  
the data stored in the buffer into the specified page in the  
main memory. Both the erase and the programming of the  
AT45DB011  
4
AT45DB011  
Block Erase Addressing  
PA8  
PA7  
PA6  
PA5  
0
PA4  
0
PA3  
0
PA2  
X
PA1  
X
PA0  
X
Block  
0
0
0
0
1
2
3
0
0
0
0
0
1
X
X
X
0
0
0
0
1
0
X
X
X
0
0
0
0
1
1
X
X
X
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
1
1
0
1
0
1
X
X
X
X
X
X
X
X
X
X
X
X
60  
61  
62  
63  
MAIN MEMORY PAGE PROGRAM: This operation is a  
combination of the Buffer Write and Buffer to Main Memory  
Page Program with Built-In Erase operations. Data is first  
shifted into the buffer from the SI pin and then programmed  
into a specified page in the main memory. An 8-bit opcode  
of 82H is followed by the six reserved bits and 18 address  
bits. The nine most significant address bits (PA8-PA0)  
select the page in the main memory where data is to be  
written, and the next nine address bits (BFA8-BFA0) select  
the first byte in the buffer to be written. After all address bits  
are shifted in, the part will take data from the SI pin and  
store it in the data buffer. If the end of the buffer is reached,  
the device will wrap around back to the beginning of the  
buffer. When there is a low to high transition on the CS pin,  
the part will first erase the selected page in main memory to  
all 1s and then program the data stored in the buffer into  
the specified page in the main memory. Both the erase and  
the programming of the page are internally self timed and  
should take place in a maximum of time tEP. During this  
time, the status register will indicate that the part is busy.  
self-timed and should take place in a maximum time of tEP.  
During this time, the status register will indicate that the  
part is busy.  
If a sector is programmed or reprogrammed sequentially  
page by page, then the programming algorithm shown in  
Figure 1 is recommended. Otherwise, if multiple bytes in a  
page or several pages are programmed randomly in a sec-  
tor, then the programming algorithm shown in Figure 2 is  
recommended.  
STATUS REGISTER: The status register can be used to  
determine the device’s ready/busy status, the result of a  
Main Memory Page to Buffer Compare operation, or the  
device density. To read the status register, an opcode of  
57H must be loaded into the device. After the last bit of the  
opcode is shifted in, the eight bits of the status register,  
starting with the MSB (bit 7), will be shifted out on the SO  
pin during the next eight clock cycles. The five most-signifi-  
cant bits of the status register will contain device informa-  
tion, while the remaining three least-significant bits are  
reserved for future use and will have undefined values.  
After bit 0 of the status register has been shifted out, the  
sequence will repeat itself (as long as CS remains low and  
SCK is being toggled) starting again with bit 7. The data in  
the status register is constantly updated, so each repeating  
sequence will output new data.  
AUTO PAGE REWRITE: This mode is only needed if multi-  
ple bytes within a page or multiple pages of data are modi-  
fied in a random fashion. This mode is a combination of two  
operations: Main Memory Page to Buffer Transfer and  
Buffer to Main Memory Page Program with Built-In Erase.  
A page of data is first transferred from the main memory to  
the data buffer, and then the same data (from the buffer) is  
programmed back into its original page of main memory.  
An 8-bit opcode of 58H is followed by the six reserved bits,  
nine address bits (PA8-PA0) that specify the page in main  
memory to be rewritten, and nine additional don’t care bits.  
When a low to high transition occurs on the CS pin, the part  
will first transfer data from the page in main memory to the  
buffer and then program the data from the buffer back into  
same page of main memory. The operation is internally  
Ready/busy status is indicated using bit 7 of the status reg-  
ister. If bit 7 is a 1, then the device is not busy and is ready  
to accept the next command. If bit 7 is a 0, then the device  
is in a busy state. The user can continuously poll bit 7 of the  
status register by stopping SCK once bit 7 has been output.  
The status of bit 7 will continue to be output on the SO pin,  
and once the device is no longer busy, the state of SO will  
change from 0 to 1. There are eight operations which can  
cause the device to be in a busy state: Main Memory Page  
5
to Buffer Transfer, Main Memory Page to Buffer Compare,  
Buffer to Main Memory Page Program with Built-In Erase,  
Buffer to Main Memory Page Program without Built-In  
Erase, Page Erase, Block Erase, Main Memory Page Pro-  
gram, and Auto Page Rewrite.  
machine to an idle state. The device will remain in the reset  
condition as long as a low level is present on the RESET  
pin. Normal operation can resume once the RESET pin is  
brought back to a high level.  
The device incorporates an internal power-on reset circuit,  
so there are no restrictions on the RESET pin during  
power-on sequences. The RESET pin is also internally  
pulled high; therefore, in low pin count applications, con-  
nection of the RESET pin is not necessary if this pin and  
feature will not be utilized. However, it is recommended  
that the RESET pin be driven high externally whenever  
possible.  
The result of the most recent Main Memory Page to Buffer  
Compare operation is indicated using bit 6 of the status  
register. If bit 6 is a 0, then the data in the main memory  
page matches the data in the buffer. If bit 6 is a 1, then at  
least one bit of the data in the main memory page does not  
match the data in the buffer.  
The device density is indicated using bits 5, 4, and 3 of the  
status register. For the AT45D011, the three bits are 0, 0,  
and 1. The decimal value of these three binary bits does  
not equate to the device density; the three bits represent a  
combinational code relating to differing densities of Serial  
DataFlash devices, allowing a total of eight different density  
configurations.  
READY/BUSY: This open drain output pin will be driven  
low when the device is busy in an internally self-timed oper-  
ation. This pin, which is normally in a high state (through an  
external pull-up resistor), will be pulled low during program-  
ming operations, compare operations, and during page-to-  
buffer transfers.  
HARDWARE PAGE WRITE PROTECT: If the WP pin is  
held low, the first 256 pages of the main memory cannot be  
reprogrammed. The only way to reprogram the first 256  
pages is to first drive the protect pin high and then use the  
program commands previously mentioned. The WP pin is  
internally pulled high; therefore, in low pin count applica-  
tions, connection of the WP pin is not necessary if this pin  
and feature will not be utilized. However, it is recom-  
mended that the WP pin be driven high externally when-  
ever possible.  
The busy status indicates that the Flash memory array and  
the buffer cannot be accessed.  
Power On/Reset State  
When power is first applied to the device, or when recover-  
ing from a reset condition, the device will default to SPI  
mode 3. In addition, the SO pin will be in a high impedance  
state, and a high to low transition on the CS pin will be  
required to start a valid instruction. The SPI mode will be  
automatically selected on every falling edge of CS by sam-  
pling the inactive clock state.  
RESET: A low state on the reset pin (RESET) will terminate  
the operation in progress and reset the internal state  
Status Register Format  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
RDY/BUSY  
COMP  
0
0
1
X
X
X
Absolute Maximum Ratings*  
*NOTICE:  
Stresses beyond those listed under “Absolute  
Maximum Ratings” may cause permanent dam-  
age to the device. This is a stress rating only and  
functional operation of the device at these or any  
other conditions beyond those indicated in the  
operational sections of this specification is not  
implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device  
reliability.  
Temperature Under Bias................................ -55°C to +125°C  
Storage Temperature..................................... -65°C to +150°C  
All Input Voltages  
(including NC Pins)  
with Respect to Ground...................................-0.6V to +6.25V  
All Output Voltages  
with Respect to Ground.............................-0.6V to VCC + 0.6V  
AT45DB011  
6
AT45DB011  
DC and AC Operating Range  
AT45D011  
0°C to 70°C  
-40°C to 85°C  
4.5V to 5.5V  
Com.  
Ind.  
Operating Temperature (Case)  
V
CC Power Supply(1)  
Note:  
1. After power is applied and VCC is at the minimum specified data sheet value, the system should wait 20 ms before an oper-  
ational mode is started.  
DC Characteristics  
Symbol  
Parameter  
Condition  
Min  
Typ  
Max  
Units  
ISB  
Standby Current  
CS, RESET, WP = VIH,  
10  
20  
µA  
all inputs at CMOS levels  
ICC1  
ICC2  
Active Current,  
Read Operation  
f = 15 MHz; IOUT = 0 mA;  
15  
25  
25  
50  
mA  
mA  
VCC = 5.5V  
Active Current,  
VCC = 5.5V  
Program/Erase Operation  
ILI  
Input Load Current  
Output Leakage Current  
Input Low Voltage  
VIN = CMOS levels  
VI/O = CMOS levels  
10  
10  
µA  
µA  
V
ILO  
VIL  
0.8  
VIH  
VOL  
VOH1  
VOH2  
Input High Voltage  
Output Low Voltage  
Output High Voltage  
Output High Voltage  
2.0  
V
IOL = 2.1 mA  
0.45  
V
IOH = -400 µA  
2.4  
4.2  
V
IOH = -100 µA; VCC = 4.5V  
V
7
AC Characteristics  
Symbol  
fSCK  
tWH  
tWL  
Parameter  
Min  
Typ  
Max  
Units  
MHz  
ns  
SCK Frequency  
15  
SCK High Time  
30  
30  
SCK Low Time  
ns  
tCS  
Minimum CS High Time  
CS Setup Time  
250  
250  
250  
ns  
tCSS  
tCSH  
tCSB  
tSU  
ns  
CS Hold Time  
ns  
CS High to RDY/BUSY Low  
Data In Setup Time  
Data In Hold Time  
200  
ns  
10  
15  
0
ns  
tH  
ns  
tHO  
Output Hold Time  
ns  
tDIS  
tV  
tXFR  
tEP  
Output Disable Time  
Output Valid  
20  
25  
ns  
ns  
Page to Buffer Transfer/Compare Time  
Page Erase and Programming Time  
Page Programming Time  
Page Erase Time  
120  
10  
7
200  
20  
µs  
ms  
ms  
ms  
ms  
µs  
tP  
15  
tPE  
6
10  
tBE  
Block Erase Time  
7
15  
tRST  
tREC  
RESET Pulse Width  
RESET Recovery Time  
10  
1
µs  
Input Test Waveforms and  
Measurement Levels  
2.4V  
Output Test Load  
DEVICE  
UNDER  
TEST  
AC  
AC  
2.0  
DRIVING  
LEVELS  
MEASUREMENT  
LEVEL  
30 pF  
0.8  
0.45V  
tR, tF < 5 ns (10% to 90%)  
AT45DB011  
8
AT45DB011  
AC Waveforms  
Two different timing diagrams are shown below. Waveform  
1 shows the SCK signal being low when CS makes a high-  
to-low transition, and Waveform 2 shows the SCK signal  
being high when CS makes a high-to-low transition. Both  
waveforms show valid timing diagrams. The setup and hold  
times for the SI signal are referenced to the low-to-high  
transition on the SCK signal.  
Waveform 1 shows timing that is also compatible with SPI  
Mode 0, and Waveform 2 shows timing that is compatible  
with SPI Mode 3.  
Waveform 1 – Inactive Clock Polarity Low  
tCS  
CS  
tCSS  
tWH  
tWL  
tCSH  
SCK  
SO  
SI  
tV  
tHO  
tDIS  
HIGH IMPEDANCE  
tSU  
HIGH IMPEDANCE  
VALID OUT  
tH  
VALID IN  
Waveform 2 – Inactive Clock Polarity High  
tCS  
CS  
tCSS  
tWL  
tWH  
tCSH  
SCK  
SO  
SI  
tV  
tHO  
tDIS  
HIGH Z  
HIGH IMPEDANCE  
VALID OUT  
tH  
tSU  
VALID IN  
9
Reset Timing (Inactive Clock Polarity Low Shown)  
CS  
tREC  
tCSS  
SCK  
tRST  
RESET  
HIGH IMPEDANCE  
HIGH IMPEDANCE  
SO  
SI  
Command Sequence for Read/Write Operations (Except Status Register Read)  
SI  
CMD  
8 bits  
8 bits  
8 bits  
MSB  
r r r r r r X X  
X X X X X X X X  
Page Address  
X X X X X X X X  
LSB  
Reserved for  
Byte/Buffer Address  
larger densities  
(PA8-PA0)  
(BA8-BA0/BFA8-BFA0)  
Notes: 1. “r” designates bits reserved for larger densities.  
2. It is recommended that “r” be a logical “0”.  
3. For densities larger than 1M bit, the “r” bits become the most significant Page Address bit for the appropriate density.  
AT45DB011  
10  
AT45DB011  
Write Operations  
The following block diagram and waveforms illustrate the various write sequences available.  
FLASH MEMORY ARRAY  
PAGE (264 BYTES)  
BUFFER TO  
MAIN MEMORY  
PAGE PROGRAM  
BUFFER (264 BYTES)  
MAIN MEMORY PAGE  
PROGRAM THROUGH  
BUFFER  
BUFFER  
WRITE  
I/O INTERFACE  
SI  
Main Memory Page Program through Buffer  
· Completes writing into buffer  
· Starts self-timed erase/program operation  
CS  
BFA7-0  
r ···r , PA8-7  
PA6-0, BFA8  
SI  
CMD  
n
n+1  
Last Byte  
Buffer Write  
· Completes writing into buffer  
CS  
SI  
CMD  
X
X···X, BFA8  
BFA7-0  
n
n+1  
Last Byte  
Buffer to Main Memory Page Program  
(Data from Buffer Programmed into Flash Page)  
Starts self-timed erase/program operation  
CS  
SI  
CMD  
r ···r , PA8-7  
PA6-0, X  
X
n = 1st byte written  
Each transition represents  
8 bits and 8 clock cycles  
n+1 = 2nd byte written  
11  
Read Operations  
The following block diagram and waveforms illustrate the various read sequences available.  
FLASH MEMORY ARRAY  
PAGE (264 BYTES)  
MAIN MEMORY  
PAGE TO  
BUFFER  
MAIN MEMORY  
PAGE READ  
BUFFER (264 BYTES)  
BUFFER  
READ  
I/O INTERFACE  
SO  
Main Memory Page Read  
CS  
SI  
CMD  
r ···r , PA8-7  
PA6-0, BA8  
BA7-0  
X
X
X
X
n
n+1  
SO  
Main Memory Page to Buffer Transfer (Data from Flash Page Read into Buffer)  
Starts reading page data into buffer  
CS  
SI  
CMD  
r ···r , PA8-7  
PA6-0, X  
X
SO  
Buffer Read  
CS  
SI  
CMD  
X
X···X, BFA8  
BFA7-0  
X
SO  
n
n+1  
n = 1st byte read  
Each transition represents  
8 bits and 8 clock cycles  
n+1 = 2nd byte read  
AT45DB011  
12  
AT45DB011  
Detailed Bit-Level Read Timing – Inactive Clock Polarity Low  
Main Memory Page Read  
CS  
SCK  
1
2
3
4
5
0
60  
X
61  
X
62  
X
63  
X
64  
X
65  
66  
67  
tSU  
COMMAND OPCODE  
SI  
0
1
0
1
tV  
DATA OUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
MSB  
Buffer Read  
CS  
SCK  
1
0
2
3
4
5
0
36  
X
37  
X
38  
X
39  
X
40  
X
41  
42  
43  
tSU  
COMMAND OPCODE  
SI  
1
0
1
tV  
DATA OUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
MSB  
Status Register Read  
CS  
SCK  
1
2
1
3
4
5
6
7
1
8
1
9
10  
11  
12  
16  
17  
tSU  
COMMAND OPCODE  
SI  
0
0
1
0
1
tV  
STATUS REGISTER OUTPUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
D
1
D
0
D
7
MSB  
LSB  
MSB  
13  
Detailed Bit-Level Read Timing – Inactive Clock Polarity High  
Main Memory Page Read  
CS  
SCK  
1
2
3
4
5
61  
62  
63  
64  
65  
66  
67  
68  
tSU  
COMMAND OPCODE  
SI  
0
1
0
1
0
X
X
X
X
X
tV  
DATA OUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
D
4
MSB  
Buffer Read  
CS  
SCK  
1
2
3
4
5
37  
38  
39  
40  
41  
42  
43  
44  
tSU  
COMMAND OPCODE  
SI  
0
1
0
1
0
X
X
X
X
X
tV  
DATA OUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
D
4
MSB  
Status Register Read  
CS  
SCK  
1
2
3
4
5
6
7
8
9
10  
11  
12  
17  
18  
tSU  
COMMAND OPCODE  
SI  
0
1
0
1
0
1
1
1
tV  
STATUS REGISTER OUTPUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
D
4
D
0
D
7
D
6
MSB  
LSB  
MSB  
AT45DB011  
14  
AT45DB011  
Table 1  
Main Memory  
Page Read  
Buffer  
Read  
Main Memory Page  
to Buffer Transfer  
Main Memory Page  
to Buffer Compare  
Buffer  
Write  
Opcode  
52H  
54H  
53H  
0
60H  
0
84H  
0
0
1
1
1
1
1
0
0
0
0
1
0
1
1
1
0
0
0
0
0
0
0
0
1
0
0
1
1
0
1
0
0
0
0
0
1
0
r
X
r
r
X
r
X
r
r
X
r
r
X
r
r
X
X
r
r
X
r
X
X
r
r
X
r
r
r
X
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
BA8  
BA7  
BA6  
BA5  
BA4  
BA3  
BA2  
BA1  
BA0  
X
X
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
BFA8  
BFA7  
BFA6  
BFA5  
BFA4  
BFA3  
BFA2  
BFA1  
BFA0  
X
BFA8  
BFA7  
BFA6  
BFA5  
BFA4  
BFA3  
BFA2  
BFA1  
BFA0  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X (Don’t Care)  
r (reserved bits)  
X
X
X
X
X
X
X
X
X
X
X
X
X (64th bit)  
15  
Table 2  
Buffer to  
Main Memory  
Page Program  
without Built-In  
Erase  
Buffer to  
Main Memory  
Page Program  
with Built-In Erase  
Main Memory  
Page Program  
Through Buffer  
Auto Page  
Rewrite  
Through Buffer  
Page  
Erase  
Block  
Erase  
Opcode  
Status  
Register  
83H  
1
88H  
1
81H  
1
50H  
0
82H  
1
58H  
0
57H  
0
0
0
0
1
0
1
1
0
0
0
0
0
0
0
0
0
0
1
0
1
1
0
1
0
0
0
1
0
0
0
0
0
0
0
1
1
0
0
0
1
0
1
1
0
1
0
0
0
1
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
X
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
BFA8  
BFA7  
BFA6  
BFA5  
BFA4  
BFA3  
BFA2  
BFA1  
BFA0  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X (Don’t Care)  
r (reserved bits)  
AT45DB011  
16  
AT45DB011  
Figure 1. Algorithm for Programming or Reprogramming of the Entire Array Sequentially  
START  
provide address  
and data  
BUFFER WRITE  
(84H)  
MAIN MEMORY PAGE PROGRAM  
(82H)  
BUFFER to MAIN  
MEMORY PAGE PROGRAM  
(83H)  
END  
Notes: 1. This type of algorithm is used for applications in which the entire array is programmed sequentially, filling the array page-by-  
page.  
2. A page can be written using either a Main Memory Page Program operation or a Buffer Write operation followed by a Buffer  
to Main Memory Page Program operation.  
3. The algorithm above shows the programming of a single page. The algorithm will be repeated sequentially for each page  
within the entire array.  
17  
Figure 2. Algorithm for Randomly Modifying Data  
START  
provide address of  
page to modify  
MAIN MEMORY PAGE  
If planning to modify multiple  
bytes currently stored within  
a page of the Flash array  
to BUFFER TRANSFER  
(53H)  
BUFFER WRITE  
(84H)  
MAIN MEMORY PAGE PROGRAM  
(82H)  
BUFFER to MAIN  
MEMORY PAGE PROGRAM  
(83H)  
(2)  
Auto Page Rewrite  
(58H)  
INCREMENT PAGE  
(2)  
ADDRESS POINTER  
END  
Notes: 1. To preserve data integrity, each page of a DataFlash  
Sector Addressing  
sector must be updated/rewritten at least once  
within every 10,000 cumulative page erase/program  
operations within that sector.  
PA2-  
PA0  
PA8  
0
PA7  
0
PA6  
0
PA5  
0
PA4  
0
PA3  
0
Sector  
2. A Page Address Pointer must be maintained to indi-  
cate which page is to be rewritten. The Auto Page  
Rewrite command must use the address specified  
by the Page Address Pointer.  
X
X
X
0
1
2
0
X
X
X
X
X
1
X
X
X
X
X
3. Other algorithms can be used to rewrite portions of  
the Flash array. Low power applications may choose  
to wait until 10,000 cumulative page erase/program  
operations have accumulated before rewriting all  
pages of the sector. See application note AN-4  
(“Using Atmel’s Serial DataFlash”) for more details.  
AT45DB011  
18  
AT45DB011  
Ordering Information  
ICC (mA)  
fSCK (MHz)  
Active  
Standby  
Ordering Code  
Package  
Operation Range  
15  
25  
0.02  
AT45D011-JC  
AT45D011-SC  
AT45D011-XC  
32J  
8S2  
14X  
Commercial  
(0°C to 70°C)  
15  
25  
0.02  
AT45D011-JI  
AT45D011-SI  
AT45D011-XI  
32J  
8S2  
14X  
Industrial  
(-40°C to 85°C)  
Package Type  
32J  
8S2  
14X  
32-Lead, Plastic J-Leaded Chip Carrier (PLCC)  
8-Lead, 0.210" Wide, Plastic Gull Wing Small Outline (EIAJ SOIC)  
14-Lead, 0.170" Wide, Plastic Thin Shrink Small Outline Package (TSSOP)  
19  
Packaging Information  
32J, 32-Lead, Plastic J-Leaded Chip Carrier (PLCC)  
Dimensions in Inches and (Millimeters)  
JEDEC STANDARD MS-016 AE  
8S2, 8-Lead, 0.210" Wide, Plastic Gull Wing Small  
Outline (EIAJ SOIC)  
Dimensions in Inches and (Millimeters)  
.025(.635) X 30° - 45°  
.020 (.508)  
.012 (.305)  
.045(1.14) X 45° PIN NO. 1  
.012(.305)  
IDENTIFY  
.008(.203)  
.530(13.5)  
.213 (5.41) .330 (8.38)  
.205 (5.21) .300 (7.62)  
.553(14.0)  
.490(12.4)  
.547(13.9)  
.032(.813)  
.026(.660)  
PIN 1  
.021(.533)  
.013(.330)  
.595(15.1)  
.585(14.9)  
.050 (1.27) BSC  
.030(.762)  
.015(3.81)  
.095(2.41)  
.060(1.52)  
.140(3.56)  
.120(3.05)  
.050(1.27) TYP  
.300(7.62) REF  
.430(10.9)  
.212 (5.38)  
.203 (5.16)  
.080 (2.03)  
.070 (1.78)  
.390(9.90)  
AT CONTACT  
POINTS  
.013 (.330)  
.004 (.102)  
.022(.559) X 45° MAX (3X)  
0
8
REF  
.010 (.254)  
.007 (.178)  
.453(11.5)  
.447(11.4)  
.495(12.6)  
.485(12.3)  
.035 (.889)  
.020 (.508)  
14X, 14-Lead, 0.170" Wide, Thin Shrink Small  
Outline Package (TSSOP)  
Dimensions in Millimeters and (Inches)*  
INDEX MARK  
PIN  
1
6.50 (.256)  
6.25 (.246)  
4.50 (.177)  
4.30 (.169)  
5.10 (.201)  
4.90 (.193)  
1.20 (.047) MAX  
.650 (.026) BSC  
0.30 (.012)  
0.15 (.006)  
0.05 (.002)  
SEATING  
PLANE  
0.19 (.007)  
0.20 (.008)  
0.09 (.004)  
0
8
REF  
0.75 (.030)  
0.45 (.018)  
*Controlling dimension: millimeters  
AT45DB011  
20  

相关型号:

AT45D011-JI

1-Megabit 5.0-volt Only Serial DataFlash
ATMEL

AT45D011-SC

1-Megabit 5.0-volt Only Serial DataFlash
ATMEL

AT45D011-SI

1-Megabit 5.0-volt Only Serial DataFlash
ATMEL

AT45D011-XC

1-Megabit 5.0-volt Only Serial DataFlash
ATMEL

AT45D011-XI

1-Megabit 5.0-volt Only Serial DataFlash
ATMEL

AT45D02-RC

(183.07 k)
ETC

AT45D021

2-Megabit 5-volt Only Serial DataFlash
ATMEL

AT45D021-JC

2-Megabit 5-volt Only Serial DataFlash
ATMEL

AT45D021-JI

2-Megabit 5-volt Only Serial DataFlash
ATMEL

AT45D021-RC

2-Megabit 5-volt Only Serial DataFlash
ATMEL

AT45D021-RI

2-Megabit 5-volt Only Serial DataFlash
ATMEL

AT45D021-TC

2-Megabit 5-volt Only Serial DataFlash
ATMEL