PC755CVGHU400LE [ATMEL]
PowerPC 755/745 RISC Microprocessor; 745分之755的PowerPC RISC微处理器型号: | PC755CVGHU400LE |
厂家: | ATMEL |
描述: | PowerPC 755/745 RISC Microprocessor |
文件: | 总50页 (文件大小:1053K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Features
• 18.1SPECint95, Estimates 12.3 SPECfp95 at 400 MHz (PC755)
• 15.7SPECint95, 9SPECfp95 at 350 MHz (PC745)
• 733 MIPS at 400 MHz (PC755) at 641 MIPS at 350 MHz (PC745)
• Selectable Bus Clock (12 CPU Bus Dividers up to 10x)
• PD Typical 6.4W at 400 MHz, Full Operating Conditions
• Nap, Doze and Sleep Modes for Power Savings
• Superscalar (3 Instructions per Clock Cycle) Two Instruction + Branch
• 4 Beta Byte Virtual Memory, 4-GByte of Physical Memory
• 64-bit Data and 32-bit Address Bus Interface
• 32-KB Instruction and Data Cache
• Six Independent Execution Units
• Write-back and Write-through Operations
• fINT max = 400 MHz (TBC)
• fBUS max = 100 MHz
• Voltage I/O 2.5V/3.3V; Voltage Int 2.0V
PowerPC
755/745 RISC
Microprocessor
Description
PC755/745
Preliminary
β-site
The PC755 and PC745 PowerPC® microprocessors are high-performance, low-
power, 32-bit implementations of the PowerPC Reduced Instruction Set Computer
(RISC) architecture, especially enhanced for embedded applications.
The PC755 and PC745 microprocessors differ only in that the PC755 features an
enhanced, dedicated L2 cache interface with on-chip L2 tags. The PC755 is a drop-in
replacement for the award winning PowerPC 750™ microprocessor and is footprint
and user software code compatible with the MPC7400 microprocessor with AltiVec™
technology. The PC745 is a drop-in replacement for the PowerPC 740™ microproces-
sor and is also footprint and user software code compatible with the PowerPC 603e™
microprocessor. PC755/745 microprocessors provide on-chip debug support and are
fully JTAG-compliant.
The PC745 microprocessor is pin compatible with the TSPC603e family.
ZF suffix
ZF suffix
PBGA255
PBGA360
Flip-Chip Plastic Ball Grid Array
Flip-Chip Plastic Ball Grid Array
G suffix
CBGA360
Ceramic Ball Grid Array
GS suffix
CI-CGA360
Ceramic Ball Grid Array with
Solder Column Interposer (SCI)
GH suffix
HITCE 360
Ceramic Ball Grid Array
Rev. 2138D–HIREL–06/03
Screening
This product is manufactured in full compliance with:
•
•
•
CBGA + CI-CGA + FC-PBGA up screenings based upon Atmel standards
HiTCE
Full military temperature range (Tj = -55°C,+125°C)
industrial temperature range (Tj = -40°C,+110°C)
General Description
Simplified Block Diagram The PC755 is targeted for low power systems and supports power management fea-
tures such as doze, nap, sleep, and dynamic power management. The PC755 consists
of a processor core and an internal L2 Tag combined with a dedicated L2 cache inter-
face and a 60x bus.
Figure 1. PC755 Block Diagram
2
PC755/745
2138D–HIREL–06/03
PC755/745
General Parameters
The following list provides a summary of the general parameters of the PC755:
Technology
Die size
0.22 µm CMOS, six-layer metal
6.61 mm x 7.73 mm (51 mm2)
Transistor count
Logic design
PC745
6.75 million
Fully-static Packages
Surface mount 255 Plastic Ball Grid Array (PBGA)
Surface mount 360 Plastic Ball Grid Array (PBGA)
Surface mount 360 Ceramic Ball Grid Array (CI-CGA, CBGA,
HiTCE)
PC755
Core power supply
I/O power supply
2V ± 100 mV DC (nominal; some parts support core voltages
down to 1.8V; see Table 5 for recommended operating
conditions)
2.5V ± 100 mV DC or 3.3V ± 165 mV DC (input thresholds are
configuration pin selectable)
Features
This section summarizes features of the PC755’s implementation of the PowerPC archi-
tecture. Major features of the PC755 are as follows:
•
Branch Processing Unit
–
–
–
Four instructions fetched per clock
One branch processed per cycle (plus resolving 2 speculations)
Up to 1 speculative stream in execution, 1 additional speculative stream in
fetch
–
–
512-entry branch history table (BHT) for dynamic prediction
64-entry, 4-way set associative Branch Target Instruction Cache (BTIC) for
eliminating branch delay slots
•
Dispatch Unit
–
–
Full hardware detection of dependencies (resolved in the execution units)
Dispatch two instructions to six independent units (system, branch,
load/store, fixed-point unit 1, fixed-point unit 2, floating-point)
–
Serialization control (predispatch, postdispatch, execution serialization)
•
•
Decode
–
–
–
Register file access
Forwarding control
Partial instruction decode
Completion
–
–
–
6 entry completion buffer
Instruction tracking and peak completion of two instructions per cycle
Completion of instructions in program order while supporting out-of-order
instruction execution, completion serialization and all instruction flow
changes
•
Fixed Point Units (FXUs) that share 32 GPRs for Integer Operands
–
–
Fixed Point Unit 1 (FXU1)-multiply, divide, shift, rotate, arithmetic, logical
Fixed Point Unit 2 (FXU2)-shift, rotate, arithmetic, logical
3
2138D–HIREL–06/03
–
–
–
Single-cycle arithmetic, shifts, rotates, logical
Multiply and divide support (multi-cycle)
Early out multiply
•
Floating-point Unit and a 32-entry FPR File
–
Support for IEEE-754 standard single and double precision floating point
arithmetic
–
–
–
–
Hardware support for divide
Hardware support for denormalized numbers
Single-entry reservation station
Supports non-IEEE mode for time-critical operations
•
•
System Unit
–
–
Executes CR logical instructions and miscellaneous system instructions
Special register transfer instructions
Load/Store Unit
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
One cycle load or store cache access (byte, half-word, word, double-word)
Effective address generation
Hits under misses (one outstanding miss)
Single-cycle unaligned access within double word boundary
Alignment, zero padding, sign extend for integer register file
Floating point internal format conversion (alignment, normalization)
Sequencing for load/store multiples and string operations
Store gathering
Cache and TLB instructions
Big and Little-endian byte addressing supported
Misaligned Little-endian supported
Level 1 Cache structure
32K, 32 bytes line, 8-way set associative instruction cache (iL1)
32K, 32 bytes line, 8-way set associative data cache (dL1)
Cache locking for both instruction and data caches, selectable by group of
ways
–
–
–
–
–
–
Single-cycle cache access
Pseudo least-recently used (PLRU) replacement
Copy-back or Write Through data cache (on a page per page basis)
Supports all PowerPC memory coherency modes
Non-Blocking instruction and data cache (one outstanding miss under hits)
No snooping of instruction cache
•
Level 2 (L2) Cache Interface (not implemented on PC745)
–
–
–
–
–
Internal L2 cache controller and tags; external data SRAMs
256K, 512K, and 1-Mbyte 2-way set associative L2 cache support
Copyback or write-through data cache (on a page basis, or for all L2)
Instruction-only mode and data-only mode.
64 bytes (256K/512K) or 128 bytes (1M) sectored line size
4
PC755/745
2138D–HIREL–06/03
PC755/745
–
–
Supports flow through (register-buffer) synchronous burst SRAMs, pipelined
(register-register) synchronous burst SRAMs (3-1-1-1 or strobeless 4-1-1-1)
and pipelined (register-register) late-write synchronous burst SRAMs
L2 configurable to direct mapped SRAM interface or split cache/direct
mapped or private memory
–
–
–
–
Core-to-L2 frequency divisors of 1, 1.5, 2, 2.5, and 3 supported
64-bit data bus
Selectable interface voltages of 2.5V and 3.3V
Parity checking on both L2 address and data
•
Memory Management Unit
–
–
–
–
–
–
–
–
128 entry, 2-way set associative instruction TLB
128 entry, 2-way set associative data TLB
Hardware reload for TLBs
Hardware or optional software tablewalk support
8 instruction BATs and 8 data BATs
8 SPRGs, for assistance with software tablewalks
Virtual memory support for up to 4 hexabytes (252) of virtual memory
Real memory support for up to 4 gigabytes (232) of physical memory
•
Bus Interface
–
–
–
–
Compatible with 60X processor interface
32-bit address bus
64-bit data bus, 32-bit mode selectable
Bus-to-core frequency multipliers of 2x, 3x, 3.5x, 4x, 4.5x, 5x, 5.5x, 6x, 6.5x,
7x, 7.5x, 8x, 10x supported
–
–
Selectable interface voltages of 2.5V and 3.3V.
Parity checking on both address and data busses
•
Power Management
–
–
Low-power design with thermal requirements very similar to PC740/750.
Selectable interface voltage of 1.8V/2.0V can reduce power in output buffers
(compared to 3.3V)
–
–
Three static power saving modes: doze, nap, and sleep
Dynamic power management
•
•
Testability
–
–
LSSD scan design
IEEE 1149.1 JTAG interface
Integrated Thermal Management Assist Unit
–
–
One-ship thermal sensor and control logic
Thermal Management Interrupt for software regulation of junction
temperature
5
2138D–HIREL–06/03
Pin Assignments
Figure 2 (in part A) shows the pinout of the PC745, 255PBGA package as viewed from
the top surface. Part B shows the side profile of the PBGA package to indicate the direc-
tion of the top surface view.
Figure 2. Pinout of the PC745, 255 PBGA Package as Viewed from the Top Surface
Part A
1
2
3
4
5
6
7 8
9 10 11 12 13 14 15 16
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
Not to Scale
Part B
View
SubstrateAssembly
Encapsulant
Die
6
PC755/745
2138D–HIREL–06/03
PC755/745
Figure 3 (in part A) shows the pinout of the PC755, 360 PBGA packages as viewed from
the top surface. Part B shows the side profile of the PBGA package to indicate the direc-
tion of the top surface view.
Figure 3. Pinout of the PC755, 360 PBGA, CBGA and CI-CGA Packages as Viewed
from the Top Surface
Part A
17 18 19
9 10 11 12 13 14 15 16
1
2
3
4
5
6
7
8
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
V
W
Not to Scale
Part B
View
SubstrateAssembly
Encapsulant
Die
7
2138D–HIREL–06/03
Pinout Listings
Table 1 provides the pinout listing for the PC745, 255 PBGA package.
Table 1. Pinout Listing for the PC745, 255 PBGA Package
I/F Voltages Supported(1)
Signal Name
Pin Number
Active
I/O
1.8V/2.0V
3.3V
A[0-31]
C16, E4, D13, F2, D14, G1, D15, E2, D16, D4, E13, G2,
E15, H1, E16, H2, F13, J1, F14, J2, F15, H3, F16, F4, G13,
K1, G15, K2, H16, M1, J15, P1
High
I/O
–
–
AACK
L2
Low
Low
High
Low
–
Input
I/O
–
–
–
–
ABB
K4
AP[0-3]
ARTRY
AVDD
C1, B4, B3, B2
I/O
–
–
J4
I/O
–
–
A10
L1
–
2V
–
2V
–
BG
Low
Low
High
Low
Low
Low
–
Input
Output
Input
Output
Input
Output
Output
I/O
BR
B6
B1
E1
D8
A6
D7
J14
N1
H15
G4
–
–
BVSEL(3)(4)(5)
GND
–
3.3V
–
CI
CKSTP_IN
CKSTP_OUT
CLK_OUT
DBB
–
–
–
–
–
–
Low
Low
Low
Low
High
–
–
DBG
Input
Input
Input
I/O
–
–
DBDIS
DBWO
DH[0-31]
–
–
–
–
P14, T16, R15, T15, R13, R12, P11, N11, R11, T12, T11,
R10, P9, N9, T10, R9, T9, P8, N8, R8, T8, N7, R7, T7, P6,
N6, R6, T6, R5, N5, T5, T4
–
–
DL[0-31]
K13, K15, K16, L16, L15, L13, L14, M16, M15, M13, N16,
N15, N13, N14, P16, P15, R16, R14, T14, N10, P13, N12,
T13, P3, N3, N4, R3, T1, T2, P4, T3, R4
High
I/O
–
–
DP[0-7]
DRTRY
GBL
M2, L3, N2, L4, R1, P2, M4, R2
High
Low
Low
I/O
Input
I/O
–
–
–
–
–
–
G16
F1
GND
C5, C12, E3, E6, E8, E9, E11, E14, F5, F7, F10, F12, G6,
G8, G9, G11, H5, H7, H10, H12, J5, J7, J10, J12, K6, K8,
K9, K11, L5, L7, L10, L12, M3, M6, M8, M9, M11, M14, P5,
P12
HRESET
A7
Low
Low
High
High
Low
Input
Input
Input
Input
Input
–
–
–
–
–
–
–
INT
B15
D11
D12
B10
L1_TSTCLK(2)
L2_TSTCLK(2)
LSSD_MODE(2)
–
–
-–
8
PC755/745
2138D–HIREL–06/03
PC755/745
Table 1. Pinout Listing for the PC745, 255 PBGA Package (Continued)
I/F Voltages Supported(1)
Signal Name
Pin Number
Active
Low
–
I/O
Input
–
1.8V/2.0V
3.3V
MCP
C13
–
–
–
–
NC (No-
Connect)
B7, B8, C3, C6, C8, D5, D6, H4, J16, A4, A5, A2, A3, B5
OVDD
C7, E5, E7, E10, E12, G3, G5, G12, G14, K3, K5, K12, K14,
M5, M7, M10, M12, P7, P10
–
–
1.8V/2.0V
3.3V
PLL_CFG[0-3]
QACK
QREQ
RSRV
SMI
A8, B9, A9, D9
High
Low
Low
Low
Low
Low
–
Input
Input
Output
Output
Input
Input
Input
Input
Input
I/O
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
2V
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
2V
D3
J3
D1
A16
SRESET
SYSCLK
TA
B14
C9
H14
Low
High
Low
High
High
High
Low
Low
High
Low
Low
High
High
Low
–
TBEN
TBST
C2
A14
TCK
C11
Input
Input
Output
Input
Input
Input
Input
I/O
TDI(5)
A11
TDO
A12
TEA
H13
TLBISYNC
TMS(5)
TRST(5)
TS
C4
B11
C10
J13
TSIZ[0-2]
TT[0-4]
WT
A13, D10, B12
B13, A15, B16, C14, C15
D2
Output
I/O
Output
–
VDD
2
F6, F8, F9, F11, G7, G10, H6, H8, H9, H11, J6, J8, J9, J11,
K7, K10, L6, L8, L9, L11
VOLTDET(6)
F3
High
Output
–
–
Notes: 1. OVDD supplies power to the processor bus, JTAG, and all control signals and VDD supplies power to the processor core and
the PLL (after filtering to become AVDD). These columns serve as a reference for the nominal voltage supported on a given
signal as selected by the BVSEL pin configuration of Table 4 and the voltage supplied. For actual recommended value of VIN
or supply voltages see Table 3.
2. These are test signals for factory use only and must be pulled up to OVDD for normal machine operation.
3. To allow for future I/O voltage changes, provide the option to connect BVSEL independently to either OVDD (selects 3.3V) or
to OGND (selects 1.8V/2.0V).
4. Uses one of 15 existing no-connects in PC745’s 255-BGA package.
5. Internal pull up on die.
6. Internally tied to GND in the PC745 255-BGA package to indicate to the power supply that a low-voltage processor is
present. This signal is not a power supply input.
9
2138D–HIREL–06/03
Table 2 provides the pinout listing for the PC755, 360 PBGA, CBGA and CI-CGA + HiTCE
Table 2. Pinout Listing for the PC755, 360 PBGA, CBGA and CI-CGA Packages + HiTCE(8)
I/F Voltages
Supported(1)
Signal Name
Pin Number
Active
I/O
1.8V/2.0V
3.3V
A[0-31]
A13, D2, H11, C1, B13, F2, C13, E5, D13, G7, F12, G3, G6, H2,
E2, L3, G5, L4, G4, J4, H7, E1, G2, F3, J7, M3, H3, J2, J6, K3, K2,
L2
High
I/O
–
–
AACK
N3
Low
Low
High
Low
-
Input
I/O
–
–
–
–
ABB
L7
AP[0-3]
ARTRY
AVDD
C4, C5, C6, C7
I/O
–
–
L6
I/O
–
–
A8
H1
E7
W1
C2
B8
D7
E3
K5
G1
K1
D1
-
2V
–
2V
–
BG
Low
Low
High
Low
Low
Low
–
Input
Output
Input
Output
Input
Output
Output
I/O
BR
–
–
BVSEL(3)(5)(6)
GND
–
3.3V
–
CI
CKSTP_IN
CKSTP_OUT
CLK_OUT
DBB
–
–
–
–
–
–
Low
Low
Low
Low
High
–
–
DBDIS
DBG
Input
Input
Input
I/O
–
–
–
–
DBWO
DH[0-31]
–
–
W12, W11, V11, T9, W10, U9, U10, M11, M9, P8, W7, P9, W9,
R10, W6, V7, V6, U8, V9, T7, U7, R7, U6, W5, U5, W4, P7, V5, V4,
W3, U4, R5
–
–
DL[0-31]
M6, P3, N4, N5, R3, M7, T2, N6, U2, N7, P11, V13, U12, P12, T13,
W13, U13, V10, W8, T11, U11, V12, V8, T1, P1, V1, U1, N1, R2,
V3, U3, W2
High
I/O
–
–
DP[0-7]
DRTRY
GBL
L1, P2, M2, V2, M1, N2, T3, R1
High
Low
Low
–
I/O
Input
I/O
–
–
–
–
H6
B1
–
–
GND
D10, D14, D16, D4, D6, E12, E8, F4, F6, F10, F14, F16, G9, G11,
H5, H8, H10, H12, H15, J9, J11, K4, K6, K8, K10, K12, K14, K16,
L9, L11, M5, M8, M10, M12, M15, N9, N11, P4, P6, P10, P14, P16,
R8, R12, T4, T6, T10, T14, T16
–
GND
GND
HRESET
B6
Low
Low
High
High
Input
Input
–
–
–
–
–
–
–
–
INT
C11
F8
L1_TSTCLK(2)
Input
L2ADDR[0-16]
L17, L18, L19, M19, K18, K17, K15, J19, J18, J17, J16, H18, H17,
J14, J13, H19, G18
Output
10
PC755/745
2138D–HIREL–06/03
PC755/745
Table 2. Pinout Listing for the PC755, 360 PBGA, CBGA and CI-CGA Packages + HiTCE(8) (Continued)
I/F Voltages
Supported(1)
Signal Name
L2AVDD
Pin Number
L13
Active
I/O
–
1.8V/2.0V
3.3V
–
Low
–
2V
–
2V
–
L2CE
P17
Output
Output
Output
I/O
L2CLKOUTA
L2CLKOUTB
L2DATA[0-63]
N15
–
–
L16
–
–
–
U14, R13, W14, W15, V15, U15, W16, V16, W17, V17, U17, W18,
V18, U18, V19, U19, T18, T17, R19, R18, R17, R15, P19, P18,
P13, N14, N13, N19, N17, M17, M13, M18, H13, G19, G16, G15,
G14, G13, F19, F18, F13, E19, E18, E17, E15, D19, D18, D17,
C18, C17, B19, B18, B17, A18, A17, A16, B16, C16, A14, A15,
C15, B14, C14, E13
High
–
–
L2DP[0-7]
L2OVDD
V14, U16, T19, N18, H14, F17, C19, B15
High
–
I/O
–
–
–
3.3V
–
D15, E14, E16, H16, J15, L15, M16, P15, R14, R16, T15, F15
1.8V/2V
L2SYNC_IN
L2SYNC_OUT
L2_TSTCLK(2)
L2VSEL(1)(3)(5)(6)
L2WE
L14
–
Input
Output
Input
Input
Output
Output
Input
Input
–
–
M14
–
–
–
F7
High
High
Low
High
Low
Low
–
–
–
A19
GND
3.3V
–
N16
–
L2ZZ
G17
–
–
LSSD_MODE(2)
F9
–
–
MCP
B11
–
–
–
NC (No-Connect)
OVDD
B3, B4, B5, W19, K9, K114, K194
–
D5, D8, D12, E4, E6, E9, E11, F5, H4, J5, L5, M4, P5, R4, R6, R9,
R11, T5, T8, T12
–
–
1.8V/2V
3.3V
PLL_CFG[0-3]
QACK
QREQ
RSRV
SMI
A4, A5, A6, A7
High
Low
Low
Low
Low
Low
–
Input
Input
Output
Output
Input
Input
Input
Input
Input
I/O
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
B2
J3
D3
A12
E10
H9
F1
SRESET
SYSCLK
TA
Low
High
Low
High
High
High
TBEN
TBST
A2
A11
B10
B7
TCK
Input
Input
Output
TDI(6)
TDO
D9
11
2138D–HIREL–06/03
Table 2. Pinout Listing for the PC755, 360 PBGA, CBGA and CI-CGA Packages + HiTCE(8) (Continued)
I/F Voltages
Supported(1)
Signal Name
TEA
Pin Number
Active
Low
Low
High
Low
Low
High
High
Low
–
I/O
Input
Input
Input
Input
I/O
1.8V/2.0V
3.3V
J1
–
–
–
–
TLBISYNC
TMS(6)
A3
C8
–
–
TRST(6)
A10
–
–
TS
K7
–
–
TSIZ[0-2]
TT[0-4]
WT
A9, B9, C9
Output
I/O
–
–
C10, D11, B12, C12, F11
–
–
C3
Output
–
–
–
VDD
G8, G10, G12, J8, J10, J12, L8, L10, L12, N8, N10, N12
K13
2V
–
2V
–
VOLTDET(7)
High
Output
Notes: 1. OVDD supplies power to the processor bus, JTAG, and all control signals except the L2 cache controls (L2CE, L2WE, and
L2ZZ); L2OVDD supplies power to the L2 cache interface (L2ADDR[0-16], L2DATA[0-63], L2DP[0-7] and L2SYNC-OUT)
and the L2 control signals; and VDD supplies power to the processor core and the PLL and DLL (after filtering to become
AVDD and L2AVDD respectively). These columns serve as a reference for the nominal voltage supported on a given signal as
selected by the BVSEL/L2VSEL pin configurations of Table 4 and the voltage supplied. For actual recommended value of
VIN or supply voltages see Table 5.
2. These are test signals for factory use only and must be pulled up to OVDD for normal machine operation.
3. To allow for future I/O voltage changes, provide the option to connect BVSEL and L2VSEL independently to either OVDD
(selects 3.3V) or to OGND (selects 1.8V/2.0V).
4. These pins are reserved for potential future use as additional L2 address pins.
5. Uses one of 9 existing no-connects in PC750’s 360-BGA package.
6. Internal pull up on die.
7. Internally tied to L2OVDD in the PC755 360-BGA package to indicate the power present at the L2 cache interface. This sig-
nal is not a power supply input.
8. This is different from the PC745 255-BGA package.
12
PC755/745
2138D–HIREL–06/03
PC755/745
Signal Description
Figure 4. PC755 Microprocessor Signal Groups
L2VDD
Not supported in the PC745B
L2AVDD
L2 VSEL
BR
L2ADDR [16-0]
17
1
BG
L2DATA [0-63]
L2DP [0-7]
ADDRESS
ARBITRATION
L2 CACHE
ADDRESS/
DATA
1
1
64
8
ABB
ADDRESS
START
TS
L2CE
1
1
L2WE
L2 CACHE
CLOCK/CONTROL
1
2
L2CLK-OUT [A-B]
L2SYNC_OUT
A[0-31]
AP[0-3]
32
4
1
1
ADDRESS
BUS
L2SYNC_IN
L2ZZ
TT[0-4]
TBST
INT
SMI
5
1
1
1
INTERRUPTS
RESET
TS1Z[0-2]
GBL
MCP
3
1
SRESET
HRESET
1
1
1
1
1
TRANSFER
ATTRIBUTE
WT
CI
CKSTP_IN
1
1
CKSTP_OUT
PC755B
RSRV
TBEN
1
1
1
PROCESSOR
STATUS
CONTROL
TLBISYNC
QREQ
AACK
1
1
1
1
ADDRESS
TERMINATION
ARTRY
QACK
DBG
SYSCLK,
PLL_CFG [0-3]
1
1
1
1
4
1
DBWO
CLOCK
CONTROL
DATA
ARBITRATION
CLK_OUT
DBB
D[0-63]
D[P0-7]
DATA
TRANSFER
64
8
JTAG:COP
TEST INTERFACE
5
3
Factory Test
DBDIS
1
TA
DRTRY
1
1
1
DATA
TERMINATION
VOLTDET
TEA
1
VDD
AVDD
OV
DD
GND
13
2138D–HIREL–06/03
Detailed
Specification
Scope
This drawing describes the specific requirements for the microprocessor PC755, in com-
pliance with Atmel Grenoble standard screening.
Applicable Documents
1) MIL-STD-883: Test methods and procedures for electronics.
2) MIL-PRF-38535 appendix A: General specifications for microcircuits.
Requirements
General
The microcircuits are in accordance with the applicable documents and as specified
herein.
Design and Construction
Terminal Connections
Depending on the package, the terminal connections is shown in Table 1, Table 2 and
Figure 4.
Absolute Maximum Rating
Table 3. Absolute Maximum Ratings(1)
Characteristic
Symbol
VDD
Maximum Value
-0.3 to 2.5
Unit
V
Core supply voltage(4)
PLL supply voltage(4)
AVDD
L2AVDD
OVDD
L2OVDD
Vin
-0.3 to 2.5
V
L2 DLL supply voltage(4)
Processor bus supply voltage(3)
L2 bus supply voltage(3)
-0.3 to 2.5
V
-0.3 to 3.6
V
-0.3 to 3.6
V
Input voltage
Processor bus(2)(5)
-0.3 to OVDD + 0.3V
-0.3 to L2OVDD + 0.3V
-0.3 to 3.6
V
L2 Bus(2)(5)
Vin
V
JTAG Signals
Vin
V
Storage temperature range
Rework Temperature
Tstg
-65 to 150
°C
°C
Trwk
220
Notes: 1. Functional and tested operating conditions are given in Table 5. Absolute maximum ratings are stress ratings only, and func-
tional operation at the maximums is not guaranteed. Stresses beyond those listed may affect device reliability or cause
permanent damage to the device.
2. Caution: VIN must not exceed OVDD or L2OVDD by more than 0.3V at any time including during power-on reset.
3. Caution: L2OVDD/OVDD must not exceed VDD/AVDD/L2AVDD by more than 1.6V during normal operation. During power-on
reset and power-down sequences, L2OVDD/OVDD may exceed VDD/AVDD/L2AVDD by up to 3.3V for up to 20 ms, or by 2.5V
for up to 40 ms. Excursions beyond 3.3V or 40 ms are not supported.
4. Caution: VDD/AVDD/L2AVDD must not exceed L2OVDD/OVDD by more than 0.4V during normal operation. During power-on
reset and power-down sequences, VDD/AVDD/L2AVDD may exceed L2OVDD/OVDD by up to 1.0V for up to 20 ms, or by 0.7V
for up to 40 ms. Excursions beyond 1.0V or 40 ms are not supported.
5. This is a DC specifications only. VIN may overshoot/undershoot to a voltage and for a maximum duration as shown in Figure
5.
14
PC755/745
2138D–HIREL–06/03
PC755/745
Figure 5 shows the allowable undershoot and overshoot voltage on the PC755 and
PC745.
Figure 5. Overshoot/Undershoot Voltage
(L2) OV
+20%
DD
(L2) OV
+5%
DD
(L2) OV
DD
VIH
VIL
Gnd
Gnd - 0.3V
Gnd - 1.0V
Not to exceed 10%
of tSYSCLK
The PC755 provides several I/O voltages to support both compatibility with existing sys-
tems and migration to future systems. The PC755 core voltage must always be provided
at nominal 2.0V (see Table 5 for actual recommended core voltage). Voltage to the L2
I/Os and Processor Interface I/Os are provided through separate sets of supply pins and
may be provided at the voltages shown in Table 4. The input voltage threshold for each
bus is selected by sampling the state of the voltage select pins BVSEL and L2VSEL dur-
ing operation. These signals must remain stable during part operation and cannot
change. The output voltage will swing from GND to the maximum voltage applied to the
OVDD or L2OVDD power pins.
Table 4 describes the input threshold voltage setting.
Table 4. Input Threshold Voltage Setting
Part Revision
BVSEL Signal
Processor Bus Interface Voltage
Not Available
L2VSEL Signal
L2 Bus Interface Voltage
Not Available
E
0
1
0
1
2.5V/3.3V
2.5V/3.3V
Notes: 1. Caution: The input threshold selection must agree with the OVDD/L2OVDD voltages supplied.
2. The input threshold settings above are different for all revisions prior to Rev. 2.8 (Rev. E). For more information, contact your
local Atmel sales office.
15
2138D–HIREL–06/03
Table 5. Recommended Operating Conditions(1)
Recommended Value
300 MHz, 350 MHz 400 MHz
Unit
Characteristic
Symbol
VDD
Min
1.80
1.80
1.80
2.375
3.135
2.375
3.135
GND
GND
GND
-55
Max
2.10
Min
Max
2.10
Core supply voltage(3)
PLL supply voltage(3)
L2 DLL supply voltage(3)
1.90
1.90
V
V
AVDD
2.10
2.10
L2AVDD
OVDD
2.10
1.90
2.10
V
Processor bus supply voltage(2)(4)(5)
L2 bus supply voltage(2)(4)(5)
Input voltage
BVSEL = 1
L2VSEL = 1
2.625
3.465
2.625
3.465
OVDD
L2OVDD
OVDD
125
2.375
3.135
2.375
3.135
GND
GND
GND
-55
2.625
3.465
2.625
3.465
OVDD
L2OVDD
OVDD
125
V
V
L2OVDD
V
V
Processor bus
Vin
Vin
Vin
Tj
V
L2 Bus
V
JTAG Signals
V
Die-junction temperature
Military temperature range
Industrial temperature
°C
°C
Tj
-40
110
-40
110
Notes: 1. These are the recommended and tested operating conditions. Proper device operation outside of these conditions is not
guaranteed.
2. Revisions prior to Rev. 2.8 (Rev. E) offered different I/O voltage support.
3. 2.0V nominal.
4. 2.5V nominal.
5. 3.3V nominal.
Thermal Characteristics
Package Characteristics
Table 6 provides the package thermal characteristics for the PC755.
Table 6. Package Thermal Characteristics
Value
PC755
CBGA
PC755
PBGA
PC745
PBGA
Characteristic
Symbol
RθJA
Unit
°C/W
°C/W
Junction-to-ambient thermal resistance, natural convection(1)(2)
24
17
31
25
34
26
Junction-to-ambient thermal resistance, natural convection, four-layer
(2s2p) board(1)(3)
RθJMA
Junction-to-ambient thermal resistance, 200 ft./min. airflow, single-layer
(1s) board(1)(3)
RθJMA
RθJMA
18
14
25
21
27
22
°C/W
°C/W
Junction-to-ambient thermal resistance, 200 ft./min. airflow, four-layer
(2s2p) board(1)(3)
Junction-to-board thermal resistance(4)
Junction-to-case thermal resistance(5)
RθJB
RθJC
8
17
17
°C/W
°C/W
< 0.1
< 0.1
< 0.1
Notes: 1. Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board) tempera-
ture, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance.
2. Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3. Per JEDEC JESD51-6 with the board horizontal.
16
PC755/745
2138D–HIREL–06/03
PC755/745
4. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1) with the calculated case temperature. The actual value of RÉýJC for the part is less than 0.1°C/W.
Note:
Refer to Section “Thermal Management Information“ page 19 for more details about thermal management.
Package Thermal
Table 7 provides the package thermal characteristics for the PC755, HiTCE.
Characteristics for HiTCE
Table 7. Package Thermal Characteristics for HiTCE Package
Value
Characteristic
Symbol
RθJ
PC755 HiTCE
Unit
°C/W
°C/W
Junction-to-bottom of balls(1)
6.8
Junction-to-ambient thermal resistance, natural
convection, four-layer (2s2p) board(1)(2)
RθJMA
20.7
Junction to board thermal resistance
RθJB
11.0
°C/W
Notes: 1. Simulation, no convection air flow.
2. Per JEDEC JESD51-6 with the board horizontal.
Table 8. Package Thermal Characteristics for CI-CGA
Value
PC755 CI-CGA
8.42
Characteristic
Symbol
RθJB
Unit
Junction to board thermal resistance
°C/W
The board designer can choose between several types of heat sinks to place on the
PC755. There are several commercially-available heat sinks for the PC755 provided by
the following vendors:
For the exposed-die packaging technology, shown in Table 5, the intrinsic conduction
thermal resistance paths are as follows:
•
•
The die junction-to-case (or top-of-die for exposed silicon) thermal resistance
The die junction-to-ball thermal resistance
Figure 6 depicts the primary heat transfer path for a package with an attached heat sink
mounted to a printed-circuit board.
Heat generated on the active side of the chip is conducted through the silicon, then
through the heat sink attach material (or thermal interface material), and finally to the
heat sink where it is removed by forced-air convection.
Since the silicon thermal resistance is quite small, for a first-order analysis, the tempera-
ture drop in the silicon may be neglected. Thus, the heat sink attach material and the
heat sink conduction/convective thermal resistances are the dominant terms.
17
2138D–HIREL–06/03
Figure 6. C4 Package with Head Sink Mounted to a Printed-circuit Board
ExternalResistance
Radiation
Convection
Heat Sink
ThermalInterfaceMaterial
Die/Package
Die Junction
InternalResistance
Package/Leads
Printed±CircuitBoard
Radiation
Convection
ExternalResistance
Note the internal versus external package resistance.
Thermal Management
Assistance
The PC755 incorporates a thermal management assist unit (TAU) composed of a ther-
mal sensor, digital-to-analog converter, comparator, control logic, and dedicated
special-purpose registers (SPRs). Specifications for the thermal sensor portion of the
TAU are found in Table 9. More information on the use of this feature is given in the
Motorola PC755 RISC Microprocessor User’s manual.
Table 9. Thermal Sensor Specifications at Recommended Operating Conditions
(see Table 5)
Characteristic
Min
0
Max
127
–
Unit
°C
s
Temperature range(1)
Comparator settling time(2)(3)
Resolution(3)
20
4
–
°C
°C
Accuracy(3)
-12
+12
Notes: 1. The temperature is the junction temperature of the die. The thermal assist unit’s raw
output does not indicate an absolute temperature, but must be interpreted by soft-
ware to derive the absolute junction temperature. For information about the use and
calibration of the TAU, see Motorola Application Note AN1800/D, “Programming the
Thermal Assist Unit in the PC750 Microprocessor”.
2. The comparator settling time value must be converted into the number of CPU clocks
that need to be written into the THRM3 SPR.
3. Guaranteed by design and characterization.
18
PC755/745
2138D–HIREL–06/03
PC755/745
Thermal Management
Information
This section provides thermal management information for the ceramic ball grid array
(BGA) package for air-cooled applications. Proper thermal control design is primarily
dependent upon the system-level design-the heat sink, airflow and thermal interface
material. To reduce the die-junction temperature, heat sinks may be attached to the
package by several methods-adhesive, spring clip to holes in the printed-circuit board or
package, and mounting clip and screw assembly; see Figure 7. This spring force should
not exceed 5.5 pounds of force.
Figure 7. Package Exploded Cross-Sectional View with Several Heat Sink Options
BGA Package
Heat Sink
Heat Sink
Clip
Adhesive
or
Thermal Interface Material
Printed ± Circuit Board
Option
Ultimately, the final selection of an appropriate heat sink depends on many factors, such
as thermal performance at a given air velocity, spatial volume, mass, attachment
method, assembly, and cost.
19
2138D–HIREL–06/03
Adhesives and Thermal
Interface Materials
Figure 8. Thermal Performance of Select Thermal Interface Material
Silicone Sheet (0.006 inch)
2
Bare Joint
Floroether Oil Sheet (0.007 inch)
Graphite/Oil Sheet (0.005 inch)
Synthetic Grease
1.5
1
0.5
0
0
10
20
30
40
50
60
70
80
Contact Pressure (psi)
A thermal interface material is recommended at the package lid-to-heat sink interface to
minimize the thermal contact resistance. For those applications where the heat sink is
attached by spring clip mechanism, Figure 8 shows the thermal performance of three
thin-sheet thermal-interface materials (silicone, graphite/oil, floroether oil), a bare joint,
and a joint with thermal grease as a function of contact pressure. As shown, the perfor-
mance of these thermal interface materials improves with increasing contact pressure.
The use of thermal grease significantly reduces the interface thermal resistance. That is,
the bare joint results in a thermal resistance approximately 7 times greater than the ther-
mal grease joint.
Heat sinks are attached to the package by means of a spring clip to holes in the printed-
circuit board (see Figure 7). This spring force should not exceed 5.5 pounds of force.
Therefore, the synthetic grease offers the best thermal performance, considering the
low interface pressure.
The board designer can choose between several types of thermal interface. Heat sink
adhesive materials should be selected based upon high conductivity, yet adequate
mechanical strength to meet equipment shock/vibration requirements.
Heat Sink Selection Example
For preliminary heat sink sizing, the die-junction temperature can be expressed as
follows:
Tj = Ta + Tr + (θjc + θint + θsa) * Pd
Where:
Tj is the die-junction temperature
Ta is the inlet cabinet ambient temperature
Tr is the air temperature rise within the computer cabinet
20
PC755/745
2138D–HIREL–06/03
PC755/745
θjc is the junction-to-case thermal resistance
θint is the adhesive or interface material thermal resistance
θsa is the heat sink base-to-ambient thermal resistance
Pd is the power dissipated by the device
During operation the die-junction temperatures (Tj) should be maintained less than the
value specified in Table 5. The temperature of the air cooling the component greatly
depends upon the ambient inlet air temperature and the air temperature rise within the
electronic cabinet. An electronic cabinet inlet-air temperature (Ta) may range from 30 to
40°C. The air temperature rise within a cabinet (Tr) may be in the range of 5 to 10°C.
The thermal resistance of the thermal interface material (θint) is typically about 1°C/W.
Assuming a Ta of 30°C, a Tr of 5oC, a CBGA package θjc = 0.03, and a power consump-
tion (Pd) of 5.0 watts, the following expression for Tj is obtained:
Die-junction temperature: Tj = 30°C + 5°C + (0.03°C/W + 1.0°C/W + θsa) * 5.0 W
For a Thermalloy heat sink #2328B, the heat sink-to-ambient thermal resistance (θsa)
versus airflow velocity is shown in Figure 9.
Figure 9. Thermalloy #2328B Heat Sink-to-Ambient Thermal Resistance Versus Air-
flow Velocity
8
Thermalloy #2328B Pin±fin Heat Sink
7
(25 x28 x 15 mm)
6
5
4
3
2
1
0
0.5
1
1.5
2
2.5
3
3.5
Approach Air Velocity (m/s)
Assuming an air velocity of 0.5 m/s, we have an effective Rsa of 7°C/W, thus
Tj = 30°C+ 5°C+ (0.03°C/W +1.0°C/W + 7°C/W) * 5.0 W,
resulting in a die-junction temperature of approximately 81°C which is well within the
maximum operating temperature of the component.
Other heat sinks offered by Chip Coolers, IERC, Thermalloy, Wakefield Engineering,
and Aavid Engineering offer different heat sink-to-ambient thermal resistances, and may
or may not need air flow.
21
2138D–HIREL–06/03
Though the die junction-to-ambient and the heat sink-to-ambient thermal resistances
are a common figure-of-merit used for comparing the thermal performance of various
microelectronic packaging technologies, one should exercise caution when only using
this metric in determining thermal management because no single parameter can ade-
quately describe three-dimensional heat flow. The final die-junction operating
temperature, is not only a function of the component-level thermal resistance, but the
system-level design and its operating conditions. In addition to the component’s power
consumption, a number of factors affect the final operating die-junction temperature —
airflow, board population (local heat flux of adjacent components), heat sink efficiency,
heat sink attach, heat sink placement, next-level interconnect technology, system air
temperature rise, altitude, etc.
Due to the complexity and the many variations of system-level boundary conditions for
today’s microelectronic equipment, the combined effects of the heat transfer mecha-
nisms (radiation, convection and conduction) may vary widely. For these reasons, we
recommend using conjugate heat transfer models for the board, as well as, system-level
designs. To expedite system-level thermal analysis, several “compact” thermal-package
models are available within FLOTHERM®. These are available upon request.
Power consideration
Power management
The PC755 provides four power modes, selectable by setting the appropriate control
bits in the MSR and HIDO registers. The four power modes are as follows:
•
Full-power: This is the default power state of the PC755. The PC755 is fully
powered and the internal functional units operate at the full processor clock speed.
If the dynamic power management mode is enabled, functional units that are idle
will automatically enter a low-power state without affecting performance, software
execution, or external hardware.
•
Doze: All the functional units of the PC755 are disabled except for the time
base/decrementer registers and the bus snooping logic. When the processor is in
doze mode, an external asynchronous interrupt, a system management interrupt, a
decrementer exception, a hard or soft reset, or machine check brings the PC755
into the full-power state. The PC755 in doze mode maintains the PLL in a fully
powered state and locked to the system external clock input (SYSCLK) so a
transition to the full-power state takes only a few processor clock cycles.
•
•
Nap: The nap mode further reduces power consumption by disabling bus snooping,
leaving only the time base register and the PLL in a powered state. The PC755
returns to the full-power state upon receipt of an external asynchronous interrupt, a
system management interrupt, a decrementer exception, a hard or soft reset, or a
machine check input (MCP). A return to full-power state from a nap state takes only
a few processor clock cycles. When the processor is in nap mode, if QACK is
negated, the processor is put in doze mode to support snooping.
Sleep: Sleep mode minimizes power consumption by disabling all internal functional
units, after which external system logic may disable the PPL and SUSCLK.
Returning the PC755 to the full-power state requires the enabling of the PPL and
SYSCLK, followed by the assertion of an external asynchronous interrupt, a system
management interrupt, a hard or soft reset, or a machine check input (MCP) signal
after the time required to relock the PPL.
22
PC755/745
2138D–HIREL–06/03
PC755/745
Power Dissipation
Table 10. Power Consumption for PC755
Processor (CPU) Frequency
300 MHz
350 MHz
400 MHz
Unit
Full-Power Mode
Typical(1)(3)(4)
Maximum(1)(2)
Doze Mode
3.1
4.5
3.6
5.3
5.4
8
W
W
Maximum(1)(2)(4)
1.8
1
2
2.3
1
W
W
Nap Mode
Maximum(1)(2)(4)
Sleep Mode
1
Maximum(1)(2)(4)
550
550
550
mW
Sleep Mode-PLL and DLL Disabled
Maximum(1)(2)
510
510
510
mW
Notes: 1. These values apply for all valid processor bus and L2 bus ratios. The values do not
include I/O supply power (OVDD and L2OVDD) or PLL/DLL supply power (AVDD and
L2AVDD). OVDD and L2OVDD power is system dependent, but is typically < 10% of
VDD power. Worst case power consumption for AVDD = 15 mW and L2AVDD = 15 mW.
2. Maximum power is measured at nominal VDD (see Table 5) while running an entirely
cache-resident, contrived sequence of instructions which keep the execution units
maximally busy.
3. Typical power is an average value measured at the nominal recommended VDD
(see Table 5) and 65×C in a system while running a typical code sequence.
4. Not 100% tested. Characterized and periodically sampled.
23
2138D–HIREL–06/03
Electrical
Characteristics
Static Characteristics
Table 11. DC Electrical Specifications at Recommended Operating Conditions (see Table 5)
Nominal bus
Characteristic
Voltage(1)
Symbol
VIH
Min
1.6
2
Max
(L2)OVDD + 0.3
(L2)OVDD + 0.3
0.6
Unit
V
Input high voltage (all inputs except SYSLCK)(2)(3)
2.5
3.3
VIH
V
Input low voltage (all inputs except SYSLCK)(2)
SYSCLK input high voltage
2.5
VIL
-0.3
-0.3
1.8
2.4
-0.3
-0.3
–
V
3.3
VIL
0.8
V
2.5
KVIH
KVIH
KVIL
KVIL
Iin
OVDD + 0.3
OVDD + 0.3
0.4
V
3.3
V
SYSCLK input low voltage
2.5
V
3.3
0.4
V
Input leakage current, (2)(3)
VIN = L2OVDD/OVDD
10
µA
Hi-Z (off-state) leakage current, (2)(3)(5)
VIN = L2OVDD/OVDD
ITSI
–
10
µA
Output high voltage, IOH = -6 mA
Output low voltage, IOL = 6 mA
Capacitance, VIN = 0V, f = 1 MHz (3)(4)
2.5
3.3
2.5
3.3
VOH
VOH
VOL
VOL
Cin
1.7
2.4
–
–
–
V
V
0.45
0.4
5
V
–
V
–
pF
Notes: 1. Nominal voltages; See Table 5 for recommended operating conditions.
2. For processor bus signals, the reference is OVDD while L2OVDD is the reference for the L2 bus signals.
3. Excludes test signals (LSSD_MODE, L1_TSTCLK, L2_TSTCLK) and IEEE 1149.1 boundary scan (JTAG) signals.
4. Capacitance is periodically sampled rather than 100% tested.
5. The leakage is measured for nominal OVDD and VDD, or both OVDD and VDD must vary in the same direction (for example,
both OVDD and VDD vary by either +5% or -5%).
Dynamic Characteristics
After fabrication, parts are sorted by maximum processor core frequency as shown in
the “Clock AC Specifications” Section on page 25 and tested for conformance to the AC
specifications for that frequency. These specifications are for 275, 300, 333 MHz pro-
cessor core frequencies. The processor core frequency is determined by the bus
(SYSCLK) frequency and the settings of the PLL_CFG[0-3] signals. Parts are sold by
maximum processor core frequency.
24
PC755/745
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PC755/745
Clock AC Specifications
Table 12 provides the clock AC timing specifications as defined in Table 3.
Table 12. Clock AC Timing Specifications at Recommended Operating Conditions (See Table 5)
Maximum Processor Core Frequency
300 MHz 350 MHz 400 MHz
Unit
Characteristic
Symbol
fcore
Min
200
400
25
10
–
Max
300
600
100
40
Min
Max
350
700
100
40
Min
200
400
25
10
–
Max
400
800
100
40
Processor frequency(1)
VCO frequency(1)
200
400
25
10
–
MHz
MHz
MHz
ns
fVCO
SYSCLK frequency(1)
SYSCLK cycle time
SYSCLK rise and fall time(2)
fSYSCLK
tSYSCLK
tKR & tKF
tKR & tKF
tKHKL/tSYSCLK
2
2
2
ns
–
1.4
60
–
1.4
60
–
1.4
60
ns
SYSCLK duty cycle measured at OVDD/2(3)
SYSCLK jitter(3)(4)
40
–
40
–
40
–
%
150
100
150
100
150
100
ps
Internal PLL relock time(3)(5)
–
–
–
µs
Notes: 1. Caution: The SYSCLK frequency and PLL_CFG[0-3] settings must be chosen such that the resulting SYSCLK (bus) fre-
quency, CPU (core) frequency, and PLL (VCO) frequency do not exceed their respective maximum or minimum operating
frequencies. Refer to the PLL_CFG[0-3] signal description in Table 18,” for valid PLL_CFG[0-3] settings
2. Rise and fall times measurements are now specified in terms of slew rates, rather than time to account for selectable I/O bus
interface levels. The minimum slew rate of 1v/ns is equivalent to a 2ns maximum rise/fall time measured at 0.4V and 2.4V or
a rise/fall time of 1ns measured at 0.4V to 1.4V.
3. Timing is guaranteed by design and characterization.
4. This represents total input jitter – short term and long term combined and is guaranteed by design.
5. Relock timing is guaranteed by design and characterization. PLL-relock time is the maximum amount of time required for
PLL lock after a stable VDD and SYSCLK are reached during the power-on reset sequence. This specification also applies
when the PLL has been disabled and subsequently re-enabled during sleep mode. Also note that HRESET must be held
asserted for a minimum of 255 bus clocks after the PLL-relock time during the power-on reset sequence.
Figure 10 provides the SYSCLK input timing diagram.
Figure 10. SYSCLK Input Timing Diagram
KV
IH
SYSCLK
VM
VM
VM
KV
IL
tKHKL
tSYSCLK
tKR
tKF
VM = Midpoint Voltage (OV /2)
DD
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2138D–HIREL–06/03
Processor Bus AC
Specifications
Table 13 provides the processor bus AC timing specifications for the PC755 as defined
in Figure 11 and Figure 13. Timing specifications for the L2 bus are provided in Section
“L2 Clock AC Specifications» page 28.
Table 13. Processor Bus Mode Selection AC Timing Specifications(1)
At VDD = AVDD = 2.0V 100 mV; -55 ≤ Tj ≤ +125°C, OVDD = 3.3V 165 mV and OVDD = 1.8V ± 100 mV and OVDD = 2.0V 100 mV
Symbols(2)
All Speed Grades
Parameter
Min
Max
–
Unit
tSYSCLk
ns
Mode select input setup to HRESET(3)(4)(5)(6)(7)
HRESET to mode select input hold(3)(4)(6)(7)(8)
tMVRH
tMXRH
8
0
–
Notes: 1. All input specifications are measured from the midpoint of the signal in question to the midpoint of the rising edge of the input
SYSCLK. All output specifications are measured from the midpoint of the rising edge of SYSCLK to the midpoint of the sig-
nal in question. All output timings assume a purely resistive 50Ω load (See Figure 11). Input and output timings are
measured at the pin; time-of-flight delays must be added for trace lengths, vias, and connectors in the system.
2. THe symbology used for timing specifications herein follows the pattern of t(signal)(state)(reference)(state) for inputs and
t(reference)(state)(signal)(state) for outputs. For example, tIVKH symbolizes the time input signals (I) reach the valid state (V) relative
to the SYSCLK reference (K) going to the high (H) state or input setup time. And tKHOV symbolizes the time from SYSCLK(K)
going highs) until outputs (O) are valid (V) or output valid time. Input hold time can be read as the time that the input signal
(I) went invalid (X) with respect to the rising clock edge (KH) - note the position of the reference and its state for inputs – and
output hold time can be read as the time from the rising edge (KH) until the output went invalid (OX). For additional explana-
tion of AC timing specifications in Motorola PowerPC microprocessors, see the application note “Understanding AC Timing
Specifications for PowerPC Microprocessors.”
3. The setup and hold time is with respect to the rising edge of HRESET (see Figure 11).
4. This specification is for configuration mode select only. Also note that the HRESET must be held asserted for a minimum of
255 bus clocks after the PLL re-lock time during the power-on reset sequence.
5. tSYSCLK is the period of the external clock (SYSCLK) in nanoseconds (ns). The numbers given in the table must be multiplied
by the period of SYSCLK to compute the actual time duration (in nanoseconds) of the parameter in question.
6. Mode select signals are BVSEL, L2VSEL, PLL_CFG[0-3]
7. Guaranteed by design and characterization.
8. Bus mode select pins must remain stable during operation. Changing the logic states of BVSEL or L2VSEL during operation
will cause the bus mode voltage selection to change. Changing the logic states of the PLL_CFG pins during operation will
cause the PLL division ratio selection to change. Both of these conditions are considered outside the specification and are
not supported. Once HRESET is negated the states of the bus mode selection pins must remain stable.
Figure 11 provides the mode select input timing diagram for the PC755.
Figure 11. Mode Input Timing Diagram
VM
HRESET
t
MVRH
t
MXRH
MODE SIGNALS
VM = Midpoint Voltage (OV /2)
DD
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PC755/745
Figure 12 provides the AC test load for the PC755.
Figure 12. AC Test Load
OUTPUT
Z
= 50Ω
OV /2
DD
0
R = 50Ω
L
Table 14. Processor Bus AC Timing Specifications(1) at Recommended Operating Conditions
All Speed Grades
Unit
Parameter
Symbols
tIVKH
Min
2.5
0.6
0.2
–
Max
–
Setup Times: All Inputs
ns
ns
Input Hold Times: TLBISYNC, MCP, SMI
Input Hold Times: All Inputs, except TLBISYNC, MCP, SMI
Valid Times: All Outputs
tIXKH
–
tIXKH
–
ns
tKHOV
4.1
–
ns
Output Hold Times: All Outputs
tKHOX
1
ns
SYSCLK to Output Enable(2)
tKHOE
0.5
–
–
ns
SYSCLK to Output High Impedance (all except ABB, ARTRY, DBB)(2)
SYSCLK to ABB, DBB High Impedance After Precharge(2)(3)(4)
Maximum Delay to ARTRY Precharge(2)(3)(5)
SYSCLK to ARTRY High Impedance After Precharge(2)(3)(5)
tKHOZ
6
ns
tKHABPZ
tKHARP
tKHARPZ
–
1
tSYSCLK
tSYSCLK
tSYSCLK
–
1
–
2
Notes: 1. Revisions prior to Rev 2.8 (Rev E) were limited in performance and did not conform to this specification. Contact your local
Motorola sales office for more information.
2. Guaranteed by design and characterization.
3. tSYSCLK is the period of the external clock (SYSCLK) in nanoseconds (ns). The numbers given in the table must be multiplied
by the period of SYSCLK to compute the actual time duration (in ns) of the parameter in question.
4. Per the 60x bus protocol, TS, ABB and DBB are driven only by the currently active bus master. They are asserted low then
precharged high before returning to high-Z as shown in Figure 6. The nominal precharge width for TS, ABB or DBB is 0.5 x
tSYSCLK, i.e. less than the minimum tSYSCLK period, to ensure that another master asserting TS, ABB, or DBB on the following
clock will not contend with the precharge. Output valid and output hold timing is tested for the signal asserted. Output valid
time is tested for precharge.The high-Z behavior is guaranteed by design.
5. Per the 60x bus protocol, ARTRY can be driven by multiple bus masters through the clock period immediately following
AACK. Bus contention is not an issue since any master asserting ARTRY will be driving it low. Any master asserting it low in
the first clock following AACK will then go to high-Z for one clock before precharging it high during the second cycle after the
assertion of AACK. The nominal precharge width for ARTRY is 1.0 tSYSCLK; i.e., it should be high-Z as shown in Figure 6
before the first opportunity for another master to assert ARTRY. Output valid and output hold timing is tested for the signal
asserted. Output valid time is tested for precharge. The high-Z and precharge behavior is guaranteed by design.
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2138D–HIREL–06/03
Figure 13 provides the input/output timing diagram for the PC755.
Figure 13. Input/Output Timing Diagram
SYSCLK
VM
VM
VM
t
IXKH
t
IVKH
ALL INPUTS
t
KHOE
t
t
KHOZ
t
KHOX
KHOV
ALL OUTPUTS
(Except TS, ABB,
ARTRY, DBB)
t
KHABPZ
t
KHOZ
t
KHOX
t
KHOV
TS,ABB,DBB
t
KHARPZ
t
KHOV
t
KHOV
t
KHARP
t
KHOX
ARTRY
VM = Midpoint Voltage (OV /2 or V /2)
DD
in
L2 Clock AC Specifications
The L2CLK frequency is programmed by the L2 Configuration Register (L2CR[4:6])
core-to-L2 divisor ratio. See Table 15 for example core and L2 frequencies at various
divisors. Table 15 provides the potential range of L2CLK output AC timing specifications
as defined in Figure 14.
The minimum L2CLK frequency of Table 15 is specified by the maximum delay of the
internal DLL. The variable-tap DLL introduces up to a full clock period delay in the
L2CLKOUTA, L2CLKOUTB, and L2SYNC_OUT signals so that the returning
L2SYNC_IN signal is phase aligned with the next core clock (divided by the L2 divisor
ratio). Do not choose a core-to-L2 divisor which results in an L2 frequency below this
minimum, or the L2CLKOUT signals provided for SRAM clocking will not be phase
aligned with the PC755 core clock at the SRAMs.
The maximum L2CLK frequency shown in Table 15 is the core frequency divided by
one. Very few L2 SRAM designs will be able to operate in this mode. Most designs will
select a greater core-to-L2 divisor to provide a longer L2CLK period for read and write
access to the L2 SRAMs. The maximum L2CLK frequency for any application of the
PC755 will be a function of the AC timings of the PC755, the AC timings for the SRAM,
bus loading, and printed circuit board trace length.
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PC755/745
Motorola is similarly limited by system constraints and cannot perform tests of the L2
interface on a socketed part on a functional tester at the maximum frequencies of Table
15. Therefore functional operation and AC timing information are tested at core-to-L2
divisors of 2 or greater. Functionality of core-to-L2 divisors of 1 or 1.5 is verified at less
than maximum rated frequencies.
L2 input and output signals are latched or enabled respectively by the internal L2CLK
(which is SYSCLK multiplied up to the core frequency and divided down to the L2CLK
frequency). In other words, the AC timings of Table 16 and Table 17 are entirely inde-
pendent of L2SYNC_IN. In a closed loop system, where L2SYNC_IN is driven through
the board trace by L2SYNC_OUT, L2SYNC_IN only controls the output phase of
L2CLKOUTA and L2CLKOUTB which are used to latch or enable data at the SRAMs.
However, since in a closed loop system L2SYNC_IN is held in phase alignment with the
internal L2CLK, the signals of Table 16 and Table 17 are referenced to this signal rather
than the not-externally-visible internal L2CLK. During manufacturing test, these times
are actually measured relative to SYSCLK.
The L2SYNC_OUT signal is intended to be routed halfway out to the SRAMs and then
returned to the L2SYNC_IN input of the PC755 to synchronize L2CLKOUT at the SRAM
with the processor’s internal clock. L2CLKOUT at the SRAM can be offset forward or
backward in time by shortening or lengthening the routing of L2SYNC_OUT to
L2SYNC_IN. See Motorola Application Note AN179/D “PowerPC™ Backside L2 Timing
Analysis for the PCB Design Engineer.”
The L2CLKOUTA and L2CLKOUTB signals should not have more than two loads.
Table 15. L2CLK Output AC Timing Specification. At VDD = AVDD = 2.0V 100 mV; -55 ≤ Tj ≤ +125°C, OVDD = 3.3V
165 mV and OVDD = 1.8V 100 mV and OVDD = 2.0V 100 mV
All Speed Grades
Parameter
Symbols
Min
80
2.5
45
640
0
Max
450
12.5
55
Unit
MHz
ns
L2CLK frequency(1)(4)
f L2CLK
L2CLK cycle time
t L2CLK
L2CLK duty cycle(2)(7)
tCHCL/tL2CLK
%
Internal DLL-relock time(3)(7)
DLL capture window(5)(7)
L2CLKOUT output-to-output skew(6)(7)
L2CLKOUT output jitter(6)(7)
–
–
L2CLK
ns
–
10
tL2CSKW
–
–
50
ps
–
±150
ps
Notes: 1. L2CLK outputs are L2CLK_OUTA, L2CLK_OUTB, L2CLK_OUT and L2SYNC_OUT pins. The L2CLK frequency to core fre-
quency settings must be chosen so that the resulting L2CLK frequency and core frequency do not exceed their respective
maximum or minimum operating frequencies. The maximum L2LCK frequency will be system dependent. L2CLK_OUTA
and L2CLK_OUTB must have equal loading.
2. The nominal duty cycle of the L2CLK is 50% measured at midpoint voltage.
3. The DLL re-lock time is specified in terms of L2CLKs. The number in the table must be multiplied by the period of L2CLK to
compute the actual time duration in nanoseconds. Re-lock timing is guaranteed by design and characterization.
4. The L2CR[L2SL] bit should be set for L2CLK frequencies less than 110 MHz. This adds more delay to each tap of the DLL.
5. Allowable skew between L2SYNC_OUT and L2SYNC_IN.
6. This output jitter number represents the maximum delay of one tap forward or one tap back from the current DLL tap as the
phase comparator seeks to minimize the phase difference between L2SYNC_IN and the internal L2CLK. This number must
be comprehended in the L2 timing analysis. The input jitter on SYSCLK affects L2CLKOUT and the L2 address/data/control
signals equally and therefore is already comprehended in the AC timing and does not have to be considered in the L2 timing
analysis.
7. Guaranteed by design.
29
2138D–HIREL–06/03
The L2CLK_OUT timing diagram is shown in Figure 14.
Figure 14. L2CLK_OUT Output Timing Diagram
t
t
L2CF
L2 Single-Ended Clock Mode
L2CR
t
L2CLK
t
CHCL
L2CLK_OUTA
L2CLK_OUTB
VM
VM
VM
VM
VM
VM
VM
VM
VM
VM
VM
t
L2CSKW
L2SYNC_OUT
L2 Differential Clock Mode
t
L2CLK
CHCL
t
L2CLK_OUTB
L2CLK_OUTA
VM
VM
VM
VM
VM
VM
L2SYNC_OUT
VM = Midpoint Voltage (L2OVdd/2)
L2 Bus Input AC Specifications
Table 16 provides the L2 bus interface AC timing specifications for the PC755 as
defined in Figure 15 and Figure 16 for the loading conditions described in Figure 17.
Table 16. L2 Bus Interface AC Timing Specifications at Recommended Operating Conditions
All Speed Grades
Parameter
Symbol
L2CR & tL2CF
tDVL2CH
Min
Max
Unit
ns
L2SYNC_IN rise and Fall Time(1)
Setup Times: Data and Parity(2)
Input Hold Times: Data and Parity(2)
t
–
1.2
0
1.0
-
-
ns
tDXL2CH
ns
Valid Times: (3)(4)
tL2CHOV
ns
All Outputs when L2CR[14-15] = 00
All Outputs when L2CR[14-15] = 01
All Outputs when L2CR[14-15] = 10
All Outputs when L2CR[14-15] = 11
-
-
-
-
3.1
3.2
3.3
3.7
Output Hold Times: (3)
tL2CHOX
ns
ns
All Outputs when L2CR[14-15] = 00
All Outputs when L2CR[14-15] = 01
All Outputs when L2CR[14-15] = 10
All Outputs when L2CR[14-15] = 11
0.5
0.7
0.9
1.1
-
-
-
-
L2SYNC_IN to High Impedance:(3)(5)
All Outputs when L2CR[14-15] = 00
All Outputs when L2CR[14-15] = 01
All Outputs when L2CR[14-15] = 10
All Outputs when L2CR[14-15] = 11
tL2CHOZ
-
-
-
-
2.4
2.6
2.8
3.0
30
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2138D–HIREL–06/03
PC755/745
Notes: 1. Rise and fall times for the L2SYNC_IN input are measured from 20% to 80% of L2OVDD
.
2. All input specifications are measured from the midpoint of the signal in question to the midpoint voltage of the rising edge of
the input L2SYNC_IN (see Figure 8). Input timings are measured at the pins.
3. All output specifications are measured from the midpoint voltage of the rising edge of L2SYNC_IN to the midpoint of the sig-
nal in question. The output timings are measured at the pins. All output timings assume a purely resistive 50Ω load (See
Figure 10).
4. The outputs are valid for both single-ended and differential L2CLK modes. For pipelined registered synchronous Bur-
stRAMs, L2CR[14-15] = 01 or 10 is recommended. For pipelined late write synchronous BurstRAMs, L2CR[14-15] = 11 is
recommended.
5. Guaranteed by design and characterization.
6. Revisions prior to Rev 2.8 (Rev E) were limited in performance.and did not conform to this specification. Contact your local
Atmel sales office for more information.
Figure 15 shows the L2 bus input timing diagrams for the PC755.
Figure 15. L2 Bus Input Timing Diagrams
tL2CR
tL2CF
L2SYNC_IN
VM
tDVL2CH
tDXL2CH
L2 DATA AND DATA
PARITY INPUTS
VM = Midpoint Voltage (L2OV /2)
DD
Figure 16 shows the L2 bus output timing diagrams for the PC755.
Figure 16. L2 Bus Output Timing Diagrams
L2SYNC_IN
ALL OUTPUTS
L2DATA BUS
VM
VM
t
L2CHOV
t
L2CHOX
t
L2CHOZ
VM = Midpoint Voltage (L2OV /2)
DD
Figure 17 provides the AC test load for L2 interface of the PC755.
Figure 17. AC Test Load for the L2 Interface
Z
0
OUTPUT
= 50Ω
L2OVdd/2
RL = 50Ω
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2138D–HIREL–06/03
IEEE 1149.1 AC Timing
Specifications
Timing Specifications
Table 17 provides the IEEE 1149.1 (JTAG) AC timing specifications as defined in Figure
18, Figure 19, Figure 20, and Figure 21.
Table 17. JTAG AC Timing Specifications (Independent of SYSCLK)(1)
Parameter
Symbol
fTCLK
Min
0
Max
Unit
MHz
ns
TCK Frequency of operation
TCK Cycle time
16
-
fTCLK
62.5
31
0
TCK Clock pulse width measured at 1.4V
TCK Rise and fall times
TRST Assert time(2)
tJHJL
-
ns
tJR & tJF
tTRST
2
-
ns
25
ns
Input Setup Times:(3)
Boundary-scan data
TMS, TDI
ns
tDVJH
tIVJH
4
0
-
-
Input Hold Times:(3)
Boundary-scan data
TMS, TDI
ns
ns
ns
ns
tDXJH
tIXJH
15
12
-
-
Valid Times:(4)
Boundary-scan data
TDO
tJLDV
tJLOV
-
-
4
4
Output Hold Times:(4)
Boundary-scan data
TDO
tJLDV
tJLOV
25
12
-
-
TCK to output high impedance:(4)(5)
Boundary-scan data
TDO
tJLDZ
tJLOZ
3
3
19
9
Notes: 1. All outputs are measured from the midpoint voltage of the falling/rising edge of TCLK to the midpoint of the signal in ques-
tion. The output timings are measured at the pins. All output timings assume a purely resistive 50Ω load (See Figure 18).
Time-of-flight delays must be added for trace lengths, vias, and connectors in the system.
2. TRST is an asynchronous level sensitive signal. The setup time is for test purposes only.
3. Non-JTAG signal input timing with respect to TCK.
4. Non-JTAG signal output timing with respect to TCK.
5. Guaranteed by design and characterization.
Figure 18 provides the AC test load for TDO and the boundary-scan outputs of the PC755.
Figure 18. ALTERNATE AC Test Load for the JTAG Interface
OUTPUT
Z
= 50Ω
OV /2
DD
0
R = 50Ω
L
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PC755/745
Figure 19 provides the JTAG clock input timing diagram.
Figure 19. JTAG Clock Input Timing Diagram
TCLK
VM
tJHJL
VM
VM
tJR
tJF
tTCLK
VM = Midpoint Voltage (OV /2)
DD
Figure 20 provides the TRST timing diagram.
Figure 20. TRST Timing Diagram
VM
VM
TRST
tTRST
VM = Midpoint Voltage (OV /2)
DD
Figure 21 provides the boundary-scan timing diagram.
Figure 21. Boundary-Scan Timing Diagram
VM
VM
TCK
t
DVJH
t
DXJH
INPUT
DATA VALID
BOUNDARY
DATA INPUTS
t
JLDV
t
JLDH
OUTPUT
DATA
VALID
BOUNDARY
DATA OUTPUTS
t
JLDZ
BOUNDARY
DATA OUTPUTS
OUTPUT DATA VALID
VM = Midpoint Voltage (OV /2)
DD
33
2138D–HIREL–06/03
Figure 22 provides the test access port timing diagram.
Figure 22. Test Access Port Timing Diagram
VM
TCK
TDI, TMS
TDO
VM
t
IVJH
t
IXJH
INPUT
DATA VALID
t
t
JLOV
JLOH
OUTPUT
DATA
VALID
t
JLOZ
OUTPUT DATA VALID
TDO
VM = Midpoint Voltage (OV /2)
DD
JTAG Configuration Signals
Boundary scan testing is enabled through the JTAG interface signals. The TRST signal
is optional in the IEEE 1149.1 specification, but is provided on all processors that imple-
ment the PowerPC architecture. While it is possible to force the TAP controller to the
reset state using only the TCK and TMS signals, more reliable power-on reset perfor-
mance will be obtained if the TRST signal is asserted during power-on reset. Because
the JTAG interface is also used for accessing the common on-chip processor (COP)
function, simply tying TRST to HRESET is not practical.
The COP function of these processors allows a remote computer system (typically, a PC
with dedicated hardware and debugging software) to access and control the internal
operations of the processor. The COP interface connects primarily through the JTAG
port of the processor, with some additional status monitoring signals. The COP port
requires the ability to independently assert HRESET or TRST in order to fully control the
processor. If the target system has independent reset sources, such as voltage moni-
tors, watchdog timers, power supply failures, or push-button switches, then the COP
reset signals must bemerged into these signals with logic.
The arrangement shown in Figure 23 allows the COP port to independently assert
HRESET or TRST, while ensuring that the target can drive HRESET as well. If the JTAG
interface and COP header will not be used, TRST should be tied to HRESET through a
0Ω isolation resistor so that it is asserted when the systemreset signal (HRESET) is
asserted ensuring that the JTAG scan chain is initialized during power-on. While Motor-
ola recommends that the COP header be designed into the system as shown in Figure
23, if this is not possible, the isolation resistor will allow future access to TRST in the
casewhere a JTAG interfacemay need to be wired onto the system in debug situations.
The COP header shown in Figure 23 adds many benefits — breakpoints, watchpoints,
register and memory examination/modification, and other standard debugger features
are possible through this interface — and can be as inexpensive as an unpopulated
footprint for a header to be added when needed.
The COP interface has a standard header for connection to the target system, based on
the 0.025" square-post 0.100" centered header assembly (often called a Berg header).
The connector typically has pin 14 removed as a connector key.
34
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2138D–HIREL–06/03
PC755/745
Figure 23. JTAG Interface Connection
SRESET
SRESET
HRESET
From Target
Board Sources
(if any)
HRESET
QACK
10 kΩ
10 kΩ
10 kΩ
10 kΩ
HRESET
13
11
OVDD
OVDD
SRESET
OVDD
OVDD
0 Ω 5
TRST
1
3
2
4
TRST
4
6
VDD_SENSE
OVDD
OVDD
10 kΩ
2 kΩ
5
6
5 1
15
7
8
CHKSTP_OUT
CHKSTP_OUT
OVDD
10 kΩ
9
10
12
Key
11
10 kΩ
14 2
OVDD
KEY
No pin
13
15
CHKSTP_IN
TMS
CHKSTP_IN
TMS
8
9
1
3
16
TDO
TDI
COP Connector
Physical Pin Out
TDO
TDI
TCK
TCK
7
2
QACK
QACK
OVDD
NC
NC
10
2 kΩ 3
12
16
10 kΩ 4
Notes: 1. RUN/STOP, normally found on pin 5 of the COP header, is not implemented on the PC755. Connect pin 5 of the COP
header to OVDD with a 10 kΩ pull-up resistor.
2. Key location; pin 14 is not physically present on the COP header.
3. Component not populated. Populate only if debug tool does not drive QACK.
4. Populate only if debug tool uses an open-drain type output and does not actively deassert QACK.
5. If the JTAG interface is implemented, connect HRESET from the target source to TRST from the COP header though an
AND gate to TRST of the part. If the JTAG interface is not implemented, connect HRESET fromthe target source to TRST of
the part through a 0Ω isolation resistor.
35
2138D–HIREL–06/03
The COP header shown in Figure 24 adds many benefits—breakpoints, watchpoints,
register and memory examination/modification and other standard debugger features
are possible through this interface – and can be as inexpensive as an unpopulated foot-
print for a header to be added when needed.
System design information
The COP interface has a standard header for connection to the target system, based on
the 0.025” square-post 0.100” centered header assembly (often called a “Berg” header).
The connector typically has pin 14 removed as a connector key.
Figure 24 shows the COP connector diagram.
Figure 24. COP Connector Diagram
TOP VIEW
13
15
16
11
9
7
8
5
6
3
4
1
2
KEY
Pins 10, 12 and 14 are no-connects.
Pin 14 is not physically present
12 10
No pin
There is no standardized way to number the COP header shown in Figure 24; conse-
quently, many different pin numbers have been observed from emulator vendors. Some
are numbered top-to-bottom then left-to-right, while others use left-to-right then top-to-
bottom, while still others number the pins counter clockwise from pin one (as with an IC).
Regardless of the numbering, the signal placement recommended in Figure 24 is com-
mon to all known emulators.
The QACK signal shown in Table 17 is usually hooked up to the PCI bridge chip in a
system and is an input to the PC755 informing it that it can go into the quiescent state.
Under normal operation this occurs during a low power mode selection. In order for
COP to work the PC755 must see this signal asserted (pulled down). While shown on
the COP header, not all emulator products drive this signal. To preserve correct power
down operation, QACK should be merged so that it also can be driven by the PCI
bridge.
36
PC755/745
2138D–HIREL–06/03
PC755/745
Preparation for Delivery
Packaging
Microcircuits are prepared for delivery in accordance with MIL-PRF-38535.
Certificate of Compliance
Atmel offers a certificate of compliances with each shipment of parts, affirming the prod-
ucts are in compliance either with MIL-PRF-883 and guarantying the parameters not
tested at temperature extremes for the entire temperature range.
Handling
MOS devices must be handled with certain precautions to avoid damage due to accu-
mulation of static charge. Input protection devices have been designed in the chip to
minimize the effect of static buildup. However, the following handling practices are
recommended:
1. Devices should be handled on benches with conductive and grounded surfaces.
2. Ground test equipment, tools and operator.
3. Do not handle devices by the leads.
4. Store devices in conductive foam or carriers.
5. Avoid use of plastic, rubber, or silk in MOS areas.
6. Maintain relative humidity above 50 percent if practical.
7. For CI-CGA packages, use specific tray to take care of the highest height of the
package compared with the normal CBGA.
Package Mechanical
Data
The following sections provide the package parameters and mechanical dimensions for
the PC745, 255 PBGA package as well as the PC755, 360 CBGA and PBGA packages.
While both the PC755 plastic and the ceramic packages are described here, both pack-
ages are not guaranteed to be available at the same time. All new designs should allow
for either ceramic or plastic BGA packages for this device. For more information on
designing a common footprint for both plastic and ceramic package types, please con-
tact your local Motorola sales office.
Parameters for the
PC745
Package Parameters for the
PC745 PBGA
The package parameters are as provided in the following list. The package type is
21 x 21 mm, 255-lead plastic ball grid array (PBGA).
Package outline
Interconnects
21 x 21 mm
255 (16 x 16 ball array – 1)
1.27 mm (50 mil)
2.25 mm
Pitch
Minimum module height
Maximum module height
Ball diameter (typical)
2.80 mm
0.75 mm (29.5 mil)
Mechanical Dimensions of the
PC745 PBGA Package
Figure 25 provides the mechanical dimensions and bottom surface nomenclature of the
PC745, 255 PBGA package.
37
2138D–HIREL–06/03
Figure 25. Mechanical Dimensions and Bottom Surface Nomenclature of the PC745 PBGA
0.2
D
A
A1 CORNER
C
0.15 C
E
NOTES:
1. DIMENSIONING AND TOLERANCING
PER ASME Y14.5M, 1994.
2. DIMENSIONS IN MILLIMETERS.
3. TOP SIDE A1 CORNER INDEX IS A
METALIZED FEATURE WITH VARIOUS
SHAPES. BOTTOM SIDE A1 CORNER IS
DESIGNATED WITH A BALL MISSING
FROM THE ARRAY.
2X
0.2
4. CAPACITOR PADS MAY BE UNPOPULATED.
B
Table 1
1
2
3
4
5
6
7
8
9 10 111213141516
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
Millimeters
DIM
A
Min
2.25
0.50
1.00
0.60
Max
2.80
0.70
1.20
0.90
M
A1
A2
b
A2
A1
D
21.00 BSC
A
E
21.00 BSC
1.27 BSC
e
255X
b
e
0.3 C A B
C
0.15
Parameters for the PC755
PBGA
Package Parameter for the
PC755 PBGA
The package parameters are as provided in the following list. The package type is 25 x
25 mm, 360-lead plastic ball grid array (PBGA).
Package outline
Interconnects
25 x 25 mm
360 (19 x 19 ball array – 1)
1.27 mm (50 mil)
2.22 mm
Pitch
Minimum module height
Maximum module height
Ball diameter
2.77 mm
0.75 mm (29.5 mil)
38
PC755/745
2138D–HIREL–06/03
PC755/745
Mechanical Dimensions of the
PC755 PBGA
Figure 26 provides the mechanical dimensions and bottom surface nomenclature of the
PC755, 360 PBGA package.
Figure 26. Mechanical Dimensions and Bottom Surface Nomenclature of the PC755 PBGA
2X
0.2
D
A
A1 CORNER
C
0.15 C
NOTES:
A. DIMENSIONING AND TOLERANCING PER
ASMEY14.5M, 1994.
B. DIMENSIONS IN MILLIMETERS.
C. TOP SIDE A1 CORNER INDEX IS A
METALIZED FEATURE WITH VARIOUS
SHAPES. BOTTOM SIDE A1 CORNER IS
DESIGNATED WITH A BALL MISSING
FROM THE ARRAY.
E
2X
0.2
Millimeters
B
DIM
A
Min
2.22
0.50
1.00
0.60
Max
2.77
0.70
1.20
0.90
171819
1
2
3
4
5
6
7
8 9 10 111213141516
W
V
U
M
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
A1
A2
b
D
25.00 BSC
A2
A1
E
25.00 BSC
1.27 BSC
e
A
e
360X
b
0.3 C A B
C
0.15
39
2138D–HIREL–06/03
Mechanical Dimensions of the Figure 28 provides the mechanical dimensions and bottom surface nomenclature of the
PC755 CBGA Package PC755, 360 CBGA package.
Figure 27. Mechanical Dimensions and Bottom Surface Nomenclature of PC755 (CBGA)
2X
0.2
D
A
A1 CORNER
D1
C
0.15
C
NOTES:
1. DIMENSIONING AND TOLERANCING
PER ASME Y14.5M, 1994.
E1
2. DIMENSIONS IN MILLIMETERS.
3. TOP SIDE A1 CORNER INDEX IS A
METALIZED FEATURE WITH VARIOUS
SHAPES. BOTTOM SIDE A1 CORNER IS
DESIGNATED WITH A BALL MISSING
FROM THE ARRAY.
E
2X
0.2
Millimeters
1
2 3 4 5 6 7 8 9 10 111213141516 171819
DIM
A
Min
2.65
0.79
1.10
—
Max
3.20
0.99
1.30
0.60
0.93
W
V
U
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
A1
A2
A3
b
0.82
D
25.00 BSC
A3
A2
D1
E
6.75
25.00 BSC
7.87
A1
A
E1
e
e
0.3 C A B
1.27 BSC
C
0.15
360X
b
40
PC755/745
2138D–HIREL–06/03
PC755/745
Mechanical Dimensions of the Figure 28 provides the mechanical dimensions and bottom surface nomenclature of the
PC755 HiTCE Package
PC755, 360 HiTCE package.
Figure 28. Mechanical Dimensions and Bottom Surface Nomenclature of PC755 (HiTCE)
2X
0.2
D
A
A1 CORNER
D1
C
0.15 C
NOTES:
1. DIMENSIONING AND TOLERANCING
PER ASME Y14.5M, 1994.
2. DIMENSIONS IN MILLIMETERS.
3. TOP SIDE A1 CORNER INDEX IS A
METALIZED FEATURE WITH VARIOUS
SHAPES. BOTTOM SIDE A1 CORNER IS
DESIGNATED WITH A BALL MISSING
FROM THE ARRAY.
E1
E
2X
0.2
Millimeters
1
2 3 4 5 6 7 8 9 10 111213141516 171819
DIM
A
Min
2.65
0.79
1.10
—
Max
3.24
0.99
1.30
0.60
0.93
W
V
U
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
A1
A2
A3
b
0.82
D
25.00 BSC
A3
A2
D1
E
6.75
25.00 BSC
7.87
A1
A
E1
e
e
0.3 C A B
1.27 BSC
C
0.15
360X
b
41
2138D–HIREL–06/03
Mechanical Dimensions of the Figure 29 provides the mechanical dimensions and bottom surface nomenclature of
PC755 CI-CGA Package PC755, 360 CI-CGA package
Figure 29. Mechanical Dimensions and Bottom Surface Nomenclature of PC755 (CI-CGA)
2X
0.2
A
D
A
A2
A1 CORNER
D1
A4
360 X
0.15 A
NOTES:
1. DIMENSIONING AND TOLERANCING
PER ASME Y14.5M, 1994.
E1
2. DIMENSIONS IN MILLIMETERS.
3. TOP SIDE A1 CORNER INDEX IS A
METALIZED FEATURE WITH VARIOUS
SHAPES. BOTTOM SIDE A1 CORNER IS
DESIGNATED WITH A BALL MISSING
FROM THE ARRAY.
E
2X
0.2
Millimeters
1
2 3 4 5 6 7 8 9 10 111213141516 171819
DIM
A
Min
Max
W
V
U
4.04 BSC
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
A1
A2
A3
1.545
1.10
—
1.695
1.30
0.60
A4
A5
0.82
0.9
A1
A6
0.10 BSC
A3
0.25
0.79
0.35
A6
b
A5
0.990
D
25.00 BSC
e
0.3 C A B
D1
6.75
C
0.15
360X
b
E
E1
e
25.00 BSC
7.87
1.27 BSC
Clock Relationship
Choices
The PC755’s PLL is configured by the PLL_CFG[0-3] signals. For a given SYSCLK
(bus) frequency, the PLL configuration signals set the internal CPU and VCO frequency
of operation. The PLL configuration for the PC755 is shown in Figure 31 for example
frequencies.
42
PC755/745
2138D–HIREL–06/03
PC755/745
Table 18. PC755 Microprocessor PLL Configuration
Example Bus-to-Core Frequency in MHz (VCO Frequency in MHz)
Bus-to-Core
Multiplier
Core-toVCO
Multiplier
Bus 33
MHz
Bus 50
MHz
Bus 66
MHz
Bus 75
MHz
Bus 80
MHz
Bus 100
MHz
PLL_CFG [0-3]
200
(400)
0100
2x
3x
2x
2x
2x
2x
2x
2x
2x
2x
2x
2x
2x
2x
2x
-
-
-
-
-
-
-
-
-
-
-
-
-
200
(400)
225
(450)
240
(480)
300
(600)
1000
1110
1010
0111
1011
1001
1101
0101
0010
0001
1100
0110
233
(466)
263
(525)
280
(560)
350
(700)
3.5x
4x
200
(400)
266
(533)
300
(600)
320
(640)
400
(800)
225
(450)
300
(600)
338
(675)
360
(720)
4.5x
5x
-
-
-
-
-
-
-
-
-
250
(500)
333
(666)
375
(750)
400
(800)
275
366
5.5x
6x
-
-
-
-
-
-
-
-
-
-
-
-
-
-
(550)
5733°
200
(400)
300
(600)
400
(800)
216
(433)
325
(650)
6.5x
7x
-
-
-
-
-
233
(466)
350
(700)
250
(500)
375
(750)
7.5x
8x
266
(533)
400
(800)
333
(666)
10x
-
0011
1111
PLL off/bypass
PLL off
PLL off, SYSCLK clocks core circuitry directly, 1x bus-to-core implied
PLL off, no core clocking occurs
Notes: 1. PLL_CFG[0:3] settings not listed are reserved.
2. The sample bus-to-core frequencies shown are for reference only. Some PLL configurations may select bus, core, or VCO
frequencies which are not useful, not supported, or not tested for by the PC755; see Section «Clock AC Specifications»
page 25 for valid SYSCLK, core, and VCO frequencies.
3. In PLL-bypass mode, the SYSCLK input signal clocks the internal processor directly, the PLL is disabled, and the bus mode
is set for 1:1 mode operation. This mode is intended for factory use and emulator tool use only.
Note: The AC timing specifications given in this document do not apply in PLL-bypass mode.
4. In PLL off mode, no clocking occurs inside the PC755 regardless of the SYSCLK input.
43
2138D–HIREL–06/03
The PC755 generates the clock for the external L2 synchronous data SRAMs by divid-
ing the core clock frequency of the PC755. The divided-down clock is then phase-
adjusted by an on-chip delay-lock-loop (DLL) circuit and should be routed from the
PC755 to the external RAMs. A separate clock output, L2SYNC_OUT is sent out half
the distance to the SRAMs and then returned as an input to the DLL on pin L2SYNC_IN
so that the rising-edge of the clock as seen at the external RAMs can be aligned to the
clocking of the internal latches in the L2 bus interface.
The core-to-L2 frequency divisor for the L2 PLL is selected through the L2CLK bits of
the L2CR register. Generally, the divisor must be chosen according to the frequency
supported by the external RAMs, the frequency of the PC755 core, and the phase
adjustment range that the L2 DLL supports. Figure 18 shows various example L2 clock
frequencies that can be obtained for a given set of core frequencies. The minimum L2
frequency target is 80 MHz.
Table 19. Sample Core-to-L2 Frequencies
Core Frequency in MHz
1
1.5
166
177
183
200
217
222
233
244
250
266
2
2.5
100
106
110
120
130
133
140
146
150
160
3
250
266
275
300
325
333
350
366
375
400
250
266
275
300
325
333
350
366
375
400
125
133
138
150
163
167
175
183
188
200
83
89
92
100
108
111
117
122
125
133
Note: The core and L2 frequencies are for reference only. Some examples may repre-
sent core or L2 frequencies which are not useful, not supported, or not tested
for by the PC755; see Section “L2 Clock AC Specifications” page 28 for valid
L2CLK frequencies. The L2CR[L2SL] bit should be set for L2CLK frequencies
less than 110 MHz.
System Design
Information
PLL Power Supply Filtering
The AVDD and L2AVDD power signals are provided on the PC755 to provide power to the
clock generation phase-locked loop and L2 cache delay-locked loop respectively. To
ensure stability of the internal clock, the power supplied to the AVDD input signal should
be filtered of any noise in the 500 kHz to 10 MHz resonant frequency range of the PLL.
A circuit similar to the one shown in Figure 31 using surface mount capacitors with mini-
mum Effective Series Inductance (ESL) is recommended. Consistent with the
recommendations of Dr. Howard Johnson in High Speed Digital Design: A Handbook of
Black Magic (Prentice Hall, 1993), multiple small capacitors of equal value are recom-
mended over a single large value capacitor.
44
PC755/745
2138D–HIREL–06/03
PC755/745
The circuit should be placed as close as possible to the AVDD pin to minimize noise cou-
pled from nearby circuits. An identical but separate circuit should be placed as close as
possible to the L2AVDD pin. It is often possible to route directly from the capacitors to the
AVDD pin, which is on the periphery of the 360 BGA footprint, without the inductance of
vias. The L2AVDD pin may be more difficult to route but is proportionately less critical.
Figure 30. PLL Power Supply Filter Circuit
10 Ω
V
AV (or L2AV
)
DD
DD
DD
2.2 µF
2.2 µF
Low ESL Surface Mount Capacitors
GND
Power Supply Voltage
Sequencing
The notes in Figure 32 contain cautions about the sequencing of the external bus volt-
ages and core voltage of the PC755 (when they are different). These cautions are
necessary for the long term reliability of the part. If they are violated, the ESD (Electro-
static Discharge) protection diodes will be forward biased and excessive current can
flow through these diodes. If the system power supply design does not control the volt-
age sequencing, the circuit of Figure 32 can be added to meet these requirements. The
MUR420 Schottky diodes of Figure 32 control the maximum potential difference
between the external bus and core power supplies on power-up and the 1N5820 diodes
regulate the maximum potential difference on power-down.
Figure 31. Example Voltage Sequencing Circuit
3.3V
2.0V
MURS320
MURS320
1N5820
1N5820
Decoupling
Recommendations
Due to the PC755’s dynamic power management feature, large address and data
buses, and high operating frequencies, the PC755 can generate transient power surges
and high frequency noise in its power supply, especially while driving large capacitive
loads. This noise must be prevented from reaching other components in the PC755 sys-
tem, and the PC755 itself requires a clean, tightly regulated source of power. Therefore,
it is recommended that the system designer place at least one decoupling capacitor at
each VDD, OVDD, and L2OVDD pin of the PC755. It is also recommended that these
decoupling capacitors receive their power from separate VDD, (L2)OVDD and GND power
planes in the PCB, utilizing short traces to minimize inductance.
These capacitors should have a value of 0.01 µF or 0.1 µF. Only ceramic SMT (surface
mount technology) capacitors should be used to minimize lead inductance, preferably
0508 or 0603 orientations where connections are made along the length of the part.
45
2138D–HIREL–06/03
In addition, it is recommended that there be several bulk storage capacitors distributed
around the PCB, feeding the VDD, L2OVDD, and OV vplanes, to enable quick recharging
of the smaller chip capacitors. These bulk capacitors should have a low ESR (equivalent
series resistance) rating to ensure the quick response time necessary. They should also
be connected to the power and ground planes through two vias to minimize inductance.
Suggested bulk capacitors – 100-330 µF (AVX TPS tantalum or Sanyo OSCON).
Connection
Recommendations
To ensure reliable operation, it is highly recommended to connect unused inputs to an
appropriate signal level through a resistor. Unused active low inputs should be tied to
OVDD. Unused active high inputs should be connected to GND. All NC (no-connect) sig-
nals must remain unconnected.
Power and ground connections must be made to all external VDD, OVDD, L2OVDD, and
GND pins of the PC755.
Output Buffer DC Impedance
The PC755 60x and L2 I/O drivers are characterized over process, voltage, and temper-
ature. To measure Z0, an external resistor is connected from the chip pad to (L2)OVDD or
GND. Then, the value of each resistor is varied until the pad voltage is (L2)OVDD/2 (See
Figure 33).
The output impedance is the average of two components, the resistances of the pull-up
and pull-down devices. When Data is held low, SW2 is closed (SW1 is open), and RN is
trimmed until the voltage at the pad equals (L2)OVDD/2. RN then becomes the resistance
of the pull-down devices. When Data is held high, SW1 is closed (SW2 is open), and RP
is trimmed until the voltage at the pad equals (L2)OVDD/2. RP then becomes the resis-
tance of the pull-up devices.
NO TAG describes the driver impedance measurement circuit described above.
Figure 32. Driver Impedance Measurement Circuit
(L2)OV
(L2)OV
DD
DD
R
N
SW2
SW1
Pad
Data
R
P
OGND
46
PC755/745
2138D–HIREL–06/03
PC755/745
Alternately, the following is another method to determine the output impedance of the
PC755. A voltage source, Vforce, is connected to the output of the PC755 as in Figure 33.
Data is held low, the voltage source is set to a value that is equal to (L2)OVDD/2 and the
current sourced by Vforce is measured. The voltage drop across the pull-down device,
which is equal to (L2)OVDD/2, is divided by the measured current to determine the output
impedance of the pull-down device, RN. Similarly, the impedance of the pull-up device is
determined by dividing the voltage drop of the pull-up, (L2)OVDD/2, by the current sank
by the pull-up when the data is high and Vforce is equal to (L2)OVDD/2. This method can
be employed with either empirical data from a test set up or with data from simulation
models, such as IBIS.
RP and RN are designed to be close to each other in value. Then Z0 = (RP + RN)/2.
Figure 33 describes the alternate driver impedance measurement circuit.
Figure 33. Alternate Driver Impedance Measurement Circuit
(L2)OV
DD
BGA
Pin
Data
Vforce
OGND
Table 20 summarizes the signal impedance results. The driver impedance values were
characterized at 0°C, 65°C, and 105°C. The impedance increases with junction temper-
ature and is relatively unaffected by bus voltage.
Table 20. Impedance Characteristics
V
DD = 2.0V, OVDD = 3.3V, Tc = 0 - 105°C
Impedance
Processor bus
25-36
L2 bus
25-36
26-39
Symbol
Unit
W
RN
RP
Z0
Z0
26-39
W
Pull–up Resistor
Requirements
The PC755 requires pull-up resistors (1 kΩ – 5 kΩ) on several control pins of the bus
interface to maintain the control signals in the negated state after they have been
actively negated and released by the processor or other bus masters. These pins are
TS, ABB, AACK, ARTRY, DBB, DBWO, TA, TEA, and DBDIS. DRTRY should also be
connected to a pull-up resistor (1 kΩ – 5 kΩ) if it will be used by the system; otherwise,
this signal should be connected to HRESET to select NO-DRTRY mode.
Three test pins also require pull-up resistors (100Ω – 1 kΩ). These pins are
L1_TSTCLK, L2_TSTCLK, and LSSD_MODE. These signals are for factory use only
and must be pulled up to OVDD for normal machine operation.
47
2138D–HIREL–06/03
In addition, CKSTP_OUT is an open-drain style output that requires a pull-up resistor (1
kΩ – 5 kΩ) if it is used by the system.
During inactive periods on the bus, the address and transfer attributes may not be
driven by any master and may, therefore, float in the high-impedance state for relatively
long periods of time. Since the processor must continually monitor these signals for
snooping, this float condition may cause additional power draw by the input receivers on
the processor or by other receivers in the system. These signals can be pulled up
through weak (10 kΩ) pull-up resistors by the system or may be otherwise driven by the
system during inactive periods of the bus to avoid this additional power draw, but
address bus pull-up resistors are not neccessary for proper device operation. The
snooped address and transfer attribute inputs are:
A[0:31], AP[0:3], TT[0:4], TBST, and GBL.
The data bus input receivers are normally turned off when no read operation is in
progress and, therefore, do not require pull-up resistors on the bus. Other data bus
receivers in the system, however, may require pull-ups, or that those signals be other-
wise driven by the system during inactive periods by the system. The data bus signals
are: DH[0:31], DL[0:31], and DP[0:7].
If 32-bit data bus mode is selected, the input receivers of the unused data and parity bits
will be disabled, and their outputs will drive logic zeros when they would otherwise nor-
mally be driven. For this mode, these pins do not require pull-up resistors, and should be
left unconnected by the system to minimize possible output switching.
If address or data parity is not used by the system, and the respective parity checking is
disabled through HID0, the input receivers for those pins are disabled, and those pins
do not require pull-up resistors and should be left unconnected by the system. If all par-
ity generation is disabled through HID0, then all parity checking should also be disabled
through HID0, and all parity pins may be left unconnected by the system.
Definitions
Datasheet Status
Validity
Objective specification
This datasheet contains target and goal specification for
discussion with customer and application validation.
Before design phase.
Target specification
This datasheet contains target or goal specification for
product development.
Valid during the design phase.
Valid before characterization phase.
Preliminary specification site
Preliminary specification β site
This datasheet contains preliminary data. Additional data
may be published later; could include simulation result.
This datasheet contains also characterization results.
Valid before the industrialization
phase.
Product specification
This datasheet contains final product specification.
Valid for production purpose.
Limiting Values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the
limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at
any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values
for extended periods may affect device reliability.
Application Information
Where application information is given, it is advisory and does not form part of the specification.
48
PC755/745
2138D–HIREL–06/03
PC755/745
Life Support
Applications
These products are not designed for use in life support appliances, devices, or systems
where malfunction of these products can reasonably be expected to result in personal
injury. Atmel customers using or selling these products for use in such applications do
so at their own risk and agree to fully indemnity Atmel for any damages resulting from
such improper use or sale.
Differences with
Commercial Part
Commercial part
Military part
Temperature range
Tj = 0 to 105°C
Tj = -55°C to 125°C
Ordering Information
PC755C
M
ZF
U
300
L
x
(1)
Revision Level
E: Rev. 2.8
Type
Temperature Range: Tj
M: -55 C, +125 C
Bus divider
(to be confirmed)
V: -40 C, +110 C
L: Any valid PLL configuration
Max internal processor speed
300: 300 MHz
350: 350 MHz
366: 366 MHz
400: 400 MHz
Package:
ZF: FC-PBGA
G: CBGA
GS: CI-CGA
GH: HiTCE
(1)
Screening Level
U: Upscreening Test
Note:
For availability of different versions, contact your Atmel sales office.
49
2138D–HIREL–06/03
Atmel Corporation
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e-mail
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Web Site
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Disclaimer: Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard
warranty which is detailed in Atmel’s Terms and Conditions located on the Company’s web site. The Company assumes no responsibility for any
errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and
does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are
granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are not authorized for use
as critical components in life support devices or systems.
© Atmel Corporation 2003. All rights reserved. Atmel® and combinations thereof, are the registered trade-
marks of Atmel Corporation or its subsidiaries. The PowerPC names and the PowerPC logotype are trade-
marks of International Business Machines Corporation, used under license therform.
Motorola is the registered trademark of Motorola, Inc. AltiVec™ is a trademark of Motorola, Inc.
Other terms and product names may be the trademarks of others.
Printed on recycled paper.
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