HDJD-J822 [AVAGO]
Color Management System Feedback Controller; 色彩管理系统反馈控制器
| 型号： | HDJD-J822 |
| 厂家： | 
AVAGO TECHNOLOGIES LIMITED |
| 描述： | Color Management System Feedback Controller |
| 文件： | 总2页 (文件大小：72K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
HDJD-J822
Color Management System Feedback Controller
Data Sheet
Description
Failure Rate Prediction
The following cumulative test results have been ob-
tained from testing performed at Avago Technologies
in accordance with the latest revision of JEDEC. Avago
Technologies tests parts at the absolute maximum rated
conditions recommended for the device. The actual per-
formance you obtain from Avago Technologies parts de-
pends on the electrical and environmental characteristics
of your application but will probably be better than the
performance outlined in Table 1.
The junction temperature of the device determines the
failure rate of semiconductor devices. The relationship
between ambient temperature and actual junction tem-
perature is given by the following:
T (°C) = T (°C) + θ
P
J
A
JA AVG
where:
T = ambient temperature in °C
A
θ
= thermal resistance of junction-to-ambient in °C/
JA
Watt
P
AVG
= average power dissipated in Watt
The estimated MTBF and failure rate at temperatures low-
er than the actual stress temperature can be determined
by using an Arrhenius model for temperature accelera-
tion. Results of such calculations are shown in the table
below using activation energy of 0.7eV.
Table 1. Life Tests
Demonstrated Performance
Performance in Time
(60% confidence)
Stress Test
Conditions
Total
Device Hrs
Units
Tested Failed
Units
[1]
[2]
Test Name
MTBF
2.52 x 10
Failure Rate (FIT)
5
High Temperature
Operating Life
T = 85°C,
A
231,000
231
0
3968
AVdd = 5.5V,
DVdd = 5.5V
Table 2.
Performance in Time
(60% Confidence)
Performance in Time
(90% Confidence)
Ambient
Temperature Temperature
Junction
[3]
[1]
[2]
(°C)
85
75
65
55
45
35
(°C)
87
82
77
57
47
37
27
MTBF (hrs) Failure Rate (FIT)
MTBF (hrs) Failure Rate (FIT)
5
5
2.52 x 10
4.81 x 10
9.52 x 10
1.97 x 10
4.25 x 10
9.65 x 10
2.32 x 10
3968
2080
1050
508
235
104
43
1.00 x 10
1.91 x 10
3.79 x 10
7.83 x 10
1.69 x 10
3.84 x 10
9.22 x 10
9970
5225
2638
1277
591
5
5
6
6
6
7
5
5
5
6
6
6
260
25
108
Notes:
1. The 60% or 90% confidence MTBF represents the minimum level of reliability performance which is expected from 60% or 90% of all samples.
The confidence level is established based on the chi-square distribution.
9
2. Failure rate (FIT) is 1/MTBF x 10 , assuming the failures are exponentially distributed.
3. Calculated from data generated at 85°C biased at DVdd 5.5V, AVdd 5.5V and θ = 45°C/watt
JA
Table 3. Environmental Tests
Test Name
Test Conditions
Units Tested
Units Failed
Temperature Cycle
HAST
-65°C/+150°C, 500 cycles
130°C/85%RH, 96 hrs
121°C, 15psig, 96 hrs
150°C, 1000hrs
231
231
231
45
0
0
0
0
Autoclave
High Temperature Storage
Table 4. Electrostatic Discharge (ESD) Classification Test Results:
Test Name
Reference
Results
ESD Human Body Model
ESD Machine Model
Latch up at 125°C
MILSTD 883, Method 3015
MILSTD 883, Method 3015
AEC-Q100-004
2000V
200V
Pass (+/-100mA)
Moisture Sensitivity Classification: Class 3
Pre-conditioning per JESD22-A113-A class 3 was per-
formed on all devices prior to reliability testing except
for High Temperature Operating Life and electrical veri-
fication test.
For product information and a complete list of distributors, please go to our web site: www.avagotech.com
Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies, Pte. in the United States and other countries.
Data subject to change. Copyright © 2006 Avago Technologies Pte. All rights reserved.
5989-4106EN - April 21, 2006
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