HEDL-5500 [AVAGO]

Motion Sensing Products, Optical Encoder Modules; 运动传感产品,光电编码器模块
HEDL-5500
型号: HEDL-5500
厂家: AVAGO TECHNOLOGIES LIMITED    AVAGO TECHNOLOGIES LIMITED
描述:

Motion Sensing Products, Optical Encoder Modules
运动传感产品,光电编码器模块

光电 编码器
文件: 总2页 (文件大小:94K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HEDL-5500, HEDL-5600, HEDL-6500, HEDL-9x00 Series  
Motion Sensing Products, Optical Encoder Modules  
Reliability Data Sheet  
Description  
Failure Rate Prediction  
The following cumulative test results have been obtained The failure rate of semiconductor devices is determined  
from testing performed at Avago Technologies Malaysia by the junction temperature of the device. The relation-  
in accordance with the latest revisions of JEDEC standards ship between ambient temperature and actual junction  
temperature is given by the following:  
Avago tests parts at the absolute maximum rated condi-  
tions recommended for the device. The actual perfor- T (°C) = T (°C) + θ P  
J
A
JA AVG  
mance you obtain from Avago parts depends on the where T = ambient temperature in °C  
A
electrical and environmental characteristics of your appli-  
cation but will probably be better than the performance  
outlined in Table 1.  
θ
= thermal resistance of junction-to-ambient in °C/Watt  
JA  
P
AVG  
= average power dissipated in Watt  
The estimated MTTF and failure rate at temperatures  
lower than the actual stress temperature can be deter-  
mined by using an Arrhenius model for temperature  
acceleration. Results of such calculations are shown in  
the table below using an activation energy of 0.43eV  
(reference MIL-HDBK-217).  
Table 1. Life Tests  
Demonstrated Performance  
Point Typical Performance  
Total Device  
Hours  
30,000  
Units  
Tested  
Total  
Failed  
Failure Rate  
(% /1 K Hours)  
[3]  
Test Name  
Stress Test Conditions  
MTTF  
High Temperature Operating Life Vcc=5.0V, T =ꢀ00°C  
30  
0
32,700  
3.06  
A
Table 2.  
[1]  
[2]  
Point Typical Performance in Time  
Performance in Time (90% Confidence)  
Ambient  
Junction  
Failure Rate  
Failure Rate  
Temperature (°C)  
Temperature (°C)  
MTTF(1)  
32,700  
46,300  
67,000  
98,900  
ꢀ49,400  
23ꢀ,ꢀ00  
367,800  
(% / 1K Hours)  
MTTF(2)  
ꢀ3,020  
ꢀ8,460  
26,680  
39,390  
59,470  
92,060  
ꢀ46,400  
(% /1K Hours)  
ꢀ00  
90  
80  
70  
60  
50  
40  
ꢀꢀ0  
ꢀ00  
90  
3.06  
2.ꢀ5  
ꢀ.49  
ꢀ.0ꢀ  
0.66  
0.43  
0.27  
7.68  
5.42  
3.75  
80  
2.54  
70  
ꢀ.68  
60  
ꢀ.08  
50  
0.68  
Notes:  
1. The point typical MTTF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero  
failures, one failure is assumed for this calculation.  
2. The 90% Confidence MTTF represents the minimum level of reliability performance which is expected from 90% of all samples. This confidence  
interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This particular distribution is  
commonly used in describing useful life failures.  
3. Failures are catastrophic or parametric. Catastrophic failures are open, short, no logic output, no dynamic parameters while parametric failures are  
failures to meet an electrical characteristic as specified in product catalog such as output voltage, duty or state errors.  
Example of Failure Rate Calculation  
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is:  
(8 hours/day) x (5 days/week) / (168 hours/week) = 0.25  
The point failure rate per year (8760 hours) at 50°C ambient temperature is:  
(0.43% / 1K hours) x 0.25 X (8760 hours/year) = 0.94% per year  
Similarly, 90% confidence level failure rate per year at 50°C:  
(1.08% / 1K hours) X 0.25 X (8760 hours/year) = 2.36% per year  
Table 3. Environmental Tests  
Test Name  
Test Conditions  
Units Tested  
Unit Failed  
Storage Temperature Cycle  
Wet High Temperature Storage life  
Low Temperature Storage Life  
-40°C to ꢀ00°C, ꢀ5min dwell time. 5 min transfer. ꢀ000 cycles  
90  
90  
90  
0
0
0
T =85°C, RH=85%, ꢀ000 hours  
A
T =-40°C, ꢀ000 hours  
A
For product information and a complete list of distributors, please go to our web site: www.avagotech.com  
Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies, Limited in the United States and other countries.  
Data subject to change. Copyright © 2006 Avago Technologies Limited. All rights reserved.  
AV0ꢀ-0682EN - December ꢀ9, 2006  

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