HEDL-5500 [AVAGO]
Motion Sensing Products, Optical Encoder Modules; 运动传感产品,光电编码器模块![HEDL-5500](http://pdffile.icpdf.com/pdf1/p00106/img/icpdf/HEDL-5500_571106_icpdf.jpg)
型号: | HEDL-5500 |
厂家: | ![]() |
描述: | Motion Sensing Products, Optical Encoder Modules |
文件: | 总2页 (文件大小:94K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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HEDL-5500, HEDL-5600, HEDL-6500, HEDL-9x00 Series
Motion Sensing Products, Optical Encoder Modules
Reliability Data Sheet
Description
Failure Rate Prediction
The following cumulative test results have been obtained The failure rate of semiconductor devices is determined
from testing performed at Avago Technologies Malaysia by the junction temperature of the device. The relation-
in accordance with the latest revisions of JEDEC standards ship between ambient temperature and actual junction
temperature is given by the following:
Avago tests parts at the absolute maximum rated condi-
tions recommended for the device. The actual perfor- T (°C) = T (°C) + θ P
J
A
JA AVG
mance you obtain from Avago parts depends on the where T = ambient temperature in °C
A
electrical and environmental characteristics of your appli-
cation but will probably be better than the performance
outlined in Table 1.
θ
= thermal resistance of junction-to-ambient in °C/Watt
JA
P
AVG
= average power dissipated in Watt
The estimated MTTF and failure rate at temperatures
lower than the actual stress temperature can be deter-
mined by using an Arrhenius model for temperature
acceleration. Results of such calculations are shown in
the table below using an activation energy of 0.43eV
(reference MIL-HDBK-217).
Table 1. Life Tests
Demonstrated Performance
Point Typical Performance
Total Device
Hours
30,000
Units
Tested
Total
Failed
Failure Rate
(% /1 K Hours)
[3]
Test Name
Stress Test Conditions
MTTF
High Temperature Operating Life Vcc=5.0V, T =ꢀ00°C
30
0
32,700
3.06
A
ꢀ
Table 2.
[1]
[2]
Point Typical Performance in Time
Performance in Time (90% Confidence)
Ambient
Junction
Failure Rate
Failure Rate
Temperature (°C)
Temperature (°C)
MTTF(1)
32,700
46,300
67,000
98,900
ꢀ49,400
23ꢀ,ꢀ00
367,800
(% / 1K Hours)
MTTF(2)
ꢀ3,020
ꢀ8,460
26,680
39,390
59,470
92,060
ꢀ46,400
(% /1K Hours)
ꢀ00
90
80
70
60
50
40
ꢀꢀ0
ꢀ00
90
3.06
2.ꢀ5
ꢀ.49
ꢀ.0ꢀ
0.66
0.43
0.27
7.68
5.42
3.75
80
2.54
70
ꢀ.68
60
ꢀ.08
50
0.68
Notes:
1. The point typical MTTF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero
failures, one failure is assumed for this calculation.
2. The 90% Confidence MTTF represents the minimum level of reliability performance which is expected from 90% of all samples. This confidence
interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This particular distribution is
commonly used in describing useful life failures.
3. Failures are catastrophic or parametric. Catastrophic failures are open, short, no logic output, no dynamic parameters while parametric failures are
failures to meet an electrical characteristic as specified in product catalog such as output voltage, duty or state errors.
Example of Failure Rate Calculation
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is:
(8 hours/day) x (5 days/week) / (168 hours/week) = 0.25
The point failure rate per year (8760 hours) at 50°C ambient temperature is:
(0.43% / 1K hours) x 0.25 X (8760 hours/year) = 0.94% per year
Similarly, 90% confidence level failure rate per year at 50°C:
(1.08% / 1K hours) X 0.25 X (8760 hours/year) = 2.36% per year
Table 3. Environmental Tests
Test Name
Test Conditions
Units Tested
Unit Failed
Storage Temperature Cycle
Wet High Temperature Storage life
Low Temperature Storage Life
-40°C to ꢀ00°C, ꢀ5min dwell time. 5 min transfer. ꢀ000 cycles
90
90
90
0
0
0
T =85°C, RH=85%, ꢀ000 hours
A
T =-40°C, ꢀ000 hours
A
For product information and a complete list of distributors, please go to our web site: www.avagotech.com
Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies, Limited in the United States and other countries.
Data subject to change. Copyright © 2006 Avago Technologies Limited. All rights reserved.
AV0ꢀ-0682EN - December ꢀ9, 2006
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