DAC8560IADGKRG4 [BB]
16-Bit, Ultra-Low Glitch, Voltage Output DIGITAL-TO-ANALOG CONVERTER with 2.5V, 2ppm/∑C Internal Reference; 16位,超低干扰,电压输出数位类比转换器具有2.5V , 2ppm的/ ΣC内部参考型号: | DAC8560IADGKRG4 |
厂家: | BURR-BROWN CORPORATION |
描述: | 16-Bit, Ultra-Low Glitch, Voltage Output DIGITAL-TO-ANALOG CONVERTER with 2.5V, 2ppm/∑C Internal Reference |
文件: | 总29页 (文件大小:997K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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DAC856
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SLAS464–DECEMBER 2006
16-Bit, Ultra-Low Glitch, Voltage Output
DIGITAL-TO-ANALOG CONVERTER
with 2.5V, 2ppm/°C Internal Reference
FEATURES
DESCRIPTION
•
•
•
•
Relative Accuracy: 4LSB
The DAC8560 is a low-power, voltage output, 16-bit
digital-to-analog converter (DAC). The DAC8560
includes a 2.5V, 2ppm/°C internal reference (enabled
by default), giving a full-scale output voltage range of
2.5V. The internal reference has an initial accuracy
of 0.02% and can source up to 20mA at the VREF pin.
The device is monotonic, provides very good
linearity, and minimizes undesired code-to-code
transient voltages (glitch). The DAC8560 uses a
versatile 3-wire serial interface that operates at clock
rates up to 30MHz. It is compatible with standard
SPI™, QSPI™, Microwire™, and digital signal
processor (DSP) interfaces.
Glitch Energy: 0.15nV-s
MicroPower Operation: 510µA at 2.7V
Internal Reference:
• 2.5V Reference Voltage (enabled by default)
• 0.02% Initial Accuracy
• 2ppm/°C Temperature Drift (typ)
• 5ppm/°C Temperature Drift (max)
• 20mA Sink/Source Capability
•
•
•
•
•
Power-On Reset to Zero
Power Supply: +2.7V to +5.5V
16-Bit Monotonic Over Temperature Range
Settling Time: 10µs to ±0.003% FSR
The DAC8560 incorporates a power-on-reset circuit
that ensures the DAC output powers up at zero-scale
and remains there until a valid code is written to the
Low-Power Serial Interface with
Schmitt-Triggered Inputs
device. The DAC8560 contains
a power-down
feature, accessed over the serial interface, that
reduces the current consumption of the device to
1.2µA at 5V.
•
On-Chip Output Buffer Amplifier with
Rail-to-Rail Operation
•
•
Power-Down Capability
The low-power consumption, internal reference, and
small footprint make this device ideal for portable,
battery-operated equipment. The power consumption
is 2.6mW at 5V, reducing to 6µW in power-down
mode.
Drop-In Compatible With DAC8531/01 and
DAC8550/51
•
•
Temperature Range: –40°C to +105°C
Available in a Tiny MSOP-8 Package
The DAC8560 is available in an MSOP-8 package.
FUNCTIONAL BLOCK DIAGRAM
APPLICATIONS
VDD
•
•
•
•
•
Process Control
VFB
Data Acquisition Systems
Closed-Loop Servo-Control
PC Peripherals
VREF
VOUT
Ref (+)
16-Bit DAC
2.5V
Reference
Portable Instrumentation
16
DAC Register
16
SYNC
SCLK
DIN
PWD
Control
Resistor
Network
Shift Register
GND
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SPI, QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor.
All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006, Texas Instruments Incorporated
DAC8560
www.ti.com
SLAS464–DECEMBER 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
PACKAGING/ORDERING INFORMATION(1)
MAXIMUM
RELATIVE
ACCURACY
(LSB)
MAXIMUM
DIFFERENTIAL
NONLINEARITY
(LSB)
MAXIMUM
REFERENCE
DRIFT
SPECIFIED
TEMPERATURE PACKAGE
PACKAGE-
LEAD
PACKAGE
DESIGNATOR
PRODUCT
DAC8560A
DAC8560B
DAC8560C
DAC8560D
(ppm/°C)
RANGE
MARKING
±12
±8
±1
±1
±1
±1
25
25
5
MSOP-8
DGK
–40°C TO +105°C
D860
±12
±8
5
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI
website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS(1)
over operating free-air temperature range (unless otherwise noted)
UNIT
VDD to GND
–0.3V to 6V
–0.3V to +VDD + 0.3V
–0.3V to +VDD + 0.3V
–40°C to +105°C
–65°C to +150°C
+150°C
Digital input voltage to GND
VOUT to GND
Operating temperature range
Storage temperature range
Junction temperature range (TJ max)
Power dissipation (DGK)
Thermal impedance, θJA
Thermal impedance, θJC
(TJ max – TA)/θJA
206°C/W
44°C/W
Human body model (HBM)
Charged device model (CDM)
4000V
ESD rating
1500V
(1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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SLAS464–DECEMBER 2006
ELECTRICAL CHARACTERISTICS
VDD = 2.7V to 5.5V, –40°C to +105°C range (unless otherwise noted)
PARAMETER
STATIC PERFORMANCE(1)
Resolution
TEST CONDITIONS
MIN
TYP
MAX
UNIT
16
Bits
LSB
DAC8560A, DAC8560C
DAC8560B, DAC8560D
±4
±4
±12
±8
Measured by line passing
through codes 485 and 64714
Relative accuracy
LSB
Differential nonlinearity
Zero-code error
Full-scale error
16-bit Monotonic
±0.5
±5
±1
LSB
±12
±0.5
±0.2
mV
Measured by line passing through codes 485 and 64714.
±0.2
±0.05
±20
±1
% of FSR
% of FSR
µV/°C
Gain error
Zero-code error drift
VDD = 5V
Gain temperature coefficient
ppm of FSR/°C
VDD = 2.7V
±3
PSRR
Power supply rejection ratio
Output unloaded
1
mV/V
OUTPUT CHARACTERISTICS(2)
Output voltage range
0
VREF
10
V
To ±0.003% FSR, 0200h to FD00h, RL = 2kΩ,
8
0pF < CL < 200pF
Output voltage settling time
µs
RL = 2kΩ, CL = 500pF
12
1.8
470
1000
0.15
0.15
1
Slew rate
V/µs
RL = ∞
pF
Capacitive load stability
RL = 2kΩ
Code change glitch impulse
Digital feedthrough
1LSB change around major carry
SCLK toggling, SYNC high
At mid-code input
nV-s
nV-s
Ω
DC output impedance
VDD = 5V
50
Short-circuit current
Power-up time
mA
VDD = 3V
20
Coming out of power-down mode VDD = 5V
Coming out of power-down mode VDD = 3V
2.5
5
µs
AC PERFORMANCE(2)
SNR
88
–77
79
dB
dB
THD
TA = +25°C, BW = 20kHz, VDD = 5V, fOUT = 1kHz,
1st 19 harmonics removed for SNR calculation
SFDR
dB
SINAD
77
dB
DAC output noise density
DAC output noise
TA = +25°C, at mid-code input, fOUT = 1kHz
TA = +25°C, at mid-code input, 0.1Hz to 10Hz
170
50
nV/√Hz
µVPP
(1) Linearity calculated using a reduced code range of 485 to 64714; output unloaded.
(2) Ensured by design and characterization, not production tested.
3
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SLAS464–DECEMBER 2006
ELECTRICAL CHARACTERISTICS (continued)
VDD = 2.7V to 5.5V, –40°C to +105°C range (unless otherwise noted)
PARAMETER
REFERENCE OUTPUT
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Output voltage
Initial accuracy
TA = +25°C
TA = +25°C
2.4995
–0.02
2.5
±0.004
5
2.5005
0.02
25
V
%
DAC8560A, DAC8560B(3)
DAC8560C, DAC8560D(4)
f = 0.1Hz to 10Hz
Output voltage temperature drift
Output voltage noise
ppm/°C
µVPP
2
5
16
TA = +25°C, f = 1MHz, CL = 0µF
TA = +25°C, f = 1MHz, CL = 1µF
TA = +25°C, f = 1MHz, CL = 4µF
TA = +25°C
125
20
Output voltage noise density
(high-frequency noise)
nV/√Hz
2
Load regulation, sourcing(5)
Load regulation, sinking(5)
Output current load capability(6)
Line regulation
30
µV/mA
µV/mA
mA
TA = +25°C
15
±20
10
TA = +25°C
µV/V
ppm
Long-term stability/drift (aging)(5)
TA = +25°C, time = 0 to 1900 hours
First cycle
50
100
25
Thermal hysteresis(5)
ppm
Additional cycles
REFERENCE
VDD = 5.5V
360
348
20
Internal reference current consumption
µA
VDD = 3.6V
External reference current
Reference input range
External VREF = 2.5V, if internal reference is disabled
µA
V
0
VDD
Reference input impedance
125
kΩ
(6)
LOGIC INPUTS
Input current
±1
µA
VDD = 5V
VDD = 3V
VDD = 5V
VDD = 3V
0.8
0.6
VIN
L
Logic input LOW voltage
Logic input HIGH voltage
V
2.4
2.1
VINH
V
Pin capacitance
POWER REQUIREMENTS
VDD
3
pF
2.7
5.5
0.850
0.840
2.5
V
VDD = 3.6V to 5.5V, VIH = VDD and VIL = GND
VDD = 2.7V to 3.6V, VIH = VDD and VIL = GND
VDD = 3.6V to 5.5V, VIH = VDD and VIL = GND
VDD = 2.7V to 3.6V, VIH = VDD and VIL = GND
VDD = 3.6V to 5.5V
0.530
0.510
1.2
0.7
2.6
1.5
6
Normal mode
mA
(7)
IDD
All power-down modes
µA
mW
µW
2.2
4.7
Normal mode
Power
VDD = 2.7V to 3.6V
3.0
dissipation
(7)
VDD = 3.6V to 5.5V
14
All power-down modes
VDD = 2.7V to 3.6V
2
8
TEMPERATURE RANGE
Specified performance
–40
+105
°C
(3) Reference is trimmed and tested at room temperature, and is characterized from –40°C to +120°C.
(4) Reference is trimmed and tested at two temperatures (+25°C and +105°C), and is characterized from –40°C to +120°C.
(5) Explained in more detail in the Application Information section of this data sheet.
(6) Ensured by design and characterization, not production tested.
(7) Input code = 32768, reference current included, no load.
4
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SLAS464–DECEMBER 2006
PIN CONFIGURATION
MSOP-8
(Top View)
1
2
3
4
8
7
6
5
VDD
VREF
VFB
GND
DIN
DAC8560
SCLK
SYNC
VOUT
PIN DESCRIPTIONS
PIN NAME
DESCRIPTION
1
2
3
4
VDD
VREF
VFB
Power supply input, 2.7V to 5.5V.
Reference voltage input/output.
Feedback connection for the output amplifier. For voltage output operation, tie to VOUT externally.
VOUT Analog output voltage from DAC. The output amplifier has rail-to-rail operation.
Level-triggered control input (active LOW). This is the frame synchronization signal for the input data. When SYNC goes
LOW, it enables the input shift register, and data is sampled on subsequent falling clock edges. The DAC output updates
following the 24th clock. If SYNC is taken HIGH before the 24th clock edge, the rising edge of SYNC acts as an interrupt,
and the write sequence is ignored by the DAC8560. Schmitt-Trigger logic Input.
5
SYNC
6
7
8
SCLK Serial clock input. Schmitt-Trigger logic input.
Serial data input. Data is clocked into the 24-bit input shift register on each falling edge of the serial clock input.
Schmitt-Trigger logic Input.
DIN
GND Ground reference point for all circuitry on the part.
5
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SLAS464–DECEMBER 2006
SERIAL WRITE OPERATION
t9
t1
SCLK
1
24
t8
t2
t3
t7
t4
SYNC
t10
t6
t5
DB23
DIN
DB0
DB23
TIMING REQUIREMENTS(1)(2)
VDD = 2.7V to 5.5V, all specifications –40°C to +105°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP MAX UNIT
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
VDD = 2.7V to 3.6V
VDD = 3.6V to 5.5V
50
ns
33
(3)
t1
t2
t3
t4
t5
t6
t7
t8
t9
SCLK cycle time
SCLK HIGH time
SCLK LOW time
13
ns
13
22.5
ns
13
0
SYNC to SCLK rising edge setup time
Data setup time
ns
0
5
ns
5
4.5
Data hold time
ns
4.5
0
SCLK falling edge to SYNC rising edge
Minimum SYNC HIGH time
ns
0
50
ns
33
100
24th SCLK falling edge to SYNC falling edge
ns
100
15
ns
15
SYNC rising edge to 24th SCLK falling edge
(for successful SYNC interrupt)
t10
(1) All input signals are specified with tR = tF = 3ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2.
(2) See Serial Write Operation timing diagram.
(3) Maximum SCLK frequency is 30MHz at VDD = 3.6V to 5.5V and 20MHz at VDD = 2.7V to 3.6V.
6
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SLAS464–DECEMBER 2006
TYPICAL CHARACTERISTICS: Internal Reference
At TA = +25°C, unless otherwise noted.
INTERNAL REFERENCE VOLTAGE
vs TEMPERATURE (Grades C and D)
INTERNAL REFERENCE VOLTAGE
vs TEMPERATURE (Grades A and B)
2.503
2.502
2.501
2.500
2.499
2.498
2.503
2.502
2.501
2.500
2.499
2.498
2.497
10 Units Shown
100
13 Units Shown
80 100 120
2.497
-40
-20
0
20
40
60
120
-40
-20
0
20
40
60
Temperature (°C)
Temperature (°C)
Figure 1.
Figure 2.
REFERENCE OUTPUT TEMPERATURE DRIFT
REFERENCE OUTPUT TEMPERATURE DRIFT
(–40°C to +120°C, Grades C and D)
(–40°C to +120°, Grades A and B)
40
30
20
10
0
30
20
10
0
Typ: 5ppm/°C
Typ: 2ppm/°C
Max: 5ppm/°C
Max: 25ppm/°C
0.5
1
1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
3
5
7
9
11
13
15
17
19
Temperature Drift (ppm/°C)
Temperature Drift (ppm/°C)
Figure 3.
Figure 4.
LONG-TERM
REFERENCE OUTPUT TEMPERATURE DRIFT
(0°C to +120°C, Grades C and D)
STABILITY/DRIFT(1)
200
150
100
50
40
30
20
10
0
See the Applications Information
section for more information
Typ: 1.2ppm/°C
Max: 3ppm/°C
0
-50
-100
-150
-200
Average
20 Units Shown
0
300
600
900
1200
1500
1800
0.5
1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
Time (Hours)
Temperature Drift (ppm/°C)
Figure 5.
Figure 6.
(1) Explained in more detail in the Application Information section of this data sheet.
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SLAS464–DECEMBER 2006
TYPICAL CHARACTERISTICS: Internal Reference (continued)
At TA = +25°C, unless otherwise noted.
INTERNAL REFERENCE NOISE DENSITY
vs FREQUENCY(2)
INTERNAL REFERENCE NOISE
0.1Hz TO 10Hz (2)
400
300
200
100
0
See the Applications Information
section for more information
See the Applications Information
section for more information
VDD = 5V
16mVPP
Reference Unbuffered
CREF = 0mF
CREF = 4mF
1k
Time (2s/div)
10
100
10k
100k
1M
Frequency (Hz)
Figure 7.
Figure 8.
INTERNAL REFERENCE VOLTAGE
vs LOAD CURRENT (Grades C and D)
INTERNAL REFERENCE VOLTAGE
vs LOAD CURRENT (Grades A and B)
2.504
2.503
2.502
2.501
2.500
2.499
2.498
2.497
2.496
2.504
2.503
2.502
2.501
2.500
2.499
2.498
2.497
2.496
-40°C
15mV/mA (sinking)
+25°C
15mV/mA (sinking) -40°C
+25°C
30mV/mA (sourcing)
+120°C
30mV/mA (sourcing)
+120°C
10 15 20 25
-25 -20 -15 -10 -5
0
5
10
15 20 25
-25 -20 -15 -10 -5
0
5
ILOAD (mA)
ILOAD (mA)
Figure 9.
Figure 10.
INTERNAL REFERENCE VOLTAGE
vs SUPPLY VOLTAGE (Grades C and D)
INTERNAL REFERENCE VOLTAGE
vs SUPPLY VOLTAGE (Grades A and B)
2.504
2.503
2.502
2.501
2.500
2.499
2.498
2.497
2.504
2.503
2.502
2.501
2.500
2.499
2.498
2.497
-40°C
-40°C
< 10mV/V
< 10mV/V
+25°C
+25°C
+120°C
+120°C
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
2.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
VDD (V)
VDD (V)
Figure 11.
(2) Explained in more detail in the Application Information section of this data sheet.
Figure 12.
8
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TYPICAL CHARACTERISTICS: DAC at VDD = 5V
At TA = +25°C, external reference used, and DAC output not loaded, unless otherwise noted.
LINEARITY ERROR AND
DIFFERENTIAL LINEARITY ERROR
vs DIGITAL INPUT CODE (–40°C)
LINEARITY ERROR AND
DIFFERENTIAL LINEARITY ERROR
vs DIGITAL INPUT CODE (+25°C)
6
6
4
VDD = 5V, External VREF = 4.99V
VDD = 5V, External VREF = 4.99V
4
2
2
0
0
-2
-4
-6
-2
-4
-6
1.0
0.5
1.0
0.5
0
0
-0.5
-1.0
-0.5
-1.0
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
Figure 13.
Figure 14.
LINEARITY ERROR AND
DIFFERENTIAL LINEARITY ERROR
vs DIGITAL INPUT CODE (+105°C)
ZERO-SCALE ERROR
vs TEMPERATURE
10
5
6
4
VDD = 5V, External VREF = 4.99V
VDD = 5.0V
Internal VREF = 2.5V
2
0
-2
-4
-6
1.0
0.5
0
0
-0.5
-1.0
-5
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
-40
0
40
80
120
Temperature (°C)
Figure 15.
Figure 16.
FULL-SCALE ERROR
vs TEMPERATURE
SOURCE AND SINK
CURRENT CAPABILITY
10
5
3.0
2.5
2.0
1.5
1.0
0.5
0
VDD = 5.0V
Internal VREF = 2.5V
VDD = 5V
Internal Reference Enabled
DAC Loaded with FFFFh
0
DAC Loaded with 0000h
-5
-40
0
40
80
120
0
5
10
15
20
Temperature (°C)
ISOURCE/SINK (mA)
Figure 17.
Figure 18.
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SLAS464–DECEMBER 2006
TYPICAL CHARACTERISTICS: DAC at VDD = 5V (continued)
At TA = +25°C, external reference used, and DAC output not loaded, unless otherwise noted.
SOURCE AND SINK
CURRENT CAPABILITY
POWER-SUPPLY CURRENT
vs DIGITAL INPUT CODE
650
600
550
500
450
6
5
4
3
2
1
0
VDD = 5.5V
Internal VREF = 2.5V
VDD = 5V
Internal Reference Disabled
External VREF = 4.99V
DAC Loaded with FFFFh
DAC Loaded with 0000h
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
5
10
15
20
ISOURCE/SINK (mA)
Figure 19.
Figure 20.
POWER-SUPPLY CURRENT
vs TEMPERATURE
POWER-SUPPLY CURRENT
vs POWER-SUPPLY VOLTAGE
700
650
600
550
500
450
400
510
VDD = 5.5V
Internal VREF = 2.5V
VDD = 2.7V to 5.5V
Internal VREF Included
505
500
495
490
485
-40
0
40
80
120
2.7
3.1
3.5
3.9
4.3
4.7
5.1
5.5
Temperature (°C)
VDD (V)
Figure 21.
Figure 22.
POWER-DOWN CURRENT
vs POWER-SUPPLY VOLTAGE
POWER-SUPPLY CURRENT
vs LOGIC INPUT VOLTAGE
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
2500
2000
1500
1000
500
VDD = 5.5V, Internal VREF Included,
SCLK Input
VDD = 2.7V to 5.5V
Sweep from 0V to 5V
Sweep from 5V to 0V
(all other digital inputs = GND)
0
2.7
3.1
3.5
3.9
4.3
4.7
5.1
5.5
0
1
2
3
4
5
VDD (V)
VLOGIC (V)
Figure 23.
Figure 24.
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TYPICAL CHARACTERISTICS: DAC at VDD = 5V (continued)
At TA = +25°C, external reference used, and DAC output not loaded, unless otherwise noted.
POWER-SUPPLY CURRENT
HISTOGRAM
TOTAL HARMONIC DISTORTION
vs OUTPUT FREQUENCY
80
70
60
50
40
30
20
10
0
-40
-50
-60
-70
-80
-90
-100
VDD = 5V, External VREF = 4.9V
VDD = 5.5V
Internal VREF = 2.5V
-1dB FSR Digital Input, fS = 225kSPS
Measurement Bandwidth = 20kHz
THD
2nd Harmonic
3rd Harmonic
450
475
500
525
550
575
600
0
1
2
3
4
5
IDD (mA)
fOUT (kHz)
Figure 25.
Figure 26.
FULL-SCALE SETTLING TIME:
5V RISING EDGE
FULL-SCALE SETTLING TIME:
5V FALLING EDGE
Trigger Pulse 5V/div
Trigger Pulse 5V/div
VDD = 5V
Ext VREF = 4.096V
From Code: FFFFh
To Code: 0000h
VDD = 5V
Ext VREF = 4.096V
From Code: 0000h
To Code: FFFFh
Falling
Edge
1V/div
Rising Edge
1V/div
Zoomed Rising Edge
1mV/div
Zoomed Falling Edge
1mV/div
Time (2ms/div)
Time (2ms/div)
Figure 27.
Figure 28.
HALF-SCALE SETTLING TIME:
5V RISING EDGE
HALF-SCALE SETTLING TIME:
5V FALLING EDGE
Trigger Pulse 5V/div
Trigger Pulse 5V/div
VDD = 5V
Ext VREF = 4.096V
From Code: CFFFh
To Code: 4000h
VDD = 5V
Ext VREF = 4.096V
From Code: 4000h
To Code: CFFFh
Rising
Edge
1V/div
Falling
Edge
1V/div
Zoomed Rising Edge
1mV/div
Zoomed Falling Edge
1mV/div
Time (2ms/div)
Time (2ms/div)
Figure 29.
Figure 30.
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TYPICAL CHARACTERISTICS: DAC at VDD = 5V (continued)
At TA = +25°C, external reference used, and DAC output not loaded, unless otherwise noted.
GLITCH ENERGY:
5V, 1LSB STEP, RISING EDGE
GLITCH ENERGY:
5V, 1LSB STEP, FALLING EDGE
VDD = 5V
VDD = 5V
Ext VREF = 4.096V
From Code: 7FFFh
To Code: 8000h
Glitch: 0.08nV-s
Ext VREF = 4.096V
From Code: 8000h
To Code: 7FFFh
Glitch: 0.16nV-s
Measured Worst Case
Time (400ns/div)
Time (400ns/div)
Figure 31.
Figure 32.
GLITCH ENERGY:
5V, 16LSB STEP, RISING EDGE
GLITCH ENERGY:
5V, 16LSB STEP, FALLING EDGE
VDD = 5V
Ext VREF = 4.096V
From Code: 8010h
To Code: 8000h
Glitch: 0.08nV-s
VDD = 5V
Ext VREF = 4.096V
From Code: 8000h
To Code: 8010h
Glitch: 0.04nV-s
Time (400ns/div)
Time (400ns/div)
Figure 33.
Figure 34.
GLITCH ENERGY:
5V, 256LSB STEP, RISING EDGE
GLITCH ENERGY:
5V, 256LSB STEP, FALLING EDGE
VDD = 5V
Ext VREF = 4.096V
From Code: 80FFh
To Code: 8000h
Glitch: Not Detected
Theoretical Worst Case
VDD = 5V
Ext VREF = 4.096V
From Code: 8000h
To Code: 80FFh
Glitch: Not Detected
Theoretical Worst Case
Time (400ns/div)
Time (400ns/div)
Figure 35.
Figure 36.
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TYPICAL CHARACTERISTICS: DAC at VDD = 5V (continued)
At TA = +25°C, external reference used, and DAC output not loaded, unless otherwise noted.
SIGNAL-TO-NOISE RATIO
vs OUTPUT FREQUENCY
POWER SPECTRAL DENSITY
0
-10
98
96
94
92
90
88
86
84
VDD = 5V, External VREF = 4.9V
VDD = 5V, External VREF = 4.9V
fOUT = 1kHz, fS = 225kSPS
-1dB FSR Digital Input, fS = 225kSPS
-20
Measurement Bandwidth = 20kHz
Measurement Bandwidth = 20kHz
-30
-40
-50
-60
-70
-80
-90
-100
-110
-120
-130
0
5
10
15
20
0
1
2
3
4
5
Frequency (kHz)
fOUT (kHz)
Figure 37.
Figure 38.
DAC OUTPUT NOISE DENSITY
vs FREQUENCY(1)
DAC OUTPUT NOISE DENSITY
vs FREQUENCY (1)
1800
1600
1400
1200
1000
800
600
400
200
0
1000
800
600
400
200
0
Internal Reference Enabled
No Load at VREF Pin
Internal Reference Enabled
4mF vs No Load at VREF Pin
See the Applications Information
section for more information
See the Applications Information
section for more information
Full-Scale
Midscale
Zero-Scale
CREF = 0mF
CREF = 4mF
10
100
1k
10k
100k
1M
10
100
1k
10k
100k
1M
Frequency (Hz)
Frequency (Hz)
Figure 39.
Figure 40.
DAC OUTPUT NOISE
0.1Hz TO 10Hz
DAC = Midscale
Internal Reference Enabled
50mVPP
Time (2s/div)
Figure 41.
(1) Explained in more detail in the Application Information section of this data sheet.
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TYPICAL CHARACTERISTICS: DAC at VDD = 3.6V
At TA = +25°C, internal reference used, and DAC output not loaded, unless otherwise noted
POWER-SUPPLY CURRENT
vs TEMPERATURE
POWER-SUPPLY CURRENT
HISTOGRAM
700
650
600
550
500
450
400
90
80
70
60
50
40
30
20
10
0
VDD = 3.6V
Internal VREF = 2.5V
VDD = 3.6V
Internal VREF = 2.5V
-40
0
40
80
120
450
475
500
525
550
575
600
Temperature (°C)
IDD (mA)
Figure 42.
Figure 43.
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TYPICAL CHARACTERISTICS: DAC at VDD = 2.7V
At TA = +25°C, internal reference used, and DAC output not loaded, unless otherwise noted
LINEARITY ERROR AND
DIFFERENTIAL LINEARITY ERROR
vs DIGITAL INPUT CODE (–40°C)
LINEARITY ERROR AND
DIFFERENTIAL LINEARITY ERROR
vs DIGITAL INPUT CODE (+25°C)
6
6
4
VDD = 2.7V, Internal VREF = 2.5V
VDD = 2.7V, Internal VREF = 2.5V
4
2
2
0
0
-2
-4
-6
-2
-4
-6
1.0
0.5
1.0
0.5
0
0
-0.5
-1.0
-0.5
-1.0
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
Figure 44.
Figure 45.
LINEARITY ERROR AND
DIFFERENTIAL LINEARITY ERROR
vs DIGITAL INPUT CODE (+105°C)
ZERO-SCALE ERROR
vs TEMPERATURE
10
5
6
4
VDD = 2.7V, Internal VREF = 2.5V
VDD = 2.7V
Internal VREF = 2.5V
2
0
-2
-4
-6
1.0
0.5
0
0
-0.5
-1.0
-5
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
-40
0
40
80
120
Temperature (°C)
Figure 46.
Figure 47.
FULL-SCALE ERROR
vs TEMPERATURE
SOURCE AND SINK
CURRENT CAPABILITY
10
5
3.0
2.5
2.0
1.5
1.0
0.5
0
VDD = 2.7V
Internal VREF = 2.5V
VDD = 2.7V
Internal Reference Enabled
DAC Loaded with FFFFh
0
DAC Loaded with 0000h
-5
-40
0
40
80
120
0
5
10
15
20
Temperature (°C)
ISOURCE/SINK (mA)
Figure 48.
Figure 49.
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TYPICAL CHARACTERISTICS: DAC at VDD = 2.7V (continued)
At TA = +25°C, internal reference used, and DAC output not loaded, unless otherwise noted
SUPPLY CURRENT
vs DIGITAL INPUT CODE
POWER-SUPPLY CURRENT
vs LOGIC INPUT VOLTAGE
650
600
550
500
450
1000
900
800
700
600
500
400
VDD = 2.7V, Internal VREF Included,
VDD = 2.7V
SCLK Input
Internal VREF = 2.5V
(all other digital inputs = GND)
Sweep from 0V to 2.7V
Sweep from 2.7V to 0V
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4 2.7
VLOGIC (V)
Figure 50.
Figure 51.
FULL-SCALE SETTLING TIME:
2.7V RISING EDGE
FULL-SCALE SETTLING TIME:
2.7V FALLING EDGE
Trigger Pulse 2.7V/div
Trigger Pulse 2.7V/div
VDD = 2.7V
Int VREF = 2.5V
From Code: FFFFh
To Code: 0000h
Rising
Edge
0.5V/div
VDD = 2.7V
Int VREF = 2.5V
From Code: 0000h
To Code: FFFFh
Zoomed Falling Edge
1mV/div
Falling
Edge
0.5V/div
Zoomed Rising Edge
1mV/div
Time (2ms/div)
Time (2ms/div)
Figure 52.
Figure 53.
HALF-SCALE SETTLING TIME:
2.7V RISING EDGE
HALF-SCALE SETTLING TIME:
2.7V FALLING EDGE
Trigger Pulse 2.7V/div
Trigger Pulse 2.7V/div
VDD = 2.7V
Int VREF = 2.5V
From Code: CFFFh
To Code: 4000h
VDD = 2.7V
Int VREF = 2.5V
From Code: 4000h
To Code: CFFFh
Rising
Edge
0.5V/div
Falling
Edge
0.5V/div
Zoomed Rising Edge
1mV/div
Zoomed Falling Edge
1mV/div
Time (2ms/div)
Time (2ms/div)
Figure 54.
Figure 55.
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TYPICAL CHARACTERISTICS: DAC at VDD = 2.7V (continued)
At TA = +25°C, internal reference used, and DAC output not loaded, unless otherwise noted
GLITCH ENERGY:
2.7V, 1LSB STEP, RISING EDGE
GLITCH ENERGY:
2.7V, 1LSB STEP, FALLING EDGE
VDD = 2.7V
VDD = 2.7V
Int VREF = 2.5V
From Code: 8000h
To Code: 7FFFh
Glitch: 0.16nV-s
Measured Worst Case
Int VREF = 2.5V
From Code: 7FFFh
To Code: 8000h
Glitch: 0.08nV-s
Time (400ns/div)
Time (400ns/div)
Figure 56.
Figure 57.
GLITCH ENERGY:
2.7V, 16LSB STEP, RISING EDGE
GLITCH ENERGY:
2.7V, 16LSB STEP, FALLING EDGE
VDD = 2.7V
Int VREF = 2.5V
From Code: 8010h
To Code: 8000h
Glitch: 0.12nV-s
VDD = 2.7V
Int VREF = 2.5V
From Code: 8000h
To Code: 8010h
Glitch: 0.04nV-s
Time (400ns/div)
Time (400ns/div)
Figure 58.
Figure 59.
GLITCH ENERGY:
2.7V, 256LSB STEP, RISING EDGE
GLITCH ENERGY:
2.7V, 256LSB STEP, FALLING EDGE
VDD = 2.7V
Int VREF = 2.5V
From Code: 80FFh
To Code: 8000h
Glitch: Not Detected
Theoretical Worst Case
VDD = 2.7V
Int VREF = 2.5V
From Code: 8000h
To Code: 80FFh
Glitch: Not Detected
Theoretical Worst Case
Time (400ns/div)
Time (400ns/div)
Figure 60.
Figure 61.
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THEORY OF OPERATION
VREF
DIGITAL-TO-ANALOG CONVERTER (DAC)
The DAC8560 architecture consists of a string DAC
followed by an output buffer amplifier. Figure 62
shows a block diagram of the DAC architecture.
RDIVIDER
VREF
2
VREF
50kW
50kW
VFB
R
62kW
REF (+)
VOUT
DAC
Register
Register String
To Output Amplifier
(2x Gain)
REF (-)
R
GND
Figure 62. DAC8560 Architecture
The input coding to the DAC8560 is straight binary,
so the ideal output voltage is given by:
DIN
65536
VOUT
+
VREF
R
R
where DIN = decimal equivalent of the binary code
that is loaded to the DAC register; it can range from
0 to 65535.
RESISTOR STRING
The resistor string section is shown in Figure 63. It is
simply a string of resistors, each of value R. The
code loaded into the DAC register determines at
which node on the string the voltage is tapped off to
be fed into the output amplifier by closing one of the
switches connecting the string to the amplifier. It is
monotonic because it is a string of resistors.
Figure 63. Resistor String
The inverting input of the output amplifier is available
at the VFB pin. This feature allows better accuracy in
critical applications by tying the VFB point and the
amplifier output together directly at the load. Other
signal conditioning circuitry may also be connected
between these points for specific applications.
OUTPUT AMPLIFIER
The output buffer amplifier is capable of generating
rail-to-rail voltages on its output, giving an output
range of 0V to VDD. It is capable of driving a load of
2kΩ in parallel with 1000pF to GND. The source and
sink capabilities of the output amplifier can be seen
in the Typical Characteristics. The slew rate is
1.8V/µs with a full-scale settling time of 8µs with the
output unloaded.
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INTERNAL REFERENCE
VREF
The DAC8560 includes a 2.5V internal reference that
is enabled by default. The internal reference is
externally available at the VREF pin. A minimum
100nF capacitor is recommended between the
reference output and GND for noise filtering.
Reference
Disable
The internal reference of the DAC8560 is a bipolar
transistor-based,
precision
bandgap
voltage
Q1
1
N
Q2
reference. The basic bandgap topology is shown in
Figure 64. Transistors Q1 and Q2 are biased such
that the current density of Q1 is greater than that of
Q2. The difference of the two base-emitter voltages
(VBE1 - VBE2) has a positive temperature coefficient
and is forced across resistor R1. This voltage is
gained up and added to the base-emitter voltage of
Q2, which has a negative temperature coefficient.
The resulting output voltage is virtually independent
of temperature. The short-circuit current is limited by
design to approximately 100mA.
R1
R2
Figure 64. Simplified Schematic of the Bandgap
Reference
Enable/Disable Internal Reference
The DAC8560 internal reference is enabled by
default; however, the reference can be disabled for
To then enable the reference, either perform a
power-cycle to reset the device, or sequentially
execute the two write sequences in Table 2 and
Table 3. Each of these write sequences must be
followed by at least two additional SCLK falling
edges while SYNC remains low.
debugging or evaluation purposes.
A
serial
command requiring at least two additional SCLK
cycles at the end of the 24-bit write sequence (see
Serial Interface section) must be used to disable the
internal reference. For proper operation, a total of at
least 26 SCLK cycles are required for each
enable/disable internal reference update sequence,
during which SYNC must be held low. To disable the
internal reference, execute the write sequence
illustrated in Table 1 followed by at least two
additional SCLK falling edges while SYNC is low.
During the time that the internal reference is
disabled, the DAC will function normally using an
external reference. At this point, the internal
reference is disconnected from the VREF pin
(tri-state). Do not attempt to drive the VREF pin
externally and internally at the same time indefinitely.
Table 1. Write Sequence for Disabling the DAC8560 Internal Reference
DB23
DB0
1
0
1
1
1
0
0
0
0
1
0
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
Table 2. Enabling the DAC8560 Internal Reference (Write Sequence 1 of 2)
DB23
0
DB0
0
0
1
1
0
0
0
0
0
0
0
1
0
0
0
0
0
0
0
Table 3. Enabling the DAC8560 Internal Reference (Write Sequence 2 of 2)
DB23
0
DB0
1
0
1
0
0
1
0
0
0
0
0
1
0
0
0
0
0
0
0
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SERIAL INTERFACE
A more complete description of the various modes is
located in the Power-Down Modes section. The next
16 bits are the data bits, which are transferred to the
DAC register on the 24th falling edge of SCLK under
normal operation (see Table 5).
The DAC8560 has a 3-wire serial interface ( SYNC,
SCLK, and DIN) that is compatible with SPI, QSPI,
and Microwire interface standards, as well as most
DSPs. See the Serial Write Operation timing diagram
for an example of a typical write sequence.
SYNC INTERRUPT
The write sequence begins by bringing the SYNC
line LOW. Data from the DIN line is clocked into the
24-bit shift register on each falling edge of SCLK.
The serial clock frequency can be as high as 30MHz,
making the DAC8560 compatible with high-speed
DSPs. On the 24th falling edge of the serial clock,
the last data bit is clocked in and the programmed
function is executed.
In a normal write sequence, the SYNC line is kept
LOW for at least 24 falling edges of SCLK and the
DAC is updated on the 24th falling edge. However, if
SYNC is brought HIGH before the 24th falling edge,
it acts as an interrupt to the write sequence. The shift
register is reset, and the write sequence is seen as
invalid. Neither an update of the DAC register
contents, nor a change in the operating mode
occurs, as shown in Figure 65.
At this point, the SYNC line may be kept LOW or
brought HIGH. In either case, it must be brought
HIGH for a minimum of 33ns before the next write
sequence so that a falling edge of SYNC can initiate
the next write sequence. As previously mentioned, it
must be brought HIGH again before the next write
sequence.
POWER-ON RESET
The DAC8560 contains a power-on-reset circuit that
controls the output voltage during power up. On
power up, all registers are filled with zeros and the
output voltage is zero-scale; it remains there until a
valid write sequence is made to the DAC. This
feature is useful in applications where it is important
to know the state of the output of the DAC while it is
in the process of powering up.
INPUT SHIFT REGISTER
The input shift register is 24 bits wide, as shown in
Table 4. The first six bits must be '000000'. The next
two bits (PD1 and PD0) are control bits that set the
desired mode of operation (normal mode or any one
of three power-down modes) as indicated in Table 5.
Table 4. DAC8560 Data Input Register Format
DB23
0
DB0
0
0
0
0
0
PD1 PD0 D15 D14 D13 D12 D11 D10 D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
24th Falling Edge
24th Falling Edge
CLK
SYNC
DIN
DB23
DB0
DB23
DB0
Invalid/Interrupted Write Sequence:
Output/Mode Does Not Update on the 24th Falling Edge
Valid Write Sequence:
Output/Mode Updates on the 24th Falling Edge
Figure 65. SYNC Interrupt Facility
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POWER-DOWN MODES
The advantage of this switching is that the output
impedance of the device is known while it is in
power-down mode. As shown in Table 5, there are
three different power-down options. VOUT can be
connected internally to GND through a 1kΩ resistor,
a 100kΩ resistor, or open circuited (High-Z). The
output stage is illustrated in Figure 66.
The DAC8560 supports four separate modes of
operation. These modes are programmable by
setting two bits (PD1 and PD0) in the control
register. Table 5 shows how to control the operating
mode with data bits PD1 (DB17) and PD0 (DB16).
Table 5. Operating Modes
VFB
PD1
PD0
OPERATING MODE
(DB17)
(DB16)
0
0
1
1
0
1
0
1
Normal operation
Amplifier
VOUT
Resistor
String
DAC
Power-down 1 kΩ to GND
Power-down 100 kΩ to GND
Power-down High-Z
Power-Down
Circuitry
Resistor
Network
When both bits are set to '0', the device works
normally with its typical current consumption of
530µA at 5.5V. However, for the three power-down
modes, the supply current falls to 1.2µA at 5.5V
(0.7µA at 3.6V). Not only does the supply current fall,
but the output stage is also internally switched from
the output of the amplifier to a resistor network of
known values.
Figure 66. Output Stage During Power Down
All analog circuitry is shut down when the
power-down mode is activated. However, the
contents of the DAC register are unaffected when in
power down. The time to exit power-down is typically
2.5µs for VDD = 5V, and 5µs for VDD = 3V. See the
Typical Characteristics for more information.
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APPLICATION INFORMATION
INTERNAL REFERENCE
The DAC8560 internal reference (grades C and D)
features an exceptional typical drift coefficient of
2ppm/°C from –40°C to +120°C. Characterizing a
large number of units, a maximum drift coefficient of
5ppm/°C (grades C and D) is observed. Temperature
drift results are summarized in the Typical
Characteristics.
The DAC8560 internal reference does not require an
external load capacitor for stability because it is
stable with any capacitive load. However, for
improved noise performance, an external load
capacitor of 150nF or larger connected to the VREF
output is recommended. Figure 67 shows the typical
connections required for operation of the DAC8560
internal reference. A supply bypass capacitor at the
VDD input is also recommended.
Noise Performance
Typical 0.1Hz to 10Hz voltage noise can be seen in
Figure 8, Internal Reference Noise. Additional
filtering can be used to improve output noise levels,
although care should be taken to ensure the output
impedance does not degrade the AC performance.
The output noise spectrum at VREF without any
external components is depicted in Figure 7, Internal
Reference Noise Density vs Frequency. Another
noise density spectrum is also shown in Figure 7,
which was obtained using a 4µF load capacitor at
VREF for noise filtering. Internal reference noise
impacts the DAC output noise; see the DAC Noise
Performance section for more details.
DAC8560
GND
DIN
VDD
1
2
3
4
VDD
8
7
6
5
1mF
VREF
VFB
SCLK
SYNC
VREF
150nF
VOUT
Figure 67. Typical Connections for Operating the
DAC8560 Internal Reference
Load Regulation
Supply Voltage
Load regulation is defined as the change in
reference output voltage as a result of changes in
load current. The load regulation of the DAC8560
internal reference is measured using force and sense
contacts as pictured in Figure 68. The force and
sense lines reduce the impact of contact and trace
resistance, resulting in accurate measurement of the
load regulation contributed solely by the DAC8560
internal reference. Measurement results are
summarized in the Typical Characteristics. Force and
sense lines should be used for applications requiring
improved load regulation.
The DAC8560 internal reference features an
extremely low dropout voltage. It can be operated
with a supply of only 5mV above the reference
output voltage in an unloaded condition. For loaded
conditions, refer to the Load Regulation section. The
stability of the DAC8560 internal reference with
variations in supply voltage (line regulation, DC
PSRR) is also exceptional. Within the specified
supply voltage range of 2.7V to 5.5V, the variation at
VREF is smaller than 10µV/V; see the Typical
Characteristics.
Temperature Drift
The DAC8560 internal reference is designed to
exhibit minimal drift error, defined as the change in
reference output voltage over varying temperature.
The drift is calculated using the box method, which is
described by Equation 2:
Output Pin
Contact and
Trace Resistance
VOUT
Force Line
VREF_MAX * VREF_MIN
6
IL
Drift Error + ǒ
Ǔ
10 (ppmń°C)
VREF TRANGE
Sense Line
Load
Meter
Where:
VREF_MAX
=
maximum reference voltage
observed within temperature range TRANGE
VREF_MIN = minimum reference voltage observed
within temperature range TRANGE
.
Figure 68. Accurate Load Regulation of the
DAC8560 Internal Reference
.
VREF = 2.5V, target value for reference output
voltage.
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Long-Term Stability
R2
10kW
V
REF
V
DD
Long-term stability/aging refers to the change of the
output voltage of a reference over a period of months
or years. This effect lessens as time progresses, as
shown in Figure 6, the typical long-term stability
curve. The typical drift value for the DAC8560
internal reference is 50ppm from 0 hours to 1900
hours. This parameter is characterized by
powering-up and measuring 20 units at regular
intervals for a period of 1900 hours.
+6V
R1
10kW
±5V
OPA703
VDD
VFB
VOUT
VREF
DAC8560
-6V
10mF
0.1mF
GND
Three-Wire
Serial Interface
Thermal Hysteresis
Thermal hysteresis for a reference is defined as the
change in output voltage after operating the device
at +25°C, cycling the device through the specified
temperature range, and returning to +25°C. It is
expressed in Equation 3:
Figure 69. Bipolar Output Range Using External
Reference at 5V
R2
10kW
V
DD
Ť
Ť
VREF_PRE * VREF_POST
6
+ ǒ
Ǔ
VHYST
10 (ppm)
VREF_NOM
+6V
R1
10kW
Where:
±2.5V
OPA703
VHYST = thermal hysteresis.
VDD
VFB
VREF_PRE = output voltage measured at +25°C
VREF
VOUT
DAC8560
pre-temperature cycling.
-6V
150nF
GND
VREF_POST = output voltage measured after the
device has been cycled through the temperature
range of –40°C to +120°C, and returned to
+25°C.
Three-Wire
Serial Interface
DAC NOISE PERFORMANCE
Figure 70. Bipolar Output Range Using Internal
Reference
Typical noise performance for the DAC8560 with the
internal reference enabled is shown in Figure 39 to
Figure 41. Output noise spectral density at pin VOUT
versus frequency is depicted in Figure 39 for
full-scale, midscale, and zero scale input codes. The
typical noise density for midscale code is 170nV/√Hz
at 1kHz and 100nV/√Hz at 1MHz. High-frequency
noise can be improved by filtering the reference
noise as shown in Figure 40, where a 4µF load
capacitor is connected to the VREF pin and compared
to the no-load condition. Integrated output noise
between 0.1Hz and 10Hz is close to 50µVPP
(midscale), as shown in Figure 41.
The output voltage for any input code can be
calculated as using Equation 4:
R1 ) R2
ǒ Ǔ
R1
R2
ǒ Ǔ
R1
D
65536
ǒ Ǔ
VO +
ƪ
VREF
* VREF
ƫ
where D represents the input code in decimal
(0–65535).
With VREF = 5V, R1 = R2 = 10kΩ.
10 D
ǒ Ǔ* 5V
VO +
65536
BIPOLAR OPERATION USING THE DAC8560
This result has an output voltage range of ±5V with
0000h corresponding to a –5V output and FFFFh
corresponding to a 5V output, as shown in Figure 69.
Similarly, using the internal reference, a ±2.5V output
voltage range can be achieved, as shown in
Figure 70.
The DAC8560 has been designed for single-supply
operation, but a bipolar output range is also possible
using the circuit in either Figure 69 or Figure 70. The
circuit shown gives an output voltage range of ±VREF
Rail-to-rail operation at the amplifier output is
achievable using an OPA703 as the output amplifier.
.
23
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DAC8560
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SLAS464–DECEMBER 2006
MICROPROCESSOR INTERFACING
MicrowireTM
CS
DAC8560(1)
SYNC
DAC8560 TO 8051 Interface
SCLK
DIN
SK
SO
See Figure 71 for a serial interface between the
DAC8560 and a typical 8051-type microcontroller.
The setup for the interface is as follows: TXD of the
8051 drives SCLK of the DAC8560, while RXD
drives the serial data line of the device. The SYNC
signal is derived from a bit-programmable pin on the
port of the 8051. In this case, port line P3.3 is used.
When data is to be transmitted to the DAC8560,
P3.3 is taken LOW. The 8051 transmits data in 8-bit
bytes; thus, only eight falling clock edges occur in
the transmit cycle. To load data to the DAC, P3.3 is
left LOW after the first eight bits are transmitted, then
a second write cycle is initiated to transmit the
second byte of data. P3.3 is taken HIGH following
the completion of the third write cycle. The 8051
outputs the serial data in a format which has the LSB
first. The DAC8560 requires its data with the MSB as
the first bit received. The 8051 transmit routine must
therefore take this into account, and mirror the data
as needed.
NOTE: (1) Additional pins omitted for clarity.
Figure 72. DAC8560 to Microwire Interface
DAC8560 to 68HC11 Interface
Figure 73 shows a serial interface between the
DAC8560 and the 68HC11 microcontroller. SCK of
the 68HC11 drives the SCLK of the DAC8560, while
the MOSI output drives the serial data line of the
DAC. The SYNC signal is derived from a port line
(PC7), similar to the 8051 diagram.
DAC8560 (1)
SYNC
68HC11(1)
PC7
SCK
SCLK
DIN
MOSI
80C51/80L51(1)
P3.3
DAC8560 (1)
SYNC
NOTE: (1) Additional pins omitted for clarity.
TXD
RXD
SCLK
DIN
Figure 73. DAC8560 to 68HC11 Interface
The 68HC11 should be configured so that its CPOL
bit is '0' and its CPHA bit is '1'. This configuration
causes data appearing on the MOSI output to be
valid on the falling edge of SCK. When data is being
transmitted to the DAC, the SYNC line is held LOW
(PC7). Serial data from the 68HC11 is transmitted in
8-bit bytes with only eight falling clock edges
occurring in the transmit cycle. (Data is transmitted
MSB first.) In order to load data to the DAC8560,
PC7 is left LOW after the first eight bits are
transferred, then a second and third serial write
operation is performed to the DAC. PC7 is taken
HIGH at the end of this procedure.
NOTE: (1) Additional pins omitted for clarity.
Figure 71. DAC8560 to 80C51/80L51 Interface
DAC8560 to Microwire Interface
Figure 72 shows an interface between the DAC8560
and any Microwire compatible device. Serial data is
shifted out on the falling edge of the serial clock and
is clocked into the DAC8560 on the rising edge of
the SK signal.
24
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DAC8560
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SLAS464–DECEMBER 2006
LAYOUT
The power applied to VDD should be well regulated
and low noise. Switching power supplies and DC/DC
converters often have high-frequency glitches or
spikes riding on the output voltage. In addition, digital
components can create similar high-frequency spikes
as their internal logic switches states. This noise can
easily couple into the DAC output voltage through
various paths between the power connections and
analog output.
A
precision analog component requires careful
layout, adequate bypassing, and clean,
well-regulated power supplies.
The DAC8560 offers single-supply operation, and it
often is used in close proximity with digital logic,
microcontrollers, microprocessors, and digital signal
processors. The more digital logic present in the
design and the higher the switching speed, the more
difficult it is to keep digital noise from appearing at
the output.
As with the GND connection, VDD should be
connected to a power-supply plane or trace that is
separate from the connection for digital logic until
they are connected at the power-entry point. In
addition, a 1µF to 10µF capacitor and 0.1µF bypass
capacitor are strongly recommended. In some
situations, additional bypassing may be required,
such as a 100µF electrolytic capacitor or even a Pi
filter made up of inductors and capacitors – all
designed to essentially low-pass filter the supply,
removing the high-frequency noise.
As a result of the single ground pin of the DAC8560,
all return currents, including digital and analog return
currents for the DAC, must flow through a single
point. Ideally, GND would be connected directly to an
analog ground plane. This plane would be separate
from the ground connection for the digital
components until they were connected at the
power-entry point of the system.
25
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PACKAGE OPTION ADDENDUM
www.ti.com
8-Jan-2007
PACKAGING INFORMATION
Orderable Device
DAC8560IADGKR
DAC8560IADGKRG4
DAC8560IADGKT
DAC8560IADGKTG4
DAC8560IBDGKR
DAC8560IBDGKRG4
DAC8560IBDGKT
DAC8560IBDGKTG4
DAC8560ICDGKR
DAC8560ICDGKRG4
DAC8560ICDGKT
DAC8560ICDGKTG4
DAC8560IDDGKR
DAC8560IDDGKRG4
DAC8560IDDGKT
DAC8560IDDGKTG4
Status (1)
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
Package Package
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)
Qty
Type
Drawing
MSOP
DGK
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
8
2500 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
MSOP
DGK
DGK
DGK
DGK
DGK
DGK
DGK
DGK
DGK
DGK
DGK
DGK
DGK
DGK
DGK
2500 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
250 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
250 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
250 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
250 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
250 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
250 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
250 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
250 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
8-Jan-2007
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 2
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications,
enhancements, improvements, and other changes to its products and services at any time and to
discontinue any product or service without notice. Customers should obtain the latest relevant information
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subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment.
TI warrants performance of its hardware products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent
TI deems necessary to support this warranty. Except where mandated by government requirements, testing
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TI assumes no liability for applications assistance or customer product design. Customers are responsible
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