CY7C1012AV33-8BGCT [CYPRESS]

Standard SRAM, 512KX24, 8ns, CMOS, PBGA119, 14 X 22 MM, 2.40 MM HEIGHT, PLASTIC, BGA-119;
CY7C1012AV33-8BGCT
型号: CY7C1012AV33-8BGCT
厂家: CYPRESS    CYPRESS
描述:

Standard SRAM, 512KX24, 8ns, CMOS, PBGA119, 14 X 22 MM, 2.40 MM HEIGHT, PLASTIC, BGA-119

静态存储器 内存集成电路
文件: 总14页 (文件大小:384K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CY7C1012AV33  
512 K × 24 Static RAM  
512  
K × 24 Static RAM  
Features  
Functional Description  
High speed  
tAA = 8 ns  
The CY7C1012AV33 is a high-performance CMOS static RAM  
organized as 512 K words by 24 bits. Each data byte is  
separately controlled by the individual chip selects (CE0, CE1,  
CE2). CE0 controls the data on the I/O0–I/O7, while CE1 controls  
the data on I/O8–I/O15, and CE2 controls the data on the data  
pins I/O16–I/O23. This device has an automatic power-down  
feature that significantly reduces power consumption when  
deselected.  
Low active power  
1080 mW (max)  
Operating voltages of 3.3 ± 0.3 V  
2.0 V data retention  
Writing the data bytes into the SRAM is accomplished when the  
chip select controlling that byte is LOW and the write enable input  
(WE) input is LOW. Data on the respective input/output (I/O) pins  
is then written into the location specified on the address pins  
(A0–A18). Asserting all of the chip selects LOW and write enable  
LOW will write all 24 bits of data into the SRAM. Output enable  
(OE) is ignored while in WRITE mode.  
Automatic power-down when deselected  
TTL-compatible inputs and outputs  
Easy memory expansion with CE0, CE1 and CE2 features  
Available in non Pb-free 119 ball PBGA.  
Data bytes can also be individually read from the device.  
Reading a byte is accomplished when the chip select controlling  
that byte is LOW and write enable (WE) HIGH while output  
enable (OE) remains LOW. Under these conditions, the contents  
of the memory location specified on the address pins will appear  
on the specified data input/output (I/O) pins. Asserting all the chip  
selects LOW will read all 24 bits of data from the SRAM.  
The 24 I/O pins (I/O0–I/O23) are placed in a high-impedance  
state when all the chip selects are HIGH or when the output  
enable (OE) is HIGH during a READ mode. For further details,  
refer to the truth table of this data sheet.  
The CY7C1012AV33 is available in a standard 119-ball PBGA.  
For a complete list of related documentation, click here.  
Functional Block Diagram  
INPUT BUFFER  
A
0
A
1
A
2
I/O –I/O  
0
7
A
3
512K x 24  
ARRAY  
A
4
I/O –I/O  
8
15  
A
5
A
6
I/O –I/O  
16  
23  
A
7
A
8
A
9
CE , CE , CE  
2
0
1
COLUMN  
DECODER  
WE  
OE  
CONTROL LOGIC  
Cypress Semiconductor Corporation  
Document Number: 38-05254 Rev. *J  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised November 18, 2014  
CY7C1012AV33  
Contents  
Selection Guide ................................................................3  
Pin Configurations ...........................................................3  
Maximum Ratings .............................................................4  
Operating Range ...............................................................4  
DC Electrical Characteristics ..........................................4  
Capacitance ......................................................................5  
AC Test Loads and Waveforms .......................................5  
AC Switching Characteristics .........................................6  
Switching Waveforms ......................................................7  
Truth Table ........................................................................9  
Ordering Information ......................................................10  
Ordering Code Definitions .........................................10  
Package Diagram ............................................................11  
Acronyms ........................................................................12  
Document Conventions .................................................12  
Units of Measure .......................................................12  
Document History Page .................................................13  
Sales, Solutions, and Legal Information ......................14  
Worldwide Sales and Design Support .......................14  
Products ....................................................................14  
PSoC® Solutions ......................................................14  
Cypress Developer Community .................................14  
Technical Support .....................................................14  
Document Number: 38-05254 Rev. *J  
Page 2 of 14  
CY7C1012AV33  
Selection Guide  
Description  
-8  
8
Unit  
ns  
Maximum Access Time  
Maximum Operating Current  
Commercial  
300  
300  
50  
mA  
Industrial  
Maximum CMOS Standby Current  
Commercial / Industrial  
mA  
Pin Configurations  
[1, 2]  
Figure 1. 119-ball PBGA pinout (Top View)  
1
2
3
4
5
6
7
A
B
NC  
NC  
A
A
A
A
A
NC  
A
A
CE0  
NC  
A
A
NC  
C
D
E
F
I/O12  
I/O13  
I/O14  
I/O15  
I/O16  
I/O17  
NC  
NC  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
A
CE1  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
NC  
A
CE2  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
NC  
A
NC  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
VSS  
VDD  
A
I/O0  
I/O1  
I/O2  
I/O3  
I/O4  
I/O5  
DNU  
I/O6  
I/O7  
I/O8  
I/O9  
I/O10  
I/O11  
NC  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
VSS  
NC  
G
H
J
K
L
I/O18  
I/O19  
I/O20  
I/O21  
I/O22  
I/O23  
NC  
M
N
P
R
T
A
WE  
OE  
A
U
NC  
A
A
A
A
NC  
Notes  
1. NC pins are not connected on the die.  
2. DNU pins have to be left floating or tied to VSS to ensure proper application.  
Document Number: 38-05254 Rev. *J  
Page 3 of 14  
 
 
CY7C1012AV33  
DC Voltage Applied to Outputs  
Maximum Ratings  
in high Z State [3] ................................ –0.5 V to VCC + 0.5 V  
DC Input Voltage [3] ............................ –0.5 V to VCC + 0.5 V  
Current into Outputs (LOW) ........................................ 20 mA  
Exceeding maximum ratings may shorten the useful life of the  
device. User guidelines are not tested.  
Storage Temperature ............................... –65 C to +150 C  
Ambient Temperature with  
Power Applied ......................................... –55 C to +125 C  
Operating Range  
Range  
Commercial  
Industrial  
Ambient Temperature  
0 C to +70 C  
VCC  
Supply Voltage on  
V
CC to Relative GND[3] ................................–0.5 V to +4.6 V  
3.3 V 0.3 V  
–40 C to +85 C  
DC Electrical Characteristics  
Over the Operating Range  
-8  
Parameter  
VOH  
Description  
Test Conditions [4]  
Unit  
Min  
2.4  
Max  
Output HIGH Voltage  
Output LOW Voltage  
Input HIGH Voltage  
VCC = Min, IOH = –4.0 mA  
V
V
VOL  
VIH  
VCC = Min, IOL = 8.0 mA  
0.4  
2.0  
–0.3  
–1  
VCC + 0.3  
0.8  
V
[3]  
VIL  
IIX  
Input LOW Voltage  
V
Input Leakage Current  
Output Leakage Current  
VCC Operating Supply Current  
GND < VI < VCC  
+1  
A  
A  
mA  
mA  
mA  
IOZ  
ICC  
GND < VOUT < VCC, Output Disabled  
–1  
+1  
VCC = Max,  
Commercial  
Industrial  
300  
300  
100  
f = fMAX = 1/tRC  
ISB1  
ISB2  
Automatic CE Power-down  
Current – TTL Inputs  
Max VCC, CE > VIH,  
VIN > VIH or VIN < VIL, f = fMAX  
Automatic CE Power-down  
Current – CMOS Inputs  
Max VCC  
CE > VCC – 0.3 V,  
IN > VCC – 0.3 V,  
or VIN < 0.3 V, f = 0  
,
Commercial /  
Industrial  
50  
mA  
V
Notes  
3.  
V
(min) = –2.0 V for pulse durations of less than 20 ns.  
IL  
4. CE refers to a combination of CE , CE , and CE . CE is active LOW when all three of these signals are active LOW at the same time.  
0
1
2
Document Number: 38-05254 Rev. *J  
Page 4 of 14  
 
 
 
CY7C1012AV33  
Capacitance  
Parameter [5]  
Description  
Input Capacitance  
I/O Capacitance  
Test Conditions  
TA = 25 C, f = 1 MHz, VCC = 3.3 V  
Max  
8
Unit  
pF  
CIN  
COUT  
10  
pF  
AC Test Loads and Waveforms  
Figure 2. AC Test Loads and Waveforms [6]  
R1 317  
50  
3.3 V  
= 1.5 V  
VTH  
OUTPUT  
OUTPUT  
Z = 50   
30 pF*  
0
R2  
351  
* Capacitive Load consists of all  
5 pF  
components of the test environment.  
(a)  
INCLUDING  
JIG AND  
SCOPE  
ALL INPUT PULSES  
(b)  
3.3 V  
90%  
10%  
90%  
10%  
GND  
Rise time > 1 V/ns  
Fall time: > 1 V/ns  
(c)  
Notes  
5. Tested initially and after any design or process changes that may affect these parameters.  
6. Valid SRAM operation does not occur until the power supplies have reached the minimum operating V (3.0 V). As soon as 1 ms (T  
) after reaching the minimum  
power  
DD  
operating V , normal SRAM operation can begin including reduction in V to the data retention (V , 2.0 V) voltage.  
CCDR  
DD  
DD  
Document Number: 38-05254 Rev. *J  
Page 5 of 14  
 
 
 
CY7C1012AV33  
AC Switching Characteristics  
Over the Operating Range  
-8  
Parameter [7]  
Description  
Unit  
Min  
Max  
Read Cycle  
[8]  
tpower  
tRC  
VCC(typical) to the first access  
Read Cycle Time  
1
8
3
1
3
0
1
8
8
5
5
5
8
5
5
ms  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAA  
Address to Data Valid  
tOHA  
tACE  
tDOE  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
tPU  
Data Hold from Address Change  
CE1, CE2, and CE3 LOW to Data Valid  
OE LOW to Data Valid  
OE LOW to low Z[9]  
OE HIGH to high Z[9]  
CE1, CE2, and CE3 LOW to low Z[9]  
CE1, CE2, or CE3 HIGH to high Z[9]  
CE1, CE2, and CE3 LOW to power-up[10]  
CE1, CE2, or CE3 HIGH to power-down[10]  
Byte Enable to Data Valid  
tPD  
tDBE  
tLZBE  
tHZBE  
Byte Enable to low Z[9]  
Byte Disable to high Z[9]  
Write Cycle[11, 12]  
tWC  
tSCE  
tAW  
Write Cycle Time  
8
6
6
0
0
6
5
0
3
6
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
CE1, CE2, and CE3 LOW to Write End  
Address Set-up to Write End  
Address Hold from Write End  
Address Set-up to Write Start  
WE Pulse Width  
tHA  
tSA  
tPWE  
tSD  
Data Set-up to Write End  
Data Hold from Write End  
WE HIGH to low Z[13]  
tHD  
tLZWE  
tHZWE  
tBW  
WE LOW to high Z[13]  
Byte Enable to End of Write  
Notes  
7. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V, and output loading of the specified I /I  
OL OH  
and transmission line loads. Test conditions for the read cycle use output loading as shown in part (a) of the Figure 2, unless specified otherwise.  
8. This part has a voltage regulator which steps down the voltage from 3 V to 2 V internally. t time has to be provided initially before a read/write operation is started.  
power  
9.  
t
, t  
, t  
, t  
, and t  
, t  
, t  
, t  
are specified with a load capacitance of 5 pF as in part (b) of Figure 2. Transition is measured 200 mV  
HZOE HZCE HZWE HZBE  
LZOE LZCE LZWE LZBE  
from steady-state voltage.  
10. These parameters are guaranteed by design and are not tested.  
11. The internal write time of the memory is defined by the overlap of CE , CE , and CE LOW and WE LOW. The chip enables must be active and WE must be LOW  
1
2
3
to initiate a write, and the transition of any of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge  
of the signal that terminates the write.  
12. The minimum write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of t  
and t  
.
HZWE  
SD  
13. t  
, t  
, t  
, t  
, and t  
, t , t , t are specified with a load capacitance of 5 pF as in part (b) of Figure 2 on page 5. Transition is measured  
HZOE HZCE HZWE HZBE  
LZOE LZCE LZWE LZBE  
200 mV from steady-state voltage.  
Document Number: 38-05254 Rev. *J  
Page 6 of 14  
 
 
 
 
 
 
 
 
CY7C1012AV33  
Switching Waveforms  
Figure 3. Read Cycle No. 1 [14, 15]  
t
RC  
ADDRESS  
t
AA  
t
OHA  
DATA OUT  
PREVIOUS DATA VALID  
DATA VALID  
Figure 4. Read Cycle No. 2 (OE Controlled) [15, 16, 17]  
ADDRESS  
CE  
t
RC  
t
ACE  
OE  
t
HZOE  
t
DOE  
t
HZCE  
t
LZOE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
DATA OUT  
DATA VALID  
t
LZCE  
t
PD  
ICC  
t
PU  
V
CC  
50%  
50%  
SUPPLY  
CURRENT  
ISB  
Figure 5. Write Cycle No. 1 (CE Controlled) [17, 18, 19]  
t
WC  
ADDRESS  
CE  
t
SCE  
t
SA  
t
SCE  
t
t
HA  
AW  
t
PWE  
WE  
t
t
HD  
SD  
DATA I/O  
DATA VALID  
Notes  
14. Device is continuously selected. OE, CE = V .  
IL  
15. WE is HIGH for read cycle.  
16. Address valid prior to or coincident with CE transition LOW.  
17. CE refers to a combination of CE , CE , and CE . CE is active LOW when all three of these signals are active LOW at the same time.  
0
1
2
18. Data I/O is high impedance if OE = V  
.
IH  
19. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.  
Document Number: 38-05254 Rev. *J  
Page 7 of 14  
 
 
 
 
 
CY7C1012AV33  
Switching Waveforms (continued)  
Figure 6. Write Cycle No. 2 (WE Controlled, OE HIGH During Write) [20, 21]  
t
WC  
ADDRESS  
CE  
t
SCE  
t
t
HA  
AW  
t
t
PWE  
SA  
WE  
OE  
t
t
SD  
HD  
DATA VALID  
DATA I/O  
IN  
NOTE 22  
t
HZOE  
Figure 7. Write Cycle No. 3 (WE Controlled, OE LOW) [21, 23]  
t
WC  
ADDRESS  
CE  
t
SCE  
t
t
HA  
AW  
t
SA  
t
PWE  
WE  
t
t
HD  
SD  
NOTE 22  
DATA I/O  
DATA VALID  
t
t
LZWE  
HZWE  
Notes  
20. Data I/O is high impedance if OE = V  
.
IH  
21. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.  
22. During this period the I/Os are in the output state and input signals should not be applied.  
23. CE refers to a combination of CE , CE , and CE . CE is active LOW when all three of these signals are active LOW at the same time.  
0
1
2
Document Number: 38-05254 Rev. *J  
Page 8 of 14  
 
 
 
 
CY7C1012AV33  
Truth Table  
CE0  
H
L
CE1  
H
H
L
CE2  
H
H
H
L
OE  
X
L
WE  
X
I/O0–I/O23  
Mode  
Power  
High Z  
Power-down  
Read  
Standby (ISB  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
)
H
H
H
H
L
I/O0–I/O7 Data Out  
I/O8–I/O15 Data Out  
I/O16–I/O23 Data Out  
Full Data Out  
)
H
H
L
L
Read  
)
H
L
L
Read  
)
L
L
Read  
)
L
H
L
H
H
L
X
X
X
X
H
I/O0–I/O7 Data In  
I/O8–I/O15 Data In  
I/O16–I/O23 Data In  
Full Data In  
Write  
)
H
H
L
L
Write  
)
H
L
L
Write  
)
L
L
Write  
)
L
L
L
H
High Z  
Selected, Outputs Disabled  
)
Document Number: 38-05254 Rev. *J  
Page 9 of 14  
CY7C1012AV33  
Ordering Information  
Speed  
Package  
Diagram  
Operating  
Range  
Ordering Code  
(ns)  
Package Type  
8
CY7C1012AV33-8BGC  
51-85115 119-ball (14 × 22 × 2.4 mm) PBGA  
Commercial  
Ordering Code Definitions  
CY 7 C 1012 V33  
C
A
BG  
- 8  
Temperature range: C = Commercial  
BG = 119-ball PBGA  
Speed Grade: 8 ns  
V33 = 3.3 V  
Process Technology: A 90 nm  
Part Identifier  
Technology Code: C = CMOS  
Marketing Code: 7 = SRAM  
Company ID: CY = Cypress  
Document Number: 38-05254 Rev. *J  
Page 10 of 14  
 
CY7C1012AV33  
Package Diagram  
Figure 8. 119-ball PBGA (14 × 22 × 2.4 mm) BG119 Package Outline, 51-85115  
51-85115 *D  
Document Number: 38-05254 Rev. *J  
Page 11 of 14  
 
CY7C1012AV33  
Acronyms  
Document Conventions  
Units of Measure  
Acronym  
Description  
CMOS  
CE  
Complementary Metal Oxide Semiconductor  
Chip Enable  
Symbol  
°C  
Unit of Measure  
degree Celsius  
megahertz  
microampere  
milliampere  
millimeter  
millisecond  
millivolt  
MHz  
µA  
mA  
mm  
ms  
mV  
mW  
ns  
I/O  
Input/Output  
OE  
Output Enable  
PBGA  
SRAM  
TTL  
Plastic Ball Grid Array  
Static Random Access Memory  
Transistor-Transistor Logic  
Write Enable  
WE  
milliwatt  
nanosecond  
percent  
%
pF  
picofarad  
volt  
V
W
watt  
Document Number: 38-05254 Rev. *J  
Page 12 of 14  
 
 
CY7C1012AV33  
Document History Page  
Document Title: CY7C1012AV33, 512 K × 24 Static RAM  
Document Number: 38-05254  
Orig. of  
Change  
Rev.  
ECN No.  
Issue Date  
Description of Change  
**  
113711  
117057  
117988  
118992  
03/11/02  
07/31/02  
09/03/02  
09/19/02  
NSL  
New data sheet.  
Removed 15-ns bin  
Added 8-ns bin  
*A  
*B  
*C  
DFP  
DFP  
DFP  
Change Cin (input capacitance) from 6 pF to 8 pF  
Change Cout (output capacitance) from 8 pF to 10 pF  
*D  
*E  
120382  
492137  
11/15/02  
See ECN  
DFP  
NXR  
Final data sheet. Added note 4 to “AC Test Loads and Waveforms”  
Removed 12 ns speed bin from product offering  
Included note #1 and 2 on page #2  
Changed the description of IIX from Input Load Current to Input Leakage Cur-  
rent in DC Electrical Characteristics table  
Updated Ordering Information Table  
*F  
*G  
*H  
2896044  
3097955  
3086499  
03/19/2010  
11/30/2010  
06/07/2011  
AJU  
PRAS  
AJU  
Updated Ordering Information Table  
Updated Package Diagram  
Added Sales, Solutions, and Legal Information  
Added Ordering Code Definitions.  
Added Acronyms and Units of Measure.  
Minor edits.  
Updated Selection Guide (Removed -10 column).  
Updated DC Electrical Characteristics (Removed -10 column).  
Updated AC Switching Characteristics (Removed -10 column).  
Updated in new template.  
*I  
4212876  
4573215  
12/06/2013  
11/18/2014  
VINI  
VINI  
Updated Package Diagram:  
spec 51-85115 – Changed revision from *C to *D.  
Updated in new template.  
Completing Sunset Review.  
*J  
Added related documentation hyperlink in page 1.  
Document Number: 38-05254 Rev. *J  
Page 13 of 14  
CY7C1012AV33  
Sales, Solutions, and Legal Information  
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closest to you, visit us at Cypress Locations.  
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any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for  
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application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),  
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,  
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress  
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without  
the express written permission of Cypress.  
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES  
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not  
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where  
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer  
assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Use may be limited by and subject to the applicable Cypress software license agreement.  
Document Number: 38-05254 Rev. *J  
Revised November 18, 2014  
Page 14 of 14  
All products and company names mentioned in this document may be the trademarks of their respective holders.  

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