CY7C1021CV26_10 [CYPRESS]

1-Mbit (64 K × 16) Static RAM; 1兆位( 64千× 16 )静态RAM
CY7C1021CV26_10
型号: CY7C1021CV26_10
厂家: CYPRESS    CYPRESS
描述:

1-Mbit (64 K × 16) Static RAM
1兆位( 64千× 16 )静态RAM

文件: 总15页 (文件大小:518K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CY7C1021CV26  
1-Mbit (64 K × 16) Static RAM  
1-Mbit (64  
K × 16) Static RAM  
an automatic power-down feature that significantly reduces  
power consumption when deselected.  
Features  
Temperature Range  
Automotive: –40 °C to 125 °C  
Writing to the device is accomplished by taking Chip Enable  
(CE) and Write Enable (WE) inputs LOW. If Byte Low Enable  
(BLE) is LOW, then data from I/O pins (I/O1 through I/O8), is  
written into the location specified on the address pins (A0  
through A15). If Byte High Enable (BHE) is LOW, then data  
from I/O pins (I/O9 through I/O16) is written into the location  
specified on the address pins (A0 through A15).  
High speed  
tAA = 15 ns  
Optimized voltage range: 2.5 V to 2.7 V  
Low active power: 220 mW (Max)  
Reading from the device is accomplished by taking Chip  
Enable (CE) and Output Enable (OE) LOW while forcing the  
Write Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW,  
then data from the memory location specified by the address  
pins will appear on I/O1 to I/O8. If Byte High Enable (BHE) is  
LOW, then data from memory will appear on I/O9 to I/O16. See  
the truth table at the end of this data sheet for a complete  
description of Read and Write modes.  
Automatic power-down when deselected  
Independent control of upper and lower bits  
CMOS for optimum speed/power  
Available in Pb-free and non Pb-free 44-pin TSOP II , 44-pin  
(400-Mil) Molded SOJ and Pb-free 48-ball FPBGA packages  
The input/output pins (I/O1 through I/O16) are placed in a  
high-impedance state when the device is deselected (CE  
HIGH), the outputs are disabled (OE HIGH), the BHE and BLE  
are disabled (BHE, BLE HIGH), or during a Write operation  
(CE LOW, and WE LOW).  
Functional Description  
The CY7C1021CV26 is a high-performance CMOS static  
RAM organized as 65,536 words by 16 bits. This device has  
Logic Block Diagram  
DATA IN DRIVERS  
A7  
A6  
A5  
A4  
A3  
A2  
64K x 16  
I/O1–I/O8  
RAM Array  
I/O9–I/O16  
A1  
A0  
COLUMN DECODER  
BHE  
WE  
CE  
OE  
BLE  
Cypress Semiconductor Corporation  
Document Number: 38-05589 Rev. *E  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised December 1, 2010  
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CY7C1021CV26  
Contents  
Selection Guide ................................................................3  
Pin Configuration .............................................................3  
Pin Definitions ..................................................................3  
Maximum Ratings .............................................................4  
Operating Range ...............................................................4  
Electrical Characteristics .................................................4  
Capacitance ......................................................................4  
Thermal Resistance ..........................................................4  
AC Test Loads and Waveforms .......................................5  
Switching Characteristics ................................................5  
Switching Waveforms ......................................................7  
Read Cycle No. 1 ........................................................7  
Read Cycle No. 2 (OE Controlled) ..............................7  
Write Cycle No. 1 (CE Controlled) ...............................8  
Write Cycle No. 2 (BLE or BHE Controlled) ................8  
Write Cycle No. 3 (WE Controlled, LOW) ....................9  
Truth Table ........................................................................9  
Ordering Information ......................................................10  
Ordering Code Definitions .........................................10  
Package Diagrams ..........................................................11  
Acronyms ........................................................................13  
Document Conventions .................................................13  
Units of Measure .......................................................13  
Document History Page .................................................14  
Sales, Solutions, and Legal Information ......................15  
Worldwide Sales and Design Support .......................15  
Products ....................................................................15  
PSoC Solutions .........................................................15  
Document Number: 38-05589 Rev. *E  
Page 2 of 15  
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CY7C1021CV26  
Selection Guide[1]  
–15  
15  
Unit  
ns  
Maximum Access Time  
Maximum Operating Current  
Maximum CMOS Standby Current  
80  
mA  
mA  
10  
Pin Configuration[2]  
TSOP II -Top View  
44  
1
A
4
A
5
43  
42  
41  
40  
39  
38  
A
A
2
3
4
5
6
3
6
A
A
2
7
OE  
A
1
BHE  
BLE  
I/O  
A
0
CE  
I/O  
7
1
16  
37  
36  
35  
34  
33  
I/O  
I/O  
8
I/O  
I/O  
2
3
15  
14  
13  
9
10  
11  
12  
13  
I/O  
V
SS  
I/O  
4
CC  
V
SS  
V
V
CC  
32  
I/O  
I/O  
I/O  
5
6
7
8
12  
11  
31  
30  
29  
28  
I/O  
I/O  
I/O  
14  
15  
16  
I/O  
10  
9
I/O  
WE 17  
NC  
18  
27  
26  
25  
A
A
8
15  
19  
A
A
14  
9
A
13  
20  
21  
22  
A
11  
10  
A
A
12  
24  
23  
NC  
NC  
Pin Definitions  
Pin Name Pin Number  
I/O Type  
Input  
Description  
A0–A15  
1–5, 18–21,  
24–27, 42–44  
Address Inputs used to select one of the address locations.  
Bidirectional Data I/O lines. Used as input or output lines depending on operation.  
No Connects. This pin is not connected to the die.  
I/O1–I/O16 7–10, 13–16, Input/Output  
29–32, 35–38  
NC  
22, 23, 28  
17  
No Connect  
Input/Control  
WE  
Write Enable Input, active LOW. When selected LOW, a Write is conducted. When  
selected HIGH, a Read is conducted.  
CE  
6
Input/Control  
Input/Control  
Input/Control  
Chip Enable Input, active LOW. When LOW, selects the chip. When HIGH,  
deselects the chip.  
BHE, BLE 40, 39  
Byte Write Select Inputs, active LOW. BHE controls I/O16–I/O9, BLE controls  
I/O8–I/O1.  
OE  
41  
Output Enable, active LOW. Controls the direction of the I/O pins. When LOW, the  
I/O pins are allowed to behave as outputs. When deasserted HIGH, I/O pins are  
tri-stated, and act as input data pins.  
VSS  
VCC  
12, 34  
11, 33  
Ground  
Ground for the device. Should be connected to ground of the system.  
Power Supply Power Supply inputs to the device.  
Notes  
1. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V = V  
, T = 25 °C.  
A
CC  
CC(typ.)  
2. NC pins are not connected on the die.  
Document Number: 38-05589 Rev. *E  
Page 3 of 15  
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CY7C1021CV26  
DC input voltage[3]............................... –0.5 V to VCC + 0.5 V  
Current into outputs (LOW) ......................................... 20 mA  
Maximum Ratings  
Exceeding maximum ratings may shorten the useful life of the  
device. User guidelines are not tested.  
Static discharge voltage...........................................> 2001 V  
(per MIL-STD-883, method 3015)  
Storage temperature ................................ –65 C to +150 C  
Latch-up current .....................................................> 200 mA  
Ambient temperature with  
power applied ........................................... –55 C to +125 C  
Supply voltage on VCC to relative GND[3].....–0.5 V to +4.6 V  
Operating Range  
Ambient  
Range  
Automotive  
VCC  
DC voltage applied to outputs  
Temperature  
in high Z state[3]...................................0.5 V to VCC + 0.5 V  
–40 C to +125 C 2.5 V–2.7 V  
Electrical Characteristics  
Over the Operating Range  
–15  
Parameter  
Description  
Test Conditions  
VCC = Min, IOH = –1.0 mA  
Unit  
Min  
2.3  
Max  
VOH  
VOL  
VIH  
VIL  
Output HIGH voltage  
Output LOW voltage  
Input HIGH voltage  
Input LOW voltage[3]  
Input leakage current  
Output leakage current  
VCC operating supply current  
0.4  
V
V
VCC = Min, IOL = 1.0 mA  
2.0  
–0.3  
–3  
–3  
VCC + 0.3  
0.8  
V
V
IIX  
GND < VI < VCC  
+3  
A  
A  
mA  
mA  
IOZ  
ICC  
ISB1  
GND < VI < VCC, output disabled  
VCC = Max, IOUT = 0 mA, f = fMAX = 1/tRC  
Max VCC, CE > VIH, VIN > VIH or VIN < VIL, f = fMAX  
+3  
80  
Automatic CE Power-Down  
Current —TTL inputs  
15  
ISB2  
Automatic CE Power-Down  
Current —CMOS inputs  
Max VCC, CE > VCC – 0.3 V, VIN > VCC – 0.3 V,  
or VIN < 0.3 V, f = 0  
10  
mA  
Capacitance[4]  
Parameter  
Description  
Input capacitance  
Output capacitance  
Test Conditions  
Max  
Unit  
pF  
CIN  
TA = 25 C, f = 1 MHz, VCC = 2.6 V  
8
8
COUT  
pF  
Thermal Resistance[4]  
Parameter  
JA  
Description  
Test Conditions  
TSOP-II  
76.92  
Unit  
C/W  
C/W  
Thermal Resistance (Junction to Ambient) Still Air, soldered on a 3 × 4.5 inch,  
four-layer printed circuit board  
JC  
Thermal Resistance (Junction to Case)  
15.86  
Notes  
3.  
V (min.) = –2.0V and V (max) = V + 0.5 V for pulse durations of less than 20 ns.  
IL IH CC  
4. Tested initially and after any design or process changes that may affect these parameters.  
Document Number: 38-05589 Rev. *E  
Page 4 of 15  
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CY7C1021CV26  
AC Test Loads and Waveforms[5]  
R1  
1830  
High Z characteristics:  
ALL INPUT PULSES  
R 317  
2.6V  
2.6 V  
2.6V  
90%  
10%  
90%  
10%  
OUTPUT  
OUTPUT  
R2  
GND  
30 pF  
INCLUDING  
JIG AND  
R2  
351  
5 pF  
1976  
Fall Time: 1 V/ns  
Rise Time: 1 V/ns  
(b)  
SCOPE  
(c)  
(a)  
Switching Characteristics  
Over the Operating Range[6]  
–15  
Parameter  
Description  
Unit  
Min  
Max  
Read Cycle  
tRC  
Read cycle time  
Address to data valid  
15  
3
0
3
0
0
15  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAA  
tOHA  
tACE  
tDOE  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
Data hold from address change  
CE LOW to data valid  
OE LOW to data valid  
OE LOW to low Z[7]  
OE HIGH to high Z[7, 8]  
CE LOW to low Z[7]  
CE HIGH to high Z[7, 8]  
CE LOW to power-up  
CE HIGH to power-down  
Byte enable to data valid  
Byte enable to low Z  
15  
7
7
7
[9]  
tPU  
[9]  
tPD  
15  
7
tDBE  
tLZBE  
tHZBE  
Byte disable to high Z  
7
Notes  
5. AC characteristics (except high Z) are tested using the Thevenin load shown in Figure (a). High Z characteristics are tested for all speeds using the test load  
shown in Figure (c)  
6. Test conditions assume signal transition time of 2.6 ns or less, timing reference levels of 1.3 V, input pulse levels of 0 to 2.6 V.  
7. At any given temperature and voltage condition, t  
is less than t  
, t  
is less than t  
, and t  
is less than t  
for any given device.  
HZCE  
LZCE HZOE  
LZOE  
HZWE  
LZWE  
8.  
t
, t  
, t  
, and t  
are specified with a load capacitance of 5 pF as in part (d) of AC Test Loads. Transition is measured 500 mV from steady-state voltage.  
HZOE HZBE HZCE  
HZWE  
9. This parameter is guaranteed by design and is not tested.  
Document Number: 38-05589 Rev. *E  
Page 5 of 15  
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CY7C1021CV26  
Switching Characteristics  
Over the Operating Range[6] (continued)  
–15  
Parameter  
Description  
Unit  
Min  
Max  
Write Cycle[10]  
tWC  
tSCE  
tAW  
Write cycle time  
15  
10  
10  
0
7
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
CE LOW to write end  
Address set-up to write end  
Address hold from write end  
Address set-up to write start  
WE pulse width  
tHA  
tSA  
0
tPWE  
tSD  
10  
8
Data set-up to write end  
Data hold from write end  
WE HIGH to low Z[11]  
WE LOW to high Z[11, 12]  
Byte enable to end of write  
tHD  
0
tLZWE  
tHZWE  
tBW  
3
9
Notes  
10. The internal Write time of the memory is defined by the overlap of CE LOW, WE LOW and BHE/BLE LOW. CE, WE and BHE/BLE must be LOW to initiate a Write,  
and the transition of these signals can terminate the Write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the Write.  
11. At any given temperature and voltage condition, t  
is less than t  
, t  
is less than t  
, and t  
is less than t  
for any given device.  
HZCE  
LZCE HZOE  
LZOE  
HZWE  
LZWE  
12. t  
, t  
, t  
, and t  
are specified with a load capacitance of 5 pF as in part (d) of AC Test Loads. Transition is measured 500 mV from steady-state voltage.  
HZOE HZBE HZCE  
HZWE  
Document Number: 38-05589 Rev. *E  
Page 6 of 15  
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CY7C1021CV26  
Switching Waveforms  
Read Cycle No. 1[13, 14]  
t
RC  
ADDRESS  
t
AA  
t
OHA  
DATA OUT  
PREVIOUS DATA VALID  
DATA VALID  
Read Cycle No. 2 (OE Controlled)[14, 15]  
ADDRESS  
CE  
t
RC  
t
ACE  
OE  
t
HZOE  
t
DOE  
BHE, BLE  
t
LZOE  
t
HZCE  
t
DBE  
t
LZBE  
t
HZBE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
DATA OUT  
VCC  
SUPPLY  
CURRENT  
DATA VALID  
t
LZCE  
t
PD  
I
CC
t
PU  
50%  
50%  
I
SB  
Notes  
13. Device is continuously selected. OE, CE, BHE and/or BLE = V .  
IL  
14. WE is HIGH for Read cycle.  
15. Address valid prior to or coincident with CE transition LOW.  
Document Number: 38-05589 Rev. *E  
Page 7 of 15  
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CY7C1021CV26  
Switching Waveforms (continued)  
Write Cycle No. 1 (CE Controlled)[16, 17]  
t
WC  
ADDRESS  
t
SA  
t
SCE  
CE  
t
AW  
t
HA  
t
PWE  
WE  
t
BW  
BHE, BLE  
t
t
SD  
HD  
DATA I/O  
Write Cycle No. 2 (BLE or BHE Controlled)  
t
WC  
ADDRESS  
t
SA  
t
BW  
BHE, BLE  
t
AW  
t
HA  
t
PWE  
WE  
CE  
t
SCE  
t
t
SD  
HD  
DATA I/O  
Notes  
16. Data I/O is high-impedance if OE or BHE and/or BLE= V  
.
IH  
17. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.  
Document Number: 38-05589 Rev. *E  
Page 8 of 15  
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CY7C1021CV26  
Switching Waveforms (continued)  
Write Cycle No. 3 (WE Controlled, LOW)  
OE  
t
WC  
ADDRESS  
t
SCE  
CE  
t
AW  
t
HA  
t
SA  
t
PWE  
WE  
t
BW  
BHE, BLE  
t
HZWE  
t
t
SD  
HD  
DATA I/O  
t
LZWE  
Truth Table  
CE OE WE BLE BHE  
I/O1–I/O8  
High Z  
I/O9–I/O16  
Mode  
Power  
H
L
X
L
X
H
X
L
X
L
High Z  
Power-down  
Read – All bits  
Standby (ISB  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
)
Data Out  
Data Out  
High Z  
Data Out  
High Z  
Data Out  
Data In  
High Z  
Data In  
High Z  
High Z  
)
L
H
L
Read – Lower bits only  
Read – Upper bits only  
Write – All bits  
)
H
L
)
L
X
L
L
Data In  
Data In  
High Z  
)
L
H
L
Write – Lower bits only  
Write – Upper bits only  
)
H
X
H
)
L
L
H
X
H
X
X
H
High Z  
Selected, Outputs Disabled  
Selected, Outputs Disabled  
)
High Z  
)
Document Number: 38-05589 Rev. *E  
Page 9 of 15  
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CY7C1021CV26  
Ordering Information  
Cypress offers other versions of this type of product in many different configurations and features. The following table contains only  
the list of parts that are currently available. For a complete listing of all options, visit the Cypress website at http://www.cypress.com  
and refer to the product summary page at http://www.cypress.com/products or contact your local sales representative.  
Cypress maintains a worldwide network of offices, solution centers, manufacturer's representatives and distributors. To find the office  
closest to you, visit us at http://www.cypress.com/go/datasheet/offices.  
Speed  
(ns)  
Package  
Name  
Operating  
Range  
Package Type  
Ordering Code  
15  
CY7C1021CV26-15ZSXE  
CY7C1021CV26-15VXE  
CY7C1021CV26-15BAE  
CY7C1021CV26-15BAET  
CY7C1021CV26-15VXET  
51-85087 44-pin TSOP Type II (Pb-free)  
Automotive  
51-85082 44-pin (400-Mil) Molded SOJ (Pb-free)  
51-85150 48-ball FPBGA (6 × 8 × 1 mm) (Pb-free)  
51-85150 48-ball FPBGA (6 × 8 × 1 mm) (Pb-free)  
51-85082 44-pin (400-Mil) Molded SOJ (Pb-free)  
CY7C1021CV26-15ZSXET 51-85087 44-pin TSOP Type II (Pb-free)  
Ordering Code Definitions  
CY7C 1021 C V26 - 15 XXX E  
X
X = T or Blank  
T = Tape and Reel; Blank = Tube  
Temperature Range: E = Automotive  
Package Type: XXX = ZSX or VX or BA  
ZSX = 44-pin TSOP Type II (Pb-free)  
VX = 44-pin (400-Mil) Molded SOJ (Pb-free)  
BA = 48-ball FPBGA (Pb-free)  
Speed Grade (15 ns)  
V26 = 2.6 V  
Process Technology 0.16 µm  
1021 = Part Identifier  
CY7C = Cypress SRAMs  
Document Number: 38-05589 Rev. *E  
Page 10 of 15  
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CY7C1021CV26  
Package Diagrams  
Figure 1. 44-pin TSOP II, 51-85087  
51-85087 *C  
Figure 2. 44-pin (400-Mil) Molded SOJ, 51-85082  
51-85082 *C  
Document Number: 38-05589 Rev. *E  
Page 11 of 15  
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CY7C1021CV26  
Package Diagrams (continued)  
Figure 3. 48-ball FBGA (6 × 8 × 1 mm), 51-85150  
51-85150 *F  
Document Number: 38-05589 Rev. *E  
Page 12 of 15  
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CY7C1021CV26  
Acronyms  
Document Conventions  
Units of Measure  
Acronym  
CMOS  
CE  
Description  
complementary metal oxide semiconductor  
chip enable  
Symbol  
ns  
Unit of Measure  
nano seconds  
Volts  
I/O  
input/output  
V
OE  
output enable  
µA  
mA  
mW  
MHz  
pF  
°C  
micro Amperes  
milli Amperes  
milli Watts  
Mega Hertz  
pico Farad  
degree Celcius  
Watts  
SOJ  
small outline J-lead  
SRAM  
TSOP  
TTL  
static random access memory  
thin small-outline package  
transistor-transistor logic  
fine-pitch ball grid array  
write enable  
FPBGA  
WE  
W
%
percent  
Document Number: 38-05589 Rev. *E  
Page 13 of 15  
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CY7C1021CV26  
Document History Page  
Document Title: CY7C1021CV26 1-Mbit (64 K × 16) Static RAM  
Document Number: 38-05589  
Orig. of  
Change  
REV.  
ECN NO. Issue Date  
Description of Change  
**  
238454  
335861  
See ECN  
See ECN  
RKF  
New data sheet for Automotive  
Added Lead-Free Product Information  
*A  
SYT  
Included the 44-Lead (400-Mil) Molded SOJ V34 Package  
*B  
493543  
See ECN  
NXR  
Changed the description of IIX from Input Load Current to  
Input Leakage Current in DC Electrical Characteristics table  
Removed IOS parameter from DC Electrical Characteristics table  
Updated Ordering Information Table  
*C  
*D  
*E  
2897087  
03/22/10  
AJU  
Removed obsolete parts from ordering information table  
Updated package diagrams  
3057593 10/13/2010  
3098812 12/01/2010  
PRAS  
PRAS  
Updated Ordering Information and added Ordering Code Definitions.  
Updated Package Diagrams.  
Added Acronyms and Units of Measure.  
Minor edits and updated in new template.  
Document Number: 38-05589 Rev. *E  
Page 14 of 15  
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Sales, Solutions, and Legal Information  
Worldwide Sales and Design Support  
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office  
closest to you, visit us at Cypress Locations.  
Products  
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© Cypress Semiconductor Corporation, 2004-2010. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of  
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for  
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integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without  
the express written permission of Cypress.  
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES  
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not  
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where  
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer  
assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Use may be limited by and subject to the applicable Cypress software license agreement.  
Document Number: 38-05589 Rev. *E  
Revised December 1, 2010  
Page 15 of 15  
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