CY7C1041 [CYPRESS]

256K x 16 Static RAM; 256K ×16静态RAM
CY7C1041
型号: CY7C1041
厂家: CYPRESS    CYPRESS
描述:

256K x 16 Static RAM
256K ×16静态RAM

文件: 总10页 (文件大小:185K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CY7C1041  
256K x 16 Static RAM  
written into the location specified on the address pins (A  
Features  
0
through A ). If Byte High Enable (BHE) is LOW, then data  
17  
• High speed  
from I/O pins (I/O through I/O ) is written into the location  
8
15  
specified on the address pins (A through A ).  
0
17  
— t = 15 ns  
AA  
Reading from the device is accomplished by taking Chip En-  
able (CE) and Output Enable (OE) LOW while forcing the Write  
Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW, then  
data from the memory location specified by the address pins  
will appear on I/O to I/O . If Byte High Enable (BHE) is LOW,  
• Low active power  
— 1430 mW (max.)  
• Low CMOS standby power (L version)  
— 2.75 mW (max.)  
0
7
then data from memory will appear on I/O to I/O . See the  
8
15  
2.0V Data Retention (400 W at 2.0V retention)  
µ
truth table at the back of this data sheet for a complete descrip-  
tion of read and write modes.  
• Automatic power-down when deselected  
• TTL-compatible inputs and outputs  
• Easy memory expansion with CE and OE features  
The input/output pins (I/O through I/O ) are placed in a  
0
15  
high-impedance state when the device is deselected (CE  
HIGH), the outputs are disabled (OE HIGH), the BHE and BLE  
are disabled (BHE, BLE HIGH), or during a write operation (CE  
LOW, and WE LOW).  
Functional Description  
The CY7C1041 is a high-performance CMOS static RAM or-  
ganized as 262,144 words by 16 bits.  
The CY7C1041 is available in a standard 44-pin 400-mil-wide  
body width SOJ and 44-pin TSOP II package with center pow-  
er and ground (revolutionary) pinout.  
Writing to the device is accomplished by taking Chip Enable  
(CE) and Write Enable (WE) inputs LOW. If Byte Low Enable  
(BLE) is LOW, then data from I/O pins (I/O through I/O ), is  
0
7
Logic Block Diagram  
Pin Configuration  
SOJ  
TSOP II  
Top View  
INPUT BUFFER  
A
44  
1
0
A
A
A
A
OE  
BHE  
BLE  
I/O  
I/O  
14  
I/O  
0
17  
16  
15  
A
43  
42  
41  
40  
39  
38  
1
A
2
3
4
5
6
1
A
2
A
2
I/O0 – I/O7  
I/O8 – I/O15  
256K x 16  
ARRAY  
A
3
4
A
3
A
A
4
1024 x 4096  
A
5
6
CE  
I/O  
A
7
0
15  
A
7
8
37  
36  
35  
34  
33  
I/O  
8
1
2
A
I/O  
9
13  
10  
11  
12  
13  
I/O  
I/O  
3
CC  
SS  
12  
V
V
SS  
COLUMN  
DECODER  
V
V
CC  
I/O  
32  
I/O  
4
11  
I/O  
31  
30  
29  
28  
I/O  
10  
14  
15  
16  
5
I/O  
I/O  
6
9
8
I/O  
I/O  
7
WE 17  
NC  
BHE  
18  
27  
26  
25  
A
14  
A
5
WE  
CE  
OE  
19  
A
6
A
13  
A
20  
21  
22  
A
7
12  
A
BLE  
A
24  
23  
11  
8
9
A
A
10  
1041–1  
1041–2  
Selection Guide  
7C1041-12  
7C1041-15  
7C1041-17  
7C1041-20  
7C1041-25  
Maximum Access Time (ns)  
12  
280  
3
15  
260  
3
17  
250  
3
20  
230  
3
25  
220  
3
Maximum Operating Current (mA)  
Maximum CMOS Standby Current Com’l  
(mA)  
Com’l  
L
0.5  
6
0.5  
6
0.5  
6
0.5  
6
0.5  
6
Ind’l  
Shaded areas contain preliminary information.  
Cypress Semiconductor Corporation  
3901 North First Street  
San Jose  
CA 95134  
408-943-2600  
October 4, 1999  
CY7C1041  
[1]  
DC Input Voltage ................................ 0.5V to V + 0.5V  
Maximum Ratings  
CC  
Current into Outputs (LOW)......................................... 20 mA  
(Above which the useful life may be impaired. For user guide-  
lines, not tested.)  
Operating Range  
Storage Temperature .................................65°C to +150°C  
Ambient  
Ambient Temperature with  
Power Applied............................................. 55°C to +125°C  
[2]  
Range  
Commercial  
Industrial  
Temperature  
0°C to +70°C  
40°C to +85°C  
V
CC  
5V ± 0.5  
[1]  
Supply Voltage on V to Relative GND .... 0.5V to +7.0V  
CC  
DC Voltage Applied to Outputs  
[1]  
in High Z State ....................................0.5V to V + 0.5V  
CC  
Electrical Characteristics Over the Operating Range  
7C1041-12  
7C1041-15  
7C1041-17  
Parameter  
Description  
Test Conditions  
= Min., I = 4.0 mA  
Min.  
Max.  
Min.  
Max.  
Min.  
Max. Unit  
V
Output HIGH Voltage  
Output LOW Voltage  
Input HIGH Voltage  
V
V
2.4  
2.4  
2.4  
V
OH  
OL  
IH  
CC  
CC  
OH  
V
V
= Min., I = 8.0 mA  
0.4  
0.4  
0.4  
V
V
OL  
2.2  
V
2.2  
V
2.2  
V
CC  
CC  
CC  
+ 0.5  
0.8  
+1  
+ 0.5  
0.8  
+1  
+ 0.5  
[1]  
V
Input LOW Voltage  
0.5  
1  
0.5  
1  
0.5  
1  
0.8  
+1  
+1  
V
IL  
I
I
Input Load Current  
GND < V < V  
CC  
µA  
µA  
IX  
I
Output Leakage  
Current  
GND < V  
< V ,  
CC  
1  
+1  
1  
+1  
1  
OZ  
OUT  
Output Disabled  
I
I
V
Operating  
V
CC  
= Max.,  
280  
40  
260  
40  
250  
40  
mA  
mA  
CC  
SB1  
CC  
Supply Current  
f = f  
= 1/t  
MAX RC  
Automatic CE  
Max. V , CE > V  
CC IH  
Power-Down Current  
TTL Inputs  
V
V
> V or  
IN  
IN  
IH  
< V , f = f  
IL  
MAX  
I
Automatic CE  
Power-Down Current CE > V 0.3V,  
CMOS Inputs  
Max. V  
,
CC  
Coml  
Coml  
3
0.5  
6
3
0.5  
6
3
0.5  
6
mA  
mA  
mA  
SB2  
CC  
L
V
> V 0.3V,  
IN CC  
or V < 0.3V, f = 0 Indl  
IN  
Shaded areas contain preliminary information.  
Notes:  
1.  
VIL (min.) = 2.0V for pulse durations of less than 20 ns.  
2. TA is the case temperature.  
2
CY7C1041  
Electrical Characteristics Over the Operating Range (continued)  
Test Conditions  
7C1041-20  
7C1041-25  
Parameter  
Description  
Min.  
Max.  
Min.  
Max.  
Unit  
V
V
V
V
Output HIGH Voltage  
Output LOW Voltage  
Input HIGH Voltage  
V
V
= Min., I = 4.0 mA  
OH  
2.4  
2.4  
OH  
OL  
IH  
CC  
CC  
= Min., I = 8.0 mA  
0.4  
0.4  
V
OL  
2.2  
V
2.2  
V
+ 0.5  
CC  
V
CC  
+ 0.5  
0.8  
+1  
[1]  
V
Input LOW Voltage  
0.5  
1  
0.5  
1  
0.8  
+1  
+1  
V
IL  
I
I
Input Load Current  
GND < V < V  
CC  
µA  
µA  
IX  
I
Output Leakage  
Current  
GND < V  
< V  
,
1  
+1  
1  
OZ  
OUT  
CC  
Output Disabled  
I
I
V
Operating  
V
CC  
= Max.,  
230  
40  
220  
40  
mA  
mA  
CC  
SB1  
CC  
Supply Current  
f = f  
= 1/t  
MAX RC  
Automatic CE  
Max. V , CE > V  
CC  
IH  
Power-Down Current  
TTL Inputs  
V
V
> V or  
IN  
IN  
IH  
< V , f = f  
IL  
MAX  
I
Automatic CE  
Power-Down Current  
CMOS Inputs  
Max. V  
CE > V 0.3V,  
,
Coml  
Coml  
Indl  
3
0.5  
6
3
0.5  
6
mA  
mA  
mA  
SB2  
CC  
CC  
L
V
> V 0.3V,  
CC  
IN  
or V < 0.3V, f = 0  
IN  
Capacitance[3]  
Parameter  
Description  
Test Conditions  
T = 25°C, f = 1 MHz,  
Max.  
Unit  
pF  
C
C
Input Capacitance  
I/O Capacitance  
8
8
IN  
A
V
= 5.0V  
CC  
pF  
OUT  
Note:  
3. Tested initially and after any design or process changes that may affect these parameters.  
AC Test Loads and Waveforms  
ALL INPUT PULSES  
90%  
R1 481  
R1 481  
5V  
5V  
3.0V  
GND  
90%  
10%  
OUTPUT  
OUTPUT  
10%  
R2  
255  
R2  
255  
30 pF  
5 pF  
3 ns  
3 ns  
INCLUDING  
JIG AND  
SCOPE  
INCLUDING  
JIG AND  
SCOPE  
(b)  
10413  
(a)  
10414  
THÉ  
VENIN EQUIVALENT  
Equivalent to:  
167  
1.73V  
OUTPUT  
3
CY7C1041  
Switching Characteristics[4] Over the Operating Range  
7C1041-12  
Min. Max.  
7C1041-15  
Min. Max.  
7C1041-17  
Min. Max.  
Parameter  
Description  
Unit  
READ CYCLE  
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Read Cycle Time  
12  
3
15  
3
17  
3
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
RC  
Address to Data Valid  
Data Hold from Address Change  
CE LOW to Data Valid  
OE LOW to Data Valid  
OE LOW to Low Z  
12  
15  
17  
AA  
OHA  
ACE  
DOE  
LZOE  
HZOE  
LZCE  
HZCE  
PU  
12  
6
15  
7
17  
7
0
3
0
0
3
0
0
3
0
[5, 6]  
OE HIGH to High Z  
6
6
7
7
7
7
[6]  
CE LOW to Low Z  
[5, 6]  
CE HIGH to High Z  
CE LOW to Power-Up  
CE HIGH to Power-Down  
Byte Enable to Data Valid  
Byte Enable to Low Z  
12  
6
15  
7
17  
7
PD  
DBE  
LZBE  
HZBE  
0
0
0
Byte Disable to High Z  
6
7
7
[7, 8]  
WRITE CYCLE  
t
t
t
t
t
t
t
t
t
t
t
Write Cycle Time  
12  
10  
10  
0
15  
12  
12  
0
17  
14  
14  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
WC  
CE LOW to Write End  
SCE  
AW  
Address Set-Up to Write End  
Address Hold from Write End  
Address Set-Up to Write Start  
WE Pulse Width  
HA  
0
0
0
SA  
10  
7
12  
8
14  
8
PWE  
SD  
Data Set-Up to Write End  
Data Hold from Write End  
0
0
0
HD  
[6]  
WE HIGH to Low Z  
3
3
3
LZWE  
HZWE  
BW  
[5, 6]  
WE LOW to High Z  
6
7
7
Byte Enable to End of Write  
10  
12  
12  
Shaded areas contain preliminary information.  
Notes:  
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified  
IOL/IOH and 30-pF load capacitance.  
5.  
tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.  
6. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.  
7. The internal write time of the memory is defined by the overlap of CELOW, and WE LOW. CE and WE must be LOW to initiate a write, and the transition of either of  
these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.  
8. The minimum write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of tHZWE and tSD  
.
4
CY7C1041  
Switching Characteristics[4] Over the Operating Range (continued)  
7C1041-20  
7C1041-25  
Min. Max.  
Parameter  
Description  
Min.  
Max.  
Unit  
READ CYCLE  
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Read Cycle Time  
20  
3
25  
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
RC  
Address to Data Valid  
Data Hold from Address Change  
CE LOW to Data Valid  
OE LOW to Data Valid  
OE LOW to Low Z  
20  
25  
AA  
OHA  
ACE  
DOE  
LZOE  
HZOE  
LZCE  
HZCE  
PU  
20  
8
25  
10  
0
3
0
0
5
0
[5, 6]  
OE HIGH to High Z  
8
8
10  
10  
[6]  
CE LOW to Low Z  
[5, 6]  
CE HIGH to High Z  
CE LOW to Power-Up  
CE HIGH to Power-Down  
Byte Enable to Data Valid  
Byte Enable to Low Z  
20  
8
25  
10  
PD  
DBE  
LZBE  
HZBE  
0
0
Byte Disable to High Z  
8
10  
[7, 8]  
WRITE CYCLE  
t
t
t
t
t
t
t
t
t
t
t
Write Cycle Time  
20  
13  
13  
0
25  
15  
15  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
WC  
CE LOW to Write End  
SCE  
AW  
Address Set-Up to Write End  
Address Hold from Write End  
Address Set-Up to Write Start  
WE Pulse Width  
HA  
0
0
SA  
13  
9
15  
10  
0
PWE  
SD  
Data Set-Up to Write End  
Data Hold from Write End  
0
HD  
[6]  
WE HIGH to Low Z  
3
5
LZWE  
HZWE  
BW  
[5, 6]  
WE LOW to High Z  
8
10  
Byte Enable to End of Write  
13  
15  
Data Retention Characteristics Over the Operating Range  
[10]  
Parameter  
Description  
for Data Retention  
Conditions  
Min.  
2.0  
Max.  
200  
Unit  
V
V
V
CC  
DR  
I
Data Retention Current  
V
= V = 2.0V,  
µA  
µA  
µA  
ns  
CCDR  
CC  
DR  
CE > V 0.3V,  
CC  
Coml L  
V
> V 0.3V or V < 0.3V  
IN  
CC IN  
[3]  
t
t
Chip Deselect to Data Retention Time  
Operation Recovery Time  
0
CDR  
[9]  
R
See Note 9  
Notes:  
9. tr < 100 µs for all speeds.  
10. No input may exceed VCC + 0.5V.  
5
CY7C1041  
Data Retention Waveform  
DATA RETENTION MODE  
> 2V  
3.0V  
3.0V  
V
V
CC  
DR  
t
t
R
CDR  
CE  
10415  
Switching Waveforms  
[11, 12]  
Read Cycle No.1  
t
RC  
ADDRESS  
t
AA  
t
OHA  
DATA OUT  
PREVIOUS DATA VALID  
DATA VALID  
1041-6  
[12, 13]  
Read Cycle No.2 (OE Controlled)  
ADDRESS  
t
RC  
CE  
t
ACE  
OE  
t
HZOE  
t
DOE  
BHE, BLE  
t
LZOE  
t
HZCE  
t
DBE  
t
LZBE  
t
HZBE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
DATA OUT  
DATA VALID  
t
LZCE  
t
PD  
I
t
CC  
PU  
V
CC  
50%  
50%  
SUPPLY  
CURRENT  
I
SB  
1041-7  
Notes:  
11. Device is continuously selected. OE, CE, BHE, and/or BHE = VIL.  
12. WE is HIGH for read cycle.  
13. Address valid prior to or coincident with CE transition LOW.  
6
CY7C1041  
Switching Waveforms (continued)  
[14, 15]  
Write Cycle No. 1 (CE Controlled)  
t
WC  
ADDRESS  
t
SA  
t
SCE  
CE  
t
AW  
t
HA  
t
PWE  
WE  
t
BW  
BHE, BLE  
t
t
SD  
HD  
DATAI/O  
1041-8  
Write Cycle No. 2 (BLEor BHE Controlled)  
t
WC  
ADDRESS  
t
SA  
t
BW  
BHE, BLE  
t
AW  
t
HA  
t
PWE  
WE  
CE  
t
SCE  
t
t
HD  
SD  
DATAI/O  
1041-9  
Notes:  
14. Data I/O is high impedance if OE or BHE and/or BLE= VIH  
.
15. If CEgoes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.  
7
CY7C1041  
Switching Waveforms (continued)  
Write Cycle No.3  
Controlled, LOW)  
(WE  
t
WC  
ADDRESS  
t
SCE  
CE  
t
AW  
t
HA  
t
SA  
t
PWE  
WE  
t
BW  
BHE, BLE  
t
HZWE  
t
SD  
t
HD  
DATA I/O  
t
LZWE  
1041-10  
Truth Table  
CE  
H
L
OE WE BLE  
BHE  
X
I/O I/O  
I/O I/O  
15  
Mode  
Power  
0
7
8
X
L
X
H
H
H
L
X
L
High Z  
High Z  
Power Down  
Read All Bits  
Standby (I  
)
SB  
L
Data Out  
Data Out  
High Z  
Data Out  
High Z  
Active (I  
Active (I  
Active (I  
Active (I  
Active (I  
Active (I  
Active (I  
)
)
)
)
)
)
)
CC  
CC  
CC  
CC  
CC  
CC  
CC  
L
L
L
H
L
Read Lower Bits Only  
Read Upper Bits Only  
Write All Bits  
L
L
H
L
Data Out  
Data In  
High Z  
L
X
X
X
H
L
Data In  
Data In  
High Z  
L
L
L
H
L
Write Lower Bits Only  
Write Upper Bits Only  
Selected, Outputs Disabled  
L
L
H
X
Data In  
High Z  
L
H
X
High Z  
8
CY7C1041  
Ordering Information  
Speed  
Package  
Name  
Operating  
Range  
(ns)  
Ordering Code  
Package Type  
44-Lead (400-Mil) Molded SOJ  
44-Lead (400-Mil) Molded SOJ  
44-Lead TSOP Type II  
15  
CY7C1041-15VC  
CY7C1041L-15VC  
CY7C1041-15ZC  
CY7C1041L-15ZC  
CY7C1041-17VC  
CY7C1041L-17VC  
CY7C1041-17ZC  
CY7C1041L-17ZC  
CY7C1041-20VC  
CY7C1041L-20VC  
CY7C1041-20ZC  
CY7C1041L-20ZC  
CY7C1041-25VC  
CY7C1041L-25VC  
CY7C1041-25ZC  
CY7C1041L-25ZC  
CY7C1041-15ZI  
CY7C1041-15VI  
CY7C1041-17ZI  
CY7C1041-17VI  
CY7C1041-20ZI  
CY7C1041-20VI  
CY7C1041-25ZI  
CY7C1041-25VI  
V34  
V34  
Z44  
Z44  
V34  
V34  
Z44  
Z44  
V34  
V34  
Z44  
Z44  
V34  
V34  
Z44  
Z44  
Z44  
V34  
V34  
Z44  
Z44  
Z44  
Z44  
Z44  
Commercial  
44-Lead TSOP Type II  
17  
20  
25  
44-Lead (400-Mil) Molded SOJ  
44-Lead (400-Mil) Molded SOJ  
44-Lead TSOP Type II  
44-Lead TSOP Type II  
44-Lead (400-Mil) Molded SOJ  
44-Lead (400-Mil) Molded SOJ  
44-Lead TSOP Type II  
44-Lead TSOP Type II  
44-Lead (400-Mil) Molded SOJ  
44-Lead (400-Mil) Molded SOJ  
44-Lead TSOP Type II  
44-Lead TSOP Type II  
15  
17  
20  
25  
44-Lead TSOP Type II  
Industrial  
44-Lead (400-Mil) Molded SOJ  
44-Lead TSOP Type II  
44-Lead (400-Mil) Molded SOJ  
44-Lead TSOP Type II  
44-Lead (400-Mil) Molded SOJ  
44-Lead TSOP Type II  
44-Lead (400-Mil) Molded SOJ  
Document #: 38-00644-B  
9
CY7C1041  
Package Diagrams  
44-Lead (400-Mil) Molded SOJ V34  
51-85082-B  
44-Pin TSOP II Z44  
51-85087-A  
© Cypress Semiconductor Corporation, 1999. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use  
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize  
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress  
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.  

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