CY7C1354C, CY7C1356C
9-Mbit (256 K × 36/512 K × 18)
Pipelined SRAM with NoBL™ Architecture
9-Mbit (256 K × 36/512 K × 18) Pipelined SRAM with NoBL™ Architecture
Features
■
■
Functional Description
The CY7C1354C and CY7C1356C
[1]
are 3.3 V, 256 K x 36 and
512K x 18 synchronous pipelined burst SRAMs with No Bus
Latency™ (NoBL logic, respectively. They are designed to
support unlimited true back-to-back read/write operations with
no wait states. The CY7C1354C and CY7C1356C are
equipped with the advanced (NoBL) logic required to enable
consecutive read/write operations with data being transferred
on every clock cycle. This feature greatly improves the
throughput of data in systems that require frequent write/read
transitions. The CY7C1354C and CY7C1356C are pin
compatible and functionally equivalent to ZBT devices.
All synchronous inputs pass through input registers controlled
by the rising edge of the clock. All data outputs pass through
output registers controlled by the rising edge of the clock. The
clock input is qualified by the clock enable (CEN) signal, which
when deasserted suspends operation and extends the
previous clock cycle.
Write operations are controlled by the byte write selects
(BW
a
–BW
d
for CY7C1354C and BW
a
–BW
b
for CY7C1356C)
and a write enable (WE) input. All writes are conducted with
on-chip synchronous self-timed write circuitry.
Three synchronous chip enables (CE
1
, CE
2
, CE
3
) and an
asynchronous output enable (OE) provide for easy bank
selection and output tristate control. To avoid bus contention,
the output drivers are synchronously tristated during the data
portion of a write sequence.
Pin-compatible and functionally equivalent to ZBT
Supports 250 MHz bus operations with zero wait states
❐
Available speed grades are 250, 200, and 166 MHz
Internally self-timed output buffer control to eliminate the
need to use asynchronous OE
Fully registered (inputs and outputs) for pipelined
operation
Byte write capability
Single 3.3 V power supply (V
DD
)
3.3 V or 2.5 V I/O power supply (V
DDQ
)
Fast clock-to-output times
❐
2.8 ns (for 250 MHz device)
Clock enable (CEN) pin to suspend operation
Synchronous self-timed writes
Available in Pb-free 100-pin TQFP package, Pb-free, and
non Pb-free 119-ball BGA package and 165-ball FBGA
package
IEEE 1149.1 JTAG-compatible boundary scan
Burst capability – linear or interleaved burst order
“ZZ” sleep mode option and stop clock option
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Logic Block Diagram – CY7C1354C (256 K × 36)
A0, A1, A
MODE
CLK
CEN
ADDRESS
REGISTER 0
A1
A1'
D1
Q1
A0
A0'
BURST
D0
Q0
LOGIC
ADV/LD
C
WRITE ADDRESS
REGISTER 1
WRITE ADDRESS
REGISTER 2
C
ADV/LD
BW
a
BW
b
BW
c
BW
d
WE
WRITE REGISTRY
AND DATA COHERENCY
CONTROL LOGIC
WRITE
DRIVERS
MEMORY
ARRAY
S
E
N
S
E
A
M
P
S
O
U
T
P
U
T
R
E
G
I
S
T
E
R
S
D
A
T
A
S
T
E
E
R
I
N
G
O
U
T
P
U
T
B
U
F
F
E
R
S
E
DQ s
DQ P
a
DQ P
b
DQ P
c
DQ P
d
E
INPUT
REGISTER 1
E
INPUT
REGISTER 0
E
OE
CE1
CE2
CE3
ZZ
READ LOGIC
SLEEP
CONTROL
Note
1. For best-practices recommendations, refer to the Cypress application note
System Design Guidelines
on
www.cypress.com.
Cypress Semiconductor Corporation
Document Number: 38-05538 Rev. *K
•
198 Champion Court
•
San Jose
,
CA 95134-1709
•
408-943-2600
Revised March 2, 2011
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CY7C1354C, CY7C1356C
Contents
Selection Guide ................................................................ 4
Pin Configurations ........................................................... 4
Pin Definitions .................................................................. 7
Functional Overview ........................................................ 8
Single Read Accesses ................................................ 8
Burst Read Accesses .................................................. 8
Single Write Accesses ................................................. 8
Burst Write Accesses .................................................. 9
Sleep Mode ................................................................. 9
Partial Write Cycle Description ..................................... 10
Truth Table ...................................................................... 10
Partial Write Cycle Description ..................................... 11
IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 12
Disabling the JTAG Feature ...................................... 12
TAP Controller State Diagram ....................................... 12
Test Access Port (TAP) ............................................. 12
TAP Controller Block Diagram ...................................... 12
PERFORMING A TAP RESET .................................. 12
TAP REGISTERS ...................................................... 13
TAP Instruction Set ................................................... 13
TAP Timing ...................................................................... 14
TAP AC Switching Characteristics ............................... 14
3.3 V TAP AC Test Conditions ....................................... 15
3.3 V TAP AC Output Load Equivalent ......................... 15
2.5 V TAP AC Test Conditions ....................................... 15
2.5 V TAP AC Output Load Equivalent ......................... 15
TAP DC Electrical Characteristics
and Operating Conditions ............................................. 15
Identification Register Definitions ................................ 15
Scan Register Sizes ....................................................... 16
Identification Codes ....................................................... 16
Boundary Scan Exit Order (256 K × 36) ........................ 17
Boundary Scan Exit Order (512 K × 18) ........................ 18
Maximum Ratings ........................................................... 19
Operating Range ............................................................. 19
Neutron Soft Error Immunity ......................................... 19
Electrical Characteristics ............................................... 19
Capacitance .................................................................... 20
Thermal Resistance ........................................................ 20
Switching Characteristics .............................................. 22
Switching Waveforms .................................................... 23
Ordering Information ...................................................... 26
Ordering Code Definitions ......................................... 26
Package Diagrams .......................................................... 27
Acronyms ........................................................................ 30
Document Conventions ................................................. 30
Units of Measure ....................................................... 30
Document History Page ................................................. 31
Sales, Solutions, and Legal Information ...................... 32
Worldwide Sales and Design Support ....................... 32
Products .................................................................... 32
PSoC Solutions ......................................................... 32
Document Number: 38-05538 Rev. *K
Page 3 of 32
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