CY7C1470V33-300BZC [CYPRESS]
ZBT SRAM, 2MX36, 2.2ns, CMOS, PBGA165;型号: | CY7C1470V33-300BZC |
厂家: | CYPRESS |
描述: | ZBT SRAM, 2MX36, 2.2ns, CMOS, PBGA165 静态存储器 |
文件: | 总26页 (文件大小:831K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
2M x 36/4M x 18/1M x 72 Pipelined SRAM
with NoBL™ Architecture
Clock Enable (CEN), Byte Write Selects (BWSa, BWSb,
BWSc, BWSd, BWSe, BWSf, BWSg, BWSh), and Read/Write
Features
• Zero Bus Latency™, no dead cycles between Write and
Read cycles
• Fast clock speed: 300, 250, 200, and 167 MHz
• Fast access time: 2.2, 2.4, 3.0 and 3.4 ns
• Internally synchronized registered outputs eliminate
the need to control OE
control (WE). BWSc and BWSd apply to CY7C1470V33 and
CY7C1472V33 only. BWSe, BWSf, BWSg, and BWSh apply to
CY7C1474V33 only.
Address and control signals are applied to the SRAM during
one clock cycle, and two cycles later its associated data
occurs, either Read or Write.
• Single 3.3V –5% and +5% power supply VDD
• Separate VDDQ for 3.3V or 2.5V
• Single WE (Read/Write) control pin
• Positive clock-edge triggered, address, data, and
control signal registers for fully pipelined applications
A Clock Enable (CEN) pin allows operation of the
CY7C1470V33, CY7C1472V33, and CY7C1474V33 to be
suspended as long as necessary. All synchronous inputs are
ignored when (CEN) is HIGH; the internal device registers will
hold their previous values.
There are three Chip Enable (CE1, CE2, CE3) pins that allow
the user to deselect the device when desired. If any one of
these three is not active when ADV/LD is LOW, no new
memory operation can be initiated and any burst cycle in
progress is stopped. However, any pending data transfers
(read or write) will be completed. The data bus will be in a
high-impedance state two cycles after chip is deselected or a
Write cycle is initiated.
• Interleaved or linear four-word burst capability
• Individualbytewrite(BWSa–BWSh)control(maybetied
LOW)
• CEN pin to enable clock and suspend operations
• Three chip enables for simple depth expansion
• JTAG boundary scan for BGA packaging version
• Available in 119-ball bump BGA and 100-pin TQFP
packages (CY7C1470V33 and CY7C1472V33). 209-ball
FBGA package for CY7C1474V33.
The CY7C1470V33, CY7C1472V33, and CY7C1474V33
have an on-chip two-bit burst counter. In burst mode,
CY7C1470V33, CY7C1472V33, and CY7C1474V33 provide
four cycles of data for a single address presented to the
SRAM. The order of the burst sequence is defined by the
MODE input pin. The MODE pin selects between linear and
interleaved burst sequence. The ADV/LD signal is used to load
a new external address (ADV/LD = LOW) or increment the
internal burst counter (ADV/LD = HIGH)
Functional Description
The CY7C1470V33, CY7C1472V33, and CY7C1474V33
SRAMs are designed to eliminate dead cycles when making
transitions from Read to Write or vice versa. These SRAMs are
optimized for 100% bus utilization and achieve Zero Bus
Latency. They integrate 2,097,152 × 36/4,194,304 × 18/
1,048,576 × 72 SRAM cells, respectively, with advanced
synchronous peripheral circuitry and a two-bit counter for
internal burst operation. The Cypress Synchronous Burst
SRAM family employs high-speed, low-power CMOS designs
using advanced single-layer polysilicon, three-layer metal
technology. Each memory cell consists of six transistors.
Output Enable (OE) and burst sequence select (MODE) are
the asynchronous signals. OE can be used to disable the
outputs at any given time. ZZ may be tied to LOW if it is not
used.
Four pins are used to implement JTAG test capabilities. The
JTAG circuitry is used to serially shift data to and from the
device. JTAG inputs use LVTTL/LVCMOS levels to shift data
during this testing mode of operation.
All synchronous inputs are gated by registers controlled by a
positive-edge-triggered Clock Input (CLK). The synchronous
inputs include all addresses, all data inputs, depth-expansion
Chip Enables (CE1, CE2, and CE3), cycle start input (ADV/LD),
Logic Block Diagram
D
CLK
Data-In REG.
CE
Q
ADV/LD
A
x
CEN
CE
CONTROL
and Write
LOGIC
2M × 36/
4M × 18/
1M × 72
1
CE
CE
2
DQ
DP
x
3
DQ
A
BWS
X
DP
X
X
X
MEMORY
ARRAY
WE
BWS
x
X = 20:0 X=a,b,c,d X=a,b,c,d X=a,b,c,d
x
2M × 36
Mode
X = 21:0
X = 19:0
X = a, b
X = a, b X = a, b
4M × 18
1M × 72
X = a, b
OE
X = a, b,
X = a, b,
c,d,e,f,g,h
c,d,e,f,g,h
c,d,e,f,g,h
Cypress Semiconductor Corporation
•
3901 North First Street
•
San Jose
•
CA 95134
•
408-943-2600
Document #: 38-05289 Rev. **
Revised August 2, 2002
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Selection Guide
CY7C1470V33-300 CY7C1470V33-250 CY7C1470V33-200 CY7C1470V33-167
CY7C1472V33-300 CY7C1472V33-250 CY7C1472V33-200 CY7C1472V33-167
CY7C1474V33-300 CY7C1474V33-250 CY7C1474V33-200 CY7C1474V33-167 Unit
Maximum Access Time
2.2
2.4
3.0
3.4
ns
Maximum Operating
Current
Com’l
TBD
TBD
TBD
TBD
mA
Maximum CMOS
Standby Current
TBD
TBD
TBD
TBD
mA
Pin Configurations
100-pin TQFP Packages
DPc
DQc
DQc
1
2
3
4
5
6
7
8
DPb
NC
NC
NC
1
2
3
4
5
6
7
8
A
NC
NC
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
DQb
DQb
VDDQ
VDDQ
VDDQ
VSS
VDDQ
VSS
NC
VSS
DQc
DQc
VSS
NC
NC
DQb
DQb
VSS
DQb
DQb
DQb
DQb
VSS
VDDQ
DQb
DQb
VSS
NC
DPa
DQa
DQa
VSS
VDDQ
DQa
DQa
VSS
DQc
DQc
VSS
9
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
VDDQ
VDDQ
DQc
DQc
NC
VDD
NC
VSS
DQd
DQb
DQb
NC
VDD
NC
NC
VDD
ZZ
CY7C1470V33
VDD
ZZ
DQa
DQa
(2M × 36)
CY7C1472V33
VSS
DQb
(4M × 18)
DQa
DQa
VDDQ
VSS
DQa
DQa
NC
DQd
VDDQ
VSS
DQd
DQd
DQd
DQd
VSS
DQb
VDDQ
VSS
VDDQ
VSS
DQa
DQa
DQa
DQa
VSS
DQb
DQb
DPb
NC
VSS
VDDQ
NC
VSS
VDDQ
NC
NC
NC
VDDQ
VDDQ
DQd
DQd
DPd
DQa
DQa
DPa
NC
NC
NC
Document #: 38-05289 Rev. **
Page 2 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Pin Configurations (continued)
119-ball Bump BGA
CY7C1470V33 (2M × 36)–7 × 17 BGA
1
2
3
4
5
6
7
V
A
A
A
A
A
V
DDQ
A
DDQ
NC
NC
DQ
CE
A
A
A
ADV/LD
A
A
CE
A
NC
NC
DQ
B
C
D
E
F
2
c
3
b
V
DD
DP
V
NC
V
DP
c
SS
SS
SS
SS
SS
SS
b
DQ
DQ
DQ
DQ
DQ
V
V
V
CE
V
V
DQ
DQ
DQ
DQ
V
DQ
b
c
c
c
c
c
1
b
b
b
b
V
OE
A
V
DDQ
DDQ
DQ
BWS
BWS
DQ
G
H
J
c
c
c
b
a
b
DQ
V
WE
DQ
V
SS
b
SS
V
NC
V
NC
V
DDQ
DDQ
DD
DD
DD
DQ
DQd
V
CLK
NC
V
DQ
DQ
K
L
d
SS
SS
a
a
a
a
a
DQ
DQ
BWS
BWS
DQ
DQ
DQ
DP
DQ
d
d
d
V
DQ
V
CEN
A1
V
V
DDQ
M
N
P
DDQ
d
SS
SS
DQ
DQ
DP
V
V
DQ
d
d
SS
SS
a
a
a
DQ
V
A0
V
DQ
d
d
SS
SS
a
NC
NC
A
A
MODE
A
V
NC
A
A
A
NC
ZZ
R
T
DD
A
V
TMS
TDI
TCK
TDO
NC
V
DDQ
U
DDQ
CY7C1472V33 (4M × 18)–7 × 17 BGA
1
2
3
4
5
6
7
V
A
A
A
A
A
V
A
B
C
D
E
F
DDQ
DDQ
NC
CE
A
A
A
ADV/LD
A
A
CE
NC
NC
NC
DQ
2
3
NC
V
A
DD
DQ
NC
DQ
V
NC
V
DP
b
SS
SS
SS
SS
SS
SS
a
NC
V
V
CE
V
V
NC
b
1
a
V
NC
DQ
OE
DQ
V
DDQ
DDQ
a
NC
BWS
A
V
V
NC
DQ
a
G
H
J
b
b
SS
SS
DQ
NC
V
WE
DQ
NC
b
SS
a
V
V
NC
V
NC
V
V
DDQ
DDQ
DD
DD
DD
NC
DQ
V
CLK
NC
V
NC
DQ
K
L
b
SS
SS
a
DQ
NC
DQ
V
BWS
DQ
NC
b
SS
a
a
V
V
CEN
A1
V
NC
V
DDQ
M
N
P
R
T
DDQ
b
SS
SS
DQ
NC
DP
V
V
DQ
NC
DQ
b
SS
SS
a
NC
V
A0
V
NC
A
b
SS
SS
a
NC
A
A
A
MODE
A
V
NC
A
NC
ZZ
DD
A
A
V
TMS
TDI
TCK
TDO
NC
V
DDQ
U
DDQ
Document #: 38-05289 Rev. **
Page 3 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Pin Configurations (continued)
165-ball Bump FBGA
CY7C1470V33 (2M × 36)–11 × 15 FBGA
1
2
3
4
5
6
7
8
9
10
11
NC
A
CE
BWS
BWS
CE
3
CEN
A
ADV/LD
A
A
NC
1
2
c
b
a
NC
DPc
DQc
A
CE
BWS
BWS
CLK
WE
B
C
D
OE
A
A
128M
DPb
d
NC
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
NC
DDQ
DDQ
SS
SS
SS
SS
SS
DDQ
DDQ
DQc
V
V
V
V
V
DQb
DQb
DD
SS
SS
SS
DD
DQc
DQc
DQc
NC
DQc
DQc
DQc
V
V
V
V
E
F
V
DQb
DQb
DQb
NC
DQb
DQb
DQb
ZZ
DDQ
DDQ
DDQ
DD
SS
SS
SS
DD
DDQ
DDQ
DDQ
V
V
V
V
V
DD
SS
SS
SS
DD
V
V
V
V
G
H
J
V
DD
SS
SS
SS
DD
V
NC
V
V
V
V
V
NC
DD
DD
SS
SS
SS
DD
DQd
DQd
DQd
DQd
DPd
NC
DQd
DQd
DQd
DQd
NC
V
V
V
V
V
V
V
DQa
DQa
DQa
DQa
NC
DQa
DQa
DQa
DQa
DPa
NC
DDQ
DDQ
DDQ
DD
SS
SS
SS
DD
DDQ
DDQ
DDQ
DDQ
V
V
V
V
V
V
V
V
K
L
V
V
V
V
V
DD
SS
SS
SS
DD
V
V
V
V
V
DD
SS
SS
SS
DD
V
V
V
V
M
N
P
V
DDQ
DD
SS
SS
SS
DD
V
NC
NC
A1
A0
NC
V
DDQ
SS
SS
DDQ
A
A
A
A
TDI
TDO
TCK
A
A
A
A
MODE
A
A
TMS
R
A
A
A
CY7C1472V33 (4M × 18)–11 × 15 FBGA
1
2
3
4
5
6
7
8
9
10
11
NC
A
CE
BWS
NC
CE
3
CEN
A
ADV/LD
A
A
A
1
2
b
NC
NC
NC
A
CE
NC
BWS
CLK
WE
B
C
D
E
F
OE
A
A
128M
DPa
a
NC
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
NC
NC
DDQ
DDQ
SS
SS
SS
SS
SS
DDQ
DDQ
DQb
V
V
V
V
V
DQa
DD
SS
SS
SS
DD
NC
NC
DQb
DQb
DQb
V
V
V
V
V
NC
NC
DQa
DQa
DQa
ZZ
DDQ
DDQ
DDQ
DD
SS
SS
SS
DD
DDQ
DDQ
DDQ
V
V
V
V
V
DD
SS
SS
SS
DD
NC
V
V
V
V
G
H
J
V
NC
DD
SS
SS
SS
DD
NC
V
NC
V
V
V
V
V
NC
NC
DD
DD
SS
SS
SS
DD
DQb
DQb
DQb
DQb
DPb
NC
NC
NC
NC
NC
NC
A
V
V
V
V
V
V
V
DQa
DQa
DQa
DQa
NC
NC
DDQ
DDQ
DDQ
DDQ
DD
SS
SS
SS
DD
DDQ
DDQ
DDQ
V
V
V
V
V
V
V
V
K
L
V
V
V
V
V
NC
DD
SS
SS
SS
DD
V
V
V
V
V
NC
DD
SS
SS
SS
DD
V
V
V
V
M
N
P
V
NC
DD
SS
SS
SS
DD
DDQ
V
NC
NC
A1
A0
NC
V
NC
DDQ
SS
SS
DDQ
A
A
A
TDI
TDO
TCK
A
A
A
A
NC
MODE
A
A
TMS
R
A
A
A
Document #: 38-05289 Rev. **
Page 4 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Pin Configurations (continued)
CY7C1474V33 (1M × 72)
1
DQg
DQg
DQg
2
3
4
5
6
7
8
9
10
DQb
11
A
B
C
D
E
F
DQg
DQg
CE
CE
ADV/LD
WE
DQb
DQb
3
2
A
A
A
A
A
BWS
NC
NC
DQb
DQb
BWS
BWS
f
BWS
b
c
g
DQg
DQg
DPc
DQc
DQc
NC
NC
BWS
NC
BWS
CE
BWS
a
BWS
e
DQb
DQb
DPb
DQf
DQf
d
1
h
DQg
V
NC
OE
V
NC
V
SS
DQb
SS
DPg
DQc
V
V
V
V
V
V
DD
DDQ
DDQ
DDQ
SS
DPf
DQf
DDQ
DD
DD
V
V
V
V
V
NC
NC
NC
NC
CEN
NC
NC
V
V
SS
SS
DD
SS
SS
DD
SS
G
H
J
DQc
DQc
V
V
V
V
V
V
DDQ
DDQ
DQf
DQf
DDQ
DDQ
V
V
V
V
V
V
SS
V
DQc
DQc
NC
SS
SS
SS
SSQ
DDQ
SS
DQf
DQf
NC
DQc
NC
V
V
V
V
V
V
DDQ
DD
DD
DDQ
DDQ
DQf
NC
K
L
CLK
NC
V
SS
SS
NC
NC
DQh
DQh
DQh
V
V
V
V
V
DDQ
DD
SS
DD
SS
DDQ
DDQ
DQa
DQa
DQa
DDQ
M
N
P
R
T
V
V
V
V
DQh
DQh
DQh
V
V
SS
SS
SS
SS
DQa
DQa
DQa
V
V
V
V
V
DDQ
DQh
DQh
DPd
DQd
DQd
V
V
V
V
V
V
NC
ZZ
DD
DD
SS
DDQ
DDQ
SS
DDQ
DQa
DQa
DPa
DQe
DQe
V
V
V
V
V
V
SS
SS
SS
SS
V
DPh
DQd
DQd
DQd
DQd
V
V
DDQ
DD
DD
DDQ
DDQ
SS
DDQ
DD
DPe
DQe
DQe
DQe
DQe
NC
V
NC
NC
NC
A
MODE
A
SS
U
V
W
A
A
A
NC
NC
A
A
A1
A
DQd
DQd
A
A
A
DQe
DQe
TDI
TDO
TCK
A
A0
A
TMS
Pin Definitions
Pin Name I/O Type
Pin Description
A0
A1
A
Input-
Synchronous
Address Inputs used to select one of the 1048576/2097152/524,288 address locations.
Sampled at the rising edge of the CLK.
BWSa
BWSb
BWSc
BWSd
BWSe
BWSf
BWSg
BWSh
Input-
Synchronous
Byte Write Select Inputs, active LOW. Qualified with WE to conduct writes to the SRAM.
Sampled on the rising edge of CLK. BWSa controls DQa and DPa, BWSb controls DQb and DPb,
BWSc controls DQc and DPc, BWSd controls DQd and DPd. BWSe controls DQe and DPe, BWSf
controls DQf and DPf, BWSg controls DQg and DPg, and BWSh controls DQh and DPh.
WE
Input-
Synchronous
Write Enable Input, active LOW. Sampled on the rising edge of CLK if CEN is active LOW.
This signal must be asserted LOW to initiate a Write sequence.
ADV/LD
Input-
Synchronous
Advance/load input used to advance the on-chip address counter or load a new address.
When HIGH (and CEN is asserted LOW), the internal burst counter is advanced. When LOW,
a new address can be loaded into the device for an access. After being deselected, ADV/LD
should be driven LOW in order to load a new address.
Document #: 38-05289 Rev. **
Page 5 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Pin Definitions (continued)
Pin Name I/O Type
Pin Description
CLK
CE1
CE2
CE3
OE
Input-
Clock
Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN.
CLK is only recognized if CEN is active LOW.
Input-
Synchronous
Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction
with CE2 and CE3 to select/deselect the device.
Input-
Synchronous
Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction
with CE1 and CE3 to select/deselect the device.
Input-
Synchronous
Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction
with CE1 and CE2 to select/deselect the device.
Input-
Output Enable, active LOW. Combined with the synchronous logic block inside the device to
Asynchronous control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs.
When deasserted HIGH, I/O pins are three-stated, and act as input data pins. OE is masked
during the data portion of a write sequence, during the first clock when emerging from a
deselected state and when the device has been deselected.
CEN
Input-
Synchronous
Clock Enable Input, active LOW. When asserted LOW the clock signal is recognized by the
SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN does not
deselect the device, CEN can be used to extend the previous cycle when required.
DQa
DQb
DQc
DQd
DQe
DQf
I/O-
Synchronous
Bidirectional Data I/O Lines. As inputs, they feed into an on-chip data register that is triggered
by the rising edge of CLK. As outputs, they deliver the data contained in the memory location
specified by A[x:0] during the previous clock rise of the read cycle. The direction of the pins is
controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave
as outputs. When HIGH, DQa–DQd are placed in a three-state condition. The outputs are
automatically three-stated during the data portion of a write sequence, during the first clock
when emerging from a deselected state, and when the device is deselected, regardless of the
state of OE. DQ a, b, c, d, e, f, g, and h are eight bits wide
DQg
DQh
DPa
DPb
DPc
DPd
DPe
DPf
I/O-
Synchronous
Bidirectional Data Parity I/O Lines. Functionally, these signals are identical to DQ[x:0]. DP a,
b, c, d, e, f, g, and h are one bit wide.
DPg
DPh
ZZ
Input-
ZZ “sleep” Input. This active HIGH input places the device in a non-time critical “sleep”
Asynchronous condition with data integrity preserved.
MODE
Input
ModeInput. Selects theburst order of the device. Tied HIGH selects theinterleaved burst order.
Strap Pin
Pulled LOW selects the linear burst order. MODE should not change states during operation.
When left floating MODE will default HIGH, to an interleaved burst order.
VDD
Power Supply
Power supply inputs to the core of the device.
Power supply for the I/O circuitry.
VDDQ
I/O Power
Supply
VSS
Ground
Ground for the device. Should be connected to ground of the system.
TDO
JTAG serial output Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK (BGA only).
Synchronous
TDI
JTAG serial input Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK (BGA only).
Synchronous
TMS
Test Mode Select This pin controls the Test Access Port state machine. Sampled on the rising edge of TCK
Synchronous
JTAG serial clock Serial clock to the JTAG circuit (BGA only).
No connects.
(BGA only).
TCK
NC
–
Document #: 38-05289 Rev. **
Page 6 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
A1 in the burst sequence, and will wraparound when incre-
mented sufficiently. A HIGH input on ADV/LD will increment
the internal burst counter regardless of the state of chip enable
inputs or WE. WE is latched at the beginning of a burst cycle.
Therefore, the type of access (Read or Write) is maintained
throughout the burst sequence.
Introduction
Functional Overview
The
CY7C1470V33/CY7C1472V33/CY7C1474V33
are
synchronous-pipelined Burst NoBL SRAMs designed specifi-
cally to eliminate wait states during Write/Read transitions. All
synchronous inputs pass through input registers controlled by
the rising edge of the clock. The clock signal is qualified with
the Clock Enable input signal (CEN). If CEN is HIGH, the clock
signal is not recognized and all internal states are maintained.
All synchronous operations are qualified with CEN. All data
outputs pass through output registers controlled by the rising
edge of the clock. Maximum access delay from the clock rise
(tCO) is 2.2 ns (300-MHz device).
Single Write Accesses
Write access are initiated when the following conditions are
satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2,
and CE3 are ALL asserted active, and (3) the Write signal WE
is asserted LOW. The address presented to Ax is loaded into
the Address Register. The write signals are latched into the
Control Logic block.
On the subsequent clock rise the data lines are automatically
three-stated regardless of the state of the OE input signal. This
allows the external logic to present the data on DQ and DQP
Accesses can be initiated by asserting Chip Enable (CE1, CE2,
CE3 on the TQFP, CE1 on the BGA) active at the rising edge
of the clock. If Clock Enable (CEN) is active LOW and ADV/LD
is asserted LOW, the address presented to the device will be
latched. The access can either be a Read or Write operation,
depending on the status of the Write Enable (WE). BWS[h:a]
can be used to conduct byte write operations.
(DQa,b,c,d,e,f,g,h/DPa,b,c,d,e,f,g,h for CY7C1474V33, DQa,b,c,d
/
DPa,b,c,d for CY7C1470V33, and DQa,b/DPa,b for
CY7C1472V33). In addition, the address for the subsequent
access (Read/Write/Deselect) is latched into the Address
Register (provided the appropriate control signals are
asserted).
Write operations are qualified by the Write Enable (WE). All
writes are simplified with on-chip synchronous self-timed write
circuitry.
On the next clock rise the data presented to DQ and DP
(DQa,b,c,d,e,f,g,h/DPa,b,c,d,e,f,g,h for CY7C1474V33, DQa,b,c,d
/
Synchronous Chip Enable (CE1, CE2, CE3 on TQFP, CE1 on
BGA) and an asynchronous Output Enable (OE) simplify
depth expansion. All operations (Reads, Writes, and
Deselects) are pipelined. ADV/LD should be driven LOW once
the device has been deselected in order to load a new address
for the next operation.
DPa,b,c,d for CY7C1470V33, and DQa,b/DPa,b for
CY7C1472V33) (or a subset for byte write operations; see
Write Cycle Description table for details) inputs is latched into
the device and the write is complete.
The data written during the Write operation is controlled by
BWS (BWSa,b,c,d,e,f,g,h for CY7C1474V33, BWSa,b,c,d for
CY7C1470V33, and BWSa,b for CY7C1472V33) signals. The
CY7C1470V33/CY7C1472V33/CY7C1474V33 provides byte
write capability that is described in the Write Cycle Description
table. Asserting the Write Enable input (WE) with the selected
Byte Write Select (BWS) input will selectively write only to the
desired bytes. Bytes not selected during a byte write operation
will remain unaltered. A Synchronous self-timed write
mechanism has been provided to simplify the write operations.
Byte write capability has been included in order to greatly
simplify Read/Modify/Write sequences, which can be reduced
to simple byte write operations.
Single Read Accesses
A read access is initiated when the following conditions are
satisfied at clock rise: (1) CEN is asserted LOW, (2) chip
enable asserted active, (3) the Write Enable input signal WE
is deasserted HIGH, and (4) ADV/LD is asserted LOW. The
address presented to the address inputs is latched into the
Address Register and presented to the memory core and
control logic. The control logic determines that a read access
is in progress and allows the requested data to propagate to
the input of the output register. At the rising edge of the next
clock the requested data is allowed to propagate through the
output register and onto the data bus within 2.2 ns (300-MHz
device) provided OE is active LOW. After the first clock of the
read access the output buffers are controlled by OE and the
internal control logic. OE must be driven LOW in order for the
device to drive out the requested data. During the second
clock, a subsequent operation (Read/Write/Deselect) can be
initiated. Deselecting the device is also pipelined. Therefore,
when the SRAM is deselected at clock rise by one of the chip
enable signals, its output will three-state following the next
clock rise.
Because the CY7C1470V33/CY7C1472V33/CY7C1474V33
is a common I/O device, data should not be driven into the
device while the outputs are active. The Output Enable (OE)
can be deasserted HIGH before presenting data to the DQand
DP (DQa,b,c,d,e,f,g,h/DPa,b,c,d,e,f,g,h for CY7C1474V33,
DQa,b,c,d/DPa,b,c,d for CY7C1470V33, and DQa,b/DPa,b for
CY7C1472V33) inputs. Doing so will three-state the output
drivers. As a safety precaution, DQ and DP (DQa,b,c,d,e,f,g,h
/
DPa,b,c,d,e,f,g,h for CY7C1474V33, DQa,b,c,d/DPa,b,c,d for
CY7C1470V33, and DQa,b/DPa,b for CY7C1472V33) are
automatically three-stated during the data portion of a Write
cycle, regardless of the state of OE.
Burst Read Accesses
The CY7C1470V33/CY7C1472V33/CY7C1474V33 have an
on-chip burst counter that allows the user the ability to supply
a single address and conduct up to four Reads without
reasserting the address inputs. ADV/LD must be driven LOW
in order to load a new address into the SRAM, as described in
the Single Read Access section above. The sequence of the
burst counter is determined by the MODE input signal. A LOW
input on MODE selects a linear burst mode, a HIGH selects an
interleaved burst sequence. Both burst counters use A0 and
Burst Write Accesses
The CY7C1470V33/CY7C1472V33/CY7C1474V33 has an
on-chip burst counter that allows the user the ability to supply
a single address and conduct up to four Write operations
without reasserting the address inputs. ADV/LD must be
driven LOW in order to load the initial address, as described
in the Single Write Access section above. When ADV/LD is
driven HIGH on the subsequent clock rise, the chip enables
Document #: 38-05289 Rev. **
Page 7 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
(CE1, CE2, and CE3) and WE inputs are ignored and the burst
counter is incremented. The correct BWS (BWSa,b,c,d,e,f,g,h for
CY7C1474V33, BWSa,b,c,d for CY7C1470V33, and BWSa,b
for CY7C1472V33) inputs must be driven in each cycle of the
burst write in order to write the correct bytes of data.
Cycle Description Truth Table[1, 2, 3, 4, 5, 6]
Address
Operation
Used
CE
CEN ADV/LD/
WE
BWSx
CLK
L-H
Comments
Deselected
External
1
0
L
X
X
I/Os three-state following next
recognized clock.
Suspend
–
X
1
X
X
X
L-H
Clock ignored, all operations
suspended.
Begin Read
Begin Write
External
External
0
0
0
0
0
0
1
0
X
L-H
Address latched.
Valid L-H
L-H
Address latched, data presented two
valid clocks later.
Burst Read
Operation
Internal
X
0
1
X
X
Burst Read operation. Previous
access was a Read operation.
Addresses incremented internally in
conjunction with the state of Mode.
Burst Write
Operation
Internal
X
0
1
X
Valid L-H
Burst Write operation. Previous
access was a Write operation.
Addresses incremented internally in
conjunction with the state of MODE.
Bytes written are determined by
BWS[h:a]
.
Sleep Mode
Interleaved Burst Sequence
The ZZ input pin is an asynchronous input. Asserting ZZ
places the SRAM in a power conservation “sleep” mode. Two
clock cycles are required to enter into or exit from this “sleep”
mode. While in this mode, data integrity is guaranteed.
Accesses pending when entering the “sleep” mode are not
considered valid nor is the completion of the operation
guaranteed. The device must be deselected prior to entering
the “sleep” mode. CEs, ADSP, and ADSC must remain
inactive for the duration of tZZREC after the ZZ input returns
LOW.
First
Second
Third
Address
Fourth
Address
Address
Address
A[1:0]
A[1:0]
A[1:0]
A[1:0]
00
01
10
11
01
00
11
10
10
11
00
01
11
10
01
00
Linear Burst Sequence
First
Address
Second
Address
Third
Address
Fourth
Address
A[1:0]
A[1:0]
A[1:0]
A[1:0]
11
00
01
10
11
01
10
11
00
10
11
00
01
00
01
10
ZZ Mode Electrical Characteristics
Parameter
IDDZZ
Description
Test Conditions
ZZ > VDD – 0.2V
ZZ > VDD – 0.2V
ZZ < 0.2V
Min.
Max.
15
Unit
mA
ns
Snooze mode standby current
Device operation to ZZ
ZZ recovery time
tZZS
2tCYC
tZZREC
2tCYC
ns
Notes:
1. X = ”Don't Care,” 1 = Logic HIGH, 0 = Logic LOW, CE stands for ALL Chip Enables active. BWS = 0 signifies at least one Byte Write Select is active,
x
BWS = Valid signifies that the desired byte write selects are asserted. See Write Cycle Description table for details.
x
2. Write is defined by WE and BWS . See Write Cycle Description table for details.
x
3. The DQ and DP pins are controlled by the current cycle and the OE signal.
4. CEN = 1 inserts wait states.
5. Device will power-up deselected and the I/Os in a three-state condition, regardless of OE.
6. OE assumed LOW.
Document #: 38-05289 Rev. **
Page 8 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Write Cycle Descriptions[1, 2]
Function (CY7C1470V33)
Read
GW
1
BWE
1
BWd
X
1
BWc
X
1
BWb
X
1
BWa
X
1
Read
1
0
Write Byte 0–DQa
Write Byte 1–DQb
Write Bytes 1, 0
Write Byte 2–DQc
Write Bytes 2, 0
Write Bytes 2, 1
Write Bytes 2, 1, 0
Write Byte 3–DQd
Write Bytes 3, 0
Write Bytes 3, 1
Write Bytes 3, 1, 0
Write Bytes 3, 2
Write Bytes 3, 2, 0
Write Bytes 3, 2, 1
Write All Bytes
1
0
1
1
1
0
1
0
1
1
0
1
1
0
1
1
0
0
1
0
1
0
1
1
1
0
1
0
1
0
1
0
1
0
0
1
1
0
1
0
0
0
1
0
0
1
1
1
1
0
0
1
1
0
1
0
0
1
0
1
1
0
0
1
0
0
1
0
0
0
1
1
1
0
0
0
1
0
1
0
0
0
0
1
1
0
0
0
0
0
Write All Bytes
0
X
X
X
X
X
Function (CY7C1472V33)
Read
GW
BWE
BWb
BWa
1
1
1
1
1
0
1
0
0
0
0
X
X
1
1
0
0
X
X
1
0
1
0
X
Read
Write Byte 0–DQ[7:0] and DP0
Write Byte 1–DQ[15:8] and DP1
Write All Bytes
Write All Bytes
Document #: 38-05289 Rev. **
Page 9 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
circuitry. Only one register can be selected at a time through
the instruction registers. Data is serially loaded into the TDI pin
on the rising edge of TCK. Data is output on the TDO pin on
the falling edge of TCK.
IEEE 1149.1 Serial Boundary Scan (JTAG)
The CY7C1472V33/CY7C1470V33 incorporates a serial
boundary scan Test Access Port (TAP) in the BGA package
only. The TQFP package does not offer this functionality. This
port operates in accordance with IEEE Standard 1149.1-1900,
but does not have the set of functions required for full 1149.1
compliance. These functions from the IEEE specification are
excluded because their inclusion places an added delay in the
critical speed path of the SRAM. Note that the TAP controller
functions in a manner that does not conflict with the operation
of other devices using fully compliant 1149.1 TAPs. The TAP
operates using JEDEC standard 2.5V I/O logic levels.
Instruction Register
Three-bit instructions can be serially loaded into the instruction
register. This register is loaded when it is placed between the
TDI and TDO pins as shown in the TAP Controller Block
Diagram. Upon power-up, the instruction register is loaded
with the IDCODE instruction. It is also loaded with the IDCODE
instruction if the controller is placed in a reset state as
described in the previous section.
When the TAP controller is in the CaptureIR state, the two least
significant bits are loaded with a binary “01” pattern to allow for
fault isolation of the board level serial test path.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, TCK must be tied LOW
(VSS) to prevent clocking of the device. TDI and TMS are inter-
nally pulled up and may be unconnected. They may alternately
be connected to VDD through a pull-up resistor. TDO should
be left unconnected. Upon power-up, the device will come up
in a reset state which will not interfere with the operation of the
device.
Bypass Register
To save time when serially shifting data through registers, it is
sometimes advantageous to skip certain states. The bypass
register is a single-bit register that can be placed between TDI
and TDO pins. This allows data to be shifted through the
SRAM with minimal delay. The bypass register is set LOW
(VSS) when the BYPASS instruction is executed.
Test Access Port—Test Clock
The test clock is used only with the TAP controller. All inputs
are captured on the rising edge of TCK. All outputs are driven
from the falling edge of TCK.
Boundary Scan Register
The boundary scan register is connected to all the input and
output pins on the SRAM. Several no connect (NC) pins are
also included in the scan register to reserve pins for higher
density devices. The ×36 configuration has a 70-bit-long
register, and the ×18 configuration has a 51-bit-long register.
Test Mode Select
The TMS input is used to give commands to the TAP controller
and is sampled on the rising edge of TCK. It is allowable to
leave this pin unconnected if the TAP is not used. The pin is
pulled up internally, resulting in a logic HIGH level.
The boundary scan register is loaded with the contents of the
RAM Input and Output ring when the TAP controller is in the
Capture-DR state and is then placed between the TDI and
TDO pins when the controller is moved to the Shift-DR state.
The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instruc-
tions can be used to capture the contents of the Input and
Output ring.
Test Data-In (TDI)
The TDI pin is used to serially input information into the
registers and can be connected to the input of any of the
registers. The register between TDI and TDO is chosen by the
instruction that is loaded into the TAP instruction register. For
information on loading the instruction register, see the TAP
Controller State Diagram. TDI is internally pulled up and can
be unconnected if the TAP is unused in an application. TDI is
connected to the Most Significant Bit (MSB) on any register.
The Boundary Scan Order tables show the order in which the
bits are connected. Each bit corresponds to one of the bumps
on the SRAM package. The MSB of the register is connected
to TDI, and the LSB is connected to TDO.
Identification (ID) Register
Test Data Out (TDO)
The ID register is loaded with a vendor-specific, 32-bit code
during the Capture-DR state when the IDCODE command is
loaded in the instruction register. The IDCODE is hardwired
into the SRAM and can be shifted out when the TAP controller
is in the Shift-DR state. The ID register has a vendor code and
other information described in the Identification Register
Definitions table.
The TDO output pin is used to serially clock data-out from the
registers. The output is active depending upon the current
state of the TAP state machine (see TAP Controller State
Diagram). The output changes on the falling edge of TCK.
TDO is connected to the Least Significant Bit (LSB) of any
register.
Performing a TAP Reset
TAP Instruction Set
A Reset is performed by forcing TMS HIGH (VDD) for five rising
edges of TCK. This RESET does not affect the operation of
the SRAM and may be performed while the SRAM is
operating. At power-up, the TAP is reset internally to ensure
that TDO comes up in a High-Z state.
Eight different instructions are possible with the three-bit
instruction register. All combinations are listed in the
Instruction Code table. Three of these instructions are listed
as RESERVED and should not be used. The other five instruc-
tions are described in detail below.
The TAP controller used in this SRAM is not fully compliant
with the 1149.1 convention because some of the mandatory
1149.1 instructions are not fully implemented. The TAP
controller cannot be used to load address, data, or control
TAP Registers
Registers are connected between the TDI and TDO pins and
allow data to be scanned into and out of the SRAM test
Document #: 38-05289 Rev. **
Page 10 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
signals into the SRAM and cannot preload the Input or Output
buffers. The SRAM does not implement the 1149.1 commands
EXTEST or INTEST or the PRELOAD portion of
SAMPLE/PRELOAD; rather it performs a capture of the Inputs
and Output ring when these instructions are executed.
When the SAMPLE/PRELOAD instructions are loaded into the
instruction register and the TAP controller is in the Capture-DR
state, a snapshot of data on the inputs and output pins is
captured in the boundary scan register.
The user must be aware that the TAP controller clock can only
operate at a frequency up to 10 MHz, while the SRAM clock
operates more than an order of magnitude faster. Because
there is a large difference in the clock frequencies, it is
possible that during the Capture-DR state, an input or output
will undergo a transition. The TAP may then try to capture a
signal while in transition (metastable state). This will not harm
the device, but there is no guarantee as to the value that will
be captured. Repeatable results may not be possible.
Instructions are loaded into the TAP controller during the
Shift-IR state when the instruction register is placed between
TDI and TDO. During this state, instructions are shifted
through the instruction register through the TDI and TDO pins.
To execute the instruction once it is shifted in, the TAP
controller needs to be moved into the Update-IR state.
EXTEST
EXTEST is a mandatory 1149.1 instruction that is to be
executed whenever the instruction register is loaded with all
0s. EXTEST is not implemented in the TAP controller, and
therefore this device is not compliant with the 1149.1 standard.
To guarantee that the boundary scan register will capture the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the TAP controller’s capture set-up plus
hold times (tCS and tCH). The SRAM clock input might not be
captured correctly if there is no way in a design to stop (or
slow) the clock during a SAMPLE/PRELOAD instruction. If this
is an issue, it is still possible to capture all other signals and
simply ignore the value of the CK and CK# captured in the
boundary scan register.
The TAP controller does recognize an all-0 instruction. When
an EXTEST instruction is loaded into the instruction register,
the SRAM responds as if a SAMPLE/PRELOAD instruction
has been loaded. There is one difference between the two
instructions. Unlike the SAMPLE/PRELOAD instruction,
EXTEST places the SRAM outputs in a High-Z state.
Once the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the
boundary scan register between the TDI and TDO pins.
IDCODE
The IDCODE instruction causes a vendor-specific, 32-bit code
to be loaded into the instruction register. It also places the
instruction register between the TDI and TDO pins and allows
the IDCODE to be shifted out of the device when the TAP
controller enters the Shift-DR state. The IDCODE instruction
is loaded into the instruction register upon power-up or
whenever the TAP controller is given a test logic reset state.
Note that since the PRELOAD part of the command is not
implemented, putting the TAP into the Update to the
Update-DR state while performing a SAMPLE/PRELOAD
instruction will have the same effect as the Pause-DR
command.
Bypass
When the BYPASS instruction is loaded in the instruction
register and the TAP is placed in a Shift-DR state, the bypass
register is placed between the TDI and TDO pins. The
advantage of the BYPASS instruction is that it shortens the
boundary scan path when multiple devices are connected
together on a board.
SAMPLE Z
The SAMPLE Z instruction causes the boundary scan register
to be connected between the TDI and TDO pins when the TAP
controller is in a Shift-DR state. It also places all SRAM outputs
into a High-Z state.
SAMPLE/PRELOAD
Reserved
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. The
PRELOAD portion of this instruction is not implemented, so
the TAP controller is not fully 1149.1-compliant.
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
Document #: 38-05289 Rev. **
Page 11 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
TAP Controller State Diagram
TEST-LOGIC
1[7]
RESET
1
1
1
TEST-LOGIC/
IDLE
SELECT
DR-SCAN
SELECT
IR-SCAN
0
0
0
1
1
CAPTURE-DR
CAPTURE-DR
0
0
SHIFT-DR
0
SHIFT-IR
0
1
1
EXIT1-DR
0
1
EXIT1-IR
0
1
0
0
PAUSE-DR
1
PAUSE-IR
1
0
0
EXIT2-DR
1
EXIT2-IR
1
UPDATE-DR
UPDATE-IR
1
1
0
0
Note:
7. The 0/1 next to each state represents the value at TMS at the rising edge of TCK.
Document #: 38-05289 Rev. **
Page 12 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
TAP Controller Block Diagram
0
Bypass Register
Selection
Circuitry
Selection
Circuitry
2
1
0
TDO
TDI
Instruction Register
29
Identification Register
31 30
.
.
2
1
1
0
0
.
.
.
.
.
2
Boundary Scan Register
TCK
TMS
TAP Controller
TAP Electrical Characteristics Over the Operating Range[8, 9]
Parameter
VOH1
Description
Output HIGH Voltage
Output HIGH Voltage
Output LOW Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Test Conditions
IOH = −4.0 mA
Min.
2.4
Max.
Unit
V
V
VOH2
VOL1
VOL2
VIH
IOH = −100 µA
IOL = 8.0 mA
IOL = 100 µA
3.0
0.4
0.2
V
V
1.8
–0.5
–5
VDD + 0.3
0.8
V
VIL
V
IX
GND < VI < VDDQ
5
µA
TAP AC Switching Characteristics Over the Operating Range [10, 11]
Parameter
tTCYC
Description
Min.
Max.
Unit
TCK Clock Cycle Time
TCK Clock Frequency
TCK Clock HIGH
100
ns
MHz
ns
tTF
10
tTH
40
40
tTL
TCK Clock LOW
ns
Set-up Times
tTMSS
TMS Set-up to TCK Clock Rise
TDI Set-up to TCK Clock Rise
Capture Set-up to TCK Rise
10
10
10
ns
ns
ns
tTDIS
tCS
Notes:
8. All voltage referenced to Ground.
9. Overshoot: VIH(AC) < VDD + 1.5V for t < tTCYC/2; undershoot: VIL(AC) < 0.5V for t < tTCYC/2; power-up: VIH < 2.6V and VDD < 2.4V and VDDQ < 1.4V for t < 200 ms.
10. tCS and tCH refer to the set-up and hold time requirements of latching data from the boundary scan register.
11. Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1 ns.
Document #: 38-05289 Rev. **
Page 13 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
TAP AC Switching Characteristics Over the Operating Range (continued)[10, 11]
Parameter
Hold Times
tTMSH
Description
Min.
Max.
Unit
TMS Hold after TCK Clock Rise
TDI Hold after Clock Rise
10
10
10
ns
ns
ns
tTDIH
tCH
Capture Hold after Clock Rise
Output Times
tTDOV TCK Clock LOW to TDO Valid
tTDOX TCK Clock LOW to TDO Invalid
20
ns
ns
0
TAP Timing and Test Conditions
1.25V
50Ω
ALL INPUT PULSES
TDO
Vih
Z = 50Ω
0
C = 20 pF
L
0V
GND
tTL
tTH
(a)
Test Clock
TCK
tTCYC
tTMSS
tTMSH
Test Mode Select
TMS
tTDIS
tTDIH
Test Data-In
TDI
Test Data-Out
TDO
tTDOV
tTDOX
Document #: 38-05289 Rev. **
Page 14 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Identification Register Definitions
Instruction Field
Revision Number (31:29)
Department Number (27:25)
Voltage (28&24)
×18
000
101
00
×36
Description
Reserved for version number
000
101
00
Department number
Architecture (23:21)
001
000
010
100
001
000
100
100
Architecture type
Memory type (20:18)
Device Width (17:15)
Device Density (14:12)
Cypress JEDEC ID (11:1)
ID Register Presence (0)
Defines type of memory
Defines width of the SRAM. ×36 or ×18
Defines the density of the SRAM
00000110100 00000110100 Allows unique identification of SRAM vendor
Indicate the presence of an ID register.
1
1
Scan Register Sizes
Register Name
Bit Size (×18)
Bit Size (×36)
Instruction
Bypass
3
1
3
1
ID
32
51
32
70
Boundary Scan
Identification Codes
Instruction
Code
Description
EXTEST
000
Captures the Input/Output ring contents. Places the boundary scan register
between the TDI and TDO. Forces all SRAM outputs to High-Z state. This
instruction is not 1149.1-compliant.
IDCODE
001
010
Loads the ID register with the vendor ID code and places the register
between TDI and TDO. This operation does not affect SRAM operation.
SAMPLE Z
Captures the Input/Output contents. Places the boundary scan register
between TDI and TDO. Forces all SRAM output drivers to a High-Z state.
RESERVED
011
100
Do Not Use. This instruction is reserved for future use.
SAMPLE/PRELOAD
Captures the Input/Output ring contents. Places the boundary scan register
betweenTDI and TDO. Does not affect the SRAM operation. This instruction
does not implement 1149.1 preload function and is therefore not
1149.1-compliant.
RESERVED
RESERVED
BYPASS
101
110
111
Do Not Use. This instruction is reserved for future use.
Do Not Use. This instruction is reserved for future use.
Places the bypass register between TDI and TDO. This operation does not
affect SRAM operation.
Document #: 38-05289 Rev. **
Page 15 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Boundary Scan Order (2M × 36)
Boundary Scan Order (4M × 18)
Document #: 38-05289 Rev. **
Page 16 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage........................................... >2001V
(per MIL-STD-883, Method 3015)
Storage Temperature ..................................... −65°C to +150°C
Ambient Temperature with
Latch-up Current..................................................... >200mA
Power Applied.................................................. −55°C to +125°C
Operating Range
Supply Voltage on VDD Relative to GND.........−0.5V to +4.6V
Ambient
Range Temperature[14]
VDD
VDDQ
DC Voltage Applied to Outputs
in High-Z State[13]....................................−0.5V to VDDQ + 0.5V
Com’l
0°C to +70°C
3.3V ±5%
2.375V (min.)
VDD (max)
DC Input Voltage[13]................................−0.5V to VDDQ + 0.5V
Electrical Characteristics Over the Operating Range
Parameter
VDD
Description
Power Supply Voltage
I/O Supply Voltage
Test Conditions
Min.
3.135
2.375
2.4
Max.
3.465
VDD
Unit
V
V
VDDQ
VOH
VDD = Min., IOH = –4.0 mA
3.3V
2.5V
3.3V
2.5V
3.3 V
2.5V
3.3V
2.5V
V
Output HIGH Voltage
VDD = Min., IOH = –1.0 mA
VDD = Min., IOL = 8.0 mA
VDD = Min., IOL = 1.0 mA
2.0
V
VOL
0.4
0.4
V
Output LOW Voltage
V
VIH
2.0
1.7
V
Input HIGH Voltage
V
VIL
–0.3
–0.3
0.8
0.7
V
Input LOW Voltage[13]
V
IX
Input Load Current
Input Current of MODE
GND < VI < VDDQ
5
µA
µA
µA
mA
mA
mA
mA
mA
mA
mA
mA
mA
30
IOZ
IDD
Output Leakage Current GND < VI < VDDQ, Output Disabled
5
VDD Operating Supply VDD = Max., IOUT = 0 mA,
f = fMAX = 1/tCYC
300 MHz
250 MHz
200 MHz
167 MHz
300 MHz
250 MHz
200 MHz
167 MHz
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
ISB1
Automatic CE
Power-down
Current—TTL Inputs
Max. VDD, Device Deselected,
VIN > VIH or VIN < VIL
f = fMAX = 1/tCYC
ISB2
Automatic CE
Power-down
Max. VDD, Device Deselected, VIN < All speed grades
0.3V or VIN > VDDQ − 0.3V,
Current—CMOS Inputs f = 0
ISB3
Automatic CE
Power-down
Current—CMOS Inputs f = fMAX = 1/tCYC
Max. VDD, Device Deselected, or VIN 300 MHz
TBD
TBD
TBD
TBD
TBD
mA
mA
mA
mA
mA
< 0.3V or VIN > VDDQ – 0.3V
250 MHz
200 MHz
167 MHz
ISB4
Automatic CE
Power-down
Max. VDD, Device Deselected, VIN > All speed grades
VIH or VIN < VIL, f = 0
Current—TTL Inputs
Shaded areas contain advance information.
Notes:
12.
TA is the ambient temperature.
13. Minimum voltage equals −2.0V for pulse durations of less than 20 ns.
Document #: 38-05289 Rev. **
Page 17 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Capacitance[15]
Parameter
Description
Input Capacitance
Test Conditions
Max.
Unit
pF
CIN
TA = 25°C, f = 1 MHz,
VDD = VDDQ = 2.5V
TBD
TBD
TBD
CCLK
CI/O
Clock Input Capacitance
Input/Output Capacitance
pF
pF
AC Test Loads and Waveforms
R = 317Ω
V
DDQ
[14]
OUTPUT
ALL INPUT PULSES
90%
OUTPUT
3.3V
GND
90%
Z = 50Ω
0
R = 50Ω
10%
10%
L
5 pF
R = 351Ω
INCLUDING
JIG AND
V = 1.5V for 3.3V V
L
= 1.25V for 2.5V V
Rise Time:
2 V/ns
DDQ
DDQ
Fall Time:
2 V/ns
SCOPE
(c)
(a)
(b)
Thermal Resistance[15]
Parameter
Description
Test Conditions
BGA Typ.
TQFP Typ.
Units
QJA
Thermal Resistance
(Junction to Ambient)
Still Air, soldered on a 4.25 × 1.125 inch,
four-layer printed circuit board
TBD
TBD
°C/W
QJC
Thermal Resistance
(Junction to Case)
TBD
TBD
°C/W
Switching Characteristics (Over the Operating Range)
-300
-250
-200
-167
Parameter
Clock
tCYC
Description
Min. Max. Min. Max. Min. Max. Min. Max.
Unit
Clock Cycle Time
3.3
4.0
5
6
ns
MHz
ns
FMAX
Maximum Operating Frequency
Clock HIGH
300
250
200
167
tCH
1.5
1.5
1.7
1.7
2.0
2.0
2.4
2.4
tCL
Clock LOW
ns
Output Times
tCO
Data Output Valid After CLK Rise
OE LOW to Output Valid[15, 17, 19]
Data Output Hold After CLK Rise
Clock to High-Z[15, 16, 17, 18, 19]
Clock to Low-Z[15, 16, 17, 18, 19]
OE HIGH to Output High-Z[16, 17, 19]
OE LOW to Output Low-Z[16, 17, 19]
2.2
2.2
2.4
2.4
3.0
3.0
3.4
3.4
ns
ns
ns
ns
ns
ns
ns
tEOV
tDOH
0.8
0.8
0.8
0.8
0.8
0.8
1.0
1.0
1.0
1.5
1.5
1.5
tCHZ
2.2
2.2
2.4
2.4
3.0
3.0
3.4
3.4
tCLZ
tEOHZ
tEOLZ
0
0
0
0
Set-up Times
tAS
Address Set-up Before CLK Rise
Data Input Set-up Before CLK Rise
CEN Set-Up Before CLK Rise
0.8
0.8
0.8
0.8
1.2
1.2
1.2
1.2
1.4
1.4
1.4
1.4
1.5
1.5
1.5
1.5
ns
ns
ns
ns
tDS
tCENS
tWES
WE, BWSx Set-up Before CLK Rise
Notes:
14. Input waveform should have a slew rate of > 1 V/ns.
15. Tested initially and after any design or process change that may affect these parameters.
16. Unless otherwise noted, test conditions assume signal transition time of 1.5ns, timing reference levels of 1.5V, input pulse levels of 0 to 3.3V, and output loading
of the specified IOL/IOH and load capacitance. Shown in (a), (b) and (c) of AC Test Loads.
17.
tCHZ, tCLZ, tOEV, tEOLZ, and tEOHZ are specified with AC test conditions shown in part (a) of AC Test Loads. Transition is measured ± 200 mV from steady-state
voltage.
18. At any given voltage and temperature, tEOHZ is less than tEOLZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve High-Z prior to Low-Z under the same system conditions.
19. This parameter is sampled and not 100% tested.
Document #: 38-05289 Rev. **
Page 18 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Switching Characteristics (Over the Operating Range)
-300
-250
Min. Max.
-200
Min. Max.
-167
Parameter
tALS
Description
ADV/LD Set-up Before CLK Rise
Chip Select Set-up
Min.
Max.
Min.
1.5
Max.
Unit
ns
0.8
0.8
1.2
1.2
1.4
1.4
tCES
1.5
ns
Hold Times
tAH
Address Hold After CLK Rise
Data Input Hold After CLK Rise
CEN Hold After CLK Rise
0.3
0.3
0.3
0.3
0.3
0.3
0.3
0.3
0.3
0.3
0.3
0.3
0.4
0.4
0.4
0.4
0.4
0.4
0.5
0.5
0.5
0.5
0.5
0.5
ns
ns
ns
ns
ns
ns
tDH
tCENH
tWEH
tALH
WE, BWx Hold After CLK Rise
ADV/LD Hold after CLK Rise
Chip Select Hold After CLK Rise
tCEH
Switching Waveforms
Read/Write/DESELECT Sequence
CLK
CEN
tCENH
tCENS
tCL
tCH
tCYC
tAH
tAS
CEN HIGH blocks
all synchronous inputs
WA2
WA5
RA1
RA3
RA4
RA6
ADDRESS
RA7
WE and
BWSx
tWS
tWH
tCEH
tCES
CE
tDH
tDS
tCHZ
tCHZ
tDOH
tCLZ
tDOH
Q4
Q1
Out
D2
In
Data
In/Out
D5
In
Q3
Out
Q6
Out
Q7
Out
Out
Device
originally
tCO
deselected
The combination of WE and BWSx (x = a, b, c, d for x36 and x = a, b for x18) defines a write cycle (see Write Cycle
Description table). CE is the combination of CE1, CE2, and CE3. All chip enables need to be active in order to select the
device. Any chip enable can deselect the device. RAx stands for Read Address X, WAx stands for Write Address X, Dx
stands for Data-in for location X, Qx stands for Data-out for location X. ADV/LD held LOW. OE held LOW.
= UNDEFINED
= DON’T CARE
Document #: 38-05289 Rev. **
Page 19 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Switching Waveforms (continued)
Burst Sequences
CLK
tCYC
tALH
tALS
ADV/LD
tCL
tCH
tAH
tAS
RA1
WA2
ADDRESS
WE
RA3
tWS
tWH
tWS
tWH
BWSx
tCES
tCEH
CE
tCLZ
tCHZ
tDH
tDOH
tCLZ
Q3
Data
In/Out
Q1
Q1+2
Out
Q1+3
Out
D2
In
D2+2
In
D2+3
Q1+1
Out
D2+1
In
Out
Out
In
Device
originally
deselected
tCO
tCO
tDS
The combination of WE and BWSx(x = a, b c, d) define a write cycle (see Write Cycle Description table). CE is the
combination of CE1, CE2, and CE3. All chip enables need to be active in order to select the device. Any chip enable
can deselect the device. RAx stands for Read Address X, WA stands for Write Address X, Dx stands for Data-in for
location X, Qx stands for Data-out for location X. CEN held LOW. During burst writes, byte writes can be conducted by
asserting the appropriate BWSx input signals. Burst order determined by the state of the MODE input. CEN held LOW.
OE held LOW.
= UNDEFINED
= DON’T CARE
Document #: 38-05289 Rev. **
Page 20 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Switching Waveforms (continued)
OE Timing
OE
tEOV
tEOHZ
Three-state
I/Os
tEOLZ
Ordering Information
Speed
(MHz)
Package
Name
Operating
Range
Ordering Code
Package Type
300
CY7C1470V33-300AC
CY7C1472V33-300AC
A101
100-pin 14 × 20 × 1.4 mm Thin Quad Flat Pack
119-ball BGA (14 × 22 × 2.4 mm)
165-ball FBGA (15 × 17 mm)
Commercial
CY7C1470V33-300BGC
CY7C1472V33-300BGC
BG119
CY7C1470V33-300BZC
CY7C1472V33-300BZC
BB165C
CY7C1474V33-300BX
BG209
A101
209-ball FBGA (14 × 22 × 1.7 mm)
250
200
167
CY7C1470V33-250AC
CY7C1472V33-250AC
100-pin 14 × 20 × 1.4 mm Thin Quad Flat Pack
CY7C1470V33-250BGC
CY7C1472V33-250BGC
BG119
119-ball BGA (14 × 22 × 2.4 mm)
165-ball FBGA (15 × 17 mm)
CY7C1470V33-250BZC
CY7C1472V33-250BZC
BB165C
CY7C1474V33-250BX
BG209
A101
209-ball FBGA (14 × 22 × 1.7 mm)
CY7C1470V33-200AC
CY7C1472V33-200AC
100-pin 14 × 20 × 1.4 mm Thin Quad Flat Pack
CY7C1470V33-200BGC
CY7C1472V33-200BGC
BG119
119-ball BGA (14 × 22 × 2.4 mm)
165-ball FBGA (15 × 17 mm)
CY7C1470V33-200BZC
CY7C1472V33-200BZC
BB165C
CY7C1474V33-200BX
BG209
A101
209-ball FBGA (14 × 22 × 1.7 mm)
CY7C1470V33-167AC
CY7C1472V33-167AC
100-pin 14 × 20 × 1.4 mm Thin Quad Flat Pack
CY7C1470V33-167BGC
CY7C1472V33-167BGC
BG119
BB165C
BG209
119-ball BGA (14 × 22 × 2.4 mm)
165-ball FBGA (15 × 17 mm)
CY7C1470V33-167BZC
CY7C1472V33-167BZC
CY7C1474V33-167BX
209-ball FBGA (14 × 22 × 1.7 mm)
Document #: 38-05289 Rev. **
Page 21 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Package Diagrams
100-pin Thin Plastic Quad Flatpack (14 x 20 x 1.4 mm) A101
51-85050-A
Document #: 38-05289 Rev. **
Page 22 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Package Diagrams (continued)
165-ball FBGA (15 × 17 × 1.20 mm) BB165C
51-85165-**
Document #: 38-05289 Rev. **
Page 23 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Package Diagrams (continued)
119-Lead BGA (14 x 22 x 2.4) BG119
51-85115-*A
Document #: 38-05289 Rev. **
Page 24 of 26
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Package Diagrams (continued)
209-Lead PBGA (14 x 22 x 2.20 mm) BG209
51-85143-*A
Zero Bus Latency, No Bus Latency, and NoBL are trademarks of Cypress Semiconductor Corporation. All product and company
names mentioned in this document are the trademarks of their respective holders.
Document #: 38-05289 Rev. **
Page 25 of 26
© Cypress Semiconductor Corporation, 2002. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.
CY7C1470V33
CY7C1472V33
CY7C1474V33
ADVANCE
INFORMATION
Document Title: CY7C1470V33/CY7C1472V33/CY7C1474V33 2M x 36/4M x 18/1M x 72 Pipelined SRAM
with NoBL™ Architecture
Document Number: 38-05289
ISSUE
DATE
ORIG. OF
CHANGE
REV.
ECN NO.
DESCRIPTION OF CHANGE
**
114676
08/06/02
PKS
New Data Sheet
Document #: 38-05289 Rev. **
Page 26 of 26
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