G93270002 [DIODES]
Parallel - Fundamental Quartz Crystal, 0.032768MHz Nom, SMD, 2 PIN;
| 型号： | G93270002 |
| 厂家： | 
DIODES INCORPORATED |
| 描述： | Parallel - Fundamental Quartz Crystal, 0.032768MHz Nom, SMD, 2 PIN 驱动 晶体 谐振器 |
| 文件： | 总7页 (文件大小：705K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
PSE Technology Corporation
SPECIFICATION FOR APPROVAL
CUSTOMER
32.768 KHz
NOMINAL FREQUENCY
PRODUCT TYPE
SPEC. NO. ( P/N )
CUSTOMER P/N
ISSUE DATE
TYPE G9 SMD CRYSTAL
G93270002
0
Oct.31,2013
C
VERSION
APPROVED
PREPARED
QA
AVL Status
APPROVED BY CUSTOMER：
Please return one copy with approval to PSE-TW
PSE Technology Corporation
No.2, Tzu-Chiang 5th Rd, Chung Li Industrial Park,
Chung Li City, Taoyuan County, Taiwan (R.O.C.)
TEL: 886-3-451-8888
FAX: 886-3-461-3865
http://www.saronix-ecera.com.tw
*Pb-free
*RoHS Compliant
*HF-Halogen Free
*REACH Compliant
E0-R-4-014 Rev. E
Page i
TYPE G9 SMD CRYSTAL
VER. C
31-Oct-13
G93270002
VERSION HISTORY
Version
No.
Version
Date
Customer Receipt
Date
Supplier Receipt
Date
Description
Notes
A
B
Apr.18,2011
Oct.3,2011
Oct.31,2013
Initial Release
Changed Operating Temperature Range from -30~70°C
to -40~85°C & Added Shunt Capacitance 7pF
Revised to RoHS Compliant
c
E0-R-4-014 Rev. E
Page ii
TYPE G9 SMD CRYSTAL
VER. C
31-Oct-13
G93270002
ELECTRICAL SPECIFICATIONS
SRe Part Number : G93270002
Parameters
Nominal Frequency
Frequency Tolerance
Load Capacitance
Symbol
Fn
Specifications
32.768
± 20
Units
KHz
ppm
pF
Notes
FT
at 25°C ± 5°C
CL
12.5
Typ.
Drive Level
DL
0.1 / 0.5
90
Typ / Max.
Max.
μW
KΩ
Equivalent Series Resistance
Temperature Coefficient
Operating Temperature Range
Shunt Capacitance
ESR
K
ppm/°C2
°C
-0.03
Typ.
TR
-40~85
7
C0
pF
Max.
Storage Temperature Range
Aging
-55~125
± 3
°C
ppm Max 1st year
Insulation Resistance
500
MΩ Min.
Reliability ( Mechanical and environmental performances )
Test Items
Conditions
Requirements
No.
1
Bending test
Apply pressure in the direction of the arrow at a rate of
about 0.5mm/s until bent width reaches 5mm, and hold
for 30 seconds.
․Without mechanical damage such as
breaks and satisfy sealing specification.
․Frequency change: Within ±5ppm
Shear test
2
3
4
A static load of 20N(2.04kgf) using a R0.5 scratch tool, ․Equivalent series resistance(E.S.R)
shall be applied on the core of the component and in
the direction of the arrow and held for 5 seconds.
change: Within 5kΩ
Core body
strength
A static load of 10N(1.02kgf) using a R0.5 pressure rod
shall be applied to the center in the direction of the
arrow and held for 10 seconds.
Endurance conditioning by a frequency sweep shall be
made. The entire frequency range, from 10Hz to 55Hz
and return to 10Hz, shall be transversed in 1 minute.
Amplitude (total excursion) ：1.5mm, This motion shall
be applied for a period of 2 hours in each of 3 mutually
perpendicular axes (a total of 6 hours). For other
procedures, refer to JIS C 60068-2-6.
Vibration
Shock
5
Peak acceleration：9810m/s2，Duration of the pulse：
1ms, Three successive shock shall be applied 3 times
perpendicular axes. For other procedures, refer to JIS C
60068-2-27.
E0-R-4-014 Rev. E
Page 1
TYPE G9 SMD CRYSTAL
VER. C
31-Oct-13
G93270002
Cold
6
7
8
9
․Frequency change: Within ±5ppm
Quartz crystal units shall be stored in the -40±3℃
atmosphere for 1000 hours. Other procedures conform
to JIS C 60068-2-1.
․Equivalent series resistance(E.S.R)
change: Within 5kΩ
Dry heat
Damp heat
Quartz crystal units shall be stored in the 100±2℃
․After conditioning, quartz crystal units
atmosphere for 100 hours. Other procedures conform to shall be subjected to standard atmospheric
JIS C 60068-2-2.
conditions for 1 hour, and measured.
Quartz crystal units shall be stored in the 40±2℃
atmosphere with 90 to 95% relative humidity for 1000
hours. Other procedures conform to JIS C 60068-2-3.
Change of
temperature
Quartz crystal units shall be subjected successively 100
cycles of temperature change shown below. Other
procedures conform to JIS C 0025.
Temperature
-40±3℃
Duration
30min.
1
2
3
4
Normal temperature Within 30 sec.
30min.
100±2℃
Normal temperature Within 30 sec.
Both the test methods specified below shall be applied.
10 Sealing
Quartz crystal units shall be soaked in 90℃ or higher
․Without repetitive leaking bubbles from
temperature hot water for 5 minutes.
quartz crystal units.
․1×10-9 Pa･m3/s or less
Quartz crystal units shall be tested by Mass
spectrometric leakage detector to measure the leakage
rate of helium gas.
11 Aging
․Frequency change: Within ±5ppm
Quartz crystal units shall be stored in the 85±3℃
atmosphere for 720±12 hours.
․Equivalent series resistance(E.S.R)
change: Within 5kΩ
․After conditioning, quartz crystal units
shall be subjected to standard atmospheric
conditions for 1 hour, and measured.
12 Solder-ability
Terminals coated with flux shall be immersed in the
solder bath for 3.5±0.5 seconds.
․Minimum 95% of immersed terminal shall
be covered with new uniform solder.
Items
Solder
Conditions
Sn-3.0Ag-0.5Cu
1
2
Approximately 25wt%
methanol(JIS K 8891)
solution of resin(JIS K
5902).
Flux
Solder
temperature
3
255±5℃
E0-R-4-014 Rev. E
Page 2
TYPE G9 SMD CRYSTAL
VER. C
31-Oct-13
G93270002
Reflow soldering method
Resistance to
soldering heat
13
․Frequency change: Within ±5ppm
Peak temperature: 260±5℃ for within 5seconds.
Soldering temperature: 220℃ or higher for 60±10
seconds.
Pre-heating temperature: 160±10℃ for 90±10 seconds.
Quartz crystal units which is put on PCB shall be
through reflow soldering furnace twice with the condition
shown above.
․Equivalent series resistance (E.S.R)
change: Within 10kΩ
․After conditioning, quartz crystal units
shall be subjected to standard atmospheric
conditions for 1 hour, and measured.
․Without distinct deformation in
appearance.
Soldering iron method
․Frequency change: Within ±5ppm
Terminals shall be applied 400±10℃ soldering iron heat ․Equivalent series resistance(E.S.R)
for 3.5±0.5 seconds twice.
change: Within 5kΩ
․After conditioning, quartz crystal units
shall be subjected to standard atmospheric
conditions for 1 hour, and measured.
․Without distinct deformation in
appearance.
Solubility to
resistance
Soak cleaning
14
․Without mechanical damage such as
breaks and satisfy sealing specification.
Quartz crystal units shall be soaked in isopropyl alcohol
at normal temperature for 90
seconds.
․Frequency change: Within ±5ppm
․Equivalent series resistance(E.S.R)
change: Within 5kΩ
․Without distinct deformation in
appearance.
․Marking shall be legible.
E0-R-4-014 Rev. E
Page 3
TYPE G9 SMD CRYSTAL
VER. C
31-Oct-13
G93270002
Marking
m
v
Date Code
Factory Code
(Units: mm)
Dimensions
Land dimensions(unit: mm)
E0-R-4-014 Rev. E
Page 4
TYPE G9 SMD CRYSTAL
VER. C
31-Oct-13
G93270002
TAPING
REEL
E0-R-4-014 Rev. E
Page 5
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