E649-EDGE649 [ETC]
Octal Pin Electronics Driver / Receiver ; 八引脚电子驱动器/接收器\n
| 型号： | E649-EDGE649 |
| 厂家： | 
ETC |
| 描述： | Octal Pin Electronics Driver / Receiver
|
| 文件： | 总16页 (文件大小：151K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Edge649
Octal Pin Electronics
Driver/Receiver
TEST AND MEASUREMENT PRODUCTS
Features
Description
The Edge649 is an octal pin electronics driver and
receiver combination fabricated in a high- performance
CMOS process. It is designed for automatic test
equipment and instrumentation where cost, functional
density, and power are all at a premium.
• 50 MHz Operation
• 11 V DUT I/O Range
• Programmable Output Levels
• Programmable Input Thresholds
• Per Pin Flexibility
• High Integration Levels
• 615 mW Quiescent Power Dissipation
• Edge648 Compatible
The Edge649 incorporates eight channels of
programmable drivers and receivers into one package.
Each channel has per pin driver levels, receiver threshold,
and tristate control.
The 11V driver output and receiver input range allows
the Edge649 to interface directly between TTL, ECL,
CMOS (3V, 5V, and 8V), and custom level circuitry.
The Edge649 is pin and functionally compatible with the
EDGE648, with the following performance differences:
• reduced driver preshoot
Functional Block Diagram
• faster driver propagation delay
• superior driver pulse width distortion
• higher driver Fmax operation
• slightly slower driver output slew rates
• higher comparator Fmax operation
• lower comparator propagation delay
• superior comparator pulse width
distortion.
V
V
HIGH
LOW
8
8
8
8
8
DATA IN
DVR EN*
Applications
8
8
DUT
• Burn-In ATE
• Functional Board Testers
• In-Circuit Board Testers
• Combinational Board Testers
• Low Cost Chip Testers
• ASIC Verifiers
+
DATA OUT
–
THRESHOLD
• VXI-Based Test Equipment
www.semtech.com
Revision 5 / October 21, 2002
1
Edge649
TEST AND MEASUREMENT PRODUCTS
PIN Description
Pin Name
Pin Number
Description
DATA IN (0:7)
64, 65, 66, 67,
3, 4, 5, 6
TTL compatible inputs that determine the high/low status of the DUT
drivers.
DATA OUT (0:7)
DUT (0:7)
56, 57, 58, 59,
11, 12, 13, 14
CMOS level outputs that indicate the status of the DUT receivers.
Pin electronic inputs/outputs that receive/drive the device under test.
46, 43, 40, 37,
33, 30, 27, 24
DVR EN (0:7)
VHIGH (0:7)
60, 61, 62, 63,
7, 8, 9, 10
TTL compatible inputs that control the high impedance state of the
DUT drivers.
45, 44, 39, 38,
32, 31, 26, 25
Unbuffered analog inputs that set the voltage level of a logical 1 of the
DUT drivers.
VLOW (0:7)
47, 42, 41, 36,
34, 29, 28, 23
Unbuffered analog inputs that set the voltage level of a logical 0 of the
DUT drivers.
THRESHOLD (0:7)
50, 51, 52, 53,
17, 18, 19, 20
Buffered analog input voltage that sets the threshold for the DUT
comparators.
VCC
VEE
21, 49
22, 48
Analog positive power supply.
Analog negative power supply.
VDD
GND
N/C
1, 15, 55
2, 16, 54, 68
35
Digital power supply.
Device ground.
No connection.
www.semtech.com
Revision 5 / October 21, 2002
2
Edge649
TEST AND MEASUREMENT PRODUCTS
PIN Description (continued)
61
62
63
64
65
66
67
68
1
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
DVR EN*1
DVR EN*2
DVR EN*3
DATA IN0
DATA IN1
DATA IN2
DATA IN3
GND
DUT1
VLOW1
VLOW2
DUT2
VHIGH2
VHIGH3
DUT3
VLOW3
NC
VDD
2
GND
VLOW4
DUT4
3
DATA IN4
DATA IN5
DATA IN6
DATA IN7
DVR EN*4
DVR EN*5
DVR EN*6
4
VHIGH4
VHIGH5
DUT5
5
6
7
VLOW5
VLOW6
DUT6
8
9
Revision 5 / October 21, 2002
3
www.semtech.com
Edge649
TEST AND MEASUREMENT PRODUCTS
Circuit Description
V
HIGH
and V
LOW
Driver Description
V
V
LOW
HIGH
VHIGH and VLOW define the logical “1” and “0” levels of
the DUT driver and can be adjusted anywhere over the
range determined by VCC and VEE. Table 1 documents
the relationship between the analog power to supplies
(VCC and VEE), the driver range (VHIGH and VLOW), and
the comparator threshold range (VTHRESHOLD).
DATA IN
DUT
DVR EN*
The VHIGH and VLOW inputs are unbuffered in that they
also provide the driver output current (see Figure 3), so
the source of VHIGH and VLOW must have ample current
drive capability.
Figure 1. Driver Diagram
As shown in Figure 1, Edge649 supports programmable
high and low levels and tristate per channel. There are
no shared lines between any drivers. The DVR EN* and
DATA IN signals are TTL compatible inputs that control
the driver (see Figure 2).
V
HIGH
With DVR EN* high, the DUT driver goes into a high
impedance state. With DVR EN* low, DATA IN high forces
the driver into a high state (DUT = VHIGH), and DATA IN
low forces the driver low (DUT = VLOW).
DUT
DVR EN*
V
LOW
DATA IN
V
V
HIGH
DUT
Figure 3.
LOW
Simplified Model of the
Unbuffered Output Stage
Figure 2. Driver Functionality
Drive/Receive
Common Mode Range
Threshold
Range
Power Supply
Conditions
0V <= DUT <= +6.5V
0V <= DUT <= +8V
0V <= DUT <= +11V
-3V <= DUT <= +8V
0.1V <= THRESHOLD <= 3.0V
0.1V <= THRESHOLD <= 4.5V
0.1V <= THRESHOLD <= 7.5V
-2.9V <= THRESHOLD <= 4.5V
VCC = +6.5V
VEE = 0V
VCC = +8V
VEE = 0V
VCC + 11V
VEE = 0V
VCC = +8V
VEE = -3V
Table 1. Power Supply Requirement
www.semtech.com
Revision 5 / October 21, 2002
4
Edge649
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
Driver Output Protection
In a functional testing environment, where a resistor is
added in series with the driver output, the Edge649 can
withstand a short to any legal DUT voltage for an indefinite
amount of time.
In a low impedance application with no additional output
series resistance, care must be exercised and systems
should be designed to check for this condition and tristate
the driver if a short is detected.
Receiver Functionality
Edge649 supports programmable thresholds per
channel. There are no shared lines between comparators.
THRESHOLD is a high input impedance analog input
which defines a logical “1” and “0” at the DUT (see
Figure 4). If the DUT voltage is more positive than
THRESHOLD, DATA OUT will be high. With DUT lower
than THRESHOLD, DATA OUT will be low.
+
–
DUT
DATA OUT
THRESHOLD
THRESHOLD
DUT
DATA OUT
Tpd
Figure 4. Receiver Functionality
Revision 5 / October 21, 2002
5
www.semtech.com
Edge649
TEST AND MEASUREMENT PRODUCTS
Application Infor mation
Power Supplies
VCC and VEE, which power the DUT drivers and receivers,
should also be decoupled to GND with a .1 µF chip
capacitor in parallel with a .001 µF chip capacitor. A
VCC and VEE plane, or at least a solid power bus, is
recommended for optimal performance.
The Edge649 uses three power supplies: VDD, VCC and
VEE. VDD is the digital supply for all of the data inputs
and outputs. VCC and VEE are the analog power supplies
for the Edge649 drivers and comparators. In order to
protect the Edge649 and avoid damaging it, the following
power supply requirements must be satisifed at all times:
V
HIGH
and V
Decoupling
VEE ≤ GND ≤ VDD ≤ VCC
LOW
Also,
VEE ≤ All Inputs ≤ VCC at all times
As the V
and V
inputs are unbuffered and must
HIGH
LOW
supply the driver output current, decoupling capacitors
for these inputs are recommended in proportion to the
amount of output current the application requires
The three-diode configuration shown in Figure 5, used
on a once-per-board basis, insures power supply
sequence and fault tolerance.
VCC
Expanding the Common Mode Range
Although the Edge649 can drive and receive 11V swings,
these 11 V signals can be adjusted over an 14V range.
By using programmable regulators V1 and V2 for the
VCC and VEE supplies (feasible because these two
analog power supplies do not supply driver output
current), the Edge649 I/O range can be optimized for a
variety of applications (see Figure 6).
VDD
1N5820 or
Equivalent
VEE
V
1
Figure 5. Power Supply Protection Scheme
VCC
The sequence below can be used as a guideline with the
Edge649:
Edge 649
Power-On Sequencing
1. VCC (substrate)
2. VEE
Power-Off Sequencing
1. Inputs
2. VDD
VDD
3. VDD
3. VEE
V
2
4. Inputs
4. VCC
Power Supplies Decoupling
Figure 6.
There are three rules which govern the supplies V1 and
V2:
VDD, which provides the digital power, should be
decoupled to GND with a .1 µF chip capacitor in parallel
with a .001 µF chip capacitor. The bypass capacitors
should be as close to the device as possible. Power and
ground planes are recommended to provide a low
inductance return path.
1)
2)
3)
VDD + 1.5V ≤ V1 ≤ +11V
–3V ≤ V2 ≤ 0V
(V1 – V2) ≤ 11V
www.semtech.com
Revision 5 / October 21, 2002
6
Edge649
TEST AND MEASUREMENT PRODUCTS
Application Infor mation (continued)
Window Comparator
Trinary Driver
Certain applications require a dual threshold window
comparator to distinguish between the DUT being high,
low, or floating. To support this application, two Edge649
channels can be combined to create one channel with a
window comparator (see Figure 7). Notice that
connecting two DUT pins ties together the positive inputs
of both receivers. The result is a difference in polarity
between the digital outputs reporting the high and low
status of the DUT.
At times, there is a need for a three-level driver. Typically,
two levels are required for the standard digital “1” and
“0” pattern generation. The third level provides a higher
voltage to place the device under test (DUT) into a
programming or test mode. By controlling the DATA IN
and DVR EN* inputs, a trinary driver with tristate is
realizable (see Figure 8).
Driver with Pull Up/Pull Down
–
High Threshold
As the drivers are unbuffered, paralleling two drivers for
one DUT node provides a means for adding pull up or
DUT HIGH
+
DUT
pull down capability. By connecting the V
and V
HIGH
LOW
+
inputs of one driver through a resistor to a voltage,
additional functionality that would normally require an
external relay on the DUT transmission line to engage
and disengage these functions is realizable.
DUT LOW*
–
Low Threshold
Figure 7. Edge649 as a
Window Comparator
One common application for the pull up feature is testing
open collector devices. The pull down satisfies open
emitter DUTs (typically ECL). Either the pull up or down
could be used to establish a default high impedance
voltage on a bidirectional bus. Notice that in all
applications, the resistors can be switched dynamically
or statically.
Once two receivers are connected as window
comparators, the two drivers also get connected in
parallel. This dual driver configuration supports a
multitude of applications that have traditionally been
difficult to accommodate.
V
A
V
A
LOW
HIGH
DATA IN A
DVR EN*A
V
V
B
A
A
HIGH
HIGH
DUT
V
B
HIGH
V
LOW
DATA IN B
DVR EN*B
Figure 8. Trinary Driver
Revision 5 / October 21, 2002
7
www.semtech.com
Edge649
TEST AND MEASUREMENT PRODUCTS
Application Infor mation (continued)
Also, either the pull up or pull down resistor could be
used to terminate the transmission from the DUT to the
pin electronics in an effort to minimize any reflections.
Two Logic Family Driver
Many test systems support exactly two families of driver
and receiver levels and select between family A and family
B settings on a per-pin basis, typically using an analog
multiplexer, (See Figure 11.) Common examples of these
families are:
V
A
V
A
LOW
HIGH
DATA IN A
DVR EN*A
DUT
V
B
B
Family A = TTL
Family B = CMOS
or
Family A = TTL
Family B = ECL
HIGH
V
PULL UP
DATA IN B
DVR EN*B
V
PULL DOWN
V
LOW
Figure 9. Driver with Pull Up/Pull Down
The Edge649 supports this system architecture with
minimal hardware and the elimination of the per-pin
analog multiplexer. The drive and receive levels need to
be generated once per system, then distributed and
buffered suitably.
Trinary Driver with Termination
Other combinations are also possible. For example, two
parallel drivers can be configured to implement one
trinary driver with a pull down (or pull up) dynamic
termination (see Figure 10).
Parametric Functions
Two drivers in parallel also offer the possibility of
connecting force and sense parametric circuitry to the
DUT without adding additional circuitry to the controlled
impedance DUT line. For example, Figure 12 shows the
second driver being utilized to force a current and
measure a voltage.
V
A
V
A
LOW
HIGH
DATA IN A
DVR EN*A
DUT
V
B
HIGH
V
TERMINATION
DATA IN B
DVR EN*B
Notice that the V
and V
pins are used from
LOW
HIGH
different drivers to allow the force and sense functions
to be active simultaneously.
Figure 10. Trinary Driver with Termination
CHANNEL 1
CHANNEL n
V
V
A
B
HIGH
HIGH
DVR EN*A
DVR DATA
DVR EN*A
DVR DATA
DVR EN*B
DUT0
DUT0
DVR EN*B
V
V
B
A
LOW
LOW
Figure 11. Family A/B Using Two Drivers Per Pin
www.semtech.com
Revision 5 / October 21, 2002
8
Edge649
TEST AND MEASUREMENT PRODUCTS
Application Infor mation (continued)
Optional Output Configuration
Certain functional applications require a series output
resistor yet also demand that the comparator be
connected directly to the DUT, not via the backmatch
resistor. To create this configuration, two distinct
termination resistors may be connected to the V
HIGH
and V
input pins (see Figure 13).
LOW
V
HIGH
PROGRAMMABLE
CURRENT
SOURCE
V
HIGH
DUT
DATA IN A
V
LOW
DATA EN* A
V
LOW
DUT
VOLTAGE
MEASUREMENT
UNIT
DATA IN B
DATA EN* B
Figure 13. Functional Application with
the Comparator Connected Directly to the DUT
Figure 12. Edge649 Supporting Parametric Testing
Thermal Information
Parameter
Symbol
Min
Typ
Max
Units
Thermal Resistance
Junction to Case
o
θJC
9.8
C/W
Junction to Air
Still Air
o
o
o
θJA
θJA
θJA
34
26
19
C/W
C/W
C/W
50 LFPM
400 LFPM
Revision 5 / October 21, 2002
9
www.semtech.com
Edge649
TEST AND MEASUREMENT PRODUCTS
Package Infor mation
68 Pin PLCC Package
θJA = 42 to 48˚C / W
0.990 SQ
[25.146]
PIN Descriptions
0.953 SQ
[24.206]
See Detail A
0.045 SQ
[1.143]
0.048
[1.219]
0.910
[23.114]
0.800 REF
[20.32]
0.113
[2.87]
0.175
[4.445]
0.029
0.016
[0.406]
[0.736]
0.065
[1.651]
0.029
[0.736]
0.016
[0.406]
0.030
[0.762]
0.020
[0.508]
MIN
Notes: (unless otherwise specified)
1. Dimensions are in inches [millimeters].
2. Tolerances are: .XXX ± 0.005 [0.127].
3. PLCC packages are intended for surface mounting on solder lands on 0.050 [1.27] centers.
www.semtech.com
Revision 5 / October 21, 2002
10
Edge649
TEST AND MEASUREMENT PRODUCTS
Recommended Operating Conditions
Parameter
Symbol
Min
Typ
Max
Units
Digital Power Supply
VDD
VCC
4.5
VDD + 2.0
-3
5
5.5
11
0
V
V
V
V
Analog Positive Power Supply
Analog Negative Power Supply
Total Analog Power Supply
Ambient Operating Temperature
VEE
VCC - VEE
7.0
11
TA
TJ
0
0
+70
+125
oC
oC
Absolute Maximum Ratings
Parameter
Symbol
VCC - VEE
VCC
Min
Typ
Max
13
Units
Total Analog Power Supply
Positive Analog Power Supply
Negative Analog Power Supply
Driver High Output Voltage
Driver Low Output Voltage
V
V
V
V
V
+5.0
-4.0
13
VEE
0.5
VHIGH
VLOW
VEE - .5
VEE - .5
VCC + .5
VCC + .5
Driver Output Swing
VHIGH - VLOW
THRESHOLD
-5
12
V
Receiver Threshold Voltage
Digital Inputs
VEE - .5
GND - .5
VCC + .5
VDD + .5
V
V
DATA IN
DVR EN*
Digital Power Supply
VDD
TA
0
6.5
V
Ambient Operating Temperature
Storage Temperature
-55
-65
+125
+150
+150
260
oC
oC
oC
oC
TS
Junction Temperature
Soldering Temperature
TJ
TSOL
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the
device. This is a stress rating only, and functional operation of the device at these, or any other conditions
beyond those listed, is not implied. Exposure to absolute maximum conditions for extended periods may
affect device reliability.
Revision 5 / October 21, 2002
11
www.semtech.com
Edge649
TEST AND MEASUREMENT PRODUCTS
DC Characteristics
Parameter
Symbol
Min
Typ
Max
Units
Driver/Receiver Characteristics
Driver High Voltage Level
V
HIGH
@
@
1 mA
125 mA
VEE + 3
VEE + 7
VCC
VCC
V
V
Driver Low Voltage Level
@ 1 mA
V
LOW
VEE
VEE
VCC – 3
VCC – 7
V
V
@ 125 mA
DC Driver Output Current (Note 1)
I
–125
+125
mA
OUT
Driver Output Impedance
R
OUT
Ω
Ω
@
@
1 mA
125 mA
40
17
8
DUT Pin Capacitance
DUT Output voltage
C
20
pF
V
OUT
DUT<0:7>
VEE
VCC
VCC – 3.5
1.0
Receiver Threshold Level
Threshold Bias Current
DUT Leakage Input Current
Receiver Offset Voltage
V
VEE + 0.1
V
THRESHOLD
I
0
µA
µA
mV
BIAS
I
.002
45
1.0
LEAK
VOS
–200
200
Quiescent Power Supply Current
Positive Power Supply
ICC
IEE
IDD
25
25
20
40
40
35
mA
mA
mA
Negative Power Supply
Digital Power Supply
Digital Inputs
DATA IN (0:7), DVR EN* (0:7)
Input High Voltage
Input Low Voltage
Input Current
VIH
2.0
V
V
MIN
VIL
0.8
1.0
MAX
I
µA
pF
IN
Input Capacitance
C
5
IN
Digital Outputs
DATA OUT (0:7)
Output Voltage High (Note 2)
Output Voltage Low (Note 3)
DC Output current
VOH
VOL
VDD – .4
–4
V
V
GND + .4
4
I
mA
OUT
Note 1 : Output current specification is per individual driver.
Note 2:
Note 3:
Output current of 4 mA.
Output current of –4 mA.
www.semtech.com
Revision 5 / October 21, 2002
12
Edge649
TEST AND MEASUREMENT PRODUCTS
AC Characteristics
Parameter
Symbol
Min
Typ
Max
Units
Propagation Delay
DATA IN <0:7> to DUT <0:7> (Note 2)
DUT <0:7> to DATA OUT <0:7> (Note 3)
Active to HiZ (Note 4)
T1
T2
T3
T4
12
8
17
12
20
15
25
20
33
27
38
33
ns
ns
ns
ns
HiZ to Active (Note 4)
DUT Output Rise/Fall Times (Note 1)
1V Swing (20% - 80%)
3.0
3.5
4.0
4.5
5.0
ns
ns
ns
ns
ns
3V Swing (10% - 90%)
5V Swing (10% - 90%)
8V Swing (10% - 90%)
10V Swing (10% - 90%)
Digital Outputs (DATA OUT <0:7>)
DATA OUT Rise Time (10% - 90%)
DATA OUT Fall Time (10% - 90%)
TR
TF
2
2
ns
ns
Minimum Pulse Width
Driver Output
20
10
ns
ns
Comparator Output
Maximum Operating Frequency
Fmax
50
MHz
AC Test Conditions: VCC = 8V, VEE = –3V, VDD = 5V.
Note 1: Into 18 inches of 50Ω transmission line terminated with 1KΩ and 5 pF with the proper series
termination resistor.
Note 2: Measured at 2.5V with a 10 mA load under the following conditions: VHIGH = +5.0V,
VLOW = 0V, VCC = +8V, VEE = -3V, and VDD = +5V.
Note 3: Measured at 2.5V with a 4 mA load.
Note 4: Load = 10 mA and measured when a 500 mV change at the output is detected.
T1
T2
DATA IN
DUT
DATA OUT
DVR EN*
DUT
HiZ
T3
T4
Revision 5 / October 21, 2002
13
www.semtech.com
Edge649
TEST AND MEASUREMENT PRODUCTS
Ordering Infor mation
Model Number
Package
E649APJ
68-Pin PLCC
EVM649APJ
Edge649 Evaluation Module
Contact Infor mation
Semtech Corporation
Test and Measurement Division
10021 Willow Creek Rd., San Diego, CA 92131
Phone: (858)695-1808 FAX (858)695-2633
www.semtech.com
Revision 5 / October 21, 2002
14
Edge649
TEST AND MEASUREMENT PRODUCTS
Revision History
Current Revision Date: October 21, 2002
Previous Revision Date: June 11, 2002
Page #
Section Name
Previous Revision
Current Revision
Para 1 rewritten.
Para 2 deleted.
6
Power Supplies
Power On & Off Sequencing added
Current Revision Date: June 11, 2002
Previous Revision Date: December 6, 2001
Page #
Section Name
Previous Revision
Current Revision
2
Pin Descriptions
VLOW
Change Pin #44 to Pin #47
E649BPJ
EVM649EVM
E649APJ
EVM649APJ
14
Ordering Information
Revision 5 / October 21, 2002
15
www.semtech.com
Edge649
TEST AND MEASUREMENT PRODUCTS
Revision History
Current Revision Date: December 6, 2001
Previous Revision Date: October 28, 1996
Page #
Section Name
Previous Revision
Current Revision
4
Circuit Description
Table 1
Update Threshold Ranges
11
Recommended
Delete:
Operating Conditions
Driver High Output Voltage
Driver Low Output Voltage
Total Driver Output Swing
Receiver Threshold Voltage
Analog Positive Power Supply, Min: VDD + 1.5 Analog Positive Power Supply, Min: VDD + 2.0
Total Analog Power Supply, Min: 6.5
Total Analog Power Supply, Min: 7.0
Add: Driver High Voltage
Driver Low Voltage
12
DC Characteristics
Driver Output Impedance
Delete: Driver Headroom
Delete: Output Voltage Swing
Driver High Voltage
Driver High Voltage Level
@
1 mA, Min: VEE
@
1 mA, Min: VEE + 3
@
125 mA, VEE + 6
@ 125 mA, VEE + 7
Driver Low Voltqge
Driver Low Voltqge Level
@
1 mA, Max: VCC
@
1 mA, Max: VCC – 3
@
125 mA, Max: VCC – 6
@
125 mA, Max: VCC – 7
Driver Output Impedance
Driver Output Impedance
@
@
1 mA, Max: TBD
125 mA, Max: 12
@
1 mA, Max: 40
125 mA, Max: 17
@
Receiver Threshold Level, Max: VCC – 1.5
Receiver Threshold Level, Max: VCC – 3.5
Receiver Offset Voltage, Min: –100, Typ: +25,
Max: 100
Receiver Offset Voltage, Min: –200, Typ: 45,
Max: 200
13
AC Characteristics
Add: AC Test Conditions
www.semtech.com
Revision 5 / October 21, 2002
16
相关型号：
©2020 ICPDF网 联系我们和版权申明