IRLR3815 [ETC]

TRANSISTOR | MOSFET | N-CHANNEL | 55V V(BR)DSS | 30A I(D) | TO-252AA ; 晶体管| MOSFET | N沟道| 55V V( BR ) DSS | 30A I( D) | TO- 252AA\n
IRLR3815
型号: IRLR3815
厂家: ETC    ETC
描述:

TRANSISTOR | MOSFET | N-CHANNEL | 55V V(BR)DSS | 30A I(D) | TO-252AA
晶体管| MOSFET | N沟道| 55V V( BR ) DSS | 30A I( D) | TO- 252AA\n

晶体 晶体管
文件: 总11页 (文件大小:174K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD - 94527  
IRLR3815  
AUTOMOTIVE MOSFET  
IRLU3815  
HEXFET® Power MOSFET  
Features  
Advanced Process Technology  
Ultra Low On-Resistance  
175°C Operating Temperature  
Fast Switching  
D
VDSS = 55V  
Repetitive Avalanche Allowed up to Tjmax  
RDS(on) = 14mΩ  
G
Description  
ID = 30A  
Specifically designed for Automotive applications,  
this HEXFET® Power MOSFET utilizes the latest  
processing techniques to achieve extremely low  
on-resistance per silicon area. Additional features  
of this product are a 175°C junction operating  
temperature, fast switching speed and improved  
repetitive avalanche rating. These features com-  
bine to make this design an extremely efficient and  
reliable device for use in Automotive applications  
and a wide variety of other applications.  
S
D-Pak  
I-Pak  
IRLU3815  
IRLR3815  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
ID @ TC = 25°C  
IDM  
Continuous Drain Current, VGS @ 10V (Silicon limited)  
Continuous Drain Current, VGS @ 10V (See Fig.9)  
Continuous Drain Current, VGS @ 10V (Package limited)  
Pulsed Drain Current   
61  
43  
A
30  
240  
PD @TC = 25°C  
Power Dissipation  
120  
W
W/°C  
V
Linear Derating Factor  
0.77  
VGS  
Gate-to-Source Voltage  
± 16  
EAS  
Single Pulse Avalanche Energy‚  
Single Pulse Avalanche Energy Tested Value‡  
Avalanche Current  
200  
600  
mJ  
EAS (6 sigma)  
IAR  
See Fig.12a, 12b, 15, 16  
A
EAR  
TJ  
Repetitive Avalanche Energy†  
Operating Junction and  
mJ  
-55 to + 175  
TSTG  
Storage Temperature Range  
°C  
Soldering Temperature, for 10 seconds  
300 (1.6mm from case )  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
–––  
110  
Max.  
1.3  
Units  
RθJC  
RθJA  
RθJA  
Junction-to-Ambient (PCB mount)ˆ  
50  
°C/W  
Junction-to-Ambient–––  
HEXFET(R) is a registered trademark of International Rectifier.  
www.irf.com  
1
08/02/02  
IRLR/U3815  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
55 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.057 ––– V/°C Reference to 25°C, ID = 1mA  
RDS(on)  
Static Drain-to-Source On-Resistance  
–––  
–––  
1.0  
42  
12  
14  
14  
17  
VGS = 10V, ID = 30A „  
VGS = 5.0V, ID = 26A „  
VDS = 10V, ID = 250µA  
VDS = 25V, ID = 30A  
mΩ  
VGS(th)  
gfs  
IDSS  
Gate Threshold Voltage  
––– 3.0  
––– –––  
V
S
Forward Transconductance  
––– ––– 20  
––– ––– 250  
––– ––– 200  
––– ––– -200  
V
DS = 55V, VGS = 0V  
VDS = 55V, VGS = 0V, TJ = 125°C  
VGS = 16V  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
IGSS  
VGS = -16V  
ID = 30A  
Qg  
–––  
–––  
–––  
–––  
–––  
–––  
61  
9.0  
17  
92  
14  
25  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 44V  
VGS = 10V„  
7.4 –––  
51 –––  
83 –––  
VDD = 28V  
ns  
ID = 30A  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
RG = 8.5Ω  
VGS = 10V „  
––– 100 –––  
D
Between lead,  
nH 6mm (0.25in.)  
from package  
LD  
Internal Drain Inductance  
4.5  
7.5  
–––  
–––  
–––  
–––  
G
LS  
Internal Source Inductance  
and center of die contact  
S
Ciss  
Input Capacitance  
––– 1870 –––  
––– 390 –––  
VGS = 0V  
Coss  
Output Capacitance  
VDS = 25V  
Crss  
Reverse Transfer Capacitance  
Output Capacitance  
–––  
74 –––  
pF  
ƒ = 1.0MHz, See Fig. 5  
Coss  
––– 2380 –––  
––– 290 –––  
––– 540 –––  
VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz  
VGS = 0V, VDS = 44V, ƒ = 1.0MHz  
VGS = 0V, VDS = 0V to 44V  
Coss  
Output Capacitance  
Coss eff.  
Effective Output Capacitance ꢀ  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
D
IS  
MOSFET symbol  
––– –––  
––– –––  
61  
showing the  
A
G
ISM  
Pulsed Source Current  
(Body Diode)   
integral reverse  
240  
p-n junction diode.  
S
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
––– ––– 1.3  
––– 62 93  
––– 110 170  
V
TJ = 25°C, IS = 30A, VGS = 0V „  
ns  
TJ = 25°C, IF = 30A, VDD = 25xjkl V  
Qrr  
ton  
nC di/dt = 100A/µs „  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
2
www.irf.com  
IRLR/U3815  
10000  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
10V  
5.0V  
3.0V  
2.7V  
2.5V  
2.25V  
2.0V  
VGS  
15V  
10V  
5.0V  
3.0V  
2.7V  
2.5V  
2.25V  
2.0V  
TOP  
TOP  
BOTTOM  
BOTTOM  
1
2.0V  
2.0V  
0.1  
1
0.01  
0.001  
20µs PULSE WIDTH  
Tj = 175°C  
20µs PULSE WIDTH  
Tj = 25°C  
0.1  
0.1  
1
10  
100  
1000  
0.1  
1
10  
100  
1000  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1000.00  
100.00  
10.00  
1.00  
70  
60  
T
= 25°C  
J
T
= 175°C  
J
T
= 25°C  
J
50  
40  
30  
20  
10  
0
T
= 175°C  
J
V
= 25V  
DS  
20µs PULSE WIDTH  
0.10  
1.0  
3.0  
5.0  
7.0  
9.0  
11.0  
13.0  
15.0  
0
10  
20  
30  
40  
50  
60  
V
, Gate-to-Source Voltage (V)  
I ,Drain-to-Source Current (A)  
GS  
D
Fig 3. Typical Transfer Characteristics  
Fig 4. Typical Forward Transconductance  
vs. Drain Current  
www.irf.com  
3
IRLR/U3815  
12  
10  
8
100000  
I
=
30A  
V
= 0V,  
f = 1 MHZ  
D
GS  
V
V
V
= 44V  
= 27V  
= 11V  
DS  
DS  
DS  
C
= C + C , C SHORTED  
iss  
gs gd ds  
C
= C  
gd  
rss  
C
= C + C  
oss  
ds gd  
10000  
1000  
100  
C
C
iss  
6
oss  
4
C
rss  
2
10  
0
0
10  
20  
30  
40  
50  
60  
70  
1
10  
100  
Q
, Total Gate Charge (nC)  
G
V
, Drain-to-Source Voltage (V)  
DS  
Fig 6. Typical Gate Charge vs.  
Fig 5. Typical Capacitance vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000  
100  
10  
1000  
OPERATION IN THIS AREA  
LIMITED BY R (on)  
DS  
100  
10  
1
°
T = 175  
J
C
100µsec  
1msec  
°
T = 25  
J
C
1
Tc = 25°C  
Tj = 175°C  
Single Pulse  
10msec  
100  
V
= 0 V  
GS  
0.1  
0.0  
0.5  
1.0  
1.5  
2.0  
1
10  
1000  
V
,Source-to-Drain Voltage (V)  
SD  
V
, Drain-to-Source Voltage (V)  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
4
www.irf.com  
IRLR/U3815  
70  
60  
50  
40  
30  
20  
10  
0
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
61A  
=
I
D
LIMITED BY PACKAGE  
V
= 10V  
GS  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
°
25  
50  
75  
100  
125  
150  
175  
T , Junction Temperature  
(
C)  
°
, Case Temperature ( C)  
J
T
C
Fig 10. Normalized On-Resistance  
Fig 9. Maximum Drain Current vs.  
vs. Temperature  
Case Temperature  
10  
1
D = 0.50  
0.20  
0.10  
0.05  
P
DM  
0.1  
t
1
SINGLE PULSE  
0.02  
0.01  
t
(THERMAL RESPONSE)  
2
Notes:  
1. Duty factor D =  
t
/ t  
1
2
2. Peak T  
= P  
x
Z
+ T  
J
DM  
thJC  
C
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRLR/U3815  
500  
400  
300  
200  
100  
0
15V  
I
D
TOP  
12A  
21A  
30A  
DRIVER  
+
BOTTOM  
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
2
V0GVS  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
(BR)DSS  
t
p
25  
50  
75  
100  
125  
°
( C)  
150  
175  
Starting Tj, Junction Temperature  
I
AS  
Fig 12c. Maximum Avalanche Energy  
Fig 12b. Unclamped Inductive Waveforms  
vs. Drain Current  
Q
G
10 V  
Q
Q
GD  
GS  
2.0  
1.5  
1.0  
0.5  
V
G
Charge  
I
= 250µA  
D
Fig 13a. Basic Gate Charge Waveform  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
+
V
DS  
D.U.T.  
-
V
GS  
-75 -50 -25  
0
25 50 75 100 125 150 175 200  
3mA  
T , Temperature ( °C )  
J
I
I
D
G
Current Sampling Resistors  
Fig 14. Threshold Voltage vs. Temperature  
Fig 13b. Gate Charge Test Circuit  
6
www.irf.com  
IRLR/U3815  
1000  
100  
10  
Duty Cycle = Single Pulse  
Allowed avalanche Current vs  
avalanche pulsewidth, tav  
0.01  
assuming  
Tj = 25°C due to  
avalanche losses  
0.05  
0.10  
1
0.1  
1.0E-08  
1.0E-07  
1.0E-06  
1.0E-05  
1.0E-04  
1.0E-03  
1.0E-02  
1.0E-01  
tav (sec)  
Fig 15. Typical Avalanche Current vs.Pulsewidth  
Notes on Repetitive Avalanche Curves , Figures 15, 16:  
(For further info, see AN-1005 at www.irf.com)  
1. Avalanche failures assumption:  
Purely a thermal phenomenon and failure occurs at a  
temperature far in excess of Tjmax. This is validated for  
every part type.  
2. Safe operation in Avalanche is allowed as long asTjmax is  
not exceeded.  
3. Equation below based on circuit and waveforms shown in  
Figures 12a, 12b.  
220  
TOP  
BOTTOM 10% Duty Cycle  
= 30A  
Single Pulse  
200  
180  
160  
140  
120  
100  
80  
I
D
4. PD (ave) = Average power dissipation per single  
avalanche pulse.  
5. BV = Rated breakdown voltage (1.3 factor accounts for  
voltage increase during avalanche).  
6. Iav = Allowable avalanche current.  
60  
40  
7. T = Allowable rise in junction temperature, not to exceed  
Tjmax (assumed as 25°C in Figure 15, 16).  
tav = Average time in avalanche.  
20  
0
25  
50  
75  
100  
125  
150  
175  
D = Duty cycle in avalanche = tav ·f  
ZthJC(D, tav) = Transient thermal resistance, see figure 11)  
Starting T , Junction Temperature (°C)  
J
PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC  
Fig 16. Maximum Avalanche Energy  
Iav = 2DT/ [1.3·BV·Zth]  
EAS (AR) = PD (ave)·tav  
vs. Temperature  
www.irf.com  
7
IRLR/U3815  
Driver Gate Drive  
P.W.  
P.W.  
Period  
DꢀUꢀT  
Period  
D =  
+
*
=10V  
V
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
‚
-
Reverse  
Recovery  
Current  
Body Diode Forward  
„
Current  
-
+
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
VDD  
Re-Applied  
Voltage  
dv/dt controlled by RG  
Driver same type as D!U!T!  
ISD controlled by Duty Factor "D"  
D!U!T! - Device Under Test  
RG  
+
-
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel  
HEXFET® Power MOSFETs  
RD  
VDS  
VGS  
DꢀUꢀTꢀ  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 18a. Switching Time Test Circuit  
V
DS  
90%  
10%  
V
GS  
t
t
r
t
t
f
d(on)  
d(off)  
Fig 18b. Switching Time Waveforms  
8
www.irf.com  
IRLR/U3815  
D-Pak (TO-252AA) Package Outline  
Dimensions are shown in millimeters (inches)  
2.38 (.094)  
2.19 (.086)  
6.73 (.265)  
6.35 (.250)  
1.14 (.045)  
0.89 (.035)  
- A -  
1.27 (.050)  
5.46 (.215)  
0.58 (.023)  
0.46 (.018)  
0.88 (.035)  
5.21 (.205)  
4
6.45 (.245)  
5.68 (.224)  
6.22 (.245)  
5.97 (.235)  
10.42 (.410)  
9.40 (.370)  
1.02 (.040)  
1.64 (.025)  
LEAD ASSIGNMENTS  
1 - GATE  
1
2
3
2 - DRAIN  
0.51 (.020)  
MIN.  
- B -  
3 - SOURCE  
4 - DRAIN  
1.52 (.060)  
1.15 (.045)  
0.89 (.035)  
0.64 (.025)  
3X  
0.58 (.023)  
0.46 (.018)  
1.14 (.045)  
0.76 (.030)  
2X  
0.25 (.010)  
M A M B  
NOTES:  
2.28 (.090)  
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.  
2 CONTROLLING DIMENSION : INCH.  
4.57 (.180)  
3 CONFORMS TO JEDEC OUTLINE TO-252AA.  
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,  
SOLDER DIP MAX. +0.16 (.006).  
D-Pak (TO-252AA) Part Marking Information  
EXAM  
PLE:  
THIS I  
S AN IRFR120  
PAR  
T NUMBER  
W
ITH ASSEMBLY  
INTERNATIONAL  
LOT CO  
DE 1234  
ASSEMBLED  
DATE CODE  
RECTI  
FIER  
IRFU120  
916A  
34  
ON WW 16, 1999  
IN THE ASSEMBLY  
YEAR 9 =  
WEEK 16  
LINE A  
LOGO  
1999  
LINE "A"  
12  
ASSEMBLY  
LOT CODE  
www.irf.com  
9
IRLR/U3815  
I-Pak (TO-251AA) Package Outline  
Dimensions are shown in millimeters (inches)  
6.73 (.265)  
6.35 (.250)  
2.38 (.094)  
2.19 (.086)  
- A -  
0.58 (.023)  
0.46 (.018)  
1.27 (.050)  
5.46 (.215)  
0.88 (.035)  
5.21 (.205)  
LEAD ASSIGNMENTS  
1 - GATE  
4
2 - DRAIN  
6.45 (.245)  
5.68 (.224)  
3 - SOURCE  
4 - DRAIN  
6.22 (.245)  
5.97 (.235)  
1.52 (.060)  
1.15 (.045)  
1
2
3
- B -  
NOTES:  
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982.  
2 CONTROLLING DIMENSION : INCH.  
2.28 (.090)  
1.91 (.075)  
9.65 (.380)  
8.89 (.350)  
3 CONFORMS TO JEDEC OUTLINE TO-252AA.  
4 DIMENSIONS SHOWN ARE BEFORE SOLDER DIP,  
SOLDER DIP MAX. +0.16 (.006).  
1.14 (.045)  
0.76 (.030)  
1.14 (.045)  
0.89 (.035)  
3X  
0.89 (.035)  
0.64 (.025)  
3X  
0.25 (.010)  
M A M B  
0.58 (.023)  
0.46 (.018)  
2.28 (.090)  
2X  
I-Pak (TO-251AA) Part Marking Information  
10  
www.irf.com  
IRLR/U3815  
D-Pak (TO-252AA) Tape & Reel Information  
Dimensions are shown in millimeters (inches)  
TR  
TRL  
TRR  
16.3 ( .641 )  
15.7 ( .619 )  
16.3 ( .641 )  
15.7 ( .619 )  
12.1 ( .476 )  
11.9 ( .469 )  
8.1 ( .318 )  
7.9 ( .312 )  
FEED DIRECTION  
FEED DIRECTION  
NOTES :  
1. CONTROLLING DIMENSION : MILLIMETER.  
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).  
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
13 INCH  
16 mm  
NOTES :  
1. OUTLINE CONFORMS TO EIA-481.  
Notes:  
 Repetitive rating; pulse width limited by  
max. junction temperature. (See fig. 11).  
‚ Limited by TJmax, starting TJ = 25°C,  
Coss eff. is a fixed capacitance that gives the same charging time  
as Coss while VDS is rising from 0 to 80% VDSS  
.
† Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive  
avalanche performance.  
L = 0.45mH, RG = 25, IAS = 30A, VGS =10V.  
Part not recommended for use above this  
value.  
‡ This value determined from sample failure population. 100%  
tested to this value in production.  
ƒ ISD 30A, di/dt 280A/µs, VDD V(BR)DSS  
TJ 175°C.  
„ Pulse width 1.0ms; duty cycle 2%.  
,
ˆ When mounted on 1" square PCB ( FR-4 or G-10 Material ).  
For recommended footprint and soldering techniques refer to  
application note #AN-994.  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Automotive [Q101] market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information. 08/02  
www.irf.com  
11  

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INFINEON

IRLR3915TRR

Power Field-Effect Transistor, 30A I(D), 55V, 0.014ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252AA, PLASTIC, DPAK-3
INFINEON

IRLR3915TRRPBF

Power Field-Effect Transistor, 30A I(D), 55V, 0.014ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252AA, LEAD FREE, PLASTIC, DPAK-3
INFINEON

IRLR4343

DIGITAL AUDIO MOSFET
INFINEON

IRLR4343PBF

DIGITAL AUDIO MOSFET
INFINEON

IRLR4343PBF

Power Field-Effect Transistor, 26A I(D), 55V, 0.05ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252AA, LEAD FREE, DPAK-3
VISHAY

IRLR4343TR

Power Field-Effect Transistor, 26A I(D), 55V, 0.05ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252AA, DPAK-3
INFINEON