IS25LD020 [ETC]

512Kbit/1 Mbit / 2 Mbit Single Operating Voltage Serial Flash Memory With 100 MHz Dual-Output SPI Bus Interface;
IS25LD020
型号: IS25LD020
厂家: ETC    ETC
描述:

512Kbit/1 Mbit / 2 Mbit Single Operating Voltage Serial Flash Memory With 100 MHz Dual-Output SPI Bus Interface

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IS25CD512/010 & IS25LD020  
512Kbit/1 Mbit / 2 Mbit Single Operating Voltage Serial Flash Memory  
With 100 MHz Dual-Output SPI Bus Interface  
FEATURES  
• Low Power Consumption  
• Single Power Supply Operation  
- Low voltage range: 2.70 V 3.60 V (512Kbit / 1Mbit)  
2.30 V 3.60 V (2Mbit)  
- Typical 10 mA active read current  
- Typical 15 mA program/erase current  
• Hardware Write Protection  
• Memory Organization  
- Protect and unprotect the device from write operation by  
Write Protect (WP#) Pin  
- IS25CD512: 64K x 8 (512 Kbit)  
- IS25CD010: 128K x 8 (1 Mbit)  
- IS25LD020: 256K x 8 (2 Mbit)  
Software Write Protection  
- The Block Protect (BP2, BP1, BP0) bits allow partial or  
entire memory to be configured as read-only  
• Cost Effective Sector/Block Architecture  
- 512Kb : Uniform 4KByte sectors / Two uniform 32KByte  
blocks  
• High Product Endurance  
- 1Mb : Uniform 4KByte sectors / Four uniform 32KByte  
- Guaranteed 200,000 program/erase cycles per single  
sector  
blocks  
- 2Mb : Uniform 4KByte sectors / Four uniform 64KByte  
blocks  
- Minimum 20 years data retention  
• Industrial Standard Pin-out and Package  
- 8-pin SOIC 150mil  
Low standby current 1uA (Typ)  
• Serial Peripheral Interface (SPI) Compatible  
- Supports single- or dual-output  
- Supports SPI Modes 0 and 3  
- 8-pin VVSOP 150mil (2Mb)  
- 8-pin USON (2x3 mm) (512Kb)  
- 8-pin WSON (5x6 mm)  
- Maximum 33 MHz clock rate for normal read  
- Maximum 100 MHz clock rate for fast read  
- 8-pin TSSOP  
- KGD (Call Factory)  
- Lead-free (Pb-free) package  
- Automotive Temperature Ranges Available  
Page Program (up to 256 Bytes) Operation  
- Typical 2 ms per page program  
Security function  
• Sector, Block or Chip Erase Operation  
- Maximum 10 ms sector, block or chip erase  
- Built in Safe Guard function and sector unlock function  
to make the flash Robust (Appendix1&2)  
GENERAL DESCRIPTION  
The IS25CD512/010 and IS25LD020 are 512Kbit/ 1Mbit / 2Mbit Serial Peripheral Interface (SPI) Flash memories, providing  
single- or dual-output. The devices are designed to support a 33 MHz clock rate in normal read mode, and 100 MHz in fast  
read, the fastest in the industry. The devices use a single low voltage power supply, wide operating voltage ranging to  
perform read, erase and program operations. The devices can be programmed in standard EPROM programmers.  
The IS25CD512/010 and IS25LD020 are accessed through a 4-wire SPI Interface consisting of Serial Data Input/Output  
(SlO), Serial Data Output (SO), Serial Clock (SCK), and Chip Enable (CE#) pins. They comply with all recognized command  
codes and operations. The dual-output fast read operation provides and effective serial data rate of 200MHz.  
The devices support page program mode, where 1 to 256 bytes data can be programmed into the memory in one program  
operation. These devices are divided into uniform 4 KByte sectors or uniform 32 KByte blocks.(IS25LD020 is uniform 4  
KByte sectors or uniform 64 KByte).  
The IS25CD512/010 and IS25LD020 are manufactured on pFLASH™’s advanced non-volatile technology. The devices are  
offered in a variety of packages for all critical needs. The devices operate at wide temperatures between -40°C to +105°C.  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
1
08/12/2013  
IS25CD512/010 & IS25LD020  
CONNECTION DIAGRAMS  
CE#  
SO  
1
2
8
7
Vcc  
8 Vcc  
CE#  
SO  
1
2
7
HOLD#  
6 SCK  
SIO  
HOLD#  
3
4
WP#  
GND  
WP#  
GND  
3
4
6
5
SCK  
SIO  
5
8-pin WSON  
8-Pin SOIC/VVSOP  
CE#  
Vcc  
1
2
3
4
8
7
6
5
Vcc  
CE#  
SO  
HOLD#  
HOLD#  
SCK  
SO  
WP#  
GND  
WP#  
GND  
SCK  
SIO  
8-Pin TSSOP  
SIO  
8-Pin USON  
PIN DESCRIPTIONS  
SYMBOL TYPE  
DESCRIPTION  
Chip Enable: CE# low activates the devices internal circuitries for  
CE#  
INPUT  
device operation. CE# high deselects the devices and switches into  
standby mode to reduce the power consumption. When a device is not  
selected, data will not be accepted via the serial input pin (SlO), and the  
serial output pin (SO) will remain in a high impedance state.  
Serial Data Clock  
SCK  
SIO  
SO  
INPUT  
INPUT/OUTPUT Serial Data Input/Output  
OUTPUT  
Serial Data Output  
GND  
Vcc  
Ground  
Device Power Supply  
WP#  
INPUT  
Write Protect: A hardware program/erase protection for all or part of a  
memory array. When the WP# pin is low, memory array write-protection depends on the  
setting of BP2, BP1 and BP0 bits in the Status Register. When the WP# is high, the devices  
are not write-protected.  
HOLD#  
INPUT  
Hold: Pause serial communication by the master device without resetting  
the serial sequence.  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
2
08/12/2013  
IS25CD512/010 & IS25LD020  
BLOCK DIAGRAM  
SIO  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
3
08/12/2013  
IS25CD512/010 & IS25LD020  
SPI MODES DESCRIPTION  
Multiple IS25CD512/010 and IS25LD020 devices can be  
connected on the SPI serial bus and controlled by a SPI  
Master, i.e. microcontroller, as shown in Figure 1. The  
devices support either of two SPI modes:  
Mode 0 (0, 0)  
The difference between these two modes is the clock polarity  
when the SPI master is in Stand-by mode: the serial clock  
remains at “0” (SCK = 0) for Mode 0 and the clock remains at  
“1” (SCK = 1) for Mode 3. Please refer to Figure 2. For both  
modes, the input data is latched on the rising edge of Serial  
Clock (SCK), and the output data is available from the falling  
edge of SCK.  
Mode 3 (1, 1)  
Figure 1. Connection Diagram among SPI Master and SPI Slaves (Memory Devices)  
SDIO  
SPI Interface with  
(0,0) or (1,1)  
SDI  
SCK  
SCK  
CE#  
SO SIO  
SCK  
SO  
SCK  
CE#  
SIO  
SO SIO  
SPI Master  
(i.e. Microcontroller)  
SPI Memory  
Device  
SPI Memory  
Device  
SPI Memory  
Device  
CS3  
CS2  
CS1  
WP#  
CE# WP#  
WP#  
HOLD#  
HOLD#  
HOLD#  
Note: 1. The Write Protect (WP#) and Hold (HOLD#) signals should be driven high or low as  
Figure 2. SPI Modes Supported  
SCK  
Mode 0 (0, 0)  
SCK  
Mode 3 (1, 1)  
SIO  
Input mode  
MSb  
SO  
MSb  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
4
08/12/2013  
IS25CD512/010 & IS25LD020  
SYSTEM CONFIGURATION  
The IS25CD512/010 and IS25LD020 devices are designed to interface directly with the synchronous Serial Peripheral  
Interface (SPI) of the Motorola MC68HCxx series of microcontrollers or any SPI interface-equipped system controllers. The  
devices have two superset features that can be enabled through specific software instructions and the Configuration  
Register:  
Block Size  
(Kbytes)  
Sector Size  
(Kbytes)  
Memory Density  
Block No.  
Sector No.  
Address Range  
Sector 0(1)  
000000h - 000FFFh  
001000h - 001FFFh  
:
4
4
:
Sector 1  
Block 0  
32  
32  
:
Sector 7  
007000h - 007FFFh  
008000h - 008FFFh  
009000h - 009FFFh  
000000h - 006FFFh  
00F000h - 00FFFFh  
010000h - 017FFFh  
018000h - 01FFFFh  
4
4
4
:
512 Kbit  
1 Mbit  
Sector 8  
Sector 9  
Block 1  
:
Sector 15  
4
"
"
Block 2  
Block 3  
32  
32  
"
"
Block  
Size  
Sector  
Size  
Memory Density  
Block No.  
Sector No.  
Address Range  
(KBytes)  
(KBytes)  
Sector 0  
4
4
:
000000h - 000FFFh  
001000h - 001FFFh  
:
Sector 1  
Block 0  
64  
64  
:
Sector 15  
4
4
4
:
00F000h - 00FFFFh  
010000h - 010FFFh  
011000h - 011FFFh  
:
Sector 16  
2 Mbit  
Sector 17  
Block 1  
:
Sector 31  
4
:
01F000h - 01FFFFh  
:
:
:
:
:
Block 3  
64  
4
030000h 03FFFFh  
Table 1-1. Block/Sector Addresses of IS25CD512/010 and IS25LD020  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
5
08/12/2013  
IS25CD512/010 & IS25LD020  
REGISTERS (CONTINUED)  
STATUS REGISTER  
Refer to Tables 5 and 6 for Status Register Format and  
Status Register Bit Definitions.  
a Write Enable (WREN) instruction. Each write register,  
program and erase instruction must be preceded by a WREN  
instruction. The WEL bit can be reset by a Write Disable  
(WRDI) instruction. It will automatically be the reset after the  
completion of a write instruction.  
The BP0, BP1, BP2, and SRWD are volatile memory cells  
that can be written by a Write Status Register (WRSR)  
instruction. The default value of the BP2, BP1, BP0 were set  
to “0and SRWD bits was set to “0at factory. Once a “0” or BP2, BP1, BP0 bits: The Block Protection (BP2, BP1, BP0)  
“1”is written, it will not be changed by device power-up or  
power-down, and can only be altered by the next WRSR  
instruction. The Status Register can be read by the Read  
Status Register (RDSR). Refer to Table 10 for Instruction  
Set.  
bits are used to define the portion of the memory area to be  
protected. Refer to Tables 7, 8 and 9 for the Block Write  
Protection bit settings. When a defined combination of BP2,  
BP1 and BP0 bits are set, the corresponding memory area is  
protected. Any program or erase operation to that area will  
be inhibited. Note: a Chip Erase (CHIP_ER) instruction is  
The function of Status Register bits are described as follows: executed successfully only if all the Block Protection Bits are  
set as “0”s.  
WIP bit: The Write In Progress (WIP) bit is read-only, and  
can be used to detect the progress or completion of a  
program or erase operation. When the WIP bit is “0”, the  
device is ready for a write status register, program or erase  
operation. When the WIP bit is “1”, the device is busy.  
SRWD bit: The Status Register Write Disable (SRWD) bit  
operates in conjunction with the Write Protection (WP#)  
signal to provide a Hardware Protection Mode. When the  
SRWD is set to “0”, the Status Register is not write-protected.  
When the SRWD is set to “1” and the WP# is pulled low  
(VIL), the volatile bits of Status Register (SRWD, BP2, BP1,  
WEL bit: The Write Enable Latch (WEL) bit indicates the  
status of the internal write enable latch. When the WEL is “0”, BP0) become read-only, and a WRSR instruction will be  
the write enable latch is disabled, and all write operations,  
including write status register, page program, sector erase,  
ignored. If the SRWD is set to “1” and WP# is pulled high  
(VIH), the Status Register can be changed by a WRSR  
block and chip erase operations are inhibited. When the WEL instruction.  
bit is “1”, write operations are allowed. The WEL bit is set by  
Table 5. Status Register Format  
Bit 7  
SRWD1  
0
Bit 6  
Bit 5  
Bit 4  
BP2  
0
Bit 3  
BP1  
0
Bit 2  
BP0  
0
Bit 1  
WEL  
0
Bit 0  
WIP  
0
Reserved  
Default (flash bit)  
0
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
6
08/12/2013  
IS25CD512/010 & IS25LD020  
REGISTERS (CONTINUED)  
Table 6. Status Register Bit Definition  
Read- Non-Volatile  
Bit  
Name  
Definition  
/Write  
bit  
Write In Progress Bit:  
Bit 0  
WIP  
"0" indicates the device is ready  
R
No  
"1" indicates a write cycle is in progress and the device is busy  
Write Enable Latch:  
Bit 1  
WEL  
"0" indicates the device is not write enabled  
"1" indicates the device is write enabled (default)  
Block Protection Bit: (See Table 7 and Table 8 for details)  
"0" indicates the specific blocks are not write-protected (default)  
"1" indicates the specific blocks are write-protected  
Reserved: Always "0"s  
R/W  
No  
Bit 2  
Bit 3  
Bit 4  
BP0  
BP1  
BP2  
N/A  
R/W  
N/A  
Yes  
Bits 5 - 6  
Status Register Write Disable: (See Table 9 for details)  
Bit 7  
SRWD "0" indicates the Status Register is not write-protected (default)  
"1" indicates the Status Register is write-protected  
R/W  
Yes  
Table 8. Block Write Protect Bits for IS25CD512/010 and IS25LD020  
Status Register Bits Protected Memory Area  
BP1  
0
BP0  
0
IS25CD512  
None  
IS25CD010  
IS25LD020  
None  
None  
0
1
None  
Upper quarter (Block 3)  
01800h-01FFFFh  
Upper quarter (Block 3)  
03000h-03FFFFh  
1
1
0
1
None  
Upper half (Block 2 & 3)  
010000h-01FFFFh  
Upper half (Block 2 & 3)  
020000h-03FFFFh  
All Blocks  
All Blocks  
All Blocks  
000000h-00FFFFh  
000000h-01FFFFh  
000000h-03FFFFh  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
7
08/12/2013  
IS25CD512/010 & IS25LD020  
REGISTERS (CONTINUED)  
PROTECTION MODE  
The IS25CD512/010 and IS25LD020 have two types of write- Table 9. Hardware Write Protection on Status  
protection mechanisms: hardware and software. These are Register  
used to prevent irrelevant operation in a possibly noisy  
environment and protect the data integrity.  
SRWD  
WP#  
Low  
Low  
High  
High  
Status Register  
Writable  
0
1
0
1
HARDWARE WRITE-PROTECTION  
Protected  
Writable  
The devices provide two hardware write-protection  
features:  
Writable  
a. When inputting a program, erase or write status register  
instruction, the number of clock pulse is checked to  
determine whether it is a multiple of eight before the  
executing. Any incomplete instruction command sequence  
will be ignored.  
b. The Write Protection (WP#) pin provides a hardware write  
protection method for BP2, BP1, BP0 and SRWD in the  
Status Register. Refer to the STATUS REGISTER  
description.  
c. All write sequences will be ignored when Vcc drop to VWI  
(see p.26)  
SOFTWARE WRITE PROTECTION  
The IS25CD512/010 and IS25LD020 also provides two  
software write protection features:  
a. Before the execution of any program, erase or write status  
register instruction, the Write Enable Latch (WEL) bit must be  
enabled by executing a Write Enable (WREN) instruction. If  
the WEL bit is not enabled first, the program, erase or write  
register instruction will be ignored.  
b. The Block Protection (BP2, BP1, BP0) bits allow part or  
the whole memory area to be write-protected.  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
8
08/12/2013  
IS25CD512/010 & IS25LD020  
DEVICE OPERATION  
The IS25CD512/010 and IS25LD020 utilize an 8-bit  
instruction register. Refer to Table 10 Instruction Set for  
details of the Instructions and Instruction Codes. All  
followed by address bytes, data bytes, or both address bytes  
and data bytes, depending on the type of instruction. CE#  
must be driven high (VIH) after the last bit of the instruction  
instructions, addresses, and data are shifted in with the most sequence has been shifted in.  
significant bit (MSB) first on Serial Data Input (SI). The input  
data on SI is latched on the rising edge of Serial Clock (SCK) The timing for each instruction is illustrated in the following  
after Chip Enable (CE#) is driven low (VIL). Every instruction operational descriptions.  
sequence starts with a one-byte instruction code and is  
Table 10. Instruction Set  
Instruction Name  
Hex Code Operation  
Command Maximum  
Cycle  
4 Bytes  
1 Byte  
Frequency  
100 MHz  
100 MHz  
RDID  
JEDEC ID READ  
ABh  
9Fh  
Read Manufacturer and Product ID  
Read Manufacturer and Product ID by JEDEC ID  
Command  
RDMDID  
WREN  
WRDI  
RDSR  
WRSR  
READ  
FAST_READ  
FRDO  
90h  
06h  
04h  
05h  
01h  
03h  
0Bh  
3Bh  
02h  
Read Manufacturer and Device ID  
Write Enable  
Write Disable  
Read Status Register  
Write Status Register  
Read Data Bytes from Memory at Normal Read Mode  
Read Data Bytes from Memory at Fast Read Mode  
Fast Read Dual Output  
4 Bytes  
1 Byte  
1 Byte  
100 MHz  
100 MHz  
100 MHz  
100 MHz  
100 MHz  
33 MHz  
100 MHz  
100 MHz  
100 MHz  
1 Byte  
2 Bytes  
4 Bytes  
5 Bytes  
5 Bytes  
4 Bytes +  
256B  
PAGE_ PROG  
Page Program Data Bytes Into Memory  
SECTOR_ER  
BLOCK_ER  
CHIP_ER  
D7h/20h  
D8h  
C7h/60h  
Sector Erase  
Block Erase  
Chip Erase  
4 Bytes  
4 Bytes  
1 Byte  
100 MHz  
100 MHz  
100 MHz  
HOLD OPERATION  
HOLD# is used in conjunction with CE# to select the  
IS25CD512/010 and IS25LD020. When the devices are  
selected and a serial sequence is underway, HOLD# can  
be used to pause the serial communication with the  
master device without resetting the serial sequence. To  
pause, HOLD# is brought low while the SCK signal is low.  
To resume serial communication, HOLD# is brought high  
while the SCK signal is low (SCK may still toggle during  
HOLD). Inputs to SlO will be ignored while SO is in the  
high impedance state.  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
9
08/12/2013  
IS25CD512/010 & IS25LD020  
DEVICE OPERATION (CONTINUED)  
RDID COMMAND (READ PRODUCT IDENTIFICATION)  
OPERATION  
The Read Product Identification (RDID) instruction is for  
reading out the old style of 8-bit Electronic Signature, whose Table 11. Product Identification  
values are shown as table of ID Definitions. This is not same  
as RDID or JEDEC ID instruction. It’s not recommended to  
use for new design. For new design, please use RDID or  
JEDEC ID instruction.  
Product Identification  
Data  
First Byte  
9Dh  
7Fh  
Manufacturer ID  
The RDES instruction code is followed by three dummy  
bytes, each bit being latched-in on SI during the rising  
edge of SCK. Then the Device ID is shifted out on SO  
with the MSB first, each bit been shifted out during the  
falling edge of SCK. The RDES instruction is ended by  
CE# goes high. The Device ID outputs repeatedly if  
continuously send the additional clock cycles on SCK while  
CE# is at low.  
Second Byte  
Device ID 1  
05h  
Device ID:  
IS25CD512  
IS25CD010  
IS25LD020  
Device ID 2  
20h  
10h  
21h  
11h  
22h  
Figure 3. Read Product Identification Sequence  
CE#  
7
9
46  
0
1
8
38 39  
47  
54  
31  
SCK  
SI  
INSTRUCTION  
1010 1011b  
3 Dummy Bytes  
HIGH IMPEDANCE  
SO  
Device ID1  
Device ID1  
Device ID1  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
10  
08/12/2013  
IS25CD512/010 & IS25LD020  
DEVICE OPERATION (CONTINUED)  
JEDEC ID READ COMMAND (READ PRODUCT IDENTIFICATION BY JEDEC ID)  
OPERATION  
The JEDEC ID READ instruction allows the user to read the  
manufacturer and product ID of devices. Refer to Table 11  
followed by the first Manufacturer ID (9Dh) and the Device ID  
(22h, in the case of the IS25LD020), each bit shifted out  
Product Identification for pFlash Manufacturer ID and Device during the falling edge of SCK. If CE# stays low after the last  
ID. After the JEDEC ID READ command is input, the second bit of the Device ID is shifted out, the Manufacturer ID and  
Manufacturer ID (7Fh) is shifted out on SO with the MSB first, Device ID will loop until CE# is pulled high.  
Figure 4. Read Product Identification by JEDEC ID READ Sequence  
CE#  
0
7
8
15 16  
23 24  
31  
SCK  
SI  
INSTRUCTION  
1001 1111b  
HIGH IMPEDANCE  
SO  
Manufacture ID2  
Manufacture ID1  
Device ID2  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
11  
08/12/2013  
IS25CD512/010 & IS25LD020  
DEVICE OPERATION (CONTINUED)  
RDMDID COMMAND (READ DEVICE MANUFACTURER AND DEVICE ID)  
OPERATION  
The RDMDID instruction allows the user to read the  
manufacturer and product ID of devices. Refer to Table 11  
the IS25LD020), and is shifted out on SO with the MSB first,  
each bit shifted out during the falling edge of SCK. If CE#  
Product Identification for pFlash Manufacturer ID and Device stays low after the last bit of the Device ID is shifted out, the  
ID. The RDMDID command is input, followed by a 24-bit  
address pointing to an ID table. The table contains the first  
Manufacturer ID (9Dh) and the Device ID (22h, in the case of  
Manufacturer ID and Device ID will loop until CE# is pulled  
high.  
Figure 5. Read Product Identification by RDMDID READ Sequence  
CE#  
9
0
2
3
4
5
8
31  
A0  
1
6
7
10 11 28  
29 30  
SCK  
SIO  
...  
3 - BYTE ADDRESS  
2
1
INSTRUCTION = 1001 0000b  
HIGH IMPEDANCE  
23  
3
...  
22  
21  
SO  
CE#  
33 34 35 36 37 38 39 40 41 42 43 44 45 46 47  
32  
SCK  
SIO  
Manufacturer ID1  
Device ID1  
5
SO  
0
2
1
6
7
3
3
4
4
7
6
5
2
1
0
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Rev. C  
12  
08/12/2013  
IS25CD512/010 & IS25LD020  
CE#  
48  
50 51 52 53  
56  
49  
54 55  
SCK  
SIO  
Manufacturer ID2  
SO  
3
4
7
6
5
2
1
0
Note :  
(1) ADDRESS A0 = 0, will output the 1st manufacture ID (9Dh) first -> device ID1 -> 2nd manufacture ID (7Fh)  
ADDRESS A0 = 1, will output the device ID1 -> 1st manufacture ID (9D) -> 2nd manufacture ID (7Fh)  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
13  
08/12/2013  
IS25CD512/010 & IS25LD020  
DEVICE OPERATION (CONTINUED)  
WRITE ENABLE OPERATION  
The Write Enable (WREN) instruction is used to set the Write erase, chip erase, page program and write status register  
Enable Latch (WEL) bit. The WEL bit of the  
operations. The WEL bit will be reset to the write-protect  
state automatically upon completion of a write operation. The  
WREN instruction is required before any above operation is  
executed.  
IS25CD512/010 and IS25LD020 is reset to the write –  
protected state after power-up. The WEL bit must be write  
enabled before any write operation, including sector, block  
Figure 6. Write Enable Sequence  
SIO  
WRDI COMMAND (WRITE DISABLE) OPERATION  
The Write Disable (WRDI) instruction resets the WEL bit and required after the execution of a write instruction, since the  
disables all write instructions. The WRDI instruction is not  
WEL bit is automatically reset.  
Figure 7. Write Disable Sequence  
SIO  
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Rev. C  
14  
08/12/2013  
IS25CD512/010 & IS25LD020  
DEVICE OPERATION (CONTINUED)  
RDSR COMMAND (READ STATUS REGISTER) OPERATION  
The Read Status Register (RDSR) instruction provides  
access to the Status Register. During the execution of a  
program, erase or write status register operation, all other  
instructions will be ignored except the RDSR instruction,  
which can be used to check the progress or completion of an  
operation by reading the WIP bit of Status Register.  
Figure 8. Read Status Register Sequence  
SIO  
WRSR COMMAND (WRITE STATUS REGISTER) OPERATION  
The Write Status Register (WRSR) instruction allows  
the user to enable or disable the block protection and status  
register write protection features by writing “0”s or “1” s into  
the volatile BP2, BP1, BP0 and SRWD bits.  
Figure 9. Write Status Register Sequence  
SIO  
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DEVICE OPERATION (CONTINUED)  
READ COMMAND (READ DATA) OPERATION  
The Read Data (READ) instruction is used to read memory  
data of a IS25CD512/010 and IS25LD020 under normal  
mode running up to 33 MHz.  
The first byte data (D7 - D0) addressed is then shifted out on  
the SO line, MSb first. A single byte of data, or up to the  
whole memory array, can be read out in one READ  
The READ instruction code is transmitted via the SlO line,  
followed by three address bytes (A23 - A0) of the first  
memory location to be read. A total of 24 address bits are  
shifted in, but only AMS (most significant address) - A0 are  
decoded. The remaining bits (A23 AMS) are ignored. The  
first byte addressed can be at any memory location. Upon  
instruction. The address is automatically incremented after  
each byte of data is shifted out. The read operation can be  
terminated at any time by driving CE# high (VIH) after the  
data comes out. When the highest address of the devices is  
reached, the address counter will roll over to the 000000h  
address, allowing the entire memory to be read in one  
completion, any data on the Sl will be ignored. Refer to Table continuous READ instruction.  
12 for the related Address Key.  
Table 12. Address Key  
Address  
AN (AMS A0)  
Don't Care Bits  
IS25LD020  
A17 - A0  
IS25CD010  
A16 - A0  
IS25CD512  
A15 - A0  
A23 A18  
A23 A17  
A23 A16  
Figure 12. Read Data Sequence  
SIO  
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DEVICE OPERATION (CONTINUED)  
FAST_READ COMMAND (FAST READ DATA) OPERATION  
The FAST_READ instruction is used to read memory data at  
up to a 100 MHz clock.  
The first byte addressed can be at any memory location. The  
address is automatically incremented after each byte of data  
is shifted out. When the highest address is reached, the  
address counter will roll over to the 000000h address,  
The FAST_READ instruction code is followed by three  
address bytes (A23 - A0) and a dummy byte (8 clocks),  
transmitted via the SI line, with each bit latched-in during the allowing the entire memory to be read with a single  
rising edge of SCK. Then the first data byte addressed is  
shifted out on the SO line, with each bit shifted out at a  
maximum frequency fCT, during the falling edge of SCK.  
FAST_READ instruction. The FAST_READ instruction is  
terminated by driving CE# high (VIH).  
Figure 13. Fast Read Data Sequence  
SIO  
SIO  
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DEVICE OPERATION (CONTINUED)  
FRDO COMMAND (FAST READ DUAL OUTPUT) OPERATION  
The FRDO instruction is used to read memory data on two  
output pins each at up to a 100 MHz clock.  
The first bit (MSb) is output on SO, while simultaneously the  
second bit is output on SIO.  
The FRDO instruction code is followed by three address  
bytes (A23 - A0) and a dummy byte (8 clocks), transmitted  
The first byte addressed can be at any memory location. The  
address is automatically incremented after each byte of data  
via the SI line, with each bit latched-in during the rising edge is shifted out. When the highest address is reached, the  
of SCK. Then the first data byte addressed is shifted out on  
the SO and SIO lines, with each pair of bits shifted out at a  
maximum frequency fCT, during the falling edge of SCK.  
address counter will roll over to the 000000h address,  
allowing the entire memory to be read with a single FRDO  
instruction. FRDO instruction is terminated by driving CE#  
high (VIH).  
Figure 14. Fast Read Dual-Output Sequence  
CE#  
9
0
2
3
4
5
8
31  
1
6
7
10 11 28  
29 30  
SCK  
SIO  
...  
3 - BYTE ADDRESS  
2
1
INSTRUCTION = 0011 1011b  
HIGH IMPEDANCE  
23  
3
0
...  
22  
21  
SO  
CE#  
33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48  
32  
SCK  
SIO  
2
2
0
1
6
7
6
6
7
4
4
0
1
DATA OUT 1  
DATA OUT 2  
HIGH IMPEDANCE  
SO  
5
3
5
3
7
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DEVICE OPERATION (CONTINUED)  
PAGE_PROG COMMAND (PAGE PROGRAM) OPERATION  
The Page Program (PAGE_PROG) instruction allows up to  
256 bytes data to be programmed into memory in a single  
Register via a RDSR instruction. If the WIP bit is “1”, the  
program operation is still in progress. If WIP bit is “0”, the  
operation. The destination of the memory to be programmed program operation has completed.  
must be outside the protected memory area set by the Block  
Protection (BP2, BP1, BP0) bits. A PAGE_PROG instruction If more than 256 bytes data are sent to a device, the address  
which attempts to program into a page that is write-protected counter rolls over within the same page, the previously  
will be ignored. Before the execution of PAGE_PROG  
instruction, the Write Enable Latch (WEL) must be enabled  
through a Write Enable (WREN) instruction.  
latched data are discarded, and the last 256 bytes data are  
kept to be programmed into the page. The starting byte can  
be anywhere within the page. When the end of the page is  
reached, the address will wrap around to the beginning of the  
The PAGE_PROG instruction code, three address bytes and same page. If the data to be programmed are less than a full  
program data (1 to 256 bytes) are input via the SlO line.  
Program operation will start immediately after the CE# is  
brought high, otherwise the PAGE_PROG instruction will not  
page, the data of all other bytes on the same page will  
remain unchanged.  
be executed. The internal control logic automatically handles Note: A program operation can alter “1”s into “0”s, but an  
the programming voltages and timing. During a program  
operation, all instructions will be ignored except the RDSR  
instruction. The progress or completion of the program  
operation can be determined by reading the WIP bit in Status  
erase operation is required to change “0”s back to “1”s. A  
byte cannot be reprogrammed without first erasing the whole  
sector or block.  
Figure 15. Page Program Sequence  
SIO  
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DEVICE OPERATION (CONTINUED)  
ERASE OPERATION  
progress or completion of the erase operation can be  
determined by reading the WIP bit in the Status Register  
using a RDSR instruction. If the WIP bit is “1”, the erase  
The memory array of the IS25CD512/010 is organized into  
uniform 4 KByte sectors or 32 KByte uniform blocks (a block operation is still in progress. If the WIP bit is “0”, the erase  
consists of eight adjacent sectors). IS25LD020 is organized  
into uniform 4 KByte sectors or 64 KByte uniform blocks (a  
block consists of sixteen adjacent sectors)  
operation has been completed.  
BLOCK_ER COMMAND (BLOCK ERASE) OPERATION  
Before a byte can be reprogrammed, the sector or block that A Block Erase (BLOCK_ER) instruction erases a 64 KByte  
contains the byte must be erased (erasing sets bits to “1”). In block of the IS25LD020, and 32 KByte block of the  
order to erase the devices, there are three erase instructions IS25CD512C/010C. Before the execution of a BLOCK_ER  
available: Sector Erase (SECTOR_ER), Block Erase  
(BLOCK_ER) and Chip Erase (CHIP_ER). A sector erase  
operation allows any individual sector to be erased without  
affecting the data in other sectors. A block erase operation  
erases any individual block. A chip erase operation erases  
the whole memory array of a device. A sector erase, block  
erase or chip erase operation can be executed prior to any  
programming operation.  
instruction, the Write Enable Latch (WEL) must be set via a  
Write Enable (WREN) instruction. The WEL is reset  
automatically after the completion of a block erase operation.  
The BLOCK_ER instruction code and three address bytes  
are input via SI. Erase operation will start immediately after  
the CE# is pulled high, otherwise the BLOCK_ER instruction  
will not be executed. The internal control logic automatically  
handles the erase voltage and timing. Refer to Figure 15 for  
SECTOR_ER COMMAND (SECTOR ERASE) OPERATION Block Erase Sequence.  
A SECTOR_ER instruction erases a 4 KByte sector Before  
the execution of a SECTOR_ER instruction, the Write Enable  
Latch (WEL) must be set via a Write Enable (WREN)  
instruction. The WEL bit is reset automatically after the  
completion of sector an erase operation.  
CHIP_ER COMMAND (CHIP ERASE) OPERATION  
A Chip Erase (CHIP_ER) instruction erases the entire  
memory array of a IS25CD512/010 and IS25LD020. Before  
the execution of CHIP_ER instruction, the Write Enable Latch  
(WEL) must be set via a Write Enable (WREN) instruction.  
A SECTOR_ER instruction is entered, after CE# is pulled low The WEL is reset automatically after completion of a chip  
to select the device and stays low during the entire  
instruction sequence The SECTOR_ER instruction code, and  
three address bytes are input via SI. Erase operation will  
start immediately after CE# is pulled high. The internal  
control logic automatically handles the erase voltage and  
timing. Refer to Figure 14 for Sector Erase Sequence.  
erase operation.  
The CHIP_ER instruction code is input via the SI. Erase  
operation will start immediately after CE# is pulled high,  
otherwise the CHIP_ER instruction will not be executed. The  
internal control logic automatically handles the erase voltage  
and timing. Refer to Figure 16 for Chip Erase Sequence.  
During an erase operation, all instruction will be ignored  
except the Read Status Register (RDSR) instruction. The  
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DEVICE OPERATION (CONTINUED)  
Figure 16. Sector Erase Sequence  
SIO  
Figure 17. Block Erase Sequence  
SIO  
Figure 18. Chip Erase Sequence  
SIO  
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ABSOLUTE MAXIMUM RATINGS (1)  
Temperature Under Bias  
Storage Temperature  
-65oC to +125oC  
-65oC to +125oC  
Standard Package 240oC 3 Seconds  
Surface Mount Lead Soldering Temperature  
Lead-free Package 260oC 3 Seconds  
Input Voltage with Respect to Ground on All Pins (2)  
-0.5 V to VCC + 0.5 V  
-0.5 V to VCC + 0.5 V  
-0.5 V to +6.0 V  
All Output Voltage with Respect to Ground  
VCC (2)  
Notes:  
1. Applied conditions greater than those listed in “Absolute Maximum Ratings” may cause permanent damage to the device.  
This is a stress rating only. The functional operation of the device conditions that exceed those indicated in the operational  
sections of this specification is not implied. Exposure to absolute maximum rating condition for extended periods may affect  
device reliability.  
2. Maximum DC voltage on input or I/O pins is VCC + 0.5 V. During voltage transitions, input or I/O pins may overshoot VCC  
by + 2.0 V for a period of time not to exceed 20 ns. Minimum DC voltage on input or I/O pins is  
-0.5 V. During voltage transitions, input or I/O pins may undershoot GND by -2.0 V for a period of time not to exceed 20 ns.  
DC AND AC OPERATING RANGE  
Part Number  
IS25CD512/010  
IS25LD020  
Operating Temperature (Extended Grade)  
Operating Temperature (Automotive, A1 Grade)  
Operating Temperature (Automotive, A2 Grade)  
Vcc Power Supply  
-40oC to 105oC  
-40oC to 85oC  
-40oC to 105oC  
2.70 V 3.60 V  
DC CHARACTERISTICS  
Applicable over recommended operating range from:  
VCC = 2.70 V to 3.60 V (unless otherwise noted).  
Symbol  
Parameter  
Condition  
Min  
Typ  
Max  
Units  
VCC = 3.60V at 33 MHz, SO =  
Open  
ICC1  
Vcc Active Read Current  
10  
15  
mA  
VCC = 3.60V at 33 MHz, SO =  
Open  
ICC2  
Vcc Program/Erase Current  
15  
30  
mA  
ISB1  
ISB2  
ILI  
Vcc Standby Current CMOS  
Vcc Standby Current TTL  
Input Leakage Current  
Output Leakage Current  
Input Low Voltage  
VCC = 3.60V, CE# = VCC  
VCC = 3.60V, CE# = VIH to VCC  
VIN = 0V to VCC  
10  
µA  
mA  
µA  
µA  
V
3
1
1
ILO  
VIN = 0V to VCC, TAC = 0oC to 85oC  
VIL  
-0.5  
0.8  
VIH  
VOL  
VOH  
Input HIgh Voltage  
0.7VCC  
VCC + 0.3  
0.45  
V
Output Low Voltage  
IOL = 2.1 mA  
IOH = -100 µA  
V
2.30V < VCC  
3.60V  
<
Output High Voltage  
VCC - 0.2  
V
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AC CHARACTERISTICS  
Applicable over recommended operating range from, VCC = 2.70 V to 3.60 V  
CL = 1 TTL Gate and 10 pF (unless otherwise noted).  
Symbol  
fCT  
fC  
Parameter  
Min  
0
Typ  
Max  
100  
33  
8
Units  
MHz  
MHz  
ns  
Clock Frequency for fast read mode  
Clock Frequency for read mode  
Input Rise Time  
0
tRI  
tFI  
Input Fall Time  
8
ns  
tCKH  
tCKL  
tCEH  
tCS  
tCH  
tDS  
tDH  
tHS  
tHD  
tV  
SCK High Time  
4
4
ns  
SCK Low Time  
ns  
CE# High Time  
25  
10  
5
ns  
CE# Setup Time  
ns  
CE# Hold Time  
ns  
Data In Setup Time  
Data in Hold Time  
2
ns  
2
ns  
Hold Setup Time  
15  
15  
ns  
Hold Time  
ns  
Output Valid  
8
ns  
tOH  
tLZ  
Output Hold Time Normal Mode  
Hold to Output Low Z  
Hold to Output High Z  
Output Disable Time  
Sector/Block/Chip Erase Time  
Page Program Time  
VCC Set-up Time  
0
ns  
200  
200  
100  
10  
ns  
tHZ  
tDIS  
tEC  
tPP  
tVCS  
tw  
ns  
ns  
ms  
ms  
µs  
2
5
50  
Write Status Register time (flash bit)  
10  
ms  
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AC CHARACTERISTICS (CONTINUED)  
SERIAL INPUT/OUTPUT TIMING (1)  
SIO  
Note: 1. For SPI Mode 0 (0,0)  
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AC CHARACTERISTICS (CONTINUED)  
HOLD TIMING  
PIN CAPACITANCE (f = 1 MHz, T = 25°C )  
Typ  
Max  
6
Units  
Conditions  
VIN = 0 V  
CIN  
4
8
pF  
pF  
COUT  
12  
VOUT = 0 V  
Note: These parameters are characterized but not 100% tested.  
OUTPUT TEST LOAD  
INPUT TEST WAVEFORMS  
AND MEASUREMENT LEVEL  
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POWER-UP AND POWER-DOWN  
At Power-up and Power-down, the device must not be  
selected (CE# must follow the voltage applied on Vcc)  
until Vcc reaches the correct value:  
is not guaranteed if, by this time, Vcc is still below Vcc(min).  
No Write Status Register, Program or Erase instructions  
should be sent until the later of:  
- Vcc(min) at Power-up, and then for a further delay of  
tVCE  
- tPUW after Vcc passed the VWI threshold  
- tVCE after Vcc passed the Vcc(min) level  
- Vss at Power-down  
Usually a simple pull-up resistor on CE# can be used to  
insure safe and proper Power-up and Power-down.  
To avoid data corruption and inadvertent write operations  
during power up, a Power On Reset (POR) circuit is included.  
At Power-up, the device is in the following state:  
- The device is in the Standby mode  
- The Write Enable Latch (WEL) bit is reset  
The logic inside the device is held reset while Vcc is less than At Power-down, when Vcc drops from the operating  
the POR threshold value (Vwi) during power up, the device  
does not respond to any instruction until a time delay of  
voltage, to below the Vwi, all write operations are disabled  
and the device does not respond to any write  
tPUW has elapsed after the moment that Vcc rised above the instruction.  
VWI threshold. However, the correct operation of the device  
Vcc  
Vcc(max)  
All Write Commands are Rejected  
Chip Selection Not Allowed  
Vcc(min)  
Reset State  
tVCE  
Read Access Allowed  
Device fully accessible  
V (write inhibit)  
tPUW  
Time  
Symbol Parameter  
Min.  
Max.  
Unit  
µs  
*1  
tVCE  
Vcc(min) to CE# Low  
10  
*1  
tPUW  
Power-Up time delay to Write instruction  
IS25CD512/010  
1
1.6  
1.9  
10  
2.1  
2.4  
ms  
*1  
VWI  
V
IS25LD020  
Note:  
*1. These parameters are characterized only.  
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PROGRAM/ERASE PERFORMANCE  
Parameter  
Unit Typ Max Remarks  
Sector Erase Time  
Block Erase Time  
Chip Erase Time  
ms  
ms  
ms  
10  
10  
10  
5
From writing erase command to erase completion  
From writing erase command to erase completion  
From writing erase command to erase completion  
From writing program command to program completion  
Page Programming Time ms  
2
Note: These parameters are characterized and are not 100% tested.  
RELIABILITY CHARACTERISTICS  
Parameter  
Min  
200,000  
20  
Unit  
Cycles  
Years  
Volts  
Volts  
mA  
Test Method  
Endurance  
JEDEC Standard A117  
JEDEC Standard A103  
JEDEC Standard A114  
JEDEC Standard A115  
JEDEC Standard 78  
Data Retention  
ESD Human Body Model  
ESD Machine Model  
Latch-Up  
2,000  
200  
100 + ICC1  
Note: These parameters are characterized and are not 100% tested.  
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PACKAGE TYPE INFORMATION  
JN  
8-Pin SOIC 150mil Broad Small Outline Integrated Circuit Package (Unit: millimeters)  
Note: Package dimensions are shown in mm.  
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PACKAGE TYPE INFORMATION (CONTINUED)  
JD  
8-pin TSSOP Package (Unit: millimeters)  
0.127  
Pin1  
Detail A  
2.9  
3.1  
Detail A  
GAGE PLANE  
0.65  
0.05  
0.15  
0.25  
0.30  
00  
0.5  
0.7  
80  
Note: Package dimensions are shown in mm.  
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PACKAGE TYPE INFORMATION (CONTINUED)  
JK  
8-pin Ultra-Thin Small Outline No-Lead (WSON) Package (Unit: millimeters)  
Note: Package dimensions are shown in mm.  
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PACKAGE TYPE INFORMATION (CONTINUED)  
JV  
8-pin VVSOP Package 150mil (Unit: millimeters)  
Note: Package dimensions are shown in mm.  
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PACKAGE TYPE INFORMATION (CONTINUED)  
JU  
8-pin USON Package (Unit: millimeters)  
Note: Package dimensions are shown in mm.  
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Appendix1: Safe Guard function  
Safe Guard function is a security function for customer to protect by sector (4Kbyte).  
Every sector has one bit register to decide it will under safe guard protect or not. (“0”means protect and “1” means not  
protect by safe guard.) IS25CD512 (sector 0~sector 15), IS25CD010 (sector 0~sector 31) and IS25LD020 (sector 0~sector  
63)  
*safe guard function priority is higher than status register (BP0/1/2)  
Mapping table for safe guard register  
Address[9:0]  
000h  
000h  
000h  
000h  
000h  
000h  
000h  
000h  
001h  
001h  
001h  
001h  
001h  
001h  
001h  
001h  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
Sector0  
Sector1  
Sector2  
Sector3  
Sector4  
Sector5  
Sector6  
Sector7  
Sector8  
Sector9  
Sector10  
Sector11  
Sector12  
Sector13  
Sector14  
Sector15  
1
1
1
1
1
1
1
0
1
1
1
1
1
1
1
0
1
1
1
1
1
1
0
1
1
1
1
1
1
1
0
1
1
1
1
1
1
0
1
1
1
1
1
1
1
0
1
1
1
1
1
1
0
1
1
1
1
1
1
1
0
1
1
1
1
1
1
0
1
1
1
1
1
1
1
0
1
1
1
1
1
1
0
1
1
1
1
1
1
1
0
1
1
1
1
1
1
0
1
1
1
1
1
1
1
0
1
1
1
1
1
1
0
1
1
1
1
1
1
1
0
1
1
1
1
1
1
1
Sector56  
Sector57  
Sector58  
Sector59  
Sector60  
Sector61  
Sector62  
Sector63  
007h  
007h  
007h  
007h  
007h  
007h  
007h  
007h  
008h  
1
1
1
1
1
1
1
0
0
1
1
1
1
1
1
0
1
0
1
1
1
1
1
0
1
1
0
1
1
1
1
0
1
1
1
0
1
1
1
0
1
1
1
1
0
1
1
0
1
1
1
1
1
0
1
0
1
1
1
1
1
1
0
0
1
1
1
1
1
1
1
0
Chip Erase disable*  
Note:1. Please set the Chip Erase disable to "0" after finished the register setting.  
2. Please set the address 009h to "00" after finished the register setting.  
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Read Safe Guard register  
The READ Safe Guard instruction code is transmitted via the SlO line, followed by three address bytes (A23 - A0) of the first  
register location to be read. The first byte data (D7 - D0) addressed is then shifted out on the SO line, MSb first. The address  
is automatically incremented after each byte of data is shifted out. The read operation can be terminated at any time by  
driving CE# high (VIH) after the data comes out.  
CS  
1
2
7
8
9
10  
23 24 25 26  
31 32 33 34  
39 40 41 42  
47 48  
SCK  
SI  
2Fh  
A23-A0  
2nd byte  
1st byte  
SO  
D7-D0  
D7-D0  
Fig a. Timing waveform of Read Safe guard register  
Erase Safe Guard register  
If we want to erase the safe guard register to let the flash into unprotect status, it needs five continuous instructions. If any  
instruction is wrong, the erase command will be ignored. Erase wait time follow product erase timing spec.  
Fig b. shows the complete steps for Erase safe guard register.  
Program Safe Guard register  
If we want to erase the safe guard register to let the flash into unprotect status, it needs five continuous instructions. If any  
instruction is wrong, the program command will be ignored. The Program safe guard instruction allows up to 256 bytes data  
to be programmed into memory in a single operation. Program wait time follow product program timing spec.  
Fig c. shows the complete steps for program safe guard register.  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
35  
08/12/2013  
IS25CD512/010 & IS25LD020  
Sector Protection Mode Erase  
CS  
1
2
7
8
9 10  
31 32  
SCK  
SI  
55h  
A23-A0  
CS  
1
2
7 8  
9 10  
31 32  
SCK  
SI  
AAh  
A23-A0  
CS  
1
2
7 8  
9 10  
31 32  
SCK  
SI  
80h  
A23-A0  
CS  
1
2
7
8
9 10  
31 32  
SCK  
SI  
AAh  
A23-A0  
CS  
1
2
7 8  
SCK  
SI  
2Bh  
Fig b. Erase safe guard register  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
36  
08/12/2013  
IS25CD512/010 & IS25LD020  
CS  
1
2
7
8
9 10  
31 32  
SCK  
SI  
55h  
A23-A0  
CS  
1
2
7 8  
9 10  
31 32  
SCK  
SI  
AAh  
A23-A0  
CS  
1
2
7 8  
9 10  
31 32  
SCK  
SI  
A0h  
A23-A0  
CS  
1
2
7
8
9 10  
31 32  
SCK  
SI  
55h  
A23-A0  
CS  
1
2
7
8
9
10  
31 32 33 34  
39 40 41 42  
47 48  
SCK  
SI  
1st byte  
2nd byte  
23h  
A23-A0  
D7-D0  
D7-D0  
Fig c. program safe guard register  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
37  
08/12/2013  
IS25CD512/010 & IS25LD020  
Appendix2: Sector Unlock function  
Instruction Name  
Hex  
Code  
26h  
Operation  
Command  
Cycle  
4 Bytes  
1 Byte  
Maximum  
Frequency  
100 MHz  
100 MHz  
SECT_UNLOCK  
SECT_LOCK  
Sector unlock  
Sector lock  
24h  
SEC_UNLOCK COMMAND OPERATION  
The Sector unlock command allows the user to select a  
specific sector to allow program and erase operations.  
This instruction is effective when the blocks are  
designated as write-protected through the BP0, BP1 and  
BP2 bits in the status register. Only one sector can be  
enabled at any time. To enable a different sector, a  
previously enabled sector must be disabled by executing  
a Sector Lock command. The instruction code is followed  
by a 24-bit address specifying the target sector, but A0  
through A11 are not decoded. The remaining sectors  
within the same block remain in read-only mode.  
Figure d. Sector Unlock Sequence  
Sector unlock  
CS  
1
2
7
8
1
2
7
8 9 10  
15 16 17 18  
23 24 25 26  
31 32  
SCK  
SI  
06h  
26h  
A23-A16  
A15-A8  
A7-A0  
In the sector unlock procedure, [A11:A0] needs equal to 0, unlock procedure is  
completed, otherwise chip will regard it as illegal command.  
Note: 1.If the clock number will not match 8 clocks(command)+ 24 clocks (address), it will be ignored.  
2.It must be executed write enable (06h) before sector unlock instructions.  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
38  
08/12/2013  
IS25CD512/010 & IS25LD020  
SECT_LOCK COMMAND OPERATION  
The Sector Lock command reverses the function of the  
Sector Unlock command. The instruction code does not  
require an address to be specified, as only one sector can  
be enabled at a time. The remaining sectors within the  
same block remain in read-only mode.  
Figure e. Sector Lock Sequence  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
39  
08/12/2013  
IS25CD512/010 & IS25LD020  
ORDERING INFORMATION:  
Frequency  
Density  
(MHz)  
Order Part Number  
Package  
IS25CD512-JDLE  
IS25CD512-JNLE  
IS25CD512-JKLE  
IS25CD512-JULE  
IS25CD512-JDLA*  
IS25CD512-JNLA*  
IS25CD512-JKLA*  
IS25CD512-JULA*  
IS25CD512-JWLE  
IS25CD010-JDLE  
IS25CD010-JNLE  
IS25CD010-JKLE  
IS25CD010-JDLA*  
IS25CD010-JNLA*  
IS25CD010-JWLE  
IS25LD020-JDLE  
IS25LD020-JNLE  
IS25LD020-JKLE  
IS25LD020-JVLE  
IS25LD020-JDLA*  
IS25LD020-JNLA*  
IS25LD020-JKLA*  
IS25LD020-JVLA*  
IS25LD020-JWLE  
8-pin TSSOP  
8-pin SOIC 150mil  
8-pin WSON (5x6mm)  
8-pin USON (2x3mm)  
8-pin TSSOP (Call Factory)  
8-pin SOIC 150mil (Call Factory)  
8-pin WSON (5x6mm) (Call Factory)  
8-pin USON (2x3mm) (Call Factory)  
KGD (Call Factory)  
8-pin TSSOP  
8-pin SOIC 150mil  
8-pin WSON (5x6mm) (Call Factory)  
8-pin TSSOP (Call Factory)  
8-pin SOIC 150mil (Call Factory)  
KGD (Call Factory)  
8-pin TSSOP  
8-pin SOIC 150mil  
8-pin WSON (5x6mm)  
8-pin VVSOP 150mil  
512Kb  
100  
100  
100  
1Mb  
2Mb  
8-pin TSSOP (Call Factory)  
8-pin SOIC 150mil (Call Factory)  
8-pin WSON (5x6mm) (Call Factory)  
8-pin VVSOP 150mil (Call Factory)  
KGD (Call Factory)  
A* = A1, A2 Automotive Temperature Ranges  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. C  
40  
08/12/2013  

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