PFM21030 [ETC]
2110-2170 MHz, 30W, 2-Stage Power Module Enhancement-Mode Lateral MOSFETs; 2110至70年兆赫, 30W , 2级功率模块,增强模式横向的MOSFET型号: | PFM21030 |
厂家: | ETC |
描述: | 2110-2170 MHz, 30W, 2-Stage Power Module Enhancement-Mode Lateral MOSFETs |
文件: | 总13页 (文件大小:423K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
PRELIMINARY
PFM21030 SPECIFICATION
2110-2170 MHz, 30W, 2-Stage Power Module
Enhancement-Mode Lateral MOSFETs
This versatile UMTS module provides excellent linearity and efficiency in
a low-cost surface mount package. The PFM21030 includes two stages
of amplification, along with internal sense FETs that are on the same
silicon die as the RF devices. These thermally coupled sense FETs
simplify the task of bias temperature compensation of the overall amplifier.
The module includes RF input, interstage, and output matching elements.
The source and load impedances required for optimum operation of the
module are much higher (and simpler to realize) than for unmatched Si
LDMOS transistors of similar performance.
Package Type: Surface Mount
PN: PFM21030SM
The surface mount package base is typically soldered to a conventional
PCB pad with an array of via holes for grounding and thermal sinking
of the module. Optimized internal construction supports low FET
channel temperature for reliable operation.
Package Type: Flange
PN: PFM21030F
• 27 dB Gain
• WCDMA Performance
5 Watts Average Output Level
18% Power Added Efficiency
–45 dBc ACPR
• 30 Watts Peak Output Power
• Internal Tracking FETs
(for improved bias control)
Module Schematic Diagram
Module Substrate
Q2 Die Carrier
Q1 Die Carrier
Drain 2
Q2
RF OUT
Q1
Gate 1
RF IN
Input
Match
Output
Match
Lead
Input
Match
Output
Match
Lead
S2
S1
Lead
Lead
Sense S1
Gate 2
Sense S2
Lead
Lead
D1
Note: Additionally, there are 250K Ohm resistors connected in shunt with all leads, to enhance ESD protection.
Page 1 of 13 Specifications subject to change without notice. US Patent No.6,822,321
Rev. 3
http://www.cree.com/
PFM21030
Electrical Specification
Parameter
Min
Limits
Typ
Units
Comments
Max
1
2
Operating Frequency
2110
-
2170
MHz
dB
Gain
25
26.7
30
Note 1.
Pulsed CW compression measurement
(12 µsec pulse, 120 µsec period, 10%
duty cycle).
Gain Compression at
Pout =30 Watts
3
4
5
-
-
-
1.3
2.0
dB
dB
°
Gain Flatness over any
30 MHz bandwidth
Deviation from Linear
Phase over any 30
MHz bandwidth
± 0.1
± 1.0
± 0.3
± 2.0
Includes delay of test fixture (~0.6
nanoseconds).
Note 3. Refer to applications data for
performance with other protocols.
6
7
8
Group Delay
-
3.5
-44
3.8
-
nanosec
dBc
ACPR with WCDMA
Pave = 5 W
Efficiency under
WCDMA Protocol,
Pave = 5 W
-40
17
19
-
%
Note 3.
Efficiency @ 30W
CW Output
DC Drain Supply
Voltage
9
40
27
-
%
Testing for conformance with RF
specifications is at +27 V.
10
24
-40
-
30
Volts
Operating
Testing for conformance with RF
specification is at +25 °C.
11 Temperature Range
(base temperature)
-
-0.033
-
+115
-
°C
Gain Variation versus
Temperature
12
Bias quiescent currents held constant.
dB/°C
VSWR 10:1, all phase angles. No
degradation in output power before &
after test.
Output Mismatch
Stress
Watts
CW
13
-
30
14 Stability
-60
-
-
-
-
dBc
0<Pout<44.8 dBm CW, 3:1 VSWR
Theta jc is for output device. Verified
with IR scan. Note 2.
15 Theta jc (channel)
2.1
°C/W
Quiescent Currents
16 a) Q1
These DC quiescent currents are typical
of the levels that produce optimum
linearity for CDMA protocol.
80
240
mA
mA
b) Q2
Tracking FET
Periphery Ratio
Ratio of sense FET current, relative to RF
FET current. Ratios are: Stg 1: 33:1;
Stg 2: 58:1 Gates of sense & RF FETs
are DC connected. Measured with no RF
signal present.
17
18
a) Stg 1 Track
b) Stg 2 Track
3.0
1.7
%
%
ESD Protection
a) Human Body Model
b) Machine Model
a) 2000V, 100 pF, 1500 Ohms
b) 400V, 200 pF, zero Ohms
Mil STD 883E, Method 3015 for Human
Body Model and for Machine Model.
Class 1
Class M3
Page 2 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
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PFM21030
Electrical Specification (Continued)
MAXIMUM RATINGS
Rating
Symbol
Value
Units
DC Drain Supply
a) Drain-to-Source Voltage, (VGS=0), D1 & D2
& Track D1 & Track D2
b) Normal Operation (Class AB operation)
VDS
+50
+30
Volts DC
Volts DC
19
VD_SUPPLY
DC Gate Supply
20
a) Gate-to-source Voltage (VDS=0)
Normal Operation (Class AB operation)
VGS
VG_SUPPLY
-0.5<VGS<+15
0<VGS<+6
Volts DC
Volts DC
21
22
RF Input Power
PIN
+25
dBm
PTOTAL
65
-0.7
Watts
Watts/°C
Maximum Power Dissipation (T ≤ +85 °C)
a) Derate above +85 °C base temperature.
23
24
Maximum Channel Operating Temperature
Storage Temperature Range
TCH
TSTG
+200
-40 to +150
°C
°C
RECOMMENDED SOURCE AND LOAD IMPEDANCES
Impedance Units
Comments
Nominal Source
Impedance for
Optimum Operation
Matched for optimum linearity and gain flatness. Impedance
is looking from the module input lead into the input matching
circuit. Reference plane is 0.105 inches from input end of
module.
Matched for optimum efficiency under WCDMA protocol.
Impedance is from the module output lead looking into the
output matching circuit. Reference plane is 0.105 inches from
output end of module.
18.3 – j0.1
23.7 + j3.8
Ohms
Ohms
Nominal Load
Impedance for
Optimum Operation
Specification Notes:
1) The module is mounted in a test fixture with external matching elements for all testing. Quiescent current bias
conditions are those appropriate for minimum ACPR under CDMA protocol. Supply voltage for all tests is
+27 volts DC. Testing is at +25 °C unless otherwise specified.
2) Theta jc is measured with a package mounting (base) temp of +85 °C, and with 10 Watts CW output.
3) Pout=5 Watts average; WCDMA protocol: (3GPP Test Model 1, 64 DPCH.).
ACPR conditions: 5.00 MHz offset, 3.84 MHz BW (crest factor = 11 dB).
4) Sense FETs are scaled versions of the main RF FETs, formed from electrically isolated cells at end of the RF
structure. Current scales according to periphery (threshold voltages offset is less than ±150 millivolts between
adjacent devices). RF & Sense FET gates and sources are DC connected. Drains are DC isolated. Leads S1 & S2
are DC connected to drains of sense FETs 1 & 2. Sources are connected to package base. Sense FETs are
electrically isolated from the RF signals.
Page 3 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
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PFM21030
Typical Module Performance
T=+25 °C, unless otherwise noted. Data is for module in a test fixture with external matching elements. See following
page for test fixture details.
Typical CW 2-Tone Intermods vs. Output Power
Typical Small-Signal Gain vs. Frequency
-10
IM3L
IM3U
IM5L
IM5U
IM7L
IM7U
28
27
26
25
24
23
-20
-30
-40
-50
-60
-70
1990
2050
2110
2170
2230
2290
2350
27
29
31
33
35
37
39
41
43
Frequency (MHz)
Average Output Power (dBm)
Typical Gain & Efficiency vs CW Output Power
Typical Input & Output Return Loss vs Freq.
0
- 2
- 4
- 6
- 8
28
27
26
25
24
23
22
21
45
40
35
30
25
20
15
10
GAIN
OUTPUT
INPUT
- 1
0
2
4
6
EFFICIENCY
- 1
- 1
- 1
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46
2
0
5
0
2
0
8
0
2
1
1
0
2
1
4
0
2
1
7
0
2
2
0
0
2 2 3 0
Output Power (dBm)
Frequency (MHz)
Note: The above data is for initial prototype units. Consult the factory for latest data.
Page 4 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
http://www.cree.com/
PFM21030
PFM21030SM Package Outline
PFM21030F Package Outline
Page 5 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
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PFM21030
Module Application Notes
The PFM21030 was designed to provide a versatile low cost solution for a wide variety of wireless applications
requiring 30 Watt peak output levels. This hybrid module contains two stages of Si LDMOS FET amplification:
a nominally 5 Watt input stage driving a 30 Watt output stage. The module is optimized for efficient, linear operation
with WCDMA signals. The input and output of this module are partially matched, and require source and load
impedances of nominally 19 and 21 Ohms (much higher than typically required by unmatched Si LDMOS FETs).
These source and load impedances can be achieved with compact conventional external PCB circuitry.
Performance for particular signal protocols can be improved slightly by small adjustments in quiescent currents and
load impedances presented to the module. The data presented in the previous pages was taken at one set of quiescent
currents and in a fixture with source and load impedances that were fixed for all measurements. The data presented is
generally representative of the performance– benefits from further optimization in quiescent current are small.
In addition to the two RF gain stages, there are Sense FET (thermally tracking) devices that serve as optional DC circuit
elements. The Sense FETs are fabricated on the same epi material with nominally identical physical characteristics (but
smaller gate periphery) as the RF devices. The sense devices can be applied as temperature compensation elements in
conjunction with external bias circuitry. Alternatively, the two-stage amplifier can be operated with the Sense FETs
unused (S1 and S2 leads floating).
The base of the module is high conductivity copper of 40 mil thickness. It is well matched to typical PCB material, and
it serves as a heat spreader for the device when mounted as a surface-mount component. The module thermal
characteristics were measured with the unit soldered to a 20 mil thick PCB material with an array of plated via holes for
electrical grounding and thermal sinking. IR scans of this configuration demonstrated maximum die channel
temperatures of 142 degrees C with a PCB base temperature of +95 degrees C, and 10 Watts CW output power.
These modules can be provided in tape-and-reel configuration for high volume application
Typical PCB Mounting Pattern
The module outline is indicated by dashed line (0.60 X 1.00 inches). The ground pad is 1.030 X 0.630 inches. Ground
vias in this example are 28 mil diameter on 35 mil (or 70 mil) centers. Thermal resistance is proportional to the
thickness of the PC board (height of vias), and inversely proportional to the total ground hole array periphery (and
thickness of plating in the holes). The densely spaced vias in this layout (on 35 mil spaces) are located in areas of
maximum heat generation. The gap between the lead pads and the ground pad is 25 mils. Note that the underside of
the PCB must be connected to a thermal heat sink and ground.
The above hole pattern is an example of one that maximizes thermal transfer. There are numerous alternative
approaches. Depending on the application (signal protocol, thermal environment, etc.), the number of via holes can be
reduced. High average power applications require the most extensive thermal sinking.
Page 6 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
http://www.cree.com/
PFM21030
Recommended Passive Bias Circuit
This schematic demonstrates a method of applying the Sense FETs internal to the module that uses passive
external circuitry. The circuit maintains a constant current through the Sense FETS, independent of
temperature of the die. The Sense FETs are configured in this case as diodes. The temperature dependence
of the Vf of the diode is very similar to that of the RF FET gate voltage, and therefore the quiescent current
remains nearly constant over a wide temperature range. The advantage of this circuit is its simplicity and
stability (avoidance of operational amplifiers) under all layout conditions. The main limitation of the circuit
is that quiescent currents must be adjusted for each individual module (they are not easily pre-set with
precision).
+10 to
+20 V
Gate
GND
+27 V
Note: Typical Q1 diode bias = 1.4 mA (VG1 ~ 3.96V)
Typical Q2 diode bias = 2.7 mA (VG2 ~ 4.21V)
(based on 6/4/04 measurements)
J1
8
7
6
5
4
3
2
1
C29
S1
S2
C28
C27
C12 C11 C10
R6
R5
C24
C23
R2
C22
C20
C21
C19
C9
C18 C17 C16 C15
C8
Drain 1
C7
Sense D2
Gate 2
C2
R3
C6
R1
Sense D1
PFM21030
RF
OUT
RF
Out
RF IN
RF
C1
Input
C4
C5
C3
Page 7 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
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PFM21030
Alternate Passive Bias Circuit Parts List
Designator
Description
Qty
C1
C2
C3
C5
1
1
1
1
2
3
4
4
1
CAP, 10 PF±0.5 pF, 0603, ATC 600S
CAP, 0.8 PF±0.1 pF, 0603, ATC 600S
CAP, 1.5 PF±0.1 pF, 0603, ATC 600S
CAP, 1.0 PF±0.1 pF, 0603, ATC 600S
CAP, 3.3 PF±0.1 pF, 0603, ATC 600S
CAP, 24 PF±5%, 0603, ATC 600S
CAP, 24 PF±5%, 100V (min), 0603, any vendor.
CAP, 470 PF ±10%,100 V, 0603, any vendor.
CAP, 3300 PF±10%, 100 V, 0603, Murata GRM39X7R332K100??, or
equivalent.
C4, C6
C7, C19, C20
C10, C13, C14, C15,
C8, C11, C16, C21
C22
C23, C9, C17, C12
C24, C18
4
2
CAP, 15000 PF±10%, 100 V, 0805, MurataGRM40X7R153K100??,
or equivalent.
CAP, 150000 1206, 50V, X7R, 10%
Suggest Murata GRM42-6-X7R-154-K-050-A-L or equivalent.
R5
RES, potentiometer, 10K ohms, Digikey SM4W103-ND
1
1
1
R6
RES, potentiometer, 5K ohms, Digikey SM4W502-ND
RES, 1/16W, 0603, 1000 ohms
R1
R3
RES, 1/16W, 0603, 42 ohms
C27
C29
C28
S1, S2
CAP, 2.2uf SMT TANTALUM, 50V (240097)
CAP, 10uf 16V SMT TANTALUM (240096)
CAP, 47UF, 50V, ELECTR SMT (240087)
SPST Switch, Digikey PN CKN1100CT-ND
1
1
1
2
Page 8 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
http://www.cree.com/
PFM21030
A metal backed PCB with clamps for securing module is used for module electrical testing and for product
demonstration. The fixture is supplied mounted to a finned heat sink. A fixture schematic is provided on the
following page.
Test Fixture
This test fixture uses an active bias circuit, which sets the bias circuit through the Sense FETs (configured as
FETs) and applies the derived gate voltage to the associated RF FETs. This assures particular quiescent bias
currents, with accuracy determined by the Sense FET-to-RF FET current ratios.
Page 9 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
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PFM21030
Test Fixture (with active bias circuit) Schematic
+27 V
OpAmp
+27 V
GND
J2 Not Used for Demo Fixture
J1
J2
8
7
6
5
4
3
2
1
8
7
6
5
4
3
2
1
RZ_FS1
RZ_FS2
C31
C37
C34
R33
C36
R36
R12
C32
4
R32
R31
R11
R16
U2
5
4
-
5 U1
R13
C43
LM8261
-
+
C42
LM8261
3
R34
C35
2
C41
+
1
3
R14
C33
C40
2
R39
R37
R40
R19
R35
R20
R15
R38
R17
S2
D2
R18
S1
D1
C28
C27
C26
C12 C11 C10
C25
C24
C22
C23
C21
C14
C9
C8
C7
C20
C19
C18 C17 C16 C15
Drain 1
Sense D2
Gate 2
C2
R2
C6
R1
Sense D1
PFM21030
RF
OUT
RF
Out
RF
Input
RF IN
C1
C4
C5
C3
See the following pages for the parts list and a description of the principle of operation. Note that an
alternative, less complex bias scheme is provided on page 10. The advantage of the above active bias design
is that bias currents are set by the RF-to-Sense FET ratios, and once the optimum bias circuit resistor
(potentiometer) values are established, the circuit can stay fixed for multiple modules (thus eliminating
Page 10 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
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PFM21030
module-specific bias alignment). Additionally, aging effects are minimized because of the similar bias
conditions for Sense and RF FETs. The disadvantage of this design is its relative complexity and the
incorporation of operational amplifiers, for which stability is potentially circuit layout dependent.
Parts List for Cree Microwave Test Fixture
Designator
Description
CAP, 10 PF±0.5 pF, 0603, ATC 600S
Qty
1
C1
C2
C3
C5
1
CAP, 0.8 PF±0.1 pF, 0603, ATC 600S
CAP, 1.5 PF±0.1 pF, 0603, ATC 600S
CAP, 1.0 PF±0.1 pF, 0603, ATC 600S
1
1
C4, C6
2
CAP, 3.3 PF±0.1 pF, 0603, ATC 600S
C7
1
CAP, 24 PF±5%, 0603, ATC 600S
C19, C20
2
CAP, 24 PF±5%, 0603, ATC 600S
C10, C13, C14, C15,
C8, C11, C16, C21
C22
4
CAP, 24 PF±5%, 100V (min), 0603, any vendor.
CAP, 470 PF ±10%,100 V, 0603, any vendor.
CAP, 3300 PF±10%, 100 V, 0603, Murata GRM39X7R332K100
4
1
C9, C23, C17, C12
4
CAP, 15000 PF±10%, 100 V, 0805, MurataGRM40X7R153K100
CAP, 150000 1206, 50V, X7R, 10%
Murata GRM42-6-X7R-154-K-050-A-L
C18, C24, C25, C26,
C31, C34
6
C27, C37
C28
CAP, 2.2uf SMT TANTALUM, 50V
CAP, 47UF, 50V, ELECTR SMT
2
1
2
2
4
1
1
2
2
4
4
2
1
1
2
2
2
2
2
2
C33, C35
C32, C36
C40, C41, C42, C43
R1
CAP, 18,000 PF ±10%,100 V, 0603
CAP, 33,000 PF ±10%,100 V, 0603
CAP, 1000 PF ±10%,100 V, 0603.
RES, 1/16W, 0603, 1000 ohms, 5%
R2
RES, 1/16W, 0805, 42 Ohms, 5%
RES, 1/16W, 0603, 332 Ohms, 1%
R11, R12
R31, R32
R13, R14, R33, R34
R16, R15, R35, R36
R19, R39
R18
RES, 1/16W, 0603, 147 Ohms, 1%
RES, 1/16W, 0603, 2370 Ohms, 1%
RES, 1/16W, 0603, 511 KOhms, 1%
RES, 1/16W, 0603, 100 KOhms, 5%
RES, 1/16W, 0603, 3320 Ohms, 5%
RES, 1/16W, 0603, 2000 Ohms, 5%
R38
R20, R40
R17, R37
RZ_FS1, RZ_FS2
D1, D2
RES, 1/8W, 1206, 1000 Ohms, 5%
RES, potentiometer, 10 Kohms, Digikey SM4W103-ND, 11T
RES, 1/16W, 0805, 0 Ohms (used as jumpers, demo fixture only)
Zener diode, 6.2 V, Digikey PN BZT52C6V27DICT-ND
SPST Switch, Digikey PN CKN1100CT-ND
Op Amp, High Output, LM8261M5 (5 pin, SOT23 package)
S1, S2
U1, U2
It is also possible to bias the two stages in a conventional manner, with the two tracking FET drains left
unused (floating or grounded). The above bias circuits are just two of several possibilities.
Page 11 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
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PFM21030
Test Fixture Active Bias Circuit Principles of Operation
The active bias circuit test fixture operates off of a single voltage supply. It contains two switches and two
potentiometers. The switches provide for independent on/off for the input and output devices of the module.
The potentiometers allow adjustment of quiescent current level of each stage. The adjustments should be
made with no RF applied to the module.
Q1 Die Carrier
Q1
Output
Match
Input
Match
Vsupply
S1
Vsupply
R1 <<Rbias
R1
R1
-
Differental Amp
+
Ids_sense
Ireference
Rbias
Principal of Operation of Bias Circuitry
The principal of operation of the fixture bias circuit is demonstrated in the above Figure. The potentiometer
establishes a reference current, and the operational amplifier adjusts gate voltage to maintain that current in
the sense device. The same DC gate voltage is also applied to the main (RF) device. Sense devices are
scaled versions of the main (RF) devices, on the same die (to facilitate temperature tracking). As the
temperature of the die changes due to RF drive (or ambient temperature changes), the operational amplifier
maintains constant current through the Sense FET, and thus constant quiescent bias for the main (RF) FET.
No RF signal is applied to the Sense FET.
There is a separate independent bias circuit for the input (Q1) device and for the output device (Q2) of the
module.
Experience has shown this bias circuit to be a reliable method of maintaining tight control of quiescent
current over operating temperature, and for minimizing the impact of device aging effects on amplifier
performance. However, there are some precautions regarding use of this circuit. The principle of the circuit
is for the differential amplifier (op amp) to adjust gate voltage until the desired current is achieved through
the sense FETs. If the current path is interrupted (thereby not allowing Ids_sense to flow), the operational
amplifier will increase gate bias in an attempt to increase current, with the possibility that the quiescent bias
current in the RF FET may increase beyond a safe limit (the device may be destroyed). The zener diodes in
the test fixture circuit (D1 and D2, test fixture schematic) are safeguards for prohibiting excessive gate
voltage to be applied to the transistors.
Page 12 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
http://www.cree.com/
PFM21030
Disclaimer: Specifications are subject to change without notice. Cree Microwave, Inc. believes the
information contained within this data sheet to be accurate and reliable. However, no responsibility is
assumed by Cree Microwave for any infringement of patents or other rights of third parties, which may
result from its use. No license is granted by implication or otherwise under any patent or patent rights of
Cree Microwave. Cree Microwave makes no warranty, representation or guarantee regarding the
suitability of its products for any particular purpose. “Typical” parameters are the average values
expected by Cree Microwave in large quantities and are provided for information purposes only. These
values can and do vary in different applications, and actual performance can vary over time. All
operating parameters should be validated by customer’s technical experts for each application. Cree
Microwave products are not designed, intended, or authorized for use as components in applications
intended for surgical implant into the body or to support or sustain life, in applications in which the
failure of the Cree product could result in personal injury or death, or in applications for planning,
construction, maintenance or direct operation of a nuclear facility. Cree Microwave is a trademark and
Cree and the Cree logo are registered trademarks of Cree, Inc.
Contact Information:
Cree Microwave, Inc.
160 Gibraltar Court
Sunnyvale, CA 94089-1319
Sheryle Henson (Cree Microwave—Marketing Manager) 408-962-7783
Tom Dekker (Cree Microwave—Sales Director) 919-313-5639
Page 13 of 13 Specifications subject to change without notice. U.S. Patent No.6,822,321
Rev. 2
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