UPA2701 [ETC]

UPA2701GR Data Sheet | Data Sheet[05/2002] ; UPA2701GR数据表|数据表[ 05/2002 ]\n
UPA2701
型号: UPA2701
厂家: ETC    ETC
描述:

UPA2701GR Data Sheet | Data Sheet[05/2002]
UPA2701GR数据表|数据表[ 05/2002 ]\n

文件: 总8页 (文件大小:73K)
中文:  中文翻译
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DATA SHEET  
MOS FIELD EFFECT TRANSISTOR  
µPA2701GR  
SWITCHING  
N-CHANNEL POWER MOS FET  
DESCRIPTION  
PACKAGE DRAWING (Unit: mm)  
The µPA2701GR is N-Channel MOS Field Effect Transistor  
designed for DC/DC converters and power management  
applications of notebook computers.  
8
5
1, 2, 3  
4
; Source  
; Gate  
5, 6, 7, 8 ; Drain  
FEATURES  
Low on-state resistance  
RDS(on)1 = 7.5 mMAX. (VGS = 10 V, ID = 7.0 A)  
RDS(on)2 = 11.6 mMAX. (VGS = 4.5 V, ID = 7.0 A)  
Low Ciss: Ciss = 1200 pF TYP. (VDS = 10 V, VGS = 0 V)  
Small and surface mount package (Power SOP8)  
6.0 ±0.3  
4.4  
1
4
5.37 MAX.  
0.8  
0.5 ±0.2  
ORDERING INFORMATION  
0.10  
1.27 0.78 MAX.  
PART NUMBER  
PACKAGE  
+0.10  
0.40  
0.12 M  
–0.05  
µPA2701GR  
Power SOP8  
ABSOLUTE MAXIMUM RATINGS (TA = 25°C, All terminals are connected.)  
Drain to Source Voltage (VGS = 0 V)  
Gate to Source Voltage (VDS = 0 V)  
Drain Current (DC)  
VDSS  
VGSS  
ID(DC)  
ID(pulse)  
PT  
30  
V
EQUIVALENT CIRCUIT  
±20  
V
±14  
A
Drain  
Drain Current (pulse) Note1  
±56  
A
Total Power Dissipation (TA = 25°C) Note2  
Body  
2.0  
W
°C  
°C  
A
Diode  
Gate  
Channel Temperature  
Tch  
150  
Storage Temperature  
Tstg  
–55 to +150  
14  
Gate  
Protection  
Diode  
Single Avalanche Current Note3  
Single Avalanche Energy Note3  
Source  
IAS  
EAS  
19.6  
mJ  
Notes 1. PW 10 µs, Duty Cycle 1%  
2. Mounted on ceramic substrate of 1200 mm2 x 2.2 mm  
3. Starting Tch = 25°C, VDD = 15 V, RG = 25 , L = 100 µH, VGS = 20 0 V  
Remark The diode connected between the gate and source of the transistor serves as a protector against ESD.  
When this device actually used, an additional protection circuit is extemally required if a voltage exceeding  
the rated voltage may be applied to this device.  
The information in this document is subject to change without notice. Before using this document, please  
confirm that this is the latest version.  
Not all devices/types available in every country. Please check with local NEC representative for  
availability and additional information.  
Document No.G15714EJ2V0DS00 (2nd edition)  
Date Published May 2002 NS CP(K)  
Printed in Japan  
2002  
©
The mark ! shows major revised points.  
µPA2701GR  
ELECTRICAL CHARACTERISTICS (TA = 25°C, All terminals are connected.)  
CHARACTERISTICS  
SYMBOL  
TEST CONDITIONS  
VDS = 30 V, VGS = 0 V  
MIN. TYP. MAX. UNIT  
Zero Gate Voltage Drain Current  
Gate Leakage Current  
IDSS  
IGSS  
10  
±10  
2.5  
µA  
µA  
V
VGS = ±20 V, VDS = 0 V  
VDS = 10 V, ID = 1 mA  
VDS = 10 V, ID = 7.0 A  
VGS = 10 V, ID = 7.0 A  
VGS = 4.5 V, ID = 7.0 A  
VGS = 4.0 V, ID = 7.0 A  
VDS = 10 V  
Gate Cut-off Voltage  
VGS(off)  
| yfs |  
RDS(on)1  
RDS(on)2  
RDS(on)3  
Ciss  
1.5  
7
2.0  
14  
Forward Transfer Admittance  
Drain to Source On-state Resistance  
S
6.2  
8.7  
10.3  
1200  
500  
160  
10  
7.5  
mΩ  
mΩ  
mΩ  
pF  
pF  
pF  
ns  
11.6  
13.7  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Turn-on Delay Time  
Rise Time  
Coss  
Crss  
VGS = 0 V  
f = 1 MHz  
td(on)  
tr  
td(off)  
tf  
VDD = 15 V, ID = 7.0 A  
VGS = 10 V  
13  
ns  
Turn-off Delay Time  
Fall Time  
RG = 10 Ω  
44  
ns  
11  
ns  
Total Gate Charge  
QG  
VDD = 15 V  
12  
nC  
nC  
nC  
V
Gate to Source Charge  
Gate to Drain Charge  
Body Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
QGS  
QGD  
VF(S-D)  
trr  
VGS = 5 V  
4
ID = 14 A  
6
IF = 14 A, VGS = 0 V  
IF = 14 A, VGS = 0 V  
di/dt = 100 A/ µs  
0.8  
32  
1.2  
ns  
Qrr  
27  
nC  
TEST CIRCUIT 1 AVALANCHE CAPABILITY  
TEST CIRCUIT 2 SWITCHING TIME  
D.U.T.  
L
D.U.T.  
V
GS  
R
L
RG  
= 25  
90%  
V
GS  
Wave Form  
VGS  
10%  
0
R
G
PG.  
PG.  
50 Ω  
V
DD  
V
DD  
V
GS = 20 0 V  
V
DS  
90%  
90%  
V
DS  
V
0
GS  
BVDSS  
10% 10%  
V
DS  
Wave Form  
0
I
AS  
V
DS  
τ
I
D
t
d(on)  
t
r
t
d(off)  
tf  
V
DD  
t
on  
toff  
τ
= 1  
µ
s
Duty Cycle 1%  
Starting Tch  
TEST CIRCUIT 3 GATE CHARGE  
D.U.T.  
= 2 mA  
I
G
RL  
PG.  
50 Ω  
V
DD  
2
Data Sheet G15714EJ2V0DS  
µPA2701GR  
TYPICAL CHARACTERISTICS (TA = 25°C)  
!
DERATING FACTOR OF FORWARD BIAS  
SAFE OPERATING AREA  
TOTAL POWER DISSIPATION vs.  
AMBIENT TEMPERATURE  
2.8  
2.4  
2.0  
1.6  
1.2  
0.8  
0.4  
0
120  
100  
80  
Mounted on ceramic  
substrate of  
1200 mm2 ×2.2 mm  
60  
40  
20  
0
20  
40 60  
80 100 120 140 160  
0
20 40  
60  
80 100 120 140 160  
T
A
- Ambient Temperature - ˚C  
TA - Ambient Temperature - ˚C  
FORWARD BIAS SAFE OPERATING AREA  
100  
I
D(pulse) = 56 A  
I
D(DC) = 14 A  
Limited  
= 10 V)  
10  
1
RDS(on)  
(VGS  
100 ms  
Remark Mounted on ceramicsubstrate of  
1200 mm2 x 2.2 mm  
0.1  
T = 25˚C  
A
Single Pulse  
0.01  
0.01  
0.1  
1
10  
100  
V
DS - Drain to Source Voltage - V  
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH  
100  
10  
1
Rth(ch-A) = 62.5˚C/W  
Mounted on ceramic substrate of  
1200 mm2 × 2.2 mm  
Single Pulse  
Channel to Ambient  
0.1  
0.001  
0.01  
0.1  
1
10  
100  
1000  
PW - Pulse Width - s  
3
Data Sheet G15714EJ2V0DS  
µPA2701GR  
DRAIN CURRENT vs.  
DRAIN TO SOURCE VOLTAGE  
FORWARD TRANSFER CHARACTERISTICS  
Pulsed  
100  
10  
80  
70  
60  
50  
40  
30  
20  
10  
0
V
GS = 10 V  
4.5 V  
T
A
= 150˚C  
75˚C  
1
0.1  
4.0 V  
25˚C  
25˚C  
Pulsed  
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0  
DS - Drain to Source Voltage - V  
V
DS = 10 V  
4
0.01  
0
1
2
3
5
0
VGS - Gate to Source Voltage - V  
V
DRAIN TO SOURCE ON-STATE RESISTANCE vs.  
GATE TO SOURCE VOLTAGE  
FORWARD TRANSFER ADMITTANCE vs.  
DRAIN CURRENT  
100  
10  
1
20  
V
DS = 10 V  
Pulsed  
Pulsed  
18  
16  
14  
12  
10  
8
T
A
= 150˚C  
75˚C  
I = 7.0 A  
D
25˚C  
6
25˚C  
4
2
0.1  
0.01  
0
0.1  
0
2
4
6
8
10 12 14 16 18 20  
1
10  
100  
V
GS - Gate to Source Voltage - V  
ID - Drain Current - A  
DRAIN TO SOURCE ON-STATE  
RESISTANCE vs. DRAIN CURRENT  
GATE CUT-OFF VOLTAGE vs.  
CHANNEL TEMPERATURE  
30  
15  
10  
5
3
2
1
0
Pulsed  
V
DS = 10 V  
I
D = 1 mA  
V
GS = 4.0 V  
4.5 V  
10 V  
0
0.1  
1
10  
100  
50 25  
0
25  
50  
75 100 125 150  
I
D - Drain Current - A  
T
ch - Channel Temperature - ˚C  
4
Data Sheet G15714EJ2V0DS  
µPA2701GR  
SOURCE TO DRAIN DIODE  
FORWARD VOLTAGE  
DRAIN TO SOURCE ON-STATE RESISTANCE vs.  
CHANNEL TEMPERATURE  
20  
15  
10  
5
100  
10  
1
Pulsed  
Pulsed  
V
GS = 0 V  
VGS = 4 V  
4.5 V  
10 V  
0.1  
0
0.01  
0
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
50 25  
0
25 50 75 100 125 150 175  
V
SD - Source to Drain Voltage - V  
T
ch - Channel Temperature - ˚C  
CAPACITANCE vs.  
DRAIN TO SOURCE VOLTAGE  
SWITCHING CHARACTERISTICS  
100  
10  
1
10000  
1000  
t
d(off)  
t
f
C
iss  
t
r
C
oss  
rss  
t
d(on)  
C
100  
10  
V
DD = 15 V  
V
GS = 10 V  
V
GS = 0 V  
R = 10 Ω  
G
f = 1 MHz  
0.1  
1
10  
100  
0.1  
1
10  
100  
V
DS - Drain to Source Voltage - V  
I
D
- Drain Current - A  
REVERSE RECOVERY TIME vs.  
DRAIN CURRENT  
DYNAMIC INPUT/OUTPUT CHARACTERISTICS  
1000  
100  
40  
35  
30  
25  
20  
15  
10  
5
8
7
6
5
4
3
2
1
0
µ
di/dt = 100 A/  
GS = 0 V  
s
V
V
DD = 24 V  
15 V  
6 V  
VGS  
10  
1
V
DS  
I
D
= 14 A  
0
0.1  
1
10  
100  
0
2
4
6
8
10 12 14 16 18 20  
I
F
- Drain Current - A  
Q
G
- Gate Charge - nC  
5
Data Sheet G15714EJ2V0DS  
µPA2701GR  
[MEMO]  
6
Data Sheet G15714EJ2V0DS  
µPA2701GR  
[MEMO]  
7
Data Sheet G15714EJ2V0DS  
µPA2701GR  
The information in this document is current as of May, 2002. The information is subject to change  
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data  
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products  
and/or types are available in every country. Please check with an NEC sales representative for  
availability and additional information.  
No part of this document may be copied or reproduced in any form or by any means without prior  
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.  
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of  
third parties by or arising from the use of NEC semiconductor products listed in this document or any other  
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any  
patents, copyrights or other intellectual property rights of NEC or others.  
Descriptions of circuits, software and other related information in this document are provided for illustrative  
purposes in semiconductor product operation and application examples. The incorporation of these  
circuits, software and information in the design of customer's equipment shall be done under the full  
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third  
parties arising from the use of these circuits, software and information.  
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers  
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize  
risks of damage to property or injury (including death) to persons arising from defects in NEC  
semiconductor products, customers must incorporate sufficient safety measures in their design, such as  
redundancy, fire-containment, and anti-failure features.  
NEC semiconductor products are classified into the following three quality grades:  
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products  
developed based on a customer-designated "quality assurance program" for a specific application. The  
recommended applications of a semiconductor product depend on its quality grade, as indicated below.  
Customers must check the quality grade of each semiconductor product before using it in a particular  
application.  
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio  
and visual equipment, home electronic appliances, machine tools, personal electronic equipment  
and industrial robots  
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster  
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed  
for life support)  
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life  
support systems and medical equipment for life support, etc.  
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's  
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not  
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness  
to support a given application.  
(Note)  
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.  
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for  
NEC (as defined above).  
M8E 00. 4  

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