URG2012L-101-L-T05 [ETC]
RES SMD 100 OHM 0.01% 1/10W 0805;
| 型号： | URG2012L-101-L-T05 |
| 厂家： | 
ETC |
| 描述： | RES SMD 100 OHM 0.01% 1/10W 0805 |
| 文件： | 总4页 (文件大小：450K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Metal thin film chip resistors
(the highest reliability and precision)
URG series
■
AEC-Q200 Compliant
Features
The tightest resistance tolerance: +/-0.01%
・
・
・
・
The smallest temperature coefficient of resistance: ±1ppm/
Long term stability with inorganic passivation
℃
Thin film structure enabling low noise and anti-sulfur
Applications
Industrial measurement, electrical scales
High precision sensors, medical electronics
・
・
Part numbering system
◆
◆
URG 2012 L - 102 - L - T1
Packaging quantity: T1(1,000pcs),
T05(500pcs), T01(100pcs)
Series code
Size: URG1608, URG2012,
Resistance tolerance
URG3216, URG5025, URG6432
Nominal resistance value (E-24: 3 digit, E-96: 4 digit,
URG3216, URG5025, URG6432: all 4 digit)
Temperature coefficient of resistance
Electrical Specification
Resistance range(Ω) Resistance tolerance
Temperature
Power
Resistance
value series temperature
Operating
Packaging
quantity
Maximum
voltage
Type
coefficient
ratings
of resistance
±0.01% (L)
±0.02% (P) ±0.05% (W) ±0.1% (B)
±0.5% (D)
*1
±1（K）
URG1608
URG2012
URG3216
URG5025
URG6432
1/16W
250 ≦R ≦7.5K
250 ≦R ≦36K
250 ≦R ≦68K
250 ≦R ≦100K
250 ≦R ≦100K
100≦R≦7.5k
100V
150V
200V
300V
300V
*2
±2（L）
*1
±1（K）
1/10W
1/4W
1/2W
3/4W
100≦R≦36k
100≦R≦68k
100≦R≦150k
100≦R≦200k
T1
*2
±２（L）
-55℃ ̃
*1
±1（K）
T05
T01
155℃
E24, E96
*2
±２（L）
*1
±1（K）
*2
±２（L）
*1
±1（K）
*2
±２（L）
*1: Applicable TCR K (±1.0) at temperature range 25℃～ 65℃
Applicable TCR K (±1.5) at temperature range -20℃～ 25℃, 65℃̃125℃
*2: Applicable TCR L at temperature range -20℃～ 125℃
*Contact us for requirements not listed in above table.
11
Dimensions
◆
L
Size
(inch)
b
Type
L
W
a
t
a
a
URG1608 0603
URG2012 0805
URG3216 1206
URG5025 2010
URG6432 2512
1.60±0.20
0.80＋0.25/－0.20
0.30±0.20
0.30±0.20
0.40＋0.15/－0.10
W
2.00±0.20
3.20±0.20
1.25＋0.25/－0.20
1.60±0.25
0.40±0.20
0.50±0.25
0.60±0.25
0.75±0.25
0.40±0.20
0.50±0.20
0.60±0.25
0.80±0.20
0.40＋0.15/－0.10
0.40＋0.15/－0.10
0.45±0.10
t
b
5.00±0.20
2.50±0.25
6.40＋0.20/－0.40
3.20±0.25
0.45±0.20
（unit：mm）
Reliability specification
◆
Test items
Standard
±0.02％+0.01Ω
Condition (test methods (MIL-PRF-55342/JIS C5201-1)
*1
Short time overload
2.5 x rated voltage, 5seconds
±0.02％+0.01Ω(R≧250Ω)
±0.05％+0.01Ω(R＜250Ω)
±0.05％+0.01Ω
*1
Life (biased)
70℃, rated voltage, 90min on 30min off, 2000hours
High temperature high humidity
Temperature shock
85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 1000hours
-65℃ (15min) ～ 150℃ (15min) 100cycles
±0.02％+0.01Ω
High temperature exposure
Resistance to soldering heat
±0.05％+0.01Ω
155℃, no bias, 1000hours
±0.0１％+0.01Ω
235±5℃, 30 seconds (reflow), (by MIL-PRF-55342)
*1 Rated voltage is given by E= R x P
E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
12
Metal thin film chip resistors
(the highest reliability and precision)
URG series
■
Reliability test data
◆
Biased life test
○
1000
800
600
400
200
0
1000
800
600
400
200
0
URG2012
URG3216
LL70℃_0.25W, n = 20
LL70℃_0.25W, n = 20
-200
-400
-600
-800
-1000
-200
-400
-600
-800
-1000
250Ω
20kΩ
1kΩ
10kΩ
32kΩ
250Ω
1kΩ
68kΩ
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1000ꢀꢀꢀꢀꢀꢀꢀꢀꢀ10000
Test duration(h)
110ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1000ꢀꢀꢀꢀꢀꢀꢀꢀꢀ10000
Test duration(h)
High temperature high humidity (biased)
○
○
○
500
500
400
300
200
100
0
400
300
200
100
0
URG2012
URG3216
THB 85 ℃, 85 %, n = 20
THB 85 ℃, 85 %, n = 20
-100
-200
-300
-400
-500
-100
-200
-300
-400
-500
250Ω
20kΩ
1kΩ
10kΩ
32kΩ
250Ω
1kΩ
68kΩ
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1000ꢀꢀꢀꢀꢀꢀꢀꢀꢀ10000
Test duration(h)
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1000ꢀꢀꢀꢀꢀꢀꢀꢀꢀ10000
Test duration(h)
Temperature shock
200
200
150
100
50
URG2012,ꢀn = 10
URG3216, n = 10
150
Thermal Shock_-65℃ to +150℃
100
Thermal Shock_ -65℃ to +150℃
50
0
0
-50
-50
-100
-150
-200
-100
-150
-200
250Ω
1kΩ
68kΩ
250Ω
1kΩ
68kΩ
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ1000
Number of cycles
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ1000
Number of cycles
High temperature exposure
500
500
400
300
200
100
0
400
300
200
100
0
URG2012, n = 20
URG3216, n = 20
High Temperature Exposure,155℃
High Temperature Exposure,155℃
-100
-200
-300
-400
-500
-100
-200
-300
-400
-500
250Ω
1kΩ
32kΩ
250Ω
1kΩ
68kΩ
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1000ꢀꢀꢀꢀꢀꢀꢀꢀꢀ10000
Test duration(h)
10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 1000ꢀꢀꢀꢀꢀꢀꢀꢀꢀ10000
Test duration(h)
13
Temperature coefficient of Resistance
◆
URG2012
○
1000
1000
800
600
400
200
0
Variation of resistance with temperature
URG2012-1kΩ
Variation of resistance with temperature
URG2012-32kΩ
800
600
400
200
0
No.1
No.2
No.3
No.4
No.5
No.6
No.7
No.8
No.9
No.10
No.1
No.2
No.3
No.4
No.5
No.6
No.7
No.8
No.9
No.10
-200
-400
-600
-800
-1000
-200
-400
-600
-800
-1000
±2ppm / ℃
±5ppm / ℃
±2ppm / ℃
±5ppm / ℃
-75 ꢀ-50ꢀ -25 ꢀ 0ꢀ 25ꢀ 50ꢀ 75ꢀ 100 125 150ꢀ 175
Ambient temperature (℃)
-75 ꢀ-50ꢀ -25 ꢀ 0ꢀ 25ꢀ 50ꢀ 75ꢀ 100 125 150ꢀ 175
Ambient temperature (℃)
URG3216
○
1000
800
600
400
200
0
1000
800
600
400
200
0
Variation of resistance with temperature
URG3216-1kΩ
Variation of resistance with temperature
URG3216-68kΩ
No.1
No.2
No.3
No.4
No.5
No.6
No.7
No.8
No.9
No.10
No.1
No.2
No.3
No.4
No.5
No.6
No.7
No.8
No.9
No.10
-200
-400
-600
-800
-1000
-200
-400
-600
-800
-1000
±2ppm / ℃
±5ppm / ℃
±2ppm / ℃
±5ppm / ℃
-75 ꢀ-50ꢀ -25 ꢀ 0ꢀ 25ꢀ 50ꢀ 75ꢀ 100 125 150ꢀ 175
Ambient temperature (℃)
-75 ꢀ-50ꢀ -25 ꢀ 0ꢀ 25ꢀ 50ꢀ 75ꢀ 100 125 150ꢀ 175
Ambient temperature (℃)
Derating Curve
◆
100
50
0
-55ꢀꢀꢀꢀ 0ꢀꢀꢀꢀꢀ50ꢀ70ꢀꢀ100ꢀꢀꢀꢀꢀ155
Ambient temperature (℃)
14
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