W72M64V-XBX [ETC]

Flash MCP ; 闪存MCP
W72M64V-XBX
型号: W72M64V-XBX
厂家: ETC    ETC
描述:

Flash MCP
闪存MCP

闪存
文件: 总15页 (文件大小:161K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
W72M64V-XBX  
2Mx64 3.3V Simultaneous Operation Flash Multi-Chip Package  
*Preliminary  
FEATURES  
!
Access Times of 100, 120, 150ns  
!
!
!
!
Unlock Bypass Program command  
!
Packaging  
Reduces overall programming time when  
issuing multiple program command sequences  
159 PBGA, 13x22mm - 1.27mm pitch  
Ready/Busy output (RY/BY)  
!
!
1,000,000 Erase/Program Cycles  
Sector Architecture  
Hardware method for detecting program or erase  
cycle completion  
Bank 1 (8Mb): eight 4K word, fifteen 32K word  
Bank 2 (24Mb): forty-eight 32K word  
Hardware reset pin (RESET)  
Hardware method of resetting the internal state  
machine to the read mode  
!
!
!
!
Bottom boot block  
Zero Power Operation  
Organized as 2Mx64 or 2x2Mx32  
WP/ACC input pin  
Write protect (WP) function allows protection of  
two outermost boot sectors, regardless of  
sector protect status  
Commercial, Industrial and Military Temperature  
Ranges  
!
!
3.3 Volt for Read and Write Operations  
Simultaneous Read/Write Operation:  
Acceleration (ACC) function accelerates  
program timing  
!
Sector Protection  
Data can be continuously read from one bank  
while executing erase/program functions in  
another bank  
Hardware method of locking a sector, either  
in-system or using programming equipment, to  
prevent any program or erase operation within  
that sector  
Zero latency between read and write operations  
!
!
Erase Suspend/Resume  
Temporary Sector Unprotect allows changing  
data in protected sectors in-system  
Suspends erase operations to allow  
programming in same bank  
Data Polling and Toggle Bits  
Note: For programming information refer to Flash Programming  
W72M64V-XBX Application Note.  
Provides a software method of detecting the  
status of program or erase cycles  
* Preliminary datasheet. This datasheet describes a product that is not characterized or qualified and is subject to  
change without notice.  
1
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  
November2003 Rev. 1  
W72M64V-XBX  
FIG 1: PIN CONFIGURATION FOR W72M64V-XBX  
TOP VIEW  
PIN DESCRIPTION  
1
2
3
4
5
6
7
8
9 10  
DQ0-63  
A0-20  
Data Inputs/Outputs  
Address Inputs  
GND GND GND  
V
CC  
V
CC  
GND GND GND  
V
CC  
A
B
C
D
E
F
WE1-4  
CS1-4  
OE  
Write Enables  
Chip Selects  
V
CC  
CC  
GND DQ41 WE  
3
V
CC  
DQ57 DNU WE  
4
V
CC  
V
CC  
Output Enable  
Hardware Reset  
V
DQ33 DQ43 DQ45 DQ47 DQ49 DQ59 DQ61 DQ63  
V
CC  
RESET  
Hardware Write  
Protect/Acceleration  
V
CC  
CC  
DQ40 DQ35 DQ37 DQ39 DQ56 DQ51 DQ53 DQ55  
DQ32 DQ42 DQ44 DQ46 DQ48 DQ58 DQ60 DQ62  
V
CC  
CC  
WP/ACC  
V
V
RY/BY Ready/Busy Output  
VCC  
GND  
DNU  
Power Supply  
Ground  
GND  
GND  
GND  
CS  
3
DQ34 DQ36 DQ38 CS  
4
DQ50 DQ52 DQ54 GND  
Do Not Use  
OE  
A
0
DNU  
V
CC  
A12  
A
16  
DNU*  
A
20  
GND  
GND  
G
H
J
A
2
WP/ACC  
A
11  
GND  
V
CC  
A
7
A
10  
A15  
GND  
GND  
A
3
4
A
6
A
9
V
CC  
GND  
A
1
RESET  
A
13  
GND  
GND  
GND  
A
A
17  
RY/BY GND  
A
14  
A
5
A
18  
A
8
K
L
GND DQ17 WE  
2
DQ29 DNU DQ  
9
DQ  
4
WE1  
A
19  
V
CC  
DQ24 DQ19 DQ21 DQ31 DQ  
1
DQ11 DQ  
6
DQ15  
V
CC  
CC  
M
N
P
R
T
V
CC DQ16 DQ26 DQ28 DQ23 DQ  
8
DQ  
3
DQ13 DQ  
7
V
V
CC  
CC  
CS  
2
DQ18 DQ20 DQ30 DQ  
0
DQ10 DQ  
5
DQ14  
V
CC  
CC  
V
VCC  
DQ25 DQ27 DQ22 CS  
1
DQ  
2
DQ12 GND  
V
V
CC  
GND GND GND  
VCC  
V
CC  
GND GND GND  
VCC  
BLOCK DIAGRAM  
WE  
1
WE  
2
WE  
3
WE  
4
* Ball G8 is DNU on this device and will become A21  
on the W74M64V-XBX  
CS  
4
CS  
3
CS  
1
CS  
2
RY/BY  
RESET  
OE  
A0-20  
BYTE  
BYTE  
BYTE  
2M x 16  
2M x 16  
2M x 16  
2M x 16 BYTE  
VCC  
WP/ACC  
DQ32-47  
DQ48-63  
DQ0-15  
DQ16-31  
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520  
2
W72M64V-XBX  
ABSOLUTEMAXIMUMRATINGS  
CAPACITANCE  
(TA = +25°C)  
Parameter  
Unit  
°C  
Parameter  
Symbol  
Conditions  
Max Unit  
Operating Temperature  
Supply Voltage Range (VCC)  
Signal Voltage Range  
Storage Temperature Range  
Endurance (write/erase cycles)  
NOTES:  
-55 to +125  
-0.5 to +4.0  
WE1-4 capacitance  
CWE  
CCS  
CI/O  
V
V
IN = 0 V, f = 1.0 MHz 25  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
V
-0.5 to Vcc +0.5  
-55 to +150  
V
CS1-4 capacitance  
IN = 0 V, f = 1.0 MHz 25  
°C  
Data I/O capacitance  
V
V
V
V
V
I/O = 0 V, f = 1.0 MHz 12  
IN = 0 V, f = 1.0 MHz 25  
IN = 0 V, f = 1.0 MHz 20  
IN = 0 V, f = 1.0 MHz 20  
IN = 0 V, f = 1.0 MHz 30  
1,000,000 min.  
cycles  
Address input capacitance CAD  
1. Stresses above the absolute maximum rating may cause  
permanent damage to the device. Extended operation at the maximum  
levels may degrade performance and affect reliability.  
RESET capacitance  
RY/BY capacitance  
WP/ACC capacitance  
CRS  
CRB  
CWA  
RECOMMENDEDOPERATINGCONDITIONS  
This parameter is guaranteed by design but not tested.  
Parameter  
Symbol  
VCC  
TA  
Min  
3.0  
-55  
-40  
Max  
3.6  
Unit  
V
Supply Voltage  
DATA RETENTION  
Operating Temp. (Mil.)  
Operating Temp. (Ind.)  
+125  
+85  
°C  
°C  
Parameter  
Test Conditions  
150°C  
Min  
10  
Unit  
TA  
Pattern Data  
Retention Time  
Years  
Years  
125°C  
20  
DCCHARACTERISTICS-CMOSCOMPATIBLE  
(VCC = 3.3V ± 0.3V, TA = -55°C to +125°C)  
Parameter  
Symbol  
ILI  
Conditions  
Min  
Max  
10  
Unit  
µA  
Input Leakage Current  
Output Leakage Current  
VCC = 3.6V, VIN = GND to VCC  
VCC = 3.6V, VOUT = GND to VCC  
CS = VIL, OE = VIH, f = 5MHz  
CS = VIL, OE = VIH, WE = VIL  
-10  
-10  
ILO  
10  
µA  
VCC Active Current for Read (1)  
ICC1  
ICC2  
65  
mA  
mA  
VCC Active Current for Program or Erase (2,3)  
120  
VCC Standby Current (2)  
VCC Reset Current (2)  
ICC3  
ICC4  
ICC5  
CS = RESET = VCC ± 0.3V  
RESET = VSS ± 0.3V  
20  
20  
µA  
µA  
Automatic Sleep Mode (2,4)  
VIH = VCC ± 0.3V;  
VIL = VSS ± 0.3V  
20  
µA  
mA  
mA  
VCC Active Read-While-Program Current (1,2)  
VCC Active Program-While-Erase Current (1,2)  
ICC6  
ICC7  
ICC8  
CS = VIL, OE = VIH  
CS = VIL, OE = VIH  
180  
180  
VCC Active Program-While-Erase-Suspended  
Current (2,5)  
CS = VIL, OE = VIH  
140  
mA  
ACC Accelerated Program Current  
IACC  
ACC Pin  
40  
CS = VIL, OE = VIH VCC Pin  
120  
mA  
V
Input Low Voltage  
Input High Voltage  
VIL  
VIH  
-0.5  
0.8  
0.7 x Vcc  
Vcc + 0.3  
V
Voltage for WP/ACC Sector  
Protect/Unprotect and Program Acceleration  
VHH  
Vcc = 3.0V + 0.3V  
8.5  
8.5  
9.5  
V
Voltage for Autoselect and Temporary  
Sector Unprotect  
VID  
Vcc = 3.0V + 0.3V  
12.5  
0.45  
V
V
Output Low Voltage  
VOL  
IOL = 4.0 mA, VCC = 3.0V  
Output High Voltage  
VOH1  
VLKO  
IOH = -2.0 mA, VCC = 3.0V  
0.85 X VCC  
2.3  
V
V
Low VCC Lock-Out Voltage (5)  
2.5  
NOTES:  
1. The ICC current listed includes both the DC operating current and the frequency dependent component (at 5 MHz). The frequency  
component typically is less than 8 mA/MHz, with OE at VIH.  
2. Maximum ICC specifications are tested with VCC = VCC MAX  
3. ICC active while Embedded Algorithm (program or erase) is in progress.  
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30ns.  
5. Not 100% tested.  
3
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  
W72M64V-XBX  
ACCHARACTERISTICSWRITE/ERASE/PROGRAMOPERATIONS-CSCONTROLLED  
(VCC = 3.3V ± 0.3V, TA = -55°C to +125°C)  
Parameter  
Symbol  
-100  
-120  
-150  
Unit  
Min Max  
Min Max Min Max  
Write Cycle Time  
tAVAV  
tWLEL  
tELEH  
tAVWL  
tDVEH  
tEHDX  
tELAX  
tEHEL  
tW C  
tW S  
tCP  
100  
0
120  
0
150  
0
ns  
ns  
Write Enable Setup Time  
Chip Select Pulse Width  
Address Setup Time  
45  
0
50  
0
50  
0
ns  
tAS  
ns  
Data Setup Time  
tDS  
45  
0
50  
0
50  
0
ns  
Data Hold Time  
tDH  
ns  
Address Hold Time  
tAH  
45  
30  
300  
15  
0
50  
30  
50  
30  
ns  
Chip Select Pulse Width High  
Duration of Byte Programming Operation (1)  
Sector Erase Time (2)  
tCPH  
ns  
t WHWH1  
tWHWH2  
tGHEL  
300  
15  
300  
15  
µs  
sec  
ns  
Read Recovery Time Before Write (3)  
Chip Programming Time (4)  
0
0
108  
108  
108  
sec  
1. Typical value for tWHWH1 is 7µs.  
2. Typical value for tWHWH2 is 0.7 sec.  
3. Guaranteed by design, but not tested.  
4. Typical value is 36 sec. The typical chip programming time is considerably less than the maximum chip programming time  
listed, since most bytes program faster than the maximum program times listed.  
ACTESTCONDITIONS  
FIG 2: AC TEST CIRCUIT  
Parameter  
Typ  
Unit  
V
I
OL  
Input Pulse Levels  
Input Rise and Fall  
Input and Output Reference Level  
Output Timing Reference Level  
NOTES:  
VIL = 0, VIH = 2.5  
5
ns  
V
Current Source  
1.5  
1.5  
V
V
Z
1.5V  
D.U.T.  
EFF = 50 pf  
(Bipolar Supply  
VZ is programmable from -2V to +7V.  
IOL & IOH programmable from 0 to 16mA.  
Tester Impedance Z0 = 75.  
C
VZ is typically the midpoint of VOH and VOL.  
IOL & IOH are adjusted to simulate a typical resistive  
load circuit.  
IOH  
Current Source  
ATE tester includes jig capacitance.  
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520  
4
W72M64V-XBX  
ACCHARACTERISTICSWRITE/ERASE/PROGRAMOPERATIONS-WECONTROLLED  
(VCC = 3.3V ± 0.3V, TA = -55°C to +125°C)  
Parameter  
Symbol  
-100  
-120  
Min  
-150  
Min  
Unit  
Min  
Max  
Max  
Max  
Write Cycle Time  
tAVAV  
tELWL  
tWC  
100  
0
120  
0
150  
0
ns  
ns  
ns  
Chip Select Setup Time  
tCS  
tWP  
tAS  
Write Enable Pulse Width  
Address Setup Time  
tWLWH  
tAVWL  
tDVWH  
tWHDX  
tWLAX  
tWHWL  
tWHWH1  
tWHWH2  
tGHWL  
tVCS  
50  
0
50  
0
65  
0
ns  
ns  
Data Setup Time  
tDS  
50  
0
50  
0
65  
0
Data Hold Time  
tDH  
ns  
ns  
Address Hold Time  
tAH  
50  
30  
300  
15  
0
50  
30  
300  
15  
0
65  
35  
Write Enable Pulse Width High  
Duration of Byte Programming Operation (1)  
Sector Erase (2)  
tWPH  
ns  
300  
15  
µs  
sec  
ns  
µs  
sec  
ns  
Read Recovery Time before Write (3)  
VCC Setup Time  
0
50  
50  
50  
Chip Programming Time (4)  
Address Setup Time to OE low during toggle bit polling  
108  
108  
108  
tA S O  
15  
15  
15  
Address Hold Time From CS or OE high  
during toggle  
tA H T  
tO E P H  
tSR /W  
t R B  
0
20  
0
0
20  
0
0
20  
0
ns  
ns  
ns  
ns  
ns  
Output Enable High during toggle bit polling  
Latency Between Read and Write Operations  
Write Recovery Time from RY/BY  
0
0
0
Program/Erase Valid to RY/BY  
tB U S Y  
90  
90  
90  
1. Typical value for tWHWH1 is 7µs.  
2. Typical value for tWHWH2 is 0.7 sec.  
3. Guaranteed by design, but not tested.  
4. Typical value is 36 sec. The typical chip programming time is considerably less than the maximum chip programming time listed, since most  
bytes program faster than the maximum program times listed.  
ACCHARACTERISTICSREAD-ONLYOPERATIONS  
(VCC = 3.3V ± 0.3V, TA = -55°C to +125°C)  
Parameter  
Symbol  
-100  
Min Max Min Max Min Max  
100 120 150  
-120  
-150  
Unit  
Read Cycle Time  
tAVAV  
tRC  
tACC  
tCE  
tOE  
tDF  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address Access Time  
tAVQV  
tELQV  
tGLQV  
tEHQZ  
tGHQZ  
tAXQX  
100  
100  
40  
120  
120  
50  
150  
150  
55  
Chip Select Access Time  
Output Enable to Output Valid  
Chip Select High to Output High Z (1)  
Output Enable High to Output High Z (1)  
20  
20  
20  
tDF  
20  
20  
20  
Output Hold from Addresses, CS or OE Change,  
Whichever occurs first  
tOH  
0
0
0
Read  
tOEH  
0
0
0
Output Enable Hold Time (1)  
Toggleand  
Data Polling  
10  
10  
10  
1. Guaranteed by design, not tested.  
5
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  
W72M64V-XBX  
FIG 3: AC WAVEFORMS FOR READ OPERATIONS  
tRC  
Addresses  
CS  
Addresses Stable  
tACC  
tDF  
tOE  
OE  
tOEH  
WE  
tCE  
tOH  
High Z  
High Z  
Outputs  
Output Valid  
RESET  
RY/BY  
OV  
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520  
6
W72M64V-XBX  
ACCHARACTERISTICSHARDWARERESET(RESET)  
Parameter  
Symbol  
-100  
-120  
-150  
Unit  
Min  
Max  
Min  
Max  
Min  
Max  
RESET Pin Low (During Embedded Algorithms)  
to Read Mode (See Note)  
tready  
20  
20  
20  
µs  
RESET Pin Low (NOT During Embedded Algorithms)  
to Read Mode (See Note)  
tready  
tRP  
500  
500  
500  
ns  
ns  
ns  
µs  
ns  
RESET Pulse Width  
500  
50  
20  
0
500  
50  
20  
0
500  
50  
20  
0
RESET High Time Before Read (See Note)  
RESET Low to Standby Mode  
RY/BY Recovery Time  
tRH  
tRPD  
tRB  
Note: Not tested.  
FIG 4: RESET TIMINGS NOT DURING EMBEDDEDALGORITHMS  
RY/BY  
CS, OE  
t
RH  
RESET  
t
RP  
t
Ready  
FIG 5: RESET TIMINGS DURING EMBEDDEDALGORITHMS  
t
Ready  
RY/BY  
t
RB  
CS, OE  
RESET  
t
RP  
7
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  
W72M64V-XBX  
FIG 6: PROGRAM OPERATION  
tWC  
tAS  
Addresses  
CS  
555h  
PA  
PA  
PA  
tAS  
tCH  
OE  
tWHWH1  
tWP  
WE  
tCS  
tWPH  
tDS  
tDH  
A0h  
Status  
DOUT  
PD  
Data  
tRB  
tBUSY  
RY/BY  
V
CC  
tVCS  
NOTES:  
1. PA is the address of the memory location to be programmed.  
2. PD is the data to be programmed at byte address.  
3. DOUT is the output of the data written to the device.  
4. Figure indicates last two bus cycles of four bus cycle sequence.  
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520  
8
W72M64V-XBX  
FIG 7: ACCELERATED PROGRAM TIMING DIAGRAM  
VHH  
VIL or VIH  
WP/ACC  
VIL or VIH  
tVHH  
tVHH  
FIG 8: CHIP/SECTOR ERASE OPERATION TIMINGS  
tWC  
tAS  
Addresses  
CS  
2AAh  
SA  
VA  
VA  
555h for  
chip erase  
tAH  
tCH  
OE  
tWP  
WE  
tCS  
tWHWH2  
tWPH  
tDS  
tDH  
In  
Progress  
55h  
Complete  
tRB  
30h  
Data  
RY/BY  
VCC  
10 for Chip Erase  
tBUSY  
tVCS  
Notes:  
1. SA = Sector Address (for Sector Erase), VA = Valid Address for reading status data  
9
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  
W72M64V-XBX  
FIG 9: BACK TO BACK READ/WRITE CYCLE TIMINGS  
tWC  
tWC  
tRC  
tWC  
Valid PA  
Valid PA  
Valid PA  
Valid RA  
Addresses  
CS  
tAH  
tCPH  
tACC  
tCE  
tCP  
tOE  
OE  
tOEH  
tWP  
tGHWL  
WE  
tDF  
tWPH  
tDS  
tOH  
tDH  
Valid In  
Data  
Valid In  
Valid In  
Valid Out  
tSR/W  
WE Controlled Write Cycle  
Read Cycle  
CS Controlled Write Cycle  
FIG. 10: DATAPOLLING TIMINGS (DURING EMBEDDEDALGORITHMS)  
tRC  
Addresses  
CS  
VA  
VA  
VA  
t
ACC  
tCE  
tCH  
tOE  
OE  
tOEH  
tDF  
WE  
tOH  
High Z  
High Z  
DQ  
7
Complement  
True  
True  
Valid Data  
Complement  
Status Data  
Valid Data  
Status Data  
DQ0-DQ6  
tBUSY  
RY/BY  
NOTE: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle.  
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520  
10  
W72M64V-XBX  
FIG 11: TOGGLE BIT TIMINGS (DURING EMBEDDEDALGORITHMS)  
tAHT  
tAS  
Addresses  
tAHT  
tASO  
CS  
tCEPH  
tOEH  
WE  
tOEPH  
OE  
tDH  
tOE  
Valid  
Data  
Valid  
Status  
Valid  
Status  
Valid  
Status  
Valid Data  
DQ6/DQ2  
(Stops Toggling)  
(First Read)  
(Second Read)  
RY/BY  
NOTE: VA = Valid address, not required for DQ6. Illustration shows first two status cycle after command sequence, last status read  
cycle, and array data read cycle.  
FIG 12: DQ2 VS. DQ6  
Enter  
Embedded  
Erasing  
Erase  
Resume  
Enter Erase  
Suspend Program  
Erase  
Suspend  
Erase  
Complete  
Erase  
Suspend  
Program  
Erase Suspend  
Read  
Erase  
Erase Suspend  
Read  
Erase  
WE  
DQ6  
DQ2  
NOTE: DQ2 toggles only when read at an address within an erase-suspended sector. The system may use OE or CS to toggle DQ2 and DQ6.  
11  
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  
W72M64V-XBX  
FIG 13: SECTOR/SECTOR BLOCK PROTECTAND UNPROTECTTIMING DIAGRAM  
V
ID  
IH  
V
RESET  
SA, A  
6,  
Valid*  
Verify  
40h  
Valid*  
Status  
Valid*  
A1  
, A0  
Sector/Sector Block Protect or Unprotect  
60h  
60h  
Data  
Sector/Sector Block Protect: 150 µs  
Sector/Sector Block Unprotect: 15 ms  
1 µs  
CS  
WE  
OE  
NOTES:  
For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0.  
ACCHARACTERISTICSALTERNATECSCONTROLLEDERASEANDPROGRAMOPERATIONS  
Parameter  
Speed Options  
JEDEC  
Std  
tWC  
Description  
100  
90  
0
120  
120  
0
150  
150  
0
Unit  
ns  
tAVAV  
tAVWL  
tELAX  
Write Cycle Time (1)  
Address Setup Time  
Address Hold Time  
Min  
Min  
Min  
Min  
Min  
Min  
Min  
Min  
Min  
Min  
Typ  
Typ  
Typ  
tAS  
ns  
tAH  
45  
45  
0
50  
50  
0
50  
50  
0
ns  
tDVEH  
tEHDX  
tGHEL  
tDS  
Data Setup Time  
ns  
tDH  
Data Hold Time  
ns  
tGHEL  
tWS  
Read Recovery Time Before Write (OE High to WE Low)  
WE Setup Time  
0
0
0
ns  
tWLEL  
tEHWH  
tELEH  
0
0
0
ns  
tWH  
WE Hold Time  
0
0
0
ns  
tCP  
CS Pulse Width  
45  
30  
9
50  
30  
9
50  
30  
9
ns  
tEHEL  
tCPH  
tWHWH1  
tWHWH1  
tWHWH2  
CS Pulse Width High  
ns  
tWHWH1  
tWHWH1  
tWHWH2  
Programming Operation  
Byte  
µs  
Accelerated Programming Operation, Word or Byte  
Sector Erase Operation  
7
7
7
µs  
0.7  
0.7  
0.7  
sec  
NOTE:  
1. Not tested.  
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520  
12  
W72M64V-XBX  
FIG 14: ALTERNATE CS CONTROLLED WRITE (ERASE/PROGRAM)  
OPERATION TIMINGS  
555 for Program  
2AA for Erase  
PA for Program  
SA for Sector Erase  
555 for Chip Erase  
Data Polling  
PA  
Addresses  
WE  
tAS  
t
WC  
WH  
tAH  
t
tGHEL  
OE  
CS  
t
CP  
t
WHWH1 OR 2  
t
WS  
tCPH  
t
BUSY  
t
DS  
tDH  
Data  
DQ7  
DOUT  
tHR  
A0 for Program  
55 for Erase  
PD for Program  
30 for Sector Erase  
10 for Chip Erase  
RESET  
RY/BY  
NOTES:  
1. Figure indicates last two bus cycles of a program or erase operation.  
2. PA = program address, SA = sector address, PD = program data.  
3. DQ7 is the complement of the data written to the device. DOUT is the data written to the device.  
13  
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  
W72M64V-XBX  
PACKAGE:159PBGA  
BOTTOM VIEW  
159 Y Ø 0.762 (0.030) NOM  
10  
9
8
7
6
5
4
3
2
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
0.61 (0.024)  
NOM  
1.27 (0.050) NOM  
11.43 (0.450) NOM  
13.1 (0.516) MAX  
2.03 (0.080) MAX  
ALL LINEAR DIMENSIONSARE IN MILLIMETERS AND PARENTHETICALLY IN INCHES.  
ORDERING INFORMATION  
W 7 2M64 V XXX B X  
WHITE ELECTRONIC DESIGNS CORP.  
Flash  
ORGANIZATION, 2M x 64  
User configurable as 2 x 2M x 32  
3.3V Power supply  
ACCESS TIME (ns)  
100 = 100ns  
120 = 120ns  
150 = 150ns  
PACKAGETYPE:  
B = 159 Plastic BGA, 13mm x 22mm  
DEVICE GRADE:  
M
I
C
=
=
=
Military Screened  
Industrial  
Commercial  
-55°C to +125°C  
-40°C to +85°C  
0°C to +70°C  
White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520  
14  
W72M64V-XBX  
Document Title  
2M x 64 Simultaneous Operation Flash Multi-Chip Package  
Revision History  
Rev #  
Rev 0  
Rev 1  
History  
Release Date  
Status  
Initial Release  
November 2002  
November 2003  
Advanced  
Preliminary  
Update (pg 1, 14, 15)  
1.1 Change status to preliminary  
1.2 Change mechanical drawing to new style  
15  
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com  

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