74ABT126CSC [FAIRCHILD]
Quad Buffer with 3-STATE Outputs; 四路缓冲带3态输出型号: | 74ABT126CSC |
厂家: | FAIRCHILD SEMICONDUCTOR |
描述: | Quad Buffer with 3-STATE Outputs |
文件: | 总6页 (文件大小:85K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
January 1995
Revised February 2005
74ABT126
Quad Buffer with 3-STATE Outputs
General Description
The ABT126 contains four independent non-inverting buff-
Features
■ Non-inverting buffers
ers with 3-STATE outputs.
■ Output sink capability of 64 mA, source capability of
32 m
■ Guaranteed latchup protection
■ High impedance glitch free bus loading during entire
power up and power down cycle
■ Nondestructive hot insertion capability
■ Disable time less than enable time to avoid bus
contention
Ordering Code:
Package
Order Number
Package Description
Number
74ABT126CSC
74ABT126CSJ
74ABT126CMTC
M14A
M14D
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Pb-Free 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
MTC14 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
74ABT126CMTCX_NL MTC14 Pb-Free 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm
(Note 1) Wide
Devices also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Pb-Free package per JEDEC J-STD-020B.
Note 1: “_NL” indicates Pb-Free package (per JEDEC J-STD-020B). Device available in Tape and Reel only.
Connection Diagram
Pin Descriptions
Pin Names
Descriptions
Inputs
Outputs
An, Bn
On
Function Table
Inputs
An
Output
On
Bn
H
H
L
L
H
X
L
H
Z
H
L
Z
X
HIGH Voltage Level
LOW Voltage Level
HIGH Impedance
Immaterial
© 2005 Fairchild Semiconductor Corporation
DS011692
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Absolute Maximum Ratings(Note 2)
Recommended Operating
Conditions
65 C to 150 C
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
VCC Pin Potential to Ground Pin
Input Voltage (Note 3)
55 C to 125 C
55 C to 150 C
0.5V to 7.0V
Free Air Ambient Temperature
Supply Voltage
40 C to 85 C
4.5V to 5.5V
Minimum Input Edge Rate ( V/ t)
Data Input
0.5V to 7.0V
50 mV/ns
Input Current (Note 3)
30 mA to 5.0 mA
Enable Input
100 mV/ns
Voltage Applied to Any Output
in the Disabled or
Power-Off State
0.5V to 5.5V
0.5V to VCC
in the HIGH State
Current Applied to Output
in LOW State (Max)
twice the rated IOL (mA)
Note 2: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
DC Latchup Source Current
(Across Comm Operating Range)
Over Voltage Latchup (I/O)
300 mA
10V
Note 3: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
V
Symbol
Parameter
Input HIGH Voltage
Min
Typ
Max
Units
Conditions
Recognized HIGH Signal
Recognized LOW Signal
CC
V
V
V
V
2.0
V
V
V
V
V
V
IH
Input LOW Voltage
0.8
1.2
IL
Input Clamp Diode Voltage
Output HIGH Voltage
Min
Min
Min
Min
I
I
I
I
18 mA
3 mA
CD
OH
IN
2.5
2.0
OH
OH
OL
32 mA
V
Output LOW Voltage
Input HIGH Current
0.55
64 mA
OL
I
1
1
7
1
1
V
V
V
V
V
2.7V (Note 4)
IH
IN
IN
IN
IN
IN
A
A
A
Max
Max
Max
0.0
V
CC
I
Input HIGH Current Breakdown Test
Input LOW Current
7.0V
BVI
I
0.5V (Note 4)
IL
0.0V
V
Input Leakage Test
4.75
-100
V
A
I
1.9 A, All Other Pin Grounded
ID
ID
I
Output Leakage Current
10
0
0
5.5V
5.5V
Max
V
2.7V; OE
2.0V
2.0V
OZH
OUT
n
n
I
Output Leakage Current
Output Short-Circuit Current
Output HIGH Leakage Current
Bus Drainage Test
10
275
50
A
mA
A
V
V
V
V
0.5V; OE
0.0V
OZL
OUT
OUT
OUT
OUT
I
OS
I
Max
0.0
V
CC
CEX
I
100
50
A
5.5V; All Others GND
ZZ
I
Power Supply Current
Power Supply Current
A
Max
Max
All Outputs HIGH
All Outputs LOW
CCH
I
15
mA
CCL
I
Power Supply Current
50
A
Max
Max
Max
OE
V
;
CCZ
n
CC
All Others at V or Ground
CC
I
Additional I /Input
Outputs Enabled
Outputs 3-STATE
Outputs 3-STATE
1.5
1.5
50
mA
mA
A
V
V
2.1V
CCT
CC
I
CC
Enable Input V
V
2.1V
2.1V
I
CC
Data Input V
V
I
CC
All Others at V or Ground
CC
I
Dynamic I
(Note 4)
No Load
mA/
Outputs Open
CCD
CC
0.1
MHz
OE
GND, (Note 5)
n
One Bit Toggling, 50% Duty Cycle
Note 4: Guaranteed, but not tested.
Note 5: For 8 bits toggling, I
0.8 mA/MHz.
CCD
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2
AC Electrical Characteristics
T
25 C
5V
T
40 C to 85 C
4.5V–5.5V
A
A
V
V
CC
CC
Symbol
Parameter
Units
C
50 pF
C
50 pF
Max
L
L
Min
1.0
1.0
1.0
1.0
1.0
1.0
Typ
Max
4.4
4.6
6.5
6.5
5.8
5.5
Min
1.0
1.0
1.0
1.0
1.0
1.0
t
t
t
t
t
t
Propagation Delay
4.4
4.6
6.5
6.5
5.8
5.5
PLH
ns
ns
ns
Data to Outputs
Output Enable
Time
PHL
PZH
PZL
PHZ
PLZ
Output Disable
Time
Capacitance
Conditions
Symbol
Parameter
Typ
Units
T
25 C
A
C
C
Input Capacitance
Output Capacitance
5.0
9.0
pF
pF
V
V
0V
IN
CC
CC
(Note 6)
5.0V
OUT
Note 6: C
is measured at frequency f 1 MHz, per MIL-STD-883, Method 3012.
OUT
3
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Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Package Number M14A
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4
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
Pb-Free 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
5
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
Package Number MTC14
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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6
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