74ACTQ08 [FAIRCHILD]

Quiet Series⑩ Quad 2-Input AND Gate; 安静Series四2输入与门
74ACTQ08
型号: 74ACTQ08
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Quiet Series⑩ Quad 2-Input AND Gate
安静Series四2输入与门

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中文:  中文翻译
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August 1990  
Revised November 1999  
74ACTQ08  
Quiet Series Quad 2-Input AND Gate  
General Description  
Features  
The ACTQ08 contains four, 2-input AND gates and utilizes  
Fairchild Quiet Series technology to guarantee quiet out-  
put switching and improved dynamic threshold perfor-  
mance. FACT Quiet Series features GTO output control  
and undershoot corrector in addition to a split ground bus  
for superior ACMOS performance.  
ICC reduced by 50%  
Guaranteed simultaneous switching noise level and  
dynamic threshold performance  
Improved latch-up immunity  
Outputs source/sink 24 mA  
TTL-compatible inputs  
Ordering Code:  
Order Number Package Number  
Package Description  
74ACTQ08SC  
74ACTQ08SJ  
74ACTQ08PC  
M14A  
M14D  
N14A  
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150Narrow Body  
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide  
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300Wide  
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.  
Logic Symbol  
Connection Diagram  
IEEE/IEC  
Pin Descriptions  
Pin Names  
An, Bn  
On  
Description  
Inputs  
Outputs  
FACT , Quiet Series , FACT Quiet Series and GTO are trademarks of Fairchild Semiconductor Corporation.  
© 1999 Fairchild Semiconductor Corporation  
DS010891  
www.fairchildsemi.com  
Absolute Maximum Ratings(Note 1)  
Recommended Operating  
Conditions  
Supply Voltage (VCC  
)
0.5V to +7.0V  
DC Input Diode Current (IIK  
VI = −0.5V  
)
Supply Voltage (VCC  
)
4.5V to 5.5V  
0V to VCC  
20 mA  
+20 mA  
Input Voltage (VI)  
VI = VCC + 0.5V  
Output Voltage (VO)  
0V to VCC  
DC Input Voltage (VI)  
0.5V to VCC + 0.5V  
Operating Temperature (TA)  
40°C to +85°C  
125 mV/ns  
DC Output Diode Current (IOK  
)
Minimum Input Edge Rate (V/t)  
V
V
O = −0.5V  
20 mA  
+20 mA  
V
IN from 0.8V to 2.0V  
O = VCC + 0.5V  
VCC @ 4.5V, 5.5V  
DC Output Voltage (VO)  
DC Output Source  
0.5V to VCC + 0.5V  
or Sink Current (IO)  
± 50 mA  
DC VCC or Ground Current  
per Output Pin (ICC or IGND  
)
± 50 mA  
Note 1: Absolute maximum ratings are those values beyond which damage  
to the device may occur. The databook specifications should be met, with-  
out exception, to ensure that the system design is reliable over its power  
supply, temperature, and output/input loading variables. Fairchild does not  
recommend operation outside of databook specifications.  
Storage Temperature (TSTG  
DC Latch-Up  
)
65°C to +150°C  
Source or Sink Current  
Junction Temperature (TJ)  
PDIP  
± 300 mA  
140°C  
DC Electrical Characteristics  
VCC  
T
A = +25°C  
TA = −40°C to +85°C  
Symbol  
Parameter  
Units  
Conditions  
VOUT = 0.1V  
(V)  
4.5  
5.5  
4.5  
5.5  
4.5  
5.5  
Typ  
1.5  
Guaranteed Limits  
VIH  
Minimum HIGH Level  
2.0  
2.0  
0.8  
0.8  
4.4  
5.4  
2.0  
2.0  
0.8  
0.8  
4.4  
5.4  
V
V
V
Input Voltage  
1.5  
or VCC 0.1V  
VOUT = 0.1V  
or VCC 0.1V  
VIL  
Maximum LOW Level  
Input Voltage  
1.5  
1.5  
VOH  
Minimum HIGH Level  
Output Voltage  
4.49  
5.49  
I
OUT = −50 µA  
IN = VIL or VIH  
V
4.5  
5.5  
4.5  
5.5  
3.86  
4.86  
0.1  
3.76  
4.76  
0.1  
V
V
I
I
OH = −24 mA  
OH = −24 mA (Note 2)  
VOL  
Maximum LOW Level  
Output Voltage  
0.001  
0.001  
I
OUT = 50 µA  
0.1  
0.1  
VIN = VILor VIH  
4.5  
5.5  
5.5  
5.5  
5.5  
5.5  
5.5  
0.36  
0.36  
± 0.1  
0.44  
0.44  
± 1.0  
1.5  
V
I
I
OL = 24 mA  
OL = 24 mA (Note 2)  
IIN  
Maximum Input Leakage Current  
Maximum ICC/Input  
µA  
VI = VCC, GND  
ICCT  
IOLD  
IOHD  
ICC  
0.6  
mA VI = VCC 2.1V  
mA OLD = 1.65V Max  
mA VOHD = 3.85V Min  
Minimum Dynamic  
75  
V
Output Current (Note 3)  
75  
20.0  
Maximum Quiescent Supply Current  
2.0  
1.5  
µA  
VIN = VCC or GND  
VOLP  
Quiet Output  
Maximum Dynamic VOL  
Figure 1, Figure 2  
(Note 4)(Note 5)  
5.0  
5.0  
1.1  
V
VOLV  
Quiet Output  
Minimum Dynamic VOL  
Figure 1, Figure 2  
(Note 4)(Note 5)  
0.6  
1.2  
V
VIHD  
VILD  
Minimum HIGH Level Dynamic Input Voltage  
Maximum LOW Level Dynamic Input Voltage  
5.0  
5.0  
1.9  
1.2  
2.2  
0.8  
V
V
(Note 4)(Note 6)  
(Note 4)(Note 6)  
Note 2: All outputs loaded; thresholds on input associated with output under test.  
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.  
Note 4: DIP package.  
Note 5: Max number of outputs defined as (n). Data inputs are 0V to 3V. One output @ GND.  
Note 6: Max number of data inputs (n) switching. (n1) inputs switching 0V to 3V (ACTQ). Input-under-test switching:  
3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz.  
www.fairchildsemi.com  
2
AC Electrical Characteristics  
VCC  
T
A = +25°C  
T
A = −40°C to +85°C  
L = 50 pF  
Max  
C
L = 50 pF  
C
Symbol  
Parameter  
(V)  
(Note 7)  
5.0  
Units  
Min  
2.5  
2.5  
Typ  
6.0  
6.0  
Max  
6.5  
Min  
tPLH  
Propagation Delay Data to Output  
Propagation Delay Data to Output  
Output to Output  
2.5  
2.5  
7.0  
7.0  
ns  
ns  
tPHL  
5.0  
6.5  
tOSHL  
tOSLH  
5.0  
0.5  
1.0  
1.0  
ns  
Skew (Note 8)  
Note 7: Voltage Range 5.0 is 5.0V ± 0.5V.  
Note 8: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The  
specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design.  
Capacitance  
Symbol  
Parameter  
Input Capacitance  
Power Dissipation Capacitance  
Typ  
Units  
Conditions  
CIN  
4.5  
70  
pF  
pF  
V
V
CC = OPEN  
CC = 5.0V  
CPD  
3
www.fairchildsemi.com  
FACT Noise Characteristics  
The setup of a noise characteristics measurement is critical  
to the accuracy and repeatability of the tests. The following  
is a brief description of the setup used to measure the  
noise characteristics of FACT.  
VOLP/VOLV and VOHP/VOHV:  
Determine the quiet output pin that demonstrates the  
greatest noise levels. The worst case pin will usually be  
the furthest from the ground pin. Monitor the output volt-  
ages using a 50coaxial cable plugged into a standard  
SMB type connector on the test fixture. Do not use an  
active FET probe.  
Equipment:  
Hewlett Packard Model 8180A Word Generator  
PC-163A Test Fixture  
Measure VOLP and VOLV on the quiet output during  
Tektronics Model 7854 Oscilloscope  
Procedure:  
worst case transition for active and enable. Measure  
VOHP and VOHV on the quiet output during the worst  
1. Verify Test Fixture Loading: Standard Load 50 pF,  
case active and enable transition.  
500.  
Verify that the GND reference recorded on the oscillo-  
scope has not drifted to ensure the accuracy and repeat-  
ability of the measurements.  
2. Deskew the HFS generator so that no two channels  
have greater than 150 ps skew between them. This  
requires that the oscilloscope be deskewed first. It is  
important to deskew the HFS generator channels  
before testing. This will ensure that the outputs switch  
simultaneously.  
V
ILD and VIHD:  
Monitor one of the switching outputs using a 50coaxial  
cable plugged into a standard SMB type connector on  
the test fixture. Do not use an active FET probe.  
3. Terminate all inputs and outputs to ensure proper load-  
ing of the outputs and that the input levels are at the  
correct voltage.  
First increase the input LOW voltage level, VIL, until the  
output begins to oscillator steps out a min of 2 ns. Oscil-  
lation is defined as noise on the output LOW level that  
exceeds VIL limits, or on output HIGH levels that exceed  
4. Set the HFS generator to toggle all but one output at a  
frequency of 1 MHz. Greater frequencies will increase  
DUT heating and effect the results of the measure-  
ment.  
VIH limits. The input LOW voltage level at which oscilla-  
tion occurs is defined as VILD  
.
Next decrease the input HIGH voltage level, VIH, until  
the output begins to oscillate or steps out a min of 2 ns.  
Oscillation is defined as noise on the output LOW level  
that exceeds VIL limits, or on output HIGH levels that  
exceed VIH limits. The input HIGH voltage level at which  
oscillation occurs is defined as VIHD  
.
Verify that the GND reference recorded on the oscillo-  
scope has not drifted to ensure the accuracy and repeat-  
ability of the measurements.  
VOHV and VOLP are measured with respect to ground reference.  
Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, tf  
3 ns, skew < 150 ps.  
=
FIGURE 1. Quiet Output Noise Voltage Waveforms  
5. Set the HFS generator input levels at 0V LOW and 3V  
HIGH for ACT devices and 0V LOW and 5V HIGH for  
AC devices. Verify levels with an oscilloscope.  
FIGURE 2. Simultaneous Switching Test Circuit  
www.fairchildsemi.com  
4
Physical Dimensions inches (millimeters) unless otherwise noted  
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150” Narrow Body  
Package Number M14A  
5
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide  
Package Number M14D  
www.fairchildsemi.com  
6
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300Wide  
Package Number N14A  
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and  
Fairchild reserves the right at any time without notice to change said circuitry and specifications.  
LIFE SUPPORT POLICY  
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the  
body, or (b) support or sustain life, and (c) whose failure  
to perform when properly used in accordance with  
instructions for use provided in the labeling, can be rea-  
sonably expected to result in a significant injury to the  
user.  
2. A critical component in any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
www.fairchildsemi.com  
7
www.fairchildsemi.com  

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