74ACTQ821_00 [FAIRCHILD]

Quiet Series 10-Bit D-Type Flip-Flop with 3-STATE Outputs; 宁静系列10位D型触发器带3态输出
74ACTQ821_00
型号: 74ACTQ821_00
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Quiet Series 10-Bit D-Type Flip-Flop with 3-STATE Outputs
宁静系列10位D型触发器带3态输出

触发器
文件: 总7页 (文件大小:79K)
中文:  中文翻译
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March 1990  
Revised September 2000  
74ACTQ821  
Quiet Series 10-Bit D-Type Flip-Flop  
with 3-STATE Outputs  
General Description  
Features  
Guaranteed simultaneous switching noise level and  
The ACTQ821 is a 10-bit D-type flip-flop with non-inverting  
3-STATE outputs arranged in a broadside pinout. The  
ACTQ821 utilizes Fairchild’s Quiet Series technology to  
guarantee quiet output switching and improved dynamic  
threshold performance. FACT Quiet Series  
GTO output control and undershoot corrector in addition  
to a split ground bus for superior performance.  
dynamic threshold performance  
Guaranteed pin-to-pin skew AC performance  
Non-inverting 3-STATE outputs for bus interfacing  
4 kV minimum ESD immunity  
features  
Outputs source/sink 24 mA  
Ordering Code:  
Order Number Package Number  
Package Description  
74ACTQ821SC  
74ACTQ821SPC  
M24B  
N24C  
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide  
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide  
Device also available in Tape and Reel. Specify by appending suffix letter Xto the ordering code.  
Logic Symbols  
Connection Diagram  
IEEE/IEC  
Pin Descriptions  
Pin Names  
Description  
Data Inputs  
Data Outputs  
D0D9  
O0O9  
OE  
Output Enable Input  
Clock Input  
CP  
FACT , Quiet Series , FACT Quiet Series , and GTO are trademarks of Fairchild Semiconductor Corporation.  
© 2000 Fairchild Semiconductor Corporation  
DS010686  
www.fairchildsemi.com  
Functional Description  
Function Table  
The ACTQ821 consists of ten-bit D-type edge-triggered  
flip-flops. The buffered Clock (CP) and buffered Output  
Enable (OE) are common to all flip-flops. The flip-flops will  
store the state of their individual D inputs that meet the  
setup and hold time requirements on the LOW-to-HIGH CP  
transition. With OE LOW the contents of the flip-flops are  
available at the outputs. When OE is HIGH the outputs go  
to the high impedance state. Operation of the OE input  
does not affect the state of the flip-flops.  
Inputs  
CP  
Internal  
Outputs  
Function  
OE  
H
D
L
Q
L
O
Z
Z
L
High Z  
High Z  
Load  
H
H
L
H
L
L
L
H
H
H
Load  
The ACTQ821 is functionally and pin compatible with the  
AM29821.  
H = HIGH Voltage Level  
L = LOW Voltage Level  
Z = HIGH Impedance  
= LOW-to-HIGH Clock Transition  
Logic Diagram  
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.  
www.fairchildsemi.com  
2
Absolute Maximum Ratings(Note 1)  
Recommended Operating  
Conditions  
Supply Voltage (VCC  
)
0.5V to + 7.0V  
DC Input Diode Current (IIK  
VI = − 0.5V  
)
Supply Voltage (VCC  
)
4.5V to 5.5V  
0V to VCC  
20 mA  
+ 20 mA  
Input Voltage (VI)  
VI = VCC + 0.5V  
Output Voltage (VO)  
0V to VCC  
DC Input Voltage (VI)  
0.5V to VCC + 0.5V  
Operating Temperature (TA)  
Minimum Input Edge Rate V/t  
Minimum Input Edge Rate V/t  
VIN from 0.8V to 2.0V  
40°C to + 85°C  
DC Output Diode Current (IOK  
)
V
V
O = − 0.5V  
20 mA  
+ 20 mA  
125 mV/ns  
O = VCC + 0.5V  
DC Output Voltage (VO)  
DC Output Source  
0.5V to VCC + 0.5V  
V
CC @ 4.5V, 5.5V  
or Sink Current (IO)  
± 50 mA  
DC VCC or Ground Current  
per Output Pin (ICC or IGND  
)
± 50 mA  
Storage Temperature (TSTG  
DC Latch-Up Source  
or Sink Current  
)
65°C to + 150°C  
Note 1: Absolute maximum ratings are those values beyond which damage  
to the device may occur. The databook specifications should be met, with-  
out exception, to ensure that the system design is reliable over its power  
supply, temperature, and output/input loading variables. Fairchild does not  
recommend operation of FACT circuits outside databook specifications.  
± 300 mA  
140°C  
Junction Temperature (TJ)  
PDIP  
DC Electrical Characteristics  
VCC  
T
A = + 25°C  
TA = − 40°C to + 85°C  
Symbol  
VIH  
Parameter  
Units  
Conditions  
(V)  
4.5  
5.5  
4.5  
5.5  
4.5  
5.5  
Typ  
1.5  
Guaranteed Limits  
Minimum HIGH Level  
2.0  
2.0  
0.8  
0.8  
4.4  
5.4  
2.0  
2.0  
0.8  
0.8  
4.4  
5.4  
V
OUT = 0.1V  
or VCC 0.1V  
OUT = 0.1V  
or VCC 0.1V  
V
V
V
Input Voltage  
1.5  
VIL  
Maximum LOW Level  
Input Voltage  
1.5  
V
1.5  
VOH  
Minimum HIGH Level  
Output Voltage  
4.49  
5.49  
I
OUT = − 50 µA  
IN = VIL or VIH  
V
4.5  
5.5  
4.5  
5.5  
3.86  
4.86  
0.1  
3.76  
4.76  
0.1  
V
V
V
I
I
OH = − 24 mA  
OH = − 24 mA (Note 2)  
VOL  
Maximum LOW Level  
Output Voltage  
0.001  
0.001  
I
OUT = 50 µA  
0.1  
0.1  
V
IN = VIL or VIH  
4.5  
5.5  
0.36  
0.36  
0.44  
0.44  
I
I
OL = 24 mA  
OL = 24 mA (Note 2)  
IIN  
Maximum Input  
VI = VCC,  
5.5  
5.5  
±0.1  
±0.5  
±1.0  
±5.0  
µA  
µA  
Leakage Current  
GND  
IOZ  
Maximum 3-STATE  
Leakage Current  
VI = VIL, VIH  
VO = VCC, GND  
ICCT  
IOLD  
IOHD  
ICC  
Maximum ICC/Input  
Minimum Dynamic  
Output Current (Note 3)  
Maximum Quiescent  
Supply Current  
5.5  
5.5  
5.5  
0.6  
1.5  
75  
mA  
mA  
mA  
VI = VCC 2.1V  
VOLD = 1.65V Max  
VOHD = 3.85V Min  
VIN = VCC  
75  
5.5  
5.0  
5.0  
5.0  
5.0  
8.0  
1.5  
80.0  
µA  
V
or GND  
VOLP  
VOLV  
VIHD  
VILD  
Quiet Output  
Figure 1, Figure 2  
(Note 4)(Note 5)  
Figure 1, Figure 2  
(Note 4)(Note 5)  
1.1  
0.6  
1.9  
Maximum Dynamic VOL  
Quiet Output  
1.2  
2.2  
V
Minimum Dynamic VOL  
Minimum HIGH Level  
Dynamic Input Voltage  
Maximum LOW Level  
Dynamic Input Voltage  
V
(Note 4)(Note 6)  
(Note 4)(Note 6)  
1.2  
0.8  
V
3
www.fairchildsemi.com  
DC Electrical Characteristics (Continued)  
Note 2: All outputs loaded; thresholds on input associated with output under test.  
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.  
Note 4: DIP package.  
Note 5: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND.  
Note 6: Maximum number of data inputs (n) switching. (n1) inputs switching 0V to 3V. Input-under-test switching: 3V to threshold (VILD),  
0V to threshold (VIHD), f = 1 MHz.  
AC Electrical Characteristics  
VCC  
T
A = + 25°C  
T
A = − 40°C to + 85°C  
L = 50 pF  
Max  
C
L = 50 pF  
C
Symbol  
Parameter  
(V)  
Units  
(Note 7)  
Min  
Typ  
Max  
Min  
fMAX  
Maximum Clock  
5.0  
5.0  
5.0  
5.0  
5.0  
120  
110  
2.5  
2.5  
1.0  
MHz  
ns  
Frequency  
tPLH  
tPHL  
tPZH  
tPZL  
Propagation Delay  
CP to On  
3.0  
3.0  
1.0  
6.5  
7.5  
6.5  
0.5  
9.5  
10.5  
8.5  
10.5  
11.5  
9.0  
Output Enable Time  
OE to On  
ns  
tPHZ  
tPLZ  
tOSLH  
tOSHL  
Output Disable Time  
OE to On  
ns  
Output to Output Skew  
CP to On (Note 8)  
1.0  
1.0  
ns  
Note 7: Voltage Range 5.0 is 5.0V ± 0.5V  
Note 8: Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs within the same packaged device.  
The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by  
design. Not tested.  
AC Operating Requirements  
VCC  
TA = + 25°C  
TA = − 40°C to + 85°C  
CL = 50 pF  
CL = 50 pF  
Symbol  
Parameter  
(V)  
Units  
(Note 9)  
Typ  
Guaranteed Minimum  
tS  
tH  
tH  
Setup Time, HIGH or LOW  
Dn to CP  
5.0  
5.0  
5.0  
3.0  
3.0  
ns  
ns  
ns  
Hold Time, HIGH or LOW  
1.5  
4.5  
1.5  
5.5  
Dn to CP  
CP Pulse Width  
HIGH or LOW  
Note 9: Voltage Range 5.0 is 5.0V ± 0.5V  
Capacitance  
Symbol  
Parameter  
Typ  
4.5  
Units  
pF  
Conditions  
CC = OPEN  
CC = 5.0V  
CIN  
Input Capacitance  
V
CPD  
Power Dissipation Capacitance  
55.0  
pF  
V
www.fairchildsemi.com  
4
FACT Noise Characteristics  
The setup of a noise characteristics measurement is critical  
to the accuracy and repeatability of the tests. The following  
is a brief description of the setup used to measure the  
noise characteristics of FACT.  
VOLP/VOLV and VOHP/VOHV:  
Determine the quiet output pin that demonstrates the  
greatest noise levels. The worst case pin will usually be  
the furthest from the ground pin. Monitor the output volt-  
ages using a 50coaxial cable plugged into a standard  
SMB type connector on the test fixture. Do not use an  
active FET probe.  
Equipment:  
Hewlett Packard Model 8180A Word Generator  
PC-163A Test Fixture  
Measure VOLP and VOLV on the quiet output during the  
Tektronics Model 7854 Oscilloscope  
Procedure:  
worst case transition for active and enable. Measure  
VOHP and VOHV on the quiet output during the worst  
1. Verify Test Fixture Loading: Standard Load 50 pF,  
case active and enable transition.  
500.  
Verify that the GND reference recorded on the oscillo-  
scope has not drifted to ensure the accuracy and repeat-  
ability of the measurements.  
2. Deskew the HFS generator so that no two channels  
have greater than 150 ps skew between them. This  
requires that the oscilloscope be deskewed first. It is  
important to deskew the HFS generator channels  
before testing. This will ensure that the outputs switch  
simultaneously.  
V
ILD and VIHD:  
Monitor one of the switching outputs using a 50coaxial  
cable plugged into a standard SMB type connector on  
the test fixture. Do not use an active FET probe.  
3. Terminate all inputs and outputs to ensure proper load-  
ing of the outputs and that the input levels are at the  
correct voltage.  
First increase the input LOW voltage level, VIL, until the  
output begins to oscillate or steps out a min of 2 ns.  
Oscillation is defined as noise on the output LOW level  
that exceeds VIL limits, or on output HIGH levels that  
4. Set the HFS generator to toggle all but one output at a  
frequency of 1 MHz. Greater frequencies will increase  
DUT heating and effect the results of the measure-  
ment.  
exceed VIH limits. The input LOW voltage level at which  
oscillation occurs is defined as VILD  
.
5. Set the HFS generator input levels at 0V LOW and 3V  
HIGH for ACT devices and 0V LOW and 5V HIGH for  
AC devices. Verify levels with an oscilloscope.  
Next decrease the input HIGH voltage level VIH until the  
output begins to oscillate or steps out a min of 2ns.  
Oscillation is defined as noise on the output LOW level  
that exceeds VIL limits, or on output HIGH levels that  
exceed VIH limits. The input HIGH voltage level at which  
oscillation occurs is defined as VIHD  
.
Verify that the GND reference recorded on the oscillo-  
scope has not drifted to ensure the accuracy and repeat-  
ability of the measurements.  
Note 10: VOHV and VOLP are measured with respect to ground reference.  
Note 11: Input pulses have the following characteristics: f = 1 MHz,  
tr = 3 ns, tf = 3 ns, skew < 150 ps.  
FIGURE 1. Quiet Output Noise Voltage Waveforms  
FIGURE 2. Simultaneous Switching Test Circuit  
5
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted  
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide  
Package Number M24B  
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6
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide  
Package Number N24C  
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and  
Fairchild reserves the right at any time without notice to change said circuitry and specifications.  
LIFE SUPPORT POLICY  
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the  
body, or (b) support or sustain life, and (c) whose failure  
to perform when properly used in accordance with  
instructions for use provided in the labeling, can be rea-  
sonably expected to result in a significant injury to the  
user.  
2. A critical component in any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
www.fairchildsemi.com  
7
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