CD4010CN 概述
Hex Buffers (Non-Inverting) 六角缓冲器(非反相) 栅极
CD4010CN 规格参数
是否Rohs认证: | 不符合 | 生命周期: | Obsolete |
零件包装代码: | DIP | 包装说明: | DIP, DIP16,.3 |
针数: | 16 | Reach Compliance Code: | unknown |
HTS代码: | 8542.39.00.01 | 风险等级: | 5.48 |
其他特性: | DUAL SUPPLY HIGH TO LOW VOLTAGE TRANSLATOR | 系列: | 4000/14000/40000 |
JESD-30 代码: | R-PDIP-T16 | JESD-609代码: | e0 |
长度: | 19.305 mm | 负载电容(CL): | 15 pF |
逻辑集成电路类型: | BUFFER | 功能数量: | 6 |
输入次数: | 1 | 端子数量: | 16 |
最高工作温度: | 125 °C | 最低工作温度: | -55 °C |
输出特性: | OPEN-DRAIN | 封装主体材料: | PLASTIC/EPOXY |
封装代码: | DIP | 封装等效代码: | DIP16,.3 |
封装形状: | RECTANGULAR | 封装形式: | IN-LINE |
峰值回流温度(摄氏度): | NOT SPECIFIED | 电源: | 3/15 V |
Prop。Delay @ Nom-Sup: | 100 ns | 传播延迟(tpd): | 100 ns |
认证状态: | Not Qualified | 施密特触发器: | NO |
座面最大高度: | 5.08 mm | 子类别: | Gates |
最大供电电压 (Vsup): | 15 V | 最小供电电压 (Vsup): | 3 V |
标称供电电压 (Vsup): | 5 V | 表面贴装: | NO |
技术: | CMOS | 温度等级: | MILITARY |
端子面层: | Tin/Lead (Sn/Pb) | 端子形式: | THROUGH-HOLE |
端子节距: | 2.54 mm | 端子位置: | DUAL |
处于峰值回流温度下的最长时间: | NOT SPECIFIED | 宽度: | 7.62 mm |
Base Number Matches: | 1 |
CD4010CN 数据手册
通过下载CD4010CN数据手册来全面了解它。这个PDF文档包含了所有必要的细节,如产品概述、功能特性、引脚定义、引脚排列图等信息。
PDF下载October 1987
Revised June 2000
CD4010C
Hex Buffers (Non-Inverting)
General Description
Features
The CD4010C hex buffers are monolithic complementary
MOS (CMOS) integrated circuits. The N- and P-channel
enhancement mode transistors provide a symmetrical cir-
cuit with output swings essentially equal to the supply volt-
age. This results in high noise immunity over a wide supply
voltage range. No DC power other than that caused by
leakage current is consumed during static conditions. All
inputs are protected against static discharge. These gates
may be used as hex buffers, CMOS to DTL or TTL inter-
face or as CMOS current drivers. Conversion ranges are
from 3V to 15V providing VCC ≤ VDD. The devices also
■ Wide supply voltage range: 3.0V to 15V
■ Low power: 100 nW (typ.)
■ High noise immunity: 0.45 VDD (typ.)
■ High current sinking: 8 mA (min.) at VO = 0.5V
capability: and VDD = 10V
Applications
•
•
•
•
•
•
•
•
Automotive
Data terminals
Instrumentation
Medical electronics
Alarm system
have buffered outputs which improve transfer characteris-
tics by providing very high gain.
Industrial controls
Remote metering
Computers
Ordering Code:
Order Number
CD4010CM
Package Number
M16A
Package Description
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150” Narrow
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
CD4010CN
N16E
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagram
Schematic Diagram
Pin Assignments for DIP and SOIC
Hex COS/MOS to DTL or TTL
converter (inverting).
Connect VCC to DTL or TTL supply.
Connect VDD to COS/MOS supply.
Top View
© 2000 Fairchild Semiconductor Corporation
DS005945
www.fairchildsemi.com
Absolute Maximum Ratings(Note 1)
Voltage at Any Pin (Note 2)
Operating Temperature Range
Storage Temperature Range (TS)
Power Dissipation (PD)
Dual-In-Line
V
SS − 0.3V to VSS +15.5V
−45°C to +85°C
−65°C to +150°C
700 mW
Note 1: “Absolute Maximum Ratings indicate limits beyond which damage
Small Outline
500 mW to the device may occur. Operating Ratings indicate conditions for which
the device is functional, but do not guarantee specific performance limits.”
Lead Temperature (TL)
(Soldering, 10 seconds)
Note 2: This device should not be connected to circuits with the power on
260°C
VSS + 3V to VSS + 15V
because high transient voltage may cause permanent damage.
Operating Range (VDD
)
DC Electrical Characteristics
Test Conditions
(Volts)
Limits
Symbol
Characteristics
−40°C
+25°C
Typ
0.03
0.05
0.15
0.5
0
+85°C
Units
VO
VDD
Min
Max
3
Min
Max
3
Min
Max
42
ICC
Quiescent Device
5
10
5
µA
µA
µW
µW
V
Current
5
5
70
PD
Quiescent Device
Dissipation/Package
Output Voltage
LOW Level
15
15
210
700
0.05
0.05
10
5
50
50
0.01
0.01
0.01
0.01
VOL
VOH
10
5
0
V
HIGH Level
4.99
9.99
4.99
9.99
5
4.95
9.95
V
10
10
V
Noise Immunity
(All Inputs)
VNL
V
V
V
V
O ≥ 1.5
O ≥ 3.0
O ≥ 3.5
O ≥ 7.0
0.4
5
10
5
1.6
3.2
1.4
2.9
3.6
9.6
−1.5
1.5
3
2.25
4.5
1.4
2.9
1.5
3
V
V
VNH
1.5
3
2.25
4.5
V
10
5
V
Output Drive Current
N-Channel (Note 3)
P-Channel (Note 3)
3
2.4
6.4
−1
mA
mA
mA
mA
pA
IDN
IDP
0.5
10
5
8
2.5
−1.25
−0.6
9.5
10
−0.72
−0.48
IIN
Input Current
10
Note 3: IDN and IDP are tested one output at a time.
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2
AC Electrical Characteristics (Note 4)
T = 25°c, CL= 15 pF, unless otherwise noted. Typical Temperature coefficient for all values of VDD= 0.3%/°C
A
Test Conditions
Limits
VDD
Symbol
Characteristics
Min
Typ
Max
Units
(Volts)
tPHL
Propagation Delay Time:
V
CC = VDD
5
—
—
—
15
10
10
70
40
35
tPLH
HIGH-to-LOW Level (tPHL
)
10
ns
V
V
V
DD = 10V
CC = 5V
LOW-to-HIGH Level (tPLH
)
CC = VDD
5
—
—
—
50
25
15
100
70
10
V
V
V
DD = 10V
40
ns
ns
ns
pF
CC = 5V
tTHL
tTLH
Transition Time:
CC = VDD
5
10
5
—
—
—
—
—
20
16
80
50
5
60
50
HIGH-to-LOW Level (tTHL
)
LOW-to-HIGH Level (tTLH
)
VCC = VDD
160
120
—
10
Input Capacitance (CI)
Any Input
Note 4: AC Parameters are guaranteed by DC correlated testing.
Typical Application
3
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Physical Dimensions inches (millimeters) unless otherwise noted
16-Line Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150” Narrow
Package Number M16A
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4
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
Package Number N16E
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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5
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