CD4023 [FAIRCHILD]

Buffered Triple 3-Input NAND Gate; 缓冲的三重3输入与非门
CD4023
型号: CD4023
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Buffered Triple 3-Input NAND Gate
缓冲的三重3输入与非门

文件: 总6页 (文件大小:71K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
October 1987  
Revised August 2000  
CD4023BC  
Buffered Triple 3-Input NAND Gate  
General Description  
Features  
These triple gates are monolithic complementary MOS  
(CMOS) integrated circuits constructed with N- and P-  
channel enhancement mode transistors. They have equal  
source and sink current capabilities and conform to stan-  
dard B series output drive. The devices also have buffered  
outputs which improve transfer characteristics by providing  
very high gain. All inputs are protected against static dis-  
Wide supply voltage range: 3.0V to 15V  
High noise immunity: 0.45 VDD (typ)  
Low power TTL compatibility:  
fan out of 2 driving 74L or 1 driving 74LS  
5V–10V–15V parametric ratings  
Symmetrical output characteristics  
charge with diodes to VDD and VSS  
.
Maximum input leakage 1 µA at 15V over full  
temperature range  
Ordering Code:  
Order Number Package Number  
Package Description  
CD4023BCM  
CD4023BCS  
CD4023BCN  
M14A  
M14D  
N14A  
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow  
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide  
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide  
Devices also available in Tape and Reel. Specify by appending the suffix letter Xtot he ordering code.  
Connection Diagram  
Block Diagram  
1
/
3 Device Shown  
*All Inputs Protected by Standard CMOS Input Protection Circuit.  
Top View  
© 2000 Fairchild Semiconductor Corporation  
DS005956  
www.fairchildsemi.com  
Absolute Maximum Ratings(Note 1)  
(Note 2)  
Recommended Operating  
Conditions  
DC Supply Voltage (VDD  
)
0.5 VDC to +18 VDC  
0.5 VDC to VDD+0.5 VDC  
65°C to +150°C  
DC Supply Voltage (VDD  
Input Voltage (VIN  
Operating Temperature Range (TA)  
)
5 VDC to 15 VDC  
0 VDC to VDD VDC  
40°C to +85°C  
Input Voltage (VIN  
)
)
Storage Temp. Range (TS)  
Power Dissipation (PD)  
Dual-In-Line  
700 mW  
500 mW  
Small Outline  
Lead Temperature (TL)  
(Soldering, 10 seconds)  
Note 1: Absolute Maximum Ratingsare those values beyond which the  
safety of the device cannot be guaranteed; they are not meant to imply that  
the devices should be operated at these limits. The table of Recom-  
mended Operating Conditionsand Electrical Characteristicsprovides  
conditions for actual device operation.  
260°C  
Note 2: VSS = 0V unless otherwise specified.  
DC Electrical Characteristics (Note 3)  
40°C  
+25°C  
Typ  
0.004  
0.005  
0.006  
0
+85°C  
Symbol  
IDD  
Parameter  
Conditions  
Units  
Min  
Typ  
Min  
Max  
1.0  
Min  
Max  
Quiescent Device Current  
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
DD = 5V  
1.0  
2.0  
7.5  
15  
DD = 10V  
DD = 15V  
DD = 5V  
2.0  
µA  
4.0  
4.0  
30  
VOL  
VOH  
VIL  
LOW Level Output Voltage  
HIGH Level Output Voltage  
LOW Level Input Voltage  
HIGH Level Input Voltage  
0.05  
0.05  
0.05  
0.05  
0.05  
0.05  
0.05  
0.05  
0.05  
DD = 10V  
DD = 15V  
DD = 5V  
0
V
V
0
4.95  
9.95  
4.95  
9.95  
5
4.95  
9.95  
DD = 10V  
DD = 15V  
10  
14.95  
14.95  
15  
14.95  
DD=5V, VO=4.5V  
1.5  
3.0  
4.0  
2
1.5  
3.0  
4.0  
1.5  
3.0  
4.0  
DD=10V, VO=9.0V  
DD=15V, VO=13.5V  
DD=5V, VO=0.5V  
|IO|<1µA  
|IO|<1µA  
4
V
6
VIH  
IOL  
IOH  
IIN  
3.5  
7.0  
3.5  
7.0  
3
3.5  
7.0  
DD=10V, VO=1.0V  
DD=15V, VO=1.5V  
DD=5V, VO = 0.4V  
DD = 10V, VO = 0.5V  
DD = 15V, VO = 1.5V  
DD = 5V, VO = 4.6V  
DD = 10V, VO = 9.5V  
DD = 15V, VO = 13.5V  
DD = 15V, VIN = 0V  
DD = 15V, VIN = 15V  
6
V
11.0  
0.52  
1.3  
11.0  
0.44  
1.1  
9
11.0  
0.36  
0.90  
2.4  
LOW Level Output Current  
(Note 4)  
0.88  
2.2  
8
mA  
3.6  
3.0  
HIGH Level Output Current  
(Note 4)  
0.52  
1.3  
3.6  
0.44  
1.1  
3.0  
0.88  
2.2  
8  
0.36  
0.90  
2.4  
mA  
5  
Input Current  
0.3  
10  
0.3  
1.0  
µA  
5  
0.3  
10  
0.3  
1.0  
Note 3: VSS = 0V unless otherwise specified.  
Note 4: IOH and IOL are tested one output at a time.  
www.fairchildsemi.com  
2
AC Electrical Characteristics (Note 5)  
TA = 25°C, CL = 50 pF, RL = 200k, unless otherwise specified  
Symbol  
tPHL  
Parameter  
Conditions  
DD = 5V  
Min  
Typ  
130  
60  
40  
110  
50  
35  
90  
50  
40  
5
Max  
250  
100  
70  
Units  
Propagation Delay, HIGH-to-LOW Level  
V
V
DD = 10V  
DD = 15V  
ns  
V
tPLH  
Propagation Delay, LOW-to-HIGH Level  
Transition Time  
V
DD = 5V  
DD = 10V  
DD = 15V  
250  
100  
70  
V
V
ns  
ns  
tTHL  
,
V
DD = 5V  
DD = 10V  
DD = 15V  
200  
100  
80  
tTLH  
V
V
CIN  
Average Input Capacitance  
Any Input  
Any Gate  
7.5  
pF  
pF  
CPD  
Power Dissipation Capacity (Note 6)  
17  
Note 5: AC Parameters are guaranteed by DC correlated testing.  
Note 6: CPD determines the no load AC power consumption of any CMOS device.  
For complete explanation, see Family Characteristics Application Note AN-90.  
3
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted  
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow  
Package Number M14A  
www.fairchildsemi.com  
4
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide  
Package Number M14D  
5
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide  
Package Number N14A  
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and  
Fairchild reserves the right at any time without notice to change said circuitry and specifications.  
LIFE SUPPORT POLICY  
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the  
body, or (b) support or sustain life, and (c) whose failure  
to perform when properly used in accordance with  
instructions for use provided in the labeling, can be rea-  
sonably expected to result in a significant injury to the  
user.  
2. A critical component in any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
www.fairchildsemi.com  
www.fairchildsemi.com  
6

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FAIRCHILD