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FCP20N60-G [FAIRCHILD]

DESIGN/PROCESS CHANGE NOTIFICATION;
FCP20N60-G
型号： FCP20N60-G
厂家： FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述：

DESIGN/PROCESS CHANGE NOTIFICATION
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PCN# : P315A  
Issue Date : Feb. 04, 2013  
DESIGN/PROCESS CHANGE NOTIFICATION  
This is to inform you that a change is being made to the products listed below.  
Unless otherwise indicated in the details of this notification, the identified change will have no impact on product  
quality, reliability, electrical, visual or mechanical performance and affected products will remain fully compliant to all  
published specifications. Products incorporating this change may be shipped interchangeably with existing unchanged  
products.  
This change is planned to take effect in 90 calendar days from the date of this notification. Please work with your local  
Fairchild Sales Representative to manage your inventory of unchanged product if your evaluation of this change will  
require more than 90 calendar days.  
Please contact your local Customer Quality Engineer within 30 days of receipt of this notification if you require any  
additional data or samples. Alternatively, you may send an email request for data, samples or other information to  
PCNSupport@fairchildsemi.com.  
Implementation of change:  
Expected First Shipment Date for Changed Product : May. 05, 2013  
Expected First Date Code of Changed Product :1327  
Description of Change (From) :  
5/6-in wafer fabrication line at Fairchild Semiconductor Bucheon Korea.  
Description of Change (To) :  
8-in wafer fabrication line at Fairchild Semiconductor Bucheon Korea.  
Reason for Change:  
Fairchild Semiconductor is increasing wafer fabrication capacity by qualifying an 8-in wafer fabrication line at Fairchild  
Semiconductor Bucheon Korea. Quality and reliability remain at the highest standards already demonstrated within  
Fairchild's existing products. The reliability qualification results used to qualify the 8-in wafer fabrication line are  
summarized below. The specific groups of products/MOSFET technologies are listed in the affected FSIDs list. Design,  
die size and layout of the affected products will remain unchanged. There are no changes in the datasheet or electrical  
performance.  
1 of 14  
Affected Product(s):  
FCA20N60  
FCA20N60S_F109  
FCA47N60  
FCA47N60_F109  
FCB20N60TM  
FCD5N60TM  
FCD7N60TM_WS  
FCH47N60_F133  
FCP11N60F  
FCP16N60_G  
FCP20N60  
FCP260N60E  
FCP4N60  
FCA20N60F  
FCA20N60_F109  
FCA47N60F  
FCB11N60TM  
FCBB20CH60SF  
FCD5N60TM_WS  
FCH35N60  
FCI7N60  
FCP11N60_G  
FCP190N60  
FCP20N60FS  
FCP380N60  
FCP7N60  
FCA20N60FS  
FCA35N60  
FCA47N60F_SN00171  
FCB20N60FTM  
FCD4N60TM  
FCD7N60TM  
FCH47N60F_F133  
FCP11N60  
FCP16N60  
FCP190N60E  
FCP20N60_G  
FCP380N60E  
FCPF11N60  
FCPF11N60F  
FCPF11N65  
FCPF11N60T  
FCPF11N65_G  
FCPF190N60E  
FCPF20N60S  
FCPF20N60T  
FCPF380N60E  
FCPF7N60YDTU  
FDA24N50  
FCPF11N60_G  
FCPF16N60  
FCPF20N60  
FCPF20N60ST  
FCPF260N60E  
FCPF400N60  
FCU5N60TU  
FDA24N50F  
FCPF190N60  
FCPF20N60FS  
FCPF20N60ST_G  
FCPF380N60  
FCPF7N60  
FDA24N40F  
FDA28N50  
FDA28N50F  
FDA33N25  
FDA38N30  
FDA50N50  
FDA59N25  
FDA59N30  
FDA69N25  
FDA70N20  
FDB12N50TM  
FDB33N25TM  
FDD3N50NZTM  
FDD6N20TM  
FDD8N50NZTM  
FDL100N50F  
FDP18N20F  
FDB20N50F  
FDB28N30TM  
FDB52N20TM  
FDD5N50NZTM  
FDD6N50FTM  
FDH50N50_F133  
FDP15N40  
FDB44N25TM  
FDD5N50NZFTM  
FDD6N25TM  
FDH45N50F_F133  
FDP12N50NZ  
FDP19N40  
FDP22N50N  
FDP33N25  
FDP24N40  
FDP26N40  
FDP39N20  
FDP51N25  
FDP52N20  
FDP5N50NZ  
FDPF12N50NZ  
FDPF33N25T  
FDPF39N20TLDTU  
FDPF51N25  
FDP61N20  
FDP8N50NZ  
FDPF18N20FT  
FDPF39N20  
FDPF44N25T  
FDPF51N25YDTU  
FDPF5N50NZFT  
FDPF8N50NZF  
FDPF13N50NZ  
FDPF33N25TRDTU  
FDPF3N50NZ  
FDPF51N25RDTU  
FDPF5N50NZF  
FDPF8N50NZ  
FDPF5N50NZ  
FDPF5N50NZU  
2 of 14  
Affected Product(s):  
FDPF8N50NZU  
FGD4536TM  
FDPF9N50NZ  
FGA40N65SMD  
FGH20N60UFDTU  
FGH40N60SMD  
FGH40N60UFDTU_SN00006  
FGH40N65UFDTU  
FGPF4533  
FGPF4536JDTU  
FGPF4633TU  
PCFC20N60W  
FGH20N60SFDTU  
FGH40N60SFTU  
FGH40N60UFDTU  
FGH40N60UFTU_SN00007  
FGH80N60FDTU  
FGPF4536  
FGPF4633RDTU  
PCFC11N60W  
PCFC47N60FW_SN00201  
FGH40N60SFDTU  
FGH40N60SMDF  
FGH40N60UFTU  
FGH80N60FD2TU  
FGPF4533RDTU  
FGPF4536YDTU  
FGPF4636YDTU  
PCFC47N60FW  
PCFG40N65SMW  
3 of 14  
Qualification Plan  
Q20120257  
Device  
Package  
Process  
No. of Lots  
3
FDA59N25  
TT3P0003  
UniFET1 150~250V  
Device  
Name  
FDA59N25  
FDA59N25  
FDA59N25  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Q20120257AA Q20120257AB Q20120257AC  
Duration Result/FA  
Result/FA  
Result/FA  
100 % Rated  
VGS, Tj  
max=150C  
80% of Rated  
BV, Tj  
JESD22-  
A108  
HTGB  
HTRB  
1000hrs  
1000hrs  
0/77  
0/77  
0/77  
0/77  
JESD22-  
A108  
0/77  
0/77  
max=150C  
JESD22-  
A103  
130 C, 85% RH, JESD22-  
HTSL  
HAST  
150 C  
1000hrs  
96hrs  
0/77  
0/77  
0/77  
0/77  
0/77  
0/77  
Vds=42V  
A110  
Delta 100C, 5  
min on, 3.5 min 750-1036  
off  
MIL-STD-  
6000  
cycles  
PRCL  
0/77  
0/77  
0/77  
JESD22-  
B106  
JESD22-  
A104  
RSDH  
TMCL  
260C  
10sec  
0/30  
0/77  
0/30  
0/77  
0/30  
0/77  
-65 C to 150 C,  
30 min/ cycles  
500  
cycles  
4 of 14  
Qualification Plan  
Q20120259  
Device  
FDH50N50_F133  
Package  
TO247003  
Process  
UniFET1 300~500V (Over 24A)  
No. of Lots  
3
Device  
Name  
FDH50N50_F133 FDH50N50_F133 FDH50N50_F133  
Reliability  
Test  
Condition Standard  
Lot No.  
Q20120259AA  
Q20120259AB  
Result/FA  
Q20120259AC  
Result/FA  
Duration Result/FA  
1000hrs 0/77  
100 %  
Rated  
VGS, Tj  
max=150  
C
JESD22-  
A108  
HTGB  
0/77  
0/77  
0/77  
0/77  
80% of  
Rated  
BV, Tj  
max=150  
C
JESD22-  
A108  
HTRB  
1000hrs 0/77  
1000hrs 0/77  
JESD22-  
A103  
HTSL  
HAST  
150 C  
0/77  
0/77  
0/77  
0/77  
130 C,  
85% RH,  
Vds=42V  
Delta  
JESD22-  
A110  
96hrs  
0/77  
0/77  
100C, 5  
min on,  
3.5 min  
off  
MIL-STD- 6000  
750-1036 cycles  
PRCL  
0/77  
0/77  
JESD22-  
10sec  
RSDH  
TMCL  
260C  
0/30  
0/77  
0/30  
0/77  
0/30  
0/77  
B106  
-65 C to  
150 C, 30 JESD22- 500  
min/  
A104  
cycles  
cycles  
5 of 14  
Qualification Plan  
Q20120260  
Device  
Package  
Process  
No. of Lots  
3
FDP22N50N  
TO220003  
UniFET2 500V  
Device  
Name  
FDP22N50N  
FDP22N50N  
FDP22N50N  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Q20120260AA Q20120260AB Q20120260AC  
Duration Result/FA  
1000hrs 0/77  
Result/FA  
0/77  
Result/FA  
0/77  
100 % Rated VGS, JESD22-  
HTGB  
HTRB  
HTSL  
HAST  
Tj max=150C  
A108  
80% of Rated BV,  
Tj max=150C  
JESD22-  
A108  
1000hrs 0/77  
1000hrs 0/77  
0/77  
0/77  
0/77  
0/77  
0/77  
0/77  
JESD22-  
A103  
150 C  
130 C, 85% RH,  
Vds=42V  
JESD22-  
A110  
96hrs  
0/77  
0/77  
MIL-  
Delta 100C, 3.5  
STD-  
8572  
cycles  
PRCL  
0/77  
0/77  
min on, 3.5 min off 750-  
1036  
JESD22-  
B106  
JESD22- 500  
A104 cycles  
RSDH  
TMCL  
260C  
10 sec  
0/30  
0/77  
0/30  
0/77  
0/30  
0/77  
-65 C to 150 C, 30  
min/ cycles  
Qualification Plan  
Q20120263  
Device  
FCP20N60  
Package  
Process  
Super-FET 600V TO220  
No. of Lots  
3
TO220003  
Device  
Name  
FCP20N60  
FCP20N60  
FCP20N60  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Q20120263AA Q20120263AB Q20120263AC  
Duration Result/FA  
1000hrs 0/77  
Result/FA  
0/77  
Result/FA  
0/77  
100 % Rated VGS, JESD22-  
HTGB  
HTRB  
HTSL  
HAST  
Tj max=150C  
A108  
80% of Rated BV,  
Tj max=150C  
JESD22-  
A108  
1000hrs 0/77  
1000hrs 0/77  
0/77  
0/77  
0/77  
0/77  
0/77  
0/77  
JESD22-  
A103  
150 C  
130 C, 85% RH,  
Vds=42V  
JESD22-  
A110  
96hrs  
0/77  
0/77  
MIL-  
Delta 100C, 3.5  
STD-  
8572  
cycles  
PRCL  
0/77  
0/77  
min on, 3.5 min off 750-  
1036  
JESD22-  
B106  
JESD22- 500  
A104 cycles  
RSDH  
TMCL  
260C  
10 sec  
0/30  
0/77  
0/30  
0/77  
0/30  
0/77  
-65 C to 150 C, 30  
min/ cycles  
6 of 14  
Qualification Plan  
Q20120265  
Device  
Package  
Process  
No. of Lots  
1
FCB20N60TM  
TT263002 Super-FET 600V D2pak  
Device Name  
FCB20N60TM  
Q20120265AA  
Result/FA  
Reliability Test  
Condition  
Standard  
Lot No.  
Duration  
PRECON  
HTGB  
L1 245C  
JESD22-A113 5 Cycles 24 hrs  
JESD22-A108 1000hrs  
0/154  
100 % Rated VGS, Tj  
max=150C  
0/77  
80% of Rated BV, Tj  
max=150C  
HTRB  
HTSL  
HAST  
JESD22-A108 1000hrs  
JESD22-A103 1000hrs  
JESD22-A110 96hrs  
0/77  
0/77  
0/77  
150 C  
130 C, 85% RH,  
Vds=42V  
Delta 100C, 3.5 min on,  
3.5 min off  
MIL-STD-750-  
8572 cycles  
1036  
PRCL  
RSDH  
TMCL  
0/77  
0/30  
0/77  
260C  
JESD22-B106 10 sec  
-65 C to 150 C, 30 min/  
cycles  
JESD22-A104 500 cycles  
Qualification Plan  
Q20120266  
Device  
Package  
Process  
UNIFET 200V(include 250V  
/Dpak and D2 pak)  
No. of Lots  
1
FDB52N20TM  
TT263002  
Device Name  
Lot No.  
FDB52N20TM  
Q20120266AA  
Reliability Test  
Condition  
L1 245C  
Standard  
Duration  
Result/FA  
0/154  
PRECON  
HTGB  
JESD22-A113 5 Cycles 24 hrs  
JESD22-A108 1000hrs  
100 % Rated VGS, Tj  
max=150C  
0/77  
80% of Rated BV, Tj  
max=150C  
HTRB  
HTSL  
HAST  
JESD22-A108 1000hrs  
JESD22-A103 1000hrs  
JESD22-A110 96hrs  
0/77  
0/77  
0/77  
150 C  
130 C, 85% RH,  
Vds=42V  
Delta 100C, 3.5 min on,  
3.5 min off  
MIL-STD-750-  
8572 cycles  
1036  
PRCL  
RSDH  
TMCL  
0/77  
0/30  
0/77  
260C  
JESD22-B106 15 sec  
-65 C to 150 C, 30 min/  
cycles  
JESD22-A104 500 cycles  
7 of 14  
Qualification Plan Device  
Package  
Process  
No. of Lots  
1
Q20120267  
FDB12N50TM TT263002 UNIFET1 300-500V_D2pak  
Device Name  
FDB12N50TM  
Reliability Test  
Condition  
L1 245C  
Standard  
Lot No.  
Q20120267AA  
Result/FA  
0/154  
Duration  
PRECON  
HTGB  
JESD22-A113 5 Cycles 24 hrs  
JESD22-A108 1000hrs  
100 % Rated VGS, Tj  
max=150C  
0/77  
80% of Rated BV, Tj  
max=150C  
HTRB  
HTSL  
HAST  
JESD22-A108 1000hrs  
JESD22-A103 1000hrs  
JESD22-A110 96hrs  
0/77  
0/77  
0/77  
150 C  
130 C, 85% RH,  
Vds=42V  
Delta 100C, 2 min on,  
3.5 min off  
MIL-STD-750-  
8572 cycles  
1036  
PRCL  
RSDH  
TMCL  
0/77  
0/30  
0/77  
260C  
JESD22-B106 10 sec  
-65 C to 150 C, 30 min/  
cycles  
JESD22-A104 500 cycles  
Qualification Plan  
Q20120268  
Device  
FCA47N60  
Package  
TT3P0003  
Process  
SuperFET 600V TO3P/TO247  
No. of Lots  
1
Device Name FCA47N60  
Reliability Test Condition  
Standard  
Lot No.  
Duration  
1000hrs  
1000hrs  
1000hrs  
96hrs  
Q20120268AA  
Result/FA  
0/77  
HTGB  
HTRB  
HTSL  
HAST  
PRCL  
RSDH  
TMCL  
100 % Rated VGS, Tj max=150C JESD22-A108  
80% of Rated BV, Tj max=150C  
150 C  
JESD22-A108  
JESD22-A103  
JESD22-A110  
0/77  
0/77  
130 C, 85% RH, Vds=42V  
0/77  
Delta 100C, 5 min on, 3.5 min off MIL-STD-750-1036 6000 cycles  
0/77  
260C  
JESD22-B106  
JESD22-A104  
10 sec  
0/30  
-65 C to 150 C, 30 min/ cycles  
500 cycles  
0/77  
8 of 14  
Qualification Plan  
Q20120269  
Device  
FGD4536TM  
Package  
Process  
No. of Lots  
1
TT252003 PDP 4GEN Trench IGBT_360V Dpak  
Device Name  
FGD4536TM  
Q20120269AA  
Result/FA  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Duration  
5 Cycles 24  
hrs  
PRECON  
HTGB  
L1 260C  
JESD22-A113  
JESD22-A108  
0/154  
0/77  
100 % Rated VGS, Tj  
max=150C  
1000hrs  
HTRB  
HTSL  
HAST  
80% of Rated BV, Tj max=150C JESD22-A108  
1000hrs  
1000hrs  
96hrs  
0/77  
0/77  
0/77  
150 C  
JESD22-A103  
JESD22-A110  
130 C, 85% RH, Vds=42V  
Delta 100C, 2 min on, 3.5 min  
off  
MIL-STD-750-  
1036  
PRCL  
10000 cycles  
0/77  
RSDH  
TMCL  
260C  
JESD22-B106  
JESD22-A104  
10 sec  
0/30  
0/77  
-65 C to 150 C, 30 min/ cycles  
500 cycles  
Qualification Plan  
Q20120270  
Device  
FCD7N60TM  
Package  
TT252002  
Process  
SuperFET_600V Dpak  
No. of Lots  
1
Device Name  
FCD7N60TM  
Q20120270AA  
Result/FA  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Duration  
5 Cycles 24  
hrs  
PRECON  
HTGB  
L1 260C  
JESD22-A113  
JESD22-A108  
0/154  
0/77  
100 % Rated VGS, Tj  
max=150C  
1000hrs  
HTRB  
HTSL  
HAST  
80% of Rated BV, Tj max=150C JESD22-A108  
1000hrs  
1000hrs  
96hrs  
0/77  
0/77  
0/77  
150 C  
JESD22-A103  
JESD22-A110  
130 C, 85% RH, Vds=42V  
Delta 100C, 2 min on, 3.5 min  
off  
MIL-STD-750-  
1036  
PRCL  
10000 cycles  
0/77  
RSDH  
TMCL  
260C  
JESD22-B106  
JESD22-A104  
10 sec  
0/30  
0/77  
-65 C to 150 C, 30 min/ cycles  
500 cycles  
9 of 14  
Qualification Plan  
Q20120271  
Device  
FDD7N60NZTM  
Package  
TT252003  
Process  
UniFET2 600V Dpak  
No. of Lots  
1
Device Name  
Lot No.  
FDD7N60NZTM  
Q20120271AA  
Result/FA  
Reliability  
Test  
Condition  
Standard  
Duration  
5 Cycles 24  
hrs  
PRECON  
HTGB  
L1 260’C  
JESD22-A113  
JESD22-A108  
0/154  
0/77  
0/77  
100 % Rated VGS, Tj  
max=150C  
80% of Rated BV, Tj  
max=150C  
1000hrs  
HTRB  
JESD22-A108  
1000hrs  
HTSL  
HAST  
150 C  
JESD22-A103  
JESD22-A110  
1000hrs  
96hrs  
0/77  
0/77  
130 C, 85% RH, Vds=42V  
Delta 100C, 2 min on, 3.5 min  
off  
MIL-STD-750-  
1036  
PRCL  
10000 cycles  
0/77  
RSDH  
TMCL  
260C  
JESD22-B106  
JESD22-A104  
10sec  
0/30  
0/77  
-65 C to 150 C, 30 min/ cycles  
500 cycles  
Qualification Plan  
Q20120272  
Device  
Package  
TT220003  
Process  
Super-FET2 600V  
No. of Lots  
3
FCP190N60  
Device  
Name  
FCP190N60  
FCP190N60  
FCP190N60  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Q20120272AA Q20120272AB Q20120272AC  
Duration Result/FA  
Result/FA  
Result/FA  
100 % Rated  
VGS, Tj  
max=150C  
80% of Rated  
BV, Tj  
JESD22-  
A108  
HTGB  
HTRB  
1000hrs  
1000hrs  
0/77  
0/77  
0/77  
0/77  
JESD22-  
A108  
0/77  
0/77  
max=150C  
JESD22-  
A103  
JESD22-  
A110  
HTSL  
HAST  
150 C  
1000hrs  
96hrs  
0/77  
0/77  
0/77  
0/77  
0/77  
0/77  
130 C, 85%  
RH, Vds=42V  
Delta 100C, 2  
min on, 3.5 min  
off  
MIL-STD-  
750-1036  
8572  
cycles  
PRCL  
0/77  
0/77  
0/77  
JESD22-  
B106  
-65 C to 150 C, JESD22-  
30 min/ cycles A104  
RSDH  
TMCL  
260C  
10 sec  
0/30  
0/77  
0/30  
0/77  
0/30  
0/77  
500  
cycles  
10 of 14  
Qualification Plan  
Q20120273  
Device  
FCPF190N60  
Package  
TF22S003  
Process  
SuperFET2 600V TO220F  
No. of Lots  
1
Device Name FCPF190N60  
Reliability Test Condition  
Standard  
Lot No.  
Duration  
1000hrs  
1000hrs  
1000hrs  
96hrs  
Q20120273AA  
Result/FA  
0/77  
HTGB  
HTRB  
HTSL  
HAST  
PRCL  
RSDH  
TMCL  
100 % Rated VGS, Tj max=150C JESD22-A108  
80% of Rated BV, Tj max=150C  
150 C  
JESD22-A108  
JESD22-A103  
JESD22-A110  
0/77  
0/77  
130 C, 85% RH, Vds=42V  
0/77  
Delta 100C, 2 min on, 3.5 min off MIL-STD-750-1036 8572 cycles  
0/77  
260C  
JESD22-B106  
JESD22-A104  
10 sec  
0/30  
-65 C to 150 C, 30 min/ cycles  
500 cycles  
0/77  
Qualification Plan  
Q20120277  
Device  
FDD6N50TM  
Package  
TT252002  
Process  
UniFET1 300-500V/Dpak Ipak  
No. of Lots  
1
Device Name  
FDD6N50TM  
Q20120277AA  
Result/FA  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Duration  
5 Cycles 24  
hrs  
PRECON  
HTGB  
L1 260’C  
JESD22-A113  
JESD22-A108  
0/154  
0/77  
100 % Rated VGS, Tj  
max=150C  
1000hrs  
HTRB  
HTSL  
HAST  
80% of Rated BV, Tj max=150C JESD22-A108  
1000hrs  
1000hrs  
96hrs  
0/77  
0/77  
0/77  
150 C  
JESD22-A103  
JESD22-A110  
130 C, 85% RH, Vds=42V  
Delta 100C, 2 min on, 3.5 min  
off  
MIL-STD-750-  
1036  
PRCL  
10000 cycles  
0/77  
RSDH  
TMCL  
260C  
JESD22-B106  
JESD22-A104  
10 sec  
0/30  
0/77  
-65 C to 150 C, 30 min/ cycles  
500 cycles  
11 of 14  
Qualification Plan  
Q20130022A  
Device  
FCB20N60FTM  
FCH47N60F_F133  
Package  
TT263002  
TO247003  
Process  
No. of Lots  
2
1
SuperFET FR FET  
Device  
Name  
FCB20N60FTM FCB20N60FTM FCH47N60F_F133  
Q20130022AA Q20130022AB Q20130022BA  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Duration Result/FA  
JESD22- 5 Cycles  
A113 24 hrs  
Result/FA  
0/154  
Result/FA  
-
PRECON L1 245’C  
100 %  
0/154  
Rated VGS, JESD22-  
HTGB  
1000hrs 0/77  
0/77  
0/77  
0/77  
0/77  
Tj  
A108  
max=150C  
80% of  
Rated BV,  
Tj  
JESD22-  
A108  
HTRB  
1000hrs 0/77  
1000hrs 0/77  
max=150C  
JESD22-  
A103  
HTSL  
HAST  
150 C  
0/77  
0/77  
0/77  
0/77  
130 C, 85%  
RH,  
Vds=42V  
JESD22-  
A110  
96hrs  
8572  
0/77  
0/77  
Delta 100C,  
2 min on,  
3.5 min off  
MIL-STD- cycles  
750-1036 5000  
cycles  
PRCL  
0/77  
0/77  
JESD22-  
10 sec  
B106  
RSDH  
TMCL  
260C  
0/30  
0/77  
0/30  
0/77  
0/30  
0/77  
-65 C to  
150 C, 30  
min/ cycles  
JESD22- 500  
A104  
cycles  
12 of 14  
Qualification  
Plan  
No. of  
Lots  
Device  
Package  
Process  
PDP 4GEN Trench IGBT 330V_360V  
TO220F  
Q20130023  
FGPF4633TU TF22S003  
3
Device  
Name  
FGPF4633TU FGPF4633TU FGPF4633TU  
Q20130023AA Q20130023AB Q20130023AC  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Duration Result/FA  
Result/FA  
Result/FA  
100 % Rated  
VGS, Tj  
max=150C  
80% of Rated  
BV, Tj  
JESD22-  
A108  
HTGB  
HTRB  
1000hrs  
1000hrs  
0/77  
0/77  
0/77  
0/77  
JESD22-  
A108  
0/77  
0/77  
max=150C  
JESD22-  
A103  
JESD22-  
A110  
HTSL  
HAST  
150 C  
1000hrs  
96hrs  
0/77  
0/77  
0/77  
0/77  
0/77  
0/77  
130 C, 85%  
RH, Vds=42V  
Delta 100C, 2  
min on, 3.5 min  
off  
MIL-STD-  
750-1036  
8572  
cycles  
PRCL  
0/77  
0/77  
0/77  
JESD22-  
B106  
-65 C to 150 C, JESD22-  
30 min/ cycles A104  
RSDH  
TMCL  
260C  
10 sec  
0/30  
0/77  
0/30  
0/77  
0/30  
0/77  
500  
cycles  
Qualification Plan  
Q20130024  
Device  
Package  
Process  
Super-FET 600V TO220  
No. of Lots  
1
FCP20N60  
TO220003  
Device Name FCP20N60  
Reliability Test Condition  
Standard  
Lot No.  
Duration  
1000hrs  
1000hrs  
1000hrs  
96hrs  
Q20130024AA  
Result/FA  
0/77  
HTGB  
HTRB  
HTSL  
HAST  
PRCL  
RSDH  
TMCL  
100 % Rated VGS, Tj max=150C JESD22-A108  
80% of Rated BV, Tj max=150C  
150 C  
JESD22-A108  
JESD22-A103  
JESD22-A110  
0/77  
0/77  
130 C, 85% RH, Vds=42V  
0/77  
Delta 100C, 2 min on, 3.5 min off MIL-STD-750-1036 8572 cycles  
0/77  
260C  
JESD22-B106  
JESD22-A104  
10 sec  
0/30  
-65 C to 150 C, 30 min/ cycles  
500 cycles  
0/77  
13 of 14  
Qualification Plan  
Q20130020  
Device  
FGH40N60SMD  
Package  
TO247003  
Process  
FS IGBT 600V  
No. of Lots  
3
Device  
Name  
FGH40N60SMD FGH40N60SMD FGH40N60SMD  
Reliability  
Test  
Condition  
Standard  
Lot No.  
Q20130020AA  
Q20130020AB  
Result/FA  
Q20130020AC  
Result/FA  
Duration Result/FA  
100 % Rated  
VGS, Tj  
max=175C  
JESD22-  
A108  
HTGB  
1000hrs 0/77  
0/77  
0/77  
80% of  
Rated BV, Tj  
max=175C  
JESD22-  
A108  
HTRB  
HTSL  
HAST  
1000hrs 0/77  
1000hrs 0/77  
0/77  
0/77  
0/77  
0/77  
0/77  
0/77  
JESD22-  
A103  
150 C  
130 C, 85%  
RH,  
Vds=42V  
Delta 100C,  
5 min on, 5  
min off  
-65 C to 150  
C, 30 min/  
cycles  
JESD22-  
A110  
96hrs  
0/77  
0/77  
0/77  
MIL-STD- 6000  
750-1036 cycles  
PRCL  
TMCL  
0/77  
0/77  
0/77  
0/77  
JESD22- 500  
A104  
cycles  
14 of 14  

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