NDB603ALS62Z [FAIRCHILD]

Power Field-Effect Transistor, 25A I(D), 30V, 0.022ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB;
NDB603ALS62Z
型号: NDB603ALS62Z
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Power Field-Effect Transistor, 25A I(D), 30V, 0.022ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB

文件: 总5页 (文件大小:53K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
January 1996  
NDP603AL / NDB603AL  
N-Channel Logic Level Enhancement Mode Field Effect Transistor  
General Description  
Features  
These N-Channel logic level enhancement mode power  
field effect transistors are produced using Fairchild's  
proprietary, high cell density, DMOS technology. This  
very high density process is especially tailored to  
25A, 30V. RDS(ON) = 0.022W @ VGS=10V.  
Critical DC electrical parameters specified at elevated  
temperature.  
minimize on-state resistance.  
These devices are  
Rugged internal source-drain diode can eliminate the need  
for an external Zener diode transient suppressor.  
particularly suited for low voltage applications such as  
DC/DC converters and high efficiency switching circuits  
where fast switching, low in-line power loss, and  
resistance to transients are needed.  
High density cell design for extremely low RDS(ON)  
.
175°C maximum junction temperature rating.  
______________________________________________________________________________  
D
G
S
Absolute Maximum Ratings  
Symbol Parameter  
TC = 25°C unless otherwise noted  
NDP603AL  
NDB603AL  
Units  
Drain-Source Voltage  
Gate-Source Voltage - Continuous  
Drain Current - Continuous  
- Pulsed  
30  
± 20  
V
V
A
VDSS  
VGSS  
ID  
25 (Note 1)  
100  
PD  
Total Power Dissipation @ TC = 25°C  
Derate above 25°C  
50  
W
W/°C  
°C  
0.4  
Operating and Storage Temperature Range  
-65 to 175  
275  
TJ,TSTG  
TL  
Maximum lead temperature for soldering purposes,  
1/8" from case for 5 seconds  
°C  
THERMAL CHARACTERISTICS  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient  
2.5  
°C/W  
°C/W  
R
JC  
q
62.5  
R
JA  
q
© 1997 Fairchild Semiconductor Corporation  
NDP603AL.SAM  
Electrical Characteristics (TC = 25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
DRAIN-SOURCE AVALANCHE RATINGS (Note 2)  
WDSS  
IAR  
Single Pulse Drain-Source Avalanche  
Energy  
VDD = 15 V, ID = 25 A  
100  
25  
mJ  
A
Maximum Drain-Source Avalanche Current  
OFF CHARACTERISTICS  
Drain-Source Breakdown Voltage  
30  
V
BVDSS  
IDSS  
VGS = 0 V, ID = 250 µA  
VDS = 24 V, VGS = 0 V  
VGS = 20 V, VDS = 0 V  
VGS = -20 V, VDS = 0 V  
Zero Gate Voltage Drain Current  
Gate - Body Leakage, Forward  
Gate - Body Leakage, Reverse  
10  
µA  
nA  
nA  
100  
-100  
IGSSF  
IGSSR  
ON CHARACTERISTICS (Note 2)  
Gate Threshold Voltage  
1.1  
0.7  
1.4  
1
1.5  
1.1  
3
2.2  
V
VGS(th)  
VDS = VGS, ID = 250 µA  
VDS = VGS, ID = 10 mA  
VGS = 10 V, ID = 25 A  
TJ = 125oC  
TJ = 125oC  
TJ = 125oC  
1.85  
1.5  
3
2.2  
Static Drain-Source On-Resistance  
0.019  
0.028  
0.031  
0.022  
0.045  
0.04  
RDS(ON)  
W
VGS = 4.5 V, ID = 10 A  
VGS = 10 V, VDS = 10 V  
VGS = 4.5 V, VDS = 10 V  
VDS = 10 V, ID = 25 A  
ID(on)  
On-State Drain Current  
60  
15  
A
S
gFS  
Forward Transconductance  
18  
DYNAMIC CHARACTERISTICS  
Input Capacitance  
1100  
540  
pF  
pF  
pF  
Ciss  
Coss  
Crss  
VDS = 15 V, VGS = 0 V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
175  
SWITCHING CHARACTERISTICS (Note 2)  
tD(on)  
tr  
tD(off)  
tf  
Turn - On Delay Time  
Turn - On Rise Time  
Turn - Off Delay Time  
Turn - Off Fall Time  
Total Gate Charge  
VDD = 15 V, ID = 25 A,  
VGS = 10 V, RGEN = 24 W  
15  
70  
90  
80  
28  
5
30  
110  
150  
130  
40  
ns  
ns  
ns  
ns  
Qg  
Qgs  
Qgd  
VDS = 10 V,  
ID = 25 A, VGS = 10 V  
nC  
nC  
nC  
Gate-Source Charge  
Gate-Drain Charge  
7
7
10  
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS  
Maximum Continuous Drain-Source Diode Forward Current  
Drain-Source Diode Forward Voltage  
25  
A
V
IS  
1.3  
VSD  
VGS = 0 V, IS = 25 A (Note 2)  
Note:  
1. Maximum DC current limited by the package.  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.  
NDP603AL.SAM  
Typical Electrical Characteristics  
80  
3
2.5  
2
VGS =10V  
8.0  
7.0  
VGS = 4V  
6.0  
4.5  
60  
5.0  
5.0  
40  
6.0  
4.5  
1.5  
1
7.0  
8.0  
10  
4.0  
20  
0
3.0  
0.5  
0
20  
40  
, DRAIN CURRENT (A)  
60  
80  
0
1
2
3
4
5
V
, DRAIN-SOURCE VOLTAGE (V)  
I
D
DS  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with Gate Voltage  
and Drain Current.  
1.6  
2.5  
ID = 25A  
VGS =10V  
VGS = 10V  
1.4  
1.2  
1
2
T
= 125°C  
J
1.5  
1
25°C  
0.8  
0.6  
-55°C  
0.5  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
175  
0
20  
40  
, DRAIN CURRENT (A)  
60  
80  
T
, JUNCTION TEMPERATURE (°C)  
I
D
J
Figure 3. On-Resistance Variation  
with Temperature.  
Figure 4. On-Resistance Variation with Drain  
Current and Temperature.  
40  
30  
20  
10  
0
0.05  
T
= -55°C  
VDS = 10V  
VDS = 10V  
J
25  
125  
0.04  
0.03  
0.02  
0.01  
0
T
= 125°C  
J
25°C  
-55°C  
1
2
3
4
5
6
0.5  
1
1.5  
2
2.5  
V
, GATE TO SOURCE VOLTAGE (V)  
V
, GATE TO SOURCE VOLTAGE (V)  
GS  
GS  
Figure 6.  
Sub-threshold Drain Current Variation  
Figure 5.  
Drain Current Variation with Gate  
with Gate Voltage and Temperature.  
Voltage and Temperature.  
NDP603AL.SAM  
Typical Electrical Characteristics (continued)  
2.2  
1.12  
1.08  
1.04  
1
VDS = VGS  
ID = 250µA  
2
1.8  
1.6  
1.4  
1.2  
1
I D = 10mA  
1mA  
250uA  
0.96  
0.92  
0.8  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
175  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
175  
T
, JUNCTION TEMPERATURE (°C)  
T
, JUNCTION TEMPERATURE (°C)  
J
J
Figure 7. Gate Threshold Variation with  
Temperature  
Figure 8. Breakdown Voltage Variation with  
Temperature.  
2500  
2000  
10  
ID = 25A  
VDS = 5V  
C
10  
iss  
8
20  
1000  
500  
6
C
oss  
4
2
0
300  
200  
C
rss  
f = 1 MHz  
VGS = 0V  
100  
0.1  
0.2  
0.5  
1
2
5
10  
20 30  
0
5
10  
Q
15  
20  
25  
30  
V
, DRAIN TO SOURCE VOLTAGE (V)  
, GATE CHARGE (nC)  
g
DS  
Figure 9. Capacitance Characteristics.  
Figure 10. Gate Charge Characteristics.  
ton  
toff  
VDD  
td(off)  
r
t
tf  
t d(on)  
90%  
90%  
RL  
VIN  
D
VOUT  
Output, V  
Input, V  
out  
10%  
90%  
10%  
VGS  
Inverted  
RGEN  
DUT  
G
50%  
in  
50%  
10%  
S
Pulse Width  
Figure 12. Switching Waveforms  
Figure 11. Switching Test Circuit  
NDP603AL.SAM  
Typical Electrical Characteristics (continued)  
25  
40  
20  
10  
5
T
= -55°C  
J
VGS = 0V  
20  
15  
10  
5
25°C  
2
1
T
= 125°C  
J
25°C  
0.5  
-55°C  
125°C  
0.2  
0.1  
VDS = 10V  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
1.6  
0
10  
20  
, DRAIN CURRENT (A)  
30  
40  
V
, BODY DIODE FORWARD VOLTAGE (V)  
SD  
I
D
Figure 13. Transconductance Variation with Drain  
Current and Temperature  
Figure 14. Body Diode Forward Voltage  
Variation with Current and Temperature  
150  
100  
50  
20  
10  
5
VGS = 20V  
2
1
SINGLE PULSE  
TC = 25°C  
0.5  
0.1  
0.5  
1
2
5
10  
30  
50  
V
, DRAIN-SOURCE VOLTAGE(V)  
DS  
Figure 15. Maximum Safe Operating Area  
1
D = 0.5  
0.5  
0.3  
0.2  
0.2  
R
(t) = r(t) * R  
qJC  
qJC  
= 2.5 °C/W  
R
JC  
q
0.1  
0.1  
P(pk)  
0.05  
0.05  
0.02  
0.01  
t1  
t 2  
0.03  
0.02  
T
- T = P * R  
(t)  
Single Pulse  
J
C
q
JC  
Duty Cycle, D = t1 /t2  
0.01  
0.01  
0.1  
1
10  
100  
1000  
t1 ,TIME (ms)  
Figure 16. Transient Thermal Response Curve  
NDP603AL.SAM  

相关型号:

NDB6050

N-Channel Enhancement Mode Field Effect Transistor
FAIRCHILD

NDB6050/L99Z

48A, 50V, 0.025ohm, N-CHANNEL, Si, POWER, MOSFET, TO-263AB
TI

NDB6050L

N-Channel Logic Level Enhancement Mode Field Effect Transistor
FAIRCHILD

NDB6050L

48A, 50V, 0.025ohm, N-CHANNEL, Si, POWER, MOSFET, TO-263AB
TI

NDB6050L/L86Z

48A, 50V, 0.025ohm, N-CHANNEL, Si, POWER, MOSFET, TO-263AB
TI

NDB6050L/L99Z

48A, 50V, 0.025ohm, N-CHANNEL, Si, POWER, MOSFET, TO-263AB
TI

NDB6050L/S62Z

48A, 50V, 0.025ohm, N-CHANNEL, Si, POWER, MOSFET, TO-263AB
TI

NDB6050L99Z

Power Field-Effect Transistor, 48A I(D), 50V, 0.025ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB
FAIRCHILD

NDB6050LS62Z

Power Field-Effect Transistor, 48A I(D), 50V, 0.025ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, D2PAK-3
FAIRCHILD

NDB6051

N-Channel Enhancement Mode Field Effect Transistor
FAIRCHILD

NDB6051

48A, 50V, 0.022ohm, N-CHANNEL, Si, POWER, MOSFET, TO-263AB
TI

NDB6051/L86Z

48A, 50V, 0.022ohm, N-CHANNEL, Si, POWER, MOSFET, TO-263AB
TI