SFM9014 概述
Advanced Power MOSFET 先进的功率MOSFET
SFM9014 数据手册
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Advanced Power MOSFET
FEATURES
BVDSS = -60 V
RDS(on) = 0.5 Ω
ID = -1.8 A
! Avalanche Rugged Technology
! Rugged Gate Oxide Technology
! Lower Input Capacitance
! Improved Gate Charge
! Extended Safe Operating Area
! Lower Leakage Current : 10 µA (Max.) @ VDS = -60V
! Lower RDS(ON) : 0.362 Ω (Typ.)
SOT-223
2
1
3
1. Gate 2. Drain 3. Source
Absolute Maximum Ratings
Symbol
Characteristic
Value
-60
Units
VDSS
Drain-to-Source Voltage
V
Continuous Drain Current (TA=25oC)
Continuous Drain Current (TA=70oC)
Drain Current-Pulsed
-1.8
-1.1
-14
ID
A
1
IDM
VGS
EAS
IAR
A
V
O
2
Gate-to-Source Voltage
±!"
110
-1.8
0.28
-5.5
2.8
O
Single Pulsed Avalanche Energy
Avalanche Current
mJ
A
1
O
1
EAR
dv/dt
Repetitive Avalanche Energy
mJ
V/ns
W
O
3
Peak Diode Recovery dv/dt
O
o
*
Total Power Dissipation (TA=25 C)
PD
W/oC
*
Linear Derating Factor
Operating Junction and
0.022
TJ , TSTG
- 55 to +150
300
Storage Temperature Range
Maximum Lead Temp. for Soldering
Purposes, 1/8” from case for 5-seconds
oC
TL
Thermal Resistance
Symbol
Characteristic
Junction-to-Ambient
Typ.
--
Max.
Units
oC/W
RθJA
*
45
* When mounted on the minimum pad size recommended (PCB Mount).
Rev. B
P-CHANNEL
POWER MOSFET
SFM9014
Electrical Characteristics (TC=25oC unless otherwise specified)
Symbol
BVDSS
Characteristic
Min. Typ. Max. Units
Test Condition
V
GS=0V,ID=-250µA
Drain-Source Breakdown Voltage
Breakdown Voltage Temp. Coeff.
Gate Threshold Voltage
V
V/oC
V
-60
-- -0.05 --
-2.0 -- -4.0
-- -100
--
--
∆BV/∆TJ
VGS(th)
ID=-250µA
See Fig 7
V
V
V
DS=-5V,ID=-250µA
GS=-20V
GS=20V
Gate-Source Leakage , Forward
Gate-Source Leakage , Reverse
--
--
--
--
IGSS
nA
--
--
100
-10
VDS=-60V
DS=-48V,TC=125oC
IDSS
Drain-to-Source Leakage Current
µA
V
-- -100
Static Drain-Source
On-State Resistance
Forward Transconductance
Input Capacitance
4
RDS(on)
VGS=-10V,ID=-0.9A
VDS=-30V,ID=-0.9A
--
--
Ω
0.5
O
4
gfs
Ciss
Coss
Crss
td(on)
tr
--
--
--
--
--
--
--
--
--
--
--
1.43 --
270 350
S
O
VGS=0V,VDS=-25V,f =1MHz
Output Capacitance
Reverse Transfer Capacitance
Turn-On Delay Time
Rise Time
135
35
30
50
50
40
11
--
90
25
10
19
21
16
9
pF
See Fig 5
VDD=-30V,ID=-6.7A,
Ω
RG=24
ns
td(off)
tf
Turn-Off Delay Time
Fall Time
4
See Fig 13
5
O
O
Qg
Total Gate Charge
Gate-Source Charge
Gate-Drain(“Miller”) Charge
VDS=-48V,VGS=-10V,
Qgs
Qgd
nC
1.8
4.2
ID=-6.7A
4
5
O
--
See Fig 6 & Fig 12
O
Source-Drain Diode Ratings and Characteristics
Symbol
IS
Characteristic
Continuous Source Current
Pulsed-Source Current
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Min. Typ. Max. Units
Test Condition
--
--
--
--
--
--
-1.8
-14
-3.8
--
Integral reverse pn-diode
in the MOSFET
TJ=25oC,IS=-1.8A,VGS=0V
TJ=25oC,IF=-6.7A
A
1
ISM
O
4
VSD
trr
V
--
O
ns
µC
75
4
Qrr
-- 0.17 --
diF/dt=100A/µs
O
Notes ;
1
Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature
O
L=40mH, IAS=-1.8A, VDD=-25V, RG=27Ω*, Starting TJ =25oC
2
O
I
_ -6.7A, di/dt 200A/µs, V
BVDSS , Starting TJ =25oC
3
_
_
<
<
<
O
SD
DD
4
_
<
Pulse Test : Pulse Width = 250µs, Duty Cycle 2%
O
5
Essentially Independent of Operating Temperature
O
P-CHANNEL
POWER MOSFET
SFM9014
Fig 1. Output Characteristics
Fig 2. Transfer Characteristics
VGS
Top :
- 15 V
- 10 V
1
1
10
10
- 8.0 V
- 7.0 V
- 6.0 V
- 5.5V
- 5.0 V
Bottom : - 4.5V
150 oC
0
0
10
10
@ Notes :
1. VGS = 0 V
25 oC
2. VDS = -30 V
@ Notes :
1. 250 s Pulse Test
µ
3. 250 s Pulse Test
µ
- 55 oC
2. T = 25 oC
C
-1
-1
10
10
-1
0
1
2
4
6
8
10
10
10
10
-VGS , Gate-Source Voltage [V]
-VDS , Drain-Source Voltage [V]
Fig 3. On-Resistance vs. Drain Current
Fig 4. Source-Drain Diode Forward Voltage
1.2
0.9
0.6
0.3
0.0
1
10
V
GS = -10 V
0
10
150 oC
@ Notes :
1. VGS = 0 V
25 oC
2. 250 s Pulse Test
µ
V
GS = -20 V
@ Note : T = 25 oC
J
-1
10
0
5
10
15
20
25
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
-I , Drain Current [A]
-VSD , Source-Drain Voltage [V]
D
Fig 5. Capacitance vs. Drain-Source Voltage
Fig 6. Gate Charge vs. Gate-Source Voltage
500
400
300
200
100
C
iss=C +Cgd (C =shorted)
gs ds
C
oss=C +C
ds gd
V
DS =-12 V
DS =-30 V
DS =-48 V
10
5
Crss=C
V
gd
V
Ciss
Coss
@Notes:
1. VGS = 0 V
2. f= 1MHz
Crss
@Notes: I =-6.7 A
D
00
10
0
1
0
2
4
6
8
10
10
Q , Total Gate Charge [nC]
-VDS , Drain-Source Voltage [V]
G
P-CHANNEL
POWER MOSFET
SFM9014
Fig 7. Breakdown Voltage vs. Temperature
Fig 8. On-Resistance vs. Temperature
1.2
1.1
1.0
0.9
0.8
2.5
2.0
1.5
1.0
0.5
0.0
@ Notes :
1. VGS = -10 V
@ Notes :
1. VGS = 0 V
2. I = -3.4 A
2. I = -250
A
µ
D
D
-75 -50 -25
0
25
50
75
100 125 150 175
o
-75 -50 -25
0
25
50
75
100 125 150 175
o
T , Junction Temperature [C]
T , Junction Temperature [C]
J
J
Fig 9. Max. Safe Operating Area
Fig 10. Max. Drain Current vs. Case Temperature
2.0
2
10
Operation in This Area
is Limited by R DS(on)
1.5
1.0
0.5
0.0
1
10
0.01 ms
0.1 ms
1 ms
10 ms
0
10
DC
@ Notes :
1. T = 25 oC
C
-1
10
2. T = 150 oC
J
3. Single Pulse
-2
10
0
1
2
25
50
75
100
125
150
10
10
10
o
T , Case Temperature [C]
-VDS , Drain-Source Voltage [V]
c
Fig 11. Thermal Response
102
D=0.5
@ Notes :
1. Z JC(t)=45 oC/W Max.
2. Duty Factor, D=t1/t2
3. TJM-TC=PDM*Zθ JC(t)
θ
101
0.2
0.1
P.DM
0.05
0.02
t1.
t2.
0.01
100
single pulse
10-5
10-4
t1
10-3
10-2
10-1
100
101
,
Square Wave Pulse Duration [sec]
P-CHANNEL
POWER MOSFET
SFM9014
Fig 12. Gate Charge Test Circuit & Waveform
“ Current Regulator ”
VGS
Same Type
as DUT
Ω
50K
Qg
12V
200nF
-10V
300nF
VDS
Qgs
Qgd
VGS
DUT
R2
-3mA
R1
Charge
Current Sampling (IG) Current Sampling (ID)
Resistor Resistor
Fig 13. Resistive Switching Test Circuit & Waveforms
RL
t on
t off
Vout
Vin
tf
td(on)
tr
td(off)
VDD
( 0.5 rated VDS
)
Vin
10%
RG
DUT
-10V
90%
Vout
Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms
BVDSS
1
2
2
LL
ID
----
--------------------
BVDSS -- VDD
EAS
=
LL IAS
VDS
t p
Time
Vary tp to obtain
required peak ID
VDD
VDS (t)
RG
C
VDD
ID (t)
DUT
-10V
IAS
BVDSS
t p
P-CHANNEL
POWER MOSFET
SFM9014
Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
+
VDS
DUT
--
I S
L
Driver
VGS
Compliment of DUT
RG
(N-Channel)
VDD
VGS
• dv/dt controlled by “RG”
• IS controlled by Duty Factor “D”
Gate Pulse Width
VGS
--------------------------
D =
Gate Pulse Period
10V
( Driver )
Body Diode Reverse Current
IRM
I S
( DUT )
di/dt
IFM , Body Diode Forward Current
Vf
VDS
( DUT )
Body Diode
VDD
Forward Voltage Drop
Body Diode Recovery dv/dt
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
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SuperSOT-8
SyncFET
ImpliedDisconnect
ISOPLANAR
LittleFET
MicroFET
MicroPak
MICROWIRE
MSX
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ActiveArray
Bottomless
CoolFET
CROSSVOLT
DOME
EcoSPARK
E2CMOSTM
EnSignaTM
FACT Quiet Series
â
FAST
â
FASTr
FRFET
GlobalOptoisolator
GTO
HiSeC
I2C
QT Optoelectronics TinyLogic
Quiet Series
RapidConfigure
RapidConnect
TruTranslation
UHC
UltraFET
MSXPro
OCX
â
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OPTOLOGIC
Across the board. Around the world.
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DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Obsolete
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I1
SFM9014 替代型号
型号 | 制造商 | 描述 | 替代类型 | 文档 |
SFM9014TF | FAIRCHILD | Power Field-Effect Transistor, 1.8A I(D), 60V, 0.5ohm, 1-Element, P-Channel, Silicon, Meta | 功能相似 |
SFM9014 相关器件
型号 | 制造商 | 描述 | 价格 | 文档 |
SFM9014TF | FAIRCHILD | Power Field-Effect Transistor, 1.8A I(D), 60V, 0.5ohm, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET, | 获取价格 | |
SFM9110 | FAIRCHILD | Advanced Power MOSFET | 获取价格 | |
SFM9110D84Z | FAIRCHILD | Power Field-Effect Transistor, 1A I(D), 100V, 1.2ohm, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET | 获取价格 | |
SFM9110L99Z | FAIRCHILD | Power Field-Effect Transistor, 1A I(D), 100V, 1.2ohm, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET | 获取价格 | |
SFM9210 | FAIRCHILD | Advanced Power MOSFET | 获取价格 | |
SFM9210TF | FAIRCHILD | Power Field-Effect Transistor, 0.5A I(D), 200V, 3ohm, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET | 获取价格 | |
SFM9214 | FAIRCHILD | Advanced Power MOSFET | 获取价格 | |
SFM9214TF | FAIRCHILD | Power Field-Effect Transistor, 0.45A I(D), 250V, 4ohm, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET | 获取价格 | |
SFM9214TF | ROCHESTER | 0.45A, 250V, 4ohm, P-CHANNEL, Si, POWER, MOSFET | 获取价格 | |
SFMC-102-01-F-D | SAMTEC | .050'' X .050 CUTTABLE SOCKET ST | 获取价格 |
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