SI3441DVD84Z [FAIRCHILD]

Small Signal Field-Effect Transistor, 3.5A I(D), 20V, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET, SUPERSOT-6;
SI3441DVD84Z
型号: SI3441DVD84Z
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Small Signal Field-Effect Transistor, 3.5A I(D), 20V, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET, SUPERSOT-6

文件: 总5页 (文件大小:83K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
April 2001  
PRELIMINARY  
Si3441DV  
P-Channel 2.5V Specified PowerTrench MOSFET  
General Description  
Features  
This P-Channel 2.5V specified MOSFET uses  
Fairchild’s low voltage PowerTrench process. It has  
been optimized for battery power management  
applications.  
–3.5 A, –20 V. RDS(ON) = 80 m@ VGS = –4.5 V  
DS(ON) = 110 m@ VGS = –2.5 V  
R
Low gate charge  
Applications  
High performance trench technology for extremely  
low RDS(ON)  
Battery management  
Load switch  
Battery protection  
S
D
D
1
2
3
6
5
4
G
D
SuperSOT TM-6  
D
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
VDSS  
Parameter  
Drain-Source Voltage  
Ratings  
Units  
V
–20  
VGSS  
ID  
Gate-Source Voltage  
Drain Current – Continuous  
– Pulsed  
V
A
±8  
–3.5  
(Note 1a)  
–20  
PD  
Maximum Power Dissipation  
(Note 1a)  
(Note 1b)  
1.6  
W
0.8  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
–55 to +150  
°C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
(Note 1a)  
(Note 1)  
78  
30  
RθJA  
°C/W  
°C/W  
RθJC  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
.441  
Si3441DV  
7’’  
8mm  
3000 units  
Si3441DV Rev A (W)  
2001 Fairchild Semiconductor Corporation  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage  
–20  
V
V
GS = 0 V, ID = –250 µA  
Breakdown Voltage Temperature  
Coefficient  
–12  
BVDSS  
TJ  
ID = –250 µA, Referenced to 25°C  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
VDS = –16 V, VGS = 0 V  
–1  
µA  
nA  
nA  
IGSSF  
IGSSR  
VGS = 8 V,  
VGS = –8 V  
VDS = 0 V  
VDS = 0 V  
100  
–100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
–0.4  
–10  
–0.8  
3
–1.5  
V
V
DS = VGS, ID = –250 µA  
Gate Threshold Voltage  
Temperature Coefficient  
VGS(th)  
TJ  
ID = –250 µA, Referenced to 25°C  
mV/°C  
RDS(on)  
Static Drain–Source  
On–Resistance  
VGS = –4.5 V, ID = –3.5 A  
V
VGS = –4.5 V, ID = –3.5A,TJ=125°C  
60  
82  
77  
80  
110  
112  
mΩ  
GS = –2.5 V, ID = –3.1 A  
ID(on)  
gFS  
On–State Drain Current  
VGS = –4.5 V,  
VDS = –5 V,  
VDS = –5 V  
ID = –3.5 A  
A
S
Forward Transconductance  
11  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
779  
121  
56  
pF  
pF  
pF  
VDS = –10 V,  
f = 1.0 MHz  
V GS = 0 V,  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
10  
9
20  
19  
43  
20  
10  
ns  
ns  
VDD = –10 V,  
VGS = –4.5 V,  
ID = –1 A,  
RGEN = 6 Ω  
27  
11  
7.2  
1.7  
1.5  
ns  
ns  
Qg  
Qgs  
Qgd  
nC  
nC  
nC  
VDS = –10 V,  
ID = –3.5 A,  
V
GS = –4.5 V  
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
–1.3  
–1.2  
A
V
VSD  
Drain–Source Diode Forward  
Voltage  
VGS = 0 V, IS = –1.3 A (Note 2)  
–0.8  
Notes:  
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.  
a)  
78°C/W when  
b)  
156°C/W when mounted  
on a minimum pad of 2 oz  
copper  
mounted on a 1in2 pad  
of 2 oz copper  
Scale 1 : 1 on letter size paper  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%  
Si3441DV Rev A (W)  
Typical Characteristics  
15  
2
1.8  
1.6  
1.4  
1.2  
1
VGS = -4.5V  
-3.0V  
-2.5V  
-3.5V  
VGS=-2.0V  
12  
9
-2.0V  
-2.5V  
6
-3.0V  
-3.5V  
-4.5V  
3
-1.5V  
0.8  
0
0
3
6
9
12  
15  
0
1
2
3
4
-ID, DRAIN CURRENT (A)  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
1.4  
1.3  
1.2  
1.1  
1
0.22  
ID = -1.8A  
ID = -3.5A  
VGS = -4.5V  
0.18  
0.14  
0.1  
TA = 125oC  
TA = 25oC  
0.9  
0.8  
0.7  
0.06  
0.02  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
1
2
3
4
5
TJ, JUNCTION TEMPERATURE (oC)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
10  
8
10  
VDS = -5V  
TA = -55oC  
25oC  
125oC  
VGS = 0V  
1
TA = 125oC  
6
0.1  
25oC  
4
0.01  
-55oC  
2
0.001  
0
0.0001  
0.5  
1
1.5  
2
2.5  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
-VGS, GATE TO SOURCE VOLTAGE (V)  
-VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
Si3441DV Rev A (W)  
Typical Characteristics  
5
1000  
800  
600  
400  
200  
0
f = 1 MHz  
VGS = 0 V  
ID = -3.5A  
VDS = -5V  
-10V  
CISS  
4
3
2
1
0
-15V  
COSS  
CRSS  
0
1
2
3
4
5
6
7
8
9
0
5
10  
15  
20  
Qg, GATE CHARGE (nC)  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
10  
8
100  
10  
SINGLE PULSE  
R
θJA = 156°C/W  
TA = 25°C  
RDS(ON) LIMIT  
100µs  
1ms  
10ms  
6
100ms  
1
1s  
4
DC  
VGS = -10V  
SINGLE PULSE  
0.1  
0.01  
RθJA = 156oC/W  
2
T
A = 25oC  
0
0.01  
0.1  
1
10  
100  
0.1  
1
10  
100  
t1, TIME (sec)  
-VDS, DRAIN-SOURCE VOLTAGE (V)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
R
θJA(t) = r(t) + RθJA  
0.2  
R
θJA = 156oC/W  
0.1  
0.1  
0.05  
0.02  
P(pk)  
t1  
t2  
0.01  
0.01  
TJ - TA = P * RθJA(t)  
Duty Cycle, D = t1 / t2  
SINGLE PULSE  
0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient thermal response will change depending on the circuit board design.  
Si3441DV Rev A (W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
PACMAN™  
POP™  
PowerTrench  
QFET™  
QS™  
QT Optoelectronics™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
Star* Power™  
Stealth™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
FAST  
FASTr™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MICROWIRE™  
OPTOLOGIC™  
OPTOPLANAR™  
ACEx™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DenseTrench™  
DOME™  
UltraFET  
VCX™  
EcoSPARK™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H1  

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