SI4466 [FAIRCHILD]

Single N-Channel 2.5V Specified PowerTrench MOSFET; 单N沟道2.5V指定的PowerTrench MOSFET
SI4466
型号: SI4466
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Single N-Channel 2.5V Specified PowerTrench MOSFET
单N沟道2.5V指定的PowerTrench MOSFET

文件: 总5页 (文件大小:81K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
January 2001  
Si4466DY  
Single N-Channel 2.5V Specified PowerTrench MOSFET  
General Description  
Features  
This N-Channel 2.5V specified MOSFET is produced  
using Fairchild Semiconductor's advanced  
PowerTrench process that has been especially tailored  
to minimize on-state resistance and yet maintain superior  
switching performance.  
15 A, 20 V. RDS(on) = 0.0075 @ VGS = 4.5 V  
RDS(on) = 0.010 @ VGS = 2.5 V.  
Low gate charge (47nC typical).  
Fast switching speed.  
These devices are well suited for low voltage and battery  
powered applications where low in-line power loss and  
fast switching are required.  
High performance trench technology for extremely  
low RDS(ON)  
.
Applications  
High power and current handling capability.  
DC/DC converter  
Load switch  
Battery protection  
D
D
D
5
6
7
8
4
3
2
1
D
G
S
S
SO-8  
S
TA = 25°C unless otherwise noted  
Absolute Maximum Ratings  
Symbol  
Parameter  
Ratings  
Units  
VDSS  
VGSS  
ID  
Drain-Source Voltage  
Gate-Source Voltage  
Drain Current - Continuous  
- Pulsed  
20  
V
V
A
12  
±
(Note 1a)  
(Note 1a)  
15  
50  
PD  
Power Dissipation for Single Operation  
2.5  
W
(Note 1b)  
(Note 1c)  
1.2  
1
TJ, Tstg  
Operating and Storage Junction Temperature Range  
-55 to +150  
C
°
Thermal Characteristics  
θ
(Note 1a)  
(Note 1)  
R
R
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
50  
25  
C/W  
C/W  
JA  
°
°
JC  
θ
Package Outlines and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape Width  
Quantity  
4466  
Si4466DY  
13’’  
12mm  
2500 units  
2001 Fairchild Semiconductor International  
Si4466DY Rev. A  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Off Characteristics  
BVDSS  
Drain-Source Breakdown Voltage  
20  
V
µ
GS = 0 V, ID = 250 A  
V
Breakdown Voltage Temperature  
Coefficient  
29  
DSS  
µ
°
°
mV/ C  
BV  
I
D = 250 A, Referenced to 25 C  
TJ  
IDSS  
Zero Gate Voltage Drain Current  
VDS = 16 V, VGS = 0 V  
1
µ
A
IGSSF  
IGSSR  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
V
V
GS = 12 V, VDS = 0 V  
GS = –12 V, VDS = 0 V  
100  
nA  
nA  
–100  
On Characteristics (Note 2)  
VGS(th)  
Gate Threshold Voltage  
0.4  
25  
0.9  
-4  
1.5  
V
µ
DS = VGS, ID = 250 A  
V
Gate Threshold Voltage  
Temperature Coefficient  
µ
°
°
VGS(th)  
I
D = 250 A, Referenced to 25 C  
mV/ C  
TJ  
RDS(on)  
Static Drain-Source  
On-Resistance  
VGS = 4.5 V, ID =15 A  
VGS = 4.5 V, ID =15 A,  
0.006 0.0075  
0.009 0.0130  
0.008 0.0100  
°
TJ=125 C  
VGS = 2.5 V, ID =12 A  
VGS = 4.5 V, VDS = 5.0 V  
ID(on)  
gFS  
On-State Drain Current  
A
S
Forward Transconductance  
VDS = 5 V, ID = 15 A  
70  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
VDS = 10 V, VGS = 0 V,  
f = 1.0 MHz  
4700  
850  
pF  
pF  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
310  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
V
DD = 10 V, ID = 1 A,  
20  
27  
95  
35  
47  
7
32  
44  
ns  
ns  
VGS = 4.5 V, RGEN = 6  
133  
56  
ns  
ns  
Qg  
VDS = 10 V, ID = 15 A,  
VGS = 5 V,  
66  
nC  
nC  
nC  
Qgs  
Qgd  
10.5  
Drain-Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain-Source Diode Forward Current  
2.1  
1.2  
A
V
(Note 2)  
VSD  
Drain-Source Diode Forward Voltage VGS = 0 V, IS = 2.1 A  
0.65  
Notes:  
1.  
RθJA is the sum of the junction-to-case and case-to-ambient resistance where the case thermal reference is defined as the solder mounting surface of the  
drain pins. RθJC is guaranteed by design while RθJA is determined by the user's board design.  
c) 125° C/W when  
a) 50° C/W when  
b) 105° C/W when  
mounted on a 0.003 in2  
pad of 2 oz. copper.  
mounted on a 0.5 in2  
pad of 2 oz. copper.  
mounted on a 0.02 in2  
pad of 2 oz. copper.  
Scale  
1 : 1 on letter size paper  
2. Pulse Test: Pulse Width 300 µs, Duty Cycle 2.0%  
Si4466DY Rev. A  
Typical Characteristics  
50  
2.5  
2
VGS= 4.5V  
2.5V  
40  
30  
20  
10  
0
2.0V  
3.0V  
VGS= 2.0V  
1.5  
1
2.5V  
3.0V  
4.5V  
40  
1.5V  
0.5  
0
0.4  
0.8  
1.2  
1.6  
2
0
10  
20  
30  
50  
V
DS, DRAIN TO SOURCE VOLTAGE (V)  
ID, DRAIN CURRENT (A)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation  
with Drain Current and Gate Voltage.  
0.03  
0.024  
0.018  
0.012  
0.006  
0
1.6  
ID= 15A  
ID= 7.0A  
VGS= 4.5V  
1.4  
1.2  
1
TJ= 125oC  
25oC  
0.8  
0.6  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
TJ, JUNCTION TEMPERATURE (oC)  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation  
with Temperature.  
Figure 4. On-Resistance Variation  
with Gate-to-Source Voltage.  
100  
50  
40  
30  
20  
10  
0
VGS= 0  
TJ= -55oC  
VDS= 5V  
25oC  
10  
1
125oC  
TJ=125oC  
25oC  
125oC  
0.1  
0.01  
0.001  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
0.5  
1
1.5  
2
2.5  
V
SD, BODY DIODE VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 6. Body Diode Forward Voltage  
Variation with Source Current  
and Temperature.  
Figure 5. Transfer Characteristics.  
Si4466DY Rev. A  
Typical Characteristics (continued)  
5
7000  
6000  
5000  
4000  
3000  
2000  
1000  
0
ID= 13A  
4
VDS= 5V  
Ciss  
10V  
3
15V  
2
1
0
Coss  
Crss  
0
4
8
12  
16  
20  
0
10  
20  
30  
40  
50  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
100  
10  
50  
40  
30  
20  
10  
0
RDS(ON) Limit  
100 s  
µ
SINGLE PULSE  
RθJA=125oC/W  
TA=25oC  
1ms  
10ms  
100ms  
1s  
10s  
1
DC  
VGS= 4.5V  
0.1  
SINGLE  
PULSE  
R JA= 125oC/W  
θ
0.01  
0.01  
0.1  
1
10  
100  
0.001  
0.01  
0.1  
1
10  
100  
1000  
VDS, DRAIN-SOURCE VOLTAGE (V)  
SINGLE PULSE TIME (SEC)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
0.5  
R
(t) = r(t) * R  
JA  
θ
0.2  
0.2  
JA  
θ
R
= 125°C/W  
JA  
θ
0.1  
0.1  
0.05  
0.05  
P(pk)  
0.02  
0.02  
0.01  
t
1
t
2
0.01  
Single Pulse  
T
- T = P * R  
(t)  
JA  
0.005  
J
A
θ
Duty Cycle, D = t /t  
1
2
0.002  
0.001  
0.0001  
0.001  
0.01  
0.1  
, TIME (sec)  
1
10  
100  
300  
t
1
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1c.  
Transient themal response will change depending on the circuit board design.  
Si4466DY Rev. A  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
PowerTrench  
QFET™  
QS™  
SyncFET™  
TinyLogic™  
UHC™  
ACEx™  
FASTr™  
GlobalOptoisolator™  
GTO™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DOME™  
QT Optoelectronics™  
VCX™  
HiSeC™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
ISOPLANAR™  
MICROWIRE™  
OPTOLOGIC™  
OPTOPLANAR™  
PACMAN™  
POP™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
FAST  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. G  

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