SI4542DYS62Z [FAIRCHILD]

Power Field-Effect Transistor, 6A I(D), 30V, 0.028ohm, 2-Element, N-Channel and P-Channel, Silicon, Metal-oxide Semiconductor FET, SO-8;
SI4542DYS62Z
型号: SI4542DYS62Z
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Power Field-Effect Transistor, 6A I(D), 30V, 0.028ohm, 2-Element, N-Channel and P-Channel, Silicon, Metal-oxide Semiconductor FET, SO-8

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中文:  中文翻译
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January 2001  
Si4542DY  
30V Complementary PowerTrench MOSFET  
General Description  
Features  
This complementary MOSFET device is produced using  
Fairchild’s advanced PowerTrench process that has  
been especially tailored to minimize the on-state  
resistance and yet maintain low gate charge for  
superior switching performance.  
Q1: N-Channel  
6 A, 30 V  
RDS(on) = 28 m@ VGS = 10V  
RDS(on) = 35 m@ VGS = 4.5V  
Q2: P-Channel  
Applications  
–6 A, –30 V  
R
DS(on) = 32 m@ VGS = –10V  
DS(on) = 45 m@ VGS = –4.5V  
DC/DC converter  
R
Power management  
Q2  
D2  
5
6
7
8
4
3
2
1
D2  
D1  
D1  
Q1  
G2  
SO-8  
S2  
G1  
S1  
Pin 1  
Absolute Maximum Ratings TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Q1  
Q2  
Units  
VDSS  
VGSS  
ID  
Drain-Source Voltage  
30  
±20  
6
–30  
±20  
–6  
V
V
A
Gate-Source Voltage  
Drain Current - Continuous  
- Pulsed  
(Note 1a)  
20  
–20  
PD  
Power Dissipation for Dual Operation  
Power Dissipation for Single Operation  
2
W
(Note 1a)  
(Note 1b)  
1.6  
1.2  
1
(Note 1c)  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
–55 to +175  
°C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
(Note 1a)  
(Note 1)  
78  
40  
RθJA  
°C/W  
°C/W  
RθJC  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
2500 units  
4542  
Si4542DY  
13”  
12mm  
Si4542DY Rev A  
2001 Fairchild Semiconductor International  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Type Min Typ Max Units  
Off Characteristics  
BVDSS  
Drain-Source Breakdown  
VGS = 0 V, ID = 250 µA  
VGS = 0 V, ID = –250 µA  
ID = 250 µA, Referenced to 25°C  
ID = –250 µA, Referenced to 25°C  
VDS = 24 V, VGS = 0 V  
Q1  
Q2  
Q1  
Q2  
30  
–30  
V
Voltage  
Breakdown Voltage  
Temperature Coefficient  
23  
–21  
BVDSS  
TJ  
mV/°C  
IDSS  
Zero Gate Voltage Drain  
Current  
Q1  
Q2  
1
–1  
µA  
V
DS = –24 V, VGS = 0 V  
IGSS  
Gate-Body Leakage  
VGS = +20 V, VDS = 0 V  
VGS = +20 V, VDS = 0 V  
Q1  
Q2  
+100  
+100  
nA  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
VDS = VGS, ID = 250 µA  
VDS = VGS, ID = –250 µA  
ID = 250 µA, Referenced to 25°C  
ID = –250 µA, Referenced to 25°C  
VGS = 10 V, ID = 6 A  
Q1  
Q2  
Q1  
Q2  
1
–1  
1.5  
–1.7  
–4  
3
–3  
V
Gate Threshold Voltage  
Temperature Coefficient  
VGS(th)  
TJ  
mV/°C  
mΩ  
4
RDS(on)  
Static Drain-Source  
On-Resistance  
Q1  
19  
32  
25  
28  
48  
35  
VGS = 10 V, ID = 6 A, TJ = 125°C  
VGS = 4.5 V, ID = 5 A  
Q2  
VGS = –10 V, ID = –6 A  
VGS = –10 V, ID = –6 A, TJ = 125°C  
VGS = –4.5 V, ID = –5 A  
21  
29  
30  
32  
51  
45  
ID(on)  
gFS  
On-State Drain Current  
VGS = 10 V, VDS = 5 V  
Q1  
Q2  
Q1  
Q2  
20  
–20  
A
S
V
GS = –10 V, VDS = –5 V  
Forward Transconductance VDS = 15 V, ID = 6 A  
VDS = –10 V, ID = –6 A  
18  
16  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
Q1  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
830  
1540  
185  
400  
80  
pF  
pF  
pF  
VDS = 15 V, VGS = 0 V,  
f = 1.0 MHz  
Q2  
VDS = –15 V, VGS = 0 V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer  
Capacitance  
170  
Electrical Characteristics (continued)  
TA = 25°C unless otherwise noted  
Symbol Parameter Test Conditions  
Type Min Typ Max Units  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
Q1  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
6
13  
10  
22  
18  
47  
5
18  
9
15  
2.8  
4
3.1  
5
12  
24  
18  
35  
29  
75  
12  
30  
13  
20  
ns  
ns  
VDS = 15 V, ID = 1 A,  
VGS = 10V, RGEN = 6 Ω  
Q2  
ns  
VDS = –15 V, ID = –1 A,  
VGS = –10 V, RGEN = 6 Ω  
ns  
Qg  
Qgs  
Qgd  
Q1  
V
nC  
nC  
nC  
DS = 15 V, ID = 7.5 A, VGS = 5 V  
Q2  
DS = –10 V, ID = –6 A, VGS = –5V  
V
Si4542DY Rev A  
Drain-Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain-Source Diode Forward Current  
Q1  
Q2  
Q1  
Q2  
1.3  
–1.3  
1.2  
A
V
VSD  
Drain-Source Diode Forward VGS = 0 V, IS = 1.3 A (Note 2)  
0.7  
–0.7  
Voltage  
VGS = 0 V, IS = –1.3 A (Note 2)  
–1.2  
Notes:  
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.  
a) 78°C/W when  
mounted on a  
0.5 in2 pad of 2 oz  
copper  
b) 125°C/W when  
mounted on a .02 in2  
pad of 2 oz copper  
c) 135°C/W when mounted on a  
minimum pad.  
Scale 1 : 1 on letter size paper  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%  
Si4542DY Rev A  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
PACMAN™  
POP™  
PowerTrench  
QFET™  
QS™  
QT Optoelectronics™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
Star* Power™  
Stealth™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
FAST  
FASTr™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MICROWIRE™  
OPTOLOGIC™  
OPTOPLANAR™  
ACEx™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DenseTrench™  
DOME™  
UltraFET  
VCX™  
EcoSPARK™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H1  

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