MCF5208CVM166 [FREESCALE]
Microprocessor Data Sheet; 微处理器数据表型号: | MCF5208CVM166 |
厂家: | Freescale |
描述: | Microprocessor Data Sheet |
文件: | 总46页 (文件大小:979K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
MCF5208EC
Rev. 0.5, 3/2006
Freescale Semiconductor
Data Sheet: Advance Information
MCF5208 ColdFire®
Microprocessor Data Sheet
Supports MCF5207 & MCF5208
by: Microcontroller Division
Table of Contents
The MCF5207 and MCF5208 devices are
1
2
3
4
5
6
MCF5207/8 Device Configurations......................2
Ordering Information ...........................................3
Signal Descriptions..............................................3
Mechanicals and Pinouts ....................................8
Preliminary Electrical Characteristics................18
Revision History ................................................43
highly-integrated 32-bit microprocessors based on the
version 2 ColdFire microarchitecture. Both devices
contain a 16-Kbyte internal SRAM, an 8-Kbyte
configurable cache, a 2-bank SDR/DDR SDRAM
controller, a 16-channel DMA controller, up to three
UARTs, a queued SPI, a low-power management
modeule, and other peripherals that enable the MCF5207
and MCF5208 for use in industrial control and
connectivity applications. The MCF5208 device also
features a 10/100 Mbps fast ethernet controller.
This document provides detailed information on power
considerations, DC/AC electrical characteristics, and AC
timing specifications of the MCF5207 and MCF5208
microprocessors. It was written from the perspective of
the MCF5208 device. See the following section for a
summary of differences between the two devices.
This document contains information on a new product. Specifications and information herein
are subject to change without notice.
© Freescale Semiconductor, Inc., 2006. All rights reserved.
• Preliminary
MCF5207/8 Device Configurations
1 MCF5207/8 Device Configurations
The following table compares the two devices described in this document:
Table 1. MCF5207 & MCF5208 Configurations
Module
MCF5207
MCF5208
Version 2 ColdFire Core with EMAC
(Enhanced Multiply-Accumulate Unit)
x
x
Core (System) Clock
up to 166.67 MHz
Peripheral and External Bus Clock
up to 83.33 MHz
(Core clock ÷ 2)
Performance (Dhrystone/2.1 MIPS)
Instruction/Data Cache
Static RAM (SRAM)
up to 159
8 Kbytes
16 Kbytes
SDR/DDR SDRAM Controller
Fast Ethernet Controller (FEC)
Low-Power Management Module
UARTs
x
x
—
x
x
x
3
3
I2C
x
x
QSPI
x
x
32-bit DMA Timers
4
4
Watchdog Timer (WDT)
Periodic Interrupt Timers (PIT)
Edge Port Module (EPORT)
Interrupt Controllers (INTC)
16-channel Direct Memory Access (DMA)
FlexBus External Interface
General Purpose I/O Module (GPIO)
JTAG - IEEE® 1149.1 Test Access Port
Package
x
x
4
4
x
x
1
1
x
x
x
x
x
x
x
x
144 LQFP
160 QFP
144 MAPBGA 196 MAPBGA
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
2
Freescale Semiconductor
Ordering Information
2 Ordering Information
Table 2. Orderable Part Numbers
Freescale Part
Number
Description
Speed
Temperature
MCF5207CAG166
MCF5207CVM166
MCF5208CAB166
MCF5208CVM166
MCF5207 RISC Microprocessor, 144 LQFP
MCF5207 RISC Microprocessor, 144 MAPBGA
MCF5208 RISC Microprocessor, 160 QFP
MCF5208 RISC Microprocessor, 196 MAPBGA
166.67 MHz
166.67 MHz
166.67 MHz
166.67 MHz
–40° to +85° C
–40° to +85° C
–40° to +85° C
–40° to +85° C
3 Signal Descriptions
The following table lists all the MCF5208 pins grouped by function. The “Dir” column is the direction for
the primary function of the pin only. Refer to Section 4, “Mechanicals and Pinouts,” for package diagrams.
For a more detailed discussion of the MCF5208 signals, consult the MCF5208 Reference Manual
(MCF5208RM).
NOTE
In this table and throughout this document a single signal within a group is
designated without square brackets (i.e., A23), while designations for
multiple signals within a group use brackets (i.e., A[23:21]) and is meant to
include all signals within the two bracketed numbers when these numbers
are separated by a colon.
NOTE
The primary functionality of a pin is not necessarily its default functionality.
Pins that are muxed with GPIO will default to their GPIO functionality.
Table 3. MCF5207/8 Signal Information and Muxing
MCF5207
144
MCF5207
144
MCF5208
160
MCF5208
196
Signal Name
GPIO
Alternate 1
Alternate 2 Dir.1
LQFP
MAPBGA
QFP
MAPBGA
Reset
RESET2
RSTOUT
—
—
—
—
—
—
I
82
74
J10
90
82
J14
O
M12
N14
Clock
EXTAL
XTAL
—
—
—
—
—
—
—
—
—
I
78
80
34
K12
J12
L1
86
88
40
L14
K14
N1
O
O
FB_CLK
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
3
Signal Descriptions
Signal Name
Table 3. MCF5207/8 Signal Information and Muxing (continued)
MCF5207
144
MCF5207
144
MCF5208
160
MCF5208
196
GPIO
Alternate 1
Alternate 2 Dir.1
LQFP
MAPBGA
QFP
MAPBGA
Mode Selection
RCON2
—
—
—
—
—
—
I
I
144
79
C4
160
87
C3
DRAMSEL
H10
K11
FlexBus
A[23:22]
A[21:16]
—
—
FB_CS[5:4]
—
—
—
O
O
118, 117
B9, A10
126, 125
B11, A11
116–114,
112, 108,
107
C9, A11,
B10, A12,
C11, B11
124, 123,
122, 120,
116, 115
B12, A12,
A13, B13,
B14, C13
A[15:14]
A[13:11]
—
—
SD_BA[1:0]
SD_A[13:11]
—
—
O
O
106, 105
104–102
B12, C12
114, 113
C14, D12
D11, E10,
D12
112, 111,
110
D13, D14,
E11
A10
—
—
—
—
—
O
O
101
C10
109
E12
A[9:0]
SD_A[9:0]
100–91
E11, D9,
E12, F10,
F11, E9,
F12, G10,
G12, F9
108–99
E13, E14,
F11–F14,
G11–G14
D[31:16]
D[15:0]
—
—
SD_D[31:16]3
FB_D[31:16]3
SD_DQM[3:0]
—
—
—
O
O
O
21–28,
40–47
F1, F2, G1,
G2, G4, G3,
H1, H2, K3,
L2, L3, K2,
M3, J4, M4,
K4
27–34,
46–53
J4–J1,
K4–K1, M3,
N3, M4, N4,
P4, L5, M5,
N5
8–15, 51–58 B2, B1, C2,
C1, D2, D1,
E2, E1, L5,
16–23,
57–64
F3–F1,
G4–G1, H1,
N6, P6, L7,
M7, N7, P7,
N8, P8
K5, L6, J6,
M6, J7, L7,
K7
BE/BWE[3:0]
PBE[3:0]
20, 48, 18, F4, L4, E3, 26, 54, 24, H2, P5, H4,
50
60
90
59
4
J5
56
66
98
65
12
M6
M8
H14
L8
OE
TA2
R/W
TS
PBUSCTL3
PBUSCTL2
PBUSCTL1
PBUSCTL0
—
—
—
—
—
—
O
I
J8
G11
K6
—
O
O
DACK0
B3
E3
Chip Selects
FB_CS[3:2]
FB_CS1
PCS[3:2]
PCS1
—
—
SD_CS1
—
—
—
—
O
O
O
119, 120
121
D7, A9
C8
—
C11, A10
B10
127
128
FB_CS0
122
B8
C10
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
4
Freescale Semiconductor
Signal Descriptions
Table 3. MCF5207/8 Signal Information and Muxing (continued)
MCF5207
144
MCF5207
144
MCF5208
MCF5208
196
Signal Name
GPIO
Alternate 1
Alternate 2 Dir.1
160
LQFP
MAPBGA
QFP
MAPBGA
SDRAM Controller
SD_A10
SD_CKE
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
O
O
O
O
O
O
O
O
O
O
37
6
M1
C3
43
14
N2
E1
SD_CLK
31
32
7
J1
37
L1
SD_CLK
K1
38
M1
F4
SD_CS0
A1
15
SD_DQS[3:2]
SD_SCAS
SD_SRAS
SD_SDR_DQS
SD_WE
19, 49
38
39
29
5
F3, M5
M2
J2
25, 55
44
H3, L6
P2
45
P3
H3
35
L3
D3
13
E2
External Interrupts Port4
IRQ72
IRQ42
IRQ12
PIRQ72
PIRQ42
PIRQ12
—
DREQ02
—
—
—
—
I
I
I
134
133
132
A5
C6
B6
142
141
140
C7
D7
D8
FEC
FEC_MDC
FEC_MDIO
FEC_TXCLK
FEC_TXEN
FEC_TXD0
FEC_COL
PFECI2C3
PFECI2C2
PFECH7
PFECH6
PFECH5
PFECH4
PFECH3
PFECH2
PFECH1
PFECH0
I2C_SCL2
U2TXD
U2RXD
—
O
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
148
147
157
158
3
D6
I2C_SDA2
I/O
I
C6
—
—
—
—
—
—
—
—
—
—
—
—
B3
—
O
O
I
A2
—
B1
—
7
D3
FEC_RXCLK
FEC_RXDV
FEC_RXD0
FEC_CRS
—
I
154
153
152
8
B4
A4
—
I
—
I
D5
—
I
D2
FEC_TXD[3:1] PFECL[7:5]
FEC_TXER PFECL4
FEC_RXD[3:1] PFECL[3:1]
—
O
O
I
6–4
156
149–151
155
C1, C2, B2
A3
—
—
A5, B5, C5
C4
FEC_RXER
PFECL0
—
I
I2C
I2C_SDA2
PFECI2C02
U2RXD2
—
I/O
—
—
—
D1
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
5
Signal Descriptions
Signal Name
Table 3. MCF5207/8 Signal Information and Muxing (continued)
MCF5207
144
MCF5207
144
MCF5208
160
MCF5208
196
MAPBGA
GPIO
PFECI2C12
Alternate 1
Alternate 2 Dir.1
LQFP
MAPBGA
QFP
I2C_SCL2
U2TXD2
—
I/O
DMA
—
—
—
E4
DACK0 and DREQ0 do not have a dedicated bond pads. Please refer to the following pins for muxing:
TS and QSPI_CS2 for DACK0, IRQ4 and QSPI_DIN for DREQ0.
QSPI
QSPI_CS2
QSPI_CLK
QSPI_DOUT
QSPI_DIN
PQSPI3
PQSPI0
PQSPI1
PQSPI2
DACK0
I2C_SCL2
I2C_SDA2
DREQ02
U2RTS
—
O
O
O
I
126
127
128
129
A8
C7
A7
B7
132
133
134
135
D10
A9
—
B9
U2CTS
C9
Note: The QSPI_CS1 and QSPI_CS0 signals are available on the U1CTS, U1RTS, U0CTS, or U0RTS pins for the 196 and
160-pin packages.
UARTs
U1CTS
U1RTS
U1CTS
U1RTS
U1TXD
U1RXD
U0CTS
U0RTS
U0CTS
U0RTS
U0TXD
U0RXD
PUARTL7
PUARTL6
PUARTL7
PUARTL6
PUARTL5
PUARTL4
PUARTL3
PUARTL2
PUARTL3
PUARTL2
PUARTL1
PUARTL0
—
—
—
I
O
I
139
142
—
B4
A2
—
—
—
—
—
—
DT1IN
DT1OUT
—
QSPI_CS1
136
137
139
138
—
D9
C8
A8
QSPI_CS1
O
O
I
—
—
—
131
130
140
141
—
A6
D6
E4
D5
—
—
—
B8
—
—
I
—
—
—
QSPI_CS0
QSPI_CS0
—
O
I
—
—
DT0IN
DT0OUT
—
76
N12
P12
P13
N13
O
O
I
—
—
77
71
L10
M10
79
—
—
70
78
Note: The UART2 signals are multiplexed on the DMA Timers, QSPI, FEC, and I2C pins.
DMA Timers
DT3IN
DT2IN
DT1IN
DT0IN
PTIMER3
PTIMER2
PTIMER1
PTIMER0
DT3OUT
DT2OUT
DT1OUT
DT0OUT
U2CTS
U2RTS
U2RXD
U2TXD
I
I
I
I
135
136
137
138
B5
C5
A4
A3
143
144
145
146
B7
A7
A6
B6
BDM/JTAG5
JTAG_EN6
DSCLK
—
—
—
—
I
I
83
76
J11
91
84
J13
L12
TRST2
—
K11
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
6
Freescale Semiconductor
Signal Descriptions
Table 3. MCF5207/8 Signal Information and Muxing (continued)
MCF5207
144
MCF5207
144
MCF5208
MCF5208
196
Signal Name
GPIO
Alternate 1
Alternate 2 Dir.1
160
LQFP
MAPBGA
QFP
MAPBGA
PSTCLK
BKPT
—
—
—
—
—
TCLK2
TMS2
TDI2
TDO
—
—
—
—
—
—
O
I
64
75
77
69
—
M7
L12
H9
70
83
85
75
—
P9
M14
K12
M12
DSI
I
DSO
O
O
M9
DDATA[3:0]
K9, L9, M11,
M8
P11, N11,
M11, P10
PST[3:0]
ALLPST
—
—
—
—
—
—
O
O
—
L11, L8,
K10, K8
—
N10, M10,
L10, L9
67
—
73
—
Test
TEST6
—
—
—
—
—
—
I
I
109
—
—
—
—
—
C12
M13
PLL_TEST
Power Supplies
EVDD
IVDD
—
—
—
—
—
1, 63, 66, 72, E5–E6, F5, 2, 9, 69, 72, E5–E7, F5,
81, 87, 125
G8–G9,
H7–H8
80, 89, 95, F6, G5, H10,
131
J9, J10,
K8–K10,
K13, M9
—
30, 68, 84, D4, D8, H4, 36, 74, 92,
J12, D4,
D11, H11,
L4, L11,
113, 143
H11, J9
121, 159
PLL_VDD
SD_VDD
—
—
—
—
—
—
86
H12
94
H13
3, 17, 33, 35, E7–E8, F8, 11, 39, 41, E8–E10, F9,
61, 89, 110, G5, H5–H6, 67, 97, 118, F10, G10,
123
J3
129
H5, J5, J6,
K5–K7, L2
VSS
—
—
—
2, 16, 36, 62, D10, F6–F7, 1, 10, 42, 68,
A1, A14,
F7–F8,
G6–G9,
H6–H9,
65, 73, 88,
111, 124
G6–G7
71, 81, 96,
117, 119,
130
J7–J8, L13,
M2, N9, P1,
P14
PLL_VSS
—
—
—
85
—
93
H12
NOTES:
1
2
3
Refers to pin’s primary function.
Pull-up enabled internally on this signal for this mode.
Primary functionality selected by asserting the DRAMSEL signal (SDR mode). Alternate functionality selected by negating
the DRAMSEL signal (DDR mode). The GPIO module is not responsible for assigning these pins.
GPIO functionality is determined by the edge port module. The GPIO module is only responsible for assigning the alternate
functions.
4
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Freescale Semiconductor
7
Preliminary
Mechanicals and Pinouts
5
If JTAG_EN is asserted, these pins default to Alternate 1 (JTAG) functionality. The GPIO module is not responsible for
assigning these pins.
Pull-down enabled internally on this signal for this mode.
6
4 Mechanicals and Pinouts
This section contains drawings showing the pinout and the packaging and mechanical characteristics of
the MCF5207 and MCF5208 devices.
NOTE
The mechanical drawings are the latest revisions at the time of publication
of this document. The most up-to-date mechanical drawings can be found at
the product summary page located at http://www.freescale.com/coldfire.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
8
Freescale Semiconductor
Preliminary
Mechanicals and Pinouts
4.1 Pinout—144 LQFP
Figure 1 shows a pinout of the MCF5207CAG166 device.
•
1
EVDD
EVSS
SD_VDD
TS
108
107
106
105
104
103
102
101
100
99
A17
2
A16
3
A15
4
A14
SD_WE
SD_CKE
SD_CS
D15
5
A13
6
A12
7
A11
8
A10
D14
9
A9
D13
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
A8
D12
98
A7
D11
D10
97
A6
96
A5
D9
D8
95
A4
94
A3
EVSS
93
A2
SD_VDD
BE/BWE1
SD_DQS1/3
BE/BWE3
92
A1
91
A0
90
TA
89
SD_VDD
VSS
D31
D30
88
87
EVDD
PLL_VDD
PLL_VSS
IVDD
JTAG_EN
RESET
EVDD
XTAL
DRAMSEL
EXTAL
TDI/DSI
TRST/DSCLK
TMS/BKPT
RSTOUT
VSS
D29
86
D28
85
D27
84
D26
83
D25
82
D24
81
SD_SDR_DQS
IVDD
80
79
SD_CLK
SD_CLK
SD_VDD
FB_CLK
SD_VDD
VSS
78
77
76
75
74
73
Figure 1. MCF5207CAG166 Pinout Top View (144 LQFP)
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
9
Mechanicals and Pinouts
4.2 Package Dimensions—144 LQFP
Figure 2 and Figure 3 show MCF5207CAB166 package dimensions.
Figure 2. MCF5207CAB166 Package Dimensions (Sheet 1 of 2)
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
10
Freescale Semiconductor
Mechanicals and Pinouts
View A
Section A-A
Rotated 90× CW
144 Places
View B
Figure 3. MCF5207CAB166 Package Dimensions (Sheet 2 of 2)
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
11
Mechanicals and Pinouts
4.3 Pinout—144 MAPBGA
The pinout of the MCF5207CVM166 device is shown below.
1
2
3
4
5
6
7
8
9
10
11
12
QSPI_
DOUT
A
B
C
D
E
F
SD_CS
U1RTS
DT0IN
DT1IN
IRQ7
U1TXD
QSPI_CS2 FB_CS2
A22
A20
A18
A
B
C
D
E
F
D14
D12
D10
D8
D15
D13
D11
D9
TS
U1CTS
RCON
IVDD
DT3IN
DT2IN
IRQ1
IRQ4
U1RXD
EVDD
VSS
QSPI_DIN FB_CS0
A23
A21
A19
A10
VSS
A12
A6
A16
A17
A15
A14
QSPI_
FB_CS1
CLK
SD_CKE
SD_WE
BE/BWE1
U0RTS
EVDD
FB_CS3
IVDD
A8
A13
A11
U0CTS
SD_VDD SD_VDD
A4
A9
A7
D31
D29
D25
D30
D28
D24
SD_DQS1 BE/BWE3
EVDD
VSS
VSS
EVDD
D2
SD_VDD
EVDD
EVDD
OE
A0
A5
A3
G
H
J
D26
D27
IVDD
SD_VDD
VSS
EVDD
TDI/DSI
IVDD
DDATA3
DDATA2
A2
TA
A1
G
H
J
SD_SDR_
DQS
DRAM
SEL
SD_VDD SD_VDD
IVDD
JTAG_EN
PLL_VDD
XTAL
EXTAL
SD_CLK SD_RAS SD_VDD
D18
BE/BWE0
D6
D4
R/W
D5
RESET
PST1
TRST/
DSCLK
K
L
SD_CLK
FB_CLK
D20
D22
D23
D21
D16
D0
PST0
PST2
K
L
TMS/
BKPT
BE/BWE2
D7
D1
U0TXD
PST3
TCLK/
PSTCLK
M
SD_A10 SD_CAS
D19
3
D17
4
SD_DQS0
5
D3
6
DDATA0 TDO/DSO
U0RXD
10
DDATA1 RSTOUT
M
1
2
7
8
9
11
12
Figure 4. MCF5207CVM166 Pinout Top View (144 MAPBGA)
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
12
Freescale Semiconductor
Mechanicals and Pinouts
4.4 Package Dimensions—144 MAPBGA
Figure 5 shows the MCF5207CAB166 package dimensions.
Figure 5. MCF5207CAB166 Package Dimensions (144 MAPBGA)
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
13
Mechanicals and Pinouts
4.5 Pinout—160 QFP
Figure 6 shows a pinout of the MCF5208CAB166 device.
•
1
VSS
EVDD
120
119
118
117
116
115
114
113
112
111
110
109
108
107
106
105
104
103
102
101
100
99
A18
2
VSS
FEC_TXD0
FEC_TXD1
FEC_TXD2
FEC_TXD3
FEC_COL
FEC_CRS
EVDD
3
SD_VDD
VSS
4
5
A17
6
A16
7
A15
8
A14
9
A13
VSS
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
A12
SD_VDD
A11
TS
A10
SD_WE
A9
SD_CKE
SD_CS
D15
A8
A7
A6
D14
A5
D13
A4
D12
A3
D11
A2
D10
A1
D9
A0
D8
98
TA
BE/BWE1
SD_DQS1/3
BE/BWE3
D31
97
SD_VDD
VSS
96
95
EVDD
PLL_VDD
PLL_VSS
IVDD
JTAG_EN
RESET
EVDD
XTAL
DRAMSEL
EXTAL
TDI/DSI
TRST/DSCLK
TMS/BKPT
RSTOUT
VSS
94
D30
93
D29
92
D28
91
D27
90
D26
89
D25
88
D24
87
SD_SDR_DQS
IVDD
86
85
SD_CLK
SD_CLK
SD_VDD
FB_CLK
84
83
82
81
Figure 6. MCF5208CAB166 Pinout Top View (160 QFP)
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
14
Freescale Semiconductor
Mechanicals and Pinouts
4.6 Package Dimensions—160 QFP
The package dimensions of the MCF5208CAB166 device are shown in the figures below.
Top View
Figure 7. MCF5208CAB166 Package Dimensions (Sheet 1 of 2)
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
15
Mechanicals and Pinouts
SECTION B-B
DETAIL A
Figure 8. MCF5208CAB166 Package Dimensions (Sheet 2 of 2)
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
16
Freescale Semiconductor
Mechanicals and Pinouts
4.7 Pinout—196 MAPBGA
Figure 6 shows a pinout of the MCF5208CVM166 device.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
FEC_
TXEN
FEC_
TXER
FEC_
RXDV
FEC_
RXD3
QSPI_
CLK
A
B
C
D
E
F
VSS
DT1IN
DT2IN
U1TXD
FB_CS2
A22
A20
A19
VSS
A
B
C
D
E
F
FEC_
TXD0
FEC_
TXD1
FEC_
TXCLK
FEC_
RXCLK
FEC_
RXD2
QSPI_
DOUT
DT0IN
DT3IN
IRQ7
IRQ4
EVDD
VSS
U1RXD
U1RTS
IRQ1
FB_CS1
A23
A21
TEST
A14
A10
A6
A18
A16
A13
A9
A17
A15
FEC_
TXD3
FEC_
TXD2
FEC_
RXER
FEC_
RXD1
FEC_
MDIO
QSPI_
DIN
RCON
FB_CS0 FB_CS3
FEC_
CRS
FEC_
COL
FEC_
RXD0
FEC_
MDC
QSPI_
IVDD
CS2
I2C_SDA
IVDD
I2C_SCL
SD_CS
D12
U1CTS
A12
SD_CKE SD_WE
TS
EVDD
EVDD
EVDD
EVDD
VSS
SD_VDD SD_VDD SD_VDD
A11
A7
A8
D13
D9
D14
D10
D15
D11
VSS
VSS
VSS
VSS
EVDD
R/W
OE
SD_VDD SD_VDD
A5
A4
G
H
J
EVDD
VSS
VSS
VSS
SD_VDD
EVDD
EVDD
EVDD
PST1
A3
A2
A1
A0
G
H
J
BE/
BWE3
SD_
DQS1
BE/
BWE1
PLL_
VSS
PLL_
VDD
D8
SD_VDD
VSS
VSS
IVDD
NC
TA
JTAG_
EN
D28
D24
D29
D25
D30
D26
D31
D27
IVDD
D21
D20
SD_VDD SD_VDD
VSS
EVDD
EVDD
PST0
EVDD
VSS
IVDD
RESET
XTAL
EXTAL
DRAM
SEL
TDI/
DSI
K
L
SD_VDD SD_VDD SD_VDD
SD_
EVDD
VSS
K
L
SD_DR_
DQS
TRST/
DSCLK
SD_CLK SD_VDD
D18
D17
D16
D5
D4
D3
IVDD
DQS0
BE/
BWE0
TDO/
DSO
PLL_
TEST
TMS/
BKPT
M
N
P
SD_CLK
VSS
D23
D22
PST2
DDATA1
DDATA2
M
N
P
FB_CLK SD_A10
D7
D1
PST3
U0CTS
U0RXD RSTOUT
BE/
BWE2
TCLK/
PSTCLK
VSS
1
SD_CAS SD_RAS
D19
4
D6
6
D2
7
D0
8
DDATA0 DDATA3
U0RTS
12
U0TXD
13
VSS
14
2
3
5
9
10
11
Figure 9. MCF5208CVM166 Pinout Top View (196 MAPBGA)
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
17
Preliminary Electrical Characteristics
4.8 Package Dimensions—196 MAPBGA
The package dimensions for the MCF5208CVM166 device is shown below.
Top View
Bottom View
Figure 10. MCF5208CVM166 Package Dimensions (196 MAPBGA)
5 Preliminary Electrical Characteristics
The following electrical specifications are preliminary and are from previous designs or design
simulations. These specifications may not be fully tested or guaranteed at this early stage of the product
life cycle, however for production silicon these specifications will be met. Finalized specifications will be
published after complete characterization and device qualifications have been completed.
5.1 Maximum Ratings
1, 2
Table 4. Absolute Maximum Ratings
Rating
Core Supply Voltage
Symbol
Value
Unit
IVDD
EVDD
– 0.5 to +2.0
– 0.3 to +4.0
– 0.3 to +4.0
– 0.3 to +2.0
V
V
V
V
CMOS Pad Supply Voltage
DDR/Memory Pad Supply Voltage
PLL Supply Voltage
SDVDD
PLLVDD
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
18
Freescale Semiconductor
Preliminary Electrical Characteristics
(continued)
1, 2
Table 4. Absolute Maximum Ratings
Digital Input Voltage 3
VIN
ID
– 0.3 to +3.6
25
V
Instantaneous Maximum Current
mA
Single pin limit (applies to all pins) 3, 4, 5
Operating Temperature Range (Packaged)
Storage Temperature Range
TA
(TL - TH)
– 40 to 85
°C
°C
Tstg
– 55 to 150
NOTES:
1
Functional operating conditions are given in Section 5.4, “DC Electrical Specifications.”
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is
not guaranteed. Continued operation at these levels may affect device reliability or cause
permanent damage to the device.
2
3
This device contains circuitry protecting against damage due to high static voltage or
electrical fields; however, it is advised that normal precautions be taken to avoid application of
any voltages higher than maximum-rated voltages to this high-impedance circuit. Reliability of
operation is enhanced if unused inputs are tied to an appropriate logic voltage level (e.g.,
either VSS or EVDD).
Input must be current limited to the value specified. To determine the value of the required
current-limiting resistor, calculate resistance values for positive and negative clamp voltages,
then use the larger of the two values.
4
5
All functional non-supply pins are internally clamped to VSS and EVDD
.
Power supply must maintain regulation within operating EVDD range during instantaneous
and operating maximum current conditions. If positive injection current (Vin > EVDD is greater
than IDD, the injection current may flow out of EVDD and could result in external power supply
going out of regulation. Insure external EVDD load will shunt current greater than maximum
injection current. This will be the greatest risk when the MCU is not consuming power (ex; no
clock). Power supply must maintain regulation within operating EVDD range during
instantaneous and operating maximum current conditions.
5.2 Thermal Characteristics
Table 5 lists thermal resistance values
Table 5. Thermal Characteristics
Characteristic
Symbol
196MBGA
160QFP
Unit
Junction to ambient, natural convection
Four layer board
(2s2p)
θJMA
321,2
401,2
°C/W
Junction to ambient (@200 ft/min)
Four layer board
(2s2p)
θJMA
291,2
361,2
°C/W
Junction to board
θJB
θJC
Ψjt
Tj
203
104
21,5
105
253
104
21,5
105
°C/W
°C/W
°C/W
oC
Junction to case
Junction to top of package
Maximum operating junction temperature
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
19
Preliminary Electrical Characteristics
N1 OTES:
θ
JMA and Ψjt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection.
Freescale recommends the use of θJmA and power dissipation specifications in the system design to prevent
device junction temperatures from exceeding the rated specification. System designers should be aware that
device junction temperatures can be significantly influenced by board layout and surrounding devices.
Conformance to the device junction temperature specification can be verified by physical measurement in the
customer’s system using the Ψjt parameter, the device power dissipation, and the method described in
EIA/JESD Standard 51-2.
2
3
Per JEDEC JESD51-6 with the board horizontal.
Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board
temperature is measured on the top surface of the board near the package.
4
5
Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL
SPEC-883 Method 1012.1).
Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization
parameter is written in conformance with Psi-JT.
The average chip-junction temperature (T ) in °C can be obtained from:
J
TJ = TA + (PD × ΘJMA
)
Eqn. 1
Where:
T
= Ambient Temperature, °C
= Package Thermal Resistance, Junction-to-Ambient, ×C/W
= P + P
A
Q
JMA
P
D
INT
I/O
P
= I × IV , Watts - Chip Internal Power
DD DD
INT
P
= Power Dissipation on Input and Output Pins — User Determined
I/O
For most applications P < P
and can be ignored. An approximate relationship between P and T (if
I/O
INT
D
J
P
is neglected) is:
I/O
K
--------------------------------
PD
=
Eqn. 2
(TJ + 273°C)
Solving equations 1 and 2 for K gives:
K = PD × (TA × 273°C) + QJMA × P2D
Eqn. 3
where K is a constant pertaining to the particular part. K can be determined from Equation 3 by measuring
P (at equilibrium) for a known T . Using this value of K, the values of P and T can be obtained by
D
A
D
J
solving Equation 1 and Equation 2 iteratively for any value of T .
A
5.3 ESD Protection
1, 2
Table 6. ESD Protection Characteristics
Characteristics
Symbol
Value
Units
ESD Target for Human Body Model
HBM
2000
V
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
20
Freescale Semiconductor
Preliminary Electrical Characteristics
N1 OTES:
All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for
Automotive Grade Integrated Circuits.
2
A device is defined as a failure if after exposure to ESD pulses the device no longer meets
the device specification requirements. Complete DC parametric and functional testing is
performed per applicable device specification at room temperature followed by hot
temperature, unless specified otherwise in the device specification.
5.4 DC Electrical Specifications
Table 7. DC Electrical Specifications
Characteristic
Symbol
Min
Max
Unit
Core Supply Voltage
PLL Supply Voltage
IVDD
PLLVDD
EVDD
1.4
1.4
1.6
1.6
V
V
V
V
V
V
V
V
V
CMOS Pad Supply Voltage
3.0
3.6
Mobile DDR/Bus Pad Supply Voltage
DDR/Bus Pad Supply Voltage
SDR/Bus Pad Supply Voltage
CMOS Input High Voltage
SDVDD
SDVDD
SDVDD
EVIH
1.65
2.25
3.0
1.95
2.75
3.6
2
EVDD + 0.05
0.8
CMOS Input Low Voltage
EVIL
-0.05
TBD
Mobile DDR/Bus Input High Voltage
SDVIH
SDVDD + 0.
05
Mobile DDR/Bus Input Low Voltage
DDR/Bus Input High Voltage
SDVIL
SDVIH
-0.05
2
TBD
V
V
SDVDD + 0.
05
DDR/Bus Input Low Voltage
SDVIL
Iin
-0.05
–1.0
0.8
1.0
V
Input Leakage Current
µA
Vin = IVDD or VSS, Input-only pins
CMOS Output High Voltage
IOH = –5.0 mA
EVOH
EVOL
EVDD - 0.4
—
0.4
V
V
CMOS Output Low Voltage
IOL = 5.0 mA
—
SDVDD - 0.4
—
DDR/Bus Output High Voltage
IOH = –5.0 mA
SDVOH
SDVOL
IAPU
—
V
DDR/Bus Output Low Voltage
IOL = 5.0 mA
0.4
V
Weak Internal Pull Up Device Current, tested at VIL Max.1
-10
- 130
µA
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
21
Preliminary Electrical Characteristics
Table 7. DC Electrical Specifications (continued)
Characteristic
Symbol
Min
Max
Unit
Input Capacitance 2
Cin
pF
All input-only pins
All input/output (three-state) pins
—
—
7
7
Core Operating Supply Current 3
Master Mode
IDD
—
170
TBD
1
mA
mA
mA
mA
LIMP mode
STOP mode
Low Power mode
TBD
NOTES:
1
Refer to the signals section for pins having weak internal pull-up devices.
This parameter is characterized before qualification rather than 100% tested.
Current measured at maximum system clock frequency, all modules active, and default drive strength with
matching load.
2
3
5.4.1 PLL Power Filtering
To further enhance noise isolation, an external filter is strongly recommended for PLL analog V pins.
DD
The filter shown in Figure 11 should be connected between the board V and the PLLV pins. The
DD
DD
resistor and capacitors should be placed as close to the dedicated PLLV pin as possible.
DD
10 Ω
Board VDD
PLL VDD Pin
10 µF
0.1 µF
GND
Figure 11. System PLL V Power Filter
DD
5.4.2 Supply Voltage Sequencing and Separation Cautions
Figure 12 shows situations in sequencing the I/O V (EV ), SDRAM V (SDV ), PLL V
DD
DD
DD
DD
DD
(PLLV ), and Core V (IV ).
DD
DD
DD
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
22
Freescale Semiconductor
Preliminary Electrical Characteristics
EVDD, SDVDD
3.3V
Supplies Stable
2.5V
SDVDD (2.5V/1.8V)
IVDD, PLLVDD
1.5V
1
2
0
Time
Notes:
1. IVDD should not exceed EVDD, SDVDD or PLLVDD by more than
0.4 V at any time, including power-up.
2. Recommended that IVDD/PLLVDD should track EVDD/SDVDD up to
0.9 V, then separate for completion of ramps.
3. Input voltage must not be greater than the supply voltage (EVDD, SDVDD
,
IVDD, or PLLVDD) by more than 0.5 V at any time, including during power-up.
4. Use 1 µs or slower rise time for all supplies.
Figure 12. Supply Voltage Sequencing and Separation Cautions
The relationship between SDV and EV is non-critical during power-up and power-down sequences.
DD
DD
Both SDV (2.5V or 3.3V) and EV are specified relative to IV .
DD
DD
DD
5.4.2.1 Power Up Sequence
If EV /SDV are powered up with IV at 0 V, then the sense circuits in the I/O pads will cause all
DD
DD
DD
pad output drivers connected to the EV /SDV to be in a high impedance state. There is no limit on
DD
DD
how long after EV /SDV powers up before IV must powered up. IV should not lead the EV ,
DD
DD
DD
DD
DD
SDV or PLLV by more than 0.4 V during power ramp-up, or there will be high current in the internal
DD
DD
ESD protection diodes. The rise times on the power supplies should be slower than 1 µs to avoid turning
on the internal ESD protection clamp diodes.
The recommended power up sequence is as follows:
1. Use 1 µs or slower rise time for all supplies.
2. IV /PLLV and EV /SDV should track up to 0.9 V, then separate for the completion of
DD
DD
DD
DD
ramps with EV /SD V going to the higher external voltages. One way to accomplish this is to
DD
DD
use a low drop-out voltage regulator.
5.4.2.2 Power Down Sequence
If IV /PLLV are powered down first, then sense circuits in the I/O pads will cause all output drivers
DD
DD
to be in a high impedance state. There is no limit on how long after IV and PLLV power down before
DD
DD
EV or SDV must power down. IV should not lag EV , SDV , or PLLV going low by more
DD
DD
DD
DD
DD
DD
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
23
Preliminary Electrical Characteristics
than 0.4 V during power down or there will be undesired high current in the ESD protection diodes. There
are no requirements for the fall times of the power supplies.
The recommended power down sequence is as follows:
1. Drop IV /PLLV to 0 V.
DD
DD
2. Drop EV /SDV supplies.
DD
DD
5.5 Oscillator and PLL Electrical Characteristics
Table 8. PLL Electrical Characteristics
Min.
Value
Max.
Value
Num
Characteristic
Symbol
Unit
1
PLL Reference Frequency Range
Crystal reference
fref_crystal
fref_ext
TBD
TBD
16
16
MHz
MHz
External reference
2
Core frequency
fsys
fsys/2
TBD
TBD
166.67
83.33
MHz
MHZ
CLKOUT Frequency 1
t
3
4
Crystal Start-up Time 2, 3
—
10
ms
cst
EXTAL Input High Voltage
Crystal Mode4
All other modes (External, Limp)
VIHEXT
VIHEXT
TBD
TBD
TBD
TBD
V
V
5
EXTAL Input Low Voltage
Crystal Mode4
VILEXT
VILEXT
TBD
TBD
TBD
TBD
V
V
All other modes (External, Limp)
6
XTAL Load Capacitance2
PLL Lock Time 2,5
5
30
1
pF
ms
%
11
tlpll
tdc
—
40
14
Duty Cycle of reference2
60
N1 OTES:
All internal registers retain data at 0 Hz.
This parameter is guaranteed by characterization before qualification rather than 100% tested.
Proper PC board layout procedures must be followed to achieve specifications.
2
3
4
This parameter is guaranteed by design rather than 100% tested.
5.6 External Interface Timing Characteristics
Table 9 lists processor bus input timings.
NOTE
All processor bus timings are synchronous; that is, input setup/hold and
output delay with respect to the rising edge of a reference clock. The
reference clock is the FB_CLK output.
All other timing relationships can be derived from these values.Timings
listed in Table 9 are shown in Figure 14 & Figure 15.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
24
Freescale Semiconductor
Preliminary
Preliminary Electrical Characteristics
* The timings are also valid for inputs sampled on the negative clock edge.
1.5V
FB_CLK(75MHz)
TSETUP
THOLD
Invalid
1.5V Valid 1.5V
Invalid
Input Setup And Hold
Input Rise Time
trise
Vh = VIH
V = V
l
IL
tfall
Vh = VIH
Vl = VIL
Input Fall Time
FB4
FB_CLK
Inputs
FB5
Figure 13. General Input Timing Requirements
5.6.1 FlexBus
A multi-function external bus interface called FlexBus is provided to interface to slave-only devices up to
a maximum bus frequency of 83.33 MHz. It can be directly connected to asynchronous or synchronous
devices such as external boot ROMs, Flash memories, gate-array logic, or other simple target (slave)
devices with little or no additional circuitry. For asynchronous devices a simple chip-select based interface
can be used. The FlexBus interface has six general purpose chip-selects (FB_CS[5:0]) which can be
configured to be distributed between the FlexBus or SDRAM memory interfaces. Chip-select FB_CS[0]
can be dedicated to boot ROM access and can be programmed to be byte (8 bits), word (16 bits), or
longword (32 bits) wide. Control signal timing is compatible with common ROM/Flash memories.
5.6.1.1 FlexBus AC Timing Characteristics
The following timing numbers indicate when data will be latched or driven onto the external bus, relative
to the system clock.
Table 9. FlexBus AC Timing Specifications
Num
Characteristic
Frequency of Operation
Clock Period (FB_CLK)
Symbol
Min
Max
Unit
Notes
83.33
12
Mhz
ns
fsys/2
tcyc
FB1
tFBCK
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
25
Preliminary Electrical Characteristics
Table 9. FlexBus AC Timing Specifications
Num
Characteristic
Symbol
Min
Max
Unit
Notes
1
FB2
Data, and Control Output Valid (A[23:0], D[31:0],
FB_CS[5:0], R/W, TS, BE/BWE[3:0] and OE)
tFBCHDCV
—
7.0
ns
1, 2
FB3
Data, and Control Output Hold ((A[23:0], D[31:0],
FB_CS[5:0], R/W, TS, BE/BWE[3:0], and OE)
tFBCHDCI
1
—
ns
FB4
FB5
FB6
FB7
FB8
FB9
Data Input Setup
tDVFBCH
tDIFBCH
tCVFBCH
tCIFBCH
tFBCHAV
tFBCHAI
3.5
0
—
—
—
—
6.0
—
ns
ns
ns
ns
ns
ns
Data Input Hold
Transfer Acknowledge (TA) Input Setup
Transfer Acknowledge (TA) Input Hold
Address Output Valid (A[23:0])
Address Output Hold (A[23:0])
4
0
3
—
1.0
NOTES:
1
Timing for chip selects only applies to the FB_CS[5:0] signals. Please see Section 5.7, "SDRAM BUS” for SD_CS[1:0]
timing.
2
3
The FlexBus supports programming an extension of the address hold. Please consult the device reference manual for
more information.
These specs are used when the A[23:0] signals are configured as 23-bit, non-muxed FlexBus address signals.
FB_CLK
FB1
FB9
A[23:0]
D[31:0]
R/W
A[23:0]
FB8
FB5
DATA
FB2
FB4
TS
FB_CSn, BE/BWEn
FB7
OE
TA
FB6
Figure 14. FlexBus Read Timing
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
26
Freescale Semiconductor
Preliminary Electrical Characteristics
FB_CLK
FB1
FB9
FB3
A[23:0]
FB8
D[31:0]
FB2
R/W
TS
FB_CSn, BE/BWEn
FB7
OE
TA
FB6
Figure 15. Flexbus Write Timing
5.7 SDRAM Bus
The SDRAM controller supports accesses to main SDRAM memory from any internal master. It supports
either standard SDRAM or double data rate (DDR) SDRAM, but it does not support both at the same time.
The SDRAM controller uses SSTL2 and SSTL3 I/O drivers. Both SSTL drive modes are programmable
for either Class I or Class II drive strength.
5.7.1 SDR SDRAM AC Timing Characteristics
The following timing numbers indicate when data will be latched or driven onto the external bus, relative
to the memory bus clock, when operating in SDR mode on write cycles and relative to SD_DQS on read
cycles. The SDRAM controller is a DDR controller that has an SDR mode. Because it is designed to
support DDR, a DQS pulse must still be supplied to the device for each data beat of an SDR read. The
ColdFire processor accomplishes this by asserting a signal called SD_DQS during read cycles. Care must
be taken during board design to adhere to the following guidelines and specs with regard to the SDR_DQS
signal and its usage.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Freescale Semiconductor
27
Preliminary
Preliminary Electrical Characteristics
Table 10. SDR Timing Specifications
Symbol
Characteristic
Symbol
Min
Max
Unit
Notes
1
Frequency of Operation
Clock Period (tCK
Clock Skew (tSK
Pulse Width High (tCKH
Pulse Width Low (tCKL
Address, SD_CKE, SD_CAS, SD_RAS, SD_WE,
—
7.52
—
83.33
12
MHz
ns
2
SD1
SD2
SD3
SD4
SD5
)
tSDCK
tSDSK
)
TBD
0.55
0.55
3
3
)
tSDCKH
tSDCKL
tSDCHACV
0.45
0.45
—
SD_CLK
SD_CLK
ns
)
0.5 × SD_CLK
SD_BA, SD_CS[1:0] - Output Valid (tCMV
)
+ 1.0
SD6
Address, SD_CKE, SD_CAS, SD_RAS, SD_WE,
tSDCHACI
2.0
—
ns
SD_BA, SD_CS[1:0] - Output Hold (tCMH
SD_SDR_DQS Output Valid (tDQSOV
)
4
5
6
7
SD7
SD8
)
tDQSOV
—
Self timed
ns
ns
SD_DQS[3:0] input setup relative to SD_CLK (tDQSIS) tDQVSDCH 0.25 × SD_CLK 0.40 × SD_CLK
SD9
SD_DQS[3:2] input hold relative to SD_CLK (tDQSIH
)
tDQISDCH Does not apply. 0.5 SD_CLK fixed width.
SD10
Data (D[31:0]) Input Setup relative to SD_CLK
tDVSDCH 0.25 × SD_CLK
—
ns
ns
ns
ns
(reference only) (tDIS
)
SD11
SD12
Data Input Hold relative to SD_CLK (reference only)
tDISDCH
1.0
—
—
(tDIH
)
Data (D[31:0]) and Data Mask(SD_DQM[3:0])
tSDCHDMV
0.75 × SD_CLK
Output Valid (tDV
)
+ 0.5
SD13
Data (D[31:0]) and Data Mask (SD_DQM[3:0]) Output tSDCHDMI
1.5
—
Hold (tDH
)
N1 OTES:
The device supports the same frequency of operation for both FlexBus and SDRAM as that of the internal bus clock. Please see
the PLL chapter of the MCF5208 Reference Manual for more information on setting the SDRAM clock rate.
2
3
4
SD_CLK is one SDRAM clock in (ns).
Pulse width high plus pulse width low cannot exceed min and max clock period.
SD_DQS is designed to pulse 0.25 clock before the rising edge of the memory clock. This is a guideline only. Subtle variation from
this guideline is expected. SD_DQS will only pulse during a read cycle and one pulse will occur for each data beat.
5
6
7
SDR_DQS is designed to pulse 0.25 clock before the rising edge of the memory clock. This spec is a guideline only. Subtle
variation from this guideline is expected. SDR_DQS will only pulse during a read cycle and one pulse will occur for each data beat.
The SDR_DQS pulse is designed to be 0.5 clock in width. The timing of the rising edge is most important. The falling edge does
not affect the memory controller.
Since a read cycle in SDR mode still uses the DQS circuit within the device, it is most critical that the data valid window be centered
1/4 clk after the rising edge of DQS. Ensuring that this happens will result in successful SDR reads. The input setup spec is just
provided as guidance.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
28
Freescale Semiconductor
Preliminary
Preliminary Electrical Characteristics
SD1
SD3
SD2
SD_CLK0
SD_CLK1
SD2
SD4
SD6
SD_CSn,
SD_RAS,
SD_CAS
SD_WE,
CMD
SD5
A[23:0],
SD_BA[1:0]
ROW
COL
SD12
SDDM
D[31:0]
SD13
WD1
WD2
WD3
WD4
Figure 16. SDR Write Timing
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
29
Preliminary Electrical Characteristics
SD1
SD2
SD_CLK0
SD_CLK1
SD2
SD6
SD_CSn,
SD_RAS,
SD_CAS,
SD_WE
CMD
3/4 MCLK
Reference
SD5
A[23:0],
SD_BA[1:0]
ROW
COL
tDQS
SDDM
SD7
SD_DQS (Measured at Output Pin)
SD_DDQS (Measured at Input Pin)
Board Delay
Board Delay
SD9
SD8
Delayed
SD_CLK
SD10
D[31:0]
form
Memories
WD1
WD2
WD3
WD4
NOTE: Data driven from memories relative
to delayed memory clock.
SD11
Figure 17. SDR Read Timing
5.7.2 DDR SDRAM AC Timing Characteristics
When using the SDRAM controller in DDR mode, the following timing numbers must be followed to
properly latch or drive data onto the memory bus. All timing numbers are relative to the four DQS byte
lanes. The following timing numbers are subject to change at anytime, and are only provided to aid in early
board design. Please contact your local Freescale representative if questions develop.
Table 11. DDR Timing Specifications
Num
Characteristic
Frequency of Operation
Symbol
Min
Max
Unit
Notes
1
83.33
TBD
0.45
0.45
—
TBD
12
Mhz
ns
2
3
3
4
DD1
DD2
DD3
DD4
Clock Period (SD_CLK)
Pulse Width High
tDDCK
tDDCKH
tDDCKL
0.55
0.55
SD_CLK
SD_CLK
ns
Pulse Width Low
Address, SD_CKE, SD_CAS, SD_RAS, SD_WE,
SD_CS[1:0] - Output Valid
tSDCHACV
0.5 × SD_CLK
+ 1.0
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
30
Freescale Semiconductor
Preliminary Electrical Characteristics
Table 11. DDR Timing Specifications (continued)
Num
Characteristic
Symbol
Min
Max
Unit
Notes
DD5
Address, SD_CKE, SD_CAS, SD_RAS, SD_WE,
SD_CS[1:0] - Output Hold
tSDCHACI
2.0
—
ns
DD6
DD7
Write Command to first DQS Latching Transition
tCMDVDQ
tDQDMV
1.25
—
SD_CLK
ns
5
6
Data and Data Mask Output Setup (DQ-->DQS)
Relative to DQS (DDR Write Mode)
1.5
1.0
—
7
DD8
Data and Data Mask Output Hold (DQS-->DQ)
Relative to DQS (DDR Write Mode)
tDQDMI
—
ns
8
9
DD9
Input Data Skew Relative to DQS (Input Setup)
tDVDQ
tDIDQ
1
ns
ns
DD10 Input Data Hold Relative to DQS.
0.25 × SD_CLK
—
+ 0.5ns
DD11 DQS falling edge from SDCLK rising (output hold time) tDQLSDCH
0.5
0.9
—
1.1
0.6
—
ns
DD12 DQS input read preamble width (tRPRE
DD13 DQS input read postamble width (tRPST
DD14 DQS output write preamble width (tWPRE
DD15 DQS output write postamble width (tWPST
)
tDQRPRE
tDQRPST
tDQWPRE
tDQWPST
SD_CLK
SD_CLK
SD_CLK
SD_CLK
)
0.4
)
0.25
0.4
)
0.6
NOTES:
1
The frequency of operation is either 2x or 4x the FB_CLK frequency of operation. FlexBus and SDRAM clock operate at the same
frequency as the internal bus clock.
SD_CLK is one SDRAM clock in (ns).
Pulse width high plus pulse width low cannot exceed min and max clock period.
Command output valid should be 1/2 the memory bus clock (SD_CLK) plus some minor adjustments for process, temperature, and
voltage variations.
2
3
4
5
This specification relates to the required input setup time of today’s DDR memories. The device’s output setup should be larger
than the input setup of the DDR memories. If it is not larger, then the input setup on the memory will be in violation.
MEM_DATA[31:24] is relative to MEM_DQS[3], MEM_DATA[23:16] is relative to MEM_DQS[2], MEM_DATA[15:8] is relative to
MEM_DQS[1], and MEM_[7:0] is relative MEM_DQS[0].
The first data beat will be valid before the first rising edge of DQS and after the DQS write preamble. The remaining data beats will
be valid for each subsequent DQS edge.
This specification relates to the required hold time of today’s DDR memories. MEM_DATA[31:24] is relative to MEM_DQS[3],
MEM_DATA[23:16] is relative to MEM_DQS[2], MEM_DATA[15:8] is relative to MEM_DQS[1], and MEM_[7:0] is relative
MEM_DQS[0].
6
7
8
9
Data input skew is derived from each DQS clock edge. It begins with a DQS transition and ends when the last data line becomes
valid. This input skew must include DDR memory output skew and system level board skew (due to routing or other factors).
Data input hold is derived from each DQS clock edge. It begins with a DQS transition and ends when the first data line becomes
invalid.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Freescale Semiconductor
31
Preliminary
Preliminary Electrical Characteristics
DD1
DD2
SD_CLK
DD3
SD_CLK
DD5
SD_CSn, SD_WE,
SD_RAS, SD_CAS
CMD
DD4
DD6
A[13:0]
ROW
COL
DD7
DM3/DM2
SD_DQS3/SD_DQS2
D[31:24]/D[23:16]
DD8
DD7
WD1 WD2 WD3 WD4
DD8
Figure 18. DDR Write Timing
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
32
Freescale Semiconductor
Preliminary Electrical Characteristics
DD1
DD2
SD_CLK
DD3
SD_CLK
DD5
CL=2
SD_CSn, SD_WE,
SD_RAS, SD_CAS
CMD
ROW
DD4
CL=2.5
A[13:0]
COL
DD9
DQS Read
Postamble
DQS Read
Preamble
SD_DQS3/SD_DQS2
D[31:24]/D[23:16]
DD10
WD1 WD2 WD3 WD4
DQS Read
Preamble
DQS Read
Postamble
SD_DQS3/SD_DQS2
D[31:24]/D[23:16]
WD1 WD2 WD3 WD4
Figure 19. DDR Read Timing
Figure 20 shows the DDR clock crossover specifications.
SD_CLK
VIX
VID
VMP
VIX
SD_CLK
Figure 20. DDR Clock Crossover Timing
5.8 General Purpose I/O Timing
1
Table 12. GPIO Timing
Num
Characteristic
FB_CLK High to GPIO Output Valid
Symbol
Min
Max
Unit
G1
G2
G3
G4
tCHPOV
tCHPOI
tPVCH
tCHPI
—
1.5
8
8
ns
ns
ns
ns
FB_CLK High to GPIO Output Invalid
GPIO Input Valid to FB_CLK High
FB_CLK High to GPIO Input Invalid
—
—
—
1.5
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
33
Preliminary Electrical Characteristics
N1 OTES:
GPIO spec cover: IRQn, UART and Timer pins.
FB_CLK
G2
G1
GPIO Outputs
G3
G4
GPIO Inputs
Figure 21. GPIO Timing
5.9 Reset and Configuration Override Timing
Table 13. Reset and Configuration Override Timing
Num
Characteristic
Symbol
Min
Max
Unit
R1
R2
R3
R4
R5
R6
R7
RESET Input valid to FB_CLK High
tRVCH
tCHRI
9
1.5
5
—
—
—
10
—
—
—
1
ns
ns
FB_CLK High to RESET Input invalid
RESET Input valid Time 1
tRIVT
tCYC
ns
FB_CLK High to RSTOUT Valid
tCHROV
tROVCV
tCOS
—
0
RSTOUT valid to Config. Overrides valid
Configuration Override Setup Time to RSTOUT invalid
Configuration Override Hold Time after RSTOUT invalid
RSTOUT invalid to Configuration Override High Impedance
ns
20
0
tCYC
ns
tCOH
R8
tROICZ
—
tCYC
N1 OTES:
During low power STOP, the synchronizers for the RESET input are bypassed and RESET is asserted asynchronously to
the system. Thus, RESET must be held a minimum of 100 ns.
FB_CLK
R1
R2
R3
RESET
R4
R4
RSTOUT
R8
R5
R6
R7
Configuration Overrides*:
(RCON, Override pins)
Figure 22. RESET and Configuration Override Timing
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
34
Freescale Semiconductor
Preliminary Electrical Characteristics
NOTE
Refer to the MCF5208 Reference Manual for more information.
5.10 I2C Input/Output Timing Specifications
2
Table 14 and Table 15 list specifications for the I C input and output timing parameters.
2
Table 14. I C Input Timing Specifications between I2C_SCL and I2C_SDA
Num
Characteristic
Start condition hold time
Min
Max
Units
I1
I2
I3
I4
I5
I6
I7
I8
I9
2
8
—
—
1
tcyc
tcyc
ms
ns
Clock low period
I2C_SCL/I2C_SDA rise time (VIL = 0.5 V to VIH = 2.4 V)
Data hold time
—
0
—
1
I2C_SCL/I2C_SDA fall time (VIH = 2.4 V to VIL = 0.5 V)
Clock high time
—
4
ms
tcyc
ns
—
—
—
—
Data setup time
0
Start condition setup time (for repeated start condition only)
Stop condition setup time
2
tcyc
tcyc
2
2
Table 15. I C Output Timing Specifications between I2C_SCL and I2C_SDA
Num
Characteristic
Start condition hold time
Min
Max
Units
I11
6
—
—
—
—
3
tcyc
tcyc
µs
1.
I2
Clock low period
10
—
7
I3 2
I2C_SCL/I2C_SDA rise time (VIL = 0.5 V to VIH = 2.4 V)
Data hold time
1.
I4
tcyc
ns
I5 3
I2C_SCL/I2C_SDA fall time (VIH = 2.4 V to VIL = 0.5 V)
Clock high time
—
10
2
1.
I6
—
—
—
—
tcyc
tcyc
tcyc
tcyc
1.
I7
Data setup time
1.
I8
Start condition setup time (for repeated start condition only)
Stop condition setup time
20
10
1.
I9
N1 OTES:
Note: Output numbers depend on the value programmed into the IFDR; an IFDR programmed with the
maximum frequency (IFDR = 0x20) results in minimum output timings as shown in Table A-16. The I2C
interface is designed to scale the actual data transition time to move it to the middle of the I2C_SCL low
period. The actual position is affected by the prescale and division values programmed into the IFDR;
however, the numbers given in Table A-16 are minimum values.
Because I2C_SCL and I2C_SDA are open-collector-type outputs, which the processor can only actively
drive low, the time I2C_SCL or I2C_SDA take to reach a high level depends on external signal
capacitance and pull-up resistor values.
2
3
Specified at a nominal 50-pF load.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Freescale Semiconductor
35
Preliminary
Preliminary Electrical Characteristics
I2
I6
I5
I2C_SCL
I1
I3
I4
I8
I9
I7
I2C_SDA
2
Figure 23. I C Input/Output Timings
5.11 Fast Ethernet AC Timing Specifications
MII signals use TTL signal levels compatible with devices operating at either 5.0 V or 3.3 V.
5.11.1 MII Receive Signal Timing (FEC_RXD[3:0], FEC_RXDV,
FEC_RXER, and FEC_RXCLK)
The receiver functions correctly up to a FEC_RXCLK maximum frequency of 25 MHz +1%. There is no
minimum frequency requirement. In addition, the processor clock frequency must exceed twice the
FEC_RXCLK frequency.
Table 16 lists MII receive channel timings.
Table 16. MII Receive Signal Timing
Num
Characteristic
Min
Max
Unit
M1
FEC_RXD[3:0], FEC_RXDV, FEC_RXER to FEC_RXCLK
setup
5
—
ns
M2
M3
M4
FEC_RXCLK to FEC_RXD[3:0], FEC_RXDV, FEC_RXER hold
FEC_RXCLK pulse width high
5
—
ns
35%
35%
65% FEC_RXCLK period
65% FEC_RXCLK period
FEC_RXCLK pulse width low
Figure 24 shows MII receive signal timings listed in Table 16.
M3
FEC_RXCLK (input)
M4
FEC_RXD[3:0] (inputs)
FEC_RXDV
FEC_RXER
M1
M2
Figure 24. MII Receive Signal Timing Diagram
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
36
Freescale Semiconductor
Preliminary Electrical Characteristics
5.11.2 MII Transmit Signal Timing (FEC_TXD[3:0], FEC_TXEN,
FEC_TXER, FEC_TXCLK)
Table 17 lists MII transmit channel timings.
The transmitter functions correctly up to a FEC_TXCLK maximum frequency of 25 MHz +1%. There is
no minimum frequency requirement. In addition, the processor clock frequency must exceed twice the
FEC_TXCLK frequency.
The transmit outputs (FEC_TXD[3:0], FEC_TXEN, FEC_TXER) can be programmed to transition from
either the rising or falling edge of FEC_TXCLK, and the timing is the same in either case. This options
allows the use of non-compliant MII PHYs.
Refer to the Ethernet chapter for details of this option and how to enable it.
Table 17. MII Transmit Signal Timing
Num
Characteristic
Min
Max
Unit
M5
FEC_TXCLK to FEC_TXD[3:0], FEC_TXEN, FEC_TXER
invalid
5
—
ns
M6
M7
M8
FEC_TXCLK to FEC_TXD[3:0], FEC_TXEN, FEC_TXER valid
FEC_TXCLK pulse width high
—
25
ns
35%
35%
65%
65%
FEC_TXCLK period
FEC_TXCLK period
FEC_TXCLK pulse width low
Figure 25 shows MII transmit signal timings listed in Table 17.
M7
FEC_TXCLK (input)
M5
M8
FEC_TXD[3:0] (outputs)
FEC_TXEN
FEC_TXER
M6
Figure 25. MII Transmit Signal Timing Diagram
5.11.3 MII Async Inputs Signal Timing (FEC_CRS and FEC_COL)
Table 18 lists MII asynchronous inputs signal timing.
Table 18. MII Async Inputs Signal Timing
Num
Characteristic
Min
Max
Unit
M9
FEC_CRS, FEC_COL minimum pulse width
1.5
—
FEC_TXCLK period
Figure 26 shows MII asynchronous input timings listed in Table 18.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
37
Preliminary Electrical Characteristics
FEC_CRS
FEC_COL
M9
Figure 26. MII Async Inputs Timing Diagram
5.11.4 MII Serial Management Channel Timing (FEC_MDIO and
FEC_MDC)
Table 19 lists MII serial management channel timings. The FEC functions correctly with a maximum
MDC frequency of 2.5 MHz.
Table 19. MII Serial Management Channel Timing
Num
Characteristic
Min Max
Unit
M10 FEC_MDC falling edge to FEC_MDIO output invalid (minimum
propagation delay)
0
—
ns
M11 FEC_MDC falling edge to FEC_MDIO output valid (max prop delay)
M12 FEC_MDIO (input) to FEC_MDC rising edge setup
M13 FEC_MDIO (input) to FEC_MDC rising edge hold
M14 FEC_MDC pulse width high
—
10
0
25
—
—
ns
ns
ns
40% 60% FEC_MDC period
40% 60% FEC_MDC period
M15 FEC_MDC pulse width low
Figure 27 shows MII serial management channel timings listed in Table 19.
M14
M15
FEC_MDC (output)
FEC_MDIO (output)
M10
M11
FEC_MDIO (input)
M12
M13
Figure 27. MII Serial Management Channel Timing Diagram
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
38
Freescale Semiconductor
Preliminary Electrical Characteristics
5.12 32-Bit Timer Module AC Timing Specifications
Table 20 lists timer module AC timings.
Table 20. Timer Module AC Timing Specifications
Name
Characteristic
Unit
Min
Max
T1
T2
DT0IN / DT1IN / DT2IN / DT3IN cycle time
DT0IN / DT1IN / DT2IN / DT3IN pulse width
3
1
—
—
tCYC
tCYC
5.13 QSPI Electrical Specifications
Table 21 lists QSPI timings.
Table 21. QSPI Modules AC Timing Specifications
Name
Characteristic
Min
Max
Unit
QS1
QS2
QS3
QS4
QS5
QSPI_CS[3:0] to QSPI_CLK
1
—
1.5
9
510
10
—
tcyc
ns
QSPI_CLK high to QSPI_DOUT valid.
QSPI_CLK high to QSPI_DOUT invalid. (Output hold)
QSPI_DIN to QSPI_CLK (Input setup)
QSPI_DIN to QSPI_CLK (Input hold)
ns
—
ns
9
—
ns
The values in Table 21 correspond to Figure 28.
QS1
QSPI_CS[3:0]
QSPI_CLK
QS2
QSPI_DOUT
QS3
QS4
QS5
QSPI_DIN
Figure 28. QSPI Timing
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
39
Preliminary Electrical Characteristics
5.14 JTAG and Boundary Scan Timing
Table 22. JTAG and Boundary Scan Timing
Num
Characteristics1
TCLK Frequency of Operation
Symbol
Min
Max
Unit
J1
J2
J3
J4
J5
J6
J7
J8
J9
fJCYC
tJCYC
DC
4
1/4
—
—
3
fsys/2
tCYC
ns
TCLK Cycle Period
TCLK Clock Pulse Width
tJCW
26
0
TCLK Rise and Fall Times
tJCRF
ns
Boundary Scan Input Data Setup Time to TCLK Rise
Boundary Scan Input Data Hold Time after TCLK Rise
TCLK Low to Boundary Scan Output Data Valid
TCLK Low to Boundary Scan Output High Z
TMS, TDI Input Data Setup Time to TCLK Rise
tBSDST
tBSDHT
tBSDV
4
—
—
33
33
—
—
26
8
ns
26
0
ns
ns
tBSDZ
0
ns
tTAPBST
tTAPBHT
tTDODV
tTDODZ
tTRSTAT
tTRSTST
4
ns
J10 TMS, TDI Input Data Hold Time after TCLK Rise
J11 TCLK Low to TDO Data Valid
10
0
ns
ns
J12 TCLK Low to TDO High Z
0
ns
J13 TRST Assert Time
100
10
—
—
ns
J14 TRST Setup Time (Negation) to TCLK High
ns
N1 OTES:
JTAG_EN is expected to be a static signal. Hence, specific timing is not associated with it.
J2
J3
J3
V
IH
TCLK
(input)
V
IL
J4
J4
Figure 29. Test Clock Input Timing
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
40
Freescale Semiconductor
Preliminary Electrical Characteristics
TCLK
V
V
IL
IH
J5
Input Data Valid
J6
Data Inputs
J7
J8
Data Outputs
Output Data Valid
Data Outputs
Data Outputs
J7
Output Data Valid
Figure 30. Boundary Scan (JTAG) Timing
TCLK
V
V
IL
IH
J9
Input Data Valid
J10
TDI
TMS
J11
TDO
Output Data Valid
J12
J11
TDO
TDO
Output Data Valid
Figure 31. Test Access Port Timing
TCLK
TRST
J14
J13
Figure 32. TRST Timing
5.15 Debug AC Timing Specifications
Table 23 lists specifications for the debug AC timing parameters shown in Figure 33 & Figure 34.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Freescale Semiconductor
41
Preliminary
Preliminary Electrical Characteristics
Table 23. Debug AC Timing Specification
Num
Characteristic
Units
Min
Max
DE0
DE1
DE2
DE3
DE4
DE5 1
DE6
PSTCLK cycle time
—
2
1
5
1
4
4
0
0.5
—
—
—
—
—
—
—
tcyc
ns
PST valid to PSTCLK high
PSTCLK high to PST invalid
DSCLK cycle time
ns
tcyc
tcyc
tcyc
ns
DSI valid to DSCLK high
DSCLK high to DSO invalid
BKPT input data setup time to FB_CLK high
FB_CLK high to BKPT invalid
DE7
ns
N1 OTES:
DSCLK and DSI are synchronized internally. DE4 is measured from the synchronized DSCLK input
relative to the rising edge of FB_CLK.
Figure 33 shows real-time trace timing for the values in Table 23.
PSTCLK
DE0
DE1
DE2
PST[3:0]
DDATA[3:0]
Figure 33. Real-Time Trace AC Timing
Figure 34 shows BDM serial port AC timing and BKPT pin timing for the values in Table 23.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
42
Freescale Semiconductor
Preliminary
Revision History
FB_CLK
BKPT
DE6
DE7
DE5
DSCLK
DE3
DSI
Current
Past
Next
DE4
DSO
Current
Figure 34. BDM Serial Port AC Timing
6 Revision History
Table 24. Revision History
Revision
Number
Date
Substantive Changes
0
5/23/2005
6/16/2005
• Initial Release
0.1
• Corrected 144QFP pinout in Figure 1. Pins 139-142 incorrectly showed
FEC functionality, which are actually UART 0/1 clear-to-send and
request-to-send signals.
• Changed maximum core frequency in Table 8, spec #2, from 240MHz to
166.67MHz. Also, changed symbols in table: fcore -> fsys and fsys -> fsys/2
for consistency throughout document and reference manual.
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
43
Revision History
Table 24. Revision History (continued)
Substantive Changes
Revision
Number
Date
0.2
8/26/2005
• Changed ball M9 from SD_VDD to EVDD in Figure 9.
• Table 3: Pin 33 for 144 LQFP package should be EVDD instead of
SD_VDD. BE/BWE[3:0] for 144 LQFP should be “20, 48, 18, 50“ instead
of “18, 20, 48, 50”
Cleaned up various electrical specifications:
• Table 4: Added DDR/Memory pad supply voltage spec, changed “clock
synthesizer supply voltage” to “PLL supply voltage”, changed min PLLVDD
from -0.5 to -0.3, changed max VIN from 4.0 to 3.6, changed minimum Tstg
from -65 to -55,
• Table 5: Changed TBD values in Tj entry to 105°C.
• Table 7: Changed minimum core supply voltage from 1.35 to 1.4 and
maximum from 1.65 to 1.6, added PLL supply voltage entry, added pad
supply entries for mobile-DDR, DDR, and SDR, changed minimum input
high voltage from 0.7xEVDD to 2 and maximum from 3.65 to EVDD+0.05,
changed minimum input low voltage from VSS-0.3 to -0.05 and maximum
from 0.35xEVDDto 0.8, added input high/low voltage entries for DDR and
mobile-DDR, removed high impedance leakage current entry, changed
minimum output high voltage from EVDD-0.5 to EVDD-0.4, added DDR/bus
output high/low voltage entries, removed load capacitance and DC
injection current entries.
• Added filtering circuits and voltage sequencing sections: Section 5.4.1,
“PLL Power Filtering,” and Section 5.4.2, “Supply Voltage Sequencing and
Separation Cautions.”
• Removed “Operating Conditions” table from Section 5.5, “Oscillator and
PLL Electrical Characteristics,” since it is redundant with Table 7.
• Table 9: Changed minimum core frequency to TBD, removed external
reference and on-chip PLL frequency specs to have only a CLKOUT
frequency spec of TBD to 83.33MHz, removed loss of reference frequency
and self-clocked mode frequency entries, in EXTAL input high/low voltage
entries changed “All other modes (Dual controller (1:1), Bypass, External)”
to “All other modes (External, Limp)”, removed XTAL output high/low
voltage entries, removed power-up to lock time entry, removed last 5
entries (frequency un-lock range, frequency lock range, CLKOUT period
jitter, frequency modulation range limit, and ICO frequency)
0.3
0.4
0.5
9/07/2005
10/10/2005
3/29/2006
• Corrected DRAMSEL footnote #3 in Table 3.
• Updated Table 3 with 144MAPBGA pin locations.
• Added 144MAPBGA ballmap to Section 4.3, “Pinout—144 MAPBGA.”
• Changed J12 from PLL_VDD to IVDD in Figure 9.
• Figure 1 and Table 3: Changed pin 33 from EVDD to SD_VDD
• Figure 4 and Table 3: Changed ball D10 from TEST to VSS
• Figure 6 and Table 3: Changed pin 39 from EVDD to SD_VDD and pin 117
from TEST to VSS
• Added “top view” and “bottom view” labels where appropriate to
mechanical drawings and pinouts.
• Updated mechanical drawings to latest available, and added note to
Section 4, “Mechanicals and Pinouts.”
MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
44
Freescale Semiconductor
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MCF5208 ColdFire® Microprocessor Data Sheet, Rev. 0.5
Preliminary
Freescale Semiconductor
45
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MCF5208EC
Rev. 0.5
3/2006
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